CN100430737C - 用于在电子元件中自测试参考电压的方法和电路装置 - Google Patents

用于在电子元件中自测试参考电压的方法和电路装置 Download PDF

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CN100430737C
CN100430737C CNB2004800180600A CN200480018060A CN100430737C CN 100430737 C CN100430737 C CN 100430737C CN B2004800180600 A CNB2004800180600 A CN B2004800180600A CN 200480018060 A CN200480018060 A CN 200480018060A CN 100430737 C CN100430737 C CN 100430737C
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wien
reference voltage
bridge
robinson
test
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CN1813195A (zh
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M·卡德纳
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Koninklijke Philips NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
    • G01R19/16547—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies voltage or current in AC supplies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
    • G01R17/10—AC or DC measuring bridges
    • G01R17/14—AC or DC measuring bridges with indication of measured value by calibrated null indicator, e.g. percent bridge, tolerance bridge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Control Of Electrical Variables (AREA)

Abstract

提供一种用于在电子元件中自测试参考电压的方法，通过该方法规定了一种能够以片上测试的形式来实现参考电压自测试的电路装置，即，对于片上测试，不需要任何地外部参考电压源，并且规定：将参考电压(Uref)馈送到压控振荡器，该压控振荡器的输出形成维恩-鲁滨逊电桥的输入，在相位检测器中就维恩-鲁滨逊电桥的输出信号相对于维恩-鲁滨逊电桥的输入的相移而检查维恩-鲁滨逊电桥的输出信号，以便检查维恩-鲁滨逊电桥的平衡，维恩-鲁滨逊电桥被设置成：在为该参考电压选定的额定值(Uref.test)下在该振荡器中生成的频率下达到平衡，如果该电桥达到平衡，就产生通过信号，否则，就产生失败信号。

Description

用于在电子元件中自测试参考电压的方法和电路装置
技术领域
本发明涉及一种用于在电子元件中自测试参考电压的方法和电路装置。
背景技术
在生产过程中，以及当在野外操作时，需要对集成电路进行测试以确保它们正确运行。由于使用外部测试装置存在许多缺点，假定必须与每个芯片单独建立接触，并且在运行条件下随后也不能对芯片进行测试，因此在芯片自身中建立测试电路已成为惯例。这种测试方法以名为BIST(嵌入式自测试)的方法为公众所知。BIST为芯片给出一种用于识别故障的闭环程序。
该电路常配有内部调节的电压源，该电压源被用作与属于该电路的集成电路内的电压或电流进行比较的参考电压的源。这些参考电压源预计是尽可能地对温度以及来自外部电源设备的电压波动的影响不敏感。为了能够进行测试来检查这些条件是否得到满足，已知的方式是把来自这种电源的参考电压与外部参考电压相比较。这还具有上述已经针对BIST描述的缺点，即当芯片在野外运行时，必须从外部与其进行接触，这就牵扯到数量不同寻常的电路和费用。
发明内容
本发明的一个目的是定义一种电路装置，用于将参考电压的自测试作为片上(on-chip)测试来实现，即对于这种测试不需任何外部参考电压源。
根据本发明，依赖权利要求1和2的特征来实现该目的。
在这些权利要求之下，参考电压被馈送到压控振荡器，该压控振荡器的输出形成维恩-鲁滨逊(Wien-Robinson)电桥的输入，在相位检测器中就维恩-鲁滨逊电桥的输出信号相对于维恩-鲁滨逊电桥的输入的相移而检查维恩-鲁滨逊电桥的输出信号，以便检查维恩-鲁滨逊电桥的平衡。该电桥被设置成在该振荡器中为该参考电压选定的额定值下具有零相移的频率时达到平衡。当这种状态存在时，该相位检测器产生通过信号，如果不存在，则产生失败信号。
一种相关联的电路装置具有压控振荡器，该压控振荡器的输出电压被馈送给维恩-鲁滨逊电桥，该维恩-鲁滨逊电桥的输出构成相位检测器的输入。
参考以下描述的实施例，对本发明的这些和其它方面进行描述，并且本发明的这些和其它方面就变得清楚明白。
附图说明
附图中：
图1是示出了自测试原理的电路框图。
图2示出了维恩-鲁滨逊电桥的构造。
具体实施方式
根据本发明的片上参考测试是基于一种测量频率的维恩-鲁滨逊电桥W的。为了使要从参考电压Uref产生的给定频率的电压能够得到测试，使用压控振荡器0来从参考电压Uref产生要加以测试的频率fx≈。来自该振荡器的频率fx≈对输入电压的依赖必须是明确的，毫无歧义的。然后，通过相位检测器P对维恩-鲁滨逊电桥的输出a与b互相之间进行比较。
控制维恩-鲁滨逊电桥的平衡状态的条件是：
R 3 ( R 0 - j 1 wC 0 ) = R 2 ( 1 1 R 1 jwC 1 )
当该电桥达到平衡时，该电桥的输出电压的相位具有零交叉。因此，维恩-鲁滨逊电桥中的电阻R0、R1、R2、R3以及其中的电容C0、C1的值要被选择成：使得相移在为参考电压Uref选择的额定值Uref.test下为零。该相位检测器接着检查维恩-鲁滨逊电桥的两个输出a和b之间的相移。根据结果，可以对已经测试的参考电压Uref的正确性做出评述。
除了依赖要测试的参考电压Uref以外，该结果仅仅依赖于该振荡器和维恩-鲁滨逊中的元件的值，这些元件的值可以通过一次校准来设置。因此，该测试独立于外部参考电压。
参考字符表：
Uref  参考电压
W     维恩-鲁滨逊电桥
a     维恩-鲁滨逊电桥的输出
b     维恩-鲁滨逊电桥的输出
0     振荡器
P     相位检测器
失败  信号
通过  信号
Rn    电阻
Cn    电容
fx≈  频率

Claims (2)

1.一种用于在电子元件中自测试参考电压的方法，其特征在于：该参考电压(Uref)被馈送到压控振荡器，该压控振荡器的输出形成维恩-鲁滨逊电桥的输入，在相位检测器中就维恩-鲁滨逊电桥的输出信号相对于维恩-鲁滨逊电桥的输入的相移而检查维恩-鲁滨逊电桥的输出信号，以检查维恩-鲁滨逊电桥的平衡，该维恩-鲁滨逊电桥被设置成：在为该参考电压选定的额定值(Uref.test)下在该振荡器中所生成的频率下达到平衡，如果该电桥达到平衡，就产生通过信号，否则，就产生失败信号。
2.一种用于在电子元件中自测试参考电压(Uref)的电路装置，其特征在于：该电路装置具有压控振荡器，该压控振荡器的输出电压被馈送给维恩-鲁滨逊电桥，该维恩-鲁滨逊电桥的输出构成相位检测器的输入，该维恩-鲁滨逊电桥被设置成：在为该参考电压选定的额定值(Uref.test)下在该振荡器中生成的频率下达到平衡，如果超出阈值，该相位检测器的输出产生失败信号，否则产生通过信号。
CNB2004800180600A 2003-06-25 2004-06-17 用于在电子元件中自测试参考电压的方法和电路装置 Expired - Fee Related CN100430737C (zh)

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GB0611332D0 (en) * 2006-06-08 2006-07-19 Elektromotive Ltd Charging station
CN105988038B (zh) * 2015-03-06 2019-02-15 龙芯中科技术有限公司 芯片压降的测量装置及方法
JP2016212512A (ja) * 2015-04-30 2016-12-15 富士通株式会社 ストレージシステム、制御装置および制御プログラム
DE102017201303A1 (de) * 2017-01-27 2018-08-02 Robert Bosch Gmbh Schaltung und Verfahren zur Überwachung einer Versorgungsspannung
JP6979413B2 (ja) * 2017-10-27 2021-12-15 ローム株式会社 監視装置及びこれを用いた電源システム

Citations (2)

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US5611239A (en) * 1994-09-21 1997-03-18 Magnetrol International Inc. Microwave point instrument with self-test circuit
US5773967A (en) * 1994-11-05 1998-06-30 Robert Bosch Gmbh Voltage reference with testing and self-calibration

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DE2326470C2 (de) * 1973-05-24 1982-09-16 Deutsche Babcock Ag, 4200 Oberhausen Rollenquetschmühle
CA2113492A1 (en) * 1994-01-14 1995-07-15 Donald W. Church Apparatus and method for identifying metallic tokens and coins

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5611239A (en) * 1994-09-21 1997-03-18 Magnetrol International Inc. Microwave point instrument with self-test circuit
US5773967A (en) * 1994-11-05 1998-06-30 Robert Bosch Gmbh Voltage reference with testing and self-calibration

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
WIEN-ROBINSON-OSZILLATOR ZUR MESSUNGKLEINERKAPAZITATSANDERUNGEN. DAI MING YUAN.ELEKTRONIK,Vol.37 No.9. 1988
WIEN-ROBINSON-OSZILLATOR ZUR MESSUNGKLEINERKAPAZITATSANDERUNGEN. DAI MING YUAN.ELEKTRONIK,Vol.37 No.9. 1988 *

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EP1642142B1 (en) 2006-11-02
US20070216395A1 (en) 2007-09-20
WO2004113937A1 (en) 2004-12-29
ATE344461T1 (de) 2006-11-15
EP1642142B8 (en) 2007-05-09
EP1642142A1 (en) 2006-04-05
WO2004113937A8 (en) 2007-03-01
DE602004003065T2 (de) 2009-01-29
DE602004003065D1 (de) 2006-12-14
JP2007516416A (ja) 2007-06-21
US7394239B2 (en) 2008-07-01

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