ATE306084T1 - Verfahren und vorrichtung zum verfolgen von hardwarezustanden mit dynamischen rekonfigurierbaren testschaltungen - Google Patents

Verfahren und vorrichtung zum verfolgen von hardwarezustanden mit dynamischen rekonfigurierbaren testschaltungen

Info

Publication number
ATE306084T1
ATE306084T1 AT01305974T AT01305974T ATE306084T1 AT E306084 T1 ATE306084 T1 AT E306084T1 AT 01305974 T AT01305974 T AT 01305974T AT 01305974 T AT01305974 T AT 01305974T AT E306084 T1 ATE306084 T1 AT E306084T1
Authority
AT
Austria
Prior art keywords
test
hardware
logic
test circuits
fpgas
Prior art date
Application number
AT01305974T
Other languages
English (en)
Inventor
Stephen Dale Hanna
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Application granted granted Critical
Publication of ATE306084T1 publication Critical patent/ATE306084T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/25—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318516—Test of programmable logic devices [PLDs]
    • G01R31/318519—Test of field programmable gate arrays [FPGA]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Debugging And Monitoring (AREA)
  • Tests Of Electronic Circuits (AREA)
AT01305974T 2000-08-02 2001-07-11 Verfahren und vorrichtung zum verfolgen von hardwarezustanden mit dynamischen rekonfigurierbaren testschaltungen ATE306084T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/631,130 US6542844B1 (en) 2000-08-02 2000-08-02 Method and apparatus for tracing hardware states using dynamically reconfigurable test circuits

Publications (1)

Publication Number Publication Date
ATE306084T1 true ATE306084T1 (de) 2005-10-15

Family

ID=24529882

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01305974T ATE306084T1 (de) 2000-08-02 2001-07-11 Verfahren und vorrichtung zum verfolgen von hardwarezustanden mit dynamischen rekonfigurierbaren testschaltungen

Country Status (8)

Country Link
US (1) US6542844B1 (de)
EP (1) EP1178324B1 (de)
KR (1) KR100420418B1 (de)
CN (1) CN1201229C (de)
AT (1) ATE306084T1 (de)
CA (1) CA2354248C (de)
DE (1) DE60113780T2 (de)
GB (1) GB2368421A (de)

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CN113165390A (zh) * 2018-12-03 2021-07-23 惠普发展公司，有限责任合伙企业 逻辑电路系统封装
CN113165397B (zh) * 2018-12-03 2022-10-14 惠普发展公司，有限责任合伙企业 可更换打印设备部件和确定打印材料储器中的压力的方法
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Also Published As

Publication number Publication date
CN1336588A (zh) 2002-02-20
EP1178324B1 (de) 2005-10-05
GB2368421A (en) 2002-05-01
DE60113780D1 (de) 2005-11-10
CA2354248C (en) 2006-09-19
KR100420418B1 (ko) 2004-03-04
GB0110357D0 (en) 2001-06-20
CA2354248A1 (en) 2002-02-02
US6542844B1 (en) 2003-04-01
CN1201229C (zh) 2005-05-11
DE60113780T2 (de) 2006-06-22
KR20020011870A (ko) 2002-02-09
EP1178324A2 (de) 2002-02-06
EP1178324A3 (de) 2004-01-07

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