ATE469359T1 - Verfahren und system für debug und test unter verwendung replizierter logik - Google Patents

Verfahren und system für debug und test unter verwendung replizierter logik

Info

Publication number
ATE469359T1
ATE469359T1 AT06800744T AT06800744T ATE469359T1 AT E469359 T1 ATE469359 T1 AT E469359T1 AT 06800744 T AT06800744 T AT 06800744T AT 06800744 T AT06800744 T AT 06800744T AT E469359 T1 ATE469359 T1 AT E469359T1
Authority
AT
Austria
Prior art keywords
circuit
logic
replicated
trigger condition
test
Prior art date
Application number
AT06800744T
Other languages
English (en)
Inventor
Chun Ng
Mario Larouche
Original Assignee
Synopsys Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Synopsys Inc filed Critical Synopsys Inc
Application granted granted Critical
Publication of ATE469359T1 publication Critical patent/ATE469359T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3016—Delay or race condition test, e.g. race hazard test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31705—Debugging aspects, e.g. using test circuits for debugging, using dedicated debugging test circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318364—Generation of test inputs, e.g. test vectors, patterns or sequences as a result of hardware simulation, e.g. in an HDL environment
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/32—Circuit design at the digital level
    • G06F30/33—Design verification, e.g. functional simulation or model checking

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Hardware Redundancy (AREA)
  • Tests Of Electronic Circuits (AREA)
AT06800744T 2005-08-02 2006-08-02 Verfahren und system für debug und test unter verwendung replizierter logik ATE469359T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/195,180 US7398445B2 (en) 2002-08-09 2005-08-02 Method and system for debug and test using replicated logic
PCT/US2006/030417 WO2007016699A2 (en) 2005-08-02 2006-08-02 Method and system for debug and test using replicated logic

Publications (1)

Publication Number Publication Date
ATE469359T1 true ATE469359T1 (de) 2010-06-15

Family

ID=37488031

Family Applications (1)

Application Number Title Priority Date Filing Date
AT06800744T ATE469359T1 (de) 2005-08-02 2006-08-02 Verfahren und system für debug und test unter verwendung replizierter logik

Country Status (6)

Country Link
US (1) US7398445B2 (de)
EP (1) EP1913410B1 (de)
JP (1) JP5039698B2 (de)
AT (1) ATE469359T1 (de)
DE (1) DE602006014549D1 (de)
WO (1) WO2007016699A2 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
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US7222315B2 (en) * 2000-11-28 2007-05-22 Synplicity, Inc. Hardware-based HDL code coverage and design analysis
US6904576B2 (en) * 2002-08-09 2005-06-07 Synplicity, Inc. Method and system for debugging using replicated logic
US7213216B2 (en) * 2002-08-09 2007-05-01 Synplicity, Inc. Method and system for debugging using replicated logic and trigger logic
US7904859B2 (en) * 2007-05-09 2011-03-08 Synopsys, Inc. Method and apparatus for determining a phase relationship between asynchronous clock signals
US7984400B2 (en) * 2007-05-09 2011-07-19 Synopsys, Inc. Techniques for use with automated circuit design and simulations
US7908574B2 (en) * 2007-05-09 2011-03-15 Synopsys, Inc. Techniques for use with automated circuit design and simulations
US8756557B2 (en) * 2007-05-09 2014-06-17 Synopsys, Inc. Techniques for use with automated circuit design and simulations
US8397195B2 (en) * 2010-01-22 2013-03-12 Synopsys, Inc. Method and system for packet switch based logic replication
US8638792B2 (en) 2010-01-22 2014-01-28 Synopsys, Inc. Packet switch based logic replication
US8788987B2 (en) * 2010-06-23 2014-07-22 Tabula, Inc. Rescaling
US9495492B1 (en) * 2015-01-05 2016-11-15 Cadence Design Systems, Inc. Implementing synchronous triggers for waveform capture in an FPGA prototyping system

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EP0358365B1 (de) * 1988-09-07 1998-10-21 Texas Instruments Incorporated Prüf-Puffer/Register
US5056094A (en) * 1989-06-09 1991-10-08 Texas Instruments Incorporated Delay fault testing method and apparatus
US5272390A (en) * 1991-09-23 1993-12-21 Digital Equipment Corporation Method and apparatus for clock skew reduction through absolute delay regulation
US5452239A (en) * 1993-01-29 1995-09-19 Quickturn Design Systems, Inc. Method of removing gated clocks from the clock nets of a netlist for timing sensitive implementation of the netlist in a hardware emulation system
US5706473A (en) * 1995-03-31 1998-01-06 Synopsys, Inc. Computer model of a finite state machine having inputs, outputs, delayed inputs and delayed outputs
US5761488A (en) * 1996-06-13 1998-06-02 International Business Machines Corporation Logic translation method for increasing simulation emulation efficiency
JPH10177590A (ja) * 1996-12-18 1998-06-30 Toshiba Corp 論理回路モデルのデバッグ装置およびデバッグ方法
US5923676A (en) * 1996-12-20 1999-07-13 Logic Vision, Inc. Bist architecture for measurement of integrated circuit delays
US6286114B1 (en) * 1997-10-27 2001-09-04 Altera Corporation Enhanced embedded logic analyzer
US6286128B1 (en) * 1998-02-11 2001-09-04 Monterey Design Systems, Inc. Method for design optimization using logical and physical information
CA2345648A1 (en) * 1998-09-30 2000-04-06 Cadence Design Systems, Inc. Block based design methodology
US6438735B1 (en) * 1999-05-17 2002-08-20 Synplicity, Inc. Methods and apparatuses for designing integrated circuits
US6519754B1 (en) * 1999-05-17 2003-02-11 Synplicity, Inc. Methods and apparatuses for designing integrated circuits
US7065481B2 (en) * 1999-11-30 2006-06-20 Synplicity, Inc. Method and system for debugging an electronic system using instrumentation circuitry and a logic analyzer
US6551227B1 (en) * 1999-12-08 2003-04-22 Heidelberger Druckmaschinen Ag Device for seizing of flat material on a transporting surface
DE10030349A1 (de) 2000-06-20 2002-01-10 Kuratorium Offis E V Verfahren zum Analysieren der Verlustleistung bzw. der Energieaufnahme einer elektrischen Schaltung bzw. eines elektrischen Bauelementes
US6516449B2 (en) * 2001-04-02 2003-02-04 Sun Microsystems, Inc. Methodology to create integrated circuit designs by replication maintaining isomorphic input output and fault behavior
US6580299B2 (en) * 2001-04-05 2003-06-17 Parthus Ireland Limited Digital circuit for, and a method of, synthesizing an input signal
JP2003099495A (ja) * 2001-09-25 2003-04-04 Fujitsu Ltd 集積回路の設計システム、集積回路の設計方法およびプログラム
US6687882B1 (en) * 2002-01-31 2004-02-03 Synplicity, Inc. Methods and apparatuses for non-equivalence checking of circuits with subspace
US6904576B2 (en) * 2002-08-09 2005-06-07 Synplicity, Inc. Method and system for debugging using replicated logic
US7266489B2 (en) * 2003-04-28 2007-09-04 International Business Machines Corporation Method, system and program product for determining a configuration of a digital design by reference to an invertible configuration database
US7055117B2 (en) * 2003-12-29 2006-05-30 Agere Systems, Inc. System and method for debugging system-on-chips using single or n-cycle stepping

Also Published As

Publication number Publication date
US20060259834A1 (en) 2006-11-16
WO2007016699A2 (en) 2007-02-08
WO2007016699A3 (en) 2007-03-29
DE602006014549D1 (de) 2010-07-08
JP2009503749A (ja) 2009-01-29
EP1913410B1 (de) 2010-05-26
JP5039698B2 (ja) 2012-10-03
EP1913410A2 (de) 2008-04-23
US7398445B2 (en) 2008-07-08

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