ATE485527T1 - System und rechnerprogrammprodukt zum testen einer logischen schaltung - Google Patents
System und rechnerprogrammprodukt zum testen einer logischen schaltungInfo
- Publication number
- ATE485527T1 ATE485527T1 AT07713151T AT07713151T ATE485527T1 AT E485527 T1 ATE485527 T1 AT E485527T1 AT 07713151 T AT07713151 T AT 07713151T AT 07713151 T AT07713151 T AT 07713151T AT E485527 T1 ATE485527 T1 AT E485527T1
- Authority
- AT
- Austria
- Prior art keywords
- test
- logic circuit
- self
- routine
- module
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/27—Built-in tests
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/005—Testing of electric installations on transport means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/005—Testing of electric installations on transport means
- G01R31/006—Testing of electric installations on transport means on road vehicles, e.g. automobiles or trucks
- G01R31/007—Testing of electric installations on transport means on road vehicles, e.g. automobiles or trucks using microprocessors or computers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3187—Built-in tests
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/IB2007/050518 WO2008099239A1 (en) | 2007-02-16 | 2007-02-16 | System, computer program product and method for testing a logic circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE485527T1 true ATE485527T1 (de) | 2010-11-15 |
Family
ID=38596818
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT07713151T ATE485527T1 (de) | 2007-02-16 | 2007-02-16 | System und rechnerprogrammprodukt zum testen einer logischen schaltung |
Country Status (5)
Country | Link |
---|---|
US (1) | US8286043B2 (de) |
EP (1) | EP2113087B1 (de) |
AT (1) | ATE485527T1 (de) |
DE (1) | DE602007010039D1 (de) |
WO (1) | WO2008099239A1 (de) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7546501B2 (en) | 2006-09-13 | 2009-06-09 | Texas Instruments Incorporated | Selecting test circuitry from header signals on power lead |
WO2009090502A1 (en) | 2008-01-16 | 2009-07-23 | Freescale Semiconductor, Inc. | Processor based system having ecc based check and access validation information means |
CN102143523B (zh) * | 2010-11-18 | 2014-06-25 | 华为技术有限公司 | 基于业务递送平台的应用测试方法和业务递送平台 |
KR102097988B1 (ko) * | 2014-04-09 | 2020-05-29 | 한국전자통신연구원 | 에러 시뮬레이션 장치 및 그 방법 |
WO2016020477A1 (en) * | 2014-08-07 | 2016-02-11 | Osr Enterprises Ag | Device, system and method for automated installation and operating environment configuration of a computer system |
JP6864992B2 (ja) * | 2016-04-28 | 2021-04-28 | 日立Astemo株式会社 | 車両制御システム検証装置及び車両制御システム |
US10891396B2 (en) * | 2016-05-27 | 2021-01-12 | Samsung Electronics Co., Ltd. | Electronic circuit performing encryption/decryption operation to prevent side- channel analysis attack, and electronic device including the same |
KR102627585B1 (ko) * | 2016-05-27 | 2024-01-25 | 삼성전자주식회사 | 부 채널 분석 공격을 방지하기 위한 암호화/복호화 연산을 수행하는 전자 회로 및 그것을 포함하는 전자 장치 |
US11686767B2 (en) * | 2017-11-02 | 2023-06-27 | Intel Corporation | System, apparatus and method for functional testing of one or more fabrics of a processor |
US10816595B2 (en) | 2018-10-19 | 2020-10-27 | Nxp Usa, Inc. | Self-test apparatuses having distributed self-test controller circuits and controller circuitry to control self-test execution based on self-test properties and method thereof |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1282041B (de) * | 1960-01-23 | 1968-11-07 | Demag Ag | Innenauskleidung fuer Konverterkamine |
US6070252A (en) * | 1994-09-30 | 2000-05-30 | Intel Corporation | Method and apparatus for interactive built-in-self-testing with user-programmable test patterns |
US5539878A (en) * | 1995-06-16 | 1996-07-23 | Elonex Technologies, Inc. | Parallel testing of CPU cache and instruction units |
US20020071325A1 (en) * | 1996-04-30 | 2002-06-13 | Hii Kuong Hua | Built-in self-test arrangement for integrated circuit memory devices |
US5963566A (en) * | 1996-12-18 | 1999-10-05 | Lsi Logic Corporation | Application specific integrated circuit chip and method of testing same |
JP2000011691A (ja) * | 1998-06-16 | 2000-01-14 | Mitsubishi Electric Corp | 半導体試験装置 |
DE19835258B4 (de) * | 1998-08-04 | 2006-07-27 | Infineon Technologies Ag | Integrierte dynamische Speicherschaltung mit einer Selbsttesteinrichtung |
US6560740B1 (en) * | 1999-08-03 | 2003-05-06 | Advanced Micro Devices, Inc. | Apparatus and method for programmable built-in self-test and self-repair of embedded memory |
US7418642B2 (en) * | 2001-07-30 | 2008-08-26 | Marvell International Technology Ltd. | Built-in-self-test using embedded memory and processor in an application specific integrated circuit |
US7089456B2 (en) * | 2002-06-03 | 2006-08-08 | Honeywell International, Inc | Error response test system and method using test mask variable |
WO2004109307A1 (ja) * | 2003-06-09 | 2004-12-16 | Advantest Corporation | パターン発生器、及び試験装置 |
JP4601305B2 (ja) * | 2004-02-27 | 2010-12-22 | 富士通セミコンダクター株式会社 | 半導体装置 |
US7231621B1 (en) * | 2004-04-30 | 2007-06-12 | Xilinx, Inc. | Speed verification of an embedded processor in a programmable logic device |
US7213182B2 (en) * | 2005-01-19 | 2007-05-01 | Advantest Corporation | Test apparatus and test method |
US8499208B2 (en) * | 2006-10-27 | 2013-07-30 | Qualcomm Incorporated | Method and apparatus for scheduling BIST routines |
-
2007
- 2007-02-16 WO PCT/IB2007/050518 patent/WO2008099239A1/en active Application Filing
- 2007-02-16 DE DE602007010039T patent/DE602007010039D1/de active Active
- 2007-02-16 AT AT07713151T patent/ATE485527T1/de not_active IP Right Cessation
- 2007-02-16 EP EP07713151A patent/EP2113087B1/de active Active
- 2007-02-16 US US12/527,347 patent/US8286043B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
EP2113087B1 (de) | 2010-10-20 |
US20100107025A1 (en) | 2010-04-29 |
EP2113087A1 (de) | 2009-11-04 |
US8286043B2 (en) | 2012-10-09 |
DE602007010039D1 (de) | 2010-12-02 |
WO2008099239A1 (en) | 2008-08-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |