201122807 六、發明說明： 【發明所屬之技術領域】 剛本發明涉及測試領域’尤其涉及-種電子產品測試粒式 引導系統及方法。 [先前技術] [0002] 〇 隨著電子技_發展，許多電子產㈣成㈣能越來越 多’在電子產品的量產過程中需要對其進行各種功能測 試’大多數功能的測試的方妓為軸電子產品編寫〆 些測試程式，然而每-種產品可能有多種型號，每〆種 型號的測試項目可能不-樣，每個測試專案所需要的測 試程式都可能是不-樣的，當出現上述情況時，測試人 員需要手動錢並執行相應_試程式完賴相應測試 專案的測試，查找的過程浪費時間。 【發明内容】 [〇_蓉於以上内容有必要提供_種電子產品測試程式引導系 統’該系統運行於電腦中。該系統包括：測試流程創建 〇 模組’用於為制電子產品創建賴流程並歧該測試 /瓜程的資料資讯，所述測試流程的資料資訊包括待測電 子產。σ的名稱，該待測電子產品包括的測試專案、每個 測4專輯需的測試程式、每侧試程式的路徑及啟動 順序，測試腳本生成模組，用於根據上述設定的測試流 程資料資訊生成該待測電子產品的測試腳本。 []鑒於以上内容還有必要提供一種電子產品測試程式引導 方法。該方法包括：（a)為待測電子產品創建測試流程 並設定該測試流程的資料資訊，所述測試流程的資料資 098143476 表單編號A0101 第3頁/共12頁 0982074463-0 201122807 訊包括待測電子產品的名稱，該待測電子產品 σσ L括的$ 試專案、每個測試專案所需的測試程式、每個蜊試。Ζ、 的路徑及啟動順序；（b)測試腳本生成模組根據上式 定的測試流程資料資訊生成該待測電子產品的測試腳 本 [0005] [0006] [0007] [0008] [0009] 通過本發明提供的電子產品測試程式引導系 、 馬每個 電子產品生成一個測試腳本，在該測試腳本的q導 照預先設定的啟動順序啟動相應的測試程式完成對電 產品的某個功能的測試，節约了測試聘間。 【實施方式】 ο 如圖1所示，是本發明電子產品測試程式引導系統的應用 環境的示意圖。該電子產品測試程式引導系統20 (以下 簡稱該系統20)運行於電腦2中，該系統2Q包括測試流程 創建模組201、測試腳本生成模組2〇2、及執行模組2们 〇所述測試流程創建模㈣〇丨祕為制電子產品創建測試 流程並設錢測試流輕的資料資訊，請參考圖2所示，* 〇測试流程的資料資訊包含的内容的示意g^所述測試流 程資料資訊包括待測電子產品名稱，該待測電子產品包 括的測試專案、每個剛試專案所需的測試程式、每個測 試程式的路徑及啟動順序。 所述測試腳本生成模組202 ’用於根據上述設定的測試流 程資料資訊生成該待_子產品的測試腳本。 所述執行模組’用於當待測電子產品的測試腳本被觸發 098143476 表單編號A0101 第4 頁/共12頁 0982074463-0 201122807 [0010] [0011] ο ' [0012] [0013] ❹ [0014] [0015] 098143476 0982074463-0 後’根據上述蚊賴待測電子產品所包含的 、每個測試專賴《的顺程式的名稱、每個測試程 式的路徑及啟動順序啟_試程式完成對待測電子產品 的測試。 σσ 如圖3所示，是本發明電子產品測試程式弓丨導方法。 步驟S202 ’通過測試流程創建模組2{)1為某個待測電子產 品創建測試流程並設定該測試流程的資料資訊，所述測 試流程資料資訊包括待測電子產品名稱，該待測電子產 品包括的測試專案、每個測試專案所需的測試程式每 個測试程式的路控及啟動順序。 步驟S204，測試腳本生成模組2〇2根據上逑設定完成後的 測試流程資料資訊生成該待測電子產品的測試腳本。 在上述步驟完成後，當某個待測電子產品的測試腳本被 觸發後，執行模組203根據上述設定的該待測電子產品所 包含的測試專案、每個測試專案所需要的測試程式的名 稱、每個測試程式的路徑及啟動順序啟動測試程式完成 對待測電子產品的測試。 為了更進一步說明本發明電子產品測試程式引導方法的 實施效果，以下以電腦主板記憶體的基準電壓範圍的測 試來進行說明。 假如需要對兩種型號的記憶體進行測試，兩種型號的記 憶體的測試程式是不一樣的，但使用的測試機台是一樣 的。同一種型號的記憶體的測試又分為高負載和低負載 下的測試，分別需要兩個挪試程式，對應一個測試腳本 表單編就Α0101 第5頁/共12頁 201122807 。這樣測試人員需要根據待測記憶體的型號去選擇八、 的測試程式’並將該測試程式啟動運行，浪費時間。 [0016] [0017] [0018] [0019] [0020] [0021] [0022] 通過本發明電子產品測試程式引導系統新建針對每個型 號的記憶體的測試流程的資料資訊並生成對應每個型號 的記憶體的測試腳本。設定好後，每次對某個型號的記 憶體進行基準電壓範圍的測試時’只需要觸發運行對應 該型號的記憶體的測試腳本，即可在該測試腳本的引導 下按照設定的順序啟動相應的測試程式完成對該型號的 記憶體的基準電壓範圍的測^。 應當說明的是，以上實施例僅用以說明本發明的技術方 案而非限制，儘管參照較佳實施例對本發明進行了詳細 說明。 ^ ' 从上所通:惶兩+知明之較佳實施例而已，日 且已達廣泛之 使用功效，凡其他未脫離本發明所揭示之精神下所々成 之均等變化或修飾，均應包令在丨下迷之廷下兀 甲蜻專利範圍内 〇 【圖式簡單說明】 導系統的應用環境的示 圖1係本發明電子產品測試程式引 意圖。 圖2係測試流程的資料資訊包含的内容的厂 、不意圖。 圖3係電子產品測試程式引導方法的流程圖。 【主要元件符號說明】 電子產品測試程式引導系統2〇 098143476 表單編號Α0101 第6頁/共12頁 201122807 [0023] 電腦2 [0024] 測試流程創建模組 201 [0025] 測試腳本生成模組 202 [0026] 執行模組2 0 3 Ο ❹ 098143476 表單編號Α0101 第7頁/共12頁 0982074463-0201122807 VI. Description of the Invention: [Technical Field of the Invention] The present invention relates to the field of testing, in particular, to an electronic product testing granular guiding system and method. [Prior Art] [0002] With the development of electronic technology, many electronic products (four) into (four) can be more and more 'in the mass production process of electronic products, they need to perform various functional tests'. 〆 These test programs are written for the axis electronics. However, there may be multiple models for each product. The test items for each model may not be the same. The test program required for each test project may not be the same. When the above situation occurs, the tester needs manual money and executes the corresponding test program to complete the test of the corresponding test project, and the process of searching is a waste of time. [Summary of the Invention] [〇_蓉 is necessary to provide the above-mentioned electronic product test program guidance system] The system runs on a computer. The system includes: a test process creation 〇 module </ RTI> for creating a data flow for the electronic product and discriminating the test/meal information, the information information of the test process including the electronic product to be tested. The name of σ, the test project included in the electronic product to be tested, the test program required for each test 4 albums, the path and startup sequence of each test program, and the test script generation module for the test flow information according to the above-mentioned settings Generate a test script for the electronic product to be tested. [] In view of the above, it is also necessary to provide an electronic product test program guiding method. The method comprises: (a) creating a test flow for the electronic product to be tested and setting information information of the test flow, the information of the test flow is 098143476, form number A0101, page 3, total 12 pages, 0982074463-0, 201122807, including the test The name of the electronic product, the test plan for the electronic product to be tested σσ L, the test program required for each test project, and each test. Ζ, the path and the startup sequence; (b) the test script generation module generates the test script of the electronic product to be tested according to the test flow data information of the above formula [0005] [0006] [0007] [0008] [0009] The electronic product test program guiding system provided by the invention generates a test script for each electronic product of the horse, and starts a corresponding test program in the preset boot sequence of the q-script of the test script to complete testing of a certain function of the electric product. Saved the test hire. [Embodiment] As shown in Fig. 1, it is a schematic diagram of an application environment of the electronic product test program guiding system of the present invention. The electronic product test program guiding system 20 (hereinafter referred to as the system 20) runs in the computer 2, and the system 2Q includes a test flow creation module 201, a test script generation module 2〇2, and an execution module 2 Test Process Creation Module (4) Secrets Create test procedures for electronic products and set up data for light test flow, please refer to Figure 2, * 示意 Test information of the test process contains information The test process information includes the name of the electronic product to be tested, the test project included in the electronic product to be tested, the test program required for each test project, the path of each test program, and the startup sequence. The test script generation module 202' is configured to generate a test script of the to-be-product according to the set test process data information. The execution module 'is used when the test script of the electronic product to be tested is triggered 098143476 Form No. A0101 Page 4 / Total 12 Page 0982074463-0 201122807 [0011] [0011] [0012] [0013] ❹ [0014 [0015] 098143476 0982074463-0 After the test according to the above-mentioned electronic products to be tested, each test is based on the name of the program, the path of each test program, and the startup sequence. Testing of electronic products. Σσ As shown in FIG. 3, it is a method for testing the electronic product test program of the present invention. Step S202: Create a module 2 through the test process to create a test process for the electronic product to be tested and set the data information of the test process. The test process information includes the name of the electronic product to be tested, and the electronic product to be tested The test program included, the test program required for each test project, and the sequence and startup sequence of each test program. In step S204, the test script generation module 2〇2 generates a test script of the electronic product to be tested according to the test process data information after the setting is completed. After the above steps are completed, when the test script of the electronic product to be tested is triggered, the execution module 203 selects the test program included in the electronic product to be tested according to the above-mentioned test, and the name of the test program required for each test project. The path of each test program and the startup sequence start the test program to complete the test of the electronic product to be tested. In order to further explain the effect of the implementation of the electronic product test program guiding method of the present invention, the following description will be made on the test of the reference voltage range of the computer motherboard memory. If you need to test both types of memory, the test program for the two models is different, but the test machine used is the same. The test of the same type of memory is divided into high load and low load test. Two test programs are required respectively, and one test script form is compiled. Α0101 Page 5 of 12 201122807 . In this way, the tester needs to select the test program of the test memory according to the model of the memory to be tested and start the operation of the test program, which wastes time. [0020] [0020] [0022] [0022] The electronic product test program guiding system of the present invention newly creates data information for the test flow of each model of memory and generates corresponding models for each model. Test script for memory. After setting, each time a certain type of memory is tested in the reference voltage range, 'only need to trigger the test script of the memory corresponding to the model, you can start the corresponding sequence according to the set order under the guidance of the test script. The test program completes the measurement of the reference voltage range of the memory of the model. It should be noted that the above embodiments are merely illustrative of the technical solutions of the present invention and are not to be construed as limiting the invention. ^ ' From the above: the best examples of the two + knowing, and have reached a wide range of use effects, all other equal changes or modifications without departing from the spirit of the present invention should be ordered In the patent scope of the 迷 迷 之 廷 〇 〇 〇 图 图 图 图 图 图 图 图 图 图 示 示 示 示 示 示 示 示 示 示 示 示 示 示 示 示 示 示 示Figure 2 is the factory, not intended, of the content of the information in the test process. Figure 3 is a flow chart of the electronic product test program guiding method. [Main component symbol description] Electronic product test program guidance system 2〇098143476 Form number Α0101 Page 6/Total 12 page 201122807 [0023] Computer 2 [0024] Test flow creation module 201 [0025] Test script generation module 202 [ 0026] Execution Module 2 0 3 Ο 098 098143476 Form Number Α 0101 Page 7 / Total 12 Page 0982074463-0