US7516536B2
(en)
*
|
1999-07-08 |
2009-04-14 |
Toho Engineering Kabushiki Kaisha |
Method of producing polishing pad
|
US6869343B2
(en)
*
|
2001-12-19 |
2005-03-22 |
Toho Engineering Kabushiki Kaisha |
Turning tool for grooving polishing pad, apparatus and method of producing polishing pad using the tool, and polishing pad produced by using the tool
|
US20080156657A1
(en)
*
|
2000-02-17 |
2008-07-03 |
Butterfield Paul D |
Conductive polishing article for electrochemical mechanical polishing
|
US20050092621A1
(en)
*
|
2000-02-17 |
2005-05-05 |
Yongqi Hu |
Composite pad assembly for electrochemical mechanical processing (ECMP)
|
US7303662B2
(en)
*
|
2000-02-17 |
2007-12-04 |
Applied Materials, Inc. |
Contacts for electrochemical processing
|
US6991528B2
(en)
*
|
2000-02-17 |
2006-01-31 |
Applied Materials, Inc. |
Conductive polishing article for electrochemical mechanical polishing
|
US7374644B2
(en)
*
|
2000-02-17 |
2008-05-20 |
Applied Materials, Inc. |
Conductive polishing article for electrochemical mechanical polishing
|
US7066800B2
(en)
*
|
2000-02-17 |
2006-06-27 |
Applied Materials Inc. |
Conductive polishing article for electrochemical mechanical polishing
|
US7670468B2
(en)
|
2000-02-17 |
2010-03-02 |
Applied Materials, Inc. |
Contact assembly and method for electrochemical mechanical processing
|
US20040020789A1
(en)
*
|
2000-02-17 |
2004-02-05 |
Applied Materials, Inc. |
Conductive polishing article for electrochemical mechanical polishing
|
US6962524B2
(en)
*
|
2000-02-17 |
2005-11-08 |
Applied Materials, Inc. |
Conductive polishing article for electrochemical mechanical polishing
|
US7059948B2
(en)
*
|
2000-12-22 |
2006-06-13 |
Applied Materials |
Articles for polishing semiconductor substrates
|
US7303462B2
(en)
*
|
2000-02-17 |
2007-12-04 |
Applied Materials, Inc. |
Edge bead removal by an electro polishing process
|
US7077721B2
(en)
*
|
2000-02-17 |
2006-07-18 |
Applied Materials, Inc. |
Pad assembly for electrochemical mechanical processing
|
US7029365B2
(en)
*
|
2000-02-17 |
2006-04-18 |
Applied Materials Inc. |
Pad assembly for electrochemical mechanical processing
|
US6979248B2
(en)
*
|
2002-05-07 |
2005-12-27 |
Applied Materials, Inc. |
Conductive polishing article for electrochemical mechanical polishing
|
US7125477B2
(en)
*
|
2000-02-17 |
2006-10-24 |
Applied Materials, Inc. |
Contacts for electrochemical processing
|
US7678245B2
(en)
|
2000-02-17 |
2010-03-16 |
Applied Materials, Inc. |
Method and apparatus for electrochemical mechanical processing
|
US6616513B1
(en)
*
|
2000-04-07 |
2003-09-09 |
Applied Materials, Inc. |
Grid relief in CMP polishing pad to accurately measure pad wear, pad profile and pad wear profile
|
WO2002028598A1
(en)
*
|
2000-10-02 |
2002-04-11 |
Rodel Holdings, Inc. |
Method for conditioning polishing pads
|
JP2002200555A
(ja)
*
|
2000-12-28 |
2002-07-16 |
Ebara Corp |
研磨工具および該研磨工具を具備したポリッシング装置
|
US7137879B2
(en)
*
|
2001-04-24 |
2006-11-21 |
Applied Materials, Inc. |
Conductive polishing article for electrochemical mechanical polishing
|
US7344432B2
(en)
*
|
2001-04-24 |
2008-03-18 |
Applied Materials, Inc. |
Conductive pad with ion exchange membrane for electrochemical mechanical polishing
|
KR100646702B1
(ko)
*
|
2001-08-16 |
2006-11-17 |
에스케이씨 주식회사 |
홀 및/또는 그루브로 형성된 화학적 기계적 연마패드
|
US6648743B1
(en)
*
|
2001-09-05 |
2003-11-18 |
Lsi Logic Corporation |
Chemical mechanical polishing pad
|
JP3843933B2
(ja)
*
|
2002-02-07 |
2006-11-08 |
ソニー株式会社 |
研磨パッド、研磨装置および研磨方法
|
US7121938B2
(en)
*
|
2002-04-03 |
2006-10-17 |
Toho Engineering Kabushiki Kaisha |
Polishing pad and method of fabricating semiconductor substrate using the pad
|
US20050194681A1
(en)
*
|
2002-05-07 |
2005-09-08 |
Yongqi Hu |
Conductive pad with high abrasion
|
TWI252793B
(en)
*
|
2002-08-20 |
2006-04-11 |
Nanya Technology Corp |
Wear auto-display polishing pad and fabricating method of the same
|
US6923362B2
(en)
*
|
2002-09-30 |
2005-08-02 |
The Curators Of University Of Missouri |
Integral channels in metal components and fabrication thereof
|
US20040152402A1
(en)
*
|
2003-02-05 |
2004-08-05 |
Markus Naujok |
Wafer polishing with counteraction of centrifugal forces on polishing slurry
|
US6783436B1
(en)
|
2003-04-29 |
2004-08-31 |
Rohm And Haas Electronic Materials Cmp Holdings, Inc. |
Polishing pad with optimized grooves and method of forming same
|
JP4292025B2
(ja)
|
2003-05-23 |
2009-07-08 |
Jsr株式会社 |
研磨パッド
|
US20040259479A1
(en)
*
|
2003-06-23 |
2004-12-23 |
Cabot Microelectronics Corporation |
Polishing pad for electrochemical-mechanical polishing
|
US6942549B2
(en)
*
|
2003-10-29 |
2005-09-13 |
International Business Machines Corporation |
Two-sided chemical mechanical polishing pad for semiconductor processing
|
US7442116B2
(en)
*
|
2003-11-04 |
2008-10-28 |
Jsr Corporation |
Chemical mechanical polishing pad
|
US7018274B2
(en)
*
|
2003-11-13 |
2006-03-28 |
Rohm And Haas Electronic Materials Cmp Holdings, Inc |
Polishing pad having slurry utilization enhancing grooves
|
US6843711B1
(en)
*
|
2003-12-11 |
2005-01-18 |
Rohm And Haas Electronic Materials Cmp Holdings, Inc |
Chemical mechanical polishing pad having a process-dependent groove configuration
|
JP2005177897A
(ja)
*
|
2003-12-17 |
2005-07-07 |
Nec Electronics Corp |
研磨方法および研磨装置と半導体装置製造方法
|
US20050178666A1
(en)
*
|
2004-01-13 |
2005-08-18 |
Applied Materials, Inc. |
Methods for fabrication of a polishing article
|
US6951510B1
(en)
*
|
2004-03-12 |
2005-10-04 |
Agere Systems, Inc. |
Chemical mechanical polishing pad with grooves alternating between a larger groove size and a smaller groove size
|
KR20060046093A
(ko)
*
|
2004-05-20 |
2006-05-17 |
제이에스알 가부시끼가이샤 |
화학 기계 연마 패드 및 화학 기계 연마 방법
|
US7270595B2
(en)
*
|
2004-05-27 |
2007-09-18 |
Rohm And Haas Electronic Materials Cmp Holdings, Inc. |
Polishing pad with oscillating path groove network
|
US6974372B1
(en)
*
|
2004-06-16 |
2005-12-13 |
Rohm And Haas Electronic Materials Cmp Holdings, Inc. |
Polishing pad having grooves configured to promote mixing wakes during polishing
|
US7198546B2
(en)
*
|
2004-06-29 |
2007-04-03 |
Lsi Logic Corporation |
Method to monitor pad wear in CMP processing
|
US7040970B2
(en)
*
|
2004-07-15 |
2006-05-09 |
Lam Research Corporation |
Apparatus and method for distributing a polishing fluid
|
US20060030156A1
(en)
*
|
2004-08-05 |
2006-02-09 |
Applied Materials, Inc. |
Abrasive conductive polishing article for electrochemical mechanical polishing
|
US6895631B1
(en)
|
2004-09-08 |
2005-05-24 |
Dedication To Detail, Inc. |
Buffing pad wear indicator
|
US7084064B2
(en)
*
|
2004-09-14 |
2006-08-01 |
Applied Materials, Inc. |
Full sequence metal and barrier layer electrochemical mechanical processing
|
WO2006039436A2
(en)
*
|
2004-10-01 |
2006-04-13 |
Applied Materials, Inc. |
Pad design for electrochemical mechanical polishing
|
US7520968B2
(en)
*
|
2004-10-05 |
2009-04-21 |
Applied Materials, Inc. |
Conductive pad design modification for better wafer-pad contact
|
US20060079159A1
(en)
*
|
2004-10-08 |
2006-04-13 |
Markus Naujok |
Chemical mechanical polish with multi-zone abrasive-containing matrix
|
JP4448766B2
(ja)
*
|
2004-12-08 |
2010-04-14 |
信越化学工業株式会社 |
研磨方法
|
US7131895B2
(en)
*
|
2005-01-13 |
2006-11-07 |
Rohm And Haas Electronic Materials Cmp Holdings, Inc. |
CMP pad having a radially alternating groove segment configuration
|
US20060219663A1
(en)
*
|
2005-03-31 |
2006-10-05 |
Applied Materials, Inc. |
Metal CMP process on one or more polishing stations using slurries with oxidizers
|
US7427340B2
(en)
*
|
2005-04-08 |
2008-09-23 |
Applied Materials, Inc. |
Conductive pad
|
US20070037491A1
(en)
*
|
2005-08-12 |
2007-02-15 |
Yuzhuo Li |
Chemically modified chemical mechanical polishing pad, process of making a modified chemical mechanical polishing pad and method of chemical mechanical polishing
|
JP4756583B2
(ja)
*
|
2005-08-30 |
2011-08-24 |
株式会社東京精密 |
研磨パッド、パッドドレッシング評価方法、及び研磨装置
|
JP4884726B2
(ja)
*
|
2005-08-30 |
2012-02-29 |
東洋ゴム工業株式会社 |
積層研磨パッドの製造方法
|
DE102006005872B3
(de)
*
|
2006-02-06 |
2008-01-31 |
J. Schmalz Gmbh |
Sauggreifer
|
JP5339680B2
(ja)
*
|
2006-02-15 |
2013-11-13 |
アプライド マテリアルズ インコーポレイテッド |
表面の研磨
|
US7267610B1
(en)
*
|
2006-08-30 |
2007-09-11 |
Rohm And Haas Electronic Materials Cmp Holdings, Inc. |
CMP pad having unevenly spaced grooves
|
US20100009611A1
(en)
*
|
2006-09-08 |
2010-01-14 |
Toyo Tire & Rubber Co., Ltd. |
Method for manufacturing a polishing pad
|
JP2008062367A
(ja)
*
|
2006-09-11 |
2008-03-21 |
Nec Electronics Corp |
研磨装置、研磨パッド、研磨方法
|
US7234224B1
(en)
*
|
2006-11-03 |
2007-06-26 |
Rohm And Haas Electronic Materials Cmp Holdings, Inc. |
Curved grooving of polishing pads
|
WO2008087797A1
(ja)
|
2007-01-15 |
2008-07-24 |
Toyo Tire & Rubber Co., Ltd. |
研磨パッド及びその製造方法
|
US20080293343A1
(en)
*
|
2007-05-22 |
2008-11-27 |
Yuchun Wang |
Pad with shallow cells for electrochemical mechanical processing
|
DE102007024954A1
(de)
*
|
2007-05-30 |
2008-12-04 |
Siltronic Ag |
Poliertuch für DSP und CMP
|
JP4593643B2
(ja)
*
|
2008-03-12 |
2010-12-08 |
東洋ゴム工業株式会社 |
研磨パッド
|
US9180570B2
(en)
|
2008-03-14 |
2015-11-10 |
Nexplanar Corporation |
Grooved CMP pad
|
US20110045753A1
(en)
*
|
2008-05-16 |
2011-02-24 |
Toray Industries, Inc. |
Polishing pad
|
ITMI20080222U1
(it)
*
|
2008-07-15 |
2010-01-16 |
Valentini Guido |
"platorello per la lavorazione di superfici con canali di aspirazione curvi"
|
US8118641B2
(en)
*
|
2009-03-04 |
2012-02-21 |
Rohm And Haas Electronic Materials Cmp Holdings, Inc. |
Chemical mechanical polishing pad having window with integral identification feature
|
WO2010078566A1
(en)
*
|
2009-01-05 |
2010-07-08 |
Innopad, Inc. |
Multi-layered chemical-mechanical planarization pad
|
TWI535527B
(zh)
*
|
2009-07-20 |
2016-06-01 |
智勝科技股份有限公司 |
研磨方法、研磨墊與研磨系統
|
WO2012036444A2
(ko)
|
2010-09-15 |
2012-03-22 |
주식회사 엘지화학 |
Cmp용 연마 패드
|
TW201235155A
(en)
*
|
2011-02-25 |
2012-09-01 |
Hon Hai Prec Ind Co Ltd |
Cleaning scrap device for grinding plate
|
US8968058B2
(en)
|
2011-05-05 |
2015-03-03 |
Nexplanar Corporation |
Polishing pad with alignment feature
|
DE102011082777A1
(de)
*
|
2011-09-15 |
2012-02-09 |
Siltronic Ag |
Verfahren zum beidseitigen Polieren einer Halbleiterscheibe
|
US8801949B2
(en)
*
|
2011-09-22 |
2014-08-12 |
Dow Global Technologies Llc |
Method of forming open-network polishing pads
|
CN104125876B
(zh)
|
2011-12-31 |
2018-07-20 |
圣戈班磨料磨具有限公司 |
具有开口的不均匀分布的研磨制品
|
CN102873625A
(zh)
*
|
2012-11-01 |
2013-01-16 |
昆山市大金机械设备厂 |
抛光装置
|
CN102909648A
(zh)
*
|
2012-11-01 |
2013-02-06 |
昆山市大金机械设备厂 |
自动研磨装置
|
JP5887290B2
(ja)
*
|
2013-02-25 |
2016-03-16 |
ニッタ・ハース株式会社 |
研磨パッド
|
US9308620B2
(en)
*
|
2013-09-18 |
2016-04-12 |
Texas Instruments Incorporated |
Permeated grooving in CMP polishing pads
|
CN103753382B
(zh)
*
|
2014-01-06 |
2016-04-27 |
成都时代立夫科技有限公司 |
一种抛光垫及其制备方法
|
TWM506674U
(zh)
*
|
2014-01-06 |
2015-08-11 |
Chengdu Times Live Science And Technology Co Ltd |
拋光墊
|
CN103878684B
(zh)
*
|
2014-03-06 |
2016-03-02 |
浙江工业大学 |
一种带有抛光功能的研磨盘
|
WO2015190189A1
(ja)
*
|
2014-06-10 |
2015-12-17 |
オリンパス株式会社 |
研磨工具、研磨方法及び研磨装置
|
US9873180B2
(en)
|
2014-10-17 |
2018-01-23 |
Applied Materials, Inc. |
CMP pad construction with composite material properties using additive manufacturing processes
|
KR102436416B1
(ko)
|
2014-10-17 |
2022-08-26 |
어플라이드 머티어리얼스, 인코포레이티드 |
애디티브 제조 프로세스들을 이용한 복합 재료 특성들을 갖는 cmp 패드 구성
|
US11745302B2
(en)
|
2014-10-17 |
2023-09-05 |
Applied Materials, Inc. |
Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process
|
US10875153B2
(en)
|
2014-10-17 |
2020-12-29 |
Applied Materials, Inc. |
Advanced polishing pad materials and formulations
|
US9776361B2
(en)
|
2014-10-17 |
2017-10-03 |
Applied Materials, Inc. |
Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles
|
US10092998B2
(en)
*
|
2015-06-26 |
2018-10-09 |
Rohm And Haas Electronic Materials Cmp Holdings, Inc. |
Method of making composite polishing layer for chemical mechanical polishing pad
|
CN105415168B
(zh)
*
|
2015-10-30 |
2018-01-16 |
佛山市金辉高科光电材料有限公司 |
一种复合抛光垫及其制备方法
|
CN113103145B
(zh)
|
2015-10-30 |
2023-04-11 |
应用材料公司 |
形成具有期望ζ电位的抛光制品的设备与方法
|
US10593574B2
(en)
|
2015-11-06 |
2020-03-17 |
Applied Materials, Inc. |
Techniques for combining CMP process tracking data with 3D printed CMP consumables
|
US10391605B2
(en)
|
2016-01-19 |
2019-08-27 |
Applied Materials, Inc. |
Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process
|
JP6565780B2
(ja)
*
|
2016-04-14 |
2019-08-28 |
株式会社Sumco |
ウェーハ端面研磨パッド、ウェーハ端面研磨装置、及びウェーハ端面研磨方法
|
US10777418B2
(en)
*
|
2017-06-14 |
2020-09-15 |
Rohm And Haas Electronic Materials Cmp Holdings, I |
Biased pulse CMP groove pattern
|
US10861702B2
(en)
|
2017-06-14 |
2020-12-08 |
Rohm And Haas Electronic Materials Cmp Holdings |
Controlled residence CMP polishing method
|
US10586708B2
(en)
|
2017-06-14 |
2020-03-10 |
Rohm And Haas Electronic Materials Cmp Holdings, Inc. |
Uniform CMP polishing method
|
US10857648B2
(en)
*
|
2017-06-14 |
2020-12-08 |
Rohm And Haas Electronic Materials Cmp Holdings |
Trapezoidal CMP groove pattern
|
US10857647B2
(en)
*
|
2017-06-14 |
2020-12-08 |
Rohm And Haas Electronic Materials Cmp Holdings |
High-rate CMP polishing method
|
US11471999B2
(en)
|
2017-07-26 |
2022-10-18 |
Applied Materials, Inc. |
Integrated abrasive polishing pads and manufacturing methods
|
WO2019032286A1
(en)
|
2017-08-07 |
2019-02-14 |
Applied Materials, Inc. |
ABRASIVE DISTRIBUTION POLISHING PADS AND METHODS OF MAKING SAME
|
JP6294553B1
(ja)
*
|
2017-10-11 |
2018-03-14 |
光触媒抗菌サービス株式会社 |
端末用充電器
|
KR102026250B1
(ko)
*
|
2018-02-05 |
2019-09-27 |
에스케이실트론 주식회사 |
웨이퍼 연마 장치용 연마 패드 및 그의 제조방법
|
KR20210042171A
(ko)
|
2018-09-04 |
2021-04-16 |
어플라이드 머티어리얼스, 인코포레이티드 |
진보한 폴리싱 패드들을 위한 제형들
|
US11331767B2
(en)
*
|
2019-02-01 |
2022-05-17 |
Micron Technology, Inc. |
Pads for chemical mechanical planarization tools, chemical mechanical planarization tools, and related methods
|
JP7431807B2
(ja)
*
|
2019-04-03 |
2024-02-15 |
株式会社クラレ |
研磨パッド
|
JP7514234B2
(ja)
*
|
2019-06-19 |
2024-07-10 |
株式会社クラレ |
研磨パッド、研磨パッドの製造方法及び研磨方法
|
CN111941251A
(zh)
*
|
2020-07-08 |
2020-11-17 |
上海新昇半导体科技有限公司 |
一种抛光垫、抛光设备及硅片的抛光方法
|
US11878389B2
(en)
|
2021-02-10 |
2024-01-23 |
Applied Materials, Inc. |
Structures formed using an additive manufacturing process for regenerating surface texture in situ
|