ATE249099T1 - Vertikale misfet-bauelemente, cmos- prozessintegration, ram-anwendungen - Google Patents
Vertikale misfet-bauelemente, cmos- prozessintegration, ram-anwendungenInfo
- Publication number
- ATE249099T1 ATE249099T1 AT96870075T AT96870075T ATE249099T1 AT E249099 T1 ATE249099 T1 AT E249099T1 AT 96870075 T AT96870075 T AT 96870075T AT 96870075 T AT96870075 T AT 96870075T AT E249099 T1 ATE249099 T1 AT E249099T1
- Authority
- AT
- Austria
- Prior art keywords
- doped
- layer
- source
- cmos process
- process integration
- Prior art date
Links
- 230000010354 integration Effects 0.000 title 1
- 229910000577 Silicon-germanium Inorganic materials 0.000 abstract 1
- LEVVHYCKPQWKOP-UHFFFAOYSA-N [Si].[Ge] Chemical compound [Si].[Ge] LEVVHYCKPQWKOP-UHFFFAOYSA-N 0.000 abstract 1
Landscapes
- Insulated Gate Type Field-Effect Transistor (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP95870071 | 1995-06-16 | ||
US1047896P | 1996-01-23 | 1996-01-23 | |
US1047996P | 1996-01-23 | 1996-01-23 | |
US1047696P | 1996-01-23 | 1996-01-23 |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE249099T1 true ATE249099T1 (de) | 2003-09-15 |
Family
ID=27443149
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT96870075T ATE249099T1 (de) | 1995-06-16 | 1996-06-17 | Vertikale misfet-bauelemente, cmos- prozessintegration, ram-anwendungen |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPH09232576A (de) |
AT (1) | ATE249099T1 (de) |
DE (1) | DE69629760T2 (de) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE20022706U1 (de) * | 1999-02-24 | 2002-01-24 | Augusto, Carlos Jorge Ramiro Proenca, Lissabon/Lisboa | Misfet |
US6265268B1 (en) * | 1999-10-25 | 2001-07-24 | Advanced Micro Devices, Inc. | High temperature oxide deposition process for fabricating an ONO floating-gate electrode in a two bit EEPROM device |
US6979622B1 (en) * | 2004-08-24 | 2005-12-27 | Freescale Semiconductor, Inc. | Semiconductor transistor having structural elements of differing materials and method of formation |
JP4862254B2 (ja) * | 2004-09-28 | 2012-01-25 | 日産自動車株式会社 | 半導体装置の製造方法 |
CN113725301B (zh) * | 2021-08-31 | 2024-07-02 | 上海积塔半导体有限公司 | 垂直型存储器件及其制备方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0360076A (ja) * | 1989-07-27 | 1991-03-15 | Seiko Instr Inc | 縦型電界効果トランジスタの製造方法 |
JPH07105497B2 (ja) * | 1990-01-31 | 1995-11-13 | 新技術事業団 | 半導体デバイス及びその製造方法 |
JP2678094B2 (ja) * | 1991-03-01 | 1997-11-17 | シャープ株式会社 | ダイナミックランダムアクセスメモリ |
JPH05136406A (ja) * | 1991-03-15 | 1993-06-01 | Hitachi Ltd | 半導体装置 |
JP2851968B2 (ja) * | 1991-04-26 | 1999-01-27 | キヤノン株式会社 | 改良された絶縁ゲート型トランジスタを有する半導体装置及びその製造方法 |
JP3221901B2 (ja) * | 1992-01-06 | 2001-10-22 | 株式会社東芝 | 半導体装置 |
JPH0645598A (ja) * | 1992-07-21 | 1994-02-18 | Fujitsu Ltd | 半導体装置及びその製造方法 |
JP3230846B2 (ja) * | 1992-07-30 | 2001-11-19 | 株式会社東芝 | 半導体装置および半導体集積回路装置 |
JPH06112428A (ja) * | 1992-09-25 | 1994-04-22 | Nec Corp | 半導体メモリおよびその製造方法 |
JP3428124B2 (ja) * | 1994-03-15 | 2003-07-22 | 三菱電機株式会社 | Mis型トランジスタおよびその製造方法 |
JPH0851203A (ja) * | 1994-08-08 | 1996-02-20 | Mitsubishi Electric Corp | 半導体装置およびその製造方法 |
-
1996
- 1996-06-17 AT AT96870075T patent/ATE249099T1/de not_active IP Right Cessation
- 1996-06-17 DE DE69629760T patent/DE69629760T2/de not_active Expired - Lifetime
- 1996-06-17 JP JP8191301A patent/JPH09232576A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
DE69629760D1 (de) | 2003-10-09 |
DE69629760T2 (de) | 2004-07-08 |
JPH09232576A (ja) | 1997-09-05 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |