ZA956035B - Ionizing radiation detector - Google Patents

Ionizing radiation detector

Info

Publication number
ZA956035B
ZA956035B ZA956035A ZA956035A ZA956035B ZA 956035 B ZA956035 B ZA 956035B ZA 956035 A ZA956035 A ZA 956035A ZA 956035 A ZA956035 A ZA 956035A ZA 956035 B ZA956035 B ZA 956035B
Authority
ZA
South Africa
Prior art keywords
pct
ridges
carriers
radiation detector
ionizing radiation
Prior art date
Application number
ZA956035A
Other languages
English (en)
Inventor
John Francis Hassard
Peter Choi
Original Assignee
Imperial College
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Imperial College filed Critical Imperial College
Publication of ZA956035B publication Critical patent/ZA956035B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T3/00—Measuring neutron radiation
    • G01T3/08—Measuring neutron radiation with semiconductor detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/26—Measuring radiation intensity with resistance detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0352—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
    • H01L31/035272—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions characterised by at least one potential jump barrier or surface barrier
    • H01L31/035281—Shape of the body
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/085—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors the device being sensitive to very short wavelength, e.g. X-ray, Gamma-rays
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Light Receiving Elements (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
ZA956035A 1994-08-02 1995-07-19 Ionizing radiation detector ZA956035B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9415584A GB9415584D0 (en) 1994-08-02 1994-08-02 Photo detector

Publications (1)

Publication Number Publication Date
ZA956035B true ZA956035B (en) 1997-01-20

Family

ID=10759275

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA956035A ZA956035B (en) 1994-08-02 1995-07-19 Ionizing radiation detector

Country Status (11)

Country Link
US (1) US6072181A (ja)
EP (1) EP0771426B1 (ja)
JP (1) JP3411580B2 (ja)
AT (1) ATE196690T1 (ja)
AU (1) AU685652B2 (ja)
CA (1) CA2194569C (ja)
DE (1) DE69518986T2 (ja)
GB (2) GB9415584D0 (ja)
TW (1) TW318890B (ja)
WO (1) WO1996004572A1 (ja)
ZA (1) ZA956035B (ja)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69622455T2 (de) * 1995-04-07 2002-11-07 Ishikawajima-Harima Heavy Industries Co., Ltd. Monitor und Verfahren zur Bestimmung der Lage eines Röntgenstrahls
AU6009696A (en) * 1995-06-14 1997-01-15 Imperial College Of Science, Technology And Medicine Neutron detector
FR2757685B1 (fr) * 1996-12-24 1999-05-14 Commissariat Energie Atomique Dispositif de detection de rayonnements ionisants a semi-conducteur de haute resistivite
JP3959188B2 (ja) * 1998-11-12 2007-08-15 株式会社東芝 ストリップ電極型放射線検出装置
SE514472C2 (sv) * 1999-04-14 2001-02-26 Xcounter Ab Strålningsdetektor och en anordning för användning vid radiografi
US6545281B1 (en) * 2001-07-06 2003-04-08 The United States Of America As Represented By The United States Department Of Energy Pocked surface neutron detector
US6897448B2 (en) * 2002-08-29 2005-05-24 Kno-Rad, Inc. Radiation detector
AU2003296919A1 (en) * 2002-10-29 2004-05-25 The Regents Of The University Of Michigan High-efficiency neutron detectors and methods of making same
US7372009B1 (en) * 2002-12-18 2008-05-13 The United States Of America As Represented By The Secretary Of The Navy Solid-state thermal neutron detector
US7745800B1 (en) * 2002-12-18 2010-06-29 The United States Of America As Represented By The Secretary Of The Navy Omni-directional solid-state thermal neutron detector
JP4937749B2 (ja) * 2003-05-09 2012-05-23 ザ リージェンツ オブ ザ ユニバーシティ オブ ミシガン 結晶中に特別なレベルの表面積および気孔率を達成するための方法の実施
EP1689762A4 (en) * 2003-12-05 2009-08-05 Univ Michigan METALLO-ORGANIC POLYEDRE
US7145986B2 (en) * 2004-05-04 2006-12-05 General Electric Company Solid state X-ray detector with improved spatial resolution
WO2006047423A2 (en) 2004-10-22 2006-05-04 The Regents Of The University Of Michigan Covalently linked organic frameworks and polyhedra
JPWO2006104046A1 (ja) * 2005-03-25 2008-09-04 国立大学法人 北海道大学 電気絶縁性高分子材料を使った放射線の線量測定素子および放射線の線量測定装置
ES2558536T3 (es) * 2005-04-07 2016-02-05 The Regents Of The University Of Michigan Technology Management Wolverine Tower Office Adsorción elevada de gas en un marco metal-orgánico con sitios metálicos abiertos
US7799120B2 (en) * 2005-09-26 2010-09-21 The Regents Of The University Of Michigan Metal-organic frameworks with exceptionally high capacity for storage of carbon dioxide at room-temperature
JP4822261B2 (ja) * 2006-01-06 2011-11-24 財団法人高輝度光科学研究センター 放射光モニター装置
WO2007101241A2 (en) 2006-02-28 2007-09-07 The Regents Of The University Of Michigan Preparation of functionalized zeolitic frameworks
GB0622695D0 (en) * 2006-11-14 2006-12-27 Element Six Ltd Robust radiation detector comprising diamond
UA111585C2 (uk) * 2010-01-08 2016-05-25 Трай Альфа Енерджи, Інк. Перетворення високоенергетичних фотонів в електрику
JP5598907B2 (ja) * 2010-03-16 2014-10-01 国立大学法人大阪大学 放射線検出器
US9529098B2 (en) * 2013-09-30 2016-12-27 Uchicago Argonne, Llc X-ray monitoring optical elements
JP7059228B2 (ja) * 2019-06-17 2022-04-25 株式会社東芝 検出素子および検出器

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3824680A (en) * 1968-03-28 1974-07-23 Levina Fizichesky I I Lebedeva Nuclear radiation detector and method of manufacturing same
US3691389A (en) * 1969-06-09 1972-09-12 Ronald Ellis Radiation detector comprising semi-conductor body incorporating a two-dimensional array of p-i-n-devices
JPS58123488A (ja) * 1982-01-19 1983-07-22 Toshiba Corp 放射線検出器
JPS61198668A (ja) * 1985-02-27 1986-09-03 Toshiba Corp イメ−ジセンサの製造方法
JPS62120086A (ja) * 1985-11-20 1987-06-01 Yokogawa Electric Corp 放射線検出装置
US5079425A (en) * 1990-01-10 1992-01-07 Sumitomo Electric Industries, Ltd. Radiation detecting element
GB9018138D0 (en) * 1990-08-17 1990-10-03 De Beers Ind Diamond Diamond alpha particle detector

Also Published As

Publication number Publication date
AU2987995A (en) 1996-03-04
WO1996004572A1 (en) 1996-02-15
AU685652B2 (en) 1998-01-22
GB9415584D0 (en) 1994-09-21
CA2194569C (en) 2007-10-02
JP3411580B2 (ja) 2003-06-03
CA2194569A1 (en) 1996-02-15
GB9512057D0 (en) 1995-08-09
EP0771426A1 (en) 1997-05-07
US6072181A (en) 2000-06-06
JPH10509509A (ja) 1998-09-14
TW318890B (ja) 1997-11-01
EP0771426B1 (en) 2000-09-27
ATE196690T1 (de) 2000-10-15
DE69518986T2 (de) 2001-03-08
DE69518986D1 (de) 2000-11-02

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