WO2023248299A1 - Procédé de diagnostic de dégradation et dispositif de diagnostic de dégradation - Google Patents

Procédé de diagnostic de dégradation et dispositif de diagnostic de dégradation Download PDF

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Publication number
WO2023248299A1
WO2023248299A1 PCT/JP2022/024557 JP2022024557W WO2023248299A1 WO 2023248299 A1 WO2023248299 A1 WO 2023248299A1 JP 2022024557 W JP2022024557 W JP 2022024557W WO 2023248299 A1 WO2023248299 A1 WO 2023248299A1
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WIPO (PCT)
Prior art keywords
surface resistivity
electrical equipment
metal wiring
insulator
deterioration
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PCT/JP2022/024557
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English (en)
Japanese (ja)
Inventor
宗一郎 藤原
勝 衣川
伸介 三木
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三菱電機株式会社
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Priority to PCT/JP2022/024557 priority Critical patent/WO2023248299A1/fr
Publication of WO2023248299A1 publication Critical patent/WO2023248299A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/56—Testing of electric apparatus

Definitions

  • the present disclosure relates to a deterioration diagnosis method and a deterioration diagnosis apparatus for diagnosing deterioration of electrical equipment including insulators.
  • Patent Document 1 International Publication No. 2021/166095
  • Patent Document 2 includes a database that defines the correlation between the resistance value of metal thin film wiring and the surface resistivity of insulators when coming into contact with a specific gas
  • a deterioration diagnosis device has been disclosed that estimates the surface resistivity of an insulator by comparing the resistance value of a metal thin film wiring installed in the vicinity of the insulator.
  • the deterioration diagnosis device calculates the life and remaining life of the electrical equipment from the estimated surface resistivity.
  • the present disclosure has been made to solve the above-mentioned problems, and it is an object of the present disclosure to provide a deterioration diagnosis method and a deterioration diagnosis device that can accurately diagnose the deterioration of electrical equipment over a long period of time.
  • a deterioration diagnosis method diagnoses deterioration of an electrical device including an insulator.
  • the deterioration diagnosis method includes the step of arranging an insulation deterioration sensor around an insulator, in which a plurality of metal wirings that corrode when exposed to a specific gas are connected in parallel.
  • the plurality of metal wires include first metal wires and second metal wires that have different corrosion progression rates when the insulation deterioration sensor is exposed to a specific gas.
  • the deterioration diagnosis method further includes creating in advance a database that defines a first correlation between the combined resistance of the insulation deterioration sensor and the surface resistivity of the insulator when both the insulator and the insulation deterioration sensor are exposed to a specific gas.
  • a step of measuring the composite resistance value of the insulation deterioration sensor at the measurement timing a step of estimating the surface resistivity of the insulator at the measurement timing using the composite resistance value at the measurement timing and the database;
  • the relationship between the operating time of the electrical equipment and the surface resistivity of the insulating material is determined from the operating time of the electrical equipment and the estimated surface resistivity of the insulating material, and the surface resistivity of the insulating material when the electrical equipment is not in use.
  • a step of creating a relational expression expressing the second correlation a step of calculating the life time of the electrical equipment corresponding to the reference surface resistivity when the insulating material loses its insulation performance in the relational expression, and a step of calculating the life time of the electrical equipment from the life time, and calculating the remaining life time of the electrical equipment by subtracting the operating time of the electrical equipment at the timing or the operating time of the electrical equipment at the timing when the insulation deterioration sensor is disposed around the insulator.
  • a deterioration diagnosis device diagnoses deterioration of an electrical device including an insulator.
  • the deterioration diagnosis device includes an insulation deterioration sensor in which a plurality of metal wirings that corrode when exposed to a specific gas are connected in parallel.
  • the plurality of metal wires include first metal wires and second metal wires that have different corrosion progression rates when the insulation deterioration sensor is exposed to a specific gas.
  • the deterioration diagnosis device further includes a database that defines a first correlation between the combined resistance value of the insulation deterioration sensor and the surface resistivity of the insulator when both the insulator and the insulation deterioration sensor are exposed to a specific gas; a measurement unit that measures the composite resistance value of the insulation deterioration sensor at the measurement timing; an estimation unit that estimates the surface resistivity of the insulator at the measurement timing using the composite resistance value at the measurement timing and a database; From the operating time of the equipment, the estimated surface resistivity of the insulating material, and the surface resistivity of the insulating material when the electrical equipment is not in use, the second difference between the operating time of the electrical equipment and the surface resistivity of the insulating material is calculated.
  • a relational expression creation section that creates a relational expression expressing a correlation
  • a life calculation section that calculates the life time of the electrical equipment corresponding to the reference surface resistivity when the insulating material loses its insulation performance in the relational expression
  • a remaining life calculation unit that calculates the remaining life time of the electrical equipment by subtracting the usage time of the electrical equipment at the measurement timing or the usage time of the electrical equipment at the timing when the insulation deterioration sensor is arranged around the insulator.
  • the corrosion progression rates of the first metal wiring and the second metal wiring due to the specific gas are different from each other. Therefore, the range of the surface resistivity of the insulator, which correlates with the combined resistance value of a plurality of metal interconnections including the first metal interconnection and the second metal interconnection, becomes wider. Thereby, the surface resistivity of the insulator can be estimated accurately over a wider range. As a result, the period during which deterioration of the insulator can be accurately diagnosed becomes longer.
  • FIG. 1 is a cross-sectional view schematically showing the configuration of a switchgear that is an example of high-voltage electrical equipment.
  • 3 is a flowchart showing the flow of a deterioration diagnosis method according to the first embodiment. It is a graph schematically showing the relationship between the number of years of use (hours of use) and surface resistivity of electrical equipment.
  • 1 is a schematic diagram of an insulation deterioration sensor according to Embodiment 1.
  • FIG. FIG. 3 is a diagram showing the relationship between the exposure time and the resistance value of the metal wiring when the metal wiring according to the first embodiment is exposed to a specific gas.
  • FIG. 3 is a diagram showing the correlation between the surface resistivity of the insulator and the resistance value of the metal wiring when a specific gas is exposed to the insulator and the metal wiring to be diagnosed.
  • FIG. 3 is a diagram showing the correlation between the surface resistivity of the insulator and the combined resistance value of the metal wiring when a specific gas is exposed to the insulator and the metal wiring connected in parallel.
  • 1 is a block diagram showing a schematic configuration of a deterioration diagnosis device that executes a deterioration diagnosis method according to Embodiment 1.
  • FIG. FIG. 9 is a hardware configuration diagram of the main parts of the control section in FIG. 8; 9 is a block diagram showing a functional configuration of a control section shown in FIG. 8.
  • FIG. FIG. 2 is a schematic diagram of an insulation deterioration sensor according to a second embodiment.
  • FIG. 7 is a diagram showing the relationship between the exposure time and the resistance value of the metal wiring when the metal wiring according to Embodiment 2 is exposed to a specific
  • the method of diagnosing deterioration of electrical equipment according to the first embodiment is a method of diagnosing deterioration of electrical equipment including an insulator.
  • the electrical equipment is, for example, high-voltage electrical equipment or special high-voltage electrical equipment that includes main circuit components such as circuit breakers, disconnectors, transformers, busbars and conductors, and measuring equipment.
  • High voltage means that the DC voltage is more than 750V and less than 7000V, or the AC voltage is more than 600V and less than 7000V.
  • Extra high voltage means that the DC or AC voltage exceeds 7000V.
  • FIG. 1 is a cross-sectional view schematically showing the configuration of a switchgear 49, which is an example of high-voltage electrical equipment.
  • the switchgear 49 includes main circuit components such as a circuit breaker, a disconnector, and a bus bar/conductor supported by an insulator, and a measuring device.
  • the X, Y, and Z axes are orthogonal to each other.
  • the + direction of the Z-axis is assumed to be the upper side, and the - direction of the Z-axis is assumed to be the lower side.
  • the switchgear 49 includes circuit breakers 50a, 50b, three horizontal busbars 52, connection conductors 53a, 54a, 53b, 54b, busbar support plate 56, and cables 57a, 57b. , and a plurality of insulators 58.
  • Circuit breaker 50a includes an operating mechanism 51a and a mold frame 55a.
  • Circuit breaker 50b includes an operating mechanism 51b and a mold frame 55b.
  • the connection conductors 53a, 54a, 53b, and 54b are supported by a plurality of insulators 58.
  • the three horizontal busbars 52 correspond to three phases of three-phase alternating current, respectively.
  • the busbar support plate 56 collectively supports the three horizontal busbars 52.
  • a mold frame 55a containing an operating mechanism 51a and a blocking section (not shown) is mounted on a trolley 61a.
  • a mold frame 55b containing an operating mechanism 51b and a blocking section (not shown) is mounted on a cart 61b.
  • the carts 61a and 61b are movable in the X-axis direction.
  • One end of the connection conductor 53a is electrically connected to the cable 57a.
  • the other end of the connection conductor 53a is electrically connected to the upper terminal of the circuit breaker 50a.
  • One end of the connection conductor 54a is electrically connected to a lower terminal of the circuit breaker 50a.
  • the other end of the connecting conductor 54a is electrically connected to one end of the connecting conductor 53b via the horizontal bus bar 52.
  • the other end of the connecting conductor 53b is connected to the upper terminal of the circuit breaker 50b.
  • One end of the connecting conductor 54b is connected to a lower terminal of the circuit breaker 50b.
  • the other end of the connecting conductor 54b is electrically connected to the cable 57b.
  • Each of the mold frames 55a and 55b, the bus bar support plate 56, or the insulator 58 is an insulator, and is a target of deterioration diagnosis (diagnosis target) in the present disclosure.
  • Examples of the material of the insulator include polyester resin, epoxy resin, or phenol resin.
  • the insulation deterioration sensor 10 is formed separately from the insulator that is the object of diagnosis, and is placed around the object of diagnosis. In FIG. 1, the insulation deterioration sensor 10 is placed near the mold frame 55b. By forming the insulation deterioration sensor 10 as a separate body from the object to be diagnosed, it is possible to suppress electric field concentration from the insulation deterioration sensor 10 to the object to be diagnosed. Furthermore, the insulation deterioration sensor 10 can be easily replaced.
  • FIG. 2 is a flowchart showing the flow of the deterioration diagnosis method according to the first embodiment.
  • FIG. 3 is a graph schematically showing the relationship between the years of use (hours of use) and surface resistivity of electrical equipment.
  • step S1 a specific gas (for example, nitrogen oxides (NOx) or sulfur oxides (SOx)) that affects the deterioration of the diagnosis target is used in the insulation deterioration sensor 10 and the electrical equipment. Exposure (contact) to the subject being diagnosed. By measuring the resistance value of the insulation deterioration sensor 10 and the surface resistivity of the insulator after exposure, a correlation (first correlation) between the resistance value of the insulation deterioration sensor 10 and the surface resistivity of the diagnosis target is defined. A database is created in advance.
  • step S2 the insulation deterioration sensor 10 is placed around the diagnostic target. The area around the diagnostic target is the area covered by the specific gas when the diagnostic target is exposed to the specific gas.
  • NOx nitrogen oxides
  • SOx sulfur oxides
  • step S3 the resistance value of the insulation deterioration sensor 10 is measured at each measurement timing using a simple resistance meter such as a tester. The resistance value is measured periodically or constantly.
  • step S4 the resistance value of the insulation deterioration sensor 10 measured in step S3 is checked against the database created in step S1, and the surface resistivity SR1 of the diagnosis target at the measurement timing of the resistance value is estimated. Note that the measurement timing of the resistance value at which the surface resistivity SR1 is estimated is the number of years of use L1 (years).
  • step S5 the correlation between the surface resistivity and the age of use of the electrical equipment (second A relational expression representing the relationship (correlation) is created.
  • the relational expression represents a deterioration straight line RF1 in which the logarithm of the surface resistivity and the number of years of use of the electrical equipment are linearly related.
  • step S6 the number of life years L2 (life time) corresponding to the threshold value SR2 (reference surface resistivity) of the surface resistivity is calculated from the deterioration straight line RF1.
  • the threshold value SR2 is the surface resistivity when the diagnostic target loses its insulation performance and discharge occurs in the diagnostic target.
  • step S7 by subtracting the service life L1 ( ⁇ L2) of the diagnosis target at the measurement timing of the insulation deterioration sensor 10 or the arrangement timing of the insulation deterioration sensor 10 from the life span L2 of the diagnosis target, the remaining life RL1 of the diagnosis target (remaining life time) is calculated.
  • FIG. 4 is a schematic diagram of the insulation deterioration sensor 10 according to the first embodiment.
  • metal wirings 31a and 31b connected in parallel are formed on the main surface of the insulating substrate 32.
  • the metal wirings 31a and 31b shown in FIG. 4 are made of metal thin films and have a comb shape.
  • the ratio (L/W) of the wiring length L to the wiring width W of the metal wirings 31a and 31b is adjusted (for example, the The shape of the metal wirings 31a and 31b may be other than a comb shape as long as the ratio is 1000 or more).
  • the metal wirings 31a, 31b are excessively thin or long, the impedance of the metal wirings 31a, 31b increases and the detection sensitivity decreases, so the metal wirings 31a, 31b should have appropriate widths and lengths. is desirable. Furthermore, if the metal wirings 31a, 31b are too short, it may become difficult to form and solder the metal wirings 31a, 31b, so it is desirable that the metal wirings 31a, 31b have appropriate lengths. Further, from the viewpoint of suppressing an increase in the impedance of the metal wirings 31a, 31b due to the cross-sectional area, it is desirable that the thickness of the metal wirings 31a, 31b is 0.1 ⁇ m or more.
  • the thickness of the metal wirings 31a and 31b is 30 ⁇ m or less so that the metal wirings 31a and 31b have a resistance (several hundred ⁇ level) that can be easily measured with a tester or the like. Furthermore, in order to measure the resistance of the metal wires 31a, 31b, the metal wires 31a, 31b need to be formed on an insulating substrate. Examples of the material for the insulating substrate 32 include glass, glass epoxy, or paper phenol.
  • the thickness or type of metal of the metal wirings 31a, 31b is set in advance so that the rate of corrosion of the metal wirings 31a, 31b by the specific gas when the insulation deterioration sensor 10 is exposed to the specific gas is different from each other.
  • the metal wirings 31a and 31b are made of the same material, and the thickness of the metal wiring 31b is set to be larger than the thickness of the metal wiring 31a. do.
  • the thickness of the metal wirings 31a and 31b may be made the same, and the material of the metal wiring 31b may be made more specific than the material of the metal wiring 31a. Select materials that are less corrosive to gases.
  • metal material for the metal wirings 31a and 31b As the metal material for the metal wirings 31a and 31b, a metal whose exposure environment to the specific gas can be accurately evaluated, that is, a metal that corrodes when it comes into contact with the specific gas is used.
  • metals that corrode when in contact with specific gases include copper (Cu), copper alloys, silver (Ag), silver alloys, nickel (Ni), nickel alloys, iron (Fe), and iron alloys. .
  • other metal materials may be used as long as they can evaluate the exposure environment of the specific gas.
  • Methods for forming the metal wirings 31a and 31b include sputtering, vapor deposition, and plating, but there is no need to be limited to these methods.
  • An electrode pad 33a_1 is arranged near one end of the metal wiring 31a, and an electrode pad 33a_2 is arranged near the other end of the metal wiring 31a.
  • An electrode pad 33b_1 is arranged near one end of the metal wiring 31b, and an electrode pad 33b_2 is arranged near the other end of the metal wiring 31b.
  • Electrode pads 33a_1, 33b_1 are connected to lead wire 34_1.
  • Electrode pads 33a_2, 33b_2 are connected to lead wire 34_2. Thereby, metal wirings 31a and 31b are connected in parallel.
  • FIG. 5 is a diagram showing the relationship between the exposure time and the resistance value of the metal wiring when the metal wiring according to the first embodiment is exposed to a specific gas.
  • FIG. 5 shows graphs 35a, 35b, and 37 in which the horizontal axis represents exposure time and the vertical axis represents resistance value.
  • a graph 35a shows a change in the resistance value of the metal wiring 31a between the electrode pads 33a_1 and 33a_2.
  • Graph 35b shows a change in the resistance value of metal wiring 31b between electrode pads 33b_1 and 33b_2.
  • a graph 37 shows a change in the resistance value between the lead wires 34_1 and 34_2, that is, the combined resistance value of the metal wires 31a and 31b connected in parallel.
  • the exposure time range 36b in which the resistance value of 31b changes has a region that does not overlap with each other.
  • the range 36a is an exposure time range in which the time rate of change in resistance value of the metal wiring 31a when exposed to the specific gas is equal to or greater than ⁇ Rmax_a, where ⁇ Rmax_a is the maximum value of the rate of change in resistance value over time. be.
  • the range 36b is the range of exposure time in which the time rate of change in resistance value of the metal wiring 31b when exposed to the specific gas is equal to or greater than ⁇ Rmax_b, where ⁇ Rmax_b is the maximum value of the rate of change in resistance value over time. It is. ⁇ is predetermined and is, for example, 0.1.
  • FIG. 6 is a diagram showing the correlation between the surface resistivity of the insulator and the resistance value of the metal wires 31a, 31b when the insulator and the metal wires 31a, 31b to be diagnosed are exposed to a specific gas.
  • FIG. 6 shows a case where the thickness or type of metal of the metal wirings 31a and 31b is set so that the rate of corrosion of the metal wiring 31b due to the specific gas is slower than the rate of corrosion of the metal wiring 31a due to the specific gas.
  • the correlation is shown.
  • the range of surface resistivity of the insulator (1 ⁇ 10 8 to 1 ⁇ 10 11 ⁇ / ⁇ ) that correlates with the resistance value of the metal interconnect 31b correlates with the resistance value of the metal interconnect 31a. It is smaller than the range of surface resistivity of insulators (1 ⁇ 10 11 to 1 ⁇ 10 15 ⁇ / ⁇ ).
  • FIG. 7 is a diagram showing the correlation between the surface resistivity of the insulator and the combined resistance value of the metal wires 31a, 31b when a specific gas is exposed to the insulator and the metal wires 31a, 31b connected in parallel.
  • the correlation shown in FIG. 7 is calculated from the correlation between the surface resistivity of the insulator and the resistance values of the metal wirings 31a and 31b shown in FIG.
  • the surface resistivity of the insulator can be estimated from the resistance value of the insulation deterioration sensor 10 (that is, the combined resistance value of the metal wirings 31a and 31b).
  • the correlation coefficient between the combined resistance value of the metal wirings 31a and 31b connected in parallel and the surface resistivity of the insulator should be 0.5 or more. is preferred. Therefore, the thickness, metal type, width, length, etc. of the metal wirings 31a, 31b are adjusted depending on the insulator to be diagnosed so that the correlation coefficient is 0.5 or more.
  • a single metal wiring is used.
  • the range of the surface resistivity of the insulator that correlates with the resistance value of the metal wiring is 1 ⁇ 10 11 to 1 ⁇ 10 15 ⁇ / ⁇ (Fig. (see 6). Therefore, the range in which the surface resistivity of the insulator can be estimated is also 1 ⁇ 10 11 to 1 ⁇ 10 15 ⁇ / ⁇ . Furthermore, when the metal wiring is disconnected, the resistance value changes rapidly, which may lead to incorrect diagnosis.
  • metal wirings 31a and 31b are used which are connected in parallel and have different corrosion progression rates due to a specific gas.
  • the rate of corrosion of the metal wiring 31b caused by the specific gas is slower than the rate of corrosion of the metal wiring 31a caused by the specific gas. Therefore, the range of surface resistivity of the insulator that correlates with the combined resistance value of the metal wirings 31a and 31b is 1 ⁇ 10 7 to 1 ⁇ 10 15 ⁇ / ⁇ , which correlates with the resistance value of the metal wiring 31a or the metal wiring 31b.
  • the range is wider than the range of surface resistivity of insulators. Thereby, the surface resistivity of the insulator can be estimated accurately over a wider range. Further, even if the metal wiring 31a is disconnected, the combined resistance value does not change suddenly. Therefore, incorrect diagnosis is suppressed.
  • FIG. 8 is a block diagram showing a schematic configuration of a deterioration diagnosis apparatus 100 that executes the deterioration diagnosis method according to the first embodiment.
  • the deterioration diagnosis device 100 is realized in the form of a control board whose operation is controlled by a program recorded on a recording medium such as a ROM (Read Only Memory).
  • the control board is an example of implementation of the deterioration diagnosis device 100, and the hardware configuration of the deterioration diagnosis device 100 is not limited to the configuration shown in FIG. 8.
  • the deterioration diagnosis device 100 includes an insulation deterioration sensor 10, a measurement section 20, an input section 101, a storage section 102, a control section 103, and an output section 104.
  • the measurement unit 20 measures the combined resistance value of a plurality of metal wirings connected in parallel in the insulation deterioration sensor 10. Specifically, the measuring unit 20 measures the resistance value between the lead wires 34_1 and 34_2 shown in FIG. 4 as the combined resistance value of the metal wires 31a and 31b connected in parallel.
  • the measuring unit 20 is configured by, for example, a tester, and measures the combined resistance value by applying a predetermined voltage (for example, 100 V) between the lead wires 34_1 and 34_2.
  • the input unit 101 includes, for example, an input device such as a keyboard, a mouse, or a tablet, and a communication port that can communicate with the measurement unit 20 or an external device.
  • the input unit 101 receives input of data necessary for diagnosing deterioration of a diagnosis target 55 (for example, mold frames 55a, 55b).
  • a diagnosis target 55 for example, mold frames 55a, 55b.
  • the resistance value of the insulation deterioration sensor 10 when the insulation deterioration sensor 10 and the polyester insulator are exposed to a specific gas (that is, the combined resistance value of a plurality of metal wirings connected in parallel) and the surface resistivity of the polyester insulator A database 70 defining correlations between the two is input to the input unit 101 prior to deterioration diagnosis.
  • the database 70 is created in advance based on preliminary experiments.
  • the resistance value of the insulation deterioration sensor 10 when the insulation deterioration sensor 10 and the polyester insulator are exposed to a specific gas that is, the combined resistance value of a plurality of metal wirings connected in parallel
  • Resistance change data indicating a change over time
  • the input unit 101 receives input of the combined resistance value measured by the measurement unit 20.
  • the storage unit 102 is a memory device including, for example, a ROM, a RAM (Random Access Memory), and a hard disk.
  • the storage unit 102 stores a program for executing the deterioration diagnosis method, a database 70 for calculating the surface resistivity from the combined resistance value, various data input to the input unit 101, and the like.
  • the database 70 defines the correlation between the surface resistivity of the insulator and the combined resistance value of the plurality of metal wirings (see FIG. 7) when a specific gas is exposed to the insulator and the plurality of metal wirings connected in parallel. .
  • the database 70 is created by an external device and stored in the storage unit 102 via the input unit 101. Alternatively, the database 70 may be created by the control unit 103 based on the resistance change data input to the input unit 101 and stored in the storage unit 102.
  • the control unit 103 is realized, for example, by a microprocessor (MPU: Micro-Processing Unit).
  • MPU Micro-Processing Unit
  • the control unit 103 reads the program stored in the storage unit 102 and executes processing related to deterioration diagnosis according to the procedure described in the program.
  • FIG. 9 is a hardware configuration diagram of the main parts of the control unit 103 in FIG. 8. Each function of the control unit 103 can be realized by the processing circuit 1.
  • the processing circuit 1 includes at least one processor 1b and at least one memory 1c.
  • the processing circuit 1 may include at least one dedicated hardware 1a together with a processor 1b and a memory 1c, or as a substitute thereof.
  • each function of the deterioration diagnosis device 100 is realized by software, firmware, or a combination of software and firmware. At least one of the software and firmware is written as a program. The program is stored in the memory 1c.
  • the processor 1b implements each function of the deterioration diagnosis device 100 by reading and executing programs stored in the memory 1c.
  • the processor 1b is also called a CPU (Central Processing Unit), a processing device, an arithmetic device, a microprocessor, a microcomputer, or a DSP.
  • the memory 1c is configured of a nonvolatile or volatile semiconductor memory, such as a RAM, a ROM, a flash memory, an Erasable Programmable Read Only Memory (EPROM), an Electrically Erasable Programmable Read Only Memory (EEPROM), or the like.
  • the processing circuit 1 may include, for example, a single circuit, a composite circuit, a programmed processor, a parallel programmed processor, an ASIC (Application Specific Integrated Circuit), or an FPGA (Field Programmable Circuit). Gate Array), or a combination of these.
  • ASIC Application Specific Integrated Circuit
  • FPGA Field Programmable Circuit
  • Each of the plurality of functions of the deterioration diagnosis device 100 can be realized by the processing circuit 1.
  • a plurality of functions of the deterioration diagnosis device 100 may be realized by the processing circuit 1 all at once.
  • a part may be realized by dedicated hardware 1a, and other parts may be realized by software or firmware.
  • the processing circuit 1 can realize each function of the deterioration diagnosis device 100 using the hardware 1a, software, firmware, or a combination thereof.
  • the output unit 104 shown in FIG. 8 outputs the diagnosis result based on the remaining life calculated by the control unit 103 to the external output device 200.
  • Output device 200 may include, for example, a wireless device, a printer, a display, or a combination thereof.
  • FIG. 10 is a block diagram showing the functional configuration of the control section shown in FIG. 8.
  • the control unit 103 includes an estimation unit 72, a relational expression creation unit 73, a lifespan calculation unit 74, and a remaining lifespan calculation unit 75.
  • the estimation unit 72 estimates the surface resistivity of the object to be diagnosed.
  • the relational expression creation unit 73 creates a relational expression between the number of years of use of the diagnostic target and the surface resistivity of the diagnostic target.
  • the lifespan calculation unit 74 calculates the lifespan of the diagnosis target.
  • the remaining life calculation unit 75 calculates the remaining life of the diagnostic target.
  • the estimating unit 72 compares the combined resistance value measured by the measuring unit 20 after the insulation deterioration sensor 10 is placed around the diagnostic target with the database 70, and estimates the surface resistivity of the diagnostic target. That is, the estimation unit 72 executes the process of step S4 in FIG.
  • the relational expression creation unit 73 connects the point corresponding to the estimated surface resistivity of the diagnostic target and the point corresponding to the surface resistivity of the diagnostic target whose usage age is 0 years (new or unused product) to determine the diagnostic target. Create a relational expression between the years of use and the surface resistivity of the diagnostic target. That is, the relational expression creation unit 73 executes the process of step S5 in FIG.
  • the lifespan calculation unit 74 calculates the number of years of lifespan of the diagnosis target based on the relational expression created by the relational expression creation unit 73 and a predetermined threshold value. That is, the life calculation unit 74 executes the process of step S6 in FIG. 2.
  • the remaining life calculation unit 75 subtracts the number of years of use of the diagnostic target at the measurement timing of the composite resistance value of the insulation deterioration sensor 10 or the placement timing of the insulation deterioration sensor 10 from the life years calculated by the life calculation unit 74, and calculates the remaining life. Calculate. That is, the remaining life calculation unit 75 executes the process of step S7 in FIG.
  • the corrosion progress rates of the metal wirings 31a and 31b due to the specific gas are different from each other. Therefore, the range of the surface resistivity of the insulator that correlates with the combined resistance value of the metal wirings 31a and 31b becomes wider. Thereby, the surface resistivity of the insulator can be estimated accurately over a wider range. As a result, the period during which deterioration of electrical equipment (for example, switchgear 49) including an insulator can be accurately diagnosed becomes longer.
  • the thickness or type of metal of the metal wirings 31a, 31b is set in advance so that the rate of corrosion of the metal wirings 31a, 31b by the specific gas is different from each other.
  • one of the metal wirings 31a and 31b may be covered with a coating film so that the rates of corrosion of the metal wirings 31a and 31b due to the specific gas are different from each other.
  • FIG. 11 is a schematic diagram of an insulation deterioration sensor according to the second embodiment.
  • the insulation deterioration sensor shown in FIG. 11 is different from the insulation deterioration sensor shown in FIG. 3 in that the metal wiring 31b is covered with a coating film 40.
  • the coating film 40 is formed by applying a coating agent onto the metal wiring 31b.
  • Coating agents used include polyurethane, silicone, and silica, but are not necessarily limited to these.
  • FIG. 12 is a diagram showing the relationship between the exposure time and the resistance value of the metal wiring when the metal wiring according to the second embodiment is exposed to a specific gas.
  • FIG. 12 shows graphs 45a, 45b, and 47 in which the horizontal axis represents exposure time and the vertical axis represents resistance value.
  • a graph 45a shows a change in the resistance value of the metal wiring 31a between the electrode pads 33a_1 and 33a_2.
  • Graph 45b shows a change in the resistance value of metal wiring 31b between electrode pads 33b_1 and 33b_2.
  • a graph 47 shows a change in the resistance value between the lead wires 34_1 and 34_2, that is, the combined resistance value of the metal wires 31a and 31b connected in parallel.
  • the range of exposure time in which the resistance value of the metal wiring 31a changes when the insulation deterioration sensor according to the second embodiment is exposed to a specific gas is 46a and an exposure time range 46b in which the resistance value of the metal wiring 31b changes when the metal wiring 31b is exposed to a specific gas have regions that do not overlap with each other.
  • the position of the range 46b depends on the length of the dead period of the metal wiring 31b.
  • the length of the dead period of the metal wiring 31b depends on the thickness of the coating film 40. Therefore, the thickness of the coating film 40 may be adjusted so that the range 46a and the range 46b do not overlap each other. Thereby, the range of the surface resistivity of the insulator that correlates with the combined resistance value of the metal wirings 31a and 31b becomes wider.
  • the coating film 40 By forming the coating film 40, contact between the metal wiring 31b and objects (for example, people, dust, etc.) that may cause detection failure is prevented. As a result, occurrence of phenomena such as unintentional disconnection of a part of the metal wiring 31b is suppressed.
  • the metal wiring 31a may also be covered with the coating film 40. This prevents contact between the object and the metal wiring 31a, which would cause detection failure.
  • the thickness of the coating film 40 covering the metal wiring 31a may be set to be thinner than the thickness of the coating film 40 covering the metal wiring 31b. As a result, the rate of corrosion of the metal wiring 31b becomes slower than the rate of corrosion of the metal wiring 31a.
  • Embodiment 3 In the first and second embodiments, an insulation deterioration sensor in which two metal wirings 31a and 31b are connected in parallel is used.
  • the number of metal wirings connected in parallel is not limited to two, and may be three or more. By using more metal wiring, multiple items that affect the insulation performance of the insulator can be taken into consideration, making it possible to diagnose deterioration that is more environmentally friendly.
  • the insulation deterioration sensor may include another metal wire connected in parallel to the metal wires 31a and 31b.
  • the range of exposure time in which the resistance value of the other metal wiring changes when the other metal wiring is exposed to the specific gas has a region that does not overlap with the ranges 36a and 36b corresponding to the metal wirings 31a and 31b.
  • Embodiments 1 to 3 a switchgear was used as an example of an electrical device, but the electrical device is not limited to a switchgear. If an insulating material is used to insulate the current-carrying parts of electrical equipment from ground to ground or between phases, and if the configuration is to diagnose the deterioration status of the insulation performance of the insulating material, Embodiments 1 to 3 may be used in the configuration. It is possible to obtain similar effects.
  • Examples of electrical equipment include switch gears, power receiving and distribution equipment, transformers, control gears such as motor control centers, generators, electric motors, and power supply devices for power supply (for example, AC power supplies, DC power supplies, or rectifiers).
  • 1 processing circuit 1a hardware, 1b processor, 1c memory, 10 insulation deterioration sensor, 20 measurement unit, 31a, 31b metal wiring, 32 insulating substrate, 33a_1, 33a_2, 33b_1, 33b-2 electrode pad, 34_1, 34_2 lead wire , 40 coating film, 49 switch gear, 50a, 50b circuit breaker, 51a, 51b operating mechanism, 52 horizontal busbar, 53a, 53b, 54a, 54b connection conductor, 55 diagnosis target, 55a, 55b mold frame, 56 busbar support plate, 57a, 57b cable, 58 insulator, 61a, 61b trolley, 70 database, 72 estimation section, 73 relational expression creation section, 74 lifespan calculation section, 75 remaining lifespan calculation section, 100 deterioration diagnosis device, 101 input section, 102 storage section, 103 control unit, 104 output unit, 200 output device.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)

Abstract

Un procédé de diagnostic de dégradation selon la présente invention comprend une étape consistant à agencer un capteur de dégradation d'isolation dans l'environnement d'un isolant. Une pluralité de pièces de câblage métallique sont reliées en parallèle au niveau du capteur de dégradation d'isolation. La pluralité de pièces de câblage métallique comprennent un premier câblage métallique et un second câblage métallique qui présentent des vitesses de progression de corrosion différentes. Le procédé de diagnostic de dégradation comprend une étape (S4) dans laquelle une valeur de résistance combinée pour le capteur de dégradation d'isolation à un instant de mesure et une base de données qui définit une première corrélation entre la valeur de résistance combinée pour le capteur de dégradation d'isolation et la résistivité de surface de l'isolant sont utilisées pour estimer la résistivité de surface de l'isolant à l'instant de mesure, une étape (S6) dans laquelle une expression relationnelle qui indique une seconde corrélation entre la résistivité de surface de l'isolant et le temps d'utilisation d'un appareil électrique est utilisée pour calculer la durée de vie de l'appareil électrique, et une étape (S7) dans laquelle la durée de vie restante de l'appareil électrique à laquelle le temps d'utilisation de l'appareil électrique à l'instant de mesure a été soustrait est calculée à partir de la durée de vie.
PCT/JP2022/024557 2022-06-20 2022-06-20 Procédé de diagnostic de dégradation et dispositif de diagnostic de dégradation WO2023248299A1 (fr)

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JP2000131363A (ja) * 1998-10-20 2000-05-12 Toshiba Corp 電子装置の寿命診断方法及び装置
JP2001215187A (ja) * 2000-02-01 2001-08-10 Toshiba Corp 劣化診断方法およびその装置
JP2015002600A (ja) * 2013-06-14 2015-01-05 三菱電機株式会社 受配電機器の余寿命診断方法および余寿命診断装置
JP2016151466A (ja) * 2015-02-17 2016-08-22 富士電機株式会社 絶縁特性測定装置、及びそれを用いた絶縁特性の測定方法、並びに、余寿命診断方法
JP2017198547A (ja) * 2016-04-27 2017-11-02 株式会社東芝 絶縁劣化試験装置および絶縁劣化試験方法
JP2020003277A (ja) * 2018-06-27 2020-01-09 三菱電機株式会社 受配電機器の短絡余寿命診断方法および短絡余寿命診断システム
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JP2000131363A (ja) * 1998-10-20 2000-05-12 Toshiba Corp 電子装置の寿命診断方法及び装置
JP2001215187A (ja) * 2000-02-01 2001-08-10 Toshiba Corp 劣化診断方法およびその装置
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