WO2022234848A1 - 信号伝達装置および絶縁モジュール - Google Patents
信号伝達装置および絶縁モジュール Download PDFInfo
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- WO2022234848A1 WO2022234848A1 PCT/JP2022/019530 JP2022019530W WO2022234848A1 WO 2022234848 A1 WO2022234848 A1 WO 2022234848A1 JP 2022019530 W JP2022019530 W JP 2022019530W WO 2022234848 A1 WO2022234848 A1 WO 2022234848A1
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- Prior art keywords
- coil
- signal
- chip
- insulating layer
- conductive portion
- Prior art date
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- 230000008054 signal transmission Effects 0.000 title claims abstract description 103
- 239000003990 capacitor Substances 0.000 claims description 171
- 239000000758 substrate Substances 0.000 claims description 54
- 239000000463 material Substances 0.000 claims description 37
- 238000009413 insulation Methods 0.000 claims description 36
- 239000011347 resin Substances 0.000 claims description 21
- 229920005989 resin Polymers 0.000 claims description 21
- 239000010949 copper Substances 0.000 claims description 18
- 229910052802 copper Inorganic materials 0.000 claims description 14
- 229910052782 aluminium Inorganic materials 0.000 claims description 13
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 6
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 5
- 239000011521 glass Substances 0.000 claims description 5
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 4
- 230000011664 signaling Effects 0.000 claims description 3
- 239000010410 layer Substances 0.000 description 209
- PDJZASCRQRBYQS-UHFFFAOYSA-N n-benzyl-4-[4-(3-chlorophenyl)-1h-pyrazol-3-yl]-1h-pyrrole-2-carboxamide Chemical compound ClC1=CC=CC(C=2C(=NNC=2)C=2C=C(NC=2)C(=O)NCC=2C=CC=CC=2)=C1 PDJZASCRQRBYQS-UHFFFAOYSA-N 0.000 description 18
- DOLQYFPDPKPQSS-UHFFFAOYSA-N 3,4-dimethylaniline Chemical compound CC1=CC=C(N)C=C1C DOLQYFPDPKPQSS-UHFFFAOYSA-N 0.000 description 15
- 238000007789 sealing Methods 0.000 description 15
- 239000004065 semiconductor Substances 0.000 description 15
- CUKZXTKQBXLMDO-UHFFFAOYSA-N 2-[(5-hex-1-yn-1-ylfuran-2-yl)carbonyl]-n-methylhydrazinecarbothioamide Chemical compound CCCCC#CC1=CC=C(C(=O)NNC(=S)NC)O1 CUKZXTKQBXLMDO-UHFFFAOYSA-N 0.000 description 14
- 230000000052 comparative effect Effects 0.000 description 13
- 239000010931 gold Substances 0.000 description 9
- 230000001681 protective effect Effects 0.000 description 9
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 description 8
- 229910052737 gold Inorganic materials 0.000 description 8
- 238000002161 passivation Methods 0.000 description 8
- 229910052709 silver Inorganic materials 0.000 description 8
- 239000010936 titanium Substances 0.000 description 8
- 229910052721 tungsten Inorganic materials 0.000 description 8
- 239000010944 silver (metal) Substances 0.000 description 7
- 230000005540 biological transmission Effects 0.000 description 6
- 230000012447 hatching Effects 0.000 description 5
- 238000002955 isolation Methods 0.000 description 5
- 229910052581 Si3N4 Inorganic materials 0.000 description 4
- 150000001875 compounds Chemical class 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 230000004907 flux Effects 0.000 description 4
- 230000004048 modification Effects 0.000 description 4
- 238000012986 modification Methods 0.000 description 4
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 4
- 229910010271 silicon carbide Inorganic materials 0.000 description 4
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 4
- 238000004804 winding Methods 0.000 description 4
- 230000015556 catabolic process Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000000149 penetrating effect Effects 0.000 description 3
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 2
- 229910002601 GaN Inorganic materials 0.000 description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 2
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- NWAIGJYBQQYSPW-UHFFFAOYSA-N azanylidyneindigane Chemical compound [In]#N NWAIGJYBQQYSPW-UHFFFAOYSA-N 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 2
- 239000003822 epoxy resin Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 239000012777 electrically insulating material Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000009719 polyimide resin Substances 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/18—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different subgroups of the same main group of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49517—Additional leads
- H01L23/49531—Additional leads the additional leads being a wiring board
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F27/00—Details of transformers or inductances, in general
- H01F27/28—Coils; Windings; Conductive connections
- H01F27/2804—Printed windings
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/01—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate comprising only passive thin-film or thick-film elements formed on a common insulating substrate
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- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F27/00—Details of transformers or inductances, in general
- H01F27/28—Coils; Windings; Conductive connections
- H01F27/2804—Printed windings
- H01F2027/2809—Printed windings on stacked layers
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- H01L2224/0554—External layer
- H01L2224/0555—Shape
- H01L2224/05552—Shape in top view
- H01L2224/05554—Shape in top view being square
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- H01L2224/0554—External layer
- H01L2224/0556—Disposition
- H01L2224/05567—Disposition the external layer being at least partially embedded in the surface
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- H01L2224/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
- H01L2224/061—Disposition
- H01L2224/0612—Layout
- H01L2224/0613—Square or rectangular array
- H01L2224/06132—Square or rectangular array being non uniform, i.e. having a non uniform pitch across the array
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- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
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- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45117—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
- H01L2224/45124—Aluminium (Al) as principal constituent
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- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45144—Gold (Au) as principal constituent
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- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45147—Copper (Cu) as principal constituent
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- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
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- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
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- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06527—Special adaptation of electrical connections, e.g. rewiring, engineering changes, pressure contacts, layout
- H01L2225/06531—Non-galvanic coupling, e.g. capacitive coupling
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- H01L23/495—Lead-frames or other flat leads
- H01L23/49541—Geometry of the lead-frame
- H01L23/49562—Geometry of the lead-frame for devices being provided for in H01L29/00
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- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/73—Means for bonding being of different types provided for in two or more of groups H01L24/10, H01L24/18, H01L24/26, H01L24/34, H01L24/42, H01L24/50, H01L24/63, H01L24/71
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L25/0655—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00 the devices being arranged next to each other
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/01—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate comprising only passive thin-film or thick-film elements formed on a common insulating substrate
- H01L27/016—Thin-film circuits
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
- H01L2924/141—Analog devices
- H01L2924/1426—Driver
Definitions
- the present disclosure relates to signal transmission devices and isolation modules.
- Patent Document 1 describes a semiconductor integrated circuit as an insulated gate driver that includes a transformer having a first coil on the primary side and a second coil on the secondary side.
- the gate driver has an insulating element such as a transformer used for insulating the primary side circuit and the secondary side circuit.
- a gate driver may be required to have an improved withstand voltage.
- Such a problem is not limited to gate drivers, and can similarly occur in signal transmission devices and isolation modules that insulate primary and secondary circuits and transmit signals.
- a signal transmission device for solving the above problems comprises a first chip including a primary side circuit, a primary side die pad on which the first chip is mounted, an insulating chip, and the primary side circuit via the insulating chip.
- a second chip including a secondary circuit configured to at least one of transmit and receive a signal; a secondary die pad on which the second chip is mounted; and the primary die pad or the secondary an insulating plate interposed between a side die pad and the insulating chip, the insulating chip having a front surface on which a first pad and a second pad are formed, and a back surface opposite to the front surface.
- an insulating layer and a first insulating element and a second insulating element provided in the element insulating layer, wherein the first insulating element is closer to the front surface than to the back surface in the element insulating layer.
- a first surface-side conductive portion disposed and electrically connected to the first pad; and a first surface-side conductive portion disposed closer to the back surface than the surface in the element insulating layer, and and a first back-side conductive portion arranged opposite to the thickness direction of the insulating layer, wherein the second insulating element is arranged closer to the front surface than the back surface in the element insulating layer, and the second a second surface-side conductive portion electrically connected to a pad; and a second surface-side conductive portion disposed closer to the back surface than the front surface in the element insulating layer in the thickness direction of the second surface-side conductive portion and the element insulating layer.
- first back-side conductive portion and the second back-side conductive portion are electrically connected, and the first back-side conductive portion and the The primary side circuit is electrically connected via the first pad, and the second surface side conductive portion and the secondary side circuit are electrically connected via the second pad.
- An insulation module for solving the above problems is an insulation module comprising an insulation unit having an element insulation layer and a first insulation element and a second insulation element embedded in the element insulation layer, wherein the element insulation layer comprises: It has a surface on which a first pad and a second pad are formed and a back surface opposite to the surface, and the first insulating element is arranged closer to the surface than the back surface in the element insulating layer.
- first surface-side conductive portion electrically connected to the first pad; and a first surface-side conductive portion disposed closer to the back surface than the front surface in the element insulating layer, the first surface-side conductive portion and the element insulating layer the second insulating element is arranged closer to the front surface than the back surface in the element insulating layer, and is connected to the second pad a second surface-side conductive portion electrically connected to a second surface-side conductive portion disposed closer to the back surface than the front surface in the element insulating layer and opposed to the second surface-side conductive portion in the thickness direction of the element insulating layer; and a second back-side conductive portion disposed, wherein the first back-side conductive portion and the second back-side conductive portion are electrically connected.
- the signal transmission device and the insulation module it is possible to improve the withstand voltage.
- FIG. 1 is a circuit diagram schematically showing the circuit configuration of the signal transmission device of the first embodiment.
- FIG. 2 is a cross-sectional view schematically showing the cross-sectional structure of the signal transmission device of FIG. 3 is a plan view schematically showing a planar structure of a transformer chip of the signal transmission device of FIG. 2.
- FIG. 4 is a cross-sectional view schematically showing the cross-sectional structure of the transformer chip of FIG. 3 taken along a plane perpendicular to the thickness direction of the transformer chip.
- FIG. 5 is a cross-sectional view schematically showing the cross-sectional structure along line 5-5 of the transformer chip in FIG.
- FIG. 6 is a cross-sectional view schematically showing the cross-sectional structure of the transformer chip of FIG.
- FIG. 7 is a plan view schematically showing a planar structure of a transformer chip of a comparative example.
- FIG. 8 is a cross-sectional view schematically showing a cross-sectional structure of a transformer chip of a comparative example cut along a plane perpendicular to the thickness direction of the transformer chip.
- 9 is a cross-sectional view schematically showing the cross-sectional structure of the transformer chip of FIG. 7 taken along line 9-9.
- FIG. 10 is a circuit diagram schematically showing the circuit configuration of the signal transmission device of the second embodiment.
- 11 is a cross-sectional view schematically showing the cross-sectional structure of the signal transmission device of FIG. 10.
- FIG. 12 is a plan view schematically showing a planar structure of a capacitor chip of the signal transmission device of FIG. 11.
- FIG. FIG. 13 is a cross-sectional view schematically showing a cross-sectional structure of the capacitor chip of FIG. 12 taken along a plane perpendicular to the thickness direction of the capacitor chip.
- 14 is a cross-sectional view schematically showing the cross-sectional structure of the capacitor chip of FIG. 12 taken along line 14-14.
- 15 is a cross-sectional view schematically showing the cross-sectional structure of the capacitor chip of FIG. 12 taken along line 15-15.
- FIG. 16 is a cross-sectional view schematically showing a cross-sectional structure of a transformer chip of a modification taken along a plane perpendicular to the thickness direction of the transformer chip.
- FIG. 17 is a cross-sectional view schematically showing the cross-sectional structure of the transformer chip of FIG. 16 taken along line 17-17.
- FIG. 18 is a plan view schematically showing the planar structure of the transformer chip of the modification.
- FIG. 19 is a cross-sectional view schematically showing the cross-sectional structure of the transformer chip of FIG. 18 cut along a plane perpendicular to the thickness direction of the transformer chip.
- FIG. 1 shows a simplified example of the circuit configuration of the signal transmission device 10. As shown in FIG.
- the signal transmission device 10 is a device that electrically insulates between a primary side terminal 11 and a secondary side terminal 12 while transmitting a pulse signal.
- the signal transmission device 10 is a digital isolator, one example of which is a DC/DC converter.
- the signal transmission device 10 includes a primary circuit 13 electrically connected to a primary terminal 11, a secondary circuit 14 electrically connected to a secondary terminal 12, and a primary circuit 13.
- a signal transmission circuit 10 ⁇ /b>A having a transformer 15 electrically insulating the secondary side circuit 14 is provided.
- the transformer 15 corresponds to an "insulating element".
- the primary side circuit 13 is a circuit configured to operate when a first voltage is applied.
- the primary circuit 13 is electrically connected, for example, to an external control device (not shown).
- the secondary circuit 14 is a circuit configured to operate when a second voltage different from the first voltage is applied.
- the second voltage is higher than the first voltage, for example.
- the first voltage and the second voltage are DC voltages.
- Secondary circuit 14 is electrically connected to, for example, a drive circuit to be controlled by the control device.
- a drive circuit is a switching circuit.
- the signal transmission device 10 of the present embodiment when a control signal from an external control device (not shown) is input to the primary side terminal 11 , the signal is transmitted from the primary side circuit 13 to the secondary side circuit 14 via the transformer 15 . , and the signal is output from the secondary side circuit 14 to the drive circuit via the secondary side terminal 12 .
- the primary side circuit 13 and the secondary side circuit 14 are electrically insulated by the transformer 15 . More specifically, the transformer 15 restricts the transmission of the DC voltage between the primary circuit 13 and the secondary circuit 14, while allowing the transmission of the pulse signal.
- the state in which the primary side circuit 13 and the secondary side circuit 14 are insulated means the state in which the transmission of the DC voltage is interrupted between the primary side circuit 13 and the secondary side circuit 14. This means that the transmission of the pulse signal from the primary side circuit 13 to the secondary side circuit 14 is permitted.
- the dielectric strength of the signal transmission device 10 is, for example, 2500 Vrms or more and 7500 Vrms or less.
- the dielectric breakdown voltage of the signal transmission device 10 of this embodiment is approximately 5000 Vrms.
- the specific numerical value of the withstand voltage of the signal transmission device 10 is not limited to this and is arbitrary.
- the ground of the primary side circuit 13 and the ground of the secondary side circuit 14 are provided independently.
- the signal transmission device 10 of this embodiment includes two transformers 15 for transmitting two types of signals from the primary circuit 13 to the secondary circuit 14 . More specifically, the signal transmission device 10 includes a transformer 15 used to transmit a first signal from the primary circuit 13 to the secondary circuit 14 and a second signal from the primary circuit 13 to the secondary circuit 14 . and a transformer 15 used for transmission of two signals.
- the first signal is a signal containing rise information of the external signal input to the signal transmission device 10
- the second signal is a signal containing fall information of the external signal.
- a pulse signal is generated by the first signal and the second signal.
- transformer 15 used for transmitting the first signal is referred to as “transformer 15A”
- transformer 15 used for transmitting the second signal is referred to as “transformer 15B”.
- the transformer 15A corresponds to the "first signal transformer”
- the transformer 15B corresponds to the "second signal transformer”.
- the signal transmission device 10 includes a primary signal line 16A connecting the primary circuit 13 and the transformer 15A, and a primary signal line 16B connecting the primary circuit 13 and the transformer 15B. . Therefore, the primary signal line 16A transmits the first signal from the primary circuit 13 to the transformer 15A. The primary signal line 16B transmits the second signal from the primary circuit 13 to the transformer 15B.
- the signal transmission device 10 includes a secondary signal line 17A connecting the transformer 15A and the secondary circuit 14, and a secondary signal line 17B connecting the secondary circuit 14 and the transformer 15B. . Therefore, the secondary signal line 17A transmits the first signal from the transformer 15A to the secondary circuit 14. FIG. The secondary side signal line 17B transmits the second signal from the transformer 15B to the secondary side circuit 14 .
- the transformer 15A transmits the first signal from the primary circuit 13 to the secondary circuit 14 and electrically isolates the primary circuit 13 and the secondary circuit 14 from each other.
- the transformer 15A has a first transformer 21A and a second transformer 22A connected in series.
- the first transformer 21A corresponds to the "first insulating element”
- the second transformer 22A corresponds to the "second insulating element”.
- the signal transmission device 10 includes a pair of connection signal lines 18A and 19A that connect the first transformer 21A and the second transformer 22A. Therefore, the pair of connection signal lines 18A and 19A are signal lines through which the first signal is transmitted.
- the dielectric breakdown voltage of each transformer 21A, 22A in this embodiment is, for example, 2500 Vrms or more and 7500 Vrms or less.
- the dielectric strength of each transformer 21A, 22A may be 2500 Vrms or more and 5700 Vrms or less.
- the dielectric strength of each transformer 21A, 22A can be changed arbitrarily.
- the first transformer 21A has a first coil 31A and a second coil 32A that is electrically insulated from the first coil 31A and can be magnetically coupled.
- the second transformer 22A has a first coil 33A and a second coil 34A electrically insulated from and magnetically coupled to the first coil 33A.
- the first coil 31A is connected to the primary side circuit 13 by the primary side signal line 16A, and is also connected to the ground of the primary side circuit 13. That is, the first end of the first coil 31A is electrically connected to the primary circuit 13, and the second end of the first coil 31A is electrically connected to the ground of the primary circuit 13. there is
- the second coil 32A is connected to the second coil 34A by a pair of connection signal lines 18A, 19A.
- the second coil 32A and the second coil 34A are connected together so as to be electrically floating.
- a first end of the second coil 32A and a first end of the second coil 34A are connected by a connection signal line 18A.
- a second end of the second coil 32A and a second end of the second coil 34A are connected by a connection signal line 19A.
- the second coil 32A and the second coil 34A serve as relay coils that relay the transmission of the first signal between the first coil 31A and the first coil 33A.
- the first coil 33A is connected to the secondary circuit 14 by the secondary signal line 17A, and is also connected to the ground of the secondary circuit 14. That is, the first end of the first coil 33A is electrically connected to the secondary circuit 14, and the second end of the first coil 33A is electrically connected to the ground of the secondary circuit 14. there is
- the transformer 15B transmits the second signal from the primary circuit 13 to the secondary circuit 14 and electrically isolates the primary circuit 13 and the secondary circuit 14 from each other.
- the transformer 15B has a first transformer 21B and a second transformer 22B connected in series.
- the first transformer 21B corresponds to the "first insulating element”
- the second transformer 22B corresponds to the "second insulating element”.
- the signal transmission device 10 includes a pair of connection signal lines 18B and 19B that connect the first transformer 21B and the second transformer 22B. Therefore, the pair of connection signal lines 18B and 19B are signal lines for transmitting the second signal.
- the first transformer 21B has a first coil 31B and a second coil 32B that is electrically insulated from the first coil 31B and can be magnetically coupled.
- the second transformer 22B has a first coil 33B and a second coil 34B electrically insulated from the first coil 33B and capable of magnetic coupling.
- the dielectric strength voltage of the first transformer 21B is the same as the dielectric strength voltage of the first transformer 21A
- the dielectric strength voltage of the second transformer 22B is the same as the dielectric strength voltage of the second transformer 22A. Since the connection configuration of the first transformer 21B and the second transformer 22B is the same as the connection configuration of the first transformer 21A and the second transformer 22A, detailed description thereof will be omitted.
- the first signal output from the primary circuit 13 is transmitted to the secondary circuit 14 via the first transformer 21A and the second transformer 22A.
- the second signal output from the primary circuit 13 is transmitted to the secondary circuit 14 via the first transformer 21B and the second transformer 22B.
- FIG. 2 shows an example of a schematic cross-sectional view showing the internal configuration of part of the signal transmission device 10.
- the signal transmission device 10 is a semiconductor device in which a plurality of semiconductor chips are packaged.
- the package format of the signal transmission device 10 is, for example, an SO (Small Outline) system, and in this embodiment, it is an SOP (Small Outline Package). Note that the package format of the signal transmission device 10 can be arbitrarily changed.
- the signal transmission device 10 includes a first chip 40, a second chip 50, and a transformer chip 60 as semiconductor chips, a primary die pad 70 on which the first chip 40 is mounted, and a secondary die pad 70 on which the second chip 50 is mounted.
- a side die pad 80 and a sealing resin 90 for sealing the die pads 70, 80 and the chips 40, 50, 60 are provided.
- the transformer chip 60 corresponds to an "insulating chip”.
- the sealing resin 90 is made of an electrically insulating material, such as a black epoxy resin.
- the sealing resin 90 is formed in a rectangular plate shape having a thickness direction in the z direction.
- Both the primary die pad 70 and the secondary die pad 80 are made of a material containing conductors.
- each die pad 70, 80 is made of a material containing Cu (copper).
- the die pads 70 and 80 may be made of another metal material such as Al (aluminum).
- the primary die pad 70 and the secondary die pad 80 are arranged apart from each other.
- the direction in which the primary die pads 70 and the secondary die pads 80 are arranged when viewed from the z direction is defined as the x direction.
- a direction perpendicular to the x direction when viewed from the z direction is the y direction. Therefore, in this embodiment, the x direction corresponds to the "first direction” and the y direction corresponds to the "second direction".
- Both the primary die pad 70 and the secondary die pad 80 are formed in a flat plate shape.
- the shapes of the primary die pad 70 and the secondary die pad 80 when viewed in the z-direction are rectangular.
- each die pad 70, 80 has the short-side direction in the x-direction and the long-side direction in the y-direction.
- the area of the primary die pad 70 viewed in the z direction is larger than the area of the secondary die pad 80 viewed in the z direction.
- the shape of each die pad 70, 80 viewed from the z-direction can be arbitrarily changed. In one example, when viewed from the z direction, the primary die pad 70 has the long side direction in the x direction and the short side direction in the y direction.
- Both the first chip 40 and the transformer chip 60 are mounted on the primary die pad 70 .
- a second chip 50 is mounted on the secondary die pad 80 .
- Each chip 40, 50, 60 is spaced apart from each other in the x-direction.
- the chips 40, 50, 60 are arranged in the order of the first chip 40, the transformer chip 60, and the second chip 50 from the primary die pad 70 toward the secondary die pad 80 in the x direction. ing.
- the transformer chip 60 is arranged between the first chip 40 and the second chip 50 in the x-direction.
- the die pads 70 and 80 are not exposed from the sealing resin 90 .
- the first chip 40 includes the primary side circuit 13.
- the shape of the first chip 40 viewed in the z-direction is a rectangle having short sides and long sides.
- the first chip 40 is mounted on the primary die pad 70 so that its short sides are along the x-direction and its long sides are along the y-direction.
- the first chip 40 has a chip main surface 40s and a chip rear surface 40r facing opposite sides in the z-direction.
- a chip rear surface 40r of the first chip 40 is bonded to the primary die pad 70 with a conductive bonding material SD such as solder or Ag (silver) paste.
- a plurality of first electrode pads 41 and a plurality of second electrode pads 42 are provided on the chip main surface 40s of the first chip 40 .
- Each electrode pad 41 , 42 is electrically connected to the primary circuit 13 .
- the plurality of first electrode pads 41 are arranged on the opposite side of the chip main surface 40s from the transformer chip 60 with respect to the center of the chip main surface 40s in the x direction. Although not shown, the plurality of first electrode pads 41 are arranged apart from each other in the y direction.
- the plurality of second electrode pads 42 are arranged closer to the transformer chip 60 with respect to the center of the chip main surface 40s in the x direction in the chip main surface 40s. Although not shown, the plurality of second electrode pads 42 are arranged apart from each other in the y direction.
- the second chip 50 includes the secondary circuit 14.
- the shape of the second chip 50 viewed in the z-direction is a rectangle having short sides and long sides.
- the second chip 50 is mounted on the secondary die pad 80 so that its short sides are along the x-direction and its long sides are along the y-direction.
- the second chip 50 has a chip main surface 50s and a chip rear surface 50r facing opposite sides in the z-direction.
- a chip rear surface 50r of the second chip 50 is bonded to the secondary die pad 80 with a conductive bonding material SD.
- a plurality of first electrode pads 51 and a plurality of second electrode pads 52 are provided on the chip main surface 50s of the second chip 50 .
- Each electrode pad 51 , 52 is electrically connected to the secondary circuit 14 .
- the plurality of first electrode pads 51 are arranged closer to the transformer chip 60 with respect to the center of the chip main surface 50s in the x direction in the chip main surface 50s. Although not shown, the plurality of first electrode pads 51 are arranged apart from each other in the y direction.
- the plurality of second electrode pads 52 are arranged on the opposite side of the chip main surface 50s from the transformer chip 60 with respect to the center of the chip main surface 50s in the x direction. Although not shown, the plurality of second electrode pads 42 are arranged apart from each other in the y direction.
- the transformer chip 60 includes both transformers 15A and 15B.
- the shape of the transformer chip 60 viewed in the z-direction is a rectangle having short sides and long sides.
- the transformer chip 60 is mounted on the primary die pad 70 so that the long side extends along the y direction and the short side extends along the x direction when viewed from the z direction.
- the transformer chip 60 is arranged next to the first chip 40 in the x direction.
- the distance between the second chip 50 and the transformer chip 60 is greater than the distance between the first chip 40 and the transformer chip 60 when viewed in the z direction.
- the transformer chip 60 is arranged closer to the first chip 40 than the second chip 50 is.
- the transformer chip 60 has a chip main surface 60s and a chip rear surface 60r facing opposite to each other in the z-direction.
- the chip main surface 60 s faces the same side as the chip main surface 40 s of the first chip 40
- the chip rear surface 60 r faces the same side as the chip rear surface 40 r of the first chip 40 .
- An insulating plate 100 is interposed between the transformer chip 60 and the primary side die pad 70 . That is, the insulating plate 100 is mounted on the primary die pad 70 and the transformer chip 60 is mounted on the insulating plate 100 .
- the insulating plate 100 is formed of an insulating substrate containing alumina or an insulating substrate containing glass.
- the insulating plate 100 may be made of an insulating resin.
- the insulating resin may be applied to the chip back surface 60 r of the transformer chip 60 .
- the insulating resin (in other words, the insulating plate 100) is integrated with the transformer chip 60. As shown in FIG.
- the shape of the insulating plate 100 viewed from the z-direction is a rectangle having long sides and short sides.
- the insulating plate 100 is mounted on the primary die pad 70 so that the long sides thereof extend along the y direction and the short sides thereof extend along the x direction when viewed from the z direction.
- the size of the insulating plate 100 viewed in the z direction is equal to the size of the transformer chip 60 viewed in the z direction.
- the size of the insulating plate 100 viewed from the z-direction can be arbitrarily changed. In one example, the size of the insulating plate 100 viewed in the z-direction may be larger than the size of the transformer chip 60 viewed in the z-direction.
- the insulating plate 100 has a principal surface 100s and a rear surface 100r facing opposite sides.
- the main surface 100 s faces the same side as the chip main surface 60 s of the transformer chip 60
- the rear surface 100 r faces the same side as the chip rear surface 60 r of the transformer chip 60 .
- a rear surface 100r of the insulating plate 100 is bonded to the primary die pad 70 with a conductive bonding material SD.
- a transformer chip 60 is mounted on the main surface 100 s of the insulating plate 100 .
- the height of the chip main surface 60s of the transformer chip 60 from the primary side die pad 70 is the same as that of the chip main surface 40s of the first chip 40. It is higher than both the height from the side die pad 70 and the height of the chip main surface 50s of the second chip 50 from the secondary side die pad 80 .
- the transformer chip 60 has a plurality of first electrode pads 61 and a plurality of second electrode pads 62 .
- Each first electrode pad 61 and each second electrode pad 62 are provided on the chip main surface 60s. More specifically, each first electrode pad 61 and each second electrode pad 62 are provided so as to be exposed from the chip main surface 60s when viewed in the z direction.
- Each first electrode pad 61 is arranged closer to the first chip 40 than the center of the transformer chip 60 in the x direction.
- Each second electrode pad 62 is arranged closer to the second chip 50 than the center of the transformer chip 60 in the x direction.
- a plurality of wires W are connected to each of the first chip 40 , the transformer chip 60 and the second chip 50 .
- Each wire W is a bonding wire formed by a wire bonding apparatus, and is made of a conductor such as Au (gold), Al, Cu, or the like.
- a plurality of first electrode pads 41 of the first chip 40 are individually connected by a plurality of wires W to a plurality of primary side leads (not shown).
- the primary lead is a component that constitutes the primary terminal 11 in FIG. 1 and is made of the same material as the primary die pad 70 .
- the primary lead is arranged on the side opposite to the secondary die pad 80 with respect to the primary die pad 70 and is formed across the sealing resin 90 . In other words, the primary lead has a portion protruding outside from the sealing resin 90 . Thereby, the primary side circuit 13 and the primary side terminal 11 are electrically connected.
- a plurality of second electrode pads 42 of the first chip 40 are individually connected to a plurality of first electrode pads 61 of the transformer chip 60 by a plurality of wires W.
- the primary side circuit 13 and each transformer 21A, 21B are electrically connected.
- a plurality of second electrode pads 62 of the transformer chip 60 are individually connected to a plurality of first electrode pads 51 of the second chip 50 by a plurality of wires W.
- the transformers 22A and 22B (see FIG. 1) and the secondary circuit 14 are electrically connected.
- the plurality of second electrode pads 52 of the second chip 50 are individually connected by a plurality of wires W to a plurality of secondary leads (not shown).
- the secondary lead is a component that constitutes the secondary terminal 12 in FIG. 1 and is made of the same material as the secondary die pad 80 .
- the secondary lead is spaced apart from the secondary die pad 80 on the side opposite to the primary die pad 70 and formed across the sealing resin 90 . That is, the secondary lead has a portion protruding outside from the sealing resin 90 . Thereby, the secondary circuit 14 and the secondary terminal 12 are electrically connected.
- FIG. 3 is a plan view schematically showing the planar structure of the transformer chip 60.
- FIG. 4 is a cross-sectional view schematically showing the cross-sectional structure of the transformer chip 60 taken along the xy plane. In FIG. 4, hatching lines are omitted from the viewpoint of visibility of the drawing.
- 5 and 6 show the cross-sectional structure of the transformer chip 60 mounted on the primary die pad 70.
- FIG. 5 and 6 are schematic cross-sectional structures of the transformer chip 60, and the number of layered element insulating layers 64 described later is not limited to the number of layered element insulating layers 64 in FIGS.
- the direction from the chip rear surface 60r of the transformer chip 60 to the chip main surface 60s is defined as upward, and the direction from the chip main surface 60s to the chip rear surface 60r is defined as downward.
- the transformer chip 60 includes both transformers 15A and 15B, and more specifically, both transformers 15A and 15B are integrated into one chip. That is, the transformer chip 60 is a chip dedicated to both the transformers 15A and 15B, different from the first chip 40 and the second chip 50. FIG.
- the transformers 21A and 21B are arranged closer to the first chip 40 (see FIG. 2) than the center of the transformer chip 60 in the x direction when viewed from the z direction.
- the transformers 22A and 22B are arranged closer to the second chip 50 (see FIG. 2) than the center of the transformer chip 60 in the x-direction.
- the first transformer 21A and the first transformer 21B are arranged at the same position in the x direction and separated from each other in the y direction.
- the second transformer 22A and the second transformer 22B are arranged at the same position in the x direction and spaced apart from each other in the y direction.
- the first transformer 21A and the second transformer 22A are arranged at the same position in the y direction and separated from each other in the x direction.
- the first transformer 21B and the second transformer 22B are arranged at the same position in the y direction and separated from each other in the x direction.
- the first coil 31A (31B) of the first transformer 21A (21B) and the first coil 33A (33B) of the second transformer 22A (22B) are arranged at x They are arranged with a gap in the direction (first direction).
- the first coil 31A of the first transformer 21A and the first coil 31B of the first transformer 21B are arranged with a gap in the y direction (second direction).
- the first coil 33A of the second transformer 22A and the first coil 33B of the second transformer 22B are arranged with a gap in the y direction (second direction).
- the first coil 31A, the first coil 31B, the first coil 33A, and the first coil 33B are arranged at the same positions in the z direction.
- One or more of Ti (titanium), TiN (titanium nitride), Au, Ag, Cu, Al, and W (tungsten) is appropriately selected for each of the coils 31A, 31B, 33A, and 33B.
- each coil 31A, 31B, 33A, 33B is made of a material containing Cu.
- each coil 31A, 31B, 33A, 33B has the same shape.
- Each of the coils 31A, 31B, 33A, and 33B includes a coil portion 35 formed in a spiral shape, a first end portion 36 extending inward from the coil portion 35, and a coil portion extending outward from the coil portion 35. and a withdrawn second end 37 .
- a first end 36 of each coil 31A, 31B is an end electrically connected to the primary circuit 13 (see FIG. 1), and a second end 37 of each coil 31A, 31B is connected to the primary circuit. 13 is the end electrically connected to the ground.
- a first end 36 of each coil 33A, 33B is an end electrically connected to the secondary circuit 14 (see FIG. 1), and a second end 37 of each coil 33A, 33B is connected to the secondary circuit. 14 is an end electrically connected to the ground.
- a plurality of (three in this embodiment) first electrode pads 61 are individually electrically connected to the first coils 31A and 31B of the transformers 21A and 21B.
- a plurality (three in this embodiment) of the second electrode pads 62 are electrically connected individually to the first coils 33A and 33B of the transformers 22A and 22B.
- the plurality of first electrode pads 61 are arranged closer to the first chip 40 (see FIG. 2) than the center of the chip main surface 60s in the x direction in the chip main surface 60s.
- the plurality of first electrode pads 61 are arranged apart from each other in the y direction.
- the plurality of second electrode pads 62 are arranged closer to the second chip 50 (see FIG. 2) than the center of the chip main surface 60s in the x direction in the chip main surface 60s.
- Each electrode pad 61, 62 is made of a material containing Al, for example.
- the plurality of first electrode pads 61 are arranged at positions overlapping the first ends 36 of the first coils 31A and 31B when viewed in the y direction.
- the plurality of second electrode pads 62 are arranged at positions overlapping the first ends 36 of the first coils 33A and 33B when viewed in the y direction.
- the three first electrode pads 61 are referred to as first electrode pads 61A, 61B and 61C
- the three second electrode pads 62 are referred to as second electrode pads 62A, 62B and 62C.
- the first electrode pads 61A and 61B correspond to the "first pad”
- the first electrode pad 61C corresponds to the "third pad”.
- the second electrode pads 62A and 62B correspond to the "second pad”
- the second electrode pad 62C corresponds to the "fourth pad”.
- the first electrode pad 61A When viewed from the z-direction, the first electrode pad 61A is displaced from the center of the first coil 31A.
- the center of the first coil 31A is the center of the coil portion 35 of the first coil 31A. That is, the center of the first coil 31A is the winding center of the first coil 31A.
- the first electrode pad 61A is arranged at a position that does not overlap the center of the first coil 31A when viewed in the z direction. Thereby, the eddy current generated in the first electrode pad 61A by the magnetic flux generated from the first coil 31A can be reduced.
- the first electrode pad 61A When viewed from the z-direction, the first electrode pad 61A is arranged inside the coil portion 35 of the first coil 31A. In other words, the coil portion 35 of the first coil 31A is formed so as to surround the first electrode pad 61A. That is, it can be said that the first electrode pad 61A is arranged inside the first coil 31A. In this embodiment, the first electrode pad 61A is arranged inside the first coil 31A and at a position shifted from the center of the first coil 31A. A first end portion 36 of the first coil 31A is electrically connected to the first electrode pad 61A.
- the first electrode pad 61B When viewed from the z-direction, the first electrode pad 61B is displaced from the center of the first coil 31B.
- the center of the first coil 31B is the center of the coil portion 35 of the first coil 31B. That is, the center of the first coil 31B is the winding center of the first coil 31B.
- the first electrode pad 61B is arranged at a position that does not overlap the center of the first coil 31B when viewed in the z direction. Thereby, the eddy current generated in the first electrode pad 61B by the magnetic flux generated from the first coil 31B can be reduced.
- the first electrode pad 61B When viewed from the z-direction, the first electrode pad 61B is arranged inside the coil portion 35 of the first coil 31B. In other words, the coil portion 35 of the first coil 31B is formed so as to surround the first electrode pad 61B. That is, it can be said that the first electrode pad 61B is arranged inside the first coil 31B. In this embodiment, the first electrode pad 61B is arranged inside the first coil 31B and at a position shifted from the center of the first coil 31B. A first end portion 36 of the first coil 31B is electrically connected to the first electrode pad 61B.
- the first electrode pad 61C When viewed from the z direction, the first electrode pad 61C is arranged between the coil portion 35 of the first coil 31A and the coil portion 35 of the first coil 31B in the y direction. It can also be said that the first electrode pad 61C is arranged between the first electrode pads 61A and 61B in the y direction when viewed from the z direction. In this embodiment, the first electrode pads 61A, 61B, 61C are arranged at the same position in the x direction and spaced apart from each other in the y direction. A second end portion 37 of the first coil 31A and a second end portion 37 of the first coil 31B are electrically connected to the first electrode pad 61C.
- the second electrode pad 62A When viewed from the z-direction, the second electrode pad 62A is displaced from the center of the first coil 33A.
- the center of the first coil 33A is the center of the coil portion 35 of the first coil 33A. That is, the center of the first coil 33A is the winding center of the first coil 33A.
- the second electrode pad 62A is arranged at a position that does not overlap the center of the first coil 33A when viewed in the z direction. Thereby, the eddy current generated in the second electrode pad 62A by the magnetic flux generated from the first coil 33A can be reduced.
- the second electrode pad 62A When viewed from the z direction, the second electrode pad 62A is arranged inside the coil portion 35 of the first coil 33A.
- the coil portion 35 of the first coil 33A is formed so as to surround the second electrode pad 62A. That is, it can be said that the second electrode pad 62A is arranged inside the first coil 33A.
- the second electrode pad 62A is arranged inside the first coil 33A and at a position shifted from the center of the first coil 33A.
- a first end portion 36 of the first coil 33A is electrically connected to the second electrode pad 62A.
- the second electrode pad 62B When viewed from the z-direction, the second electrode pad 62B is displaced from the center of the first coil 33B.
- the center of the first coil 33B is the center of the coil portion 35 of the first coil 33B. That is, the center of the first coil 33B is the winding center of the first coil 33B.
- the second electrode pad 62B is arranged at a position that does not overlap the center of the first coil 33B when viewed in the z direction. Thereby, the eddy current generated in the second electrode pad 62B by the magnetic flux generated from the first coil 33B can be reduced.
- the second electrode pad 62B When viewed from the z-direction, the second electrode pad 62B is arranged inside the coil portion 35 of the first coil 33B.
- the coil portion 35 of the first coil 33B is formed so as to surround the second electrode pad 62B. That is, it can be said that the second electrode pad 62B is arranged inside the first coil 33B.
- the second electrode pad 62B is arranged inside the first coil 33B and at a position shifted from the center of the first coil 33B.
- a first end portion 36 of the first coil 33B is electrically connected to the second electrode pad 62B.
- the second electrode pad 62C When viewed from the z direction, the second electrode pad 62C is arranged between the coil portion 35 of the first coil 33A and the coil portion 35 of the first coil 33B in the y direction. It can also be said that the second electrode pad 62C is arranged between the second electrode pads 62A and 62B in the y direction when viewed from the z direction. In this embodiment, the second electrode pads 62A, 62B, 62C are arranged at the same position in the x direction and spaced apart from each other in the y direction. The second electrode pad 62C is electrically connected to the second end 37 of the first coil 33A and the second end 37 of the first coil 33B.
- the first electrode pads 61A and the second electrode pads 62A are arranged at the same position in the y direction and spaced apart from each other in the x direction.
- the first electrode pads 61B and the second electrode pads 62B are arranged at the same position in the y direction and spaced apart from each other in the x direction.
- the first electrode pads 61C and the second electrode pads 62C are arranged at the same position in the y direction and spaced apart from each other in the x direction.
- the arrangement relationship between the electrode pads 61A to 61C and the electrode pads 62A to 62C is not limited to the arrangement relationship between the electrode pads 61A to 61C and the electrode pads 62A to 62C shown in FIG. is.
- the second coil 32A and the second coil 34A are formed as a first coil 38A integrated with each other. More specifically, the first coil 38A has a first loop-shaped conductive portion 39A, a second loop-shaped conductive portion 39B, a third loop-shaped conductive portion 39C, and a fourth loop-shaped conductive portion 39D.
- the first loop-shaped conductive portion 39A, the second loop-shaped conductive portion 39B, the third loop-shaped conductive portion 39C, and the fourth loop-shaped conductive portion 39D have similar shapes.
- the second loop-shaped conductive portion 39B is arranged to surround the first loop-shaped conductive portion 39A
- the third loop-shaped conductive portion 39C is arranged to surround the second loop-shaped conductive portion 39B
- the fourth loop-shaped conductive portion 39D is arranged so as to surround the third loop-shaped conductive portion 39C.
- the number of loop-shaped conductive portions is four like the first to fourth loop-shaped conductive portions 39A to 39D, but the number is not limited to this.
- the number of loop-shaped conductive parts can be changed arbitrarily.
- the first loop-shaped conductive portion 39A has a first facing portion 39p, a second facing portion 39q, and a connecting portion 39r.
- the first facing portion 39p, the second facing portion 39q, and the connecting portion 39r are integrated.
- the integrated first facing portion 39p, second facing portion 39q, and connecting portion 39r form a loop shape.
- the first facing portion 39p and the second facing portion 39q are arranged at the same position in the y direction and separated from each other in the x direction.
- the first facing portion 39p is arranged to face the first coil 31A in the z-direction, and constitutes the second coil 32A.
- the shape of the first facing portion 39p when viewed in the z direction is an annular shape with an open portion near the second facing portion 39q in the x direction.
- the second facing portion 39q is arranged to face the first coil 33A in the z-direction, and constitutes the second coil 34A.
- the shape of the second facing portion 39q when viewed in the z direction is formed in an annular shape with an open portion closer to the first facing portion 39p in the x direction. In this manner, when viewed from the z-direction, the first facing portion 39p and the second facing portion 39q are formed in an open annular shape that is open so as to face each other.
- the connecting portion 39r connects the first facing portion 39p and the second facing portion 39q.
- the connecting portion 39r includes a first connecting portion 39ra and a second connecting portion 39rb.
- the first connecting portion 39ra has a first open end that is an open annular first end of the first facing portion 39p and a first open end that is an open annular first end of the second facing portion 39q. is connected with
- the second connecting portion 39rb has a second open end that is an open annular second end of the first facing portion 39p and a second open end that is an open annular second end of the second facing portion 39q. is connected with
- the connecting portion 39r connects the open ends of the opposing portions 39p and 39q.
- Each connecting portion 39ra, 39rb is formed in a straight line extending along the x direction.
- the second to fourth loop-shaped conductive portions 39B to 39D also have a first facing portion 39p, a second facing portion 39q, and a connecting portion 39r.
- the second coil 32B and the second coil 34B are formed as a second coil 38B integrated with each other.
- the second coil 38B has the same shape as the first coil 38A. Therefore, detailed description of the second coil 38B is omitted.
- One or more of Ti, TiN, Au, Ag, Cu, Al, and W are appropriately selected for the second coils 32A, 32B, 34A, and 34B.
- the second coils 32A, 32B, 34A, 34B are made of a material containing Al.
- the number of turns of the first coil 31A and the number of turns of the second coil 32A are the same.
- the outer diameter of the coil portion 35 of the first coil 31A and the outer diameter of the second coil 32A are equal.
- the outer diameter of the second coil 32A is the outer diameter of the first facing portion 39p (see FIG. 4) of the fourth loop-shaped conductive portion 39D.
- the relationship between the first coil 31B and the second coil 32B is the same as that of the first coil 31A and the second coil 32A.
- the winding direction of the coil portion 35 of the first coil 31A and the winding direction of the coil portion 35 of the first coil 31B are the same.
- the winding direction of the coil portion 35 of the first coil 33A and the winding direction of the coil portion 35 of the first coil 33B are the same. Therefore, as shown in FIG. 3, the first coil 33A and the first coil 33B are arranged point-symmetrically about the second electrode pad 62C. Also, the first coil 31A and the first coil 31B are arranged so as to be point-symmetrical about the first electrode pad 61C.
- the transformer chip 60 has a substrate 63 and an element insulating layer 64 formed on the substrate 63 .
- Substrate 63 is formed of, for example, a semiconductor substrate.
- the substrate 63 is a substrate made of a material containing Si (silicon).
- the substrate 63 may use a wide bandgap semiconductor or a compound semiconductor as a semiconductor substrate.
- the substrate 63 may be an insulating substrate made of a material containing glass instead of the semiconductor substrate.
- a wide bandgap semiconductor is a semiconductor substrate having a bandgap of 2.0 eV or more.
- the wide bandgap semiconductor may be SiC (silicon carbide).
- the compound semiconductor may be a III-V compound semiconductor.
- the compound semiconductor may contain at least one of AlN (aluminum nitride), InN (indium nitride), GaN (gallium nitride), and GaAs (gallium arsenide).
- the substrate 63 has a substrate front surface 63s and a substrate rear surface 63r facing opposite sides in the z-direction.
- the substrate rear surface 63 r constitutes the chip rear surface 60 r of the transformer chip 60 . Therefore, the substrate rear surface 63r is joined to the main surface 100s of the insulating plate 100. As shown in FIG.
- a plurality of element insulating layers 64 are laminated in the z-direction on the substrate surface 63s of the substrate 63 .
- the z direction can also be said to be the thickness direction of the element insulating layer 64 .
- the total thickness of the plurality of device insulating layers 64 is thicker than the thickness of the substrate 63 .
- the number of lamination of the element insulating layers 64 is set according to the withstand voltage required for the transformer chip 60 . Therefore, the total thickness of the plurality of element insulating layers 64 may be thinner than the thickness of the substrate 63 depending on the number of stacked element insulating layers 64 .
- the element insulating layer 64 has a first insulating film 64A and a second insulating film 64B formed on the first insulating film 64A.
- the first insulating film 64A is, for example, an etching stopper film, and is made of a material containing SiN (silicon nitride), SiC, SiCN (nitrogen-added silicon carbide), or the like.
- the first insulating film 64A is made of a material containing SiN.
- the second insulating film 64B is an interlayer insulating film, for example, and is an oxide film made of a material containing SiO 2 (silicon oxide). As shown in FIGS. 5 and 6, the second insulating film 64B is thicker than the first insulating film 64A.
- the thickness of the first insulating film 64A may be 100 nm or more and less than 1000 nm.
- the thickness of the second insulating film 64B may be 1000 nm or more and 3000 nm or less. In this embodiment, the thickness of the first insulating film 64A is, for example, approximately 300 nm, and the thickness of the second insulating film 64B is, for example, approximately 2000 nm.
- a first electrode pad 61 and a second electrode pad 62 are provided on the surface 64 s of the element insulating layer 64 .
- the surface 64s of the element insulating layer 64 is the surface of the uppermost element insulating layer 64 among the plurality of element insulating layers 64 stacked in the z direction.
- the back surface 64 r of the element insulating layer 64 faces the opposite side to the front surface 64 s of the element insulating layer 64 and faces the substrate surface 63 s of the substrate 63 .
- the back surface 64r of the element insulating layer 64 is in contact with the substrate front surface 63s of the substrate 63 .
- the rear surface 64r of the element insulating layer 64 is the rear surface of the lowermost element insulating layer 64 among the plurality of element insulating layers 64 stacked in the z direction.
- the transformer chip 60 further has a protective film 65 formed on the surface 64 s of the element insulating layer 64 and a passivation film 66 formed on the protective film 65 .
- the protective film 65 is a film that protects the element insulating layer 64, and is formed of, for example, a silicon oxide film.
- Passivation film 66 is a surface protective film of transformer chip 60 and is formed of, for example, a silicon nitride film. The passivation film 66 constitutes the chip main surface 60 s of the transformer chip 60 .
- the first electrode pad 61 and the second electrode pad 62 are covered with a protective film 65 and a passivation film 66.
- the protective film 65 and the passivation film 66 are provided with openings for exposing the first electrode pads 61 and the second electrode pads 62 . Therefore, the electrode pads 61 and 62 are provided with exposed surfaces for connecting the wires W to each other.
- the first coils 31A, 31B, 33A, 33B are provided inside the element insulating layer 64.
- the first coil 38A is provided within the element insulating layer 64 .
- each of the loop-shaped conductive portions 39A-39D is provided within the element insulating layer 64.
- the second coil 38B is provided within the element insulating layer 64 . Therefore, it can also be said that the second coils 32A, 32B, 34A, and 34B are provided within the element insulating layer 64 .
- the first coils 31A, 31B, 33A, and 33B are arranged at the same positions in the z direction.
- the first coils 31A, 31B, 33A, and 33B are provided on the same element insulation layer 64 among the plurality of element insulation layers 64 .
- the first coils 31A, 31B, 33A, and 33B are provided in the element insulating layer 64 one layer below the uppermost element insulating layer 64 among the plurality of element insulating layers 64 .
- it can be said that the first coils 31A, 31B, 33A, and 33B are embedded in the element insulating layer 64 .
- the second coils 32A, 32B, 34A, and 34B are arranged at the same positions in the z direction.
- the first coil 38A is provided on the same element insulation layer 64 among the plurality of element insulation layers 64 .
- the first facing portion 39p, the second facing portion 39q, and the connecting portion 39r of the first coil 38A are provided on the same element insulating layer 64 out of the plurality of element insulating layers 64 . Therefore, it can be said that the second coils 32A and 34A are connected to each other in the same element insulating layer 64 . It can also be said that the second coils 32B and 34B are connected to each other in the same element insulating layer 64 .
- the second coils 32A, 32B, 34A, and 34B are provided in the lowest element insulating layer 64 among the plurality of element insulating layers 64 .
- the second coils 32A, 32B, 34A, and 34B are embedded in the element insulating layer 64 .
- the second coils 32A, 32B, 34A, and 34B are provided on the same element insulating layer 64 among the plurality of element insulating layers 64 .
- the first coil 31A and the second coil 32A of the first transformer 21A are arranged apart from each other in the z direction.
- One or more element insulating layers 64 are interposed between the first coil 31A and the second coil 32A in the z direction.
- five element insulating layers 64 are interposed between the first coil 31A and the second coil 32A in the z direction.
- the first coil 31A and the second coil 32A are provided within the element insulating layer 64 .
- the first coil 31A is positioned closer to the front surface 64s than the rear surface 64r in the element insulating layer 64
- the second coil 32A is positioned closer to the rear surface 64r than the front surface 64s in the element insulating layer 64.
- the first coil 31A is provided so as to penetrate the one-layer element insulating layer 64 in the z-direction. That is, both the first insulating film 64A and the second insulating film 64B of the one-layer element insulating layer 64 are provided with openings for forming the first coils 31A.
- the first coil 31A is formed by embedding a conductive member made of a material containing Cu in the opening.
- the second coil 32A is also formed in the same manner as the first coil 31A.
- the first coil 33A and the second coil 34A of the second transformer 22A are arranged apart from each other in the z direction.
- One or more element insulating layers 64 are interposed between the first coil 33A and the second coil 34A.
- five element insulating layers 64 are interposed between the first coil 33A and the second coil 34A in the z direction. That is, the distance DA between the first coil 31A and the second coil 32A of the first transformer 21A in the z direction is the distance DB between the first coil 33A and the second coil 34A of the second transformer 22A in the z direction.
- the first coil 33A is positioned closer to the front surface 64s than the rear surface 64r in the element insulating layer 64, and the second coil 34A is positioned closer to the rear surface 64r than the front surface 64s in the element insulating layer 64.
- the first coil 33A and the second coil 34A are formed similarly to the first coil 31A.
- the first coil 31B and the second coil 32B of the first transformer 21B are arranged apart from each other in the z direction.
- One or more element insulating layers 64 are interposed between the first coil 31B and the second coil 32B.
- five element insulating layers 64 are interposed between the first coil 31B and the second coil 32B in the z direction. That is, the distance DC between the first coil 31B and the second coil 32B of the first transformer 21B in the z direction is the distance DA between the first coil 31A and the second coil 32A of the first transformer 21A in the z direction.
- the first coil 31B is positioned closer to the front surface 64s than the rear surface 64r in the element insulating layer 64, and the second coil 32B is positioned closer to the rear surface 64r than the front surface 64s in the element insulating layer 64.
- the first coil 31B and the second coil 32B are formed similarly to the first coil 31A.
- first coil 33B and the second coil 34B of the second transformer 22B are arranged apart from each other in the z direction.
- One or more element insulating layers 64 are interposed between the first coil 33B and the second coil 34B.
- five element insulating layers 64 are interposed between the first coil 33B and the second coil 34B in the z direction. That is, the distance between the first coil 33B and the second coil 34B of the second transformer 22B in the z direction is the distance DC between the first coil 31B and the second coil 32B of the first transformer 21B in the z direction. equal.
- the first coil 33B is positioned closer to the front surface 64s than the rear surface 64r in the element insulating layer 64, and the second coil 34B is positioned closer to the rear surface 64r than the front surface 64s in the element insulating layer 64.
- the first coil 33B and the second coil 34B are formed in the same manner as the first coil 31A.
- the thickness T2 of the insulating plate 100 is thinner than the thickness T1 of the transformer chip 60.
- the thickness T2 can be defined by the distance between the main surface 100s and the rear surface 100r of the insulating plate 100 in the z direction.
- the thickness T1 can be defined by the distance between the chip main surface 60s and the chip rear surface 60r of the transformer chip 60 in the z direction.
- the thickness T2 of the insulating plate 100 is thicker than the thickness T3 of the substrate 63 .
- the thickness T3 can be defined by the distance between the substrate front surface 63s and the substrate rear surface 63r of the substrate 63 in the z direction.
- the thickness T2 of the insulating plate 100 is thicker than the thickness T4 of the element insulating layer 64 .
- the thickness T4 can be defined by the distance between the front surface 64s and the back surface 64r of the device insulating layer 64 in the z direction.
- the thickness T2 of the insulating plate 100 is approximately 50 ⁇ m
- the thickness T4 of the element insulating layer 64 is approximately 20 ⁇ m.
- the distance DA between the first coil 31A and the second coil 32A is smaller than the thickness T2 of the insulating plate 100.
- the thickness T2 of the insulating plate 100 is greater than the distance DA between the first coil 31A and the second coil 32A. Therefore, the distance DD between the second coil 32A and the primary die pad 70 is greater than the distance DA between the first coil 31A and the second coil 32A. Since the distance DB between the first coil 33A and the second coil 34A is equal to the distance DA, the distance DE between the second coil 34A and the primary die pad 70 is larger than the distance DA. Both the relationship between the first coil 31B, the second coil 32B, and the primary die pad 70 and the relationship between the first coil 33B, the second coil 34B, and the primary die pad 70 are The relationship between the second coil 32A and the primary die pad 70 is the same.
- the first coils 31A and 31B correspond to the "first surface side conductive portion” and the "first surface side coil”
- the second coils 32A and 32B correspond to the "first back side conductive portion”. and “first back side coil”.
- the first coils 33A, 33B correspond to the "second surface-side conductive portion” and the “second surface-side coil”
- the second coils 34A, 34B correspond to the "second back-side conductive portion” and the "second back-side coil.” corresponds to
- the first end 36 of the first coil 31A has a portion facing the first electrode pad 61A in the z direction.
- a first end portion 36 of the first coil 31A is connected to the first electrode pad 61A by a connection line 67 .
- the connection line 67 is a via that penetrates the element insulating layer 64 in the z-direction, and one or more of Ti, TiN, Au, Ag, Cu, Al, and W are appropriately selected, for example.
- the connection line 67 is made of a material containing Al.
- the connection line 67 is arranged at a position overlapping both the first end 36 of the first coil 31A and the first electrode pad 61A. 61A and extends in the z-direction.
- the first end 36 (see FIG. 3) of the first coil 33A and the second electrode pad 62A are connected by a connection line 67 different from the connection line 67 described above.
- the connection mode by the connection line 67 between the first end portion 36 of the first coil 33A and the second electrode pad 62A is the same as that of the first end portion 36 of the first coil 31A and the first electrode pad 61A.
- the first end portion 36 of the first coil 31B and the first electrode pad 61B are connected by a connection line 67 different from the connection line 67 described above.
- connection mode of the first end portion 36 of the first coil 31B and the first electrode pad 61B by the connection line 67 is the same as that of the first end portion 36 of the first coil 31A and the first electrode pad 61A.
- the first end portion 36 of the first coil 33B and the second electrode pad 62B are connected by a connection line 67 different from the connection line 67 described above.
- the connection mode by the connection line 67 between the first end portion 36 of the first coil 33B and the second electrode pad 62B is the same as the first end portion 36 of the first coil 31A and the first electrode pad 61A.
- connection line 68 is a via that penetrates the element insulating layer 64 in the z-direction, and one or more of Ti, TiN, Au, Ag, Cu, Al, and W are appropriately selected, for example.
- the connection line 68 is made of a material containing Al.
- connection line 68 When viewed from the z-direction, the connection line 68 is arranged at a position overlapping both the second end 37 of the first coil 31A and the second end 37 of the first coil 31B and the first electrode pad 61C, It extends in the z-direction so as to connect these second ends 37 and the first electrode pads 61C.
- the second end 37 of the first coil 33A and the second end 37 of the first coil 33B are connected to the second electrode pad 62C by a connection line 68 different from the connection line 68 described above. ing.
- the second end 37 of the first coil 33A and the second end 37 of the first coil 33B are connected to the second electrode pad 62C by the connection line 68, so that the second end 37 of the first coil 31A and the first This is the same as the connection mode by the connection line 68 between the second end portion 37 of the coil 31B and the first electrode pad 61C.
- FIG. 7 is a plan view of a transformer chip 60X of a comparative example.
- FIG. 8 is a cross-sectional view schematically showing the cross-sectional structure of the transformer chip 60X of the comparative example taken along the xy plane. In FIG. 8, hatching lines are omitted from the viewpoint of visibility of the drawing.
- FIG. 9 is a cross-sectional view of a transformer chip 60X of a comparative example.
- the components that are common to the components of the transformer chip 60 of the present embodiment are denoted by the same reference numerals, and the description thereof will be omitted.
- the first coil 31A electrically connected to the primary side circuit 13 is located closer to the rear surface 64r of the element insulating layer 64 than the second coil 32A. placed nearby. Therefore, as shown in FIG. 7, the first electrode pads 61A of the transformer chip 60X are arranged closer to the first chip 40 (see FIG. 2) than the first coil 31A in the x direction.
- the first electrode pad 61B of the transformer chip 60X is arranged in the x direction in the first direction. It is arranged closer to the first chip 40 than the coil 31B.
- the first electrode pads 61C of the transformer chip 60X are also arranged closer to the first chip 40 than the first coils 31A and 31B.
- the first coil 33A electrically connected to the secondary circuit 14 is closer to the back surface of the element insulating layer 64 than the second coil 34A. It is located near 64r. Therefore, as shown in FIG. 7, the second electrode pads 62A of the transformer chip 60X are arranged closer to the second chip 50 (see FIG. 2) than the first coil 33A in the x direction.
- the second electrode pad 62B of the transformer chip 60X is arranged in the x direction at the first It is arranged closer to the second chip 50 than the coil 33B.
- the second electrode pads 62C of the transformer chip 60X are also arranged closer to the second chip 50 than the first coils 33A and 33B.
- the first electrode pads 61A-61C are arranged closer to the first chip 40 than the first coils 31A, 31B, and the second electrode pads 62A-62C are arranged closer to the second coils 32A, 32B than the second coils 32A, 32B. Since it is arranged near the chip 50, the size of the transformer chip 60X increases in the x direction.
- the first electrode pad 61A is arranged inside the coil portion 35 of the first coil 31A, and the first electrode pad 61B is arranged inside the coil portion 35 of the first coil 31B. It is located inside.
- the first electrode pad 61C is arranged at a position overlapping the coil portion 35 of the first coil 31A (31B) in the x-direction. In other words, the first electrode pads 61A to 61C are not arranged closer to the first chip 40 than the first coil 31A (31B).
- the second electrode pad 62A is arranged inside the coil portion 35 of the first coil 33A
- the second electrode pad 62B is arranged inside the coil portion 35 of the first coil 33B.
- the second electrode pad 62C is arranged at a position overlapping the coil portion 35 of the first coil 33A (33B) in the x-direction.
- the second electrode pads 62A to 62C are not arranged closer to the second chip 50 than the first coil 33A (33B). Therefore, the x-direction size of the transformer chip 60 can be made smaller than the x-direction size of the transformer chip 60X of the comparative example.
- the second coil 32A (32B), which is not electrically connected to the primary circuit 13, is electrically connected to the secondary circuit 14.
- the second coils 34A (34B) that are not connected are electrically connected to each other.
- the first coil 31A (31B) electrically connected to the primary side circuit 13 and the secondary side circuit 14 are electrically connected to each other. Since the connected first coil 33A (33B) is arranged closer to the back surface 64r than the front surface 64s of the element insulating layer 64, the connection lines 67 and the first electrode pads 61A to 61C are individually connected to the first electrode pads 61A to 61C. Both the connection lines 68 individually connected to the two electrode pads 62A to 62C are lengthened.
- each of the connection lines 67 and 68 extends in the z-direction from the uppermost element insulating layer 64 to the lowermost element insulating layer 64 among the plurality of element insulating layers 64 .
- the connection wires 67 and 68 need to be connected to the first end (not shown) formed inside the coil portion 35 of the first coil 31A (first coil 33A). And as shown in FIG. 9, it is necessary to straddle the coil portion 35 of the first coil 31A (first coil 33A) when viewed from the z direction. Therefore, between the first coil 31A (first coil 33A) and the substrate 63, at least one element insulating layer 64 for providing the connection lines 67 and 68 is required.
- the distance DA (DB) between the first coil 31A (33A) and the second coil 32A (34A) in the z direction becomes small.
- the relationship between the first coil 31B (33B) and the second coil 32B (34B) and the connecting wire 67 is the same. Since the connection lines 67 and 68 are lengthened in this manner, the process for forming the connection lines 67 and 68 in the element insulating layer 64 is complicated.
- the first coil 31A (33A) is arranged at a position farther from the substrate 63 than the second coil 32A (34A). That is, the first coil 31A (33A) is arranged closer to the first electrode pad 61A (the second electrode pad 62A) than the second coil 32A (34A) in the z direction.
- the first end 36 of the first coil 31A and the first electrode pad 61A are arranged at positions overlapping each other, and the first end 36 of the first coil 33A and the second electrode pad 61A are arranged to overlap each other.
- the pads 62A are arranged to overlap each other.
- connection lines 67 and 68 are shortened, and the connection lines 67 and 68 are formed as vias penetrating the element insulating layer 64 . Complications can be suppressed.
- the first coil It is possible to suppress reduction in the distance DA (DB) between 31A (33A) and the second coil 32A (34A). The same applies to the first coil 31B (33B) and the second coil 32B (34B).
- the signal transmission device 10 includes a first chip 40 including a primary circuit 13, a primary die pad 70 on which the first chip 40 is mounted, a transformer chip 60 as an insulating chip, a transformer chip a second chip 50 including a secondary circuit 14 configured to receive signals from the primary circuit 13 via 60; a secondary die pad 80 on which the second chip 50 is mounted; and an insulating plate 100 interposed between the side die pad 70 and the transformer chip 60 .
- the transformer chip 60 includes an element insulating layer 64 having a surface 64s on which a first electrode pad 61 and a second electrode pad 62 are formed and a back surface 64r opposite to the surface 64s; It has a first transformer 21A (21B) as a first insulating element and a second transformer 22A (22B) as a second insulating element.
- the first transformer 21A (21B) includes a first coil 31A (31B) as a first surface-side conductive portion arranged closer to the surface 64s than the back surface 64r in the element insulating layer 64, and and a second coil 32A (32B) as a first back-side conductive portion arranged closer to the back surface 64r than the surface 64s.
- the first coil 31A (31B) is electrically connected to the first electrode pad 61.
- the second coil 32A (32B) is arranged to face the first coil 31A (31B) in the z direction, which is the thickness direction of the element insulating layer 64.
- the second transformer 22A (22B) includes a first coil 33A (33B) as a second surface-side conductive portion disposed closer to the surface 64s than the back surface 64r in the element insulating layer 64, and and a second coil 34A (34B) as a second back surface side conductive portion arranged closer to the back surface 64r than the front surface 64s.
- the first coil 33A (33B) is electrically connected to the second electrode pad 62. As shown in FIG.
- the second coil 34A (34B) is arranged to face the first coil 33A (33B) in the z direction.
- the second coil 32A (32B) and the second coil 34A (34B) are electrically connected.
- the first coil 31A (31B) and the primary circuit 13 are electrically connected via the first electrode pads 61.
- the first coil 33A (33B) and the secondary circuit 14 are electrically connected via the second electrode pads 62. As shown in FIG.
- the first transformer 21A (21B) and the second transformer 22A (22B) are connected in series. It is possible to improve the dielectric strength of the capacitor.
- the distance between the first coil 31A (31B) connected to the first electrode pad 61A (61B) is shortened.
- the distance between the first coil 33A (33B) and the second electrode pad 62 becomes shorter.
- the length of the conductive path between the first coil 31A (31B) and the first electrode pad 61 and the length of the conductive path between the first coil 33A (33B) and the second electrode pad 62 are Since the resulting inductance can be reduced, noise contained in the first signal and the second signal can be reduced.
- the insulating plate 100 is mounted on the primary die pad 70 .
- Transformer chip 60 is mounted on insulating plate 100 .
- the second coils 32A, 32B, 34A, 34B of the transformer chip 60 and the primary side The distance in the z direction from the die pad 70 can be increased. Therefore, the withstand voltage between the transformer chip 60 and the primary die pad 70 can be improved.
- the thickness T2 of the insulating plate 100 is the distance DA between the first coil 31A and the second coil 32A in the z direction, and the distance DA between the first coil 33A and the second coil 34A in the z direction. Thicker than both distance DB. Also, the thickness T2 of the insulating plate 100 is the distance DC between the first coil 31B and the second coil 32B in the z direction and the distance between the first coil 33B and the second coil 34B in the z direction. Thicker than both.
- the distance DD (DE) between the second coil 32A (32B) and the primary die pad 70 in the z direction is the distance DA to DC, and the first coil 33B and the second coil 34B in the z direction.
- the dielectric strength of the transformer chip 60 can be suppressed from being lowered.
- the insulating plate 100 is formed of an insulating substrate containing alumina or an insulating substrate containing glass. According to this configuration, the insulating plate 100 having the thickness T2 of (1-2) can be easily formed as compared with the case where the insulating plate 100 is made of an insulating film.
- the distance DA between the first coil 31A and the second coil 32A in the z direction and the distance DB between the first coil 33A and the second coil 34A in the z direction are equal to each other. Also, the distance DC between the first coil 31B and the second coil 32B in the z direction is equal to the distance between the first coil 33B and the second coil 34B in the z direction.
- the total dielectric strength voltage of the first and second transformers connected in series is It may be lower than the sum with the dielectric strength voltage.
- the dielectric strength voltage of the first transformer 21A (21B) and the dielectric strength voltage of the second transformer 22A (22B) are equal to each other. Therefore, the total withstand voltage of the first transformer 21A (21B) and the second transformer 22A (22B) connected in series is equal to the withstand voltage of the first transformer 21A (21B) and the withstand voltage of the second transformer 22A (22B) It is roughly equal to the sum of the insulation voltage and the dielectric strength. Therefore, compared to the case where the dielectric strength voltage of the first transformer 21A (21B) and the dielectric strength voltage of the second transformer 22A (22B) are different from each other, the dielectric strength voltage of the transformer chip 60 can be improved.
- the second coil 32A (32B) and the second coil 34A (34B) are arranged at the same position in the z direction.
- Each of the second coils 32A, 32B, 34A, 34B has a first loop-shaped conductive portion 39A including a first facing portion 39p, a second facing portion 39q, and a connecting portion 39r, and a shape similar to the first loop-shaped conductive portion 39A. and a second loop-shaped conductive portion 39B disposed so as to surround the first loop-shaped conductive portion 39A when viewed from the z-direction.
- the first facing portion 39p is arranged to face the first coil 31A (31B) in the z-direction, and constitutes the second coil 32A (32B).
- the second facing portion 39q is arranged to face the first coil 33A (33B) in the z direction, and constitutes the second coil 34A (34B).
- the connecting portion 39r connects the first facing portion 39p and the second facing portion 39q.
- the first coils 31A, 31B, 33A, 33B are made of a material containing copper.
- the second coils 32A, 32B, 34A, 34B are made of a material containing aluminum.
- the first coils 31A, 31B, 33A, 33B through which a relatively large current flows are formed of a material containing copper, the current flows smoothly through the first coils 31A, 31B, 33A, 33B. be able to.
- the second coils 32A, 32B, 34A, 34B are made of a material containing aluminum, the second coils 32A, 32B, 34A, 34B are made of a material containing copper. The two coils 32A, 32B, 34A, 34B can be formed at low cost.
- the first coil 31A (31B) and the first coil 33A (33B) are arranged apart from each other in the x direction, and the second coil 32A (32B) and the second coil 34A (34B) are spaced apart from each other in the x-direction.
- the first coil 31A (33A) and the first coil 31B (33B) are arranged apart from each other in the y direction, and the second coil 32A (34A) and the second coil 32B (34B) are arranged apart from each other in the y direction. are spaced apart.
- the first coil 31A (31B) electrically connected to the primary side circuit 13 is arranged near the first chip 40 in the x direction, and the first coil 31A (31B) electrically connected to the secondary side circuit 14 33A (33B) are arranged near the second chip 50 in the x-direction.
- the wire W can easily connect the first chip 40 including the primary circuit 13 and the first coil 31A (31B). Also, the wire W can easily connect the second chip 50 including the secondary circuit 14 and the first coil 33A (33B).
- the first electrode pad 61A When viewed from the z direction, the first electrode pad 61A is arranged inside the coil portion 35 of the first coil 31A, and the first electrode pad 61B is arranged inside the coil portion 35 of the first coil 31B. placed inside.
- the first electrode pad 61C is arranged at a position overlapping the first coil 31A (31B) in the x direction when viewed from the y direction.
- the second electrode pad 62A is arranged inside the coil portion 35 of the first coil 33A, and the second electrode pad 62B is arranged inside the coil portion 35 of the first coil 33B.
- the second electrode pad 62C is arranged at a position overlapping the first coil 33A (33B) in the x direction when viewed in the y direction.
- the first electrode pads 61A to 61C are arranged closer to the first chip 40 than the first coil 31A (31B) when viewed from the z direction, and the second electrode pads 62A to 62C are arranged to be closer to the first coil 31A (31B).
- the size of the transformer chip 60 can be reduced in the x direction.
- the second coils 32A, 32B, 34A, and 34B are provided in the lowest element insulating layer 64 among the plurality of element insulating layers 64 .
- the distance DA between the first coil 31A and the second coil 32A in the z direction, the distance DB between the first coil 33A and the second coil 34A in the z direction, and the distance The distance DC between the first coil 31B and the second coil 32B and the distance between the first coil 33B and the second coil 34B in the z direction can each be made large. Therefore, the dielectric breakdown voltage of the transformer chip 60 can be improved.
- a transformer chip 60 as an insulation module includes an element insulation layer 64 having a surface 64s on which a first electrode pad 61 and a second electrode pad 62 are formed and a back surface 64r opposite to the surface 64s; It has a first transformer 21A (21B) as a first insulating element and a second transformer 22A (22B) as a second insulating element provided in the element insulating layer 64 .
- the first transformer 21A (21B) includes a first coil 31A (31B) as a first surface-side conductive portion arranged closer to the surface 64s than the back surface 64r in the element insulating layer 64, and and a second coil 32A (32B) as a first back-side conductive portion arranged closer to the back surface 64r than the surface 64s.
- the first coil 31A (31B) is electrically connected to the first electrode pad 61.
- the second coil 32A (32B) is arranged to face the first coil 31A (31B) in the z direction, which is the thickness direction of the element insulating layer 64. As shown in FIG.
- the second transformer 22A (22B) includes a first coil 33A (33B) as a second surface-side conductive portion disposed closer to the surface 64s than the back surface 64r in the element insulating layer 64, and and a second coil 34A (34B) as a second back surface side conductive portion arranged closer to the back surface 64r than the front surface 64s.
- the first coil 33A (33B) is electrically connected to the second electrode pad 62.
- the second coil 34A (34B) is arranged to face the first coil 33A (33B) in the z direction.
- the second coil 32A (32B) and the second coil 34A (34B) are electrically connected.
- the first coil 31A (31B) and the primary circuit 13 are electrically connected via the first electrode pads 61.
- the first coil 33A (33B) and the secondary circuit 14 are electrically connected via the second electrode pads 62.
- the first transformer 21A (21B) and the second transformer 22A (22B) are connected in series. It is possible to improve the withstand voltage.
- the distance between the first coil 31A (31B) connected to the first electrode pad 61A (61B) is shortened.
- the distance between the first coil 33A (33B) and the second electrode pad 62 becomes shorter.
- the length of the conductive path between the first coil 31A (31B) and the first electrode pad 61 and the length of the conductive path between the first coil 33A (33B) and the second electrode pad 62 are Since the resulting inductance can be reduced, noise contained in the first signal and the second signal can be reduced.
- FIG. 10 A signal transmission device 10 according to the second embodiment will be described with reference to FIGS. 10 to 15.
- FIG. The signal transmission device 10 of the present embodiment is mainly different from the signal transmission device 10 of the first embodiment in that the insulation structure using the transformer 15 is changed to the insulation structure using the capacitor 110 .
- points different from the first embodiment will be mainly described, and the same reference numerals will be given to the components that are common to the first embodiment, and description thereof will be omitted.
- FIG. 10 is a schematic circuit diagram of the signal transmission device 10 of this embodiment.
- the signal transmission circuit 10A of the signal transmission device 10 includes a capacitor 110 as an insulating structure for electrically insulating the primary side circuit 13 and the secondary side circuit 14 from each other.
- the capacitor 110 has a capacitor 110A connected to the signal line that transmits the first signal, and a capacitor 110B connected to the signal line that transmits the second signal. Both capacitors 110A and 110B are provided between primary circuit 13 and secondary circuit 14 .
- the capacitor 110A corresponds to the "first signal capacitor”
- the capacitor 110B corresponds to the "second signal capacitor”.
- the signal transmission circuit 10A has a connection signal line 20A as a signal line for transmitting the first signal and a connection signal line 20B as a signal line for transmitting the second signal line.
- the connection signal line 20A is provided between the primary signal line 16A and the secondary signal line 17A.
- the connection signal line 20B is provided between the primary signal line 16B and the secondary signal line 17B. That is, the signal lines that transmit the first signal include the primary signal line 16A, the secondary signal line 17A, and the connection signal line 20A.
- the signal lines that transmit the second signal include the primary signal line 16B, the secondary signal line 17B, and the connection signal line 20B.
- the capacitor 110A has a first capacitor 111A and a second capacitor 112A that are connected in series with each other via a connection signal line 20A.
- the first capacitor 111A is electrically connected to the primary side circuit 13 and the second capacitor 112A is electrically connected to the secondary side circuit 14 . More specifically, first capacitor 111A has first electrode 113A and second electrode 114A, and second capacitor 112A has first electrode 115A and second electrode 116A.
- a first electrode 113A of the first capacitor 111A is connected to the primary circuit 13 by a primary signal line 16A, and a second electrode 114A is connected to a second electrode 116A of the second capacitor 112A through a connection signal line 20A. It is connected.
- a first electrode 115A of the second capacitor 112A is connected to the secondary circuit 14 by a secondary signal line 17A. Therefore, the primary side circuit 13 and the secondary side circuit 14 transmit the first signal via the first capacitor 111A and the second capacitor 112A that are connected in series with each other.
- the capacitor 110B has a first capacitor 111B and a second capacitor 112B that are connected in series with each other via the connection signal line 20B.
- the first capacitor 111B has a first electrode 113B and a second electrode 114B
- the second capacitor 112B has a first electrode 115B and a second electrode 116B.
- the configuration of capacitor 110B and the configuration of connection between primary side circuit 13 and secondary side circuit 14 are the same as capacitor 110A, so detailed description thereof will be omitted.
- Primary side circuit 13 and secondary side circuit 14 transmit a second signal via first capacitor 111B and second capacitor 112B that are connected in series with each other.
- the first capacitors 111A and 111B correspond to the "first insulating element”
- the second capacitors 112A and 112B correspond to the "second insulating element”.
- FIG. 11 is a schematic cross-sectional view of part of the signal transmission device 10 of this embodiment.
- the signal transmission device 10 includes a capacitor chip 120 instead of the transformer chip 60 (see FIG. 2) of the first embodiment.
- Capacitor chip 120 like transformer chip 60, is arranged between first chip 40 and second chip 50 in the x-direction. Similar to the transformer chip 60 of the first embodiment, in this embodiment, the distance between the capacitor chip 120 and the second chip 50 in the x direction is equal to the distance between the capacitor chip 120 and the first chip 40 in the x direction. Greater than distance.
- the capacitor chip 120 is mounted on the primary die pad 70 . More specifically, an insulating plate 100 is mounted on the primary die pad 70 as in the first embodiment. Capacitor chip 120 is mounted on insulating plate 100 . In other words, the insulating plate 100 is interposed between the primary die pad 70 and the capacitor chip 120 .
- the capacitor chip 120 corresponds to an "insulating chip".
- FIG. 12 is a plan view schematically showing the planar structure of capacitor chip 120.
- FIG. 13 is a cross-sectional view schematically showing the cross-sectional structure of the inside of the capacitor chip 120 taken along the xy plane. In FIG. 13, hatching lines are omitted from the viewpoint of visibility of the drawing. 14 and 15 show the cross-sectional structure of the capacitor chip 120 mounted on the primary die pad 70.
- the capacitor chip 120 has a chip main surface 120s and a chip rear surface 120r facing opposite sides in the z direction.
- the chip main surface 120 s faces the same side as the chip main surface 40 s of the first chip 40
- the chip rear surface 120 r faces the same side as the chip rear surface 40 r of the first chip 40 .
- the direction from the chip rear surface 120r to the chip main surface 120s of the capacitor chip 120 is defined as upward
- the direction from the chip main surface 120s to the chip rear surface 120r is defined as downward.
- the capacitor chip 120 includes both capacitors 110A and 110B, and more specifically, both capacitors 110A and 110B are integrated into one chip. That is, the capacitor chip 120 is a chip dedicated to both the capacitors 110A and 110B, which is separate from the first chip 40 and the second chip 50. FIG.
- the capacitors 111A and 111B are arranged in a portion of the capacitor chip 120 near the first chip 40 (see FIG. 11) when viewed from the z direction. are arranged in a portion of the capacitor chip 120 close to the second chip 50 (see FIG. 11).
- the first capacitor 111A and the first capacitor 111B are arranged at the same position in the x direction and spaced apart from each other in the y direction.
- the second capacitors 112A and 112B are arranged at the same position in the x direction and spaced apart from each other in the y direction.
- the first capacitor 111A and the second capacitor 112A are arranged at the same position in the y direction and spaced apart from each other in the x direction.
- the first capacitor 111B and the second capacitor 112B are arranged at the same position in the y direction and spaced apart from each other in the x direction.
- the first capacitor 111A includes a first electrode plate 121A and a second electrode plate 122A arranged to face the first electrode plate 121A in the z-direction.
- the first electrode plate 121A constitutes the first electrode 113A of the first capacitor 111A
- the second electrode plate 122A constitutes the second electrode 114A of the first capacitor 111A.
- the first capacitor 111B includes a first electrode plate 121B and a second electrode plate 122B arranged to face the first electrode plate 121B in the z-direction.
- the first electrode plate 121B constitutes the first electrode 113B of the first capacitor 111B
- the second electrode plate 122B constitutes the second electrode 114B of the first capacitor 111B.
- the first electrode plate 121A and the first electrode plate 121B are arranged at the same position in the x direction and separated from each other in the y direction. That is, the first electrode plate 121A and the first electrode plate 121B are arranged with a gap in the y direction when viewed from the z direction.
- the second electrode plate 122A and the second electrode plate 122B are arranged at the same position in the x direction and spaced apart from each other in the y direction. That is, the second electrode plate 122A and the second electrode plate 122B are arranged with a gap in the y direction when viewed from the z direction.
- the second capacitor 112A includes a first electrode plate 123A and a second electrode plate 124A facing the first electrode plate 123A in the z direction.
- the first electrode plate 123A constitutes the first electrode 115A of the second capacitor 112A
- the second electrode plate 124A constitutes the second electrode 116A of the second capacitor 112A.
- the second capacitor 112B includes a first electrode plate 123B and a second electrode plate 124B arranged to face the first electrode plate 123B in the z-direction.
- the first electrode plate 123B constitutes the first electrode 115B of the second capacitor 112B
- the second electrode plate 124B constitutes the second electrode 116B of the second capacitor 112B.
- the first electrode plate 123A and the first electrode plate 123B are arranged at the same position in the x direction and separated from each other in the y direction. That is, the first electrode plate 123A and the first electrode plate 123B are arranged with a gap in the y direction when viewed from the z direction.
- the second electrode plate 124A and the second electrode plate 124B are arranged at the same position in the x direction and spaced apart from each other in the y direction. That is, the second electrode plate 124A and the second electrode plate 124B are arranged with a gap in the y direction when viewed from the z direction.
- the first electrode plate 121A and the first electrode plate 123A are arranged at the same position in the y direction and separated from each other in the x direction. That is, the first electrode plate 121A and the first electrode plate 123A are arranged with a gap in the x direction when viewed from the z direction.
- the first electrode plate 121B and the first electrode plate 123B are arranged at the same position in the y direction and separated from each other in the x direction. That is, the first electrode plate 121B and the first electrode plate 123B are arranged with a gap in the x direction when viewed from the z direction.
- the second electrode plate 122A and the second electrode plate 124A are arranged at the same position in the y direction and spaced apart from each other in the x direction. That is, the second electrode plate 122A and the second electrode plate 124A are arranged with a gap in the x direction when viewed from the z direction.
- the second electrode plate 122B and the second electrode plate 124B are arranged at the same position in the y direction and separated from each other in the x direction. That is, the second electrode plate 122B and the second electrode plate 124B are arranged with a gap in the x direction when viewed from the z direction.
- each electrode plate 121A, 121B, 122A, 122B, 123A, 123B, 124A, and 124B is made of a material containing Cu.
- Each electrode plate 121A, 121B, 122A, 122B, 123A, 123B, 124A, 124B is formed in a flat plate shape.
- the electrode plates 121A, 121B, 122A, 122B, 123A, 123B, 124A, and 124B have the same shape when viewed from the z direction, and are rectangular in this embodiment.
- the shape of each of the electrode plates 121A, 121B, 122A, 122B, 123A, 123B, 124A, and 124B as viewed in the z direction is not limited to rectangular and can be changed arbitrarily.
- the capacitor chip 120 has a substrate 63 and an element insulating layer 64, like the transformer chip 60 of the first embodiment.
- the configurations of the substrate 63 and the element insulating layer 64 are the same as in the first embodiment.
- the capacitor chip 120 has a protective film 65 and a passivation film 66, like the transformer chip 60 of the first embodiment.
- the structures of the protective film 65 and the passivation film 66 are the same as in the first embodiment.
- the first electrode plates 121A, 121B, 123A, and 123B are provided within the element insulating layer 64.
- the first electrode plates 121A, 121B, 123A, and 123B are arranged at the same positions in the z direction.
- the first electrode plates 121A, 121B, 123A, and 123B are provided on the same element insulation layer 64 among the plurality of element insulation layers 64 .
- the first electrode plates 121A, 121B, 123A, and 123B are provided in the element insulating layer 64 one layer below the uppermost element insulating layer 64 among the plurality of element insulating layers 64 .
- it can be said that the first electrode plates 121A, 121B, 123A, and 123B are embedded in the element insulating layer 64 .
- the second electrode plates 122A, 122B, 124A and 124B are provided within the element insulating layer 64.
- the second electrode plates 122A, 122B, 124A, 124B are arranged at the same positions in the z-direction.
- the second electrode plates 122A, 122B, 124A, and 124B are provided on the same element insulation layer 64 among the plurality of element insulation layers 64 .
- the second electrode plates 122A, 122B, 124A, and 124B are provided on the lowest element insulating layer 64 among the plurality of element insulating layers 64 .
- it can be said that the second electrode plates 122A, 122B, 124A, and 124B are embedded in the element insulating layer 64.
- the distance DF between the first electrode plate 121A and the second electrode plate 122A in the z direction and the distance between the first electrode plate 123A and the second electrode plate 124A in the z direction DG are equal to each other.
- the distance DH between the first electrode plate 121B and the second electrode plate 122B in the z direction is equal to the distance between the first electrode plate 123B and the second electrode plate 124B in the z direction.
- the distances DF and DG are equal to the distance DH.
- the thickness T2 of the insulating plate 100 is determined by the distance DF between the first electrode plate 121A and the second electrode plate 122A in the z direction and the distance DF between the first electrode plate 123A and the second electrode plate 124A. a distance DG between the z-directions of the first electrode plate 121B and the second electrode plate 122B in the z-direction, and a distance DH between the first electrode plate 123B and the second electrode plate 124B in the z-direction greater than each with distance.
- each of the distance DI between the second electrode plate 122A and the primary die pad 70 in the z direction and the distance DJ between the second electrode plate 124A and the primary die pad 70 in the z direction is greater than the distances DF and DG.
- Both the distance between the second electrode plate 122B and the primary die pad 70 in the z direction and the distance between the second electrode plate 124B and the primary die pad 70 in the z direction are the distance DH, and the distance between the first electrode plate 123B and the second electrode plate 124B in the z direction.
- the distance DI and the distance DJ are equal to each other, and the second electrode plate 122B and the first electrode plate 122B are provided on the same element insulating layer 64.
- the distance between the side die pad 70 in the z direction and the distance between the second electrode plate 124B and the primary side die pad 70 in the z direction are equal to the distance DI(DJ).
- the first electrode plates 121A and 121B correspond to the "first front side conductive portion” and the “first front side electrode plate”
- the second electrode plates 122A and 122B correspond to the "first back side conductive portion”. It corresponds to "conductive part” and “first back side electrode plate”.
- the first electrode plates 123A and 123B correspond to the "second surface-side conductive portion” and the “second surface-side electrode plate”
- the second electrode plates 124A and 124B correspond to the "second back-side conductive portion" and the "second back-side electrode plate”. side electrode plate”.
- the capacitor chip 120 includes multiple (two in this embodiment) first electrode pads 131 and multiple (two in this embodiment) second electrode pads 132 . Electrode pads 131 and 132 are provided on capacitor chip 120 so as to be exposed from chip main surface 120s of capacitor chip 120 .
- the two first electrode pads 131 may be referred to as first electrode pads 131A and 131B
- the two second electrode pads 132 may be referred to as second electrode pads 132A and 132B.
- the first electrode pads 131A and 131B correspond to "first pads”
- the second electrode pads 132A and 132B correspond to "second pads”.
- the plurality of first electrode pads 131 are individually electrically connected to the first electrode plate 121A of the first capacitor 111A and the first electrode plate 121B of the first capacitor 111B. More specifically, as shown in FIG. 14, the first electrode plate 121A of the first capacitor 111A and the first electrode pad 131A are connected by a connection line 141. As shown in FIG. A connection line 141 connected to the first electrode plate 121A is embedded in the element insulating layer 64 . In other words, the first electrode plate 121A and the first electrode pad 131A of the first capacitor 111A are electrically connected within the element insulating layer 64 .
- connection line 141 As shown in FIG. 15, the first electrode plate 121B of the first capacitor 111B and the first electrode pad 131B are connected by a connection line 141. As shown in FIG. A connection line 141 connected to the first electrode plate 121B is embedded in the element insulating layer 64 . That is, the first electrode plate 121B and the first electrode pad 131B of the first capacitor 111B are electrically connected within the element insulating layer 64 .
- the first electrode pads 131A and 131B are individually connected to the plurality of second electrode pads 42 (see FIG. 11) of the first chip 40 by a plurality of wires W (see FIG. 11).
- the first electrode plate 121A (first electrode 113A) of the first capacitor 111A and the first electrode plate 121B (first electrode 113B) of the first capacitor 111B are electrically connected to the primary circuit 13 (see FIG. 10). It is connected to the.
- each connection line 141 is formed by a via that penetrates the element insulating layer 64 in the z direction.
- each connection line 141 is formed as a via penetrating through one element insulating layer 64 .
- Ti, TiN, Au, Ag, Cu, Al, and W are appropriately selected for each connection line 141, for example.
- each connection line 141 is made of a material containing Al.
- the plurality of second electrode pads 132 are individually electrically connected to the first electrode plate 123A of the second capacitor 112A and the first electrode plate 123B of the second capacitor 112B.
- the first electrode plate 123A of the second capacitor 112A and the second electrode pad 132A are connected by a connection line 142.
- a connection line 142 connected to the first electrode plate 123A is embedded in the element insulating layer 64 .
- the first electrode plate 123A and the second electrode pad 132A of the second capacitor 112A are electrically connected within the element insulating layer 64 .
- first electrode plate 123B and the second electrode pad 132B of the second capacitor 112B are connected by a connection line 142, like the first electrode plate 123A and the second electrode pad 132A.
- a connection line 142 connected to the first electrode plate 123B is embedded in the element insulating layer 64 .
- the first electrode plate 123B and the second electrode pad 132B of the second capacitor 112B are electrically connected within the element insulating layer 64 .
- the second electrode pads 132A and 132B are individually connected to the plurality of first electrode pads 51 (see FIG. 11) of the second chip 50 by a plurality of wires W.
- the first electrode plate 123A (first electrode 115A) of the second capacitor 112A and the first electrode plate 123B (first electrode 115B) of the second capacitor 112B are electrically connected to the secondary circuit 14 (see FIG. 10). It is connected to the.
- each connection line 142 is formed by a via that penetrates the element insulating layer 64 in the z direction.
- each connection line 142 is formed as a via penetrating through one element insulating layer 64 .
- Ti, TiN, Au, Ag, Cu, Al, and W are appropriately selected for each connection line 142, for example.
- each connection line 142 is made of a material containing Al.
- the second electrode plate 122A of the first capacitor 111A and the second electrode plate 124A of the second capacitor 112A are formed as a first electrode body 125A integrated with each other. More specifically, the first electrode body 125A has a first facing portion 125p, a second facing portion 125q, and a connecting portion 125r. The first facing portion 125p, the second facing portion 125q, and the connecting portion 125r are integrated. The first facing portion 125p and the second facing portion 125q are arranged at the same position in the y direction and spaced apart from each other in the x direction.
- the first facing portion 125p is arranged at a position facing the first electrode plate 121A in the z-direction, and constitutes the second electrode plate 122A.
- the shape of the first facing portion 125p viewed from the z direction is the same shape as the shape of the first electrode plate 121A viewed from the z direction. That is, in the present embodiment, the shape of the second electrode plate 122A viewed from the z direction is the same shape as the shape of the first electrode plate 121A viewed from the z direction.
- the second facing portion 125q is arranged at a position facing the first electrode plate 121B in the z-direction, and constitutes the second electrode plate 122B.
- the shape of the second facing portion 125q viewed from the z direction is the same shape as the shape of the first electrode plate 121B viewed from the z direction. That is, in this embodiment, the shape of the second electrode plate 122B viewed from the z direction is the same shape as the shape of the first electrode plate 121B viewed from the z direction.
- the connecting portion 125r connects the first facing portion 125p and the second facing portion 125q.
- the connecting portion 125r extends along the x direction.
- the width of the connecting portion 125r (the y-direction dimension of the connecting portion 125r) is smaller than the y-direction dimension of the first opposing portion 125p.
- there is one connecting portion 125r but the number of connecting portions 125r is not limited to this.
- a plurality of connecting portions 125r may be provided. In this case, the plurality of connecting portions 125r are arranged apart from each other in the y direction.
- the second electrode plate 122B of the first capacitor 111B and the second electrode plate 124B of the second capacitor 112B are formed as a second electrode body 125B integrated with each other.
- the second electrode body 125B has the same shape as the first electrode body 125A. Therefore, detailed description of the second electrode body 125B is omitted.
- the effect according to the effect of 1st Embodiment is acquired.
- Each of the above-described embodiments is an example of a form that the signal transmission device related to the present disclosure can take, and is not intended to limit the form.
- a signal transmission device related to the present disclosure may take a form different from the forms exemplified in the above embodiments.
- One example is a form in which a part of the configuration of each of the above embodiments is replaced, changed, or omitted, or a form in which a new configuration is added to each of the above embodiments.
- each of the following modifications can be combined with each other as long as they are not technically inconsistent.
- the same reference numerals as those in each of the above-described embodiments are attached to the portions common to each of the above-described embodiments, and the description thereof is omitted.
- the positions of the first electrode pads 61A and 61B of the transformer chip 60 can be arbitrarily changed when viewed from the z direction.
- the first electrode pad 61A may be arranged outside the coil portion 35 of the first coil 31A.
- the first electrode pad 61A may be arranged at a position overlapping the coil portion 35 of the first coil 31A in the x direction when viewed from the y direction.
- the first electrode pad 61A may be arranged closer to the first chip 40 or closer to the second chip 50 in the x direction than the coil portion 35 of the first coil 31A when viewed from the z direction.
- the first electrode pad 61A may be arranged on the side opposite to the first coil 33A in the x direction with respect to the first coil 31A when viewed in the z direction.
- the first electrode pad 61B may be arranged outside the coil portion 35 of the first coil 31B. In this case, the first electrode pad 61B may be arranged at a position overlapping the coil portion 35 of the first coil 31B in the x direction when viewed from the y direction.
- the first electrode pad 61B may be arranged closer to the first chip 40 or closer to the second chip 50 in the x direction than the coil portion 35 of the first coil 31B when viewed from the z direction. That is, the first electrode pad 61B may be arranged on the side opposite to the first coil 33B in the x direction with respect to the first coil 31B when viewed in the z direction.
- the first electrode pad 61A may be arranged at a position overlapping the coil portion 35 of the first coil 31A when viewed from the z direction. Also, the first electrode pad 61B may be arranged at a position overlapping the coil portion 35 of the first coil 31B when viewed in the z direction.
- the first electrode pad 61A may be arranged at a position overlapping the center of the first coil 31A when viewed from the z direction. Also, the first electrode pad 61B may be arranged at a position overlapping the center of the first coil 31B when viewed in the z direction.
- the positions of the second electrode pads 62A and 62B of the transformer chip 60 can be arbitrarily changed when viewed from the z direction.
- the second electrode pad 62A may be arranged outside the coil portion 35 of the first coil 33A.
- the second electrode pad 62B may be arranged at a position overlapping the coil portion 35 of the first coil 33A in the x direction when viewed from the y direction.
- the second electrode pad 62A may be arranged closer to the first chip 40 or to the second chip 50 in the x direction than the coil portion 35 of the first coil 33A when viewed in the z direction.
- the second electrode pad 62A may be arranged on the side opposite to the first coil 31A in the x direction with respect to the first coil 33A when viewed in the z direction.
- the second electrode pad 62B may be arranged outside the coil portion 35 of the first coil 33B.
- the second electrode pad 62B may be arranged at a position overlapping the coil portion 35 of the first coil 33B in the x direction when viewed from the y direction.
- the second electrode pad 62B may be arranged closer to the first chip 40 or to the second chip 50 in the x direction than the coil portion 35 of the first coil 33B when viewed in the z direction. That is, the second electrode pad 62B may be arranged on the side opposite to the first coil 31B in the x direction with respect to the first coil 33B when viewed in the z direction.
- the second electrode pad 62A may be arranged at a position overlapping the coil portion 35 of the first coil 33A when viewed from the z direction. Also, the second electrode pad 62B may be arranged at a position overlapping the coil portion 35 of the first coil 33B when viewed in the z direction.
- the second electrode pad 62A may be arranged at a position overlapping the center of the first coil 33A when viewed from the z direction. Also, the second electrode pad 62B may be arranged at a position overlapping the center of the first coil 33B when viewed in the z direction.
- the positions of the second coils 32A, 32B, 34A, and 34B in the z-direction can be arbitrarily changed.
- one or more element insulating layers 64 may be interposed between the second coils 32A, 32B, 34A, 34B and the substrate 63 in the z direction.
- the shapes of the second coils 32A, 32B, 34A, and 34B viewed from the z-direction can be arbitrarily changed.
- the second coil 32A and the second coil 32B may be individually formed.
- the shapes of the second coils 32A and 32B viewed from the z-direction may be annular or spiral.
- the second coil 34A and the second coil 34B may be formed separately.
- the shapes of the second coils 34A and 34B viewed from the z-direction may be annular or spiral.
- 16 and 17 show the case where the second coil 32A (32B) and the second coil 34A (34B) are spirally formed.
- the coil portion 35 of the second coil 32A (32B) and the coil portion 35 of the second coil 34A (34B) are connected by a first end portion 36 and a second end portion 37, respectively.
- the second end portions 37 of the second coils 32A and 34A are provided at the same positions as the coil portions 35 of the second coils 32A and 34A in the z direction.
- the first end portions 36 of the second coils 32A, 34A are provided at positions different from the coil portions 35 of the second coils 32A, 34A in the z-direction.
- the first end portions 36 of the second coils 32A and 34A are formed in the element insulating layer 64 one layer above the element insulating layer 64 in which the coil portions 35 of the second coils 32A and 34A are formed. formed.
- the position of the first ends 36 of the second coils 32A, 34A in the z direction can be changed arbitrarily.
- the first end portions 36 of the second coils 32A and 34A are arranged in the second coils 32A and 34A when the element insulating layer 64 on which the coil portions 35 of the second coils 32A and 34A are formed is not the lowest element insulating layer 64. It may be formed in the element insulating layer 64 closer to the substrate 63 than the element insulating layer 64 in which the coil portions 35 of the coils 32A and 34A are formed.
- a signal path that transmits the first signal from the primary circuit 13 to the secondary circuit 14 and a signal path that transmits the second signal from the primary circuit 13 to the secondary circuit 14 may be omitted.
- FIGS. 18 and 19 show the configuration of the transformer chip 60 when the signal path for transmitting the second signal from the primary side circuit 13 to the secondary side circuit 14 is omitted.
- the transformer chip 60 is obtained by converting the transformer 15A into one chip. That is, in the element insulating layer 64 of the transformer chip 60, the first coil 31A and the second coil 32A of the first transformer 21A and the first coil 33A and the second coil 34A of the second transformer 22A are embedded. As shown in FIG. 19, the second coil 32A and the second coil 34A constitute the first coil 38A.
- the first coil 31A of the first transformer 21A and the first coil 33A of the second transformer 22A are arranged at the same position in the y direction as viewed from the z direction and are spaced apart from each other in the x direction. ing.
- the first coil 31A and the first coil 33A are arranged at the same position in the z direction.
- the transformer chip 60 has two first electrode pads 61A, 61C and two second electrode pads 62A, 62C.
- the first electrode pad 61A is arranged inside the coil portion 35 of the first coil 31A, and the first electrode pad 61C is arranged outside the coil portion 35 of the first coil 31A.
- a first end portion 36 of the first coil 31A is connected to the first electrode pad 61A, and a second end portion 37 of the first coil 31A is connected to the first electrode pad 61C.
- the second electrode pad 62A is arranged inside the coil portion 35 of the first coil 33A, and the second electrode pad 62C is arranged outside the coil portion 35 of the first coil 33A.
- a first end portion 36 of the first coil 33A is connected to the second electrode pad 62A, and a second end portion 37 of the first coil 33A is connected to the second electrode pad 62C.
- the second embodiment can be similarly modified.
- the transformer chip 60 may have a dummy pattern.
- the dummy patterns include, for example, a first dummy pattern annularly provided to surround the first coil 38A and a second dummy pattern annularly provided to surround the second coil 38B when viewed from the z direction. include. Also, the dummy pattern includes, for example, a third dummy pattern annularly provided so as to surround the first coil 33A (33B) when viewed from the z direction.
- At least one element insulating layer 64 may be interposed between the second coils 32A, 32B of the first transformer 21A (21B) and the substrate 63 . At least one element insulating layer 64 may be interposed between the second coils 34A and 34B of the second transformer 22A (22B) and the substrate 63.
- FIG. 1 A block diagram illustrating an exemplary computing environment in accordance with the present disclosure.
- the positions of the plurality of first electrode pads 131 of the capacitor chip 120 can be arbitrarily changed when viewed from the z direction.
- the first electrode pad 131A may be arranged at a position not overlapping the first electrode plate 121A when viewed in the z direction.
- the first electrode pad 131B may be arranged at a position not overlapping the first electrode plate 121B when viewed in the z direction.
- the positions of the plurality of second electrode pads 132 of the capacitor chip 120 can be arbitrarily changed when viewed from the z direction.
- the second electrode pad 132A may be arranged at a position not overlapping the first electrode plate 123A when viewed in the z direction.
- the second electrode pad 132B may be arranged at a position not overlapping the first electrode plate 123B when viewed in the z direction.
- the positions of the second electrode plates 122A, 122B, 124A, and 124B in the z direction can be changed arbitrarily.
- one or more element insulating layers 64 may be interposed between the second electrode plates 122A, 122B, 124A, 124B and the substrate 63 in the z direction.
- At least one element insulating layer 64 may be interposed between the substrate 63 and the second electrode plate 122A (122B) of the first capacitor 111A (111B). Between the second electrode plate 124A (124B) of the second capacitor 112A (112B) and the substrate 63, at least one element insulating layer 64 may be interposed.
- the transformer chip 60 (capacitor chip 120 ) may be mounted on the secondary die pad 80 .
- the insulating plate 100 is mounted on the secondary die pad 80 .
- the transformer chip 60 (capacitor chip 120 ) is mounted on the insulating plate 100 mounted on the secondary die pad 80 .
- the transformer chip 60 (capacitor chip 120 ) may be mounted on an intermediate die pad different from the primary die pad 70 and the secondary die pad 80 .
- the intermediate die pad is arranged between the primary die pad 70 and the secondary die pad 80 in the x-direction.
- the sealing resin 90 may be omitted from the signal transmission device 10 .
- the bonding material interposed between the insulating plate 100 and the primary die pad 70 can be arbitrarily changed.
- an insulating bonding material may be used instead of the conductive bonding material SD.
- the transformer chip 60 may include a resin layer composed of one layer or a plurality of layers as a configuration of the element insulating layer 64.
- a material containing any one of polyimide resin, phenol resin, and epoxy resin may be used as the resin layer.
- the transformer chip 60 (capacitor chip 120) can be applied to other than the signal transmission device 10 of each embodiment.
- the transformer chip 60 (capacitor chip 120) may be applied to, for example, a primary side circuit module. That is, the primary circuit module includes the first chip 40, the transformer chip 60 (capacitor chip 120), and the sealing resin that seals these chips 40, 60 (120).
- the primary side circuit module also includes a primary side die pad 70 on which the first chip 40 and the transformer chip 60 (capacitor chip 120) are mounted.
- An insulating plate 100 is mounted on the primary die pad 70 .
- the transformer chip 60 (capacitor chip 120 ) is mounted on the insulating plate 100 .
- the transformer chip 60 may be applied to, for example, a secondary circuit module. That is, the secondary circuit module includes the second chip 50, the transformer chip 60 (capacitor chip 120), and the sealing resin that seals these chips 40, 60 (120).
- the secondary circuit module also includes a secondary die pad 80 on which the second chip 50 and the transformer chip 60 (capacitor chip 120) are mounted.
- An insulating plate 100 is mounted on the secondary die pad 80 .
- the transformer chip 60 (capacitor chip 120 ) is mounted on the insulating plate 100 .
- the structure of the signal transmission apparatus 10 can be changed arbitrarily.
- the signal transmission device 10 may include the primary circuit module and the second chip 50 .
- the second chip 50 may be mounted on the secondary die pad 80, and both the secondary die pad 80 and the second chip 50 may be configured by a module sealed with sealing resin.
- the signal transmission device 10 may include the secondary circuit module and the first chip 40 .
- the first chip 40 may be mounted on the primary side die pad 70, and both the primary side die pad 70 and the first chip 40 may be configured by a module sealed with a sealing resin.
- the insulating plate 100 may be omitted from the signal transmission device 10 .
- the transformer chip 60 is mounted on the primary die pad 70 in the first embodiment. That is, the transformer chip 60 is bonded to the primary die pad 70 with the conductive bonding material SD.
- the capacitor chip 120 is mounted on the primary die pad 70 . That is, the capacitor chip 120 is bonded to the primary die pad 70 with the conductive bonding material SD.
- the transformer chip 60 may be mounted on the secondary die pad 80 .
- the capacitor chip 120 may be mounted on the secondary die pad 80 .
- the direction of signal transmission in the signal transmission device 10 can be arbitrarily changed.
- the signal transmission device 10 may be configured such that a signal is transmitted from the secondary side circuit 14 to the primary side circuit 13 via the transformer 15 . More specifically, when a signal (e.g., a feedback signal) from a drive circuit electrically connected to secondary circuit 14 via secondary terminal 12 is input to secondary terminal 12, the secondary circuit A signal is transmitted from the circuit 14 to the primary side circuit 13 via the transformer 15 . A signal of the primary circuit 13 is output to the control device electrically connected to the primary circuit 13 via the primary terminal 11 . Further, the signal transmission device 10 may be configured such that signals are transmitted bidirectionally between the primary side circuit 13 and the secondary side circuit 14 . In short, the signal transmission device 10 includes a primary circuit 13 and a secondary circuit 14 configured to at least one of transmit and receive signals to and from the primary circuit 13 via a transformer 15. You can stay.
- on as used in this disclosure includes the meanings of “on” and “above” unless the context clearly indicates otherwise.
- the expression “A is formed on B” means that although in this embodiment A may be placed directly on B with A touching B, as a variant, A does not touch B. It is intended that it can be positioned above. That is, the term “on” does not exclude structures in which other members are formed between A and B.
- the z-direction used in the present disclosure does not necessarily have to be the vertical direction, nor does it have to match the vertical direction perfectly.
- the various structures according to this disclosure are not limited to the z-direction "top” and “bottom” described herein being the vertical “top” and “bottom”.
- the x-direction may be vertical, or the y-direction may be vertical.
- references herein to "at least one of A and B" should be understood to mean “A only, or B only, or both A and B.”
- the term “annular” may refer to any structure that forms a loop or continuous shape without ends and generally looped structures with interstices such as C-shapes. . "Annular" shapes include, but are not limited to, circular, elliptical, and polygonal shapes with sharp or rounded corners.
- a secondary die pad (80) on which the second chip (50) is mounted an insulating plate (100) interposed between the primary die pad (70) or the secondary die pad (80) and the insulating chip (60/120);
- the insulating tip (60/120) comprises: a device insulating layer (64) having a surface (64s) on which a first pad (61/131) and a second pad (62/132) are formed, and a back surface (64r) opposite to the surface (64s); , a first insulating element (21A, 21B/111A, 111B) and a second insulating element (22A, 22B/112A
- the first back-side conductive portions (32A, 32B/122A, 122B) and the second back-side conductive portions (34A, 34B/124A, 124B) are electrically connected,
- the first surface-side conductive portions (31A, 31B/121A, 121B) and the primary circuit (13) are electrically connected via the first pads (61/131),
- the second surface-side conductive portion (33A, 33B/123A, 123B) and the secondary circuit (14) are electrically connected via the second pad (62/132).
- Appendix 2 The signal transmission device according to appendix 1, wherein the insulating plate (100) is mounted on the primary die pad (70).
- the thickness (T2) of the insulating plate (100) is the same as the thickness of the first surface-side conductive portions (31A, 31B/121A, 121B) in the thickness direction (z direction) of the element insulating layer (64).
- the first back-side conductive portions (32A, 32B/122A, 122B) and the second back-side conductive portions (34A, 34B/124A, 124B) extend in the thickness direction (z direction) of the element insulating layer (64). 6.
- the signal transmission device according to any one of Appendices 1 to 5, which are arranged at the same positions in the .
- the first surface-side conductive portion is a first surface-side coil (31A, 31B) formed in a spiral or annular shape
- the first back-side conductive portion is a first back-side coil (32A, 32B) formed in a spiral or annular shape
- the second surface-side conductive portion is a second surface-side coil (33A, 33B) formed in a spiral or annular shape
- the signal transmission device according to any one of Appendices 1 to 7, wherein the second back side conductive portion is a second back side coil (34A, 34B) formed in a spiral or annular shape.
- the first pads (61A, 61B) are arranged inside the first surface-side coils (31A, 31B),
- the second pads (62A, 62B) are arranged inside the second surface-side coils (33A, 33B).
- the signal transmission device according to .
- the first back side coils (32A, 32B) and the second back side coils (34A, 34B) are arranged at the same position in the thickness direction (z direction) of the element insulating layer (64),
- the insulating chip (60) includes a first loop-shaped conductive portion (39A) and a second loop-shaped conductive portion (39B) provided in the element insulating layer (64),
- the first loop-shaped conductive portion (39A) is an open annular first facing portion (39p) and a second facing portion (39q) open to face each other; and a connecting portion (39r) connecting the open ends of the opposing portions (39p, 39q) to form a loop
- the first facing portion (39p) is arranged at a position facing the first surface side coil (31A/31B) in the thickness direction (z direction) of the element insulating layer (64), It constitutes a coil (32A/32B),
- the second facing portion (39q) is arranged at a position facing the second
- Both the first surface-side coils (31A, 31B) and the second surface-side coils (33A, 33B) are made of a material containing copper, Both the first back side coils (32A, 32B) and the second back side coils (34A, 34B) are made of a material containing aluminum. Signal transmission according to any one of appendices 8 to 11 Device.
- the signal transmission device (10) transmits a signal from the primary side circuit (13) through transformers (15A, 15B) having the first insulating elements (21A, 21B) and the second insulating elements (22A, 22B). configured to transmit a signal toward the secondary circuit (14),
- the transformer includes a first signal transformer (15A) and a second signal transformer (15B), the signals transmitted through the transformers (15A, 15B) include a first signal and a second signal; the first signal is transmitted from the primary circuit (13) to the secondary circuit (14) through the first signal transformer (15A); The second signal is transmitted from the primary side circuit (13) to the secondary side circuit (14) via the second signal transformer (15B).
- the signal transmission device according to .
- the first surface-side coils (31A, 31B) and the second surface-side coils (33A, 33B) are arranged with a gap in the first direction (x direction)
- the first back side coils (32A, 32B) and the second back side coils (34A, 34B) are arranged with a gap in the first direction (x direction)
- the first surface-side coil (31A) of the first signal transformer (15A) and the first surface-side coil (31B) of the second signal transformer (15B) have a thickness of the element insulating layer (64) are arranged with gaps in a second direction (y direction) orthogonal to the first direction (x direction) when viewed from the vertical direction (z direction), In the second direction (y direction), the second surface side coil (33A) of the first signal transformer (15A) and the second surface side coil (33B) of the second signal transformer (15B) arranged with gaps between The first back side coil (32A) of the first signal transformer (15A) and the first back side
- a third pad (61C) and a fourth pad (62C) are formed on the surface (64s) of the element insulating layer (64), When viewed from the thickness direction (z direction) of the element insulating layer (64), the third pad (61C) includes the first surface-side coil (31A) of the first signal transformer (15A) and the third pad (61C). The first surface coil (31A) of the first signal transformer (15A) and the second signal transformer are arranged between the first surface coil (31B) of the two-signal transformer (15B).
- the fourth pad (62C) is arranged between the second surface side coil (33A) of the first signal transformer (15A) and the second surface side coil (33A).
- the second surface side coil (33A) of the first signal transformer (15A) and the second signal transformer are arranged between the second surface side coil (33B) of the two-signal transformer (15B) and the second surface side coil (33A) of the first signal transformer (15A).
- the signal transmission device according to appendix 14 which is electrically connected to the second surface side coil (33B) of (15B).
- the first surface-side conductive portion is a first surface-side electrode plate (121A, 121B) formed in a flat plate shape
- the first back-side conductive portion is a first back-side electrode plate (122A, 122B) formed in a flat plate shape
- the second surface-side conductive portion is a second surface-side electrode plate (123A, 123B) formed in a flat plate shape
- the signal transmission device (10) converts the primary side circuit (13) to the secondary side circuit (13) through a capacitor (110) having the first insulating element (110A) and the second insulating element (110B). 15) is configured to transmit a signal toward The capacitor (110) includes a first signal capacitor (110A) and a second signal capacitor (110B), the signal transmitted through the capacitor (110) comprises a first signal and a second signal; the first signal is transmitted from the primary circuit (13) to the secondary circuit (14) through the first signal capacitor (110A); 17.
- the signal transmission device according to appendix 16 wherein the second signal is transmitted from the primary circuit (13) to the secondary circuit (14) via the second signal capacitor (110B).
- the first surface-side electrode plates (121A, 121B) and the second surface-side electrode plates (123A, 123B) are arranged with a gap in the first direction (x direction)
- the first back electrode plates (122A, 122B) and the second back electrode plates (124A, 124B) are arranged with a gap in the first direction
- the first surface-side electrode plate (121A) of the first signal capacitor (110A) and the first surface-side electrode plate (121B) of the second signal capacitor (110B) are formed from the element insulating layer (64).
- the second surface side electrode plate (123A) of the first signal capacitor (110A) and the second surface side electrode plate (123B) of the second signal capacitor (110B) are arranged in the second direction (y direction).
- the first back side electrode plate (122A) of the first signal capacitor (110A) and the first back side electrode plate (122B) of the second signal capacitor (110B) are arranged in the second direction (y direction).
- the second back side electrode plate (124A) of the first signal capacitor (110A) and the second back side electrode plate (124B) of the second signal capacitor (110B) are arranged in the second direction (y direction). ), the signal transmission device according to appendix 17.
- the first pad (131) When viewed from the second direction (y-direction), the first pad (131) is located between the first surface side electrode plate (121A) of the first signal capacitor (110A) and the second signal capacitor (110B). ) at a position overlapping the first surface-side electrode plate (121B), When viewed from the second direction (y-direction), the second pad (132) is located between the second surface side electrode plate (123A) of the first signal capacitor (110A) and the second signal capacitor (110B). ) in a position overlapping the second surface-side electrode plate (123B).
- An insulation unit having an element insulation layer (64) and first insulation elements (21A, 21B/111A, 111B) and second insulation elements (22A, 22B/112A, 112B) embedded in the element insulation layer (64).
- An isolation module comprising The element insulating layer (64) has a surface (64s) on which a first pad (61/131) and a second pad (62/132) are formed, and a back surface (64r) opposite to the surface (64s).
- the first insulating elements (21A, 21B/111A, 111B) are A first surface-side conductive part ( 31A, 31B/121A, 121B) and Arranged closer to the back surface (64r) than the front surface (64s) in the element insulating layer (64), the first surface-side conductive portions (31A, 31B/121A, 121B) and the element insulating layer (64) ) and a first back side conductive portion (32A, 32B/122A, 122B) arranged opposite to each other in the thickness direction (z direction) of
- the second insulating elements (22A, 22B/112A, 112B) are a second surface-side conductive portion ( 33A, 33B/123A, 123B) and The second surface-side conductive portions (33A, 33B/123A, 123B) and the element insulating layer (64) are arranged closer to the back surface (64r) than the front surface (64s) in the element insulating layer (64).
- first back-side conductive portions (32A, 32B/122A, 122B) and the second back-side conductive portions (34A, 34B/134A, 134B) are electrically connected.
- a secondary die pad (80) on which the second chip (50) is mounted When, a secondary die pad (80) on which the second chip (50) is mounted;
- the insulating chip (60/120) is mounted on the primary die pad (70) or the secondary die pad (80), a device insulating layer (64) having a surface (64s) on which a first pad (61/131) and a second pad (62/132) are formed, and a back surface (64r) opposite to the surface (64s); , a first insulating element (21A, 21B/111A, 111B) and a second insulating element (22A, 22B/112A, 112B
- the first back-side conductive portions (32A, 32B/122A, 122B) and the second back-side conductive portions (34A, 34B/124A, 124B) are electrically connected,
- the first surface-side conductive portions (31A, 31B/121A, 121B) and the primary circuit (13) are electrically connected via the first pads (61/131),
- the second surface-side conductive portion (33A, 33B/123A, 123B) and the secondary circuit (14) are electrically connected via the second pad (62/132).
- the first pads (61A, 61B) are arranged on the opposite side of the first surface-side coils (31A, 31B) from the second surface-side coils (33A, 33B), According to Appendix 10, the second pads (62A, 62B) are arranged on the side opposite to the first surface-side coils (31A, 31B) with respect to the second surface-side coils (33A, 33B). signaling device.
- the first pads (61A, 61B) extend along the thickness direction (z direction) of the element insulating layer (64), the first surface side (31A, 31B) and the second surface side coils (33A, 33B).
- the second pads (62A, 62B) extend along the thickness direction (z direction) of the element insulating layer (64), the first surface side (31A, 31B) and the second surface side coils (33A, 33B).
- the signal transmission device according to appendix 10 wherein the second surface-side coils (33A, 33B) are overlapped when viewed from a direction (y direction) perpendicular to both the arrangement direction (x direction) of the .
- second coil (first back-side conductive portion, first back-side coil) 33A, 33B... 1st coil (2nd surface side conductive part, 2nd surface side coil) 34A, 34B . . . second coil (second back-side conductive portion, second back-side coil) 35... Coil part 36... First end part 37... Second end part 38A... First coil 38B... Second coil 39A... First loop-shaped conductive part 39B... Second loop-shaped conductive part 39C... Third loop-shaped conductive part 39D... Fourth loop-shaped conductive part 39p... First opposing part 39q... Second opposing part 39r... Connecting part 39ra... First connecting part 39rb... Second connecting part 40... First chip 40s... Chip main surface 40r...
- connection wire T1 ... Thickness of transformer chip T2 . Thickness of insulating layer T3 . Thickness of substrate T4 . Thickness of element insulating layer DA to DC ...
- first coil and second coil DD, DE ... Distance between the second coil and the primary side die pad DF to DH ... Distance between the first electrode plate and the second electrode plate DI, DJ ... Second electrode plate and the primary side die pad distance between
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Abstract
Description
図1~図6を参照して、第1実施形態の信号伝達装置10について説明する。図1は、信号伝達装置10の回路構成の一例を簡略化して示している。
本実施形態の信号伝達装置10は、1次側回路13から2次側回路14に向けて2種類の信号を伝達させることに対応させて、トランス15を2つ備えている。より詳細には、信号伝達装置10は、1次側回路13から2次側回路14への第1信号の伝達に用いられるトランス15と、1次側回路13から2次側回路14への第2信号の伝達に用いられるトランス15と、を備えている。本実施形態では、第1信号は信号伝達装置10に入力される外部信号の立ち上がり情報を含む信号であり、第2信号は外部信号の立ち下がり情報を含む信号である。第1信号および第2信号によってパルス信号が生成される。
図3は、トランスチップ60の平面構造を模式的に示した平面図である。図4は、トランスチップ60の内部をxy平面で切った断面構造を模式的に示した断面図である。図4では、図面の見やすさの観点からハッチング線を省略して示している。図5および図6は、トランスチップ60が1次側ダイパッド70に搭載された状態におけるトランスチップ60の断面構造を示している。図5および図6は、トランスチップ60の模式的な断面構造であり、後述する素子絶縁層64の積層数は図5および図6の素子絶縁層64の積層数に限定されない。また、図5および図6における各コイル31A,31B,32A,32B,33A,34Aは、模式的に示されているため、図3における各コイル31A,31B,32A,32B,33A,34Aの構成とは整合していない。また、図5および図6では、後述する第1端部36を省略して示している。
基板63は、たとえば半導体基板によって形成されている。本実施形態では、基板63は、Si(シリコン)を含む材料から形成された基板である。なお、基板63は、半導体基板として、ワイドバンドギャップ半導体または化合物半導体が用いられていてもよい。また、基板63は、半導体基板に代えて、ガラスを含む材料によって形成された絶縁基板が用いられていてもよい。
第1絶縁膜64Aは、たとえばエッチングストッパ膜であり、SiN(窒化シリコン)、SiC、SiCN(窒素添加炭化シリコン)等を含む材料によって形成されている。本実施形態では、第1絶縁膜64Aは、SiNを含む材料によって形成されている。第2絶縁膜64Bは、たとえば層間絶縁膜であり、SiO2(酸化シリコン)を含む材料によって形成された酸化膜である。図5および図6に示すとおり、第2絶縁膜64Bの厚さは、第1絶縁膜64Aの厚さよりも厚い。第1絶縁膜64Aの厚さは、100nm以上1000nm未満であってもよい。第2絶縁膜64Bの厚さは、1000nm以上3000nm以下であってもよい。本実施形態では、第1絶縁膜64Aの厚さはたとえば300nm程度であり、第2絶縁膜64Bの厚さはたとえば2000nm程度である。
また、絶縁板100の厚さT2は、素子絶縁層64の厚さT4よりも厚い。厚さT4は、素子絶縁層64の表面64sと裏面64rとのz方向の間の距離によって定義できる。一例では、絶縁板100の厚さT2は50μm程度であり、素子絶縁層64の厚さT4は20μm程度である。
次に、本実施形態の作用について説明する。図7は、比較例のトランスチップ60Xの平面図である。図8は、比較例のトランスチップ60Xの内部をxy平面で切った断面構造を模式的に示した断面図である。図8では、図面の見やすさの観点からハッチング線を省略して示している。図9は、比較例のトランスチップ60Xの断面図である。なお、以降の説明では、比較例のトランスチップ60Xの構成要素のうち本実施形態のトランスチップ60の構成要素と共通する構成要素には同一符号を付し、その説明を省略する。
本実施形態によれば、以下の効果が得られる。
(1-1)信号伝達装置10は、1次側回路13を含む第1チップ40と、第1チップ40が実装される1次側ダイパッド70と、絶縁チップとしてのトランスチップ60と、トランスチップ60を介して1次側回路13と信号の受信を行うように構成された2次側回路14を含む第2チップ50と、第2チップ50が実装される2次側ダイパッド80と、1次側ダイパッド70とトランスチップ60との間に介在された絶縁板100と、を備えている。トランスチップ60は、第1電極パッド61および第2電極パッド62が形成された表面64s、および表面64sとは反対側の裏面64rを有する素子絶縁層64と、素子絶縁層64内に設けられた第1絶縁素子としての第1トランス21A(21B)および第2絶縁素子としての第2トランス22A(22B)と、を有している。第1トランス21A(21B)は、素子絶縁層64内における裏面64rよりも表面64sの近くに配置された第1表面側導電部としての第1コイル31A(31B)と、素子絶縁層64内における表面64sよりも裏面64rの近くに配置された第1裏面側導電部としての第2コイル32A(32B)と、を有している。第1コイル31A(31B)は、第1電極パッド61に電気的に接続されている。第2コイル32A(32B)は、第1コイル31A(31B)と素子絶縁層64の厚さ方向であるz方向に対向配置されている。第2トランス22A(22B)は、素子絶縁層64内における裏面64rよりも表面64sの近くに配置された第2表面側導電部としての第1コイル33A(33B)と、素子絶縁層64内における表面64sよりも裏面64rの近くに配置された第2裏面側導電部としての第2コイル34A(34B)と、を有している。第1コイル33A(33B)は、第2電極パッド62に電気的に接続されている。第2コイル34A(34B)は、第1コイル33A(33B)とz方向に対向配置されている。第2コイル32A(32B)と第2コイル34A(34B)とは電気的に接続されている。第1コイル31A(31B)と1次側回路13とは、第1電極パッド61を介して電気的に接続されている。第1コイル33A(33B)と2次側回路14とは、第2電極パッド62を介して電気的に接続されている。
この構成によれば、トランスチップ60と1次側ダイパッド70とのz方向の間に絶縁板100が介在しているため、トランスチップ60の第2コイル32A,32B,34A,34Bと1次側ダイパッド70とのz方向の間の距離を大きくとることができる。したがって、トランスチップ60と1次側ダイパッド70との間の絶縁耐圧の向上を図ることができる。
この構成によれば、絶縁板100を絶縁膜によって構成する場合と比較して、上記(1-2)の厚さT2を有する絶縁板100を容易に形成することができる。
この構成によれば、z方向における第1コイル31Aと第2コイル32Aとの間の距離DAと、z方向における第1コイル33Aと第2コイル34Aとの間の距離DBと、z方向における第1コイル31Bと第2コイル32Bとの間の距離DCと、z方向における第1コイル33Bと第2コイル34Bとの間の距離とのそれぞれを大きくとることができる。したがって、トランスチップ60の絶縁耐圧の向上を図ることができる。
図10~図15を参照して、第2実施形態の信号伝達装置10について説明する。本実施形態の信号伝達装置10は、第1実施形態の信号伝達装置10と比較して、トランス15による絶縁構造からキャパシタ110による絶縁構造に変更した点が主に異なる。以降の説明では、第1実施形態と異なる点を主に説明し、第1実施形態と共通する構成要素には同一の符号を付し、その説明を省略する。
図11に示すように、信号伝達装置10は、第1実施形態のトランスチップ60(図2参照)に代えて、キャパシタチップ120を備えている。キャパシタチップ120は、トランスチップ60と同様に、x方向において第1チップ40と第2チップ50との間に配置されている。第1実施形態のトランスチップ60と同様に、本実施形態では、キャパシタチップ120と第2チップ50とのx方向の間の距離は、キャパシタチップ120と第1チップ40とのx方向の間の距離よりも大きい。
図12は、キャパシタチップ120の平面構造を模式的に示した平面図である。図13は、キャパシタチップ120の内部をxy平面で切った断面構造を模式的に示した断面図である。図13では、図面の見やすさの観点からハッチング線を省略して示している。図14および図15は、キャパシタチップ120が1次側ダイパッド70に搭載された状態におけるキャパシタチップ120の断面構造を示している。
より詳細には、図14に示すように、第1キャパシタ111Aの第1電極板121Aと第1電極パッド131Aとは、接続線141によって接続されている。第1電極板121Aに接続された接続線141は、素子絶縁層64に埋め込まれている。つまり、第1キャパシタ111Aの第1電極板121Aと第1電極パッド131Aとは、素子絶縁層64内で電気的に接続されている。
上記各実施形態は本開示に関する信号伝達装置が取り得る形態の例示であり、その形態を制限することを意図していない。本開示に関する信号伝達装置は、上記各実施形態に例示された形態とは異なる形態を取り得る。その一例は、上記各実施形態の構成の一部を置換、変更、もしくは省略した形態、または上記各実施形態に新たな構成を付加した形態である。また、以下の各変更例は、技術的に矛盾しない限り、互いに組み合わせることができる。以下の各変更例において、上記各実施形態に共通する部分については、上記各実施形態と同一符号を付してその説明を省略する。
・各実施形態において、絶縁板100と1次側ダイパッド70との間に介在する接合材は任意に変更可能である。一例では、導電性接合材SDに代えて、絶縁性接合材を用いてもよい。
トランスチップ60(キャパシタチップ120)は、たとえば1次側回路モジュールに適用されてもよい。つまり、1次側回路モジュールは、第1チップ40と、トランスチップ60(キャパシタチップ120)と、これらチップ40,60(120)を封止する封止樹脂と、を備えている。また1次側回路モジュールは、第1チップ40およびトランスチップ60(キャパシタチップ120)が搭載された1次側ダイパッド70を備えている。1次側ダイパッド70には、絶縁板100が搭載されている。トランスチップ60(キャパシタチップ120)は、絶縁板100に搭載されている。
一例では、信号伝達装置10は、上記1次側回路モジュールと第2チップ50とを備えていてもよい。この場合、第2チップ50が2次側ダイパッド80に搭載され、2次側ダイパッド80および第2チップ50の双方が封止樹脂によって封止されたモジュールによって構成されていてもよい。
本明細書で使用する「環状」という用語は、ループを形成する任意の構造、または両端のない連続した形状、およびC形状のような隙間を有する一般的にループ状の構造を指す場合がある。「環状」形状には、円形状、楕円形状、および角が鋭いまたは丸みを帯びた多角形状が含まれるが、これらに限定されるものではない。
上記各実施形態および上記各変更例から把握できる技術的思想を以下に記載する。なお、各付記に記載された構成要素に対応する実施形態の構成要素の符号を括弧書きで示す。符号は、理解の補助のために例として示すものであり、各付記に記載された構成要素は、符号で示される構成要素に限定されるべきではない。
1次側回路(13)を含む第1チップ(40)と、
前記第1チップ(40)が実装される1次側ダイパッド(70)と、
絶縁チップ(60/120)と、
前記絶縁チップ(60/120)を介して前記1次側回路(13)と信号の送信および受信の少なくとも一方を行うように構成された2次側回路(14)を含む第2チップ(50)と、
前記第2チップ(50)が実装される2次側ダイパッド(80)と、
前記1次側ダイパッド(70)または前記2次側ダイパッド(80)と前記絶縁チップ(60/120)との間に介在された絶縁板(100)と、を備え、
前記絶縁チップ(60/120)は、
第1パッド(61/131)および第2パッド(62/132)が形成された表面(64s)、および前記表面(64s)とは反対側の裏面(64r)を有する素子絶縁層(64)と、
前記素子絶縁層(64)内に設けられた第1絶縁素子(21A,21B/111A,111B)および第2絶縁素子(22A,22B/112A,112B)と、を有し、
前記第1絶縁素子(21A,21B/111A,111B)は、
前記素子絶縁層(64)内における前記裏面(64r)よりも前記表面(64s)の近くに配置され、前記第1パッド(61/131)に電気的に接続された第1表面側導電部(31A,31B/121A,121B)と、
前記素子絶縁層(64)内における前記表面(64s)よりも前記裏面(64r)の近くに配置され、前記第1表面側導電部(31A,31B/121A,121B)と前記素子絶縁層(64)の厚さ方向(z方向)に対向配置された第1裏面側導電部(32A,32B/122A,122B)と、を備え、
前記第2絶縁素子(22A,22B/112A,112B)は、
前記素子絶縁層(64)内における前記裏面(64r)よりも前記表面(64s)の近くに配置され、前記第2パッド(62/132)に電気的に接続された第2表面側導電部(33A,33B/123A,123B)と、
前記素子絶縁層(64)内における前記表面(64s)よりも前記裏面(64r)の近くに配置され、前記第2表面側導電部(33A,33B/123A,123B)と前記素子絶縁層(64)の厚さ方向(z方向)に対向配置された第2裏面側導電部(34A,34B/124A,124B)と、を備え、
前記第1裏面側導電部(32A,32B/122A,122B)と前記第2裏面側導電部(34A,34B/124A,124B)とが電気的に接続されており、
前記第1表面側導電部(31A,31B/121A,121B)と前記1次側回路(13)とは、前記第1パッド(61/131)を介して電気的に接続されており、
前記第2表面側導電部(33A,33B/123A,123B)と前記2次側回路(14)とは、前記第2パッド(62/132)を介して電気的に接続されている
信号伝達装置(10)。
前記絶縁板(100)は、前記1次側ダイパッド(70)に搭載されている
付記1に記載の信号伝達装置。
前記絶縁板(100)は、前記2次側ダイパッド(80)に搭載されている
付記1に記載の信号伝達装置。
前記絶縁板(100)の厚さ(T2)は、前記素子絶縁層(64)の厚さ方向(z方向)における前記第1表面側導電部(31A,31B/121A,121B)と前記第1裏面側導電部(32A,32B/122A,122B)との間の距離(DA,DC)と、前記素子絶縁層(64)の厚さ方向(z方向)における前記第2表面側導電部(33A,33B/123A,123B)と前記第2裏面側導電部(34A,34B/124A,124B)との間の距離(DC)との双方よりも厚い
付記2または3に記載の信号伝達装置。
前記絶縁板(100)は、アルミナを含む絶縁基板、ガラスを含む絶縁基板、または絶縁樹脂によって形成されている
付記1~4のいずれか1つに記載の信号伝達装置。
前記第1裏面側導電部(32A,32B/122A,122B)および前記第2裏面側導電部(34A,34B/124A,124B)は、前記素子絶縁層(64)の厚さ方向(z方向)において互いに同じ位置に配置されている
付記1~5のいずれか1つに記載の信号伝達装置。
前記素子絶縁層(64)の厚さ方向(z方向)における前記第1表面側導電部(31A,31B/121A,121B)と前記第1裏面側導電部(32A,32B/122A,122B)との間の距離(DA,DC)と、前記素子絶縁層(64)の厚さ方向(z方向)における前記第2表面側導電部(33A,33B/123A,123B)と前記第2裏面側導電部(34A,34B/124A,124B)との間の距離(DC)とは、互いに等しい
付記1~6のいずれか1つに記載の信号伝達装置。
前記第1表面側導電部は、渦巻き状または環状に形成された第1表面側コイル(31A,31B)であり、
前記第1裏面側導電部は、渦巻き状または環状に形成された第1裏面側コイル(32A,32B)であり、
前記第2表面側導電部は、渦巻き状または環状に形成された第2表面側コイル(33A,33B)であり、
前記第2裏面側導電部は、渦巻き状または環状に形成された第2裏面側コイル(34A,34B)である
付記1~7のいずれか1つに記載の信号伝達装置。
前記素子絶縁層(64)の厚さ方向(z方向)から視て、前記第1パッド(61A,61B)は、前記第1表面側コイル(31A,31B)の中心からずれて配置されており、
前記素子絶縁層(64)の厚さ方向(z方向)から視て、前記第2パッド(62A,62B)は、前記第2表面側コイル(33A,33B)の中心からずれて配置されている
付記8に記載の信号伝達装置。
前記素子絶縁層(64)の厚さ方向(z方向)から視て、前記第1パッド(61A,61B)は、前記第1表面側コイル(31A,31B)の内側に配置されており、
前記素子絶縁層(64)の厚さ方向(z方向)から視て、前記第2パッド(62A,62B)は、前記第2表面側コイル(33A,33B)の内側に配置されている
付記9に記載の信号伝達装置。
前記第1裏面側コイル(32A,32B)および前記第2裏面側コイル(34A,34B)は、前記素子絶縁層(64)の厚さ方向(z方向)において同じ位置に配置されており、
前記絶縁チップ(60)は、前記素子絶縁層(64)内に設けられた第1ループ状導電部(39A)および第2ループ状導電部(39B)を含み、
前記第1ループ状導電部(39A)は、
互いに向き合うように開口した開いた環状の第1対向部(39p)および第2対向部(39q)と、
前記両対向部(39p,39q)の開口端同士を連結している連結部(39r)と、によってループ状に構成されており、
前記第1対向部(39p)は、前記素子絶縁層(64)の厚さ方向(z方向)において前記第1表面側コイル(31A/31B)と対向する位置に配置され、前記第1裏面側コイル(32A/32B)を構成しており、
前記第2対向部(39q)は、前記素子絶縁層(64)の厚さ方向(z方向)において前記第2表面側コイル(33A/33B)と対向する位置に配置され、前記第2裏面側コイル(34A/34B)を構成しており、
前記第2ループ状導電部(39B)は、
前記第1ループ状導電部(39A)と相似状に形成されており、前記素子絶縁層(64)の厚さ方向(z方向)から視て、前記第1ループ状導電部(39A)を囲むように配置されている
付記8~10のいずれか1つに記載の信号伝達装置。
前記第1表面側コイル(31A,31B)および前記第2表面側コイル(33A,33B)の双方は、銅を含む材料によって形成されており、
前記第1裏面側コイル(32A,32B)および前記第2裏面側コイル(34A,34B)の双方は、アルミニウムを含む材料によって形成されている
付記8~11のいずれか1つに記載の信号伝達装置。
前記信号伝達装置(10)は、前記第1絶縁素子(21A,21B)および前記第2絶縁素子(22A,22B)を有するトランス(15A,15B)を介して前記1次側回路(13)から前記2次側回路(14)に向けて信号が伝達されるように構成されており、
前記トランスは、第1信号用トランス(15A)および第2信号用トランス(15B)を含み、
前記トランス(15A,15B)を介して伝達される前記信号は、第1信号および第2信号を含み、
前記第1信号は、前記第1信号用トランス(15A)を介して前記1次側回路(13)から前記2次側回路(14)に向けて伝達され、
前記第2信号は、前記第2信号用トランス(15B)を介して前記1次側回路(13)から前記2次側回路(14)に向けて伝達される
付記8~12のいずれか1つに記載の信号伝達装置。
前記素子絶縁層(64)の厚さ方向(z方向)から視て、前記1次側ダイパッド(70)と前記2次側ダイパッド(80)とは、隙間を介して配列されており、
前記第1チップ(40)、前記第2チップ(50)、および前記絶縁チップ(60)は、前記1次側ダイパッド(70)と前記2次側ダイパッド(80)との配列方向である第1方向(x方向)において互いに隙間を介して配列されており、
前記第1表面側コイル(31A,31B)および前記第2表面側コイル(33A,33B)は、前記第1方向(x方向)において隙間を介して配列されており、
前記第1裏面側コイル(32A,32B)および前記第2裏面側コイル(34A,34B)は、前記第1方向(x方向)において隙間を介して配列されており、
前記第1信号用トランス(15A)の前記第1表面側コイル(31A)および前記第2信号用トランス(15B)の前記第1表面側コイル(31B)は、前記素子絶縁層(64)の厚さ方向(z方向)から視て前記第1方向(x方向)と直交する第2方向(y方向)において隙間を介して配列されており、
前記第1信号用トランス(15A)の前記第2表面側コイル(33A)および前記第2信号用トランス(15B)の前記第2表面側コイル(33B)は、前記第2方向(y方向)において隙間を介して配列されており、
前記第1信号用トランス(15A)の前記第1裏面側コイル(32A)および前記第2信号用トランス(15B)の前記第1裏面側コイル(32B)は、前記第2方向(y方向)において隙間を介して配列されており、
前記第1信号用トランス(15A)の前記第2裏面側コイル(34A)および前記第2信号用トランス(15B)の前記第2裏面側コイル(34B)は、前記第2方向(y方向)において隙間を介して配列されている
付記13に記載の信号伝達装置。
前記素子絶縁層(64)の前記表面(64s)には、第3パッド(61C)および第4パッド(62C)が形成されており、
前記第3パッド(61C)は、前記素子絶縁層(64)の厚さ方向(z方向)から視て、前記第1信号用トランス(15A)の前記第1表面側コイル(31A)と前記第2信号用トランス(15B)の前記第1表面側コイル(31B)との間に配置され、前記第1信号用トランス(15A)の前記第1表面側コイル(31A)と前記第2信号用トランス(15B)の前記第1表面側コイル(31B)とに電気的に接続されており、
前記第4パッド(62C)は、前記素子絶縁層(64)の厚さ方向(z方向)から視て、前記第1信号用トランス(15A)の前記第2表面側コイル(33A)と前記第2信号用トランス(15B)の前記第2表面側コイル(33B)との間に配置され、前記第1信号用トランス(15A)の前記第2表面側コイル(33A)と前記第2信号用トランス(15B)の前記第2表面側コイル(33B)とに電気的に接続されている
付記14に記載の信号伝達装置。
前記第1表面側導電部は、平板状に形成された第1表面側電極板(121A,121B)であり、
前記第1裏面側導電部は、平板状に形成された第1裏面側電極板(122A,122B)であり、
前記第2表面側導電部は、平板状に形成された第2表面側電極板(123A,123B)であり、
前記第2裏面側導電部は、平板状に形成された第2裏面側電極板(124A,124B)である
付記1~7のいずれか1つに記載の信号伝達装置。
前記信号伝達装置(10)は、前記第1絶縁素子(110A)および前記第2絶縁素子(110B)を有するキャパシタ(110)を介して前記1次側回路(13)から前記2次側回路(15)に向けて信号が伝達されるように構成されており、
前記キャパシタ(110)は、第1信号用キャパシタ(110A)および第2信号用キャパシタ(110B)を含み、
前記キャパシタ(110)を介して伝達される前記信号は、第1信号および第2信号を含み、
前記第1信号は、前記第1信号用キャパシタ(110A)を介して前記1次側回路(13)から前記2次側回路(14)に向けて伝達され、
前記第2信号は、前記第2信号用キャパシタ(110B)を介して前記1次側回路(13)から前記2次側回路(14)に向けて伝達される
付記16に記載の信号伝達装置。
前記素子絶縁層(64)の厚さ方向(z方向)から視て、前記1次側ダイパッド(70)と前記2次側ダイパッド(80)とは、隙間を介して配列されており、
前記第1チップ(40)、前記第2チップ(50)、および前記絶縁チップ(120)は、前記1次側ダイパッド(70)と前記2次側ダイパッド(80)との配列方向である第1方向(x方向)において互いに隙間を介して配列されており、
前記第1表面側電極板(121A,121B)および前記第2表面側電極板(123A,123B)は、前記第1方向(x方向)において隙間を介して配列されており、
前記第1裏面側電極板(122A,122B)および前記第2裏面側電極板(124A,124B)は、前記第1方向において隙間を介して配列されており、
前記第1信号用キャパシタ(110A)の前記第1表面側電極板(121A)および前記第2信号用キャパシタ(110B)の前記第1表面側電極板(121B)は、前記素子絶縁層(64)の厚さ方向(z方向)から視て前記第1方向(x方向)と直交する第2方向(y方向)において隙間を介して配列されており、
前記第1信号用キャパシタ(110A)の前記第2表面側電極板(123A)および前記第2信号用キャパシタ(110B)の前記第2表面側電極板(123B)は、前記第2方向(y方向)において隙間を介して配列されており、
前記第1信号用キャパシタ(110A)の前記第1裏面側電極板(122A)および前記第2信号用キャパシタ(110B)の前記第1裏面側電極板(122B)は、前記第2方向(y方向)において隙間を介して配列されており、
前記第1信号用キャパシタ(110A)の前記第2裏面側電極板(124A)および前記第2信号用キャパシタ(110B)の前記第2裏面側電極板(124B)は、前記第2方向(y方向)において隙間を介して配列されている
付記17に記載の信号伝達装置。
前記第1パッド(131)は、前記第2方向(y方向)から視て、前記第1信号用キャパシタ(110A)の前記第1表面側電極板(121A)および前記第2信号用キャパシタ(110B)の前記第1表面側電極板(121B)と重なる位置に配置されており、
前記第2パッド(132)は、前記第2方向(y方向)から視て、前記第1信号用キャパシタ(110A)の前記第2表面側電極板(123A)および前記第2信号用キャパシタ(110B)の前記第2表面側電極板(123B)と重なる位置に配置されている
付記18に記載の信号伝達装置。
素子絶縁層(64)と、前記素子絶縁層(64)に埋め込まれた第1絶縁素子(21A,21B/111A,111B)および第2絶縁素子(22A,22B/112A,112B)を有する絶縁ユニットを備えた絶縁モジュールであって、
前記素子絶縁層(64)は、第1パッド(61/131)および第2パッド(62/132)が形成された表面(64s)、および前記表面(64s)とは反対側の裏面(64r)を有し、
前記第1絶縁素子(21A,21B/111A,111B)は、
前記素子絶縁層(64)内における前記裏面(64r)よりも前記表面(64s)の近くに配置され、前記第1パッド(61/131)に電気的に接続された第1表面側導電部(31A,31B/121A,121B)と、
前記素子絶縁層(64)内における前記表面(64s)よりも前記裏面(64r)の近くに配置され、前記第1表面側導電部(31A,31B/121A,121B)と前記素子絶縁層(64)の厚さ方向(z方向)に対向配置された第1裏面側導電部(32A,32B/122A,122B)と、を備え、
前記第2絶縁素子(22A,22B/112A,112B)は、
前記素子絶縁層(64)内における前記裏面(64r)よりも前記表面(64s)の近くに配置され、前記第2パッド(62/132)に電気的に接続された第2表面側導電部(33A,33B/123A,123B)と、
前記素子絶縁層(64)内における前記表面(64s)よりも前記裏面(64r)の近くに配置され、前記第2表面側導電部(33A,33B/123A,123B)と前記素子絶縁層(64)の厚さ方向(z方向)に対向配置された第2裏面側導電部(34A,34B/134A,134B)と、を備え、
前記第1裏面側導電部(32A,32B/122A,122B)と前記第2裏面側導電部(34A,34B/134A,134B)とが電気的に接続されている
絶縁モジュール。
1次側回路(13)を含む第1チップ(40)と、
前記第1チップ(40)が実装される1次側ダイパッド(70)と、
絶縁チップ(60/120)と、
前記絶縁チップ(60/120)を介して前記1次側回路(13)と信号の送信および受信の少なくとも一方を行うように構成された2次側回路(14)を含む第2チップ(50)と、
前記第2チップ(50)が実装される2次側ダイパッド(80)と、を備え、
前記絶縁チップ(60/120)は、前記1次側ダイパッド(70)または前記2次側ダイパッド(80)に搭載されており、
第1パッド(61/131)および第2パッド(62/132)が形成された表面(64s)、および前記表面(64s)とは反対側の裏面(64r)を有する素子絶縁層(64)と、
前記素子絶縁層(64)内に設けられた第1絶縁素子(21A,21B/111A,111B)および第2絶縁素子(22A,22B/112A,112B)と、を有し、
前記第1絶縁素子(21A,21B/111A,111B)は、
前記素子絶縁層(64)内における前記裏面(64r)よりも前記表面(64s)の近くに配置され、前記第1パッド(61/131)に電気的に接続された第1表面側導電部(31A,31B/121A,121B)と、
前記素子絶縁層(64)内における前記表面(64s)よりも前記裏面(64r)の近くに配置され、前記第1表面側導電部(31A,31B/121A,121B)と前記素子絶縁層(64)の厚さ方向(z方向)に対向配置された第1裏面側導電部(32A,32B/122A,122B)と、を備え、
前記第2絶縁素子(22A,22B/112A,112B)は、
前記素子絶縁層(64)内における前記裏面(64r)よりも前記表面(64s)の近くに配置され、前記第2パッド(62/132)に電気的に接続された第2表面側導電部(33A,33B/123A,123B)と、
前記素子絶縁層(64)内における前記表面(64s)よりも前記裏面(64r)の近くに配置され、前記第2表面側導電部(33A,33B/123A,123B)と前記素子絶縁層(64)の厚さ方向(z方向)に対向配置された第2裏面側導電部(34A,34B/124A,124B)と、を備え、
前記第1裏面側導電部(32A,32B/122A,122B)と前記第2裏面側導電部(34A,34B/124A,124B)とが電気的に接続されており、
前記第1表面側導電部(31A,31B/121A,121B)と前記1次側回路(13)とは、前記第1パッド(61/131)を介して電気的に接続されており、
前記第2表面側導電部(33A,33B/123A,123B)と前記2次側回路(14)とは、前記第2パッド(62/132)を介して電気的に接続されている
信号伝達装置(10)。
前記第1パッド(61A,61B)は、前記第1表面側コイル(31A,31B)に対して前記第2表面側コイル(33A,33B)とは反対側に配置され、
前記第2パッド(62A,62B)は、前記第2表面側コイル(33A,33B)に対して前記第1表面側コイル(31A,31B)とは反対側に配置されている
付記10に記載の信号伝達装置。
前記第1パッド(61A,61B)は、前記素子絶縁層(64)の厚さ方向(z方向)および前記第1表面側(31A,31B)と前記第2表面側コイル(33A,33B)との配列方向(x方向)との双方と直交する方向(y方向)から視て、前記第1表面側コイル(31A,31B)と重なる位置に配置され、
前記第2パッド(62A,62B)は、前記素子絶縁層(64)の厚さ方向(z方向)および前記第1表面側(31A,31B)と前記第2表面側コイル(33A,33B)との配列方向(x方向)との双方と直交する方向(y方向)から視て、前記第2表面側コイル(33A,33B)と重なる位置に配置されている
付記10に記載の信号伝達装置。
10A…信号伝達回路
11…1次側端子
12…2次側端子
13…1次側回路
14…2次側回路
15…トランス(絶縁素子)
15A…トランス(第1信号用トランス)
15B…トランス(第2信号用トランス)
16A,16B…1次側信号線
17A,17B…2次側信号線
18A,18A…接続信号線
19B,19B…接続信号線
21A,21B…第1トランス(第1絶縁素子)
22A,22B…第2トランス(第2絶縁素子)
31A,31B…第1コイル(第1表面側導電部、第1表面側コイル)
32A,32B…第2コイル(第1裏面側導電部、第1裏面側コイル)
33A,33B…第1コイル(第2表面側導電部、第2表面側コイル)
34A,34B…第2コイル(第2裏面側導電部、第2裏面側コイル)
35…コイル部
36…第1端部
37…第2端部
38A…第1コイル
38B…第2コイル
39A…第1ループ状導電部
39B…第2ループ状導電部
39C…第3ループ状導電部
39D…第4ループ状導電部
39p…第1対向部
39q…第2対向部
39r…連結部
39ra…第1連結部
39rb…第2連結部
40…第1チップ
40s…チップ主面
40r…チップ裏面
41…第1電極パッド
42…第2電極パッド
50…第2チップ
50s…チップ主面
50r…チップ裏面
51…第1電極パッド
52…第2電極パッド
60…トランスチップ(絶縁チップ)
60s…チップ主面
60r…チップ裏面
61…第1電極パッド
61A,61B…第1電極パッド(第1パッド)
61C…第1電極パッド(第3パッド)
62…第2電極パッド
62A,62B…第2電極パッド(第2パッド)
62C…第2電極パッド(第4パッド)
63…基板
63s…基板表面
63r…基板裏面
64…素子絶縁層
64s…表面
64r…裏面
64A…第1絶縁膜
64B…第2絶縁膜
65…保護膜
66…パッシベーション膜
67…接続線
68…接続線
70…1次側ダイパッド
80…2次側ダイパッド
90…封止樹脂
100…絶縁板
100s…主面
100r…裏面
110…キャパシタ
110A…キャパシタ(第1信号用キャパシタ)
110B…キャパシタ(第2信号用キャパシタ)
111A,111B…第1キャパシタ(第1絶縁素子)
112A,112B…第2キャパシタ(第2絶縁素子)
113A,113B…第1電極
114A,114A…第2電極
115A,115B…第1電極
116A,116B…第2電極
120…キャパシタチップ(絶縁チップ)
121A,121B…第1電極板(第1表面側導電部、第1表面側電極板)
122A,122B…第2電極板(第1裏面側導電部、第1裏面側電極板)
123A,123B…第1電極板(第2表面側導電部、第2表面側電極板)
124A,124B…第2電極板(第2裏面側導電部、第2裏面側電極板)
125A…第1電極体
125B…第2電極体
125p…第1対向部
125q…第2対向部
125r…連結部
131A,131B…第1電極パッド(第1パッド)
132A,132B…第2電極パッド(第2パッド)
141…接続線
142…接続線
T1…トランスチップの厚さ
T2…絶縁層の厚さ
T3…基板の厚さ
T4…素子絶縁層の厚さ
DA~DC…第1コイルと第2コイルとの間の距離
DD,DE…第2コイルと1次側ダイパッドとの間の距離
DF~DH…第1電極板と第2電極板との間の距離
DI,DJ…第2電極板と1次側ダイパッドとの間の距離
Claims (20)
- 1次側回路を含む第1チップと、
前記第1チップが実装される1次側ダイパッドと、
絶縁チップと、
前記絶縁チップを介して前記1次側回路と信号の送信および受信の少なくとも一方を行うように構成された2次側回路を含む第2チップと、
前記第2チップが実装される2次側ダイパッドと、
前記1次側ダイパッドまたは前記2次側ダイパッドと前記絶縁チップとの間に介在された絶縁板と、
を備え、
前記絶縁チップは、
第1パッドおよび第2パッドが形成された表面、および前記表面とは反対側の裏面を有する素子絶縁層と、
前記素子絶縁層内に設けられた第1絶縁素子および第2絶縁素子と、
を有し、
前記第1絶縁素子は、
前記素子絶縁層内における前記裏面よりも前記表面の近くに配置され、前記第1パッドに電気的に接続された第1表面側導電部と、
前記素子絶縁層内における前記表面よりも前記裏面の近くに配置され、前記第1表面側導電部と前記素子絶縁層の厚さ方向に対向配置された第1裏面側導電部と、
を備え、
前記第2絶縁素子は、
前記素子絶縁層内における前記裏面よりも前記表面の近くに配置され、前記第2パッドに電気的に接続された第2表面側導電部と、
前記素子絶縁層内における前記表面よりも前記裏面の近くに配置され、前記第2表面側導電部と前記素子絶縁層の厚さ方向に対向配置された第2裏面側導電部と、
を備え、
前記第1裏面側導電部と前記第2裏面側導電部とが電気的に接続されており、
前記第1表面側導電部と前記1次側回路とは、前記第1パッドを介して電気的に接続されており、
前記第2表面側導電部と前記2次側回路とは、前記第2パッドを介して電気的に接続されている
信号伝達装置。 - 前記絶縁板は、前記1次側ダイパッドに搭載されている
請求項1に記載の信号伝達装置。 - 前記絶縁板は、前記2次側ダイパッドに搭載されている
請求項1に記載の信号伝達装置。 - 前記絶縁板の厚さは、前記素子絶縁層の厚さ方向における前記第1表面側導電部と前記第1裏面側導電部との間の距離と、前記素子絶縁層の厚さ方向における前記第2表面側導電部と前記第2裏面側導電部との間の距離との双方よりも厚い
請求項2または3に記載の信号伝達装置。 - 前記絶縁板は、アルミナを含む絶縁基板、ガラスを含む絶縁基板、または、絶縁樹脂によって形成されている
請求項1~4のいずれか一項に記載の信号伝達装置。 - 前記第1裏面側導電部および前記第2裏面側導電部は、前記素子絶縁層の厚さ方向において互いに同じ位置に配置されている
請求項1~5のいずれか一項に記載の信号伝達装置。 - 前記素子絶縁層の厚さ方向における前記第1表面側導電部と前記第1裏面側導電部との間の距離と、前記素子絶縁層の厚さ方向における前記第2表面側導電部と前記第2裏面側導電部との間の距離とは、互いに等しい
請求項1~6のいずれか一項に記載の信号伝達装置。 - 前記第1表面側導電部は、渦巻き状または環状に形成された第1表面側コイルであり、
前記第1裏面側導電部は、渦巻き状または環状に形成された第1裏面側コイルであり、
前記第2表面側導電部は、渦巻き状または環状に形成された第2表面側コイルであり、
前記第2裏面側導電部は、渦巻き状または環状に形成された第2裏面側コイルである
請求項1~7のいずれか一項に記載の信号伝達装置。 - 前記素子絶縁層の厚さ方向から視て、前記第1パッドは、前記第1表面側コイルの中心からずれて配置されており、
前記素子絶縁層の厚さ方向から視て、前記第2パッドは、前記第2表面側コイルの中心からずれて配置されている
請求項8に記載の信号伝達装置。 - 前記素子絶縁層の厚さ方向から視て、前記第1パッドは、前記第1表面側コイルの内側に配置されており、
前記素子絶縁層の厚さ方向から視て、前記第2パッドは、前記第2表面側コイルの内側に配置されている
請求項9に記載の信号伝達装置。 - 前記第1裏面側コイルおよび前記第2裏面側コイルは、前記素子絶縁層の厚さ方向において同じ位置に配置されており、
前記絶縁チップは、前記素子絶縁層内に設けられた第1ループ状導電部および第2ループ状導電部を含み、
前記第1ループ状導電部は、
互いに向き合うように開口した開いた環状の第1対向部および第2対向部と、
前記両対向部の開口端同士を連結している連結部と、によってループ状に構成されており、
前記第1対向部は、前記素子絶縁層の厚さ方向において前記第1表面側コイルと対向する位置に配置され、前記第1裏面側コイルを構成しており、
前記第2対向部は、前記素子絶縁層の厚さ方向において前記第2表面側コイルと対向する位置に配置され、前記第2裏面側コイルを構成しており、
前記第2ループ状導電部は、
前記第1ループ状導電部と相似状に形成されており、前記素子絶縁層の厚さ方向から視て、前記第1ループ状導電部を囲むように配置されている
請求項8~10のいずれか一項に記載の信号伝達装置。 - 前記第1表面側コイルおよび前記第2表面側コイルの双方は、銅を含む材料によって形成されており、
前記第1裏面側コイルおよび前記第2裏面側コイルの双方は、アルミニウムを含む材料によって形成されている
請求項8~11のいずれか一項に記載の信号伝達装置。 - 前記信号伝達装置は、前記第1絶縁素子および前記第2絶縁素子を有するトランスを介して前記1次側回路から前記2次側回路に向けて信号が伝達されるように構成されており、
前記トランスは、第1信号用トランスおよび第2信号用トランスを含み、
前記トランスを介して伝達される前記信号は、第1信号および第2信号を含み、
前記第1信号は、前記第1信号用トランスを介して前記1次側回路から前記2次側回路に向けて伝達され、
前記第2信号は、前記第2信号用トランスを介して前記1次側回路から前記2次側回路に向けて伝達される
請求項8~12のいずれか一項に記載の信号伝達装置。 - 前記素子絶縁層の厚さ方向から視て、前記1次側ダイパッドと前記2次側ダイパッドとは、隙間を介して配列されており、
前記第1チップ、前記第2チップ、および前記絶縁チップは、前記1次側ダイパッドと前記2次側ダイパッドとの配列方向である第1方向において互いに隙間を介して配列されており、
前記第1表面側コイルおよび前記第2表面側コイルは、前記第1方向において隙間を介して配列されており、
前記第1裏面側コイルおよび前記第2裏面側コイルは、前記第1方向において隙間を介して配列されており、
前記第1信号用トランスの前記第1表面側コイルおよび前記第2信号用トランスの前記第1表面側コイルは、前記素子絶縁層の厚さ方向から視て前記第1方向と直交する第2方向において隙間を介して配列されており、
前記第1信号用トランスの前記第2表面側コイルおよび前記第2信号用トランスの前記第2表面側コイルは、前記第2方向において隙間を介して配列されており、
前記第1信号用トランスの前記第1裏面側コイルおよび前記第2信号用トランスの前記第1裏面側コイルは、前記第2方向において隙間を介して配列されており、
前記第1信号用トランスの前記第2裏面側コイルおよび前記第2信号用トランスの前記第2裏面側コイルは、前記第2方向において隙間を介して配列されている
請求項13に記載の信号伝達装置。 - 前記素子絶縁層の前記表面には、第3パッドおよび第4パッドが形成されており、
前記第3パッドは、前記素子絶縁層の厚さ方向から視て、前記第1信号用トランスの前記第1表面側コイルと前記第2信号用トランスの前記第1表面側コイルとの間に配置され、前記第1信号用トランスの前記第1表面側コイルと前記第2信号用トランスの前記第1表面側コイルとに電気的に接続されており、
前記第4パッドは、前記素子絶縁層の厚さ方向から視て、前記第1信号用トランスの前記第2表面側コイルと前記第2信号用トランスの前記第2表面側コイルとの間に配置され、前記第1信号用トランスの前記第2表面側コイルと前記第2信号用トランスの前記第2表面側コイルとに電気的に接続されている
請求項14に記載の信号伝達装置。 - 前記第1表面側導電部は、平板状に形成された第1表面側電極板であり、
前記第1裏面側導電部は、平板状に形成された第1裏面側電極板であり、
前記第2表面側導電部は、平板状に形成された第2表面側電極板であり、
前記第2裏面側導電部は、平板状に形成された第2裏面側電極板である
請求項1~7のいずれか一項に記載の信号伝達装置。 - 前記信号伝達装置は、前記第1絶縁素子および前記第2絶縁素子を有するキャパシタを介して前記1次側回路から前記2次側回路に向けて信号が伝達されるように構成されており、
前記キャパシタは、第1信号用キャパシタおよび第2信号用キャパシタを含み、
前記キャパシタを介して伝達される前記信号は、第1信号および第2信号を含み、
前記第1信号は、前記第1信号用キャパシタを介して前記1次側回路から前記2次側回路に向けて伝達され、
前記第2信号は、前記第2信号用キャパシタを介して前記1次側回路から前記2次側回路に向けて伝達される
請求項16に記載の信号伝達装置。 - 前記素子絶縁層の厚さ方向から視て、前記1次側ダイパッドと前記2次側ダイパッドとは、隙間を介して配列されており、
前記第1チップ、前記第2チップ、および前記絶縁チップは、前記1次側ダイパッドと前記2次側ダイパッドとの配列方向である第1方向において互いに隙間を介して配列されており、
前記第1表面側電極板および前記第2表面側電極板は、前記第1方向において隙間を介して配列されており、
前記第1裏面側電極板および前記第2裏面側電極板は、前記第1方向において隙間を介して配列されており、
前記第1信号用キャパシタの前記第1表面側電極板および前記第2信号用キャパシタの前記第1表面側電極板は、前記素子絶縁層の厚さ方向から視て前記第1方向と直交する第2方向において隙間を介して配列されており、
前記第1信号用キャパシタの前記第2表面側電極板および前記第2信号用キャパシタの前記第2表面側電極板は、前記第2方向において隙間を介して配列されており、
前記第1信号用キャパシタの前記第1裏面側電極板および前記第2信号用キャパシタの前記第1裏面側電極板は、前記第2方向において隙間を介して配列されており、
前記第1信号用キャパシタの前記第2裏面側電極板および前記第2信号用キャパシタの前記第2裏面側電極板は、前記第2方向において隙間を介して配列されている
請求項17に記載の信号伝達装置。 - 前記第1パッドは、前記第2方向から視て、前記第1信号用キャパシタの前記第1表面側電極板および前記第2信号用キャパシタの前記第1表面側電極板と重なる位置に配置されており、
前記第2パッドは、前記第2方向から視て、前記第1信号用キャパシタの前記第2表面側電極板および前記第2信号用キャパシタの前記第2表面側電極板と重なる位置に配置されている
請求項18に記載の信号伝達装置。 - 素子絶縁層と、前記素子絶縁層に埋め込まれた第1絶縁素子および第2絶縁素子を有する絶縁ユニットを備えた絶縁モジュールであって、
前記素子絶縁層は、第1パッドおよび第2パッドが形成された表面、および前記表面とは反対側の裏面を有し、
前記第1絶縁素子は、
前記素子絶縁層内における前記裏面よりも前記表面の近くに配置され、前記第1パッドに電気的に接続された第1表面側導電部と、
前記素子絶縁層内における前記表面よりも前記裏面の近くに配置され、前記第1表面側導電部と前記素子絶縁層の厚さ方向に対向配置された第1裏面側導電部と、
を備え、
前記第2絶縁素子は、
前記素子絶縁層内における前記裏面よりも前記表面の近くに配置され、前記第2パッドに電気的に接続された第2表面側導電部と、
前記素子絶縁層内における前記表面よりも前記裏面の近くに配置され、前記第2表面側導電部と前記素子絶縁層の厚さ方向に対向配置された第2裏面側導電部と、
を備え、
前記第1裏面側導電部と前記第2裏面側導電部とが電気的に接続されている
絶縁モジュール。
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JPS63266855A (ja) * | 1987-04-23 | 1988-11-02 | Nec Corp | 半導体装置 |
WO2014097425A1 (ja) * | 2012-12-19 | 2014-06-26 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
JP2016028407A (ja) * | 2013-11-13 | 2016-02-25 | ローム株式会社 | 半導体装置および半導体モジュール |
JP2016127162A (ja) * | 2015-01-05 | 2016-07-11 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
JP2019009353A (ja) * | 2017-06-27 | 2019-01-17 | パナソニックIpマネジメント株式会社 | アイソレータ |
JP2020036171A (ja) * | 2018-08-29 | 2020-03-05 | 株式会社東芝 | アイソレータ及び通信システム |
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JPS63266855A (ja) * | 1987-04-23 | 1988-11-02 | Nec Corp | 半導体装置 |
WO2014097425A1 (ja) * | 2012-12-19 | 2014-06-26 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
JP2016028407A (ja) * | 2013-11-13 | 2016-02-25 | ローム株式会社 | 半導体装置および半導体モジュール |
JP2016127162A (ja) * | 2015-01-05 | 2016-07-11 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
JP2019009353A (ja) * | 2017-06-27 | 2019-01-17 | パナソニックIpマネジメント株式会社 | アイソレータ |
JP2020036171A (ja) * | 2018-08-29 | 2020-03-05 | 株式会社東芝 | アイソレータ及び通信システム |
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