WO2022222049A1 - 量子点图案、量子点发光器件、显示装置及制作方法 - Google Patents

量子点图案、量子点发光器件、显示装置及制作方法 Download PDF

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WO2022222049A1
WO2022222049A1 PCT/CN2021/088533 CN2021088533W WO2022222049A1 WO 2022222049 A1 WO2022222049 A1 WO 2022222049A1 CN 2021088533 W CN2021088533 W CN 2021088533W WO 2022222049 A1 WO2022222049 A1 WO 2022222049A1
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quantum dot
layer
dot pattern
pattern portion
substrate
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PCT/CN2021/088533
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English (en)
French (fr)
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吴勇
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京东方科技集团股份有限公司
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Priority to CN202180000823.2A priority Critical patent/CN115552640A/zh
Priority to PCT/CN2021/088533 priority patent/WO2022222049A1/zh
Priority to US17/770,487 priority patent/US20240147805A1/en
Publication of WO2022222049A1 publication Critical patent/WO2022222049A1/zh

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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K50/00Organic light-emitting devices
    • H10K50/10OLEDs or polymer light-emitting diodes [PLED]
    • H10K50/11OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers
    • H10K50/115OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers comprising active inorganic nanostructures, e.g. luminescent quantum dots
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/30Devices specially adapted for multicolour light emission
    • H10K59/38Devices specially adapted for multicolour light emission comprising colour filters or colour changing media [CCM]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10OLED displays
    • H10K59/12Active-matrix OLED [AMOLED] displays
    • H10K59/1201Manufacture or treatment

Definitions

  • the present disclosure relates to the field of semiconductor technology, and in particular, to a quantum dot pattern, a quantum dot light-emitting device, a display device, and a manufacturing method.
  • quantum dots are known for their unique optoelectronic properties, such as their high brightness, narrow emission spectrum, wide color gamut tunability, high quantum yield, and good stability. Extensive research has been carried out to realize electro/optical conversion quantum dot light-emitting diodes available for mass production.
  • Embodiments of the present disclosure provide a quantum dot pattern, a quantum dot light-emitting device, a display device, and a manufacturing method.
  • the manufacturing method includes:
  • An isolation layer is formed on the side of the original substrate with the groove, and the thickness of the isolation layer is smaller than the depth of the groove, wherein the isolation layer forms pattern pits in a region corresponding to the groove;
  • a surface of the stacked structure exposing the quantum dot pattern portion is brought into contact with a target substrate, and the sacrificial layer and the adhesive layer are removed.
  • the manufacturing method further includes:
  • the alignment substrate to which the laminated structure is bonded is aligned and bonded to the target substrate on one surface having the quantum dot pattern portion.
  • the removing the sacrificial layer and the adhesive layer includes:
  • the laminated structure is immersed in a first solution to dissolve the sacrificial layer.
  • forming a plurality of pattern pits on one side of the original substrate includes:
  • a plurality of the pattern pits with a first ratio of 0.005 ⁇ 0.06 are formed on one side of the original substrate, and the first ratio is the depth of the pattern pits and the smallest opening size of the pattern pits in a direction perpendicular to the depth. Proportion.
  • forming a plurality of the pattern pits with a first ratio of 0.005-0.06 on one side of the original substrate includes:
  • a plurality of the pattern pits with a depth of 15 nm to 30 nm and a minimum opening size of 500 nm to 3000 nm in a direction perpendicular to the depth are formed on one side of the original substrate through a patterning process.
  • forming a plurality of pattern pits on one side of the original substrate includes:
  • a plurality of the pattern pits with a first ratio ranging from 1.67 to 20 are formed on one side of the original substrate, and the first ratio is the depth of the pattern pits and the smallest opening size of the pattern pits in a direction perpendicular to the depth. Proportion.
  • forming a plurality of the pattern pits with a first ratio ranging from 1.67 to 20 on one side of the original substrate includes:
  • a plurality of the pattern pits with a depth of 5000 nm to 10000 nm and a minimum opening size of 500 nm to 3000 nm in a direction perpendicular to the depth are formed on one side of the original substrate.
  • the quantum dot pattern portion is formed in the pattern pit through a quantum dot solution self-assembly process, including:
  • a quantum dot solution with a quantum dot concentration of 10 mg/mL to 90 mg/mL, and a toluene mass fraction of 10% to 15% in the binary solvent of toluene and heptane;
  • the quantum dot solution is spin-coated on the side of the isolation layer away from the original substrate, and the quantum dot solution is formed in the pattern pits by capillary action.
  • the forming an isolation layer on the side of the original substrate with the pattern pits includes:
  • the heat treatment is performed for a first period of time to remove the solvent in the dimethylsiloxane solution to form the isolation layer.
  • the forming a sacrificial layer on the side of the quantum dot pattern portion away from the isolation layer includes:
  • the attaching the adhesive layer on the side of the sacrificial layer away from the quantum dot pattern portion includes:
  • a polyimide film layer is attached to the side of the sacrificial layer that is away from the quantum dot pattern portion.
  • the forming a plurality of pattern pits on one side of the original substrate includes: forming a plurality of the pattern pits on one side of the original substrate through a photolithography patterning process.
  • the adhesion between the sacrificial layer and the quantum dot pattern portion is greater than the adhesion force between the quantum dot pattern portion and the isolation layer.
  • An embodiment of the present disclosure further provides a quantum dot pattern, which includes: a plurality of quantum dot pattern portions located on one side of a base substrate, wherein the thickness of the quantum dot pattern portion is perpendicular to the quantum dot pattern portion.
  • the ratio of the smallest dimension in the thickness direction is 0.005-0.06, or the ratio of the thickness of the quantum dot pattern portion to the smallest dimension of the quantum dot pattern portion perpendicular to the thickness direction is 1.67-20.
  • the quantum dot pattern portion has a minimum dimension in the range of 500 nm to 3000 nm perpendicular to the thickness direction.
  • the quantum dot pattern portion has a thickness of 15 nm to 30 nm.
  • the quantum dot pattern portion has a thickness of 5000 nm to 10000 nm.
  • Embodiments of the present disclosure also provide a quantum dot light-emitting device, including:
  • the first electrode is located on one side of the first base substrate
  • the first functional layer is located on the side of the first electrode away from the first base substrate;
  • the quantum dot light-emitting layer is located on the side of the first functional layer away from the first electrode, and includes a plurality of the quantum dot pattern parts provided by the embodiments of the present disclosure
  • the second functional layer is located on the side of the quantum dot light-emitting layer away from the first functional layer;
  • a second electrode, the second electrode is located on the side of the second functional layer away from the quantum dot light-emitting layer.
  • Embodiments of the present disclosure also provide a display device, including:
  • a light conversion layer is located on the light emitting side of the light-emitting substrate, and the light conversion layer includes a plurality of the quantum dot pattern parts provided in the embodiments of the present disclosure.
  • the light-emitting substrate includes:
  • the driving circuit is located on the side of the second base substrate facing the light conversion layer;
  • a backlight source the backlight source is located on the side of the driving circuit facing the light conversion layer.
  • the backlight source is a blue light emitting diode, or the backlight source is an organic light emitting device that emits blue light.
  • the display device includes a light blocking structure located between adjacent quantum dot pattern parts.
  • the display device includes: a color filter layer on a side of the light conversion layer away from the light-emitting substrate, and the color filter layer includes a one-to-one correspondence with the quantum dot pattern parts. color filter.
  • the display device includes a third base substrate on a side of the color filter layer away from the light-emitting substrate.
  • the display device includes a quarter-wave plate located on a side of the third base substrate away from the light-emitting substrate.
  • FIG. 1 is one of the schematic diagrams of the fabrication process of the patterned quantum dot film layer provided by the embodiment of the present disclosure
  • FIG. 2 is a schematic structural diagram of forming a groove on an original substrate according to an embodiment of the present disclosure
  • FIG. 3 is a schematic structural diagram of forming an isolation layer according to an embodiment of the present disclosure.
  • FIG. 4 is a schematic diagram of forming a quantum dot pattern portion in a pattern pit according to an embodiment of the present disclosure
  • FIG. 5 is a schematic structural diagram of forming a sacrificial layer according to an embodiment of the present disclosure
  • FIG. 6 is a schematic structural diagram of forming an adhesive layer according to an embodiment of the present disclosure.
  • FIG. 7 is a schematic structural diagram of separating the quantum dot pattern portion and the isolation layer according to an embodiment of the present disclosure.
  • FIG. 8 is a schematic diagram of transferring a quantum dot pattern portion to a target substrate according to an embodiment of the present disclosure
  • FIG. 9 is the second schematic diagram of the manufacturing process of the patterned quantum dot film layer provided by the embodiment of the present disclosure.
  • FIG. 10 is a schematic diagram of transferring a quantum dot pattern portion to a transfer substrate according to an embodiment of the present disclosure
  • FIG. 11 is a schematic diagram of aligning and bonding a transfer substrate and a target substrate according to an embodiment of the present disclosure
  • FIG. 12 is a schematic diagram of a quantum dot pattern portion provided in an embodiment of the present disclosure when projected as a circle;
  • FIG. 13 is a schematic diagram of a quantum dot pattern portion provided in an embodiment of the present disclosure when projected as a rectangle;
  • FIG. 14 is a schematic diagram of a quantum dot pattern portion provided in an embodiment of the present disclosure when projected into a hexagon;
  • 15A is a schematic structural diagram of a quantum dot pattern according to an embodiment of the present disclosure.
  • FIG. 15B is a schematic diagram of quantum dot pattern portions of different sizes provided in an embodiment of the present disclosure.
  • 15C is a schematic diagram of a quantum dot pattern portion with different pixel densities according to an embodiment of the present disclosure
  • 16A is a schematic diagram of a quantum dot light-emitting device according to an embodiment of the present disclosure.
  • Figure 16B is a schematic diagram of performance comparison between the quantum dot light-emitting device provided in the embodiment of the present disclosure and a conventional quantum dot light-emitting device;
  • FIG. 17 is a schematic diagram of a display device according to an embodiment of the present disclosure.
  • Quantum dots have very broad application prospects in the field of ultra-high resolution (pixel density) due to their highly saturated color gamut and transparent properties of quantum dot films.
  • the sub-pixel feature size in current smartphones is in the range of tens of microns, but the patterning of quantum dots in ultra-high-resolution displays has limitations.
  • the big problem, and more importantly, is that the light-emitting properties of quantum dots will deteriorate to a certain extent after patterning, thereby reducing the performance of the display.
  • an embodiment of the present disclosure provides a method for fabricating a patterned quantum dot film layer, as shown in FIG. 1, FIG. 2-FIG. 8, including:
  • Step S100 forming a plurality of grooves 10 on one side of the original substrate 1, as shown in FIG. 2; specifically, the original substrate 1 may be a silicon substrate; specifically, a plurality of grooves 10 may be formed by a photolithography patterning process;
  • the orthographic shape of the groove 10 on the side of the original substrate 1 away from the groove 10 can be made according to the specific required pixel pattern. Specifically, for example, the orthographic shape of the groove 10 on the side of the original substrate 1 away from the groove 10 can be linear. , a single geometric figure such as circle, rectangle, rhombus, hexagon, pentagon, or a combination of the aforementioned figures;
  • Step S200 forming an isolation layer 2 on the side of the original substrate 1 with the groove 10, the thickness of the isolation layer 2 is less than the depth of the groove 10, wherein, the isolation layer 2 forms a pattern pit 20 in the area corresponding to the groove 10, such as As shown in FIG.
  • this step may include: spin-coating a polydimethylsiloxane (PDMS) solution on the side of the original substrate 1 with the grooves 10 ; heat treatment for a first time period, To remove the solvent in the dimethylsiloxane solution, the isolation layer 2 is formed; specifically, the PDMS solution can be spin-coated at 3000rpm for 20s (heptane is used as the solvent solution, wherein the PDMS mass fraction range can be 1wt% ⁇ 3wt% , specifically, for example, 2wt%), and then, heat treatment in a vacuum oven for a first time period (for example, the first time period is 30min), and the obtained PDMS thickness ranges from 3nm to 5nm;
  • PDMS polydimethylsiloxane
  • Step S300 through the quantum dot solution self-assembly process, the quantum dot pattern portion 5 is formed in the pattern pit 20, as shown in FIG. 4;
  • step S400 a sacrificial layer 3 is formed on the side of the quantum dot pattern portion 5 away from the isolation layer 5, as shown in FIG. 5;
  • the adhesive force of the layer 2 can be improved, and then the quantum dot pattern part 5 can be separated from the isolation layer 2 during subsequent peeling; specifically, this step S400 can include: spin coating on the side of the quantum dot pattern part 5 away from the isolation layer 2 A polymethyl methacrylate (polymethyl methacrylate, PMMA) solution; heat treatment for a second time period to remove the solvent in the methyl methacrylate solution to form a sacrificial layer 3; specifically, the PMMA solution (acetone as the Solvent, the mass fraction of PMMA can be in the range of 1wt% to 3wt%, specifically, for example, 2wt%) for 10s, to form a PMMA film layer as the sacrificial layer 3;
  • Step S500 attaching the adhesive layer 4 on the side of the sacrificial layer 3 away from the quantum dot pattern portion 5, as shown in FIG. 6; Side-bonded polyimide film (Polyimide Film, PI);
  • Step S600 peeling off the adhesive layer 4, so that the quantum dot pattern part 5 and the sacrificial layer 3 are separated from the isolation layer 2 together with the adhesive layer 4 to obtain a stack of the adhesive layer 4, the sacrificial layer 3 and the quantum dot pattern part 5 Structure S, as shown in Figure 7; wherein, the adhesive layer 4 (PI film layer) will drive the sacrificial layer 3 (PMMA film layer) and the quantum dot pattern portion 5 to separate from the isolation layer 2 (PDMS film layer) due to the adhesive effect. ;
  • step S700 the exposed surface of the quantum dot pattern portion 5 of the stacked structure S is brought into contact with the target substrate 6 , as shown in FIG. 8 , and the sacrificial layer 3 and the adhesive layer 4 are removed.
  • the micro-nano micro-nano effect of quantum dots is realized.
  • the size of the array is fabricated, and then a sacrificial layer is formed on the side of the quantum dot pattern portion away from the isolation layer, and the adhesive layer is attached to the side of the sacrificial layer away from the quantum dot pattern portion.
  • the dot pattern part is separated from the isolation layer, and combined with the transfer process, the fabrication of the quantum dot film layer in the ultra-high pixel density array is realized.
  • the patterning yield and repeatability of the quantum dot film layer are better, which meets the technical requirements of mass production. , while retaining the original optical properties of quantum dots, ensuring the performance of the display device.
  • the manufacturing method further includes:
  • Step S800 attaching the side of the laminated structure S with the adhesive layer 4 to the alignment substrate 7, as shown in FIG. 10; specifically, the alignment substrate 7 may have a first alignment mark, and the target substrate 6 may have a first alignment mark.
  • the corresponding second alignment marks are aligned by the first alignment marks of the alignment substrate 7 and the second alignment marks of the target substrate 6, so that the quantum dot pattern portion 5 is accurately transferred to the target substrate 6; specifically,
  • the alignment substrate 7 can be a glass substrate;
  • step S900 the alignment substrate 7 attached with the laminated structure S is aligned with the target substrate 6 on one side having the quantum dot pattern portion 5 , as shown in FIG. 11 .
  • the side of the laminated structure S with the adhesive layer 4 may be attached to the alignment substrate 7 , and the alignment substrate 7 is connected to the target substrate through the alignment substrate 7 .
  • the alignment of 6 realizes the accurate transfer of the quantum dot pattern portion 5 to the target substrate 6 .
  • the above steps S100 to S700 can realize the formation of a quantum dot pattern part of one light emitting color.
  • the steps S100 to S700 can be repeated many times to achieve.
  • removing the sacrificial layer 3 and the adhesive layer 4 may include: immersing the laminated structure S in a first solution to dissolve the sacrificial layer 3 .
  • the first solution may be an acetone solution
  • the step may include: immersing the laminated structure S in the acetone solution (the first solution) for 30 minutes, dissolving the sacrificial layer 3 (PMMA film layer), and dissolving the sacrificial layer 3 (PMMA film layer) )
  • the other film layer structures for example, the adhesive layer 4, the alignment substrate 7) on the side away from the quantum dot pattern portion 5 are separated from the quantum dot pattern portion 5, and the quantum dot pattern portion 5 remains on the target substrate 6, and the quantum dot pattern portion 5 is completed.
  • step S100 forming a plurality of grooves 10 on one side of the original substrate 1 includes: forming a plurality of first proportions on one side of the original substrate 1 In the groove 10 of 0.005 ⁇ 0.06, the first ratio is the ratio of the depth d of the groove 10 to the smallest opening size k of the groove 10 in the direction perpendicular to the depth. Specifically, for example, as shown in FIG.
  • the minimum opening size k of the groove 10 in the direction perpendicular to the depth can be the diameter of the circle
  • the minimum opening size k of the groove 10 in the direction perpendicular to the depth direction can be understood as the groove 10 deviates from the original substrate 1.
  • the minimum opening size of the groove 10 in the direction perpendicular to the depth can be the smallest of the two distances, that is, relative to the two long sides distance k1; for another example, as shown in FIG. 14, when the orthographic shape of the groove 10 on the surface of the original substrate 1 facing away from the groove 10 is a hexagon, the minimum opening size of the groove 10 in the direction perpendicular to the depth can be hexagonal The distance between the two opposite sides of the shape, and is the smallest distance among them.
  • forming a plurality of grooves 10 with a first ratio of 0.005 to 0.06 on one side of the original substrate 1 includes: forming a plurality of grooves 10 with a depth of 15 nm to 30 nm on one side of the original substrate 1 through a patterning process.
  • the groove 10 with the smallest opening size in the depth direction is 500 nm to 3000 nm.
  • the depth of the groove 10 is 15 nm to 30 nm, which can make the quantum dot pattern part 5 formed thinner, and can be used for making the light emitting layer in the quantum dot light emitting device.
  • the thinner quantum dot pattern part 5 has It is beneficial to have higher electroluminescence efficiency; moreover, the minimum opening size of the groove 10 is between 500 nm and 3000 nm. Compared with the size of the sub-pixel in the prior art, which is several tens of microns, the size of the sub-pixel that can be formed in the embodiment of the present disclosure is Small, can achieve ultra-high-resolution display. It can be understood that the thickness of the quantum dot pattern portion 5 may be approximately the same as the depth of the groove 10 .
  • forming a plurality of grooves 10 on one side of the original substrate 1 includes: forming a plurality of grooves 10 with a first ratio ranging from 1.67 to 20 on one side of the original substrate 1 , and the first ratio is the grooves 10 and the grooves.
  • forming a plurality of grooves with a first ratio of 1.67 to 20 on one side of the original substrate 1 includes: forming a plurality of grooves with a depth of 5000 nm to 10000 nm on one side of the original substrate 1, and a minimum opening size perpendicular to the depth direction
  • the grooves 10 are at 500 nm to 3000 nm.
  • the minimum opening size of the groove 10 in the direction perpendicular to the depth direction is 5000 nm to 10000 nm
  • the formed quantum dot pattern portion 5 is relatively thick, which can be used for making a light conversion layer in a display device.
  • the quantum dot pattern part 5 is beneficial to have high photoluminescence efficiency; and the minimum opening size of the groove 10 is 500nm-3000nm, compared with the sub-pixel size of the prior art, which is several tens of microns.
  • the sub-pixel size that can be formed by the example is small, and ultra-high-resolution display can be realized.
  • step S300 forming a quantum dot pattern portion in the pattern pit through a quantum dot solution self-assembly process includes:
  • a quantum dot solution with a quantum dot concentration of 10mg/mL to 90mg/mL and a toluene mass fraction of 10% to 15% in a binary solvent of toluene and heptane; specifically, the quantum dot solution can be spin-coated at 1000 to 3000 rpm for 10s ⁇ 30s
  • the quantum dot solution can include quantum dots, and a binary solvent composed of toluene and heptane, wherein the mass fraction of toluene is 0-100%, specifically, it can be 0-30%, more specifically, it can be 10- 15%; the concentration of quantum dots can be: 0-100mg/mL, specifically, it can be 10-90mg/mL);
  • the quantum dot solution is spin-coated on the side of the isolation layer away from the original substrate, and the quantum dot solution is formed in the pattern pits by capillary action.
  • the quantum dot solution by providing a quantum dot solution with a quantum dot concentration of 10 mg/mL to 90 mg/mL and a solvent mass fraction of 10% to 15%, it is possible to spin-coat the quantum dot solution on the isolation layer away from the original substrate.
  • the quantum dot solution can be formed in the pattern pits by capillary action, so as to realize the formation of the quantum dot pattern part of the ultra-high-resolution display device.
  • an embodiment of the present disclosure further provides a quantum dot pattern, as shown in FIG. 15A , comprising: a plurality of quantum dot pattern portions 5 located on one side of the base substrate 8 , wherein the thickness of the quantum dot pattern portion 5 is The ratio of a to the smallest dimension b of the quantum dot pattern portion 5 perpendicular to the thickness direction is 0.005 to 0.06, or the ratio of the thickness a of the quantum dot pattern portion 5 to the minimum dimension b of the quantum dot pattern portion 5 perpendicular to the thickness direction is 1.67 ⁇ 20.
  • the ratio of the thickness a of the quantum dot pattern portion 5 to the minimum dimension b of the quantum dot pattern portion 5 perpendicular to the thickness direction is 0.005-0.06, or, the thickness a of the quantum dot pattern portion 5 and the quantum dot pattern portion 5 5
  • the ratio of the smallest dimension b perpendicular to the thickness direction is 1.67 to 20, which can realize ultra-high resolution display.
  • the ratio of the thickness a of the quantum dot pattern portion 5 to the smallest dimension b of the quantum dot pattern portion 5 perpendicular to the thickness direction may be approximately the same as the first ratio of the groove 10 when the quantum dot pattern portion 5 is formed.
  • the quantum dot pattern portion 5 may include a first quantum dot pattern portion 51 for emitting red light, a second quantum dot pattern portion 52 for emitting green light, and a third quantum dot pattern portion 53 for emitting blue light.
  • the minimum dimension b of the quantum dot pattern portion 5 in the direction perpendicular to the thickness is in the range of 500 nm to 3000 nm. In the embodiment of the present disclosure, the minimum dimension b of the quantum dot pattern portion 5 in the direction perpendicular to the thickness is in the range of 500 nm to 3000 nm, which can realize ultra-high resolution display.
  • the thickness a of the quantum dot pattern portion 5 is 15 nm ⁇ 30 nm.
  • the quantum dot pattern portion 5 is between 15 nm and 30 nm, and the formed quantum dot pattern portion 5 is relatively thin, which can be used to fabricate a light-emitting layer in a quantum dot light-emitting device.
  • the thinner quantum dot pattern portion 5 is beneficial to Has high electroluminescence efficiency.
  • the thickness a of the quantum dot pattern portion 5 is 5000 nm ⁇ 10000 nm. In the embodiment of the present disclosure, the thickness a of the quantum dot pattern portion 5 is 5000 nm to 10000 nm, and the formed quantum dot pattern portion 5 is relatively thick, which can be used to fabricate a light conversion layer in a display device. The thicker quantum dot pattern portion 5 , which is beneficial to have higher photoluminescence efficiency.
  • 15B shows the quantum dot pattern portion arrays of various sizes from 5 nm to 1 ⁇ m formed by the quantum dot pattern fabrication method provided by the embodiment of the present disclosure. It can be seen from this that as the size of the quantum dot pattern portion decreases, the transferred The array saturation of the quantum dot pattern portion also decreases slightly, and the edge error of the quantum dot pattern portion size of 350 nm in FIG. 15B is less than 10 nm, which is within an acceptable error range.
  • FIG. 15C shows the quantum dot pattern portion arrays with different pixel densities.
  • the red, green, and blue quantum dot pattern portion arrays with ultra-high pixel density are prepared by solution self-assembly and alignment technology.
  • an embodiment of the present disclosure further provides a quantum dot light-emitting device, which includes:
  • the first electrode 811 is located on one side of the first base substrate 81;
  • the first functional layer S1, the first functional layer S1 is located on the side of the first electrode 811 away from the first base substrate 81; the second sub-functional layer 813 on the side facing away from the first electrode 812;
  • a quantum dot light-emitting layer is located on the side of the first functional layer S1 away from the first electrode 811, and includes a plurality of quantum dot pattern parts 5 provided in the embodiments of the present disclosure;
  • the second functional layer 814, the second functional layer 814 is located on the side of the quantum dot light-emitting layer away from the first functional layer S1;
  • the second electrode 815 is located on the side of the second functional layer 814 away from the quantum dot light-emitting layer.
  • the first electrode 811 can be an anode, and the specific material can be indium tin oxide; the first sub-functional layer 812 can specifically be a hole injection layer, and the specific material can be PEDOT: PSS, the film thickness can be 25nm ⁇ 30nm, specifically, it can be 28nm; the second sub-functional layer 813 can be a hole transport layer, and the specific material can be TFB, and the film thickness can be 20nm ⁇ 30nm, specifically, can be 25nm; the second functional layer 814 can be an electron transport layer specifically, the specific material can be zinc oxide, the film thickness can be 40nm-60nm, specifically, can be 50nm; the second electrode 815 can specifically be a cathode, and the specific material can be It can be aluminum, and the thickness of the film layer can be 80 nm to 120 nm, and specifically, it can be 100 nm.
  • Table 1 and FIG. 16B show a comparison between the quantum dot light-emitting device formed by using the quantum dot pattern portion prepared in the embodiment of the present disclosure and the quantum dot device prepared by the traditional mature spin coating process, wherein, Example 1 represents the preparation using the embodiment of the present disclosure.
  • an embodiment of the present disclosure further provides a display device, including:
  • the light conversion layer is located on the light-emitting side of the light-emitting substrate F, and the light conversion layer includes a plurality of quantum dot pattern parts 5 as provided in the embodiments of the present disclosure.
  • the light-emitting substrate F includes:
  • the drive circuit is located on the side of the second base substrate 82 facing the light conversion layer, the drive circuit may specifically include a drive circuit layer 821, and an electrode layer 822 located on the side of the drive circuit layer 821 away from the second base substrate 82;
  • the backlight source 823 is located on the side of the driving circuit facing the light conversion layer.
  • the backlight source 823 may be a blue light emitting diode, or the backlight source 823 may also be an organic light emitting device emitting blue light.
  • the display device includes light blocking structures 827 located between adjacent quantum dot pattern parts 5 .
  • the display device includes: a color filter layer located on a side of the light conversion layer away from the light-emitting substrate, and the color filter layer includes color filter portions 83 corresponding to the quantum dot pattern portions one-to-one.
  • the color filter part 83 may include a first color filter part 831 corresponding to the first quantum dot pattern part 51 emitting red light, so as to filter other light except red light, including the second quantum dots corresponding to the second quantum dot emitting green light.
  • the display device includes a third base substrate 825 located on a side of the color filter layer away from the light-emitting substrate.
  • the display device includes a quarter-wave plate 826 located on a side of the third base substrate 825 away from the light-emitting substrate.
  • the display device includes a quantum dot encapsulation layer 824 on the side of the light conversion layer facing the light-emitting substrate.
  • the micro-nano micro-nano effect of quantum dots is realized.
  • the size of the array is fabricated, and then a sacrificial layer is formed on the side of the quantum dot pattern portion away from the isolation layer, and the adhesive layer is attached to the side of the sacrificial layer away from the quantum dot pattern portion.
  • the dot pattern part is separated from the isolation layer, and combined with the transfer process, the array fabrication of the quantum dot film layer in ultra-high pixel density is realized.
  • Technical requirements while retaining the original optical properties of quantum dots, to ensure the performance of the display device.

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Abstract

本公开实施例提供一种量子点图案、量子点发光器件、显示装置及制作方法。所述图案化量子点膜层的制作方法,包括:在原始基板的一侧形成多个凹槽;在所述原始基板具有所述凹槽的一侧形成隔离层,所述隔离层的厚度小于所述凹槽的深度;通过量子点溶液自组装工艺,在所述图案坑形成量子点图案部;在所述量子点图案部背离所述隔离层的一侧形成牺牲层;在所述牺牲层背离所述量子点图案部的一侧贴合粘合层;剥离所述粘合层,以使所述量子点图案部与所述牺牲层随所述粘合层一同从所述隔离层分离,得到所述粘合层、所述牺牲层和所述量子点图案部的叠层结构;将所述叠层结构暴露所述量子点图案部的一面与目标基板接触,并去除所述牺牲层和所述粘合层。

Description

量子点图案、量子点发光器件、显示装置及制作方法 技术领域
本公开涉及半导体技术领域,尤其涉及一种量子点图案、量子点发光器件、显示装置及制作方法。
背景技术
在各种新型显示技术中,量子点由于其独特的光电特性而著称,例如其高亮度、窄发射光谱、广泛的色域可调性、高量子产率和良好的稳定性。为了实现量产可用的电致/光转换量子点发光二极管,已经进行了广泛的研究。
发明内容
本公开实施例提供一种量子点图案、量子点发光器件、显示装置及制作方法。所述制作方法包括:
在原始基板的一侧形成多个凹槽;
在所述原始基板具有所述凹槽的一侧形成隔离层,所述隔离层的厚度小于所述凹槽的深度,其中,所述隔离层在与所述凹槽对应的区域形成图案坑;
通过量子点溶液自组装工艺,在所述图案坑形成量子点图案部;
在所述量子点图案部背离所述隔离层的一侧形成牺牲层;
在所述牺牲层背离所述量子点图案部的一侧贴合粘合层;
剥离所述粘合层,以使所述量子点图案部与所述牺牲层随所述粘合层一同从所述隔离层分离,得到所述粘合层、所述牺牲层和所述量子点图案部的叠层结构;
将所述叠层结构暴露所述量子点图案部的一面与目标基板接触,并去除所述牺牲层和所述粘合层。
在一种可能的实施方式中,在剥离所述粘合层之后,以及在将所述叠层结构暴露所述量子点图案部的一面与目标基板接触之前,所述制作方法还包 括:
将所述叠层结构具有所述粘合层的一面与对位基板贴合;
将贴合有所述叠层结构的所述对位基板以具有所述量子点图案部的一面与所述目标基板进行对位并贴合。
在一种可能的实施方式中,所述去除所述牺牲层和所述粘合层,包括:
将所述叠层结构浸入第一溶液,以使所述牺牲层溶解。
在一种可能的实施方式中,所述在原始基板的一侧形成多个图案坑,包括:
在所述原始基板的一侧形成多个第一比例在0.005~0.06的所述图案坑,所述第一比例为所述图案坑深度与所述图案坑在垂直于深度方向上最小开口尺寸的比例。
在一种可能的实施方式中,所述在所述原始基板的一侧通形成多个第一比例在0.005~0.06的所述图案坑,包括:
在原始基板的一侧通过构图工艺形成多个深度在15nm~30nm,在垂直于深度方向上最小开口尺寸在500nm~3000nm的所述图案坑。
在一种可能的实施方式中,所述在原始基板的一侧形成多个图案坑,包括:
在所述原始基板的一侧形成多个第一比例在1.67~20的所述图案坑,所述第一比例为所述图案坑深度与所述图案坑在垂直于深度方向上最小开口尺寸的比例。
在一种可能的实施方式中,所述在所述原始基板的一侧形成多个第一比例在1.67~20的所述图案坑,包括:
在原始基板的一侧形成多个深度在5000nm~10000nm,在垂直于深度方向上最小开口尺寸在500nm~3000nm的所述图案坑。
在一种可能的实施方式中,所述通过量子点溶液自组装工艺,在所述图案坑形成量子点图案部,包括:
提供量子点浓度为10mg/mL~90mg/mL,甲苯和庚烷的二元溶剂中所述 甲苯质量分数在10%~15%的量子点溶液;
将所述量子点溶液旋涂于所述隔离层的背离所述原始基板的一侧,所述量子点溶液通过毛细作用形成于所述图案坑。
在一种可能的实施方式中,所述在所述原始基板的具有所述图案坑的一侧形成隔离层,包括:
在所述原始基板的具有所述图案坑的一侧旋涂聚二甲基硅氧烷溶液;
加热处理第一时长,以去除所述二甲基硅氧烷溶液中的溶剂,形成所述隔离层。
在一种可能的实施方式中,所述在所述量子点图案部的背离所述隔离层的一侧形成牺牲层,包括:
在所述量子点图案部的背离所述隔离层的一侧旋涂聚甲基丙烯酸甲酯溶液;
加热处理第二时长,以去除所述甲基丙烯酸甲酯溶液中的溶剂,形成所述牺牲层。
在一种可能的实施方式中,所述在所述牺牲层的背离所述量子点图案部的一侧贴合粘合层,包括:
在所述牺牲层的背离所述量子点图案部的一侧贴合聚酰亚胺膜层。
在一种可能的实施方式中,所述在原始基板的一侧形成多个图案坑,包括:在所述原始基板的一侧通过光刻构图工艺形成多个所述图案坑。
在一种可能的实施方式中,所述牺牲层与所述量子点图案部的黏合力大于所述量子点图案部与所述隔离层的黏合力。
本公开实施例还提供一种量子点图案,其中,包括:位于衬底基板一侧的多个量子点图案部,其中,所述量子点图案部的厚度与所述量子点图案部在垂直于厚度方向最小尺寸的比例为0.005~0.06,或者,所述量子点图案部的厚度与所述量子点图案部在垂直于厚度方向最小尺寸的比例为1.67~20。
在一种可能的实施方式中,所述量子点图案部在垂直于厚度方向最小尺寸范围为500nm~3000nm。
在一种可能的实施方式中,所述量子点图案部的厚度为15nm~30nm。
在一种可能的实施方式中,所述量子点图案部的厚度为5000nm~10000nm。
本公开实施例还提供一种量子点发光器件,其中,包括:
第一衬底基板;
第一电极,所述第一电极位于所述第一衬底基板的一侧;
第一功能层,所述第一功能层位于所述第一电极背离所述第一衬底基板的一侧;
量子点发光层,所述量子点发光层位于所述第一功能层的背离所述第一电极的一侧,包括多个如本公开实施例提供的所述量子点图案部;
第二功能层,所述第二功能层位于所述量子点发光层的背离所述第一功能层的一侧;
第二电极,所述第二电极位于所述第二功能层的背离所述量子点发光层的一侧。
本公开实施例还提供一种显示装置,包括:
发光基板;
光转换层,所述光转换层位于所述发光基板的出光侧,所述光转换层包括多个如本公开实施例提供的所述量子点图案部。
在一种可能的实施方式中,所述发光基板包括:
第二衬底基板;
驱动电路,所述驱动电路位于所述第二衬底基板面向所述光转换层的一侧;
背光源,所述背光源位于所述驱动电路面向所述光转换层的一侧。
在一种可能的实施方式中,所述背光源为蓝光发光二极管,或者,所述背光源为出射蓝光的有机发光器件。
在一种可能的实施方式中,所述显示装置包括位于相邻所述量子点图案部之间的光阻挡结构。
在一种可能的实施方式中,所述显示装置包括:位于所述光转换层背离 所述发光基板一侧的彩膜层,所述彩膜层包括与所述量子点图案部一一对应的滤色部。
在一种可能的实施方式中,所述显示装置包括位于所述彩膜层背离所述发光基板一侧的第三衬底基板。
在一种可能的实施方式中,所述显示装置包括位于所述第三衬底基板背离所述发光基板一侧的四分之一波片。
附图说明
图1为本公开实施例提供的图案化量子点膜层的制作流程示意图之一;
图2为本公开实施例提供的在原始基板形成凹槽的结构示意图;
图3为本公开实施例提供的形成隔离层的结构示意图;
图4为本公开实施例提供的在图案坑形成量子点图案部的示意图;
图5为本公开实施例提供的形成牺牲层的结构示意图;
图6为本公开实施例提供的形成粘合层的结构示意图;
图7为本公开实施例提供的将量子点图案部与隔离层分离结构示意图;
图8为本公开实施例提供的将量子点图案部转移到目标基板的示意图;
图9为本公开实施例提供的图案化量子点膜层的制作流程示意图之二;
图10为本公开实施例提供的将量子点图案部转移到转印基板的示意图;
图11为本公开实施例提供的将转印基板与目标基板对位贴合的示意图;
图12为本公开实施例提供的量子点图案部投影为圆形时的示意图;
图13为本公开实施例提供的量子点图案部投影为矩形时的示意图;
图14为本公开实施例提供的量子点图案部投影为六边形时的示意图;
图15A为本公开实施例提供的一种量子点图案的结构示意图;
图15B为本公开实施例提供的不同尺寸的量子点图案部示意图;
图15C为本公开实施例提供的不同像素密度的量子点图案部示意图;
图16A为本公开实施例提供的量子点发光器件的示意图;
图16B为本公开实施例提供的量子点发光器件与传统量子点发光器件的 性能对比示意图;
图17为本公开实施例提供的显示装置的示意图。
具体实施方式
为了使得本公开实施例的目的、技术方案和优点更加清楚,下面将结合本公开实施例的附图,对本公开实施例的技术方案进行清楚、完整地描述。显然,所描述的实施例是本公开的一部分实施例,而不是全部的实施例。基于所描述的本公开的实施例,本领域普通技术人员在无需创造性劳动的前提下所获得的所有其他实施例,都属于本公开保护的范围。
除非另外定义,本公开使用的技术术语或者科学术语应当为本公开所属领域内具有一般技能的人士所理解的通常意义。本公开中使用的“第一”、“第二”以及类似的词语并不表示任何顺序、数量或者重要性,而只是用来区分不同的组成部分。“包括”或者“包含”等类似的词语意指出现该词前面的元件或者物件涵盖出现在该词后面列举的元件或者物件及其等同,而不排除其他元件或者物件。“连接”或者“相连”等类似的词语并非限定于物理的或者机械的连接,而是可以包括电性的连接,不管是直接的还是间接的。“上”、“下”、“左”、“右”等仅用于表示相对位置关系,当被描述对象的绝对位置改变后,则该相对位置关系也可能相应地改变。
为了保持本公开实施例的以下说明清楚且简明,本公开省略了已知功能和已知部件的详细说明。
随着技术的不断发展,红、绿、蓝的量子点器件性能不断提升,尤其是其效率急剧提高,但是对于红、绿、蓝全色量子点阵列进行图案化仍然是难以解决的难点,量子点的图案化的复杂性主要是由于合成的量子点的胶体状态,转印工艺、喷墨打印、平板印刷等工艺已被证明可用于量子点的图案化从而提高显示器的性能。然而随着人们对生活品质的要求不断提高以及各种新型显示的需求,显示设备需要高像素密度乃至超高像素密度的高性能,在保证超高像素密度的同时,必须保证发光材料的高色域,以确保准确的色彩 表达。量子点由于其高度饱和色域和量子点薄膜的透明性能,在超高分辨率(像素密度)领域具有非常广阔的应用前景。当前智能手机中的亚像素特征尺寸在几十微米的范围内,但是量子点在超高分辨率显示的图案化存在局限性,其微纳尺寸的均匀全色像素阵列以及高保真度都存在较大问题,更重要的是量子点的发光特性在图案化后会有一定程度的劣化,从而降低显示的性能。
有鉴于此,本公开实施例提供一种图案化量子点膜层的制作方法,参见图1、图2-图8所示,其中,包括:
步骤S100、在原始基板1的一侧形成多个凹槽10,如图2所示;具体的,原始基板1可以为硅基板;具体的,可以通过光刻构图工艺形成多个凹槽10;凹槽10在原始基板1背离凹槽10一面的正投影形状可以根据具体要求的像素图案进行制作,具体的,例如,凹槽10在原始基板1背离凹槽10一面的正投影形状可以为线形、圆形、矩形、菱形、六边形、五边形等单个几何图形或者前述几种图形的组合形状;
步骤S200、在原始基板1具有凹槽10的一侧形成隔离层2,隔离层2的厚度小于凹槽10的深度,其中,隔离层2在与凹槽10对应的区域形成图案坑20,如图3所示;具体的,具体的,该步骤可以包括:在原始基板1的具有凹槽10的一侧旋涂聚二甲基硅氧烷(Polydimethylsiloxane,PDMS)溶液;加热处理第一时长,以去除二甲基硅氧烷溶液中的溶剂,形成隔离层2;具体的,可以是以3000rpm旋涂PDMS溶液20s(庚烷作为溶剂溶液,其中,PDMS质量分数范围可以是1wt%~3wt%,具体的,例如2wt%),然后,真空烘箱进行热处理第一时长(例如,第一时长为30min),得到的PDMS厚度范围3nm~5nm;
步骤S300、通过量子点溶液自组装工艺,在图案坑20形成量子点图案部5,如图4所示;
步骤S400、在量子点图案部5背离隔离层5的一侧形成牺牲层3,如图5所示;具体的,牺牲层3与量子点图案部5的黏合力大于量子点图案部5与 隔离层2的黏合力,进而可以在后续剥离时,将量子点图案部5从隔离层2分开;具体的,该步骤S400可以包括:在量子点图案部5的背离隔离层2的一侧旋涂聚甲基丙烯酸甲酯(polymethyl methacrylate,PMMA)溶液;加热处理第二时长,以去除甲基丙烯酸甲酯溶液中的溶剂,形成牺牲层3;具体的,可以以3000rpm旋涂PMMA溶液(丙酮作为溶剂,PMMA的质量分数范围可以是1wt%~3wt%,具体的,例如2wt%)10s,形成PMMA膜层,作为牺牲层3;
步骤S500、在牺牲层3背离量子点图案部5的一侧贴合粘合层4,如图6所示;具体的,该步骤可以包括:在牺牲层3的背离量子点图案部5的一侧贴合聚酰亚胺膜层(Polyimide Film,PI);
步骤S600、剥离粘合层4,以使量子点图案部5与牺牲层3随粘合层4一同从隔离层2分离,得到粘合层4、牺牲层3和量子点图案部5的叠层结构S,如图7所示;其中,粘合层4(PI膜层)因为粘合作用会带动牺牲层3(PMMA膜层)和量子点图案部5从隔离层2(PDMS膜层)分离;
步骤S700、将叠层结构S暴露量子点图案部5的一面与目标基板6接触,如图8所示,并去除牺牲层3和粘合层4。
本公开实施例中,通过先在原始基板形成凹槽,并在原始基板具有凹槽的一面形成隔离层,并通过溶液自组装工艺在图案坑形成量子点图案部,实现对量子点进行微纳尺寸的阵列制作,后续在量子点图案部背离隔离层的一侧形成牺牲层,并在牺牲层的背离量子点图案部的一侧贴合粘合层,通过剥离粘合层,可以实现将量子点图案部从隔离层分离,再结合转印工艺,实现量子点膜层在超高像素密度阵列的制作,量子点膜层的图案化良率和可重复性较佳,满足量产的技术要求,同时保留了量子点原有的光学特性,保证了显示器件的性能。
在一种可能的实施方式中,参见图9,以及图10、图11所示,在步骤S600之后,以及在步骤S700之前,即,在剥离粘合层之后,以及在将叠层结构暴露量子点图案部的一面与目标基板接触之前,制作方法还包括:
步骤S800、将叠层结构S具有粘合层4的一面与对位基板7贴合,如图10所示;具体的,对位基板7可以具有第一对位标记,目标基板6上可以具有对应的第二对位标记,通过对位基板7的第一对位标记与目标基板6的第二对比标记进行对位,实现将量子点图案部5准确转移到目标基板6上;具体的,对位基板7可以为玻璃基板;
步骤S900、将贴合有叠层结构S的对位基板7以具有量子点图案部5的一面与目标基板6进行对位,如图11所示。
本公开实施例中,在将量子点图案部5转移到目标基板6之前,可以先将叠层结构S具有粘合层4的一面与对位基板7贴合,通过对位基板7与目标基板6的对位,实现将量子点图案部5准确转移到目标基板6。
可以理解的是,以上步骤S100-步骤S700可以实现一种出光颜色的量子点图案部的形成,在需要形成多种出光颜色的量子点图案部时,可以多次重复步骤S100-步骤S700,实现多种出光颜色量子点图案部的制作。
在一种可能的实施方式中,结合图11所示,关于步骤S700中的,去除牺牲层3和粘合层4,可以包括:将叠层结构S浸入第一溶液,以使牺牲层3溶解。具体的,第一溶液可以是丙酮溶液,该步骤可以包括:将叠层结构S浸入丙酮溶液(第一溶液)中30min,牺牲层3(PMMA膜层)溶解,以及牺牲层3(PMMA膜层)背离量子点图案部5一侧的其它膜层结构(例如,粘合层4,对位基板7)与量子点图案部5分离,量子点图案部5则留在目标基板6,完成了量子点图案部5从原始基板1向目标基板6的转移过程。
在一种可能的实施方式中,结合图2所示,关于步骤S100中的,在原始基板1的一侧形成多个凹槽10,包括:在原始基板1的一侧形成多个第一比例在0.005~0.06的凹槽10,第一比例为凹槽10深度d与凹槽10在垂直于深度方向上最小开口尺寸k的比例。具体的,例如,参见图12所示,凹槽10在原始基板1背离凹槽10一面的正投影形状为圆形时,凹槽10在垂直于深度方向上最小开口尺寸k可以为圆的直径相同;具体的,凹槽10在原始基板1背离凹槽10一面的正投影形状为多边形时,凹槽10在垂直于深度方向上最 小开口尺寸k,可以理解为凹槽10在原始基板1背离凹槽10一面正投影外轮廓相对两边距离中的最小值,例如,参见图13所示,凹槽10在原始基板1背离凹槽10一面的正投影外轮廓形状为矩形时,可以有相对两个长边的距离k1,相对两个短边的距离k2,k1<k2,凹槽10在垂直于深度方向上最小开口尺寸可以为两个距离中的最小者,即,相对两个长边的距离k1;又例如,参见图14所示,凹槽10在原始基板1背离凹槽10一面的正投影形状为六边形时,凹槽10在垂直于深度方向上最小开口尺寸可以为六边形相对的两边的距离,且为其中最小的距离。
具体的,在原始基板1的一侧通形成多个第一比例在0.005~0.06的凹槽10,包括:在原始基板1的一侧通过构图工艺形成多个深度在15nm~30nm,在垂直于深度方向上最小开口尺寸在500nm~3000nm的凹槽10。本公开实施例中,凹槽10深度在15nm~30nm,可以使形成的量子点图案部5较薄,可以用于制作量子点发光器件中的发光层,较薄的量子点图案部5,有利于具有较高的电致发光效率;而且,凹槽10的最小开口尺寸在500nm~3000nm,相比于现有技术亚像素尺寸在几十微米的尺寸,本公开实施例可以形成的亚像素尺寸较小,可以实现超高分辨率显示。可以理解的是,量子点图案部5的厚度可以与凹槽10深度大致相同。
具体的,在原始基板1的一侧形成多个凹槽10,包括:在原始基板1的一侧形成多个第一比例在1.67~20的凹槽10,第一比例为凹槽10与凹槽在垂直于深度方向上最小开口尺寸的比例。
具体的,在原始基板的一侧形成多个第一比例在1.67~20的凹槽,包括:在原始基板1的一侧形成多个深度在5000nm~10000nm,在垂直于深度方向上最小开口尺寸在500nm~3000nm的凹槽10。本公开实施例中,凹槽10在垂直于深度方向上最小开口尺寸范围为5000nm~10000nm,形成的量子点图案部5的较厚,可以用于制作显示装置中的光转换层,较厚的量子点图案部5,有利于具有较高的光致发光效率;而且,凹槽10的最小开口尺寸在500nm~3000nm,相比于现有技术亚像素尺寸在几十微米的尺寸,本公开实施例可以形成的亚 像素尺寸较小,可以实现超高分辨率显示。
在一种可能的实施方式中,关于步骤S300中的,通过量子点溶液自组装工艺,在图案坑形成量子点图案部,包括:
提供量子点浓度为10mg/mL~90mg/mL,甲苯和庚烷的二元溶剂中甲苯质量分数在10%~15%的量子点溶液;具体的,可以以1000~3000rpm旋涂量子点溶液10s~30s(量子点溶液可以包括量子点,以及甲苯和庚烷组成的二元溶剂,其中,甲苯质量分数0~100%,具体的,可以是0~30%,更具体的,可以是10~15%;量子点的浓度可以是:0~100mg/mL,具体的,可以是10~90mg/mL);
将量子点溶液旋涂于隔离层的背离原始基板的一侧,量子点溶液通过毛细作用形成于图案坑。
本公开实施例中,通过提供量子点浓度为10mg/mL~90mg/mL,溶剂质量分数在10%~15%的量子点溶液,可以实现将量子点溶液旋涂于隔离层的背离原始基板的一侧时,量子点溶液可以通过毛细作用形成于图案坑,实现超高分辨率显示器件的量子点图案部的形成。
基于同一发明构思,本公开实施例还提供一种量子点图案,参见图15A所示,包括:位于衬底基板8一侧的多个量子点图案部5,其中,量子点图案部5的厚度a与量子点图案部5在垂直于厚度方向最小尺寸b的比例为0.005~0.06,或者,量子点图案部5的厚度a与量子点图案部5在垂直于厚度方向最小尺寸b的比例为1.67~20。本公开实施例中,量子点图案部5的厚度a与量子点图案部5在垂直于厚度方向最小尺寸b的比例为0.005~0.06,或者,量子点图案部5的厚度a与量子点图案部5在垂直于厚度方向最小尺寸b的比例为1.67~20,可以实现超高分辨率显示。
具体的,量子点图案部5的厚度a与量子点图案部5在垂直于厚度方向最小尺寸b的比例,可以与形成量子点图案部5时的关于凹槽10的第一比例大致相同。具体的,量子点图案部5可以包括出射红光的第一量子点图案部51,出射绿光的第二量子点图案部52,以及出射蓝光的第三量子点图案部53。
在一种可能的实施方式中,量子点图案部5在垂直于厚度方向最小尺寸b范围为500nm~3000nm。本公开实施例中,量子点图案部5在垂直于厚度方向最小尺寸b范围为500nm~3000nm,可以实现超高分辨率显示。
在一种可能的实施方式中,量子点图案部5的厚度a为15nm~30nm。本公开实施例中,量子点图案部5在15nm~30nm,形成的量子点图案部5较薄,可以用于制作量子点发光器件中的发光层,较薄的量子点图案部5,有利于具有较高的电致发光效率。
在一种可能的实施方式中,量子点图案部5的厚度a为5000nm~10000nm。本公开实施例中,量子点图案部5的厚度a为5000nm~10000nm,形成的量子点图案部5的较厚,可以用于制作显示装置中的光转换层,较厚的量子点图案部5,有利于具有较高的光致发光效率。
图15B展示了通过本公开实施例提供的量子点图案制作方法形成的5nm~1μm各种尺寸的量子点图案部阵列,从中可以看出,随着量子点图案部尺寸的减小,转印的量子点图案部阵列饱和度也随之略微下降,图15B中350nm的量子点图案部尺寸的边缘误差小于10nm,处于可接受误差范围内。
图15C展示了不同像素密度的量子点图案部阵列,利用溶液自组装和对位技术制备了超高像素密度的红、绿、蓝量子点图案部阵列。
基于同一发明构思,参见图16A所示,本公开实施例还提供一种量子点发光器件,其中,包括:
第一衬底基板81;
第一电极811,第一电极811位于第一衬底基板81的一侧;
第一功能层S1,第一功能层S1位于第一电极811背离第一衬底基板81的一侧;第一功能层S1具体可以包括第一子功能层812,以及位于第一子功能层812背离第一电极812一侧的第二子功能层813;
量子点发光层,量子点发光层位于第一功能层S1的背离第一电极811的一侧,包括多个如本公开实施例提供的量子点图案部5;
第二功能层814,第二功能层814位于量子点发光层的背离第一功能层 S1的一侧;
第二电极815,第二电极815位于第二功能层814的背离量子点发光层的一侧。
具体的,以量子点发光器件为正置结构为例,第一电极811可以为阳极,具体材质可以氧化铟锡;第一子功能层812具体可以为空穴注入层,具体材料可以为PEDOT:PSS,膜层厚度可以为25nm~30nm,具体的,可以为28nm;第二子功能层813具体可以为空穴传输层,具体材料可以为TFB,膜层厚度可以为20nm~30nm,具体的,可以为25nm;第二功能层814具体可以为电子传输层,具体材料可以为氧化锌,膜层厚度可以为40nm~60nm,具体的,可以为50nm;第二电极815具体可以为阴极,具体材料可以为铝,膜层厚度可以为80nm~120nm,具体的,可以为100nm。
表1和图16B表明了采用本公开实施例制备的量子点图案部形成的量子点发光器件和传统成熟的旋涂工艺制备的量子点器件比较,其中,实施例一表示采用本公开实施例制备的量子点图案部形成的量子点发光器件,实施例二表示采用传统成熟的旋涂工艺制备的量子点器件,二者性能相当,但是本公开实施例可制备的红、绿、蓝亚像素密度远远高于传统工艺,因而具有更广阔的应用前景。
表1:
  V CE cd/A EQE
实施例1 2.20V 14.8 3.3%
实施例2 2.25V 15.1 3.4%
基于同一发明构思,参见图17所示,本公开实施例还提供一种显示装置,包括:
发光基板F;
光转换层,光转换层位于发光基板F的出光侧,光转换层包括多个如本公开实施例提供的量子点图案部5。
在一种可能的实施方式中,发光基板F包括:
第二衬底基板82;
驱动电路,驱动电路位于第二衬底基板82面向光转换层的一侧,驱动电路具体可以包括驱动电路层821,以及位于驱动电路层821背离第二衬底基板82一侧的电极层822;
背光源823,背光源823位于驱动电路面向光转换层的一侧。
在一种可能的实施方式中,背光源823可以为蓝光发光二极管,或者,背光源823也可以为出射蓝光的有机发光器件。
在一种可能的实施方式中,显示装置包括位于相邻量子点图案部5之间的光阻挡结构827。
在一种可能的实施方式中,显示装置包括:位于光转换层背离发光基板一侧的彩膜层,彩膜层包括与量子点图案部一一对应的滤色部83。具体的,滤色部83可以包括与出射红光的第一量子点图案部51对应的第一滤色部831,以过滤除红光以外的其它光,包括与出射绿光的第二量子点图案部52对应的第二滤色部832,以过滤除绿光以外的其它光,以及包括与出射蓝光的第三量子点图案部53对应的第三滤色部832,以过滤除蓝光以外的其它光。
在一种可能的实施方式中,显示装置包括位于彩膜层背离发光基板一侧的第三衬底基板825。
在一种可能的实施方式中,显示装置包括位于第三衬底基板825背离发光基板一侧的四分之一波片826。
在一种可能的实施方式中,显示装置包括位于光转换层面向发光基板一侧的量子点封装层824。
本公开实施例中,通过先在原始基板形成凹槽,并在原始基板具有凹槽的一面形成隔离层,并通过溶液自组装工艺在图案坑形成量子点图案部,实现对量子点进行微纳尺寸的阵列制作,后续在量子点图案部背离隔离层的一侧形成牺牲层,并在牺牲层的背离量子点图案部的一侧贴合粘合层,通过剥离粘合层,可以实现将量子点图案部从隔离层分离,再结合转印工艺,实现 了量子点膜层在超高像素密度的阵列制作,其量子点膜层的图案化良率和可重复性较佳,满足量产的技术要求,同时保留了量子点原有的光学特性,保证了显示器件的性能。
尽管已描述了本发明的优选实施例,但本领域内的技术人员一旦得知了基本创造性概念,则可对这些实施例作出另外的变更和修改。所以,所附权利要求意欲解释为包括优选实施例以及落入本发明范围的所有变更和修改。
显然,本领域的技术人员可以对本发明实施例进行各种改动和变型而不脱离本发明实施例的精神和范围。这样,倘若本发明实施例的这些修改和变型属于本发明权利要求及其等同技术的范围之内,则本发明也意图包含这些改动和变型在内。

Claims (25)

  1. 一种图案化量子点膜层的制作方法,其中,包括:
    在原始基板的一侧形成多个凹槽;
    在所述原始基板具有所述凹槽的一侧形成隔离层,所述隔离层的厚度小于所述凹槽的深度,其中,所述隔离层在与所述凹槽对应的区域形成图案坑;
    通过量子点溶液自组装工艺,在所述图案坑形成量子点图案部;
    在所述量子点图案部背离所述隔离层的一侧形成牺牲层;
    在所述牺牲层背离所述量子点图案部的一侧贴合粘合层;
    剥离所述粘合层,以使所述量子点图案部与所述牺牲层随所述粘合层一同从所述隔离层分离,得到所述粘合层、所述牺牲层和所述量子点图案部的叠层结构;
    将所述叠层结构暴露所述量子点图案部的一面与目标基板接触,并去除所述牺牲层和所述粘合层。
  2. 如权利要求1所述的制作方法,其中,在剥离所述粘合层之后,以及在将所述叠层结构暴露所述量子点图案部的一面与目标基板接触之前,所述制作方法还包括:
    将所述叠层结构具有所述粘合层的一面与对位基板贴合;
    将贴合有所述叠层结构的所述对位基板以具有所述量子点图案部的一面与所述目标基板进行对位。
  3. 如权利要求1或2所述的制作方法,其中,所述去除所述牺牲层和所述粘合层,包括:
    将所述叠层结构浸入第一溶液,以使所述牺牲层溶解。
  4. 如权利要求3所述的制作方法,其中,所述在原始基板的一侧形成多个凹槽,包括:
    在所述原始基板的一侧形成多个第一比例在0.005~0.06的所述凹槽,所述第一比例为所述凹槽深度与所述凹槽在垂直于深度方向上最小开口尺寸的 比例。
  5. 如权利要求4所述的制作方法,其中,所述在所述原始基板的一侧通形成多个第一比例在0.005~0.06的所述凹槽,包括:
    在原始基板的一侧通过构图工艺形成多个深度在15nm~30nm,在垂直于深度方向上最小开口尺寸在500nm~3000nm的所述凹槽。
  6. 如权利要求3所述的制作方法,其中,所述在原始基板的一侧形成多个凹槽,包括:
    在所述原始基板的一侧形成多个第一比例在1.67~20的所述凹槽,所述第一比例为所述凹槽深度与所述凹槽在垂直于深度方向上最小开口尺寸的比例。
  7. 如权利要求6所述的制作方法,其中,所述在所述原始基板的一侧形成多个第一比例在1.67~20的所述凹槽,包括:
    在原始基板的一侧形成多个深度在5000nm~10000nm,在垂直于深度方向上最小开口尺寸在500nm~3000nm的所述凹槽。
  8. 如权利要求1所述的制作方法,其中,所述通过量子点溶液自组装工艺,在所述图案坑形成量子点图案部,包括:
    提供量子点浓度为10mg/mL~90mg/mL,甲苯和庚烷的二元溶剂中所述甲苯质量分数在10%~15%的量子点溶液;
    将所述量子点溶液旋涂于所述隔离层的背离所述原始基板的一侧,所述量子点溶液通过毛细作用形成于所述图案坑。
  9. 如权利要求1所述的制作方法,其中,所述在所述原始基板的具有所述图案坑的一侧形成隔离层,包括:
    在所述原始基板的具有所述图案坑的一侧旋涂聚二甲基硅氧烷溶液;
    加热处理第一时长,以去除所述二甲基硅氧烷溶液中的溶剂,形成所述隔离层。
  10. 如权利要求9所述的制作方法,其中,所述在所述量子点图案部的背离所述隔离层的一侧形成牺牲层,包括:
    在所述量子点图案部的背离所述隔离层的一侧旋涂聚甲基丙烯酸甲酯溶液;
    加热处理第二时长,以去除所述甲基丙烯酸甲酯溶液中的溶剂,形成所述牺牲层。
  11. 如权利要求10所述的制作方法,其中,所述在所述牺牲层的背离所述量子点图案部的一侧贴合粘合层,包括:
    在所述牺牲层的背离所述量子点图案部的一侧贴合聚酰亚胺膜层。
  12. 如权利要求1所述的制作方法,其中,所述在原始基板的一侧形成多个凹槽,包括:在所述原始基板的一侧通过光刻构图工艺形成多个所述凹槽。
  13. 如权利要求1所述的制作方法,其中,所述牺牲层与所述量子点图案部的黏合力大于所述量子点图案部与所述隔离层的黏合力。
  14. 一种量子点图案,其中,包括:位于衬底基板一侧的多个量子点图案部,其中,所述量子点图案部的厚度与所述量子点图案部在垂直于厚度方向最小尺寸的比例为0.005~0.06,或者,所述量子点图案部的厚度与所述量子点图案部在垂直于厚度方向最小尺寸的比例为1.67~20。
  15. 如权利要求14所述的量子点图案,其中,所述量子点图案部在垂直于厚度方向最小尺寸范围为500nm~3000nm。
  16. 如权利要求15所述的量子点图案,其中,所述量子点图案部的厚度为15nm~30nm。
  17. 如权利要求15所述的量子点图案,其中,所述量子点图案部的厚度为5000nm~10000nm。
  18. 一种量子点发光器件,其中,包括:
    第一衬底基板;
    第一电极,所述第一电极位于所述第一衬底基板的一侧;
    第一功能层,所述第一功能层位于所述第一电极背离所述第一衬底基板的一侧;
    量子点发光层,所述量子点发光层位于所述第一功能层的背离所述第一电极的一侧,包括多个如权14-16任一项所述的量子点图案部;
    第二功能层,所述第二功能层位于所述量子点发光层的背离所述第一功能层的一侧;
    第二电极,所述第二电极位于所述第二功能层的背离所述量子点发光层的一侧。
  19. 一种显示装置,包括:
    发光基板;
    光转换层,所述光转换层位于所述发光基板的出光侧,所述光转换层包括多个如权14、15或17所述的量子点图案部。
  20. 如权利要求19所述的显示装置,其中,所述发光基板包括:
    第二衬底基板;
    驱动电路,所述驱动电路位于所述第二衬底基板面向所述光转换层的一侧;
    背光源,所述背光源位于所述驱动电路面向所述光转换层的一侧。
  21. 如权利要求20所述的显示装置,其中,所述背光源为蓝光发光二极管,或者,所述背光源为出射蓝光的有机发光器件。
  22. 如权利要求19所述的显示装置,其中,所述显示装置包括位于相邻所述量子点图案部之间的光阻挡结构。
  23. 如权利要求19所述的显示装置,其中,所述显示装置包括:位于所述光转换层背离所述发光基板一侧的彩膜层,所述彩膜层包括与所述量子点图案部一一对应的滤色部。
  24. 如权利要求23所述的显示装置,其中,所述显示装置包括位于所述彩膜层背离所述发光基板一侧的第三衬底基板。
  25. 如权利要求24所述的显示装置,其中,所述显示装置包括位于所述第三衬底基板背离所述发光基板一侧的四分之一波片。
PCT/CN2021/088533 2021-04-20 2021-04-20 量子点图案、量子点发光器件、显示装置及制作方法 WO2022222049A1 (zh)

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