WO2021217741A1 - 显示面板及电子装置 - Google Patents

显示面板及电子装置 Download PDF

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Publication number
WO2021217741A1
WO2021217741A1 PCT/CN2020/090599 CN2020090599W WO2021217741A1 WO 2021217741 A1 WO2021217741 A1 WO 2021217741A1 CN 2020090599 W CN2020090599 W CN 2020090599W WO 2021217741 A1 WO2021217741 A1 WO 2021217741A1
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WO
WIPO (PCT)
Prior art keywords
color resist
patterns
metal
display panel
pattern
Prior art date
Application number
PCT/CN2020/090599
Other languages
English (en)
French (fr)
Inventor
邓帆
姚晓慧
金一坤
Original Assignee
深圳市华星光电半导体显示技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 深圳市华星光电半导体显示技术有限公司 filed Critical 深圳市华星光电半导体显示技术有限公司
Priority to US16/771,014 priority Critical patent/US11342359B2/en
Publication of WO2021217741A1 publication Critical patent/WO2021217741A1/zh

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136286—Wiring, e.g. gate line, drain line
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G02F1/133509—Filters, e.g. light shielding masks
    • G02F1/133514—Colour filters

Definitions

  • the present application relates to the field of display panel technology, and in particular to a test key design of a display panel, and an electronic device including the display panel.
  • LCD liquid crystal displays
  • TFT thin film transistor
  • CF color filter
  • Liquid Crystal Layer liquid crystal layer
  • COA Color Filter on array
  • COA technology is to fabricate color resist blocks on the thin film transistor array substrate.
  • the color resist blocks include red color resist blocks, green color resist blocks, and blue color resist blocks.
  • each display The display area of the panel 2 is provided with multiple color resist blocks 601.
  • the color resist blocks 601 include red color resist blocks, green color resist blocks, blue color resist blocks, red color resist blocks, green color resist blocks, and blue color resist blocks.
  • the widths of the red, green, and blue color resist blocks will change.
  • the color resist blocks 601 and the metal traces 501 are offset and overlapped. When the overlap/offset width is too large or too small, the flatness, shielding and other properties will deteriorate.
  • the main monitoring mark monitors the width of the color resistance block and the offset and overlap between the color resistance block and the column drive line (Overlay), but in actual production, the main monitoring mark is often made poorly and causes the monitoring to fail.
  • the main monitoring mark cannot monitor each display panel, and the monitoring accuracy needs to be improved. Therefore, it is necessary to propose a test key suitable to be set on each display panel and set on each display panel to monitor the offset and overlap of the color resist blocks in each display panel.
  • the embodiments of the present application provide a display panel and an electronic device, and each display panel is provided with a test key to solve the problem that the metal traces in the display area of the display panel cannot be monitored due to the failure of the main monitoring mark in the existing display panel manufacturing.
  • a display panel includes a display area and a non-display area surrounding the display area.
  • the display panel includes a plurality of metal wires and a plurality of color resist blocks located in the display area; and a test key is located in the display area.
  • the test key includes a plurality of color resist patterns and a plurality of metal patterns, each of the color resist patterns corresponds to a color resist block of the same color, and each of the metal patterns corresponds to the corresponding metal pattern. Line, each of the color resist patterns is arranged between two corresponding adjacent metal patterns.
  • the application also proposes an electronic device, which includes a display panel, the display panel includes a display area and a non-display area surrounding the display area, the display panel includes: a plurality of metal traces and a plurality of color resist blocks , Located in the display area; a test key, located in the non-display area, the test key includes a plurality of color resist patterns and a plurality of metal patterns, each of the color resist patterns corresponds to a color resist block of the same color, each Each of the metal patterns corresponds to the corresponding metal trace, and each of the color resist patterns is disposed between two corresponding adjacent metal patterns.
  • the beneficial effect of the present application is that a test key is set in the non-display area of each display panel, and the relative position of a plurality of metal patterns in the test key, the width of a plurality of color resist patterns, and a plurality of color resist patterns relative to the corresponding
  • the offset and overlap of two adjacent metal patterns are tested to monitor the width of the color block in the display area of the display panel, the offset and the amount of overlap between the color block and the adjacent metal traces to avoid When the main monitoring mark fails, it cannot be monitored, which improves the monitoring accuracy of each display panel.
  • Figure 1 (a) is a schematic diagram of a main monitoring mark provided in the prior art on the motherboard;
  • FIG. 1(b) is a schematic diagram of a color resist block in a display area of a display panel provided by the prior art
  • FIG. 1(c) is a schematic diagram of a color resist block in a display area of a display panel provided by the prior art
  • FIG. 2 is a schematic structural diagram of a display motherboard provided in Embodiment 1 of the present application.
  • FIG. 3 is a schematic structural diagram of a display panel provided in Embodiment 1 of the application.
  • FIG. 4 is a schematic diagram of the structure of a test key of a display panel provided in the first/second embodiment of the application;
  • FIG. 5 is a schematic structural diagram of a test key of a display panel provided in the third embodiment of the application.
  • FIG. 6 is a schematic structural diagram of a test key of a display panel provided in the third embodiment of the application.
  • FIG. 7 is a schematic structural diagram of a test key of a display panel provided in the fourth embodiment of the application.
  • FIG. 8 is a schematic structural diagram of a test key of a display panel provided in the fifth embodiment of the application.
  • FIG. 9 is a schematic structural diagram of a test key of a display panel provided in the sixth embodiment of the application.
  • FIG. 10 is a schematic structural diagram of a test key of a display panel provided in the sixth embodiment of the application.
  • FIG. 11 is a schematic structural diagram of a test key of a display panel provided in the seventh embodiment of the application.
  • FIG. 12(a) is a schematic structural diagram of a test key of a display panel provided in the eighth embodiment of this application.
  • FIG. 12(b) is a schematic structural diagram of a test key of a display panel provided in the eighth embodiment of the application.
  • FIG. 12(c) is a schematic structural diagram of a test key of a display panel provided in the eighth embodiment of the application.
  • FIG. 12(d) is a schematic structural diagram of a test key of a display panel provided in the eighth embodiment of the application.
  • FIG. 13 is a schematic structural diagram of a test key of a display panel provided in the ninth embodiment of the application.
  • FIG. 14 is a schematic structural diagram of a test key of a display panel provided in the ninth embodiment of the application.
  • FIG. 15 is a schematic structural diagram of a test key of a display panel provided in the ninth embodiment of the application.
  • first and second are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features. Therefore, the features defined with “first” and “second” may explicitly or implicitly include one or more of the features. In the description of the present application, “multiple” means two or more than two, unless otherwise specifically defined.
  • connection should be understood in a broad sense, unless otherwise clearly specified and limited.
  • it can be a fixed connection or a detachable connection.
  • Connected or integrally connected it can be mechanically connected, or electrically connected or can communicate with each other; it can be directly connected or indirectly connected through an intermediate medium, it can be the internal communication of two components or the interaction of two components relation.
  • an intermediate medium it can be the internal communication of two components or the interaction of two components relation.
  • the "on" or “under” of the first feature of the second feature may include direct contact between the first and second features, or may include the first and second features Not in direct contact but through other features between them.
  • the "above”, “above” and “above” of the first feature on the second feature include the first feature directly above and obliquely above the second feature, or it simply means that the first feature is higher in level than the second feature.
  • the “below”, “below” and “below” of the second feature of the first feature include the first feature directly below and obliquely below the second feature, or it simply means that the level of the first feature is smaller than the second feature.
  • the embodiment of the present application provides a display panel, which includes a display area and a non-display area surrounding the display area.
  • the display panel includes: a plurality of metal traces and a plurality of color resist blocks located in the display area; and a test key is located in the non-display area ,
  • the test key includes multiple color resist patterns and multiple metal patterns, each color resist pattern corresponds to a corresponding color resist block, each metal pattern corresponds to a corresponding metal trace, and each color resist pattern is set in the corresponding two-phase Between adjacent metal patterns.
  • the beneficial effect of the present application is that a test key is set in the non-display area of each display panel, and the relative position of a plurality of metal patterns in the test key, the width of a plurality of color resist patterns, and a plurality of color resist patterns relative to the corresponding
  • the offset and overlap of two adjacent metal patterns are tested to monitor the width of the color block in the display area of the display panel, the offset and the amount of overlap between the color block and the adjacent metal traces to avoid When the main monitoring mark fails, it cannot be monitored, which improves the monitoring accuracy of each display panel.
  • the display panel 2 includes a display area 8 and a non-display area 9 surrounding the display area 8.
  • the area 8 is provided with a plurality of metal traces 501 and a plurality of color resist blocks 601.
  • the test key 10 is located in the non-display area 9.
  • the test key 10 includes a plurality of color resist patterns 11 and a plurality of metal patterns 111, each of the color resist patterns 11 Corresponding to the corresponding color resist block 601, each metal pattern 111 corresponds to a corresponding metal wiring 501, and each color resist pattern 11 is disposed between two corresponding adjacent metal patterns 111.
  • the display area 8 of the display panel 2 is provided with a plurality of color resist blocks 601, and the color resist blocks include a red color resist block R, a green color resist block G, and a blue color resist block B.
  • the test key 10 includes a plurality of color resist patterns 11, the color resist patterns include a red color resist pattern R, a green color resist pattern G, and a blue color resist pattern B. Each color resist pattern corresponds to a corresponding color resist block, that is, a red color resist.
  • the pattern R corresponds to the red color resist block R
  • the green color resist pattern G corresponds to the green color resist block G
  • the blue color resist pattern B corresponds to the blue color resist block B
  • the red color resist pattern R and the red color resist block R are formed by the same material and the same process
  • the green color resist pattern G and the green color resist block G are formed by the same material and the same process
  • the blue color resist pattern B and the blue color resist block B are formed by the same material and the same process
  • the display area 8 of the display panel 2 is provided with multiple metal traces Line 501
  • each metal pattern 111 of the test key 10 corresponds to a corresponding metal trace 501, that is, each metal pattern 111 and its corresponding metal trace 501 are formed by the same material and the same process, for example, the same process for the column driving lines Formation, especially when the metal wiring is a data signal line (data line), part or all of the plurality of metal patterns 111 and the data signal line (data line) are formed by the same material and the same process.
  • the mother board 1 has a number of main monitoring marks 3 in the Dummy area, although the main monitoring mark 3 is set to monitor each color resistive layer and column drive line/row drive Lines, etc. overlap/offset (Overlay), but in actual production, the main monitoring mark3 is often made poorly and the monitoring fails, and the main monitoring mark3 cannot monitor each display panel 2, and the monitoring accuracy needs to be improve.
  • the test key 10 is set on each display panel, and the test key
  • the shape and size of the multiple color resist patterns in 10 can be better maintained with the multiple color resist blocks in the display area.
  • the shape and size of the multiple metal patterns in the test key 10 can better maintain the multiple color resist patterns in the display area.
  • the metal traces are consistent, so that the layer of the display area can be accurately monitored by the test key 10.
  • the test key 10 is arranged in the non-display area 9 where the non-display area 9 and the display area 8 are adjacent to each other.
  • the test key 10 is arranged next to the display area 8 in the non-display area 9, which can reduce the space and area occupied by the test key 10 in the non-display area, and facilitates the layout and manufacture of the test key 10 in the display panel 2.
  • the test key 10 is adjacent to the display Area setting, considering the uniformity of layer formation, the shape and size of multiple color resist patterns and multiple metal patterns in the test key 10 can be better kept consistent with the display area, so that the display area can be accurately monitored by the test key 10 Layers.
  • the color resist pattern is provided with skirts on one side of the first direction and/or the second direction, and the bottom surface of each of the skirts is self-adjacent to one of the color resist patterns.
  • the distance from the side to the side far from the color resist pattern is the same, the side of the skirt away from the color resist pattern is an inclined surface, the area of the bottom surface of the skirt is larger than the area of the top surface of the skirt, so
  • the inclined surface is provided with protruding strips or grooves, the protruding strips or grooves are wavy or zigzag-shaped, and the protruding strips or the grooves extend from the bottom surface of the skirt to the top surface of the skirt.
  • the distance between any two wave crests of the wavy or zigzag-shaped protrusion or the groove is the same, or the distance between any two tooth tips is the same.
  • the wavy or zigzag-shaped protrusions or grooves are used to identify the thickness of the color resist pattern, that is, when a camera unit (CCD, Charge Coupled Device) photographs the image in a direction perpendicular to the display panel
  • the captured image includes the wavy or zigzag-shaped protrusions or the grooves on the slope of the skirt, and the waves or the grooves of the protrusions or the grooves
  • the density of the sawtooth marks the thickness of the color resist pattern, that is, the greater the thickness of the color resist pattern, the greater the density of the waves or sawtooths of the convex strips or the grooves in the captured image, and when the The smaller the thickness of the color resist pattern is, the smaller the density of the waves or sawtooths of the convex strips or the grooves in the captured image.
  • the beneficial effect of the present application is that a test key is set in the non-display area of each display panel, and the relative position of a plurality of metal patterns in the test key, the width of a plurality of color resist patterns, and a plurality of color resist patterns relative to the corresponding
  • the offset and overlap of two adjacent metal patterns are tested to monitor the width of the color block in the display area of the display panel, the offset and the amount of overlap between the color block and the adjacent metal traces to avoid When the main monitoring mark fails, it cannot be monitored, which improves the monitoring accuracy of each display panel.
  • the test key includes: a first test key 6, the first test key 6 includes a plurality of first color resist patterns 11 and A plurality of first metal patterns 111 are arranged in one direction, and each first color resist pattern 11 is disposed between two corresponding adjacent first metal patterns 111.
  • the plurality of first color resist patterns 11 includes: a red color resist pattern, a green color resist pattern, and a blue color resist pattern; the plurality of first metal patterns include: adjacently arranged on both sides of the red color resist pattern along the first direction
  • the first metal patterns 111 are arranged, the first metal patterns 111 arranged along the first direction are adjacently arranged on both sides of the green color resist pattern, and the first metal patterns arranged along the first direction are arranged adjacently on both sides of the blue color resist pattern 11 Pattern 111.
  • the first metal patterns 111 adjacent to both sides of each first color resist pattern 11 are used to measure its relative position in the first direction, and each first color resist pattern 11 is used to measure its width in the first direction.
  • a first metal pattern 11 and its adjacent first metal patterns 111 on both sides are used to measure the offset and overlap of each first metal pattern 11 and its adjacent first metal patterns 111 on both sides in the first direction ( Overlay) volume.
  • the first metal pattern 111 adjacent to both sides of the red color resist pattern is used to measure its relative position in the first direction
  • the red color resist pattern is used to measure its width in the first direction
  • the red color resist pattern is used to measure its width in the first direction.
  • the side-adjacent first metal pattern 111 is used to measure the offset and overlap in the first direction between the red color resist pattern and the first metal pattern 111 adjacent to both sides; the green color resist pattern is opposite to both sides
  • the adjacent first metal pattern 111 is used to measure its relative position in the first direction, the green color resist pattern is used to measure its width in the first direction, and the green color resist pattern is matched with the adjacent first metal patterns 111 on both sides It is used to measure the offset and overlap in the first direction between the green color resist pattern and the first metal pattern 111 adjacent to both sides;
  • the first metal pattern 111 adjacent to both sides of the blue color resist pattern is used to measure Its relative position in the first direction, the blue color resist pattern is used to measure its width in the first direction, the blue color resist pattern and its adjacent first metal pattern 111 on both sides are used to measure the blue color resist pattern and its two sides
  • adjacent first color resist patterns 11 may selectively share the first metal pattern 111, There is no limitation here.
  • a notch 101 is provided on the blue color resist pattern as an example.
  • the function of the notch 101 is to facilitate the machine to grasp the position of the test key.
  • Computers and software and other equipment or systems can identify the position of the blue color resist pattern through the notch 101 , And distinguish the position of the red color resist pattern and the green color resist pattern.
  • the position setting of the notch 101 is not limited here, and can be set on any one or more of each metal pattern or/and each color resist pattern in the test key.
  • each first color resist pattern 11 corresponds to two adjacent ones of each first metal pattern 111 in the first There is no contact in the direction, but it does not limit whether each first color resist pattern 11 in the preset design or production pattern is in contact with each of the two adjacent first metal patterns 111 in the first direction. Only preferred embodiments or situations are listed.
  • the first test key 6 as shown in FIG. 4 shows that in the first test key 6 as shown in FIG. 4, although in this preferred implementation, each first color resist pattern 11 corresponds to two adjacent ones of each first metal pattern 111 in the first There is no contact in the direction, but it does not limit whether each first color resist pattern 11 in the preset design or production pattern is in contact with each of the two adjacent first metal patterns 111 in the first direction. Only preferred embodiments or situations are listed. In the first test key 6 as shown in FIG.
  • the red color resist pattern has distances r1, r2, respectively, relative to the two adjacent first metal patterns 111, and the green color resist The patterns have distances g1 and g2 from the corresponding two adjacent first metal patterns 111, respectively, and the blue color resist patterns have distances b1 and b2 from the corresponding two adjacent first metal patterns 111, respectively.
  • the widths of the red color resist pattern, the green color resist pattern, and the blue color resist pattern in the first direction are represented by r3, g3, and b3, respectively.
  • the relative position of multiple metal patterns in the test key By calculating the difference between the measured value and the preset value, the relative position of multiple metal patterns in the test key, the width of multiple color resist patterns, and the offset of multiple color resist patterns with respect to two adjacent metal patterns can be calculated
  • the actual measurement r1-preset r1 can be used to indicate the overlap amount of the red color resist pattern 11 and the first metal pattern 111.
  • the measurement and use method S of the first test key is described here by taking the red color resist pattern and its corresponding two adjacent first metal patterns as an example, and the method S includes:
  • S3 Determine whether the relative positions of two adjacent first metal patterns corresponding to the red color resist pattern are within the preset design value and error value range, the relative positions include respective ones of the two adjacent first metal patterns corresponding to the red color resist pattern.
  • the width and the distance between the two is that the relative position of two adjacent first metal patterns 111 is used as the reference quantity/reference quantity for subsequent measurement and calculation, generally in other positions on the display panel or on the motherboard. There are also a large number of monitoring mark or test key settings for monitoring the width and distance of the same layer of metal of the first metal pattern.
  • the relative positions of multiple first metal patterns 111 are within the preset design value and error value range.
  • S4 Obtain the width of the red color resist pattern in the first direction through step S2 or repeat S2.
  • the measured r3-preset r3 can be used to indicate the difference between the actual red color resist pattern and the preset width, which can be used as a reference for actual production;
  • each display panel 2 is provided with a plurality of color resist blocks 601.
  • the color resist blocks 601 include a red color resist block, a green color resist block, a blue color resist block, a red color resist block, Adjacent metal traces 501 (such as column drive lines) are arranged between the green color resist block and the blue color resist block, the red color resist block, the green color resist block, the blue color resist block and the adjacent metal traces The edge of 501 is aligned with the preset design.
  • the preset overlap of the red color resistance block and the column driving line 501 is 0.
  • the values of measured r1 and measured r2 can be obtained.
  • measured r1-preset r1 can be used Indicates the amount of overlap between the red color resistance layer and the adjacent column drive line 501 on the left, and the actual measurement r2-preset r2 represents the amount of overlap between the red color resistance layer and the adjacent column drive line 502 on the right, and the red color resistance layer is opposite
  • the offset of the adjacent column drive lines 501 on both sides is measured r1-preset r1+(measured r3-preset r3)/2, or measured r2-preset r2+(measured r3-preset r3)/2 .
  • the offset and the overlap amount may also have different corresponding calculation methods.
  • steps S4 and S5 in method S can be adjusted and is not limited.
  • the relative position of two adjacent first metal patterns corresponding to each first color resist pattern in the first test key, the width of each first color resist pattern, each The offset and overlap amount of the first color resist pattern and the corresponding two adjacent first metal patterns in the first direction can be obtained by measurement, calculation, and calculation by method S, which will not be listed here. .
  • the multiple metal patterns and multiple color resist patterns in the test key are rectangular, in actual panel production, the multiple metal patterns and multiple color resist patterns in the test key can be set to other shapes, such as curves.
  • the shape, circle, etc. are not limited here.
  • a test key suitable for setting in each display panel is provided.
  • the test includes the first test key.
  • the main monitoring mark fails, the relative position of each metal pattern and the color resistance can be well monitored.
  • the width, the offset of each color resist pattern and the corresponding metal pattern and the amount of overlap (Overlay) improve the monitoring accuracy of each display panel.
  • a test key is provided in each display panel.
  • the test key includes a first test key.
  • the first test key is used to illustrate the method S to detect each color resistance pattern corresponding to the first test key.
  • the width of the color resist block in the display area of the display panel can be monitored by testing the relative position of the metal pattern in the test key, the width of the color resist pattern, and the offset and overlap of the color resist pattern with respect to the corresponding metal pattern.
  • the offset and overlap width between the color resistance block and the metal trace avoids the failure of monitoring when the main monitoring mark fails, and improves the monitoring accuracy of each display panel.
  • this embodiment is the same as or similar to the first and second embodiments, except that the multiple color resist patterns further include multiple second color resist patterns 12, and the multiple metal patterns further include multiple second metal patterns.
  • Pattern 122 the test key also includes a second test key 7, the second test key 7 is located on one side of the first test key 6 along the first direction, and the second test key 7 includes a plurality of second color resist patterns 12 and along the second A plurality of second metal patterns 122 are arranged in a direction, each second color resist pattern 12 is disposed between two corresponding adjacent second metal patterns 122, and the second direction is perpendicular to the first direction.
  • the test key includes a first test key 6 and a second test key 7, and the plurality of second color resist patterns 12 include: a red color resist pattern, a green color resist pattern, and a blue color resist pattern; a plurality of second metal patterns 112 includes: second metal patterns 122 arranged in the second direction arranged adjacent to both sides of the green color resist pattern, second metal patterns 122 arranged in the second direction arranged adjacent to both sides of the red color resist pattern, and The second metal patterns 122 arranged along the second direction are arranged adjacent to the two sides of the blue color resist pattern.
  • the first metal patterns 122 adjacent to both sides of each second color resist pattern 12 are used to measure its relative position in the second direction
  • each second color resist pattern 122 is used to measure its width in the second direction.
  • a second metal pattern 12 and its adjacent second metal patterns 122 on both sides are used to measure the offset and overlap of each second metal pattern 12 and the first metal patterns 122 adjacent on both sides in the second direction ( Overlay) volume.
  • the second metal pattern 122 adjacent to both sides of the red color resist pattern is used to measure its relative position in the second direction
  • the red color resist pattern is used to measure its width in the second direction
  • the red color resist pattern is used to measure its width in the second direction.
  • the side-adjacent second metal pattern 122 is used to measure the offset and overlap amount of the red color resist pattern and the second metal pattern 122 adjacent to both sides in the second direction; the green color resist pattern on both sides
  • the adjacent second metal pattern 122 is used to measure its relative position in the second direction, the green color resist pattern is used to measure its width in the second direction, and the green color resist pattern is matched with the adjacent second metal patterns 122 on both sides Used to measure the offset and overlap in the second direction between the green color resist pattern and the second metal pattern 122 adjacent to both sides; the second metal pattern 122 adjacent to both sides of the blue color resist pattern is used to measure Its relative position in the second direction, the blue color resist pattern is used to measure its width in the second direction, and the blue color resist pattern and its adjacent second metal patterns 122 on both sides are used to measure the blue color resist pattern and its two sides.
  • the offset and overlap amount of the adjacent second metal patterns 122 in the second direction is used to measure its relative position in the second direction, the green color resist pattern is used to measure its
  • each second color resist pattern 12 corresponds to two adjacent second metal patterns 122 in the second There is no contact in the direction, but it does not limit whether each second color resist pattern 12 in the preset design or production pattern is in contact with each of the two adjacent second metal patterns 122 in the second direction. Only preferred embodiments or situations are listed.
  • the second test key 7 shown in FIG. 5 shows that in the second test key 7 shown in FIG.
  • the red color resist pattern has distances r4 and r5 from the two adjacent second metal patterns 122, respectively, and the green color resist The pattern has distances g4 and g5 relative to two adjacent second metal patterns 122, respectively, and the blue color resist pattern has distances b4 and b5 relative to two adjacent second metal patterns 122, respectively.
  • the widths of the red color resist pattern, the green color resist pattern, and the blue color resist pattern in the second direction are represented by r6, g6, and b6, respectively.
  • first direction can be the x direction and the second direction can be the y direction, or the first direction can be the y direction and the second direction can be the x direction.
  • the first and second directions are not limited here.
  • the second direction is perpendicular to the first direction.
  • the test key includes the first test key 6 and the second test key 7 at the same time.
  • the relative position of two adjacent first metal patterns corresponding to each first color resist pattern in the first test key 6, the width of each first color resist pattern in the first direction, each first color resist pattern and the corresponding The offset and the overlap (Overlay) of the two adjacent first metal patterns in the first direction can be measured, calculated and calculated by Method S; at the same time, each second color resistance pattern in the second test key is The relative position of the corresponding two adjacent second metal patterns, the width of each second color resist pattern in the second direction, the deviation of each second color resist pattern and the corresponding two adjacent second metal patterns in the second direction
  • the amount of shift and overlap (Overlay) can also be measured, calculated and calculated by method S.
  • the second test key 7 further includes a first metal pattern 111, and each second color resist pattern 12 and two adjacent second metal patterns 122 are located correspondingly Between two adjacent first metal patterns 111.
  • the plurality of first color resist patterns 11 and the plurality of second color resist patterns 12 are all arranged along the first direction, and the plurality of first colors
  • the resist pattern 11 includes a red color resist pattern, a green color resist pattern, and a blue color resist pattern.
  • the red color resist pattern, the green color resist pattern, and the blue color resist pattern are arranged in a first direction.
  • the second color resist pattern 12 includes a red color resist pattern, a green color resist pattern, and a blue color resist pattern.
  • the red color resist pattern, the green color resist pattern, and the blue color resist pattern are arranged along the first direction. .
  • a test key is set in each display panel.
  • the test key includes a first test key and a second test key.
  • the display panel can be monitored at the same time.
  • the related parameters of the first direction and the second direction avoid the failure of monitoring when the main monitoring mark fails, and improve the monitoring accuracy of each display panel.
  • this embodiment is the same as or similar to the first, second, and third embodiments.
  • the plurality of metal patterns further includes a plurality of third metal patterns 133
  • the first test key 6 also includes a direction along the second direction.
  • a plurality of third metal patterns 133 are arranged, each first color resist pattern 11 is also disposed between two adjacent third metal patterns 133, the second direction is perpendicular to the first direction, and each third metal pattern 133 It is located between two corresponding two adjacent first metal patterns 111 or intersects with two corresponding two adjacent first metal patterns 11. That is, in this embodiment, the first test key 6 includes the first color resist pattern 11, the first metal pattern 11, and the third metal pattern 133 at the same time.
  • the first test key can simultaneously measure the parameters of the first direction and the second party to monitor the display panel, and each of the first test keys in the first test key corresponds to two adjacent ones of the first color resistance pattern.
  • the relative position of the first metal patterns, the width of each first color resist pattern in the first direction, the offset and overlap of each first color resist pattern and the corresponding two adjacent first metal patterns in the first direction ( Overlay) can be measured, calculated and calculated by method S; at the same time, the relative position of two adjacent third metal patterns corresponding to each first color resist pattern in the first test key, and each first color resist
  • the width of the pattern in the second direction, the offset and the amount of overlap between each first color resist pattern and the corresponding two adjacent third metal patterns in the second direction can also be measured, calculated and calculated by method S Calculated.
  • the monitoring method is the same as the above embodiment, and the description will not be repeated here.
  • a test key is provided in each display panel.
  • the first test key can be provided with multiple first color resist patterns, multiple first metal patterns, and multiple third metal patterns 133 at the same time.
  • the test key can monitor the relevant parameters in the first direction and the second direction in the display panel at the same time, avoiding the failure of monitoring when the main monitoring mark fails, and improving the monitoring accuracy of each display panel.
  • each third color resist pattern 13 is arranged on one side of the first color resist pattern 11, and at least one through hole 201 is arranged in the third color resist pattern 13.
  • the third color resist pattern 13 includes: a red color resist pattern, a green color resist pattern, and a blue color resist pattern; at least one through hole 201 is provided in the red color resist pattern, and at least one through hole 201 is provided in the green color resist pattern. At least one through hole 201 is provided in the resist pattern.
  • the color resistance blocks in the pixels include vias, including but not limited to COA (Color Filter on Array) substrate pixels, and the pixel electrodes are electrically connected to the TFT (thin film transistor) through the vias.
  • the size of the through hole on the color resist layer in the pixel in the display area can be well monitored.
  • the shape of the through hole in the test key can be the same as the shape of the through hole in the pixel of the display area, and the design size of the through hole in the test key can be the same as the design size of the through hole in the pixel of the display area.
  • the shape and size can directly describe the shape and size of the via hole on the color resist block in the pixel of the display area.
  • the method S further includes:
  • the size of the through hole 201 is obtained by step S2 or by repeating the step S2 again.
  • the measured r7-preset r7 can be used to indicate the size change of the through hole 201.
  • steps S4, S5, and S6 in method S can be adjusted and is not limited.
  • a plurality of third color resist patterns are added to monitor the size of the via holes in the pixels in the display area, which can well monitor the relative positions of the metal patterns, the widths of the color resists, and the color resists.
  • the amount of offset and overlap between the pattern and the corresponding metal pattern, as well as the shape and size of the vias, improve the monitoring accuracy of each display panel.
  • the test key includes the first test key 6 described in the third embodiment, and the first test key 6 includes a plurality of first color resist patterns 11 and a plurality of first color resist patterns arranged along a first direction.
  • each of the first color resist patterns 11 is arranged between two corresponding adjacent first metal patterns 111;
  • the test key includes the second test key 7 described in the third embodiment, and the second test key 7 extends along the first One direction is located on one side of the first test key 6,
  • the second test key 7 includes a plurality of second color resist patterns 12 and a plurality of second metal patterns 122 arranged along the second direction, and each second color resist pattern 12 is provided Between the corresponding two adjacent second metal patterns 122, the second direction is perpendicular to the first direction;
  • the test key also includes one side of the plurality of first color resist patterns 11 or/and the plurality of second color resist patterns 12
  • the plurality of first color resist patterns 11 and the plurality of second color resist patterns 12 are all arranged along the first direction, and the plurality of first color resist patterns 11 include red color resist patterns and green color resist patterns.
  • Blue color resist patterns, the red color resist patterns, the green color resist patterns, and the blue color resist patterns of the plurality of first color resist patterns 11 are arranged along the first direction, and the plurality of second color resist patterns 12 include red color resist patterns and green color resist patterns.
  • the color resist pattern and the blue color resist pattern, among the plurality of second color resist patterns 11, the red color resist pattern, the green color resist pattern, and the blue color resist pattern are arranged along the first direction.
  • the second test key 7 may also optionally include a first metal pattern 111, each second color resist pattern 12 and two adjacent second metal patterns 122 It is located between two corresponding adjacent first metal patterns 111.
  • a preferred implementation situation is illustrated as an example, which can well monitor the relative position of each metal pattern, the width of each color resist, and the offset and overlap between each color resist pattern and the corresponding metal pattern (Overlay)
  • the quantity, as well as the shape and size of the vias, improve the monitoring accuracy of each display panel.
  • this embodiment is the same as or similar to the previous embodiment, except that the first metal pattern 111 and the second metal pattern 122 are composed of different layers of metal, for example, the first metal pattern 111 and the column driver of the display panel
  • the second metal pattern 122 is in the same layer as the row driving lines in the display panel; for example, the first metal pattern 111 is in the same layer as the row driving lines in the display panel, and the second metal pattern 122 is in the same layer as the column driving lines in the display panel; or Referring to FIG. 5, the first metal pattern 111 and the second metal pattern 122 are made of the same layer of metal, for example, the first metal pattern 111 and the second metal pattern 122 are in the same layer as the column driving lines or the row driving lines in the display panel. There is no limitation here.
  • first metal pattern and the second metal pattern use the same or different layers of metal.
  • the first test key and the second test key can be set according to the specific conditions of the display panel by selecting an appropriate metal layer. To facilitate the layout and manufacture of test keys in the display panel.
  • the non-display area 9 includes a first frame area 91 and a third frame area 93 that are arranged oppositely, and The second frame area 92 and the fourth frame area 94 are opposed to each other. Any adjacent two of the first, second, third, and fourth frame areas intersect to form a corner, and at least one corner is provided in the foregoing embodiment Test key.
  • At least one of the first, second, third, and fourth corners 911 to 914 is provided with a test key.
  • At least one of the first, second, third, and fourth frame areas 91 to 94 is provided with a test key.
  • At least one of the first, second, third, and fourth frame areas 91 to 94 is provided with a test key
  • the fourth frame area includes a frame glue structure
  • the first sub-region 941 of the fourth frame and the second sub-region 942 of the fourth frame are provided with the pad structure.
  • the test key can also be disposed in the second sub-region 942 of the fourth frame. When the test key is arranged in the second sub-area 942 of the fourth frame, the test key can be easily tested after the display panel is cut into small pieces from the mother board.
  • test key in a preferred embodiment and implementation, can be selectively arranged only in the second sub-region 942 of the fourth frame.
  • the preferred test key is set next to the display area. From the perspective of layer formation uniformity, the shape and size of multiple color resist patterns and multiple metal patterns in the test key can be Better maintain consistency with the display area, so as to accurately monitor the display area layer through the test key.
  • a display panel containing a test key is provided, and the position of the preferred implementation setting of the test key in the display panel is described in detail, so as to reduce the area occupied by the test key in the display panel and improve The accuracy of the layer in the display area is monitored by the test key to improve the convenience of monitoring.
  • this embodiment further illustrates the setting of the test key in the display panel: part or all of the metal pattern in the test key extends from the metal traces in the display area to The non-display area is formed; or/and the color resist pattern is partially or completely formed by extending the color resist layer of the display area to the non-display area.
  • the metal pattern includes one or more of the foregoing multiple first metal patterns, multiple second metal patterns, and multiple third metal patterns.
  • the multiple color resist patterns include the multiple first color resist patterns and the multiple second metal patterns.
  • One or more of the two-color resist pattern and the plurality of third color resist patterns are not limited here.
  • the display area of the display panel includes row and row driving lines (for example, scan driving lines) 301, and column driving lines (for example, data signal lines/data lines) 302.
  • column driving lines 302 are arranged along the first direction and along the first direction. Extending in two directions, a number of row driving lines 301 are arranged along the second direction and extend along the first direction.
  • the display area of the display panel also includes a color resist layer.
  • a COA (Color Filter on Array) type display panel is taken as an example.
  • the technical display panel is made of color resist blocks on a thin film transistor array substrate.
  • the color resist blocks include red color blocks, green color blocks, and blue color blocks.
  • the column drive lines 302 or/and the row drive lines 301 in the display area extend from the display area to the non-display area to form the first metal pattern in the first test key or/and the second test key.
  • the second metal pattern, the red color resistance block, the green color resistance block, and the blue color resistance block in the display area extend to the non-display area to form the first color resistance pattern in the first test key or/and the first color resistance pattern in the second test key Two-color resist pattern.
  • the display panel includes a display area 8 and a non-display area 9, and the test key is arranged in the non-display area 9 adjacent to the non-display area 8 and the display area 8.
  • the plurality of first metal patterns 111 are arranged on both sides of the plurality of first color resist patterns 11 along the first direction and extend along the second direction.
  • the plurality of column drive lines 302 in the display area 8 extend along the second direction.
  • the red color resist blocks, the green color resist blocks, and the blue color resist blocks within 8 are arranged along the first direction and extend along the second direction.
  • the plurality of first metal patterns 111 of the first test key 6 are formed by extending 302 of the column driving lines of the display area to the non-display area 9, and the plurality of first color resist patterns 11 are formed by the red color resist blocks in the display area, The green color resistance block and the blue color resistance block are extended to the non-display area 9, thus reducing the area occupied by the test key in the display panel.
  • the first test key 6 includes a plurality of first metal patterns 111 and a plurality of first
  • the color resist pattern 11 is formed by a plurality of column driving lines 302 and a plurality of color resist blocks in the display area 8 extending to the non-display area 9, so that the shape of the plurality of color resist patterns and the plurality of metal patterns in the first test key 6 The and size can be better kept consistent with the display area, so that the layers in the display area 8 can be accurately monitored through the first test key 6.
  • the display panel includes a display area 8 and a non-display area 9.
  • the test key is arranged in the non-display area 9 adjacent to the non-display area 8 and the display area 8, and a plurality of second The metal patterns 122 are arranged on both sides of the plurality of second color resist patterns 12 along the second direction and extend along the first direction, and the plurality of row driving lines 301 of the display area 8 extend along the first direction.
  • the plurality of second metal patterns 122 of the second test key 7 are formed by extending 301 of the row driving lines of the display area to the non-display area, thus reducing the area occupied by the test key in the display panel.
  • the multiple second metal patterns 122 in 6 are formed by the multiple row driving lines 301 in the display area 8 extending to the non-display area 9, so that the shape and size of the multiple metal patterns in the second test key 7 can be better. Keep it consistent with the display area, so that the layers in the display area 8 can be accurately monitored by the second test key 7.
  • the first test key 7 and the second test key 8 can be arranged in one place or separately. Different parts.
  • the multiple metal patterns and multiple color resist patterns in the first test key 7 or/and the second test key 8 can be partly or completely composed of multiple column drive lines and multiple color resists in the display area 9
  • the layer extends to the non-display area to be formed.
  • a display panel containing a test key is provided.
  • the setting form of the preferred embodiment of the first test key and the second test key in the display panel is illustrated in detail.
  • Multiple metal patterns and multiple color resist patterns can be partially or completely formed by metal traces and color resist layers in the display area extending to the non-display area, further reducing the number of first test keys and second test keys in the display panel The occupied area improves the accuracy of the layer in the display area monitored by the test key.
  • COA Color Filter on array
  • the display panel can be a non-COA type, and the color resist layer is arranged on the CF substrate.
  • the test key can also be set on the display area through the same or similar scheme in the embodiment of this application. monitor.
  • method S is used to describe how to monitor the display panel
  • other methods can also be used to measure the test keys to realize the monitoring of the display panel.
  • This application also proposes an electronic device, which includes the above-mentioned display panel.

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Abstract

一种显示面板（2），显示面板（2）包括显示区（8）和围绕显示区（8）的非显示区（9），显示面板（2）包括：多个金属走线（501）和多个色阻块（601），位于显示区（8）；测试键（10），位于非显示区（9），测试键（10）包括多个色阻图案（11）与多个金属图案（111），每个色阻图案（11）对应于对应的色阻块（601），每个金属图案（111）对应于对应的金属走线（501），每一色阻图案（11）设置在对应的两相邻金属图案（111）之间。

Description

显示面板及电子装置 技术领域
本申请涉及显示面板技术领域，尤其涉及一种显示面板的测试键设计，以及包含该显示面板的电子装置。
 背景技术
现今显示技术领域，液晶显示器(Liquid Crystal Display，LCD)已广泛应用于日常生活中，如手机或电视等。LCD的显示面板，其主要是由一薄膜晶体管（Thin Film Transistor, TFT）阵列基板、一彩膜（Color Filter, CF）基板、以及配置于两基板间的液晶层（Liquid Crystal Layer）所构成。随着显示技术的提升，已经发展了COA（Color Filter on array）技术，COA技术是将色阻块制作在薄膜晶体管阵列基板上，色阻块包含红色色阻块、绿色色阻块、蓝色色阻块。如图1（a）所示，母板1上制作有若干个显示面板2，母板1四角设置有主监控mark（Testkey、测试键）3，如图1（b）所示，每一显示面板2的显示区都设置有多个色阻块601，色阻块601包括红色色阻块、绿色色阻块、蓝色色阻块，红色色阻块、绿色色阻块、蓝色色阻块之间设置有相邻接的金属走线501（例如列驱动线），如图1（c）所示，在实际制作过程红色色阻块、绿色色阻块、蓝色色阻块的宽度会发生变化，且各色阻块601与金属走线501发生偏移与交叠（Overlay），当交叠/偏移宽度过多或过少时都会导致平坦性、屏蔽性等性能变差。
虽然设置了主监控mark监控色阻块宽度、色阻块与列驱动线发生偏移和交叠（Overlay）的情况，但是实际生产中经常出现主监控mark制作不良等导致监控失效的情况，且主监控mark不能对每一显示面板进行监控，监控精度有待提高。因此有必要提出一种适合设置在每一显示面板上的测试键，并在每一显示面板上设置，以监控每一显示面板中色阻块的偏移和交叠（Overlay）的情况。
 技术问题
本申请实施例提供一种显示面板及电子装置，在每一显示面板中设置测试键，以解决现有显示面板制造中由于主监控mark失效导致的不能监控显示面板显示区内的金属走线相对位置、色阻块宽度、色阻块与金属走线偏移和交叠（Overlay）宽度的问题，并提升每一显示面板的监控精度。
 技术解决方案
一种显示面板，其包括显示区和围绕所述显示区的非显示区，所述显示面板包括：多个金属走线和多个色阻块，位于所述显示区；测试键，位于所述非显示区，所述测试键包括多个色阻图案与多个金属图案，每个所述色阻图案对应于相同颜色的色阻块，每个所述金属图案对应于对应的所述金属走线，每一所述色阻图案设置在对应的两相邻所述金属图案之间。
本申请还提出了一种电子装置，其包括显示面板，所述显示面板包括显示区和围绕所述显示区的非显示区，所述显示面板包括：多个金属走线和多个色阻块，位于所述显示区；测试键，位于所述非显示区，所述测试键包括多个色阻图案与多个金属图案，每个所述色阻图案对应于相同颜色的色阻块，每个所述金属图案对应于对应的所述金属走线，每一所述色阻图案设置在对应的两相邻所述金属图案之间。
 有益效果
本申请的有益效果为：在每一显示面板的非显示区设置测试键，通过对测试键中多个金属图案的相对位置、多个色阻图案的宽度、多个色阻图案相对于对应的两相邻金属图案的偏移和交叠（Overlay）量的测试来监控显示面板显示区的色阻块宽度、色阻块与相邻金属走线的偏移和交叠（Overlay）量，避免主监控mark失效时无法监控，提升每一显示面板的监控精度。
 附图说明
图1（a）为现有技术提供的一种主监控mark在母板中设置示意图；
图1（b）为现有技术提供的一种显示面板的显示区的色阻块的示意图；
图1（c）为现有技术提供的一种显示面板的显示区的色阻块的示意图；
图2为本申请实施例一提供的一种显示母板的结构示意图；
图3为本申请实施例一提供的一种显示面板的结构示意图；
图4为本申请实施例一/二提供的一种显示面板的测试键的结构示意图；
图5为本申请实施例三提供的一种显示面板的测试键的结构示意图；
图6为本申请实施例三提供的一种显示面板的测试键的结构示意图；
图7为本申请实施例四提供的一种显示面板的测试键的结构示意图；
图8为本申请实施例五提供的一种显示面板的测试键的结构示意图；
图9为本申请实施例六提供的一种显示面板的测试键的结构示意图；
图10为本申请实施例六提供的一种显示面板的测试键的结构示意图；
图11为本申请实施例七提供的一种显示面板的测试键的结构示意图；
图12（a）为本申请实施例八提供的一种显示面板的测试键的结构示意图；
图12（b）为本申请实施例八提供的一种显示面板的测试键的结构示意图；
图12（c）为本申请实施例八提供的一种显示面板的测试键的结构示意图；
图12（d）为本申请实施例八提供的一种显示面板的测试键的结构示意图；
图13为本申请实施例九提供的一种显示面板的测试键的结构示意图；
图14为本申请实施例九提供的一种显示面板的测试键的结构示意图；
图15为本申请实施例九提供的一种显示面板的测试键的结构示意图。
 本发明的实施方式
下面将结合本申请实施例中的附图，对本申请实施例中的技术方案进行清楚、完整地描述。显然，所描述的实施例仅仅是本申请一部分实施例，而不是全部的实施例。基于本申请中的实施例，本领域技术人员在没有作出创造性劳动前提下所获得的所有其他实施例，都属于本申请保护的范围。
在本申请的描述中，需要理解的是，术语“中心”、“纵向”、“横向”、“长度”、“宽度”、“厚度”、“上”、“下”、“前”、“后”、“左”、“右”、“竖直”、“水平”、“顶”、“底”、“内”、“外”、“顺时针”、“逆时针”等指示的方位或位置关系为基于附图所示的方位或位置关系，仅是为了便于描述本申请和简化描述，而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作，因此不能理解为对本申请的限制。此外，术语“第一”、“第二”仅用于描述目的，而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此，限定有“第一”、“第二”的特征可以明示或者隐含地包括一个或者更多个所述特征。在本申请的描述中，“多个”的含义是两个或两个以上，除非另有明确具体的限定。
在本申请的描述中，需要说明的是，除非另有明确的规定和限定，术语“安装”、“相连”、“连接”应做广义理解，例如，可以是固定连接，也可以是可拆卸连接，或一体地连接；可以是机械连接，也可以是电连接或可以相互通讯；可以是直接相连，也可以通过中间媒介间接相连，可以是两个元件内部的连通或两个元件的相互作用关系。对于本领域的普通技术人员而言，可以根据具体情况理解上述术语在本申请中的具体含义。
在本申请中，除非另有明确的规定和限定，第一特征在第二特征之“上”或之“下”可以包括第一和第二特征直接接触，也可以包括第一和第二特征不是直接接触而是通过它们之间的另外的特征接触。而且，第一特征在第二特征“之上”、“上方”和“上面”包括第一特征在第二特征正上方和斜上方，或仅仅表示第一特征水平高度高于第二特征。第一特征在第二特征“之下”、“下方”和“下面”包括第一特征在第二特征正下方和斜下方，或仅仅表示第一特征水平高度小于第二特征。
下文的公开提供了许多不同的实施方式或例子用来实现本申请的不同结构。为了简化本申请的公开，下文中对特定例子的部件和设置进行描述。当然，它们仅仅为示例，并且目的不在于限制本申请。此外，本申请可以在不同例子中重复参考数字和/或参考字母，这种重复是为了简化和清楚的目的，其本身不指示所讨论各种实施方式和/或设置之间的关系。此外，本申请提供了的各种特定的工艺和材料的例子，但是本领域普通技术人员可以意识到其他工艺的应用和/或其他材料的使用。
本申请实施例提供了一种显示面板，包括显示区和围绕显示区的非显示区，显示面板包括：多个金属走线和多个色阻块，位于显示区；测试键，位于非显示区，测试键包括多个色阻图案与多个金属图案，每个色阻图案对应于对应的色阻块，每个金属图案对应于对应的金属走线，每一色阻图案设置在对应的两相邻金属图案之间。
本申请的有益效果为：在每一显示面板的非显示区设置测试键，通过对测试键中多个金属图案的相对位置、多个色阻图案的宽度、多个色阻图案相对于对应的两相邻金属图案的偏移和交叠（Overlay）量的测试来监控显示面板显示区的色阻块宽度、色阻块与相邻金属走线的偏移和交叠（Overlay）量，避免主监控mark失效时无法监控，提升每一显示面板的监控精度。
下面结合附图和实施例对本申请作进一步说明。
实施例一
请参阅图2、图3，并以图4中一种测试键举例说明，本申请实施例提供了一种显示面板，显示面板2包括显示区8和围绕显示区8的非显示区9，显示区8设置有多个金属走线501和多个色阻块601，测试键10位于非显示区9，测试键10包括多个色阻图案11与多个金属图案111，每个色阻图案11对应于对应的色阻块601，每个金属图案111对应于对应的金属走线501，每一色阻图案11设置在对应的两相邻金属图案111之间。
具体的，显示面板2的显示区8设置有多个色阻块601，色阻块包括红色色阻块R、绿色色阻块G、蓝色色阻块B。测试键10包括多个色阻图案11，色阻图案包括红色色阻图案R、绿色色阻图案G、蓝色色阻图案B，每个色阻图案对应于对应的色阻块，即红色色阻图案R对应红色色阻块R，绿色色阻图案G对应绿色色阻块G，蓝色色阻图案B对应蓝色色阻块B，红色色阻图案R与红色色阻块R通过相同材料同一工艺形成，绿色色阻图案G与绿色色阻块G通过相同材料同一工艺形成，蓝色色阻图案B与蓝色色阻块B通过相同材料同一工艺形成；显示面板2的显示区8设置有多个金属走线501，测试键10的每个金属图案111对应于对应的金属走线501，即每个金属图案111与其对应的金属走线501通过相同材料同一工艺形成，例如都为列驱动线的同一工艺形成，特别的当金属走线为数据信号线（data线）时，多个金属图案111中部分或全部与数据信号线（data线）通过相同材料和同一工艺形成。
请参阅图2，若干个显示面板2制作于显示母板1之中，母板1在Dummy区设有若干个主监控mark3，虽然设置了主监控mark3监控各色阻层与列驱动线/行驱动线等发生交叠/偏移（Overlay）的情况，但是实际生产中经常出现主监控mark3制作不良等导致监控失效的情况，且主监控mark3不能对每一显示面板2进行监控，且监控精度有待提高。另外在色阻块、金属走线制造过程成存在成膜均一性问题，即越近的色阻块、金属走线具有更好的尺寸均一性，测试键10设置在每一显示面板，测试键10中多个色阻图案的形状和尺寸可以更好的保持和显示区的多个色阻块一致，测试键10中多个金属图案的形状和尺寸可以更好的保持和显示区的多个金属走线一致，从而通过测试键10精确的监控显示区图层。
在本实施例的一优选实施例和实施情况中，测试键10设置于非显示区9与显示区8相邻接的非显示区9部位。测试键10紧邻显示区8设置在非显示区9，可以减小测试键10对非显示区空间和面积的占用，利于测试键10在显示面板2中的布局和制造，同时测试键10紧邻显示区设置，从图层形成均一性角度考虑，测试键10中多个色阻图案、多个金属图案的形状和尺寸可以更好的保持和显示区一致，从而通过测试键10精确的监控显示区图层。
作为一种改进，所述色阻图案在所述第一方向和/或所述第二方向上的一侧设置有裙部，每一所述裙部的底面自贴近所述色阻图案的一侧至远离所述色阻图案的一侧的距离相同，所述裙部远离所述色阻图案的一侧面为斜面，所述裙部的底面面积大于所述裙部的顶面的面积，所述斜面上设置有凸条或凹槽，所述凸条或凹槽为波浪状或锯齿状，所述凸条或所述凹槽自所述裙部的底面延伸至所述裙部的顶面，波浪状或锯齿状的所述凸条或所述凹槽任意两波峰之间的距离相同，或者任意两齿尖的距离相同。波浪状或锯齿状的所述凸条或所述凹槽用于标识所述色阻图案的厚度，即，当摄像单元（CCD，Charge Coupled Device）在垂直于所述显示面板的方向上拍摄所述色阻图案时，所拍摄的图像中包括所述裙部的所述斜面上的波浪状或锯齿状的所述凸条或所述凹槽，所述凸条或所述凹槽的波浪或锯齿的密度标识所述色阻图案的厚度，即，当所述色阻图案的厚度越大，所拍摄的图像中所述凸条或所述凹槽的波浪或锯齿的密度越大，当所述色阻图案的厚度越小，所拍摄的图像中所述凸条或所述凹槽的波浪或锯齿的密度越小。
本申请的有益效果为：在每一显示面板的非显示区设置测试键，通过对测试键中多个金属图案的相对位置、多个色阻图案的宽度、多个色阻图案相对于对应的两相邻金属图案的偏移和交叠（Overlay）量的测试来监控显示面板显示区的色阻块宽度、色阻块与相邻金属走线的偏移和交叠（Overlay）量，避免主监控mark失效时无法监控，提升每一显示面板的监控精度。
实施例二
请参阅图4，基于上述实施例，在一实施例和实施情况中，多个色阻图案
包括多个第一色阻图案11，多个金属图案包括多个第一金属图案111，测试键包括：第一测试键6，第一测试键6包括多个第一色阻图案11和沿第一方向排列的多个第一金属图案111，每一第一色阻图案11设置在对应的两相邻第一金属图案111之间。
具体的，多个第一色阻图案11包括：红色色阻图案、绿色色阻图案、蓝色色阻图案；多个第一金属图案包括：于红色色阻图案两侧相邻设置沿第一方向排列的第一金属图案111，于绿色色阻图案两侧相邻设置沿第一方向排列的第一金属图案111，于蓝色色阻图案11两侧相邻设置沿第一方向排列的第一金属图案111。每一第一色阻图案11两侧相邻的第一金属图案111用于测量其在第一方向的相对位置，每一第一色阻图11用于测量其在第一方向的宽度，每一第一金属图案11与其两侧相邻的第一金属图案111搭配用于测量每一第一金属图案11与其两侧相邻的第一金属图案111在第一方向的偏移和交叠（Overlay）量。具体的，红色色阻图案两侧相邻的第一金属图案111用于测量其在第一方向的相对位置，红色色阻图案用于测量其在第一方向的宽度，红色色阻图案与其两侧相邻的第一金属图案111搭配用于测量红色色阻图案与其两侧相邻的第一金属图案111在第一方向的偏移和交叠（Overlay）量；绿色色阻图案两侧相邻的第一金属图案111用于测量其在第一方向的相对位置，绿色色阻图案用于测量其在第一方向的宽度，绿色色阻图案与其两侧相邻的第一金属图案111搭配用于测量绿色色阻图案与其两侧相邻的第一金属图案111在第一方向的偏移和交叠（Overlay）量；蓝色色阻图案两侧相邻的第一金属图案111用于测量其在第一方向的相对位置，蓝色色阻图案用于测量其在第一方向的宽度，蓝色色阻图案与其两侧相邻的第一金属图案111搭配用于测量蓝色色阻图案与其两侧相邻的第一金属图案111在第一方向的偏移和交叠（Overlay）量。
在图4中，为了压缩多个第一色阻图案和多个第一金属图案在面板中占用的空间，相邻的第一色阻图案11之间可以选择性的共用第一金属图案111，在此不做限定。
在图4中，以蓝色色阻图案上设置有缺口101为例，缺口101的作用是便于机台抓取测试键位置，计算机和软件等设备或系统可以通过缺口101识别蓝色色阻图案的位置，并以此区分红色色阻图案和绿色色阻图案的位置。其中缺口101的位置设定在此不做限定，可以设置在测试键中各个金属图案或/和各个色阻图案中任意一个或者多个上面。
需要说明的是，在图4中所示第一测试键6之中，虽然在此优选实施情况中每一第一色阻图案11与对应的两相邻每一第一金属图案111在第一方向上不相接触，但是并没有限定预设设计或者制作的图形中每一第一色阻图案11与对应的两相邻每一第一金属图案111在第一方向是否相接触，在此处仅列举了优选实施例或情况。如图4所示第一测试键6之中，在一优选实施例或实施情况中，红色色阻图案相对于对应的两相邻的第一金属图案111分别具有距离r1、r2，绿色色阻图案相对于对应的两相邻的第一金属图案111分别具有距离g1、g2，蓝色色阻图案相对于对应的两相邻的第一金属图案111分别具有距离b1、b2。其中红色色阻图案、绿色色阻图案、蓝色色阻图案在第一方向的宽度分别用r3、g3、b3表示。
通过计算实测值与预设值的差值，可以计算测试键中多个金属图案的相对位置、多个色阻图案的宽度、多个色阻图案相对于对应的两相邻金属图案的偏移和交叠（Overlay）量，例如：在图4中所示第一测试键6之中，可以用实测r1-预设r1表示红色色阻图案11与第一金属图案111的交叠量。
具体的，第一测试键的测量和使用方法S在此以红色色阻图案及其对应的两相邻的第一金属图案举例进行说明，方法S包括：
S1：拍摄第一测试键6的照片；
S2：通过计算机和软件等设备或系统将第一测试键6的照片与设计图形或预设图形作比较运算；
S3：确定红色色阻图案对应的两相邻第一金属图案的相对位置是否在预设设计值和误差值范围内，相对位置包括红色色阻图案对应的两相邻第一金属图案的各自的宽度、和两者之间的距离，在这里需要说明的是两相邻第一金属图案111的相对位置作为后续测量和计算的参考量/基准量，一般在显示面板其他位置或者在母板其他位置还有大量监控第一金属图案同层金属的宽度和距离等参数的监控mark或测试键设置，通常多个第一金属图案111的相对位置在预设的设计值和误差值范围内，才会继续进行后续的生产，后面的测量才具有实际生产参考意义；
S4：通过第S2或重复S2步骤得出红色色阻图案在第一方向的宽度，可以用实测r3-预设r3表示红色色阻图案实作与预设的宽度差值，作为实际生产参考；
S5：通过第S2或再次重复S2步骤得出红色色阻图案与对应的两相邻第一金属图案111在第一方向的的偏移和交叠（Overlay）量。结合图1（b），每一显示面板2的显示区都设置有多个色阻块601，色阻块601包括红色色阻块、绿色色阻块、蓝色色阻块，红色色阻块、绿色色阻块、蓝色色阻块之间设置有相邻接的金属走线501（例如列驱动线），红色色阻块、绿色色阻块、蓝色色阻块与相邻接的金属走线501的边缘对齐预设设计，此时红色色阻块与列驱动线501的预设交叠为0，通过重复步骤S2得到实测r1、实测r2的数值，此时可以用实测r1-预设r1表示红色色阻层与左侧相邻列驱动线501的交叠量，用实测r2-预设r2表示红色色阻层与右侧相邻列驱动线502的交叠量，红色色阻层相对于两侧相邻的列驱动线501的偏移量为实测r1-预设r1+（实测r3-预设r3）/2，或者为实测r2-预设r2+（实测r3-预设r3）/2。当显示区内色阻层与金属走线具有不同的预设设计的交叠量时，偏移和交叠（Overlay）量还可以具有其对应的不同计算方法。
方法S中的步骤S4、S5的顺序可以调整，不做限定。
需要说明的是，在本申请实施例中，第一测试键中每一第一色阻图案所对应的两相邻第一金属图案的相对位置、每一第一色阻图案的宽度、每一第一色阻图案与对应的两相邻第一金属图案在第一方向的偏移和交叠（Overlay）量，可以通过方法S进行测量、计算和运算得出，在此不一一进行列举。
在图4中，虽然示意了测试键中多个金属图案、多个色阻图案为矩形，在实际面板生产中可以设置测试键中多个金属图案、多个色阻图案为其他形状，例如曲线形状、圆形等，在此不做限定。
在本申请实施例中，提供一种适合于设置在每一显示面板中的测试键，测试包括键第一测试键，在主监控mark失效时可以很好的监控各金属图案相对位置、各色阻宽度、各色阻图案与对应金属图案的偏移和交叠（Overlay）量，提升每一显示面板的监控精度。
在本申请实施例中，在每一显示面板中设置测试键，测试键包括第一测试键，通过以第一测试键举例说明了通过方法S来检测第一测试键中每一色阻图案所对应的两相邻第一金属图案的相对位置、每一色阻图案的宽度、每一色阻图案与对应的两相邻第一金属图案的偏移和交叠（Overlay）量的步骤和原理。可以通过对测试键中金属图案的相对位置、色阻图案的宽度、色阻图案相对于对应金属图案的偏移和交叠（Overlay）量的测试来监控显示面板显示区的色阻块宽度、色阻块与金属走线的偏移和交叠（Overlay）宽度，避免主监控mark失效时无法监控，提升每一显示面板的监控精度。
实施例三
请参阅图5，本实施例与实施例一、二相同或相似，不同之处在于：多个色阻图案还包括多个第二色阻图案12，多个金属图案还包括多个第二金属图案122，测试键还包括第二测试键7，第二测试键7沿第一方向位于第一测试键6的一侧，第二测试键7包括多个第二色阻图案12和沿第二方向排列的多个第二金属图案122，每一第二色阻图案12设置在对应的两相邻第二金属图案122之间，第二方向垂直于第一方向。
具体的，测试键同时包括第一测试键6和第二测试键7，多个第二色阻图案12包括：红色色阻图案、绿色色阻图案、蓝色色阻图案；多个第二金属图案112包括：于绿色色阻图案两侧相邻设置的沿第二方向排列的第二金属图案122，于红色色阻图案两侧相邻设置的沿第二方向排列的第二金属图案122，于蓝色色阻图案两侧相邻设置的沿第二方向排列的第二金属图案122。每一第二色阻图案12两侧相邻的第一金属图案122用于测量其在第二方向的相对位置，每一第二色阻图122用于测量其在第二方向的宽度，每一第二金属图案12与其两侧相邻的第二金属图案122搭配用于测量每一第二金属图案12与其两侧相邻的第一金属图案122在第二方向的偏移和交叠（Overlay）量。具体的，红色色阻图案两侧相邻的第二金属图案122用于测量其在第二方向的相对位置，红色色阻图案用于测量其在第二方向的宽度，红色色阻图案与其两侧相邻的第二金属图案122搭配用于测量红色色阻图案与其两侧相邻的第二金属图案122在第二方向的偏移和交叠（Overlay）量；绿色色阻图案两侧相邻的第二金属图案122用于测量其在第二方向的相对位置，绿色色阻图案用于测量其在第二方向的宽度，绿色色阻图案与其两侧相邻的第二金属图案122搭配用于测量绿色色阻图案与其两侧相邻的第二金属图案122在第二方向的偏移和交叠（Overlay）量；蓝色色阻图案两侧相邻的第二金属图案122用于测量其在第二方向的相对位置，蓝色色阻图案用于测量其在第二方向的宽度，蓝色色阻图案与其两侧相邻的第二金属图案122搭配用于测量蓝色色阻图案与其两侧相邻的第二金属图案122在第二方向的偏移和交叠（Overlay）量。
需要说明的是，在图5中所示第二测试键7之中，虽然在此优选实施情况中每一第二色阻图案12与对应的两相邻每一第二金属图案122在第二方向上不相接触，但是并没有限定预设设计或者制作的图形中每一第二色阻图案12与对应的两相邻每一第二金属图案122在第二方向是否相接触，在此处仅列举了优选实施例或情况。如图5所示第二测试键7之中，在一优选实施例或实施情况中，红色色阻图案相对于对应的两相邻的第二金属图案122分别具有距离r4、r5，绿色色阻图案相对于对应的两相邻的第二金属图案122分别具有距离g4、g5，蓝色色阻图案相对于对应的两相邻的第二金属图案122分别具有距离b4、b5。其中红色色阻图案、绿色色阻图案、蓝色色阻图案在第二方向的宽度分别用r6、g6、b6表示。
需要说明的是，其中第一方向可以为x方向、第二方向可以为y方向，或者第一方向可以为y方向、第二方向可以为x方向，在此不限定第一方向、第二方向的方向，第二方向垂直于第一方向。
需要说明的是，在本申请实施例中，测试键同时包括第一测试键6和第二测试键7。第一测试键6中每一第一色阻图案所对应的两相邻第一金属图案的相对位置、每一第一色阻图案在第一方向的宽度、每一第一色阻图案与对应的两相邻第一金属图案在第一方向的偏移和交叠（Overlay）量，可以通过方法S进行测量、计算和运算得出；同时第二测试键中每一第二色阻图案所对应的两相邻第二金属图案的相对位置、每一第二色阻图案在第二方向的宽度、每一第二色阻图案与对应的两相邻第二金属图案在第二方向的偏移和交叠（Overlay）量，也可以通过方法S进行测量、计算和运算得出。
请参阅图6，在一些优选实施例或实施情况中，第二测试键7中还包括第一金属图案111，每一第二色阻图案12和对应的两相邻第二金属图案122位于对应的两相邻的第一金属图案111之间。
请参阅图5、图6，包括但不限于：在一优选实施情况中，多个第一色阻图案11和多个第二色阻图12案均沿第一方向排列，多个第一色阻图案11包括红色色阻图案、绿色色阻图案、蓝色色阻图案，多个第一色阻图案11中红色色阻图案、绿色色阻图案、蓝色色阻图案沿第一方向排列，多个第二色阻图12包括红色色阻图案、绿色色阻图案、蓝色色阻图案，多个第二色阻图案11中红色色阻图案、绿色色阻图案、蓝色色阻图案沿第一方向排列。
在本申请实施例中，在每一显示面板中设置测试键，测试键包括第一测试键和第二测试键，通过对第一测试键和第二测试键，可以同时监控显示面板中在第一方向和第二方向的相关参数，避免主监控mark失效时无法监控，提升每一显示面板的监控精度。
实施例四
请参阅图7，本实施例与实施例一、二、三相同或相似，不同之处在于：多个金属图案还包括多个第三金属图案133，第一测试键6还包括沿第二方向排列的多个第三金属图案133，每一第一色阻图案11还设置在对应的两相邻第三金属图案133之间，第二方向垂直于第一方向，每一第三金属图案133位于对应的两相邻的第一金属图案111之间，或与对应的两相邻的第一金属图案11相交。即在此实施例中，第一测试键6同时包括第一色阻图案11、第一金属图案11、第三金属图案133。
在此实施例中，通过方法S，第一测试键可以同时测量第一方向和第二方的参数对显示面板进行监控，第一测试键中每一第一色阻图案所对应的两相邻第一金属图案的相对位置、每一第一色阻图案在第一方向的宽度、每一第一色阻图案与对应的两相邻第一金属图案在第一方向的偏移和交叠（Overlay）量，可以通过方法S进行测量、计算和运算得出；同时第一测试键中每一第一色阻图案所对应的两相邻第三金属图案的相对位置、每一第一色阻图案在第二方向的宽度、每一第一色阻图案与对应的两相邻第三金属图案在第二方向的偏移和交叠（Overlay）量，也可以通过方法S进行测量、计算和运算得出。监控方法同上述实施例，在此不再重复描述。
在本申请实施例中，在每一显示面板中设置测试键，第一测试键可以同时设置多个第一色阻图案、多个第一金属图案、多个第三金属图案133，通过第一测试键可以同时监控显示面板中在第一方向和第二方向的相关参数，避免主监控mark失效时无法监控，提升每一显示面板的监控精度。
实施例五
请参阅图8，本实施例与前述实施例相同或相似，不同之处在于：多个色阻图案还包括多个第三色阻图案13，第一测试键6还包括多个第三色阻图案13，每一第三色阻图案13设置在第一色阻图案11的一侧，第三色阻图案13中设置至少一通孔201。
具体的，第三色阻图案13包括：红色色阻图案、绿色色阻图案、蓝色色阻图案；红色色阻图案中至少设置一通孔201，绿色色阻图案中至少设置一通孔201，蓝色色阻图案中至少设置一通孔201。其中，在显示面板的显示区像素内，像素中色阻块包括过孔，包括但不限于COA（Color Filter on array）基板像素中，像素电极穿过过孔电性连接到TFT（薄膜晶体管）的源/漏极，通过在测试键中设置测量通孔的尺寸的色阻图案，可以很好的监控显示区像素内色阻层上的过孔尺寸。测试键中的通孔在形状上可以与显示区像素内的过孔形状相同，测试键中的通孔设计尺寸可以与显示区像素内的过孔设计尺寸相同，这样测试键中的通孔的形状、尺寸就可以直接说明显示区像素内色阻块上的过孔的形状、尺寸。
基于前述施例中的方法S，在此实施例中，以多个第三色阻图案13之中的红色色阻图案举例说明，方法S还包括：
S6：通过第S2或再次重复S2步骤得出通孔201的尺寸，可以用实测r7-预设r7表示通孔201的尺寸变化。
方法S中步骤S4、S5、S6的顺序可以调整，不做限定。
在本申请实施例中，基于前述实施例，增加了用以监控显示区像素内过孔尺寸的多个第三色阻图案，可以很好的监控各金属图案相对位置、各色阻宽度、各色阻图案与对应金属图案的偏移和交叠（Overlay）量，以及过孔的形状和尺寸，提升对每一显示面板的监控精度。
实施例六
请参阅图9，本实施例与前述实施例相同或相似，此实施例举例说明一优选实施情况。在本实施例优选实施情况中，测试键包括实施例三之中所述第一测试键6，第一测试键6包括多个第一色阻图案11和沿第一方向排列的多个第一金属图案111，每一第一色阻图案11设置在对应的两相邻第一金属图案111之间；测试键包括实施例三之中所述第二测试键7，第二测试键7沿第一方向位于第一测试键6的一侧，第二测试键7包括多个第二色阻图案12和沿第二方向排列的多个第二金属图案122，每一第二色阻图案12设置在对应的两相邻第二金属图案122之间，第二方向垂直于第一方向；测试键还包括设置于多个第一色阻图案11或/和多个第二色阻图案12一侧的多个第三色阻图案13，每一第三色阻图案13内设置至少一通孔201。
在一优选实施情况中，多个第一色阻图案11和多个第二色阻图12案均沿第一方向排列，多个第一色阻图案11包括红色色阻图案、绿色色阻图案、蓝色色阻图案，多个第一色阻图案11中红色色阻图案、绿色色阻图案、蓝色色阻图案沿第一方向排列，多个第二色阻图12包括红色色阻图案、绿色色阻图案、蓝色色阻图案，多个第二色阻图案11中红色色阻图案、绿色色阻图案、蓝色色阻图案沿第一方向排列。
请参阅图10，在一优选实施情况中，第二测试键7之中还可以选择性的包括第一金属图案111，每一第二色阻图案12和对应的两相邻第二金属图案122位于对应的两相邻的第一金属图案111之间。
在本申请实施例中，基于前述实施例，举例说明一优选实施情况，可以很好的监控各金属图案相对位置、各色阻宽度、各色阻图案与对应金属图案的偏移和交叠（Overlay）量，以及过孔的形状和尺寸，提升对每一显示面板的监控精度。
实施例七
请参阅图11，本实施例与前述实施例相同或相似，不同之处在于：第一金属图案111与第二金属图案122由不同层金属构成，例如第一金属图案111与显示面板中列驱动线同层，第二金属图案122与显示面板中行驱动线同层；例如第一金属图案111与显示面板中行驱动线同层，第二金属图案122与显示面板中列驱动线同层；或者请参阅图5，第一金属图案111与第二金属图案122由同层金属构成，例如第一金属图案111、第二金属图案122与显示面板中列驱动线同层或行驱动线同层。在此不做限定。
在本申请实施例中，对第一金属图案与第二金属图案使用相同或不同层金属进行了说明，第一测试键、第二测试键可以依据显示面板具体情况选择适当的金属层进行设置，以方便测试键在显示面板中的布局和制造。
实施例八
请参阅图12（a），基于前述实施例，本实施例对测试键在显示面板中的位置进行了说明：非显示区9包括相对设置的第一边框区91和第三边框区93，以及相对设置的第二边框区92和第四边框区94，第一、第二、第三及第四边框区中任意相邻的两个相交成一个角部，至少一个角部设置前述实施例中测试键。
请参阅图12（a）、图12（b）、图12（c）、图12（d），第一边框区91和第二边框区92相交形成第一角部位911、第二边框区92和第三边框区93相交形成第二角部位912、第三边框区93和第四边框区94相交形成第三角部位913、第四边框区94和第一边框区91相交形成第四角部位914；第一、第二、第三、第四角部位的至少一个设置上述测试键。
在图12（a）中，一优选实施例和实施情况中，第一、第二、第三、第四角部位911~914至少一个设置有测试键。
在图12（b）中，一优选实施例和实施情况中，第一、第二、第三、第四边框区91~94至少一个设置有测试键。
在图12（c）中，一优选实施例和实施情况中，第一、第二、第三、第四边框区91~94至少一个设置有测试键，其中第四边框区包括设置框胶结构的第四边框第一子区941和设置焊盘结构的第四边框第二子区942，测试键还可以设置在第四边框第二子区942。测试键设置在第四边框第二子区942时，显示面板从母板上切割成小片后，还可以容易测试测试键。
在图12（d）中，一优选实施例和实施情况中，测试键可选择性的只设置在第四边框第二子区942。
在图12（a）、图12（b）中，优选的测试键紧邻显示区设置，从图层形成均一性角度考虑，测试键中多个色阻图案、多个金属图案的形状和尺寸可以更好的保持和显示区一致，从而通过测试键精确的监控显示区图层。
在本申请实施例中，供一种包含测试键的显示面板，对测试键在显示面板中的优选实施设置的位置进行了细化说明，以缩减测试键在显示面板中所占用的面积，提升通过测试键监控显示区图层精确性，提升监控的便捷性。
实施例九
请参阅图13、图14、图15，基于前述实施例，本实施例对测试键在显示面板中的设置进一步举例说明：前述测试键中金属图案部分或全部由显示区的金属走线延伸至非显示区形成；或/和色阻图案部分或全部由显示区的色阻层延伸至非显示区形成。金属图案包括上述多个第一金属图案、多个第二金属图案、多个第三金属图案中的一种或多种，多个色阻图案包括上述多个第一色阻图案、多个第二色阻图案、多个第三色阻图案中的一种或多种，在此不做限定。
在图13中，显示面板显示区内包括行行驱动线（例如扫描驱动线）301、列驱动线（例如数据信号线/data线）302，若干列驱动线302沿第一方向排列并沿第二方向延伸，若干行驱动线301沿第二方向排列并沿第一方向延伸，在显示面板的显示区内还包括色阻层，以COA（Color Filter on array）型显示面板举例说明，采用COA技术的显示面板是将色阻块制作在薄膜晶体管阵列基板上，色阻块包含红色色块、绿色色块、蓝色色块。可选择性的举例说明，显示区内的列驱动线302或/和行驱动线301由显示区延伸至非显示区形成第一测试键中的第一金属图案或/和第二测试键中的第二金属图案，显示区中的红色色阻块、绿色色阻块、蓝色色阻块延伸至非显示区形成第一测试键中的第一色阻图案或/和第二测试键中的第二色阻图案。
结合图13、图14，一优选实施例和实施情况中，显示面板包括显示区8和非显示区9，测试键设置于非显示区8与显示区8相邻接的非显示区9部位，多个第一金属图案111沿第一方向排列在多个第一色阻图案11两侧并沿第二方向延伸，显示区8之内的多个列驱动线302沿第二方向延伸，显示区8之内的红色色阻块、绿色色阻块、蓝色色阻块沿第一方向排列并沿第二方向延伸。第一测试键6的多个第一金属图案111由显示区的多个列驱动线延302申至非显示区9形成，多个第一色阻图案11由显示区内的红色色阻块、绿色色阻块、蓝色色阻块延伸至非显示区9形成，这样就缩减了测试键在显示面板中所占用的面积，第一测试键6中多个第一金属图案111和多个第一色阻图案11由显示区8之内的多个列驱动线302和多个色阻块延伸至非显示区9形成，使得第一测试键6中多个色阻图案、多个金属图案的形状和尺寸可以更好的保持和显示区一致，从而通过第一测试键6精确的监控显示区8之内的图层。
结合图13、图15，在一些实施情况中，显示面板包括显示区8和非显示区9，测试键设置于非显示区8与显示区8相邻的非显示区9部位，多个第二金属图案122沿第二方向排列在多个第二色阻图案12两侧并沿第一方向延伸，显示区8的多个行驱动线301沿第一方向延伸。第二测试键7的多个第二金属图案122由显示区的多个行驱动线延301申至非显示区形成，这样就缩减了测试键在显示面板中所占用的面积，第二测试键6中多个第二金属图案122由显示区8之内的多个行驱动线301延伸至非显示区9形成，使得第二测试键7之中多个金属图案的形状和尺寸可以更好的保持和显示区一致，从而通过第二测试键7精确的监控显示区8之内的图层。
需要说明的是，在在非显示区9与显示区8相邻的非显示区9部位设置测试键时，第一测试键7和第二测试键8可以设置在一个部位，也可以分开设置在不同部位。第一测试键7或/和第二测试键8之中的多个金属图案、多个色阻图案，可以部分的或者全部的由显示区9之内的多个列驱动线、多个色阻层延伸至非显示区形成。
在本申请实施例中，提供一种包含测试键的显示面板，对第一测试键、第二测试键在显示面板中的优选实施例的设置形式进行了细化举例说明，测试键之中的多个金属图案、多个色阻图案可以部分的或者全部的由显示区内的金属走线、色阻层延伸至非显示区形成，进一步缩减第一测试键、第二测试键在显示面板中所占用的面积，提升通过测试键监控显示区图层精确性。
虽然在本申请多个实施例中，以COA（Color Filter on array）型显示面板举例说明，但不限于此，例如显示面板可以为非COA型，色阻层设置在CF基板，也可以通过本申请实施例中相同或相似方案设置测试键对显示区进行监控。
虽然在本申请多个实施例中，以方法S说明了如何对显示面板进行监控，还可以通过其他方法对测试键进行测量，以实现对显示面板的监控。
本申请还提出了一种电子装置，电子装置包含上述显示面板。
以上对本申请实施例进行了详细介绍，本文中应用了具体个例对本申请的原理及实施方式进行了阐述，以上实施例的说明只是用于帮助理解本申请的技术方案及其核心思想；本领域的普通技术人员应当理解：其依然可以对前述各实施例所记载的技术方案进行修改，或者对其中部分技术特征进行等同替换；而这些修改或者替换，并不使相应技术方案的本质脱离本申请各实施例的技术方案的范围。

Claims (20)

  1. 一种显示面板，其包括显示区和围绕所述显示区的非显示区，所述显示面板包括：
    多个金属走线和多个色阻块，位于所述显示区；
    测试键，位于所述非显示区，所述测试键包括多个色阻图案与多个金属图案，每个所述色阻图案对应于相同颜色的色阻块，每个所述金属图案对应于对应的所述金属走线，每一所述色阻图案设置在对应的两相邻所述金属图案之间。
  2. 根据权利要求1所述的显示面板，其中，
    所述多个色阻图案包括多个第一色阻图案，所述多个金属图案包括沿第一方向排列的多个第一金属图案，每一所述第一色阻图案设置在对应的两相邻所述第一金属图案之间。
  3. 根据权利要求2所述的显示面板，其中，
    所述多个色阻图案还包括多个第二色阻图案，所述多个金属图案还包括多个沿第二方向排列的多个第二金属图案，所述第二色阻图案和所述第二金属图案沿所述第一方向位于所述第一色阻图案和所述第一金属图案的一侧，每一所述第二色阻图案设置在对应的两相邻所述第二金属图案之间，所述第二方向垂直于所述第一方向。
  4. 根据权利要求3所述的显示面板，其中，
    所述多个第一色阻图案和所述多个第二色阻图案均沿所述第一方向排列。
  5. 根据权利要求3所述的显示面板，其中，
    每一所述第二色阻图案和对应的两相邻所述第二金属图案位于对应的两相邻的所述第一金属图案之间。
  6. 根据权利要求2所述的显示面板，其中，
    所述多个金属图案还包括多个沿第二方向排列的第三金属图案，每一所述第一色阻图案还设置在对应的两相邻所述第三金属图案之间，所述第二方向垂直于所述第一方向，每一所述第三金属图案位于对应的两相邻的所述第一金属图案之间，或与对应的两相邻的所述第一金属图案相交。
  7. 根据权利要求2所述的显示面板，其中，
    所述多个色阻图案还包括多个第三色阻图案，每一所述第三色阻图案设置在所述第一色阻图案的一侧，所述第三色阻图案中设置至少一通孔。
  8. 根据权利要求3所述的显示面板，其中，
    所述第一金属图案与所述第二金属图案由同层金属构成，或者所述第一金属图案与所述第二金属图案由不同层金属构成。
  9. 根据权利要求1所述的显示面板，其中，
    所述非显示区包括相对设置的第一边框区和第三边框区，以及相对设置的第二边框区和第四边框区，所述第一、第二、第三及第四边框区中任意相邻的两个相交成一个角部，所述测试键设置于至少一个所述角部。
  10. 根据权利要求2所述的显示面板，其中，
    所述非显示区包括相对设置的第一边框区和第三边框区，以及相对设置的第二边框区和第四边框区，所述第一、第二、第三及第四边框区中任意相邻的两个相交成一个角部，所述测试键设置于至少一个所述角部。
  11. 根据权利要求3所述的显示面板，其中，
    所述非显示区包括相对设置的第一边框区和第三边框区，以及相对设置的第二边框区和第四边框区，所述第一、第二、第三及第四边框区中任意相邻的两个相交成一个角部，所述测试键设置于至少一个所述角部。
  12. 根据权利要求6所述的显示面板，其中，
    所述非显示区包括相对设置的第一边框区和第三边框区，以及相对设置的第二边框区和第四边框区，所述第一、第二、第三及第四边框区中任意相邻的两个相交成一个角部，所述测试键设置于至少一个所述角部。
  13. 根据权利要求7所述的显示面板，其中，
    所述非显示区包括相对设置的第一边框区和第三边框区，以及相对设置的第二边框区和第四边框区，所述第一、第二、第三及第四边框区中任意相邻的两个相交成一个角部，所述测试键设置于至少一个所述角部。
  14. 根据权利要求1所述的显示面板，其中，
    所述金属图案部分或全部由所述金属走线延伸至所述非显示区形成；或/和
    所述色阻图案部分或全部由所述色阻块延伸至所述非显示区形成。
  15. 一种电子装置，其包括显示面板，所述显示面板包括显示区和围绕所述显示区的非显示区，所述显示面板包括：
    多个金属走线和多个色阻块，位于所述显示区；
    测试键，位于所述非显示区，所述测试键包括多个色阻图案与多个金属图案，每个所述色阻图案对应于相同颜色的色阻块，每个所述金属图案对应于对应的所述金属走线，每一所述色阻图案设置在对应的两相邻所述金属图案之间。
  16. 根据权利要求15所述的电子装置，其中，
    所述多个色阻图案包括多个第一色阻图案，所述多个金属图案包括沿第一方向排列的多个第一金属图案，每一所述第一色阻图案设置在对应的两相邻所述第一金属图案之间。
  17. 根据权利要求16所述的电子装置，其中，
    所述多个色阻图案还包括多个第二色阻图案，所述多个金属图案还包括多个沿第二方向排列的多个第二金属图案，所述第二色阻图案和所述第二金属图案沿所述第一方向位于所述第一色阻图案和所述第一金属图案的一侧，每一所述第二色阻图案设置在对应的两相邻所述第二金属图案之间，所述第二方向垂直于所述第一方向。
  18. 根据权利要求16所述的电子装置，其中，
    所述多个金属图案还包括多个沿第二方向排列的第三金属图案，每一所述第一色阻图案还设置在对应的两相邻所述第三金属图案之间，所述第二方向垂直于所述第一方向，每一所述第三金属图案位于对应的两相邻的所述第一金属图案之间，或与对应的两相邻的所述第一金属图案相交。
  19. 根据权利要求16所述的电子装置，其中，
    所述多个色阻图案还包括多个第三色阻图案，每一所述第三色阻图案设置在所述第一色阻图案的一侧，所述第三色阻图案中设置至少一通孔。
  20. 根据权利要求15所述的电子装置，其中，
    所述金属图案部分或全部由所述金属走线延伸至所述非显示区形成；或/和
    所述色阻图案部分或全部由所述色阻块延伸至所述非显示区形成。
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