WO2021060434A1 - 光学素子、光学装置、撮像装置、及び光学素子の製造方法 - Google Patents

光学素子、光学装置、撮像装置、及び光学素子の製造方法 Download PDF

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Publication number
WO2021060434A1
WO2021060434A1 PCT/JP2020/036172 JP2020036172W WO2021060434A1 WO 2021060434 A1 WO2021060434 A1 WO 2021060434A1 JP 2020036172 W JP2020036172 W JP 2020036172W WO 2021060434 A1 WO2021060434 A1 WO 2021060434A1
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WIPO (PCT)
Prior art keywords
optical
pixel
optical element
light
filters
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2020/036172
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English (en)
French (fr)
Japanese (ja)
Inventor
睦 川中子
西本　直樹
周平 松下
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Corp
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Fujifilm Corp
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Publication date
Application filed by Fujifilm Corp filed Critical Fujifilm Corp
Priority to CN202080066962.0A priority Critical patent/CN114514447B/zh
Priority to JP2021549020A priority patent/JP7335969B2/ja
Publication of WO2021060434A1 publication Critical patent/WO2021060434A1/ja
Priority to US17/688,819 priority patent/US11968437B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/50—Constructional details
    • H04N23/55—Optical parts specially adapted for electronic image sensors; Mounting thereof
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2823—Imaging spectrometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters
    • G02B5/201—Filters in the form of arrays
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G02B5/3025—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
    • G02B5/3058—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state comprising electrically conductive elements, e.g. wire grids, conductive particles
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/006—Filter holders
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/10—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming different wavelengths into image signals
    • H04N25/11—Arrangement of colour filter arrays [CFA]; Filter mosaics
    • H04N25/13—Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements
    • H04N25/131—Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements including elements passing infrared wavelengths
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/10—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming different wavelengths into image signals
    • H04N25/11—Arrangement of colour filter arrays [CFA]; Filter mosaics
    • H04N25/13—Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements
    • H04N25/135—Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements based on four or more different wavelength filter elements
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/805—Coatings
    • H10F39/8053—Colour filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2823—Imaging spectrometer
    • G01J2003/2826—Multispectral imaging, e.g. filter imaging
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
    • G02B27/286—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising for controlling or changing the state of polarisation, e.g. transforming one polarisation state into another

Definitions

  • the present invention relates to an optical element for capturing a multispectral image, an optical device, an imaging device, and a method for manufacturing the optical element.
  • Patent Document 1 describes a polarized color imaging device that enables multispectral imaging by using a polarized sensor and pupil division. Further, Patent Document 2 describes a multi-mode imaging system in which a filter module is moved with respect to the imaging system.
  • One embodiment according to the technique of the present disclosure provides an optical element, an optical device, an imaging device, and a method for manufacturing the optical element, which can easily acquire a multispectral image of good image quality.
  • the optical element according to the first aspect of the present invention is a plurality of optical filters, the plurality of optical filters including two or more optical filters that transmit light having at least a part of wavelength bands different from each other, and an optical axis center. It is a frame body having a slope portion having an apex as the apex, and includes a frame body in which a plurality of optical filters are installed on the slope portion.
  • the optical element according to the second aspect has a plurality of slope portions in the first aspect.
  • the optical element according to the third aspect further includes a fixing member for fixing the optical filter and the frame in the first or second aspect.
  • the fixing member is an adhesive, and the adhesive fixes a plurality of optical filters to the frame and covers the light receiving regions of the plurality of optical filters with the adhesive.
  • the unbroken portion forms a light transmitting region.
  • the optical element according to the fifth aspect is filled with an amount of adhesive corresponding to the area of the light transmitting region determined based on the wavelength bands of the plurality of optical filters in the plurality of windows. ..
  • the optical element according to the sixth aspect further includes an inclination adjusting member for adjusting the inclination of the plurality of optical filters with respect to the slope portion in any one of the first to fifth aspects.
  • the contact surface of the inclination adjusting member with the plurality of optical filters is an inclined surface.
  • the inclination adjusting member is fixed to the frame body.
  • the optical element according to the ninth aspect has, in any one of the first to eighth aspects, the plurality of window portions each having a polarizing portion that polarizes the light transmitted through the plurality of window portions.
  • the optical element according to the tenth aspect has a plurality of types of polarization directions in the ninth aspect.
  • the optical element according to the eleventh aspect is a wire grid or a slit formed in a plurality of window portions according to the direction of polarization in the ninth or tenth aspect.
  • the optical element according to the twelfth aspect has a frame body that is light transmissive in any one of the first to eleventh aspects.
  • the optical element according to the thirteenth aspect has an opening in a portion where a plurality of optical filters are installed, and the optical element has an opening for adjusting the area of the opening. It is equipped with an area adjusting member.
  • the optical element according to the fourteenth aspect has a plurality of optical filters installed on the slope portion at an inclination angle according to the wavelength band of the light transmitted by the respective optical filters. Has been done.
  • the optical device includes an optical element according to any one of the first to fourteenth aspects and a lens for forming an optical image of a subject, and the optical element is the light of the optical element. It is arranged in the optical path of light passing through the lens with the axis and the optical axis of the lens aligned.
  • the image pickup device is composed of the optical device according to the fifteenth aspect, an image pickup element including a plurality of pixel groups that selectively receive light transmitted through any of the plurality of optical filters, and an image pickup device. It includes a signal processing unit that generates a plurality of images corresponding to the wavelength bands of the plurality of optical filters based on the output signal.
  • the image pickup element includes a plurality of types of optical filters having different transmission wavelength bands and a plurality of types of polarizing portions having different polarization directions on the pixel.
  • the method for manufacturing an optical element according to an eighteenth aspect is a plurality of optical filters, the plurality of optical filters including two or more optical filters that transmit light having at least a part of wavelength bands different from each other, and an optical axis center. It is a method of manufacturing an optical element including a frame having a slope portion having an apex and a plurality of optical filters installed on the slope portion, and a plurality of optical filters are applied to a plurality of window portions. It includes an installation step of installing, an inclination adjusting step of adjusting the inclination of the optical filter with respect to the slope portion, and a fixing step of fixing the optical filter to the frame by a fixing member.
  • FIG. 1 is a diagram showing a schematic configuration of an image pickup apparatus according to a first embodiment.
  • FIG. 2 is a perspective view showing the structure of the frame body.
  • FIG. 3 is a diagram showing the configuration of the polarizing portion.
  • FIG. 4 is a diagram showing the arrangement of the bandpass filter and the inclination adjusting member.
  • FIG. 5 is a diagram showing the arrangement of the pupil region.
  • FIG. 6 is a diagram showing a state of adjusting the inclination.
  • FIG. 7 is a diagram showing a state of filling amount of the adhesive.
  • FIG. 8 is another diagram showing the state of the filling amount of the adhesive.
  • FIG. 9 is a diagram showing another configuration of the filter unit.
  • FIG. 10 is a diagram showing an array of pixels of the image sensor.
  • FIG. 10 is a diagram showing an array of pixels of the image sensor.
  • FIG. 11 is a diagram showing a configuration of an image sensor.
  • FIG. 12 is a cross-sectional view showing the configuration of the image sensor.
  • FIG. 13 is a diagram showing an arrangement pattern of the polarizing filter elements.
  • FIG. 14 is a diagram showing an arrangement pattern of the spectroscopic filter elements.
  • FIG. 15 is a diagram showing the transmission wavelength characteristics of the spectroscopic filter element.
  • FIG. 16 is a block diagram showing a schematic configuration of a signal processing unit.
  • FIG. 17 is a conceptual diagram of image generation.
  • FIG. 18 is a conceptual diagram of image generation by an imaging device.
  • FIG. 19 is a diagram showing another aspect of the inclination adjusting member.
  • FIG. 20 is a diagram showing another aspect of the filter unit.
  • FIG. 21 is a diagram showing the adjustment of the inclination by pushing and pulling the rod-shaped member.
  • FIG. 22 is a diagram showing another aspect of the polarizing unit.
  • An embodiment of an optical element, an optical device, an image pickup device, and a method for manufacturing an optical element according to the present invention is as follows. In the description, the accompanying drawings will be referred to as necessary.
  • FIG. 1 is a diagram showing a schematic configuration of an image pickup apparatus according to a first embodiment.
  • the image pickup device 1 (imaging device) according to the first embodiment is an image pickup device that captures a 4-band multispectral image, and mainly includes an imaging optical system 10 (optical device), an image pickup device 100 (imaging device), and an image pickup device 100 (imaging device). It includes a signal processing unit 200 (signal processing unit).
  • the imaging optical system 10 is configured by combining a plurality of lenses 12 (lenses) for forming an optical image of a subject, and has a filter unit 16 (optical element) in the optical path thereof.
  • the filter unit 16 is arranged in the optical path of light passing through the lens 12 in a state where the optical axis L of the lens 12 and the optical axis L2 of the filter unit 16 (see FIG. 2) are aligned (for example, the pupil position or its vicinity). Will be done.
  • the imaging optical system 10 has a focus adjusting mechanism (not shown). The focus adjustment mechanism adjusts the focus by moving the focus lens included in the imaging optical system 10 back and forth along the optical axis L.
  • the filter unit 16 is composed of a frame, a bandpass filter (bandpass filters 50A to 50D, see FIG. 4: optical filter), and a fixing member (adhesive 52; see FIGS. 7 to 8), and is an inclination adjusting member (inclination).
  • Adjusting member 30 Refer to FIGS. 4 to 7) to adjust the inclination of the bandpass filter.
  • FIG. 2 is an external perspective view of the frame body 20.
  • the frame body 20 is light-transmitting and has a plurality of rectangular slope portions 22 (slope portions) (four in the example of FIG. 2).
  • the four slope portions 22 have a polygonal pyramid shape with the optical axis center 21 (optical axis center) as the apex, which is the point where the optical axis L2 intersects.
  • the term "light transmission” means transmitting light in a desired wavelength band (for example, a wavelength band determined within the visible to near infrared range).
  • the slope portion 22 is provided with four window portions 24A, 24B, 24C, 24D (plurality of window portions) on which bandpass filters 50A to 50D (see FIG. 4) are installed, respectively.
  • the window portions 24A to 24D are rectangles in which one corner (vertex) is formed in the vicinity of the center 21 of the optical axis, and the wall portions 26 formed on the side surfaces of the window portions 24A to 24D are bandpassed.
  • the positional deviation of the filters 50A to 50D is regulated.
  • an insertion port 28 is provided at the end of the window portions 24A to 24D (the corner opposite to the center of the optical axis 21), and the inclination adjusting member 30 (see FIGS. 4, 6 to 8) is inserted (described later). .
  • FIG. 2 shows an example in which the frame body 20 has a plurality of slope portions 22, the optical element according to the present invention may have only one slope portion.
  • FIG. 3 is a conceptual diagram of the polarizing film 40.
  • the wire grid is obtained by forming a pattern of wires 42 (for example, a pitch of about 100 nm to 150 nm) on a transparent resin film by imprinting or the like. Light that oscillates in the direction orthogonal to the grid (Wp direction in FIG. 3) is transmitted, and light that oscillates in parallel to the grid (Ws direction in FIG. 3) is reflected.
  • the polarized light portion may be formed by a pattern formed by a plurality of slits (slits) instead of the wire.
  • slits slits
  • the polarization direction can be changed by changing the direction of the slit in the windows 24A to 24D.
  • FIG. 4 is a diagram showing a state in which the bandpass filter 50A and the inclination adjusting member 30 (inclination adjusting member) are arranged on the window portion 24A.
  • the bandpass filters 50A to 50D are a plurality of optical filters including two or more optical filters that transmit light having at least a part of wavelength bands different from each other, and are arranged in the windows 24A to 24D, respectively (installation step).
  • the transmission wavelength bands of the bandpass filters 50A to 50D are ⁇ 1 to ⁇ 4, for example, ⁇ 1 can be a blue wavelength band, ⁇ 2 can be a green wavelength band, ⁇ 3 can be a red wavelength band, and ⁇ 4 can be a near infrared wavelength band. Part of the transmission wavelength band may overlap.
  • the transmission wavelength band is not limited to this combination, and may be a different wavelength band (or a combination thereof) depending on the spectrum to be imaged.
  • the combination of the window portion and the bandpass filter described above forms a plurality of pupil regions Z1 to Z4 having different characteristics.
  • FIG. 6 is a diagram showing a state of tilt adjustment.
  • the contact surface of the inclination adjusting member 30 with the bandpass filter 50A is an inclination 30A (slope), and the inclination adjusting member 30 is inserted into the insertion port 28 and pushed and pulled in the direction of the arrow (left-right direction in the drawing).
  • the inclination of the bandpass filter 50A with respect to the slope portion 22 can be easily adjusted (inclination adjusting step).
  • the inclination angle of the bandpass filters 50A to 50D can be adjusted to any of positive, negative, and zero.
  • the bandpass filters 50A to 50D are adjusted to an inclination angle according to the transmission wavelength band of each filter, and are installed on the slope portion 22.
  • the filter unit 16 optical element
  • the image pickup optical system 10 optical device
  • the aberration of the image pickup optical system 10 is corrected by utilizing the change in the optical path length (described later), and good image quality is obtained. Multispectral images can be obtained.
  • bandpass filter 50A will be described as an example for installing the bandpass filter, adjusting the inclination, and fixing the bandpass filter in FIGS. 6 and 6, the same can be applied to other bandpass filters 50B to 50D.
  • an adhesive is used as a fixing member for fixing the bandpass filters 50A to 50D (optical filters) to the frame body 20.
  • This adhesive fixes the bandpass filters 50A to 50D and the inclination adjusting member 30 to the frame body 20, and the portion of the light receiving region of the bandpass filters 50A to 50D that is not covered with the adhesive opens an opening (light transmission region).
  • the adhesive is preferably non-light transmissive, but may not be completely non-light transmissive.
  • the window portion of the adhesive is filled with an amount corresponding to the area of the light transmission region determined based on the transmission wavelength band of the bandpass filters 50A to 50D.
  • the area of the light transmission region can be determined based on conditions such as the transmittance of the subject, the light source, and the bandpass filter in each wavelength band, the spectral sensitivity characteristics of the image pickup element, and the like (for example, "sensitivity" determined by these conditions. For wavelength bands with a low “", increase the area of the transmission region). Therefore, the filling amount of the adhesive may be different for each bandpass filter (for each window).
  • FIG. 7 is a diagram showing a state of filling the adhesive.
  • the adhesive is filled (fixed) through the gap between the insertion port 28 and the bandpass filter 50A with a syringe, a dropper, or the like. Process).
  • the adhesive reaches, for example, the filling lines 52A when the filling amount is small, and reaches the filling lines 52B and 52C as the filling amount increases.
  • FIG. 8 is another view showing the state of filling the adhesive, and shows the adhesive 52 when viewed from the cross-sectional direction of the frame body 20.
  • the tips of the adhesive 52 (the side closer to the center of the frame body 20; the left side in the figure) in the portions (a) to (c) of FIG. 8 correspond to the filling lines 52A to 52C in FIG. 7, respectively.
  • the opening area can be easily adjusted at the time of assembly by changing the filling amount of the adhesive, and the assembly is easy. Is.
  • the inclination adjusting member 30 may be kept fixed to the frame body 20 as shown in FIG. 8, or the inclination adjusting member 30 may be removed as shown in FIG. You may.
  • bandpass filters 50A to 50D are installed (installation on windows 24A to 24D; installation process), inclination adjustment (pushing and pulling of the inclination adjusting member 30; inclination adjusting process), and fixing (adhesive 52). Injection; fixing step) can be performed using various machines and devices.
  • FIG. 10 is a diagram showing a schematic configuration of a pixel array of an image sensor.
  • the image pickup device 100 has a plurality of types of pixels (pixels P1 to P16) on its light receiving surface. These pixels P1 to P16 are regularly arranged at a constant pitch along the horizontal direction (x-axis direction) and the vertical direction (y-axis direction).
  • one pixel block PB (X, Y) is composed of 16 adjacent (4 ⁇ 4) pixels P1 to P16, and these pixels.
  • the blocks PB are regularly arranged along the horizontal direction (x-axis direction) and the vertical direction (y-axis direction). (X, Y) indicate the positions in the x-axis direction and the y-axis direction, respectively.
  • FIG. 11 is a diagram showing a schematic configuration of the image sensor 100. Further, FIG. 12 is a cross-sectional view showing a schematic configuration of one pixel (broken line portion in FIG. 11).
  • the image pickup device 100 includes a pixel array layer 110, a polarizing filter element array layer 120 (polarizing section), a spectroscopic filter element array layer 130 (optical filter), and a microlens array layer 140. That is, the image sensor 100 includes a plurality of types of optical filters having different transmission wavelength bands and a plurality of types of polarizing portions having different polarization directions on the pixel. Each layer is arranged in the order of the pixel array layer 110, the polarizing filter element array layer 120, the spectroscopic filter element array layer 130, and the microlens array layer 140 from the image plane side to the object side.
  • the pixel array layer 110 is configured by arranging a large number of photodiodes 112 two-dimensionally. One photodiode 112 constitutes one pixel. Each photodiode 112 is regularly arranged along the horizontal direction (x direction) and the vertical direction (y direction).
  • the polarizing filter element array layer 120 is configured by two-dimensionally arranging four types of polarizing filter elements 122A to 122D having different polarization directions of the transmitted light.
  • the polarizing filter elements 122A to 122D are arranged at the same intervals as the photodiode 112, and are provided for each pixel. In each pixel block PB (X, Y), each polarizing filter element 122A to 122D is regularly arranged.
  • FIG. 13 is a diagram showing an example of an arrangement pattern of polarizing filter elements in one pixel block.
  • the pixel P1, the pixel P3, the pixel P9, and the pixel P11 are provided with the polarizing filter element 122A.
  • the pixel P2, the pixel P4, the pixel P10, and the pixel P12 are provided with the polarizing filter element 122B.
  • the pixel P3, the pixel P7, the pixel P13, and the pixel P15 are provided with the polarizing filter element 122C.
  • the pixel P4, the pixel P8, the pixel P14, and the pixel P16 are provided with the polarizing filter element 122D.
  • the spectroscopic filter element array layer 130 is configured by two-dimensionally arranging four types of spectroscopic filter elements 132A to 132D having different transmission wavelength characteristics.
  • the spectroscopic filter elements 132A to 132D are arranged at the same intervals as the photodiode 112, and are provided for each pixel. In each pixel block PB (X, Y), the spectroscopic filter elements 132A to 132D are regularly arranged.
  • FIG. 14 is a diagram showing an example of an arrangement pattern of spectral filter elements in one pixel block.
  • the pixel P1, the pixel P2, the pixel P5, and the pixel P6 are provided with the spectroscopic filter element 132A.
  • the pixel P3, the pixel P4, the pixel P7, and the pixel P8 are provided with the spectroscopic filter element 132B.
  • the pixel P9, the pixel P10, the pixel P13, and the pixel P14 are provided with the spectroscopic filter element 132C.
  • the pixel P11, the pixel P12, the pixel P15, and the pixel P16 are provided with the spectroscopic filter element 132D.
  • FIG. 15 is a graph showing an example of transmission wavelength characteristics of each spectroscopic filter element.
  • A shows the transmission wavelength characteristic of the spectroscopic filter element 132A.
  • B shows the transmission wavelength characteristic of the spectroscopic filter element 132B.
  • C indicates the transmission wavelength characteristic of the spectroscopic filter element 132C.
  • D indicates the transmission wavelength characteristic of the spectroscopic filter element 132D.
  • the spectroscopic filter elements 132A to 132D have different transmission wavelength characteristics.
  • the spectroscopic filter element 132A is composed of a spectroscopic filter element that transmits blue (Blue, B) light
  • the spectroscopic filter element 132B is composed of a spectroscopic filter element that transmits green (Green, G) light.
  • the spectroscopic filter element 132C is composed of a spectroscopic filter element that transmits red (Red, R) light
  • the spectroscopic filter element 132D is composed of a spectroscopic filter element that transmits infrared light (infrared, IR).
  • Red, R red
  • IR infrared
  • the wavelength bands ⁇ 1 to ⁇ 4 of the light transmitted by the bandpass filters 50A to 50D described above are set within the wavelength band transmitted by the spectral filter elements 132A to 132D. That is, the wavelength bands ⁇ 1 to ⁇ 4 of the light transmitted by the bandpass filters 50A to 50D are set in the region where the wavelength bands transmitted by the spectral filter elements 132A to 132D overlap. In other words, the transmission wavelength band of each spectroscopic filter element 132A to 132D is set so as to cover the transmission wavelength band of each bandpass filter 50A to 50D. Therefore, each spectroscopic filter element 132A to 132D uses a filter that transmits light in a wide band.
  • the microlens array layer 140 is configured by arranging a large number of microlenses 142 two-dimensionally. Each microlens 142 is arranged at the same spacing as the photodiode 112 and is provided for each pixel. The microlens 142 is provided for the purpose of efficiently condensing the light from the imaging optical system 10 on the photodiode 112.
  • each pixel P1 to P16 receives light from the image pickup optical system 10 as follows.
  • the pixel P1 receives the light from the imaging optical system 10 via the spectroscopic filter element 132A (transmission wavelength characteristic A) and the polarization filter element 122A (polarization direction ⁇ A). Further, the pixel P2 receives light from the imaging optical system 10 via the spectroscopic filter element 132A (transmission wavelength characteristic A) and the polarization filter element 122B (polarization direction ⁇ B). Further, the pixel P3 receives light from the imaging optical system 10 via the spectroscopic filter element 132B (transmission wavelength characteristic B) and the polarization filter element 122A (polarization direction ⁇ A).
  • the pixel P4 receives light from the imaging optical system 10 via the spectroscopic filter element 132B (transmission wavelength characteristic B) and the polarization filter element 122B (polarization direction ⁇ B).
  • the pixel P5 receives light from the imaging optical system 10 via the spectroscopic filter element 132A (transmission wavelength characteristic A) and the polarization filter element 122C (polarization direction ⁇ C).
  • the pixel P6 receives light from the imaging optical system 10 via the one spectroscopic filter element 132A (transmission wavelength characteristic A) and the polarization filter element 122D (polarization direction ⁇ D).
  • the pixel P7 receives light from the imaging optical system 10 via the spectroscopic filter element 132B (transmission wavelength characteristic B) and the polarization filter element 122C (polarization direction ⁇ C). Further, the pixel P8 receives light from the imaging optical system 10 via the spectroscopic filter element 132B (transmission wavelength characteristic B) and the polarization filter element 122D (polarization direction ⁇ D). Further, the pixel P9 receives light from the imaging optical system 10 via the spectroscopic filter element 132C (transmission wavelength characteristic C) and the polarization filter element 122A (polarization direction ⁇ A).
  • the pixel P10 receives light from the imaging optical system 10 via the spectroscopic filter element 132C (transmission wavelength characteristic C) and the polarization filter element 122B (polarization direction ⁇ B). Further, the pixel P11 receives light from the imaging optical system 10 via the spectroscopic filter element 132D (transmission wavelength characteristic D) and the polarization filter element 122A (polarization direction ⁇ A). Further, the pixel P12 receives light from the imaging optical system 10 via the spectroscopic filter element 132D (transmission wavelength characteristic D) and the polarization filter element 122B (polarization direction ⁇ B).
  • the pixel P13 receives light from the imaging optical system 10 via the spectroscopic filter element 132C (transmission wavelength characteristic C) and the polarization filter element 122C (polarization direction ⁇ C). Further, the pixel P14 receives light from the imaging optical system 10 via the spectroscopic filter element 132C (transmission wavelength characteristic C) and the polarization filter element 122D (polarization direction ⁇ D). Further, the pixel P15 receives light from the imaging optical system 10 via the spectroscopic filter element 132D (transmission wavelength characteristic D) and the polarization filter element 122C (polarization direction ⁇ C). Further, the pixel P16 receives light from the imaging optical system 10 via the spectroscopic filter element 132D (transmission wavelength characteristic D) and the polarization filter element 122D (polarization direction ⁇ D).
  • the pixels P1 to P16 receive light having different characteristics (wavelength band and polarization direction) because they have different optical characteristics. That is, the pixels P1 to P16 form a plurality of pixel groups that selectively receive light transmitted through any of the bandpass filters 50A to 50D (plurality of optical filters) by the spectroscopic filter element and the polarizing filter element.
  • the signal processing unit 200 processes the signal output from the image sensor 100 to generate image data of a 4-band multispectral image. That is, image data of four types of wavelength bands ⁇ 1 to ⁇ 4 (a plurality of images corresponding to the wavelength bands of a plurality of optical filters) that pass through the above-mentioned filter unit 16 are generated.
  • FIG. 16 is a block diagram showing a schematic configuration of a signal processing unit.
  • the signal processing unit 200 includes an analog signal processing unit 200A, an image generation unit 200B, and a coefficient storage unit 200C.
  • the analog signal processing unit 200A takes in the analog pixel signal output from each pixel of the image pickup element 100, performs signal processing (for example, correlation double sampling processing, amplification processing, etc.), and then converts it into a digital signal. Output.
  • the image generation unit 200B performs signal processing on the pixel signal after being converted into a digital signal to generate image data in each wavelength band ( ⁇ 1 to ⁇ 4).
  • FIG. 17 is a conceptual diagram of image generation.
  • each pixel block PB (X, Y) includes 16 pixels P1 to P16. Therefore, 16 image data D1 to D16 are generated by separating and extracting the pixel signals of the pixels P1 to P16 from the pixel blocks PB (X, Y).
  • crosstalk has occurred in the 16 image data D1 to D16. That is, since light in each wavelength band is incident on the pixels P1 to P16, the generated image is a mixture of images in each wavelength band. Therefore, the image generation unit 200B performs the interference removal process to generate image data in each wavelength band ( ⁇ 1 to ⁇ 4).
  • the pixel signal (signal value) obtained from the pixel P1 of each pixel block PB (X, Y) is defined as ⁇ 1, and the pixel signals obtained from the pixels P2 to P16 are similarly referred to as ⁇ 2 to ⁇ 16, respectively.
  • 16 pixel signals ⁇ 1 to ⁇ 16 are obtained from each pixel block PB (X, Y).
  • the image generation unit 200B calculates four pixel signals ⁇ 1 to ⁇ 4 corresponding to light in each wavelength band ⁇ 1 to ⁇ 4 from the 16 pixel signals ⁇ 1 to ⁇ 16, and eliminates interference. Specifically, four pixel signals ⁇ 1 to ⁇ 4 corresponding to light in each wavelength band ⁇ 1 to ⁇ 4 are calculated by Equation 1 using the following matrix A, and interference is eliminated.
  • the pixel signal ⁇ 1 is a pixel signal corresponding to light in the wavelength band ⁇ 1
  • the pixel signal ⁇ 2 is a pixel signal corresponding to light in the wavelength band ⁇ 2
  • the pixel signal ⁇ 3 is a pixel signal corresponding to light in the wavelength band ⁇ 3, and the pixel signal ⁇ 4.
  • the reason why the interference can be eliminated by the above-mentioned equation 1 will be described.
  • b11 is the ratio of light in the wavelength band ⁇ 1 received by the pixel P1
  • b12 is the ratio of light in the wavelength band ⁇ 2 received by the pixel P1
  • b13 is the ratio of light in the wavelength band ⁇ 3 received by the pixel P1.
  • the ratio, b14 is the ratio at which light in the wavelength band ⁇ 4 is received by the pixel P1.
  • This ratio bij (b11 to b164) sets the wavelength bands ⁇ 1 to ⁇ 4 of the light transmitted by the bandpass filters 50A to 50D of the filter unit 16 and the polarization directions ⁇ 1 to ⁇ 4 of the light transmitted by the windows 24A to 24D.
  • Transmission wavelength characteristics A to D (see FIG. 15) of the pixels P1 to P16 of the image pickup element 100
  • polarization directions ⁇ A to ⁇ C (see FIG. 13) of the light received by the pixels P1 to P16 of the image pickup element 100. It is uniquely determined from and can be obtained in advance.
  • the following relationship is between the pixel signals ⁇ 1 to ⁇ 16 obtained from the pixels P1 to P16 of each pixel block PB (X, Y) and the pixel signals ⁇ 1 to ⁇ 4 corresponding to the light in each wavelength band ⁇ 1 to ⁇ 4. Holds.
  • ⁇ 1 to ⁇ 4 which are the solutions of the simultaneous equations of equations 2 to 17, are calculated by multiplying both sides of equation 18 by the inverse matrix B -1 of the matrix B.
  • the light of each wavelength band ⁇ 1 to ⁇ 4 emitted from the imaging optical system 10 is the light of each pixel P1 of the pixel block PB (X, Y). It can be calculated from the signal values (pixel signals ⁇ 1 to ⁇ 16) of each pixel P1 to P16 based on the ratio of light received by ⁇ P16.
  • the coefficient storage unit 200C stores each element aij of the matrix A for performing the interference removal process as a coefficient group.
  • the image generation unit 200B acquires a coefficient group from the coefficient storage unit 200C, and uses the pixel signals ⁇ 1 to ⁇ 16 obtained from the pixels P1 to P16 of each pixel block PB (X, Y) to obtain each wavelength according to the above equation 1. Pixel signals ⁇ 1 to ⁇ 4 corresponding to the bands ⁇ 1 to ⁇ 4 are calculated, and image data of each wavelength band ⁇ 1 to ⁇ 4 is generated.
  • the image data of each wavelength band ⁇ 1 to ⁇ 4 generated by the image generation unit 200B is output to the outside and stored in a storage device (not shown) as needed. In addition, it is displayed on a display (not shown) as needed.
  • FIG. 18 is a conceptual diagram of image generation by the image pickup apparatus 1.
  • the light incident on the image pickup optical system 10 becomes four types of light having different characteristics and is incident on the image pickup element 100. Specifically, light having a polarization direction ⁇ 1 and a wavelength band ⁇ 1 (first light), light having a polarization direction ⁇ 2 and a wavelength band ⁇ 2 (second light), and light having a polarization direction ⁇ 3 and a wavelength band ⁇ 3 (third light). Light) and (fourth light) in the polarization direction ⁇ 4 and the wavelength band ⁇ 4 are incident on the image pickup device 100.
  • each pixel block PB (X, Y) of the image sensor 100 light in each wavelength band emitted from the image pickup optical system 10 is received in each pixel P1 to P16 at the above-mentioned ratio bij. That is, due to the action of the polarizing filter elements 122A to 122D and the spectroscopic filter elements 132A to 132D provided in the pixels P1 to P16, the light in each wavelength band ⁇ 1 to ⁇ 4 is received at a ratio bij.
  • the signal processing unit 200 has pixel signals ⁇ 1 to ⁇ 4 corresponding to light in each wavelength band ⁇ 1 to ⁇ 4 from pixel signals ⁇ 1 to ⁇ 16 obtained from pixels P1 to P16 of each pixel block PB (X, Y) of the image sensor 100. Is calculated, and image data of each wavelength band ⁇ 1 to ⁇ 4 is generated. That is, arithmetic processing (interference removal processing) according to Equation 1 using the matrix A was performed to correspond to light in each wavelength band ⁇ 1 to ⁇ 4 from the pixel signals ⁇ 1 to ⁇ 16 of the pixels P1 to P16 obtained from the image sensor 100. Pixel signals ⁇ 1 to ⁇ 4 are calculated, and image data of each wavelength band ⁇ 1 to ⁇ 4 is generated.
  • one image pickup optical system 10 and one (single plate) image pickup element 100 are used for images of four different wavelength bands (four-band multispectral image). ) Can be imaged.
  • ⁇ Aberration correction of imaging optical system> In a general imaging optical system, aberrations differ depending on the wavelength. Therefore, even if a general imaging optical system is simply divided into pupils and used for imaging, a multispectral image with good image quality cannot be obtained.
  • the "general imaging optical system” here means an imaging optical system in which aberrations for each wavelength are not particularly corrected, that is, an imaging optical system in which aberrations for each wavelength remain.
  • Patent Document 1 described above, multispectral imaging is enabled by using a polarizing sensor and pupil division, but the aberration of the lens is not discussed, and an ideal lens is assumed. .. Therefore, when a general lens having aberration is applied to the system of Patent Document 1, unexpected aberration may occur and the resolution performance may be deteriorated. On the other hand, in order to design a dedicated lens for the system of Patent Document 1 and suppress aberration, there are restrictions on the number of lenses, the size, the type of glass used, and the like.
  • the image pickup apparatus 1 divides the pupil region of the imaging optical system 10 into a plurality of regions (pupil regions Z1 to Z4) (pupil division), and in each region.
  • the bandpass filters 50A to 50D have a function of individually correcting the aberrations in the regions corresponding to the pupil regions Z1 to Z4. Specifically, by individually adjusting the inclination of each bandpass filter 50A to 50D, the optical path length of the light transmitted through each pupil region Z1 to Z4 is individually adjusted to correct the aberration.
  • the imaging position of the light transmitted through the pupil regions Z1 to Z4 is moved back and forth on the optical axis L, thereby correcting the axial chromatic aberration.
  • the imaging optical system 10 has different aberration characteristics in the regions corresponding to the pupil regions Z1 to Z4.
  • the aberrations in the regions corresponding to the pupil regions Z1 to Z4 can be individually controlled, so that the aberrations can be controlled for each wavelength.
  • good resolving power can be obtained even with a general lens having aberration, and a multispectral image with good image quality can be captured.
  • FIG. 19 is a diagram showing a modified example of the inclination adjusting member.
  • the angle is adjusted by pushing and pulling the inclination adjusting member 30 having a single shape, whereas in the example shown in FIG. 19, a plurality of inclination adjusting members having different shapes are prepared and used properly. So, the angle to adjust is limited.
  • the inclination adjusting members 32 and 34 shown in the portions (a) and 19 (b) of FIG. 19 are provided with slopes 32A and 34A, respectively, and these slopes 32A and 34A come into surface contact with the bandpass filter 50A. This stabilizes the posture of the bandpass filter 50A.
  • a plurality of protrusions for example, three points
  • FIG. 20 is a diagram showing a modified example of the frame body and the fixing member (only one side of the frame body is shown).
  • the portion where the bandpass filters 50A to 50D are installed is the opening 39 (opening).
  • the opening area of the opening 39 can be adjusted by preparing and using a plurality of opening area adjusting members (non-light transmitting) having different shapes. Specifically, in the examples shown in the portions (a) and (b) of FIG. 20, opening area adjusting members 36 and 38 having different shapes are used, respectively, and the opening 39 is formed by these opening area adjusting members 36 and 38. The opening area of is changed.
  • opening area adjusting members 36, 38 can be fixed to other members by using a light-transmitting or non-light-transmitting adhesive.
  • the frame body 60 may be light-transmitting or non-light-transmitting.
  • a polarizing filter can be laminated on the bandpass filters 50A to 50D to form a polarizing portion (see FIG. 22).
  • FIG. 21 is a diagram showing another modification of the inclination adjusting member (only one side of the frame is shown).
  • the rod-shaped member 64 inclination adjusting member
  • the portion (a) in the figure, b) As shown in the portion, the inclination of the bandpass filter 50A with respect to the window portion 24A (slope portion 22) can be adjusted.
  • FIG. 22 is a diagram showing a modified example of the polarizing portion (only one side of the frame is shown).
  • the polarizing portion (see FIG. 3 and the like) is formed by using a wire grid or a slit, but in the example shown in FIG. 22, the polarizing filter 54A is laminated on the bandpass filter 50A to form the window portion. It is a polarizing part for 24A. As in the case of using the wire grid or the slit, the direction of polarization is different from that of the bandpass filters 50A to 50D.
  • the filter unit 16 corresponds to four wavelength bands and four polarization directions is described, but the wavelength bands and the polarization directions may be different numbers.
  • the bandpass filters 50A to 50D for example, the bandpass filter 50D
  • the above-mentioned filter unit 16 can correspond to three wavelength bands (bandpass filters 50A to 50A to). Two of 50C may be installed).
  • the filter unit 16 is made to correspond to the three polarization directions. Can be done. Further, three wavelength bands and three polarization directions may be realized by shielding any of the windows 24A to 24D. Further, three windows may be formed on the frame body.
  • the image sensor may be a color image sensor having a spectroscopic filter element array layer as in the first embodiment, or a monochrome image sensor having no spectroscopic filter element array layer.
  • the combination of the number of wavelength bands and the number of polarization directions of the optical filter and the number of spectra and the number of polarization directions of the image sensor depends on "how many wavelengths of an image you want to acquire (the number of spectra of the image to be acquired)". Can be decided.
  • the selective light receiving may be realized by other means.
  • a microlens is provided for each pixel, and a light-shielding mask with a part opened on the light-receiving surface of the image sensor is provided, and this mask receives light transmitted through one of the pupil regions and transmits the other pupil region. It is also possible to block the light.
  • the slope portion 22, the window portions 24A to 24D, and the bandpass filters 50A to 50D are rectangular, but other shapes such as a polygon, a circle, and a fan shape other than the rectangle may be used.
  • the light amount of each wavelength band is adjusted by adjusting the aperture area, but the light amount is adjusted by using a neutral density filter such as an ND filter (ND: Neutral Density). May be good. In this case, the dimming degree of the ND filter may be changed depending on the wavelength band.
  • ND Neutral Density
  • Imaging device 10 Imaging optical system 12 Lens 16 Filter unit 20 Frame 21 Optical axis center 22 Slope 24A Window 24B Window 24C Window 24D Window 26 Wall 28 Insertion port 30 Tilt adjustment member 30A Slope 32 Tilt adjustment member 32A Slope 34 Inclined adjustment member 34A Slope 36 Opening area adjusting member 38 Opening area adjusting member 39 Opening 40 Polarizing film 42 Wire 50A Bandpass filter 50B Bandpass filter 50C Bandpass filter 50D Bandpass filter 52 Adhesive 52A Filling line 52B Filling line 52C Filling line 54A Polarizing filter 62 Frame 64 Rod-shaped member 100 Imaging element 110 Pixel array layer 112 Photo diode 120 Polarizing filter element Array layer 122A Polarizing filter element 122B Polarizing filter element 122C Polarizing filter element 122D Polarizing filter element 130 Spectral filter element Array layer 132A Spectral filter element 132B Spectral filter element 132C Spectral filter element 132D Spectral filter element 140 Microlens array layer 142 Microlens 200 Signal processing

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PCT/JP2020/036172 2019-09-27 2020-09-25 光学素子、光学装置、撮像装置、及び光学素子の製造方法 Ceased WO2021060434A1 (ja)

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003195136A (ja) * 2001-12-26 2003-07-09 Alps Electric Co Ltd 光学フィルタ付き枠体及びその製造方法
JP2005260480A (ja) * 2004-03-10 2005-09-22 Olympus Corp マルチスペクトル画像撮影装置及びアダプタレンズ
WO2012169136A1 (ja) * 2011-06-06 2012-12-13 パナソニック株式会社 色分離フィルタアレイ、固体撮像素子、撮像装置、および表示装置
JP2013072771A (ja) * 2011-09-28 2013-04-22 Topcon Corp スペクトル画像取得装置
JP2015017834A (ja) * 2013-07-09 2015-01-29 株式会社リコー 測定装置及び測定方法

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH088157A (ja) * 1994-06-16 1996-01-12 Nikon Corp 投影露光装置
US7554596B2 (en) * 2001-04-13 2009-06-30 The Trustees Of Columbia University In The City Of New York Method and apparatus for recording a sequence of images using a moving optical element
JP2003262781A (ja) * 2002-03-08 2003-09-19 Konica Corp 画像記録装置におけるミラー角度調整機構
WO2005046248A1 (ja) * 2003-11-11 2005-05-19 Olympus Corporation マルチスペクトル画像撮影装置
WO2009104394A1 (ja) * 2008-02-18 2009-08-27 パナソニック株式会社 複眼カメラモジュール
JP2010122183A (ja) * 2008-11-21 2010-06-03 Sanyo Electric Co Ltd 物体検出装置および情報取得装置
JP5649990B2 (ja) * 2010-12-09 2015-01-07 シャープ株式会社 カラーフィルタ、固体撮像素子、液晶表示装置および電子情報機器
US9658463B2 (en) * 2012-02-03 2017-05-23 Panasonic Intellectual Property Management Co., Ltd. Imaging device and imaging system
JP6124079B2 (ja) 2012-08-02 2017-05-10 パナソニックＩｐマネジメント株式会社 偏光カラー撮像装置
US9219866B2 (en) * 2013-01-07 2015-12-22 Ricoh Co., Ltd. Dynamic adjustment of multimode lightfield imaging system using exposure condition and filter position
EP3067672B1 (en) * 2013-12-13 2018-08-22 Konica Minolta, Inc. Spectroscopic unit and spectroscopic device using same
CN205374966U (zh) * 2015-12-31 2016-07-06 中国华录集团有限公司 一种投影光学系统及投影仪
CN205563060U (zh) * 2015-12-31 2016-09-07 中国华录集团有限公司 一种反射镜调整结构及投影光学系统
JP2017201652A (ja) * 2016-05-02 2017-11-09 住友電気工業株式会社 光モジュール
JP6332347B2 (ja) * 2016-07-08 2018-05-30 住友電気工業株式会社 光モジュール
US20180195902A1 (en) * 2017-01-09 2018-07-12 Michigan Aerospace Corporation Titled filter imaging spectrometer

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003195136A (ja) * 2001-12-26 2003-07-09 Alps Electric Co Ltd 光学フィルタ付き枠体及びその製造方法
JP2005260480A (ja) * 2004-03-10 2005-09-22 Olympus Corp マルチスペクトル画像撮影装置及びアダプタレンズ
WO2012169136A1 (ja) * 2011-06-06 2012-12-13 パナソニック株式会社 色分離フィルタアレイ、固体撮像素子、撮像装置、および表示装置
JP2013072771A (ja) * 2011-09-28 2013-04-22 Topcon Corp スペクトル画像取得装置
JP2015017834A (ja) * 2013-07-09 2015-01-29 株式会社リコー 測定装置及び測定方法

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