WO2020215739A1 - 一种纳米金属膜模块制备方法及其基板制备方法 - Google Patents
一种纳米金属膜模块制备方法及其基板制备方法 Download PDFInfo
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- WO2020215739A1 WO2020215739A1 PCT/CN2019/123826 CN2019123826W WO2020215739A1 WO 2020215739 A1 WO2020215739 A1 WO 2020215739A1 CN 2019123826 W CN2019123826 W CN 2019123826W WO 2020215739 A1 WO2020215739 A1 WO 2020215739A1
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- WIPO (PCT)
- Prior art keywords
- nano
- metal
- metal film
- film module
- nano metal
- Prior art date
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- 229910052751 metal Inorganic materials 0.000 title claims abstract description 111
- 239000002184 metal Substances 0.000 title claims abstract description 111
- 239000000758 substrate Substances 0.000 title claims abstract description 61
- 238000002360 preparation method Methods 0.000 title abstract description 21
- 239000002923 metal particle Substances 0.000 claims abstract description 49
- 239000002002 slurry Substances 0.000 claims abstract description 30
- 238000007639 printing Methods 0.000 claims abstract description 15
- 238000001035 drying Methods 0.000 claims abstract description 12
- 238000004806 packaging method and process Methods 0.000 claims abstract description 5
- 238000000034 method Methods 0.000 claims description 55
- 239000000463 material Substances 0.000 claims description 38
- 229910052802 copper Inorganic materials 0.000 claims description 36
- 239000010949 copper Substances 0.000 claims description 36
- 239000000919 ceramic Substances 0.000 claims description 35
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 29
- 230000008569 process Effects 0.000 claims description 26
- 239000010410 layer Substances 0.000 claims description 18
- 229910000679 solder Inorganic materials 0.000 claims description 14
- 238000007650 screen-printing Methods 0.000 claims description 12
- 239000011521 glass Substances 0.000 claims description 11
- 239000000654 additive Substances 0.000 claims description 10
- 239000011195 cermet Substances 0.000 claims description 9
- 238000013461 design Methods 0.000 claims description 9
- 239000012298 atmosphere Substances 0.000 claims description 8
- 238000000576 coating method Methods 0.000 claims description 8
- 238000003698 laser cutting Methods 0.000 claims description 8
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 7
- 230000000996 additive effect Effects 0.000 claims description 7
- 239000004332 silver Substances 0.000 claims description 7
- 239000002356 single layer Substances 0.000 claims description 7
- 229910001252 Pd alloy Inorganic materials 0.000 claims description 6
- AHGIVYNZKJCSBA-UHFFFAOYSA-N [Ti].[Ag].[Cu] Chemical compound [Ti].[Ag].[Cu] AHGIVYNZKJCSBA-UHFFFAOYSA-N 0.000 claims description 6
- 229910052709 silver Inorganic materials 0.000 claims description 6
- 229910052719 titanium Inorganic materials 0.000 claims description 6
- 239000010936 titanium Substances 0.000 claims description 6
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 5
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 5
- 239000011248 coating agent Substances 0.000 claims description 5
- 238000002156 mixing Methods 0.000 claims description 5
- 229910052760 oxygen Inorganic materials 0.000 claims description 5
- 239000001301 oxygen Substances 0.000 claims description 5
- 229910001316 Ag alloy Inorganic materials 0.000 claims description 4
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 4
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 4
- 239000011888 foil Substances 0.000 claims description 4
- 229910052738 indium Inorganic materials 0.000 claims description 4
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 4
- 239000003960 organic solvent Substances 0.000 claims description 4
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims description 4
- 239000002904 solvent Substances 0.000 claims description 4
- 229910052718 tin Inorganic materials 0.000 claims description 4
- 229910000990 Ni alloy Inorganic materials 0.000 claims description 3
- PQJKKINZCUWVKL-UHFFFAOYSA-N [Ni].[Cu].[Ag] Chemical compound [Ni].[Cu].[Ag] PQJKKINZCUWVKL-UHFFFAOYSA-N 0.000 claims description 3
- 239000000853 adhesive Substances 0.000 claims description 3
- 230000001070 adhesive effect Effects 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 3
- YCKOAAUKSGOOJH-UHFFFAOYSA-N copper silver Chemical compound [Cu].[Ag].[Ag] YCKOAAUKSGOOJH-UHFFFAOYSA-N 0.000 claims description 3
- 238000001704 evaporation Methods 0.000 claims description 3
- 230000008020 evaporation Effects 0.000 claims description 3
- 238000005242 forging Methods 0.000 claims description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 239000010931 gold Substances 0.000 claims description 3
- BBKFSSMUWOMYPI-UHFFFAOYSA-N gold palladium Chemical compound [Pd].[Au] BBKFSSMUWOMYPI-UHFFFAOYSA-N 0.000 claims description 3
- 238000000227 grinding Methods 0.000 claims description 3
- 238000003760 magnetic stirring Methods 0.000 claims description 3
- 239000002105 nanoparticle Substances 0.000 claims description 3
- 229920000620 organic polymer Polymers 0.000 claims description 3
- 238000003756 stirring Methods 0.000 claims description 3
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 2
- 241000533950 Leucojum Species 0.000 claims description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims description 2
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 claims description 2
- PQIJHIWFHSVPMH-UHFFFAOYSA-N [Cu].[Ag].[Sn] Chemical compound [Cu].[Ag].[Sn] PQIJHIWFHSVPMH-UHFFFAOYSA-N 0.000 claims description 2
- DICWILYNZSJYMQ-UHFFFAOYSA-N [In].[Cu].[Ag] Chemical compound [In].[Cu].[Ag] DICWILYNZSJYMQ-UHFFFAOYSA-N 0.000 claims description 2
- 125000003158 alcohol group Chemical group 0.000 claims description 2
- CSDREXVUYHZDNP-UHFFFAOYSA-N alumanylidynesilicon Chemical compound [Al].[Si] CSDREXVUYHZDNP-UHFFFAOYSA-N 0.000 claims description 2
- WPPDFTBPZNZZRP-UHFFFAOYSA-N aluminum copper Chemical compound [Al].[Cu] WPPDFTBPZNZZRP-UHFFFAOYSA-N 0.000 claims description 2
- -1 aluminum silicon copper Chemical compound 0.000 claims description 2
- 230000003064 anti-oxidating effect Effects 0.000 claims description 2
- 229910052787 antimony Inorganic materials 0.000 claims description 2
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 claims description 2
- 239000011230 binding agent Substances 0.000 claims description 2
- 229910052797 bismuth Inorganic materials 0.000 claims description 2
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 claims description 2
- 229910000416 bismuth oxide Inorganic materials 0.000 claims description 2
- 229910052810 boron oxide Inorganic materials 0.000 claims description 2
- KOPBYBDAPCDYFK-UHFFFAOYSA-N caesium oxide Chemical compound [O-2].[Cs+].[Cs+] KOPBYBDAPCDYFK-UHFFFAOYSA-N 0.000 claims description 2
- 229910001942 caesium oxide Inorganic materials 0.000 claims description 2
- BRPQOXSCLDDYGP-UHFFFAOYSA-N calcium oxide Chemical compound [O-2].[Ca+2] BRPQOXSCLDDYGP-UHFFFAOYSA-N 0.000 claims description 2
- 239000000292 calcium oxide Substances 0.000 claims description 2
- ODINCKMPIJJUCX-UHFFFAOYSA-N calcium oxide Inorganic materials [Ca]=O ODINCKMPIJJUCX-UHFFFAOYSA-N 0.000 claims description 2
- 229910052799 carbon Inorganic materials 0.000 claims description 2
- 238000005520 cutting process Methods 0.000 claims description 2
- TYIXMATWDRGMPF-UHFFFAOYSA-N dibismuth;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Bi+3].[Bi+3] TYIXMATWDRGMPF-UHFFFAOYSA-N 0.000 claims description 2
- JKWMSGQKBLHBQQ-UHFFFAOYSA-N diboron trioxide Chemical compound O=BOB=O JKWMSGQKBLHBQQ-UHFFFAOYSA-N 0.000 claims description 2
- 230000005684 electric field Effects 0.000 claims description 2
- RHZWSUVWRRXEJF-UHFFFAOYSA-N indium tin Chemical compound [In].[Sn] RHZWSUVWRRXEJF-UHFFFAOYSA-N 0.000 claims description 2
- 239000000395 magnesium oxide Substances 0.000 claims description 2
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 claims description 2
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 claims description 2
- WPBNNNQJVZRUHP-UHFFFAOYSA-L manganese(2+);methyl n-[[2-(methoxycarbonylcarbamothioylamino)phenyl]carbamothioyl]carbamate;n-[2-(sulfidocarbothioylamino)ethyl]carbamodithioate Chemical compound [Mn+2].[S-]C(=S)NCCNC([S-])=S.COC(=O)NC(=S)NC1=CC=CC=C1NC(=S)NC(=O)OC WPBNNNQJVZRUHP-UHFFFAOYSA-L 0.000 claims description 2
- 239000011733 molybdenum Substances 0.000 claims description 2
- 239000012299 nitrogen atmosphere Substances 0.000 claims description 2
- SIWVEOZUMHYXCS-UHFFFAOYSA-N oxo(oxoyttriooxy)yttrium Chemical compound O=[Y]O[Y]=O SIWVEOZUMHYXCS-UHFFFAOYSA-N 0.000 claims description 2
- 229910052698 phosphorus Inorganic materials 0.000 claims description 2
- 239000011574 phosphorus Substances 0.000 claims description 2
- 239000010703 silicon Substances 0.000 claims description 2
- 229910052710 silicon Inorganic materials 0.000 claims description 2
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 2
- KKCBUQHMOMHUOY-UHFFFAOYSA-N sodium oxide Chemical compound [O-2].[Na+].[Na+] KKCBUQHMOMHUOY-UHFFFAOYSA-N 0.000 claims description 2
- 229910001948 sodium oxide Inorganic materials 0.000 claims description 2
- 238000005507 spraying Methods 0.000 claims description 2
- 239000011135 tin Substances 0.000 claims description 2
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 claims description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 2
- 229910052721 tungsten Inorganic materials 0.000 claims description 2
- 239000010937 tungsten Substances 0.000 claims description 2
- 239000011787 zinc oxide Substances 0.000 claims description 2
- 229910052726 zirconium Inorganic materials 0.000 claims description 2
- 229910001182 Mo alloy Inorganic materials 0.000 claims 1
- 239000000969 carrier Substances 0.000 claims 1
- 230000000694 effects Effects 0.000 abstract description 5
- 230000017525 heat dissipation Effects 0.000 abstract description 5
- 239000002699 waste material Substances 0.000 abstract description 5
- 239000002245 particle Substances 0.000 description 19
- 238000005219 brazing Methods 0.000 description 7
- 238000005245 sintering Methods 0.000 description 5
- 238000003860 storage Methods 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 3
- 239000012528 membrane Substances 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 238000012546 transfer Methods 0.000 description 3
- 238000003466 welding Methods 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 230000002708 enhancing effect Effects 0.000 description 2
- 230000005496 eutectics Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- SWELZOZIOHGSPA-UHFFFAOYSA-N palladium silver Chemical compound [Pd].[Ag] SWELZOZIOHGSPA-UHFFFAOYSA-N 0.000 description 2
- 230000002265 prevention Effects 0.000 description 2
- DAFHKNAQFPVRKR-UHFFFAOYSA-N (3-hydroxy-2,2,4-trimethylpentyl) 2-methylpropanoate Chemical compound CC(C)C(O)C(C)(C)COC(=O)C(C)C DAFHKNAQFPVRKR-UHFFFAOYSA-N 0.000 description 1
- CRWNQZTZTZWPOF-UHFFFAOYSA-N 2-methyl-4-phenylpyridine Chemical compound C1=NC(C)=CC(C=2C=CC=CC=2)=C1 CRWNQZTZTZWPOF-UHFFFAOYSA-N 0.000 description 1
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 238000007792 addition Methods 0.000 description 1
- JRBRVDCKNXZZGH-UHFFFAOYSA-N alumane;copper Chemical compound [AlH3].[Cu] JRBRVDCKNXZZGH-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 239000011889 copper foil Substances 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000003137 locomotive effect Effects 0.000 description 1
- 239000011812 mixed powder Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 239000006259 organic additive Substances 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000005382 thermal cycling Methods 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4846—Leads on or in insulating or insulated substrates, e.g. metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4846—Leads on or in insulating or insulated substrates, e.g. metallisation
- H01L21/4867—Applying pastes or inks, e.g. screen printing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49866—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers characterised by the materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/8384—Sintering
Definitions
- the invention relates to the field of chip packaging interconnection, and more specifically to the preparation technology of a composite substrate.
- semiconductor devices In the semiconductor fields such as power electronics and optoelectronic communications, semiconductor devices often need to carry extreme conditions such as high voltage, high current, high switching speed, and high operating temperature during operation. With the continuous recording of operating voltage and current of power devices in recent years Refreshing, as well as the continuous reduction of chip size, the power density of the power device as a whole will increase dramatically, which poses new challenges to the various components of the chip package. As the part that is in direct contact with the chip, the substrate plays a variety of functions such as mechanical support, conductive interconnection, heat dissipation management, and breakdown prevention, and its development is closely related to the performance of the chip.
- the mainstream solutions for preparing cermet substrates currently mainly include: direct copper coating (DCB or DBC) and active metal brazing (AMB).
- DCB direct copper coating
- AMB active metal brazing
- the DCB process uses the eutectic reaction of copper and aluminum oxide at low oxygen concentration (less than 5ppm) and about 1065°C to form a eutectic phase at the interface to achieve cermet connection.
- the DCB process is relatively simple, but the disadvantage is that the process temperature is too high, and there is a large difference in thermal expansion coefficient between copper and aluminum oxide, which makes the metal-ceramic interface produce large thermal stress and cause cracks during the preparation process and use process Risks: At the same time, the thermal conductivity, bending strength, and fracture toughness of alumina materials are relatively poor, which makes it unsuitable for future automotive electronics, electric locomotives and smart grid applications.
- the AMB process uses active metal solder to weld metal and ceramics together under vacuum or protective atmosphere conditions. This process improves the strength of the cermet connecting layer, and through the use of titanium-containing brazing material, it is possible to weld copper and silicon nitride ceramics with higher performance.
- vacuum conditions are indispensable, which limits its application in mass production.
- the metal-ceramic substrate plays a variety of functions such as mechanical support, conductive interconnection, heat dissipation management and prevention of breakdown, which directly affects the performance and working life of the device.
- Copper-ceramic substrates have been widely used in the power electronics industry because they combine the high electrical conductivity, high thermal conductivity, and low cost characteristics of copper, as well as the high dielectric coefficient and high fracture toughness of ceramics. Among them, the process of using thick film to prepare cermet substrates is widely used due to its ease of operation, design flexibility, and material saving.
- the first prior art is a patent application with a patent publication number of US2005/0051253A, which discloses a ceramic substrate directly coated with a plurality of metal conductive coatings. A ceramic paste is printed between these metal coatings to fill the gaps between the metal conductive coatings.
- the second prior art is a patent application with a patent publication number of US2004/0163555A, which discloses a ceramic substrate with a metal conductive coating, in which a ceramic slurry is additionally used to fill the gap between the circuits formed by the metal conductive coating. The corresponding ceramic slurry is prepared by mixing ceramic powder with an organic carrier.
- the third prior art is a patent application with a patent publication number EP3419390A1, which discloses a bonding process in which a conductive copper paste is used as a connecting layer between a copper foil and a ceramic, in which glass etc. are used as bonding auxiliary additives.
- organic additives and solvents will volatilize, causing the copper paste to form a dense copper layer.
- the glass additive will reach the metal-ceramic interface through diffusion or flow, and wet the two surfaces to form a bond. Through this process, the reliability of thermal cycling has been improved more than ten times.
- the above-mentioned copper-clad substrate preparation process is limited by the process on the one hand, and the steps of printing, drying, and baking must be performed continuously and uninterrupted; and the thick copper substrate preparation unit needs to constantly purchase new printing screens to meet the needs of its pattern design update. The old design screen will produce unnecessary waste.
- the present invention provides a nano metal film module, including:
- the nano metal auxiliary connection module includes first metal particles and second metal particles, and the first metal particles and the second metal particles have different diameters.
- the diameter of the first metal particles is 0.1 um-100 ⁇ m; the diameter of the second metal particles is 0.5 nm-100 nm.
- the nano-metal auxiliary connection module is continuous or discontinuous discretely arranged small pieces; the nano-metal auxiliary connection module has a single-layer, double-layer, three-layer or multi-layer structure.
- the thickness of the nano-metal auxiliary connection module is 1 micrometer to 500 micrometers in thickness.
- the nano metal film module further includes a connection auxiliary additive, an organic carrier and a solvent.
- the first metal particles account for 45wt.% to 95wt.% of the auxiliary module material; the second metal particles account for 5wt.% to 55wt.% of the auxiliary layer material; the connection auxiliary additive accounts for auxiliary 0.1wt% to 9.9wt% of the layer material.
- the materials of the first metal particles and the second metal particles are: three-group elements including aluminum and indium, four-group elements including carbon, silicon, tin, and lead, and five-group elements including phosphorus, bismuth, and antimony.
- connection auxiliary additive includes: a glass or ceramic phase composed of bismuth oxide, silicon oxide, aluminum oxide, calcium oxide, sodium oxide, cesium oxide, yttrium oxide, zinc oxide, magnesium oxide, boron oxide, and titanium oxide; or/and includes : Silver, copper, titanium, tin, indium, lead.
- the shapes of the first metal particles and the second metal particles are spherical, fibrous, snowflake, flake, and/or linear.
- the base material and the nano-metal auxiliary connection module have weak adhesion or no adhesion at all.
- a method for preparing a nano metal film module includes:
- Step 1 Use micron-level metal particles or micron/nano-level mixed metal particles to configure the metal solder slurry
- Step 2 Printing the metal paste on the substrate to form a thick film
- Step 3 Form a thick film preform by screen printing or laser cutting
- Step 4 Spraying or packaging the thick film preform by anti-oxidation.
- the configuration method of step 1 is:
- the second metal particles are mixed into the first paste by a mechanical mixing method;
- the mechanical mixing method is to prepare the metal slurry by magnetic stirring, vacuum defoaming, and evaporation;
- the substrate is a carbonized glass, ceramic, metal, or organic polymer substrate.
- the step 2 includes:
- Step 2.1 Design the printing screen according to the shape and size of the required discrete preforms
- Step 2.2 Print the paste on the substrate by screen printing.
- the step 2 includes:
- the step 3 is: cutting the thick film prefabricated module by laser cutting or forging.
- the screen is a screen printed with a non-specific area metal film.
- the metal slurry in step 1 includes first metal particles, second metal particles, connection auxiliary additives, organic vehicles and solvents.
- the step 1 further includes a metal slurry pretreatment process, and the metal slurry pretreatment process includes:
- the metal slurry is processed by defoaming, stirring, and grinding methods.
- the step 3 also includes a drying process.
- the drying process is: the drying temperature is 100-150°C and the duration is 5-30 minutes.
- a method for preparing a substrate using a nano metal film module includes:
- Step 1 Coating adhesive on the bottom of the nano metal film module
- Step 2 Place the nano metal film module on a substrate
- Step 3 Place metal foil on the surface of the nano metal film module
- Step 4 Bake according to the set temperature curve and atmosphere
- Step 5 Cool to form a metal-clad substrate.
- the binder is alcohol or an organic solvent
- the substrate is a ceramic substrate.
- At least one nano metal film module is distributed on at least one surface of the substrate
- the set temperature curve is: a peak temperature of 400-900°C, and a duration of 30 seconds to 30 minutes; the atmosphere is: a nitrogen atmosphere or a reducing atmosphere with an oxygen content of less than 6ppm
- the method for preparing the nano metal film module and the substrate preparation method provided by the present invention can be customized and updated from the preform manufacturer according to the requirements, avoiding the waste generated by the new screen, and improving thermal stability, heat dissipation efficiency, and The technical effect of bonding strength and improving package reliability.
- Fig. 1 is a schematic diagram of the process of preparing a cermet substrate using the nano metal membrane module of the present invention.
- Figure 2 is a flow chart of the preparation and application of the nano metal film module of the present invention.
- Fig. 3 is a schematic diagram of the single-layer prefabricated module of the present invention and its preparation process.
- Discrete multi-position storage box 1 unused nano metal film module 2, nano metal film module 3 to be connected, ceramic substrate 4, metal foil 5, connecting layer 6 formed after baking, first material Metal paste 7, first material particles 8, nanoparticle generator 9, electric or magnetic field 10, second material particles 10, mixed paste 11, printing squeegee 12, printing screen (A) 13, printing screen (B ) 14, non-adhesive substrate 15, discrete prefabricated module 16, to be cut prefabricated module 17, laser 18
- This embodiment provides a single-layer prefabricated module structure and a preparation method thereof, as shown in FIGS. 2 and 3.
- the first material is silver copper titanium active brazing material
- the second material is nano copper particles.
- the preparation method is:
- solder is screen printed on a non-sticky carbonized glass carrier through a specific pattern to form a separate prefabricated module to be dried;
- the final prefabricated module is formed by drying the thick film.
- the use of small-size nano-copper particles mixed with the first material effectively reduces the welding temperature; secondly, the small-size nano-copper particles effectively fill the original gaps between the first material particles, which can effectively improve the The density of the connection auxiliary layer during segment welding.
- This embodiment provides a single-layer prefabricated module structure and a preparation method thereof, as shown in FIGS. 2 and 3.
- the main body (first material) is silver copper titanium active brazing material slurry
- the second material is nano copper particles.
- the preparation method is:
- solder is screen printed with a specific pattern onto a non-sticky carbonized glass carrier to form a complete prefabricated module to be dried;
- a laser is used to cut a complete prefabricated module to form a discrete module with a specific shape and size. Compared with the traditional screen printing process, it has a higher degree of design freedom.
- This embodiment provides a multilayer prefabricated module structure and a preparation method thereof.
- a slurry containing large-size metal particles and a slurry containing small-size nano copper particles are sequentially printed on the surface of a non-sticky substrate to form a stack A prefabricated module with a layer structure; the large and small metal particles in the multi-layer material of the module will merge with each other along with the diffusion phenomenon in the subsequent welding metal-ceramic substrate process, and fill the gaps with each other, thereby increasing the density of the auxiliary layer and increasing Connection strength.
- the first material also includes gold, palladium, silver, copper, aluminum, silver-palladium alloy, gold-palladium alloy, copper-silver alloy, copper-silver-nickel alloy Or copper-aluminum alloy.);
- step 4) Printing the second material slurry on the surface of the first slurry in step 3) using screen printing technology; drying;
- This embodiment provides a method for preparing a metal-ceramic substrate using a prefabricated module, and the steps for preparing a metal-clad substrate by using the nano metal film module are shown in FIG. 1:
- Cooling system to form a metal-ceramic substrate.
- the organic solvent will be completely volatilized during the baking process.
- the baking process parameters can be set to the peak temperature of 400 ⁇ 900°C, 30 seconds to 10 minutes) and nitrogen (control the oxygen content below 6ppm) atmosphere bake.
- the combination of nano-copper + micro-copper reduces the overall average particle size of the copper material, thereby achieving the effect of reducing the sintering temperature.
- the traditional sintering temperature is 900-1100°C, while the sintering temperature of the present invention is 400 ⁇ 900°C; on the other hand, the nano-copper particles will be uniformly mixed with the micron copper in the copper paste, so that the voids generated by the original micron copper paste will be filled during sintering, thereby increasing the density of the sintered copper layer.
- the invention provides a nano metal film module and a preparation method thereof:
- the metal solder connection auxiliary layer is improved from the traditional "slurry” state to the "prefabricated module” state, which is easy to store; the metal solder connection auxiliary layer has a use effect similar to "double-sided tape", which can be taken and used at any time .
- the nano metal membrane module can be customized and designed according to requirements, its shape, size, material matching, etc., through the implementation of this scheme, avoid the disadvantages of the traditional metal ceramic connection process that must be performed continuously, and have a high degree of freedom in use.
- the complete metal solder film is cut to form a prefab module by using laser cutting, forging, etc., which can avoid the waste of buying a new printing screen; the metal ceramic substrate preparation unit can also customize the prefab from the nano metal film module manufacturer according to demand , which simplifies the complexity of production.
- the present invention uses metal particles with a mixture of large and small sizes to fill the gaps of the particles that originally existed.
- the specific selection of the size of the larger and smaller particles of the nano metal particles of the present invention is not possible with the combination of other diameter size metal particles.
- the present invention improves the density after soldering, so that the metal solder connection aid of the present invention has the technical effects of improving thermal stability, enhancing heat dissipation efficiency, enhancing bonding strength and improving packaging reliability.
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- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Ceramic Engineering (AREA)
- Powder Metallurgy (AREA)
- Laminated Bodies (AREA)
- Manufacturing Of Printed Wiring (AREA)
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Abstract
Description
Claims (23)
- 一种纳米金属膜模块,其特征在于,包括:纳米金属辅助连接模块,基底,所述纳米金属辅助连接模块包括第一金属颗粒、第二金属颗粒,所述第一金属颗粒与所述第二金属颗粒直径不同。
- 根据权利要求1所述纳米金属膜模块,其特征在于,所述第一金属颗粒直径为0.1μm~100μm;所述第二金属颗粒直径为0.5nm~100nm。
- 根据权利要求1所述纳米金属膜模块,其特征在于,所述纳米金属辅助连接模块是连续式,或,非连续式的离散排布的小块;所述纳米金属辅助连接模块具有单层、双层、三层或多层结构。
- 根据权利要求1所述纳米金属膜模块,其特征在于,所述纳米金属辅助连接模块厚度为:1μm~500μm厚度。
- 根据权利要求1所述纳米金属膜模块,其特征在于,所述纳米金属膜模块还包括连接辅助添加剂、有机载体和溶剂。
- 根据权利要求1所述纳米金属膜模块,其特征在于,所述第一金属颗粒,占有辅助模块材料的45wt.%~95wt.%;所述第二金属颗粒,占有辅助层材料的5wt.%~55wt.%;所述连接辅助添加剂占有辅助层材料的0.1wt%~9.9wt%。
- 根据权利要求1所述纳米金属膜模块,其特征在于,所述第一金属颗粒及所述第二金属颗粒材料为:包括铝、铟的三族元素,包括碳、硅、锡、铅的四族元素,包括磷、铋、锑的五族元素,包括铜、金、银的第一副族;包括钛、锆的第四副族,包括锰、钨、钼的第六副族,银钯合金、金钯合金、铜银合金、铜银镍合金、银铜钛、银铜铟、银铜锡、铝硅铜、铝硅、铝铜、铟锡;所述连接辅助添加剂为:氧化铋、氧化硅、氧化铝、氧化钙、氧化钠、氧化铯、氧化钇、氧化锌、氧化镁、氧化硼、氧化钛组成的玻璃或陶瓷相;或/和包括:银、铜、钛、锡、铟、铅;所述基底材料为:碳化玻璃、陶瓷、金属、或有机聚合基材。
- 根据权利要求1所述纳米金属膜模块,其特征在于,所述第一金属颗粒及所述第二金属颗粒形状为:球型、纤维状、雪花状、片状和/或线状形状;
- 根据权利要求1所述纳米金属膜模块,其特征在于,所述基底材料与所述纳米金属辅助连接模块有微弱粘结力、或完全无粘结力。
- 一种纳米金属膜模块的制备方法,其特征在于,包括:步骤1:采用微米级金属颗粒或微米/纳米级混合金属颗粒配置金属焊料的浆料;步骤2:将所述金属浆料印制在基底上,形成厚膜;步骤3:通过丝网印刷方式或激光切割方式,形成厚膜预制件;步骤4:通过防氧化喷涂或包装所述厚膜预制件。
- 根据权利要求10所述纳米金属膜模块的制备方法,其特征在于,所述步骤1的配置方法为:采用机械混合的方法将第二金属颗粒混入第一膏体;所述机械混合方法为通过磁力搅拌、真空去泡,蒸发制备所述金属浆料;或,利用电场、磁场或气流给第二纳米金属颗粒赋予动能,以物理冲击方式将第二纳米金属颗粒打入所述第一膏体,填充第一膏体中第一金属颗粒之间的间隙,形成多尺寸纳米颗粒混合的金属浆料。
- 根据权利要求10所述纳米金属膜模块的制备方法,其特征在于,所述基底为碳化玻璃、陶瓷、金属、或有机聚合基材。
- 根据权利要求10所述纳米金属膜模块的制备方法,其特征在于,通过丝网印刷方式,所述步骤2包括:步骤2.1:根据所需离散型预制件的形状、尺寸设计印刷丝网;步骤2.2:将所述浆料通过丝网印刷方式印制在所述基底上。
- 根据权利要求10所述纳米金属膜模块的制备方法,其特征在于,通过激光切割方式,所述步骤2包括:将所述浆料通过丝网印制在所述基底上;所述步骤3为:激光切割或锻压方式切割所述厚膜预制模块。
- 根据权利要求14所述纳米金属膜模块的制备方法,其特征在于,所述丝网为印制非特定面积金属膜的丝网。
- 根据权利要求10所述纳米金属膜模块的制备方法,其特征在于,所述步骤1的金属浆料包含第一金属颗粒、第二金属颗粒、连接辅助添加剂、有机载体和溶剂。
- 根据权利要求10所述纳米金属膜模块的制备方法,其特征在于,所述步骤1还包括金属浆料预处理过程,所述金属浆料预处理过程包括:使用脱泡、搅拌、研磨方式处理所述金属浆料。
- 根据权利要求10所述纳米金属膜模块的制备方法,其特征在于,所述步骤3还包括干燥过程。
- 根据权利要求18所述纳米金属膜模块的制备方法,其特征在于,所述干燥过程为:干燥温度100~150℃,持续时间5~30分钟。
- 一种使用权利要求1-9所述纳米金属膜模块的基板制备方法,其特征在于,包括:步骤1:将所述纳米金属膜模块底部涂覆粘结剂;步骤2:将所述纳米金属膜模块置于基板上;步骤3:在纳米金属膜模块表面放置金属箔;步骤4:按照设定温度曲线和气氛烘烤;步骤5:冷却形成覆金属基板。
- 根据权利要求20所述使用所述纳米金属膜模块的制备金属陶瓷基板的方法,其特征在于,所述粘结剂为酒精或有机溶剂;所述基板为陶瓷基板。
- 根据权利要求20所述使用所述纳米金属膜模块的制备金属陶瓷基板的方法,其特征在于,所述步骤2中,所述基板上的至少一面分布至少一个所述纳米金属膜模块。
- 根据权利要求20所述厚使用所述纳米金属膜模块的制备金属陶瓷基板的方法,其特征在于,所述设定温度曲线为:峰值温度400~900℃,持续时间30秒~30分钟;所述气氛为:含氧量低于6ppm氧气含量的氮气气氛或还原性气氛。
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CN112440025B (zh) * | 2019-09-02 | 2022-02-18 | 清华大学 | 用于电子器件的双面微纳复合预成型焊片及低温互连方法 |
CN111415918B (zh) * | 2020-03-06 | 2022-01-25 | 深圳第三代半导体研究院 | 一种基于反应性膜的互连方法 |
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