WO2020143430A1 - 触控面板、触控模组及触控面板裂纹检测方法 - Google Patents

触控面板、触控模组及触控面板裂纹检测方法 Download PDF

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Publication number
WO2020143430A1
WO2020143430A1 PCT/CN2019/127169 CN2019127169W WO2020143430A1 WO 2020143430 A1 WO2020143430 A1 WO 2020143430A1 CN 2019127169 W CN2019127169 W CN 2019127169W WO 2020143430 A1 WO2020143430 A1 WO 2020143430A1
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WO
WIPO (PCT)
Prior art keywords
area
touch panel
touch
short
test
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PCT/CN2019/127169
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English (en)
French (fr)
Inventor
龚庆
牛文骁
Original Assignee
京东方科技集团股份有限公司
成都京东方光电科技有限公司
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Application filed by 京东方科技集团股份有限公司, 成都京东方光电科技有限公司 filed Critical 京东方科技集团股份有限公司
Priority to JP2020560904A priority Critical patent/JP2022516387A/ja
Priority to US16/771,761 priority patent/US11181999B2/en
Priority to EP19909545.6A priority patent/EP3910455A4/en
Publication of WO2020143430A1 publication Critical patent/WO2020143430A1/zh

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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0416—Control or interface arrangements specially adapted for digitisers
    • G06F3/04164—Connections between sensors and controllers, e.g. routing lines between electrodes and connection pads
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2203/00—Indexing scheme relating to G06F3/00 - G06F3/048
    • G06F2203/041—Indexing scheme relating to G06F3/041 - G06F3/045
    • G06F2203/04103—Manufacturing, i.e. details related to manufacturing processes specially suited for touch sensitive devices
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/04—Structural and physical details of display devices
    • G09G2300/0421—Structural details of the set of electrodes
    • G09G2300/0426—Layout of electrodes and connections
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/12—Test circuits or failure detection circuits included in a display system, as permanent part thereof

Definitions

  • the present disclosure relates to the field of display technology, and in particular, to a touch sensor, a touch module, and a touch sensor crack detection method.
  • the touch module generally includes a touch sensor and a circuit board provided with a touch integrated circuit.
  • the touch sensor is usually connected to a circuit board provided with a touch integrated circuit through bonding technology.
  • the purpose of the present disclosure is to provide a touch sensor, a touch module and a touch sensor crack detection method.
  • a touch panel including a touch area and a peripheral area surrounding the touch area, the peripheral area on at least one side of the touch area includes a binding area, the binding The fixed area is used for binding a circuit board, wherein the binding area is provided with at least one test pin group for detecting a crack of the touch panel; each of the test leads in the at least one test pin group
  • the foot group includes two test pins, and the two test pins are short-circuited by a short wire, and the short wire extends beyond the binding area.
  • the touch panel has a slotted area
  • the binding area is located in the slotted area
  • the position of the slotted area other than the binding area is In the special-shaped slotted area
  • the short wire passes through the special-shaped slotted area and extends to a peripheral area outside the slotted area.
  • the short wire surrounds the touch area.
  • the test pin group includes: a first test pin group and a second test pin group.
  • the first test pin group is set on the first side of the binding area, and includes two first test pins, and the two first test pins are short-circuited through the first short wiring;
  • the second test pin group is set On the second side of the binding area opposite to the first side, the second test pin group includes two second test pins, and the two second test pins are shorted by a second short wire Pick up.
  • the first short wire extends to the special-shaped slotted area, extends along an edge trace in the special-shaped slotted area, and the first shorted wire extends along the binding The direction of the first side of the fixed area extends to the peripheral area of the touch panel.
  • the second short wire extends to the special-shaped slotted area, extends along an edge trace in the special-shaped slotted area, and the second shorted wire extends along the The direction of the second side opposite to the first side in the binding area extends to the peripheral area of the touch panel.
  • the first short wire and the second short wire extend to the entire peripheral area.
  • the first short wire and the second short wire meet at the corner of the peripheral area but do not contact.
  • the first short wire and the second short wire extend in different lengths in the peripheral region.
  • the substrate is a polarizer.
  • a touch module including the above-mentioned touch panel and a circuit board provided with a touch integrated circuit, the circuit board being bound to the touch panel ;
  • the binding area of the circuit board is provided with at least one test pin group, the test pin group includes two test pins; when the circuit board is bound to the touch panel, the touch panel And the two detection pins of the circuit board are directly opposite to each other.
  • a touch sensor crack detection method for detecting the above touch module includes:
  • the electrical signal between two test pins on the circuit board is adopted by an electrical signal acquisition unit;
  • the touch sensor According to the electrical signal, it is determined whether the touch sensor has a crack.
  • the method further includes: acquiring, by the electrical signal acquisition unit, electrical signals between a plurality of test pin groups having different short wiring extension lengths; determining the touch according to the electrical signals Whether the control panel is cracked and the location of the crack.
  • FIG. 1 is a schematic structural diagram of a touch module in the related art
  • FIG. 2 is a schematic structural diagram of an exemplary embodiment of a touch sensor of the present disclosure
  • FIG. 3 is a schematic structural diagram of another exemplary embodiment of a touch sensor of the present disclosure.
  • FIG. 4 is a cross-sectional view along A-A in FIG. 3;
  • FIG. 5 is a schematic structural diagram of another exemplary embodiment of the touch sensor of the present disclosure.
  • the touch module includes a touch sensor 1 and a circuit board 2.
  • the touch sensor 1 is provided with a test pin group including test pins 11 and 12, wherein test pin 11 and test pin 12 are short-circuited;
  • the circuit board 2 is provided with test pins including test pins 21 and 22 Group, when the touch sensor 1 is bound to the circuit board 2, the test pin 11 and the test pin 21 are directly opposite, and the test pin 12 and the test pin 22 are directly opposite.
  • the binding state between the touch sensor 1 and the circuit board 2 can be judged. For example, if the resistance between the detection test pins 21 and 22 is small, it means the binding The state is good.
  • the bonding state is bad.
  • cracks are likely to occur around the touch sensor binding area 3 (dashed frame), thereby affecting the normal function of the touch sensor.
  • the touch sensor 1 has an edge trace 14 around the binding area 3 that connects the touch electrode in the display area 4 and the normal pin 13 of the touch sensor. A crack around the bond area 3 may easily cause the edge trace 14 to break .
  • the present exemplary embodiment provides a touch sensor, which includes a touch area and a peripheral area surrounding the touch area.
  • the peripheral area on at least one side of the touch area includes a binding area, and the binding
  • the fixed area is used for binding a circuit board, wherein the binding area is provided with at least one test pin group for detecting a crack of the touch panel; each of the test leads in the at least one test pin group
  • the foot group includes two test pins, and the two test pins are short-circuited by a short wire, and the short wire extends beyond the binding area.
  • FIG. 2 it is a schematic structural diagram of an exemplary embodiment of a touch sensor of the present disclosure.
  • the touch sensor 5 is provided with a touch area (TA) and a binding area 51 (dashed frame) for binding a circuit board 6.
  • the binding area 51 may be located in a peripheral area (PA) surrounding the touch area TA )in.
  • the binding area 51 is provided with a first test pin group for detecting the binding state of the touch sensor 5 and the circuit board 6.
  • the first test pin group includes two first test pins 711 and 712, the two first test pins 711 and 712 are short-circuited by a first short wire 713, and the short wire 713 extends beyond the binding area 51.
  • the circuit board 6 is provided with two test pins 611 and 612. When the circuit board 6 is bound to the touch sensor 5, the test pin 611 is directly opposite to the first test pin 711, and the test pin 612 and the first Test pin 712 is right.
  • the present exemplary embodiment provides a touch sensor.
  • the touch sensor short-circuits the short wires of the two test pins and extends beyond the binding area. When a crack occurs at the first short wire position around the binding area, the short wire breaks, so that one of the two test pins on the circuit board The resistance will be infinite.
  • the touch sensor provided by the present disclosure can determine whether the touch sensor is cracked by testing the electrical signal between two test pins on the circuit board; on the other hand, the touch sensor provided by the present disclosure can pass the test circuit board The resistance between the last two test pins determines the binding state of the touch sensor and the circuit board.
  • the first test pin group may be disposed on the first side of the binding area, and the second side opposite to the first side in the binding area 51
  • a second test pin group for detecting the binding state of the touch sensor 5 and the circuit board 6 may also be provided, and the second test pin group may include two second test pins 721, 722, The two second test pins 721 and 722 are short-circuited by a second short wire 723 which extends beyond the binding area 51.
  • the circuit board 6 is provided with two test pins 621 and 622. When the circuit board 6 is bound to the touch sensor 5, the test pin 621 is directly opposite to the second test pin 721, and the test pin 622 and the second Test pin 722 is right. By detecting the electrical signal between the two test pins 621 and 622, it can be determined whether a crack has occurred in the position of the second short wire.
  • the side where the edge trace 52 extends out of the binding area is a high incidence area where the touch trace of the touch sensor breaks and breaks.
  • the first short wire 713 and the second short wire 723 may extend beyond the binding area along the extending direction of the trace 52 inside the binding area 51, as shown in FIG. 2, the first short wiring 713
  • the second short wiring 723 extends out of the binding area in the upward direction. This setting can focus on detecting the crack state on the side of the binding area where the upper edge trace 52 of the touch sensor extends.
  • first short wire 713 and the second short wire 723 may also extend out of the binding area in other directions and in other ways, which are all within the protection scope of the present disclosure.
  • FIG. 3 is a schematic structural diagram of another exemplary embodiment of the touch sensor of the present disclosure
  • FIG. 4 is a cross-sectional view along A-A in FIG. 3.
  • the touch sensor 5 is attached to a substrate 8.
  • a groove area 81 is defined in the substrate 8, and the binding area 51 is formed in the groove area 81.
  • the touch sensor 5 is located inside the slotted area 81, and no film is attached to the position outside the binding area.
  • This area is defined as a special-shaped slotted area 53, which is a high-incidence area where the touch sensor cracks.
  • the first shorting wire 713 and the second shorting wire 723 may extend through the profiled slotted area to the bonding area of the touch sensor 5 and the substrate 8. This setting can detect whether there is a crack around the binding area of the touch sensor, and also whether there is a crack in the opposite slotted area.
  • the first short wire 713 may extend along the extending direction of the edge trace in the slotted area to the shaped slotted area, and along the first side of the binding area The direction extends to the bonding area of the touch sensor and the substrate.
  • the second short wire extends along the extending direction of the edge trace in the slotted area to the shaped slotted area, and extends to the touch sensor and along the direction of the second side of the binding area The bonding area of the substrate.
  • the touch sensor 5 generally includes a display area 54 and an edge area 55 surrounding the display area.
  • the display area is provided with touch electrodes.
  • the edge area 55 may be provided with elements such as edge traces.
  • the first short The wire and the second short wire may extend along the edge area, so as not to affect the normal function of the touch sensor in the display area.
  • FIG. 5 it is a schematic structural diagram of another exemplary embodiment of the touch sensor of the present disclosure.
  • the first short wire 713 and the second short wire 723 may extend to the entire edge area.
  • This exemplary embodiment also provides a touch module including the above-mentioned touch sensor and a circuit board provided with a touch integrated circuit, the circuit board being bound to the touch sensor;
  • the binding area of the circuit board is provided with at least one test pin group, and the test pin group includes two test pins; when the circuit board is bound to the touch sensor, the touch sensor The two detection pins are directly opposite to the two detection pins of the circuit board.
  • the touch module provided by this exemplary embodiment has the same technical features and working principles as the above-mentioned touch sensor. The above content has been described in detail and will not be repeated here.
  • This exemplary embodiment also provides a touch sensor crack detection method for detecting the above-mentioned touch module, which includes:
  • Step S1 The electrical signal between the two test pins on the circuit board is adopted by an electrical signal acquisition unit;
  • Step S2 Determine whether the touch sensor cracks according to the electrical signal.
  • the electrical signal collection unit may be a resistance detection device.
  • the resistance detection device detects that the resistance between the two test pins on the circuit board is infinite, it may determine that the touch sensor has a crack.
  • the method can also be used to detect the location where the touch sensor cracks. Specifically, the method further includes: collecting electrical signals between a plurality of test pin groups having different short wiring extension lengths through the electrical signal collection unit; judging whether the touch sensor is cracked according to the electrical signals And the location of the crack.
  • the present disclosure provides a touch sensor, a touch module, and a touch sensor crack detection method.
  • the short wire of the touch sensor short-circuiting the two test pins extends beyond the binding area. When a crack occurs around the binding area of the touch sensor, the short wire breaks, resulting in resistance between the two test pins on the circuit board Will be infinite.
  • the touch sensor provided by the present disclosure can determine whether the touch sensor is cracked by testing the resistance between two test pins on the circuit board; on the other hand, the touch sensor provided by the present disclosure can be tested by the circuit board The resistance between the two test pins determines the binding state of the touch sensor and the circuit board.

Abstract

一种触控传感器（5），所述触控传感器（5）上设置有用于绑定一电路板（6）的绑定区（51），所述绑定区（51）设置有用于检测所述触控传感器（5）与所述电路板（6）绑定状态的至少一个测试引脚组；所述测试引脚组包括两个测试引脚（711,712），两所述测试引脚（711,712）通过短接线（713）短接，所述短接线（713）延伸到所述绑定区（51）以外。

Description

触控面板、触控模组及触控面板裂纹检测方法
相关申请的交叉引用
本申请要求于2019年01月08日递交的中国专利申请第201910016302.0号的优先权，在此全文引用上述中国专利申请公开的内容以作为本申请的一部分。
技术领域
本公开涉及显示技术领域，尤其涉及一种触控传感器、触控模组及触控传感器裂纹检测方法。
背景技术
触控模组一般包括触控传感器以及设置有触控集成电路的电路板，触控传感器通常通过绑定(bonding)技术与设置有触控集成电路的电路板连接。
需要说明的是，在上述背景技术部分公开的信息仅用于加强对本公开的背景的理解，因此可以包括不构成对本领域普通技术人员已知的现有技术的信息。
发明内容
本公开的目的在于提供一种触控传感器、触控模组及触控传感器裂纹检测方法。
根据本公开的一个方面，提供了一种触控面板，包括触控区和围绕所述触控区的周边区，所述触控区至少一侧的周边区中包含绑定区，所述绑定区用于绑定电路板，其中，所述绑定区设置有用于检测所述触控面板裂纹的至少一个测试引脚组；所述至少一个测试引脚组中的每个所述测试引脚组包括两个测试引脚，所述两个测试引脚通过短接线短接，所述短接线延伸到所述绑定区以外。
在本公开的一种示例性实施例中，所述触控面板具有一开槽区，所述绑定区位于所述开槽区内，所述开槽区中除绑定区以外的位置为 异形开槽区，所述短接线穿过所述异形开槽区并向所述开槽区之外的周边区延伸。
在本公开的一种示例性实施例中，所述短接线环绕所述触控区。
在本公开的一种示例性实施例中，所述测试引脚组包括：第一测试引脚组和第二测试引脚组。第一测试引脚组设置于所述绑定区的第一侧，包括两个第一测试引脚，两所述第一测试引脚通过第一短接线短接；第二测试引脚组设置于所述绑定区的与所述第一侧相对的第二侧，所述第二测试引脚组包括两个第二测试引脚，两所述第二测试引脚通过第二短接线短接。
在本公开的一种示例性实施例中，所述第一短接线延伸到所述异形开槽区，沿所述异形开槽区内边沿走线延伸且所述第一短接线沿所述绑定区第一侧的方向延伸到所述触控面板的所述周边区。
在本公开的一种示例性实施例中，所述第二短接线延伸到所述异形开槽区，沿所述异形开槽区内边沿走线延伸，且所述第二短接线沿所述绑定区中与所述第一侧相对的第二侧的方向延伸到所述触控面板的所述周边区。
在本公开的一种示例性实施例中，所述第一短接线和所述第二短接线延伸到整个所述周边区。
在本公开的一种示例性实施例中，所述第一短接线和所述第二短接线在所述周边区的拐角处相遇但不接触。
在本公开的一种示例性实施例中，所述第一短接线和所述第二短接线在所述周边区中延伸的长度不同。
在本公开的一种示例性实施例中，所述基板为偏光片。
根据本公开的一个方面，提供一种触控模组，该触控模组包括上述的触控面板以及设置有触控集成电路的电路板，所述电路板绑定在所述触控面板上；所述电路板的绑定区设置有至少一个测试引脚组，所述测试引脚组包括两个测试引脚；所述电路板与所述触控面板绑定时，所述触控面板的两个检测引脚与所述电路板的连个检测引脚分别正对。
根据本公开的一个方面，提供一种触控传感器裂纹检测方法， 用于检测上述的触控模组，该方法包括：
通过一电信号采集单元采用所述电路板上两测试引脚之间的电信号；
根据所述电信号判断所述触控传感器是否发生裂纹。
根据本公开的一个方面，所述方法还包括：通过所述电信号采集单元采集具有不同的短接线延伸长度的多个测试引脚组之间的电信号；根据所述电信号判断所述触控面板是否发生裂纹以及发生裂纹的位置。
应当理解的是，以上的一般描述和后文的细节描述仅是示例性和解释性的，并不能限制本公开。
附图说明
此处的附图被并入说明书中并构成本说明书的一部分，示出了符合本公开的实施例，并与说明书一起用于解释本公开的原理。显而易见地，下面描述中的附图仅仅是本公开的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。
图1为相关技术中一种触控模组的结构示意图；
图2为本公开触控传感器一种示例性实施例的结构示意图；
图3为本公开触控传感器另一种示例性实施例的结构示意图；
图4为图3中沿A-A的剖面图；
图5为本公开触控传感器另一种示例性实施例的结构示意图。
具体实施方式
现在将参考附图更全面地描述示例实施例。然而，示例实施例能够以多种形式实施，且不应被理解为限于在此阐述的范例；相反，提供这些实施例使得本公开将更加全面和完整，并将示例实施例的构思全面地传达给本领域的技术人员。图中相同的附图标记表示相同或类似的结构，因而将省略它们的详细描述。
虽然本说明书中使用相对性的用语，例如“上”“下”来描述图标的 一个组件对于另一组件的相对关系，但是这些术语用于本说明书中仅出于方便，例如根据附图中所述的示例的方向。能理解的是，如果将图标的装置翻转使其上下颠倒，则所叙述在“上”的组件将会成为在“下”的组件。其他相对性的用语，例如“高”“低”“顶”“底”“左”“右”等也作具有类似含义。当某结构在其它结构“上”时，有可能是指某结构一体形成于其它结构上，或指某结构“直接”设置在其它结构上，或指某结构通过另一结构“间接”设置在其它结构上。
用语“一个”、“一”、“所述”用以表示存在一个或多个要素/组成部分/等；用语“包括”和“具有”用以表示开放式的包括在内的意思并且是指除了列出的要素/组成部分/等之外还可存在另外的要素/组成部分/等。
如图1所示，为相关技术中，一种触控模组的结构示意图，该触控模组包括触控传感器1和电路板2。触控传感器1上设置有包括测试引脚11、12的测试引脚组，其中测试引脚11和测试引脚12短接；电路板2上设有包括测试引脚21、22的测试引脚组，当触控传感器1与电路板2绑定时，测试引脚11和测试引脚21正对，测试引脚12和测试引脚22正对。通过检测测试引脚21和22之间的电信号可以判断触控传感器1与电路板2之间的绑定状态，例如，如果检测测试引脚21和22之间的电阻较小则说明绑定状态良好，如果检测测试引脚21和22之间的电阻较大则说明绑定状态不良。然而，在电路板2与触控传感器1绑定过程中，触控传感器绑定区3(虚线框)的周围容易发生裂纹，从而影响触控传感器的正常功能。例如，触控传感器1在绑定区3的周围存在连接显示区4中触控电极和触控传感器正常引脚13的边沿走线14，绑定区3周围的裂纹容易导致边沿走线14断裂。
基于此，本示例性实施例提供一种触控传感器，包括触控区和围绕所述触控区的周边区，所述触控区至少一侧的周边区中包含绑定区，所述绑定区用于绑定电路板，其中，所述绑定区设置有用于检测所述触控面板裂纹的至少一个测试引脚组；所述至少一个测试引脚组中的每个所述测试引脚组包括两个测试引脚，所述两个测试引脚通过 短接线短接，所述短接线延伸到所述绑定区以外。如图2所示，为本公开触控传感器一种示例性实施例的结构示意图。所述触控传感器5上设置有触控区(TA)以及用于绑定一电路板6的绑定区51(虚线框)，绑定区51可以位于围绕触控区TA的周边区(PA)中。所述绑定区51内设置有用于检测所述触控传感器5与所述电路板6绑定状态的第一测试引脚组，所述第一测试引脚组包括两个第一测试引脚711、712，两所述第一测试引脚711、712通过第一短接线713短接，所述短接线713延伸到所述绑定区51以外。相应的，电路板6上设置有两测试引脚611、612，电路板6与触控传感器5绑定时，测试引脚611与第一测试引脚711正对，测试引脚612和第一测试引脚712正对。
本示例性实施例提供一种触控传感器。该触控传感器短接两个测试引脚的短接线延伸到绑定区以外，当绑定区周围的第一短接线位置发生裂纹时，短接线断裂，从而电路板上两个测试引脚之间的电阻将无穷大。一方面，本公开提供的触控传感器可以通过测试电路板上两个测试引脚之间的电信号判断触控传感器是否发生裂纹，另一方面，本公开提供的触控传感器可以通过测试电路板上两个测试引脚之间的电阻判断触控传感器与电路板的绑定状态。
本示例性实施例中，如图2所示，所述第一测试引脚组可以设置于绑定区的第一侧，所述绑定区51内与所述第一侧相对的第二侧还可以设置有用于检测所述触控传感器5与所述电路板6绑定状态的第二测试引脚组，所述第二测试引脚组可以包括两个第二测试引脚721、722，两所述第二测试引脚721、722通过第二短接线723短接，所述第二短接线723延伸到所述绑定区51以外。相应的，电路板6上设置有两测试引脚621、622，电路板6与触控传感器5绑定时，测试引脚621与第二测试引脚721正对，测试引脚622和第二测试引脚722正对。通过检测两测试引脚621、622之间的电信号可以判断第二短接线的位置是否发生裂纹。
边沿走线52延伸出绑定区的一侧是触控传感器边沿走线断裂故障的高发区。本示例性实施例中，第一短接线713和第二短接线723 可以沿绑定区51内边沿走线52的延伸方向延伸到绑定区以外，如图2所示，第一短接线713和第二短接线723沿向上的方向延伸出绑定区。该设置可以重点检测触控传感器上边沿走线52延伸出绑定区一侧的裂纹状态。
应该理解的是，在其他示例性实施例中，绑定区内还可以设置其他数量的检测引脚组，多组检测引脚组可以检测触控传感器不同位置的裂纹状态，并且可以判断触控传感器裂纹的位置。第一短接线713和第二短接线723也可以沿其他方向以及其他方式延伸出绑定区，这些都属于本公开的保护范围。
触控传感器集成于显示模组时，需要贴合于一基板上，根据触控传感器不同集成方式，该基板可以为偏光片、保护玻璃等。本示例性实施例中，如图3、4所示，图3为本公开触控传感器另一种示例性实施例的结构示意图，图4为图3中沿A-A的剖面图。所述触控传感器5贴合于一基板8，所述基板8上开设有一开槽区81，所述绑定区51形成于所述开槽区81内。触控传感器5位于开槽区81以内，绑定区以外的位置没有贴附任何膜层，定义该区域为异形开槽区53，该异形开槽区53是触控传感器发生裂纹的高发区。本示例性实施例中，所述第一短接线713和第二短接引线723可以穿过所述异形开槽区延伸至所述触控传感器5与所述基板8的贴合区。该设置既可以检测触控传感器绑定区周围是否发生裂纹，还可以检测异性开槽区是否发生裂纹。
本示例性实施例中，所述第一短接线713可以沿所述开槽区内所述边沿走线的延伸方向延伸到所述异形开槽区，且沿所述绑定区第一侧的方向延伸到所述触控传感器与所述基板的贴合区。所述第二短接线沿所述开槽区内所述边沿走线的延伸方向延伸到所述异形开槽区，且沿所述绑定区第二侧的方向延伸到所述触控传感器与所述基板的贴合区。
本示例性实施例中，触控传感器5一般包括有显示区54和围绕显示区的边沿区55，显示区设置有触控电极，边沿区55可以设置边沿走线等元件，所述第一短接线和所述第二短接线可以沿所述边沿区 延伸，从而不影响触控传感器在显示区的正常功能。
本示例性实施例中，如图5所示，为本公开触控传感器另一种示例性实施例的结构示意图。所述第一短接线713和所述第二短接线723可以延伸到整个所述边沿区。触控传感器周围任何位置发生裂纹导致第一短接线或者第二短接线断裂时，均可以通过上述的检测方法判断是否出现裂纹。
本示例性实施例还提供一种触控模组，该触控模组包括上述的触控传感器以及设置有触控集成电路的电路板，所述电路板绑定在所述触控传感器上；所述电路板的绑定区设置有至少一个测试引脚组，所述测试引脚组包括两个测试引脚；所述电路板与所述触控传感器绑定时，所述触控传感器的两个检测引脚与所述电路板的连个检测引脚分别正对。
本示例性实施例提供的触控模组与上述触控传感器具有相同的技术特征和工作原理，上述内容已经做出详细说明，此处不再赘述。
本示例性实施例还提供一种触控传感器裂纹检测方法，用于检测上述的触控模组，该包括：
步骤S1：通过一电信号采集单元采用所述电路板上两测试引脚之间的电信号；
步骤S2：根据所述电信号判断所述触控传感器是否发生裂纹。
其中，电信号采集单元可以为电阻检测装置，当电阻检测装置检测到所述电路板上两测试引脚之间的电阻无穷大时，则可以判断触控传感器发生裂纹。
在本公开的一个实施例中，该方法还能够用于检测触控传感器发生裂纹的位置。具体地，该方法还包括：通过所述电信号采集单元采集具有不同的短接线延伸长度的多个测试引脚组之间的电信号；根据所述电信号判断所述触控传感器是否发生裂纹以及发生裂纹的位置。
本公开提供一种触控传感器、触控模组及触控传感器裂纹检测方法。该触控传感器短接两个测试引脚的短接线延伸到绑定区以外，当触控传感器绑定区周围发生裂纹时，短接线断裂，从而电路板上两 个测试引脚之间的电阻将无穷大。一方面，本公开提供的触控传感器可以通过测试电路板上两个测试引脚之间的电阻判断触控传感器是否发生裂纹，另一方面，本公开提供的触控传感器可以通过测试电路板上两个测试引脚之间的电阻判断触控传感器与电路板的绑定状态。
本领域技术人员在考虑说明书及实践这里公开的公开后，将容易想到本公开的其它实施方案。本申请旨在涵盖本公开的任何变型、用途或者适应性变化，这些变型、用途或者适应性变化遵循本公开的一般性原理并包括本公开未公开的本技术领域中的公知常识或惯用技术手段。说明书和实施例仅被视为示例性的，本公开的真正范围和精神由所附的权利要求指出。
上述所描述的特征、结构或特性可以以任何合适的方式结合在一个或更多实施方式中，如有可能，各实施例中所讨论的特征是可互换的。在上面的描述中，提供许多具体细节从而给出对本公开的实施方式的充分理解。然而，本领域技术人员将意识到，可以实践本公开的技术方案而没有特定细节中的一个或更多，或者可以采用其它的方法、组件、材料等。在其它情况下，不详细示出或描述公知结构、材料或者操作以避免模糊本公开的各方面。

Claims (12)

  1. 一种触控面板，包括触控区和围绕所述触控区的周边区，所述触控区至少一侧的周边区中包含绑定区，所述绑定区用于绑定电路板，其中，
    所述绑定区设置有用于检测所述触控面板裂纹的至少一个测试引脚组；
    所述至少一个测试引脚组中的每个所述测试引脚组包括两个测试引脚，所述两个测试引脚通过短接线短接，所述短接线延伸到所述绑定区以外。
  2. 根据权利要求1所述的触控面板，其中，所述触控面板具有一开槽区，所述绑定区位于所述开槽区内，所述开槽区中除绑定区以外的位置为异形开槽区，所述短接线穿过所述异形开槽区并向所述开槽区之外的周边区延伸。
  3. 根据权利要求1所述的触控面板，其中，所述短接线环绕所述触控区。
  4. 根据权利要求2所述的触控面板，其中，所述测试引脚组包括：
    第一测试引脚组，设置于所述绑定区的第一侧，包括两个第一测试引脚，两所述第一测试引脚通过第一短接线短接；
    第二测试引脚组，设置于所述绑定区的与所述第一侧相对的第二侧，所述第二测试引脚组包括两个第二测试引脚，两所述第二测试引脚通过第二短接线短接。
  5. 根据权利要求4所述的触控面板，其中，
    所述第一短接线延伸到所述异形开槽区，沿所述异形开槽区内边沿走线延伸且所述第一短接线沿所述绑定区第一侧的方向延伸到所述触控面板的所述周边区。
  6. 根据权利要求5所述的触控面板，其中，
    所述第二短接线延伸到所述异形开槽区，沿所述异形开槽区内边沿走线延伸，且所述第二短接线沿所述绑定区中与所述第一侧相对的第二侧的方向延伸到所述触控面板的所述周边区。
  7. 根据权利要求4所述的触控面板，其中，所述第一短接线和所述第二短接线延伸到整个所述周边区。
  8. 根据权利要求7所述的触控面板，其中，所述第一短接线和所述第二短接线在所述周边区的拐角处相遇但不接触。
  9. 根据权利要求4所述的触控面板，其中，所述第一短接线和所述第二短接线在所述周边区中延伸的长度不同。
  10. 一种触控模组，包括：权利要求1-9任一项所述的触控面板以及设置有触控集成电路的电路板，所述电路板绑定在所述触控面板上；
    所述电路板的绑定区设置有至少一个测试引脚组，所述测试引脚组包括两个测试引脚；
    所述电路板与所述触控面板绑定时，所述触控面板的两个检测引脚与所述电路板的两个检测引脚分别正对。
  11. 一种触控面板裂纹检测方法，用于检测权利要求10所述的触控模组，其中，包括：
    通过一电信号采集单元采用所述电路板上两测试引脚之间的电信号；
    根据所述电信号判断所述触控面板是否发生裂纹。
  12. 根据权利要求11所述的方法，还包括：
    通过所述电信号采集单元采集具有不同的短接线延伸长度的多个测试引脚组之间的电信号；
    根据所述电信号判断所述触控面板是否发生裂纹以及发生裂纹的位置。
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