WO2020140972A1 - 辐射检查设备和辐射检查方法 - Google Patents

辐射检查设备和辐射检查方法 Download PDF

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Publication number
WO2020140972A1
WO2020140972A1 PCT/CN2020/070279 CN2020070279W WO2020140972A1 WO 2020140972 A1 WO2020140972 A1 WO 2020140972A1 CN 2020070279 W CN2020070279 W CN 2020070279W WO 2020140972 A1 WO2020140972 A1 WO 2020140972A1
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Prior art keywords
radiation
inspection
radiation inspection
objects
row
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Ceased
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PCT/CN2020/070279
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English (en)
French (fr)
Inventor
陈志强
李元景
张丽
李荐民
孙尚民
宗春光
胡煜
宋全伟
周合军
喻卫丰
曹金国
傅冰
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Tsinghua University
Nuctech Co Ltd
Nuctech Beijing Co Ltd
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Tsinghua University
Nuctech Co Ltd
Nuctech Beijing Co Ltd
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Priority to GB2109852.0A priority Critical patent/GB2594412B/en
Priority to PL438330A priority patent/PL246313B1/pl
Priority to US17/420,681 priority patent/US11822043B2/en
Publication of WO2020140972A1 publication Critical patent/WO2020140972A1/zh
Anticipated expiration legal-status Critical
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/232—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays having relative motion between the source, detector and object other than by conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G01N23/087—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/224—Multiple energy techniques using one type of radiation, e.g. X-rays of different energies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/03—Investigating materials by wave or particle radiation by transmission
    • G01N2223/04—Investigating materials by wave or particle radiation by transmission and measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3303—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object fixed; source and detector move
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/639—Specific applications or type of materials material in a container

Definitions

  • An object of the present disclosure is to provide a radiation inspection apparatus and a radiation inspection method.
  • a first aspect of the present disclosure provides a radiation inspection device, including:
  • a radiation detection device including a ray source and a detector that cooperates with the ray source to scan and inspect an object, the radiation detection device has an inspection channel for the object to pass through when it is scanned and inspected;
  • the radiation inspection device may be turned 180°.
  • the radiation source is configured such that the angle between the beam emitted by the beam and the extension direction of the inspection channel is variable, and the detector is configured to change the position in response to the angle change of the beam .
  • the radiation source is configured such that the angle between the beam emitted by the radiation beam and the extending direction of the inspection channel is variable within a range of 90 ⁇ °, where 0 ⁇ 15°.
  • the radiation detection device includes a transmission inspection device, and the radiation source and the detector of the transmission inspection device are located on both sides of the inspection channel and are connected by an arm bracket, and the arm bracket The detector is driven to move so that the detector changes position corresponding to the angle change of the beam.
  • the scanning speed of the radiation inspection device is variably set; and/or
  • the beam exit frequency of the ray source is variably set.
  • a second aspect of the present disclosure provides a radiation inspection method using the radiation inspection apparatus according to any one of the first aspect of the disclosure, including:
  • the radiation inspection device scans and inspects a plurality of objects in a row
  • the walking wheel of the radiation inspection device is rotated 90° in situ and the radiation inspection device is moved in a direction perpendicular to the extending direction of the inspection channel
  • the inspection channel is opposed to another row of multiple objects
  • the radiation inspection device performs scanning inspection on the plurality of objects to be inspected in another row.
  • the radiation inspection apparatus scanning and inspecting the row of multiple objects includes passing the row of multiple objects from one end of the inspection channel to the other The first side of the row of test objects is scanned and inspected.
  • the radiation inspection apparatus performs scanning inspection on a plurality of objects in a row including rotating the beam of the radiation source of the radiation detection device to extend the beam and the inspection channel The angle of the direction changes, and the detector changes the position corresponding to the angle change of the beam to perform scanning inspection of the object at different angles.
  • FIG. 3 is a schematic structural diagram of the radiation inspection apparatus shown in an embodiment of the present disclosure when scanning inspections of a plurality of test objects in a row and a row are completed, when scanning inspection of the first side is completed.
  • FIG. 12 is a schematic structural diagram of the radiation inspection apparatus shown in FIG. 11 when a beam inspection direction of a ray source is deflected toward a lateral side during a scanning inspection of a plurality of test objects in a row.
  • FIG. 13 is a schematic structural diagram of the radiation inspection apparatus shown in FIG. 11 during the scanning inspection of a plurality of test objects in a row, when the beam exit direction of the ray source is deflected toward the other side in the lateral direction.
  • 1 to 13 show the structure and working principle of the radiation inspection apparatus 20 of the embodiment of the present disclosure.
  • the radiation inspection apparatus 20 of the embodiment of the present disclosure mainly includes a radiation detection device and a walking wheel.
  • the radiation detection device includes a ray source and a detector that cooperates with the ray source to scan and inspect the object 10.
  • the radiation detection device has an inspection channel for the object 10 to pass through when it is scanned and inspected.
  • the “pass” is the passage of the test object 10 relative to the radiation inspection device, that is, the radiation inspection device 20 is stationary and the test object 10 is moving, or the radiation inspection device 20 is moving and the test object 10 is still, and It may be that the radiation inspection apparatus 20 and the test object 10 move simultaneously.
  • the radiation inspection device 20 of the present disclosure after completing the scanning inspection of a plurality of test objects 10 in a row (such as the first row of vehicles), the walking wheel rotates 90°, and the radiation inspection device 20 as a whole
  • the direction perpendicular to the extension direction of the inspection channel also called lateral direction, the extension direction of the inspection channel is the longitudinal direction
  • the radiation inspection device 20 automatically moves laterally to another row of multiple objects 10 (such as the second row) Vehicle), and then rotate the walking wheel 90 degrees, and then scan and inspect a plurality of test objects 10 in another row.
  • Performing the aforementioned steps in sequence can achieve continuous scan inspection of multiple rows of test objects 10, improving The use efficiency of the radiation inspection device 20.
  • the radiation inspection apparatus 20 may include a controller for controlling the rotation speed and steering angle of each walking wheel.
  • the controller may receive the state parameters of the first vehicle body 21 and the second vehicle body 22 provided by the detection device, so as to perform the rotation speed and steering angle of each walking wheel 27 according to the state parameters control.
  • the controller may also receive control commands from a remote control platform (such as an industrial control computer, etc.) or a remote controller to control the rotation speed and steering angle of each walking wheel 27.
  • two of the four walking wheels on the beam side are inclined in the same direction with respect to the extending direction of the inspection channel 24.
  • the four walking wheels 27 are inclined relative to the extending direction of the inspection channel 24, the two walking wheels on one side of the beam have the same inclination direction, and the two walking wheels on the other side of the beam
  • the tilt direction of 27 is the same but the tilt direction of the other two walking wheels 27 is opposite.
  • FIG. 11 is the principle when the radiation inspection apparatus 20 shown in an embodiment of the present disclosure scans and inspects a plurality of test objects 10 in a row when the beam exit direction of the ray source is perpendicular to the extending direction of the inspection channel Sexual structure diagram.
  • FIG. 12 is a schematic structural diagram of the radiation inspection apparatus 20 shown in FIG. 11 when the beam exit direction of the ray source is deflected toward the lateral side during the scanning inspection of a plurality of test objects 10 in a row.
  • FIG. 13 is a schematic structural diagram of the radiation inspection device 20 shown in FIG. 11 when the beam inspection direction of the ray source is deflected toward the other side in the lateral direction during the scanning inspection of a plurality of test objects 10 in a row.
  • the ray source is provided on the first vehicle body 21 and the detector is provided on the boom 23.
  • the gantry frame constituted by the first vehicle body 21, the second vehicle body 22, and the boom 23 and its longitudinally extended area form an inspection passage 24 for the object 10 to pass through when undergoing a scanning inspection.
  • the scanning speed of the radiation inspection apparatus 20 is variably set; and/or the beam exit frequency of the radiation source is variably set. This setting is helpful to get the scanned image with corresponding resolution according to the inspection needs.
  • the standard scanning speed and the standard beam output frequency that are often used when scanning and inspecting the object 10 can be set for the radiation inspection device 20 and the radiation source, respectively, and the standard scanning speed or Based on the beam output frequency, a fine scan of the object 10 is achieved by reducing the scanning speed and/or increasing the beam output frequency of the ray source, thereby forming a clearer scan image.
  • An embodiment of the present disclosure also provides a radiation inspection method applying the radiation inspection apparatus 20 of the present disclosure, including:
  • the walking wheel of the radiation inspection device 20 is rotated 90° in situ and the radiation inspection device is moved in a direction (transverse direction) perpendicular to the extending direction of the inspection channel to The inspection channel is opposed to another row of multiple test objects 10;
  • the radiation inspection apparatus 20 scans and inspects a plurality of objects 10 in another row.
  • the radiation inspection apparatus 20 scans and inspects the rows of the plurality of objects 10 including passing the rows of the plurality of objects 10 from one end of the inspection channel to the other end to inspect the rows of objects The first side of the object 10 is scanned and inspected.
  • the radiation inspection apparatus 20 and the radiation inspection method of the embodiments of the present disclosure can not only realize a single-sided radiation inspection of the test object 10, to form a single-sided scan image of the test object 10, but also can realize both sides of the test object 10 Scan inspection to form a double-sided scanned image of the test object 10.
  • the radiation inspection apparatus 20 scans and inspects a plurality of objects 10 in a row, including rotating the radiation beam of the radiation source of the radiation detection device to change the angle between the radiation beam and the extending direction of the inspection channel, the detector The position is changed in accordance with the change in the angle of the beam to perform scanning inspection of the object 10 at different angles.
  • the angle between the beam and the extension direction of the inspection channel varies within a range of 90 ⁇ °, where ⁇ is an acute angle greater than zero. In some embodiments, preferably, 0 ⁇ 15°.
  • the radiation inspection device 20 performs scanning inspection on the plurality of test objects 10 in a row including: changing the scanning speed of the radiation inspection device 20; and/or changing the beam exit frequency of the radiation source.
  • the radiation inspection method implemented by the present disclosure has the same advantages as the radiation inspection apparatus 20 of the embodiment of the present disclosure.
  • the radiation inspection device and the radiation inspection method of the above embodiments of the present disclosure can realize continuous scanning, reciprocating scanning, unilateral scanning, bilateral scanning, and small-angle scanning of multiple rows of objects.
  • the use efficiency of the radiation inspection equipment is improved; at the same time, the object can be scanned and imaged with more angles of view, so that more complete scanning information can be obtained, and the risk detection,
  • the accuracy of personal investigations has improved the ease of use of products.

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Abstract

一种辐射检查设备(20)和辐射检查方法。辐射检查设备(20)包括：辐射探测装置，包括射线源和与射线源配合以对被检物(10)进行扫描检查的探测器(50)，辐射探测装置具有用于被检物(10)在接受扫描检查时通过的检查通道(24)；和行走轮(27)，设置于辐射探测装置的底部，用于辐射检查设备(20)沿检查通道(24)的延伸方向行走，其中，行走轮(27)被配置为可旋转90°以使辐射检查设备(20)沿垂直于检查通道(24)的延伸方向的方向行走。辐射检查设备(20)和辐射检查方法，可以实现对多排被检物(10)的连续扫描检查，提高辐射检查设备(20)的使用效率。

Description

辐射检查设备和辐射检查方法
相关申请
本公开是以申请号为201910008952.0，申请日为2019年1月4日，发明名称为“辐射检查设备和辐射检查方法”的中国专利申请为基础，并主张其优先权，该中国专利申请的公开内容在此作为整体引入本公开中。
技术领域
本公开涉及辐射检查技术领域，特别涉及一种辐射检查设备和辐射检查方法。
背景技术
现有技术中，在利用射线针对如车辆、集装箱等被检物进行扫描检查的辐射检查技术领域，对被检物的检查扫描方式有单向扫描方式和双向扫描方式。这两种扫描方式均只可以对一排被检物进行扫描，无法实现对多排被检物进行连续扫描，辐射检查设备的使用效率较低。同时，在被检物不动的情况下，无法形成相反方向对被检物的辐射检查。另外，检查视角较为单一，不利于对被检物内复杂货物进行扫描图像分析。
发明内容
本公开的目的在于提供一种辐射检查设备和辐射检查方法。
本公开第一方面提供一种辐射检查设备，包括：
辐射探测装置，包括射线源和与所述射线源配合以对被检物进行扫描检查的探测器，所述辐射探测装置具有用于被检物在接受扫描检查时通过的检查通道；和
行走轮，设置于所述辐射探测装置的底部，用于所述辐射检查设备沿所述检查通道的延伸方向行走，其中，所述行走轮被配置为可旋转90°以使所述辐射检查设备沿垂直于所述检查通道的延伸方向的方向行走。
在一些实施例中，所述辐射检查设备可180°旋转调头。
在一些实施例中，所述射线源被配置为其发出的射线束与所述检查通道的延伸方向的夹角可变，所述探测器被配置为相应于所述射线束的角度变化改变位置。
在一些实施例中，所述射线源被配置为其发出的射线束与所述检查通道的延伸方向的夹角在90±θ°的范围内可变，其中0＜θ≤15°。
在一些实施例中，所述辐射探测装置包括透射检查装置，所述透射检查装置的所述射线源和所述探测器分设于所述检查通道的两侧并通过臂架连接，所述臂架带动所述探测器移动以使所述探测器相应于所述射线束的角度变化改变位置。
在一些实施例中，
所述辐射检查设备的扫描速度可变地设置；和/或
所述射线源的出束频率可变地设置。
本公开第二方面提供一种应用本公开第一方面任一项所述的辐射检查设备的辐射检查方法，包括：
所述辐射检查设备对一排成排的多个被检物进行扫描检查；
对一排成排的多个被检物完成扫描检查后，使所述辐射检查设备的行走轮原地转动90°并使所述辐射检查装置沿垂直于所述检查通道的延伸方向的方向行走至检查通道与另一排成排的多个被检物相对；
所述辐射检查设备对所述另一排成排的多个被检物进行扫描检查。
在一些实施例中，所述辐射检查设备对所述成排的多个被检物进行扫描检查包括使所述成排的多个被检物从所述检查通道的一端向另一端通过以对所述成排的被检物的第一侧进行扫描检查。
在一些实施例中，所述辐射检查设备对成排的多个被检物进行扫描检查还包括对所述成排的被检物的第一侧进行扫描检查完成后，使所述辐射检查设备进行180°旋转调头，并使所述成排的多个被检物从所述检查通道的所述另一端向所述一端通过以对所述成排的被检物的第二侧进行扫描检查。
在一些实施例中，所述辐射检查设备对成排的多个被检物进行扫描检查包括旋转所述辐射探测装置的所述射线源的射线束使所述射线束与所述检查通道的延伸方向的夹角变化，所述探测器相应于所述射线束的角度变化改变位置以对所述被检物进行不同角度的扫描检查。
在一些实施例中，使所述射线束与所述检查通道的延伸方向的夹角在90±θ°的范围内变化，其中，0＜θ≤15°。
在一些实施例中，所述辐射检查设备对成排的多个被检物进行扫描检查包括：
改变所述辐射检查设备的扫描速度；和/或
改变所述射线源的出束频率。
基于本公开提供的辐射检查设备和辐射检查方法，在完成对一排成排的多个被检 物(如第一排车辆)的扫描检查后，行走轮进行90°旋转，旋转到位后辐射检查设备整体在垂直于检查通道的延伸方向的方向(也称横向)移动，当辐射检查设备自动横向移动到另一排成排的多个被检物(如第二排车辆)处，再对行走轮进行90°旋转，然后对另一排成排的多个被检物进行扫描检查，依次执行前述步骤可以实现对多排被检物的连续扫描检查，提高辐射检查设备的使用效率。
通过以下参照附图对本公开的示例性实施例的详细描述，本公开的其它特征及其优点将会变得清楚。
附图说明
此处所说明的附图用来提供对本公开的进一步理解，构成本申请的一部分，本公开的示意性实施例及其说明用于解释本公开，并不构成对本公开的不当限定。在附图中：
图1为本公开一实施例的辐射检查设备在开始对一排成排的多个被检物进行扫描检查时的原理性结构示意图。
图2为图1所示实施例的辐射检查设备在对一排成排的多个被检物进行扫描检查完毕后横向行走至检查通道的延伸方向与另一排成排的多个被检物相对时的原理性结构示意图。
图3为本公开一实施例所示的辐射检查设备在对一排成排的多个被检物进行扫描检查时，完成对第一侧的扫描检查时的原理性结构示意图。
图4为图3所示辐射检查设备旋转调头至一定角度时的原理性结构示意图。
图5为本公开的一实施例的辐射检查设备的结构示意图。
图6至图10为图5所示的辐射检查设备在各行走轮处于不同转向角时的俯视结构示意图。
图11为本公开一实施例所示的辐射检查设备在对成排的多个被检物进行扫描检查过程中，射线源的射线束出束方向与检查通道的延伸方向垂直时的原理性结构示意图。
图12为图11所示的辐射检查设备在对成排的多个被检物进行扫描检查过程中，射线源的射线束出束方向朝向横向一侧偏转时的原理性结构示意图。
图13为图11所示的辐射检查设备在对成排的多个被检物进行扫描检查过程中，射线源的射线束出束方向朝向横向另一侧偏转时的原理性结构示意图。
具体实施方式
下面将结合本公开实施例中的附图，对本公开实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例仅仅是本公开一部分实施例，而不是全部的实施例。以下对至少一个示例性实施例的描述实际上仅仅是说明性的，决不作为对本公开及其应用或使用的任何限制。基于本公开中的实施例，本领域普通技术人员在没有作出创造性劳动前提下所获得的所有其他实施例，都属于本公开保护的范围。
除非另外具体说明，否则在这些实施例中阐述的部件和步骤的相对布置、数字表达式和数值不限制本公开的范围。同时，应当明白，为了便于描述，附图中所示出的各个部分的尺寸并不是按照实际的比例关系绘制的。对于相关领域普通技术人员已知的技术、方法和设备可能不作详细讨论，但在适当情况下，所述技术、方法和设备应当被视为授权说明书的一部分。在这里示出和讨论的所有示例中，任何具体值应被解释为仅仅是示例性的，而不是作为限制。因此，示例性实施例的其它示例可以具有不同的值。应注意到：相似的标号和字母在下面的附图中表示类似项，因此，一旦某一项在一个附图中被定义，则在随后的附图中不需要对其进行进一步讨论。
在本公开的描述中，需要理解的是，使用“第一”、“第二”等词语来限定零部件，仅仅是为了便于对相应零部件进行区别，如没有另行声明，上述词语并没有特殊含义，因此不能理解为对本公开保护范围的限制。
在本公开的描述中，需要理解的是，方位词如“前、后、上、下、左、右”、“横向、竖向、垂直、水平”和“顶、底”等，仅是为了便于描述本公开和简化描述，在未作相反说明的情况下，这些方位词并不指示和暗示所指的装置或元件必须具有特定的方位或者以特定的方位构造和操作，因此不能理解为对本公开保护范围的限制；方位词“内、外”是指相对于各部件本身的轮廓的内外。
图1至图13示出了本公开实施例的辐射检查设备20的结构和工作原理。
如图1至图13所示，本公开实施例的辐射检查设备20主要包括辐射探测装置和行走轮。
辐射探测装置包括射线源和与射线源配合以对被检物10进行扫描检查的探测器，辐射探测装置具有用于被检物10在接受扫描检查时通过的检查通道。其中“通过”是被检物10相对于辐射检查装置而言的通过，即可以是辐射检查设备20静止而被检物10移动，也可以是辐射检查设备20移动而被检物10静止，还可以是辐射检查设备20和被检物10同时移动。
如图1至图4所示，行走轮设置于辐射探测装置的底部，用于辐射检查设备20沿检查通道的延伸方向行走。如图1和图2所示，行走轮被配置为可旋转90°以使辐射检查设备20沿垂直于检查通道的延伸方向的方向行走。
本公开的辐射检查设备20，在完成对一排成排的多个被检物10(如第一排车辆)的扫描检查后，行走轮进行90°旋转，旋转到位后辐射检查设备20整体在垂直于检查通道的延伸方向的方向(也称横向，检查通道的延伸方向作为纵向)移动，当辐射检查设备20自动横向移动到另一排成排的多个被检物10(如第二排车辆)处，再对行走轮进行90度旋转，然后对另一排成排的多个被检物10进行扫描检查，依次执行前述步骤可以实现对多排被检物10的连续扫描检查，提高辐射检查设备20的使用效率。
其中被检物10可以是车辆、集装箱或其它货物等。
如图3和图4所示，辐射检查设备20可180°旋转调头。该设置可以使辐射检查设备20在完成对被检物10的一次扫描检查后，进行180度旋转，再次对被检物10进行扫描检查，使射线源分别从正向和反向对被检物10进行扫描检查，形成两幅不同视角的扫描图像，从而实现对被检物10的双侧扫描。
图5为本公开一实施例的辐射检查设备20的结构示意图。如图5所示，辐射检查设备20包括第一车体21、第二车体22、射线源、臂架23和探测器。第一车体21、第二车体22和臂架23形成的门形结构及其在纵向的延长区域形成供被检物10在接受扫描检查时通过的检查通道24。射线源设置在第一车体21中，用于发射高能量的射线束，例如X射线或γ射线等。探测器50可设置在臂架23和/或第一车体21上，用于接收来自射线源发出的射线束。
参考图5，辐射检查设备20还包括四个行走轮27，四个行走轮27两两分组设置于第一车体21和第二车体22上。本实施例中，各行走轮27均可以沿正时针方向及逆时针方向旋转至少90度，并且各行走轮27均为驱动轮。各行走轮27可通过行走电机驱动实现行走功能，而通过转动电机驱动实现转向功能。驱动电机和转动电机可采用伺服电机。
为了实现辐射检查设备20的控制，辐射检查设备20可以包括控制器，用于对各行走轮的转速和转向角进行控制。在一些实施例中，控制器可接收检测装置提供的所述第一车体21和所述第二车体22的状态参数，以便根据所述状态参数对各行走轮27的转速和转向角进行控制。在另一些实施例中，控制器也可接收来自远程控制平台(例 如工控机等)或者遥控器的控制指令，来对各行走轮27的转速和转向角进行控制。
检测装置可以包括角度编码器、加速度仪、陀螺仪等，以检测驱动轮或辐射检查设备20的运动速度、加速度、转动角度、转动角速度、角加速度等，也可以包括基于红外、激光、超声、视觉、地埋磁条或GPS等的定位元件等，以便获取驱动轮或辐射检查设备20的位置、姿态等。这些检测装置可设置在辐射检查设备20内。检测装置还可以包括设置在辐射检查设备20的外部的检测元件，例如设置在场地内的摄像元件等。通过检测装置可采集辐射检查设备20的当前运动位置、运动速度/加速度、运动姿态等状态参数，以供远程控制平台或辐射检查设备20内的控制器进行控制。
行走轮的数量不限于四个，只要能实现本公开要求的功能，可以为其它数量。
图6至图10为图5所示的辐射检查设备在各行走轮处于不同角度时的俯视结构示意图。
图6中，四个行走轮27的行走方向与检查通道24的延伸方向相同。图6中四个行走轮27的方向为辐射检查设备在检查被检物过程中沿被检物的排列方向行走时的状态。
图7中四个行走轮27的行走方向与检查通道的延伸方向垂直。即图7相对于图6而言，行走轮27旋转90°，从而可以使辐射检查设备20沿垂直于检查通道24的延伸方向的方向行走。
图8至图10所示的行走轮的转动角度，均可以实现辐射检查设备的掉头。
图8与图6相比，四个行走轮中位于射线束一侧的两个行走轮相对于检查通道24的延伸方向朝向同一方向倾斜。
图9与图6相比，四个行走轮27中相对于检查通道24的延伸方向均倾斜，位于射线束一侧的两个行走轮倾斜方向相同，位于射线束另一侧的两个行走轮27倾斜方向相同但与另两个行走轮27倾斜方向相反。
图10与图6相比，四个行走轮的外侧(远离射线束的一侧)均朝向靠近检查通道24的延伸方向倾斜。图10中各行走轮27的转向角的设置与图8和图9的行走轮27的转向角相比可以实现旋转。
图11为本公开一实施例所示的辐射检查设备20在对成排的多个被检物10进行扫描检查过程中，射线源的射线束出束方向与检查通道的延伸方向垂直时的原理性结构示意图。图12为图11所示的辐射检查设备20在成排的多个被检物10进行扫描检查过程中，射线源的射线束出束方向朝向横向一侧偏转时的原理性结构示意图。图13 为图11所示的辐射检查设备20在对成排的多个被检物10进行扫描检查过程中，射线源的射线束出束方向朝向横向另一侧偏转时的原理性结构示意图。
如图11至图13所示，射线源被配置为其发出的射线束与检查通道的延伸方向的夹角可变，探测器被配置为相应于射线束的角度变化改变位置。在一些实施例中优选地射线束与检查通道的延伸方向的夹角在90±θ°的范围内可变，其中θ为大于零的锐角，例如0＜θ≤15°。
该辐射检查设备20在对被检物10进行扫描检查的过程中，可以使辐射源的射线束在90±θ°的范围内变化，从而在同一扫描位置形成对被检物10的不同视角的扫描图像，可以实现对被检物10的小角度扫描，利于获取被检物10的更详细的局部扫描信息。
如图11至图13所示，在一些实施例中，辐射探测装置包括透射检查装置，透射检查装置的射线源和探测器分设于检查通道的两侧并通过臂架连接。臂架带动探测器移动以使探测器相应于射线束的角度变化改变位置。
在图11至图13中，射线源设置于第一车体21，探测器设置于臂架23。第一车体21、第二车体22和臂架23构成的门式框架及其在纵向的延长区域形成供被检物10在接受扫描检查时通过的检查通道24。
在一些实施例中，辐射检查设备20的扫描速度可变地设置；和/或射线源的出束频率可变地设置。该设置利于根据检查需要得到相应清晰度的扫描图像。例如，可以对辐射检查设备20和射线源分别设置在对被检物10进行扫描检查时经常采用的标准扫描速度和标准出束频率，在辐射检查设备20对被检物10进行标准扫描速度或出束频率的基础上，通过降低扫描速度和/或增加射线源的出束频率实现对被检物10的精细扫描，从而形成更加清晰的扫描图像。
本公开实施例还提供一种应用本公开的辐射检查设备20的辐射检查方法，包括：
辐射检查设备20对一排成排的多个被检物10进行扫描检查；
对一排成排的多个被检物10完成扫描检查后，使辐射检查设备20的行走轮原地转动90°并使辐射检查装置沿垂直于检查通道的延伸方向的方向(横向)行走至检查通道与另一排成排的多个被检物10相对；
辐射检查设备20对另一排成排的多个被检物10进行扫描检查。
在一些实施例中，辐射检查设备20对成排的多个被检物10进行扫描检查包括使成排的多个被检物10从检查通道的一端向另一端通过以对成排的被检物10的第一侧 进行扫描检查。
在一些实施例中，辐射检查设备20对成排的多个被检物10进行扫描检查还包括对成排的被检物10的第一侧进行扫描检查完成后，使辐射检查设备20进行180°旋转调头，并使成排的多个被检物10从检查通道的前述另一端向前述一端通过以对成排的被检物10的第二侧进行扫描检查。
本公开实施例的辐射检查设备20和辐射检查方法既可以实现对被检物10的单侧辐射检查，形成对被检物10的单侧扫描图像，也可以实现对被检物10的双侧扫描检查，形成对被检物10的双侧扫描图像。
在一些实施例中，辐射检查设备20对成排的多个被检物10进行扫描检查包括旋转辐射探测装置的射线源的射线束使射线束与检查通道的延伸方向的夹角变化，探测器相应于射线束的角度变化改变位置以对被检物10进行不同角度的扫描检查。在一些实施例中，射线束与检查通道的延伸方向的夹角在90±θ°的范围内变化，θ为大于零的锐角。在一些实施例中优选地，0＜θ≤15°。
在一些实施例中，辐射检查设备20对成排的多个被检物10进行扫描检查包括：改变辐射检查设备20的扫描速度；和/或改变射线源的出束频率。
本公开实施的辐射检查方法与本公开实施例的辐射检查设备20具有对应相同的优点。
本公开以上实施例的辐射检查装置和辐射检查方法可以实现对多排被检物连续扫描、往复扫描、单侧扫描、双侧扫描、小角度扫描。与现有辐射检查设备和辐射检查方法相比，提高了辐射检查设备的使用效率；同时，可以以更多视角对被检物进行扫描成像，从而可以获得更加完整的扫描信息，提高查危、查私的准确率，提升了产品易用性。
最后应当说明的是：以上实施例仅用以说明本公开的技术方案而非对其限制；尽管参照较佳实施例对本公开进行了详细的说明，所属领域的普通技术人员应当理解：依然可以对本公开的具体实施方式进行修改或者对部分技术特征进行等同替换，其均应涵盖在本公开请求保护的技术方案范围当中。

Claims (12)

  1. 一种辐射检查设备，包括：
    辐射探测装置，包括射线源和与所述射线源配合以对被检物(10)进行扫描检查的探测器，所述辐射探测装置具有用于被检物(10)在接受扫描检查时通过的检查通道；和
    行走轮，设置于所述辐射探测装置的底部，用于所述辐射检查设备(20)沿所述检查通道的延伸方向行走，其中，所述行走轮被配置为可旋转90°以使所述辐射检查设备(20)沿垂直于所述检查通道的延伸方向的方向行走。
  2. 根据权利要求1所述的辐射检查设备，其中所述辐射检查设备(20)可180°旋转调头。
  3. 根据权利要求1所述的辐射检查设备，其中所述射线源被配置为其发出的射线束与所述检查通道的延伸方向的夹角可变，所述探测器被配置为相应于所述射线束的角度变化改变位置。
  4. 根据权利要求3所述的辐射检查设备，其中所述射线源被配置为其发出的射线束与所述检查通道的延伸方向的夹角在90±θ°的范围内可变，其中0＜θ≤15°。
  5. 根据权利要求3所述的辐射检查设备，其中所述辐射探测装置包括透射检查装置，所述透射检查装置的所述射线源和所述探测器分设于所述检查通道的两侧并通过臂架连接，所述臂架带动所述探测器移动以使所述探测器相应于所述射线束的角度变化改变位置。
  6. 根据权利要求1所述的辐射检查设备，其中，
    所述辐射检查设备(20)的扫描速度可变地设置；和/或
    所述射线源的出束频率可变地设置。
  7. 一种应用权利要求1至6任一所述的辐射检查设备的辐射检查方法，包括：
    所述辐射检查设备(20)对一排成排的多个被检物(10)进行扫描检查；
    对一排成排的多个被检物(10)完成扫描检查后，使所述辐射检查设备(20)的行走轮原地转动90°并使所述辐射检查装置沿垂直于所述检查通道的延伸方向的方向行走至检查通道与另一排成排的多个被检物(10)相对；
    所述辐射检查设备(20)对所述另一排成排的多个被检物(10)进行扫描检查。
  8. 根据权利要求7所述的辐射检查方法，其中所述辐射检查设备(20)对所述成排的多个被检物(10)进行扫描检查包括使所述成排的多个被检物(10)从所述检查通道的一端向另一端通过以对所述成排的被检物(10)的第一侧进行扫描检查。
  9. 根据权利要求8所述的辐射检查方法，其中所述辐射检查设备(20)对成排的多个被检物(10)进行扫描检查还包括对所述成排的被检物(10)的第一侧进行扫描检查完成后，使所述辐射检查设备(20)进行180°旋转调头，并使所述成排的多个被检物(10)从所述检查通道的所述另一端向所述一端通过以对所述成排的被检物(10)的第二侧进行扫描检查。
  10. 根据权利要求7所述的辐射检查方法，其中所述辐射检查设备(20)对成排的多个被检物(10)进行扫描检查包括旋转所述辐射探测装置的所述射线源的射线束使所述射线束与所述检查通道的延伸方向的夹角变化，所述探测器相应于所述射线束的角度变化改变位置以对所述被检物(10)进行不同角度的扫描检查。
  11. 根据权利要求10所述的辐射检查方法，其中使所述射线束与所述检查通道的延伸方向的夹角在90±θ°的范围内变化，其中，0＜θ≤15°。
  12. 根据权利要求7所述的辐射检查方法，其中所述辐射检查设备(20)对成排的多个被检物(10)进行扫描检查包括：
    改变所述辐射检查设备(20)的扫描速度；和/或
    改变所述射线源的出束频率。
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