WO2019230166A1 - 被覆切削工具及びその製造方法 - Google Patents
被覆切削工具及びその製造方法 Download PDFInfo
- Publication number
- WO2019230166A1 WO2019230166A1 PCT/JP2019/013106 JP2019013106W WO2019230166A1 WO 2019230166 A1 WO2019230166 A1 WO 2019230166A1 JP 2019013106 W JP2019013106 W JP 2019013106W WO 2019230166 A1 WO2019230166 A1 WO 2019230166A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- side single
- cutting tool
- substrate
- layer
- coated cutting
- Prior art date
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23B—TURNING; BORING
- B23B27/00—Tools for turning or boring machines; Tools of a similar kind in general; Accessories therefor
- B23B27/14—Cutting tools of which the bits or tips or cutting inserts are of special material
- B23B27/148—Composition of the cutting inserts
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23B—TURNING; BORING
- B23B51/00—Tools for drilling machines
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23C—MILLING
- B23C5/00—Milling-cutters
- B23C5/16—Milling-cutters characterised by physical features other than shape
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/0021—Reactive sputtering or evaporation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0641—Nitrides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0641—Nitrides
- C23C14/0647—Boron nitride
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/32—Vacuum evaporation by explosion; by evaporation and subsequent ionisation of the vapours, e.g. ion-plating
- C23C14/325—Electric arc evaporation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C28/00—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
- C23C28/04—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D only coatings of inorganic non-metallic material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C28/00—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
- C23C28/04—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D only coatings of inorganic non-metallic material
- C23C28/042—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D only coatings of inorganic non-metallic material including a refractory ceramic layer, e.g. refractory metal oxides, ZrO2, rare earth oxides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C28/00—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
- C23C28/04—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D only coatings of inorganic non-metallic material
- C23C28/044—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D only coatings of inorganic non-metallic material coatings specially adapted for cutting tools or wear applications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C28/00—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
- C23C28/40—Coatings including alternating layers following a pattern, a periodic or defined repetition
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C28/00—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
- C23C28/40—Coatings including alternating layers following a pattern, a periodic or defined repetition
- C23C28/42—Coatings including alternating layers following a pattern, a periodic or defined repetition characterized by the composition of the alternating layers
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C30/00—Coating with metallic material characterised only by the composition of the metallic material, i.e. not characterised by the coating process
- C23C30/005—Coating with metallic material characterised only by the composition of the metallic material, i.e. not characterised by the coating process on hard metal substrates
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23B—TURNING; BORING
- B23B2228/00—Properties of materials of tools or workpieces, materials of tools or workpieces applied in a specific manner
- B23B2228/10—Coatings
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23B—TURNING; BORING
- B23B2228/00—Properties of materials of tools or workpieces, materials of tools or workpieces applied in a specific manner
- B23B2228/10—Coatings
- B23B2228/105—Coatings with specified thickness
Definitions
- the present invention relates to a coated cutting tool that exhibits excellent wear resistance and a method for producing the same.
- This application claims priority on May 30, 2018 based on Japanese Patent Application No. 2018-103480 for which it applied to Japan, and uses the content here.
- Patent Document 1 includes, on a base material, a first film-forming layer made of (AlCrB) N or (AlCrB) CN and inevitable impurities, and SiN, SiCN, CN or CNB and inevitable impurities.
- a coated cutting tool having a multilayer coating layer in which two or more second film-forming layers are alternately laminated is disclosed.
- Patent Document 2 JP-T-2018-505310 sequentially laminates a base layer 212 made of (AlCr) N, an A layer made of (AlCrB) N, and a B layer made of (AlCr) N on a base material. And a coating (paragraphs 0022, 0024, FIG. 2) having a multilayer film 216 and an outermost layer 220 made of (AlCrB) N.
- Patent Document 3 discloses a multilayer coating system (paragraph 0014) having a multilayer structure in which (AlCrB) N individual layers and (TiAl) N individual layers are alternately laminated on a base material. doing.
- Patent Document 4 discloses that a (TiB) N film and a (TiAlN) -based hard film or (CrAl) N-based hard film excellent in oxidation resistance are laminated to form a multilayer structure. (Paragraph 0017).
- Both the multilayer coating system described in Patent Document 3 and the coated tool described in Patent Document 4 lack the laminated portion (combination of a layer and b layer) according to the present invention, and flank wear and rake surface wear. Cannot be controlled in a well-balanced manner.
- an object of the present invention is to provide a new and high-performance coated cutting tool that exhibits superior wear resistance compared to a conventional coated cutting tool on which an (AlCr) N coating or a (TiB) N coating is formed, and a method for manufacturing the same. Is to provide.
- the coated cutting tool of the present invention is a coated cutting tool having a hard film on a substrate, and has a substrate-side single layer part and a laminated part in order from the substrate side as the hard film, and the substrate-side single layer part Is a nitride-based hard film containing at most Al in the proportion of metal (including metalloid) element, the total content ratio (atomic ratio) of Al and Cr being 0.9 or more, and containing at least B
- Ti is the largest in the ratio of metal (including metalloid) element, and a nitride-based a layer containing at least B, and Al in the ratio of metal (including metalloid) element.
- the most and the nitride-based b layers containing at least Cr and B are alternately laminated, and the laminating period in the film thickness direction of the a layer and the b layer is 5 to 100 nm.
- the thickness (t1) of the substrate-side single layer portion is 1.0 to 5 ⁇ m
- the overall thickness (t2) of the laminated portion is 0.5 to 2.5 ⁇ m.
- the film thickness ratio (t1 / t2) between the side single-layer part and the entire laminated part is preferably 1.0 to 5.
- the coated cutting tool has a surface-side single layer portion on the laminated portion, and the film thickness (t3) of the surface-side single layer portion is 0.3 to 5 ⁇ m, and the substrate-side single layer portion, the laminated portion, and The X-ray diffraction pattern of the portion composed of the surface-side single layer portion has an fcc single structure, and the surface-side single layer portion has the largest amount of Al in the proportion of metal (including semimetal) elements, and Al and Cr
- the total content ratio (atomic ratio) is preferably 0.9 or more, and is preferably composed of a nitride-based hard film containing at least B.
- (111) is preferably 0.2 to 0.37.
- (111) is preferably 0.03 to 0.15.
- the manufacturing method of the coated cutting tool of the present invention is a method of manufacturing the coated cutting tool by an arc ion plating method, and the target for forming the base-side single-layer part and the b-layer excludes inevitable impurities.
- the method for manufacturing a coated cutting tool includes a step of forming a surface-side single layer portion on a laminated portion, and a bias voltage applied to the base material when forming the surface-side single layer portion is set to ⁇ 160 to ⁇ 100V. It is preferable.
- the same AlCrB alloy or AlCrBC alloy as the base-side single-layer part as the target for forming the surface-side single-layer part.
- an arc current is simultaneously applied to the formation target for the a layer and the formation target for the b layer in forming the laminated portion.
- the coated cutting tool of the present invention has a hard film on a base material, and has a base material side single layer part and a laminated part in order from the base material side as the hard film.
- Al is the most in the proportion of elements (including metalloid), the total content ratio (atomic ratio) of Al and Cr is 0.9 or more, and consists of a nitride-based hard film containing at least B, and is laminated
- the portion has the largest amount of Ti in the proportion of metal (including metalloid) element, and a nitride-based a layer containing at least B, and the largest amount of Al in the proportion of metal (including metalloid) element, and
- the nitride-based b layers containing at least Cr and B are alternately laminated, and the laminating period in the film thickness direction of the a layer and the b layer is 5 to 100 nm.
- the X-ray diffraction pattern of the portion composed of the portion has a single structure of fcc. For this reason, flank wear and rake face wear are suppressed in a well-balanced manner as compared with the conventional coated cutting tool on which the (AlCr) N film or (TiB) N film is formed. By this action, the coated cutting tool of the present invention has high performance and long life.
- the novel and high-performance coated cutting tool of the present invention can be provided.
- FIG. 2 is a scanning electron microscope (SEM) photograph (magnification of 20,000 times) showing a cross section of the coated cutting tool of Example 1.
- FIG. It is a scanning electron microscope (SEM) photograph (magnification 20,000 times) which shows the section of the covering cutting tool of Example 4.
- SEM scanning electron microscope
- 2 is a dark field image (magnification: 1,600,000 times) by a transmission electron microscope (TEM) in which the laminated portion of Example 1 is enlarged.
- TEM transmission electron microscope
- It is a perspective view which shows an example of the insert base material which comprises the coated cutting tool of this invention.
- It is the schematic which shows an example of the blade-tip-exchange-type rotary tool equipped with the insert.
- the coated cutting tool of the present embodiment has a hard film on a base material, and has a base material side single layer part and a laminated part in order from the base material side as the hard film.
- the layer part is mainly composed of nitride in the proportion of metal (including metalloid) element, the total content ratio (atomic ratio) of Al and Cr is 0.9 or more, and contains at least B. It consists of a hard film.
- the laminated portion has the largest amount of Ti in the proportion of the metal (including metalloid) element and the largest amount of Al in the nitride-based a layer containing at least B and the proportion of the metal (including metalloid) element,
- the nitride-based b layers containing at least Cr and B are alternately laminated.
- the lamination period of the a layer and the b layer in the film thickness direction is 5 to 100 nm.
- the X-ray diffraction pattern of the portion composed of the substrate-side single layer portion and the laminated portion has a single fcc structure.
- FIG. 2 is a schematic diagram showing an example of a cross section of the coated cutting tool 40 of the embodiment.
- the coated cutting tool 40 includes a base material 31, a modified layer 32 provided on the surface of the base material 31 as necessary, and a base material side single layer portion 33 and a laminated portion 34 that are sequentially provided on the modified layer 32. And having.
- the stacked unit 34 is a layer in which a layers and b layers are alternately deposited in the above-described stacking cycle.
- the coated cutting tool 40 has a hard coating composed of at least the base-material-side single layer portion 33 and the laminated portion 34.
- the coated cutting tool 40 may have a hard coating composed of the substrate-side single layer portion 33, the laminated portion 34, and the surface-side single layer portion 35.
- the X-ray diffraction pattern of the hard coating portion preferably has a single fcc structure.
- the substrate needs to be a material that is rich in heat resistance and to which physical vapor deposition can be applied.
- the material of the substrate include cemented carbide, cermet, high speed steel, tool steel, and ceramics such as cubic boron nitride (cBN).
- the material of the substrate is preferably a cemented carbide substrate or a ceramic substrate from the viewpoints of strength, hardness, wear resistance, toughness, thermal stability, and the like.
- the cemented carbide is composed of tungsten carbide particles and a binder phase of Co or an alloy mainly containing Co.
- the content of the binder phase is preferably 1 to 13.5 mass% and more preferably 3 to 13 mass% with respect to the total content (100 mass%) of tungsten carbide and the binder phase.
- the content of the binder phase in the cemented carbide is less than 1% by mass, the toughness is insufficient, and when it exceeds 13.5% by mass, the hardness (wear resistance) is insufficient.
- the hard film of this embodiment can be formed on any of the unprocessed surface, the polished surface, and the blade edge processing surface of the sintered base material.
- (B) Modified layer of cemented carbide substrate When the substrate is cemented carbide, the surface of the substrate is irradiated with ions generated from a TiB alloy target (hereinafter also referred to as ion bombardment), and an average thickness of 1 to It is preferable to form a modified layer having a 10 nm fcc structure.
- the main component tungsten carbide has an hcp structure, but the modified layer has the same fcc structure as the single-layer part on the substrate side.
- the cemented carbide base material and the modified layer preferably have a portion of preferably 30% or more, more preferably 50% or more, particularly preferably 70% or more of crystal lattice stripes at the boundary (interface) between them. With this structure, the substrate of the cemented carbide and the substrate-side single layer portion are firmly adhered to each other through the modified layer.
- the modified layer having an fcc structure is formed in a high-density thin layer, so that it is unlikely to become a starting point for fracture. If the average thickness of the modified layer is less than 1 nm, the effect of improving the adhesion of the hard coating to the substrate cannot be obtained sufficiently, and if it exceeds 10 nm, the adhesion is adversely affected.
- the average thickness of the modified layer is more preferably 2 to 9 nm.
- composition (a) Base-side single-layer part and surface-side single-layer part Both the base-side single-layer part and the surface-side single-layer part of this embodiment are metals (including semimetals). )
- Al is the most in terms of element ratio, the total content ratio (atomic ratio) of Al and Cr is 0.9 or more, and consists of a nitride-based hard film containing at least B.
- the total content ratio (atomic ratio) of Al and Cr is 0.9 or more, the wear resistance of the coating is improved.
- the total content ratio (atomic ratio) of Al and Cr is preferably 0.90 to 0.99, and the Al content ratio (atomic ratio) is 0.5 or more.
- the content ratio (atomic ratio) of B is preferably 0.01 or more.
- the wear resistance decreases.
- “Nitride-based” means that the content ratio (atomic ratio) of N is 0.5 or more with respect to the total content ratio (atomic ratio) of non-metallic elements of 1;
- the ratio (atomic ratio) is preferably 0.6 or more.
- the composition of the coating is the following general formula: (Al x Cr 1-x-y B y) N 1-e-f C e O f (although, x, 1-x-y , y, 1-e-f, e and f, respectively Al, Cr, B, A numerical value that represents the atomic ratio of N, C, and O, and satisfies 0.5 ⁇ x ⁇ 0.75, 0.01 ⁇ y ⁇ 0.1, 0 ⁇ e ⁇ 0.03, and 0 ⁇ f ⁇ 0.010 Is preferred.)
- the contents of metal (including metalloid elements), N and O can be analyzed by using EPMA and TEM-EDS (hereinafter also referred to as EDS) described later in combination.
- EDS TEM-EDS
- the range of the atomic ratio x of Al is preferably 0.5 to 0.75. If x is less than 0.5, the content of Al is too small, so that the oxidation resistance of the film is impaired. On the other hand, when x exceeds 0.75, a soft crystal phase of hcp structure is formed in the film and the wear resistance is impaired. More preferably, x is 0.50 to 0.74.
- the range of Cr atomic ratio 1-xy is preferably 0.49 to 0.15. If 1-xy is less than 0.15, the Al content is too high, so that a soft crystal phase of hcp structure is formed in the film and wear resistance is impaired. On the other hand, if 1-xy exceeds 0.49, the content of Al in the coating becomes too low, and the oxidation resistance is impaired. 1-xy is more preferably 0.49 to 0.18.
- the range of the atomic ratio y of B is preferably 0.01 to 0.1. If y is less than 0.01, the effect of addition cannot be obtained, and the lubricity of the film is impaired. On the other hand, if y exceeds 0.1, the film becomes brittle. More preferably, y is 0.01 to 0.08.
- the atomic ratio 1-ef of N contained in the (AlCrB) N film, (AlCrB) NO film, and (AlCrB) NCO film of this embodiment is preferably 1 to 0.96.
- 1-ef is out of the specific range, the wear resistance of the film tends to be lowered. More preferably, 1-ef is 0.998 to 0.96.
- the atomic ratio f of O contained in the (AlCrB) N coating, (AlCrB) NO coating, and (AlCrB) NCO coating of this embodiment is preferably 0.010 or less. When f exceeds 0.010, the oxygen content becomes excessive, and the wear resistance of the film tends to be lowered. More preferably, f is 0.002 to 0.010.
- the atomic ratio e of C contained in the (AlCrB) NCO film of this embodiment is preferably 0.03 or less. When e exceeds 0.03, the wear resistance of the film is lowered. In order to improve the wear resistance of the film, e is more preferably 0.01 to 0.03. In the case of the (AlCrB) N film and the (AlCrB) NO film, e is allowed to have an inevitable impurity level of less than 0.01 (for example, about 0.001 to 0.009).
- the laminate part of the present embodiment includes a nitride-based a layer containing the largest amount of Ti and at least B in the proportion of metal (including metalloid) element, and metal (including metalloid).
- Al is the most in the ratio of elements, and at least Cr and B-containing nitride-based b layers are alternately stacked.
- the Ti content ratio (atomic ratio) is preferably 0.65 or more
- the B content ratio (atomic ratio) is preferably 0.01 or more.
- the Al content ratio (atomic ratio) is preferably 0.42 or more
- the Cr content ratio (atomic ratio) is preferably 0.1 or more
- Niride-based means that the content ratio (atomic ratio) of N is 0.5 or more with respect to the total content ratio (atomic ratio) of non-metallic elements of 1; The ratio (atomic ratio) is preferably 0.6 or more.
- composition of the metal (including metalloid) element of the a layer is represented by the following general formula: (Ti 1-pqr B p Al q Cr r ) (where 1-pq- r, p, q, and r represent the atomic ratio of Ti, B, Al, and Cr, respectively, 0.01 ⁇ p ⁇ 0.05, 0.02 ⁇ q ⁇ 0.2, and 0.01 ⁇ r ⁇ 0. Is a number satisfying .1).
- the atomic ratio 1-pqr of Ti is preferably 0.96 to 0.65. When 1-pqr is out of the specific range, the rake face wear resistance of the coating is lowered. 1-pqr is more preferably 0.96 to 0.8.
- B The atomic ratio p of B is preferably 0.01 to 0.05. When p is out of the specific range, the rake face wear resistance of the coating is lowered. More preferably, p is 0.01 to 0.03.
- the atomic ratio q of Al is preferably 0.02 to 0.2. When q is out of the specified range, the rake face wear resistance of the coating is lowered. More preferably, q is 0.02 to 0.12.
- the atomic ratio r of Cr is preferably 0.01 to 0.1. When r is out of the specific range, the rake face wear resistance of the film is lowered. More preferably, r is 0.01 to 0.05.
- composition of the metal (including metalloid) element of the b layer is the following general formula: (Al 1 ⁇ s ⁇ t ⁇ Cr Cr s B t Ti u ) except for inevitable impurities (where 1 ⁇ s ⁇ t ⁇ u, s, t, and u represent atomic ratios of Al, Cr, B, and Ti, respectively, and 0.1 ⁇ s ⁇ 0.4, 0.01 ⁇ t ⁇ 0.08, and 0.03 ⁇ u ⁇ . Is a number satisfying 0.1).
- the atomic ratio 1-stu of Al is preferably 0.86 to 0.42. When 1-st-u is out of the specific range, the flank wear resistance of the coating is lowered. 1-pqr is more preferably 0.84 to 0.44.
- the atomic ratio s of Cr is preferably 0.1 to 0.4. When s is out of the specific range, the flank wear resistance of the film is lowered. More preferably, s is from 0.12 to 0.40.
- the atomic ratio t of B is preferably 0.01 to 0.08. When t is out of the specific range, the flank wear resistance of the coating is lowered. t is more preferably 0.01 to 0.07.
- the atomic ratio u of Ti is preferably 0.03 to 0.1. When u is out of the specific range, the flank wear resistance of the coating is lowered. u is more preferably 0.03 to 0.09.
- Both a layer and b layer are hard films mainly composed of nitride.
- N is mainly used for the content ratio (atomic ratio) of N, C and O in the a layer and the b layer. That is, in the a layer and the b layer, the content ratio (atomic ratio) of N is 0.5 or more with respect to the total content ratio (atomic ratio) of N, C, and O, and in a preferred example, the content of N The ratio (atomic ratio) was 0.6 or more. For this reason, in Tables 5 and 6 to be described later, the composition of the a layer and the b layer is shown only by the composition of the metal (including metalloid) element.
- the film thickness (t1) of the base material side single layer part of this embodiment is larger than the film thickness (t2) of the whole laminated part. Further, t1 is preferably 1.0 to 5 ⁇ m. When t1 is less than 1.0 ⁇ m, the flank wear is likely to proceed, and when it exceeds 5 ⁇ m, the adhesion of the substrate-side single layer portion is significantly reduced. It is more preferable that t1 is 1.2 to 5.0 ⁇ m.
- the total film thickness (t2) of the laminated part is preferably 0.5 to 2.5 ⁇ m. If t2 is less than 0.5 ⁇ m, rake face wear tends to proceed, and if it exceeds 2.5 ⁇ m, the adhesion of the laminated portion is reduced. More preferably, t2 is 0.8 to 2.2 ⁇ m.
- the film thickness (t3) of the surface-side single layer part in this embodiment is preferably 0.3 to 5 ⁇ m. If t3 is less than 0.3 ⁇ m, the effect of suppressing flank wear cannot be obtained, and if it exceeds 5 ⁇ m, the adhesion between the surface-side single layer portion 35 and the laminated portion 34 is significantly reduced. More preferably, t3 is 0.5 to 4.5 ⁇ m.
- the film thickness ratio (t1 / t2) between the substrate-side single layer portion and the entire laminated portion of this embodiment is preferably 1.0 to 5.
- the film thickness ratio (t3 / t2) between the surface-side single layer portion and the entire laminated portion is preferably 0.3 to 4.
- the ratio (t1 + t3) / t2 of the total film thickness of the substrate-side single layer part and the surface-side single layer part of the present embodiment and the total film thickness of the laminated part is preferably 1.0 to 10. If the respective film thickness ratios t1 / t2, t3 / t2, and (t1 + t3) / t2 are out of the specific ranges, it becomes difficult to achieve both excellent flank wear resistance and rake face wear resistance. More preferably, t1 / t2 is 1.2-5. More preferably, t3 / t2 is 0.5-3. (T1 + t3) / t2 is more preferably 1.2 to 8.
- the film thickness (ta) of the a layer and the film thickness (tb) of the b layer constituting the laminated portion of this embodiment are both 3 to 30 nm.
- ta and tb are out of the specific range, it is difficult to achieve both excellent flank wear resistance and rake face wear resistance. More preferably, both ta and tb are 4 to 28 nm.
- the film thickness ratio (t3 / t1) between the surface-side single layer part and the substrate-side single layer part is preferably 0.1 to 1.5.
- t3 / t1 is out of the above specific range, it becomes difficult to achieve both excellent flank wear resistance and rake face wear resistance. More preferably, t3 / t1 is 0.2 to 1.2.
- Thickness of the non-flat substrate-side single-layer part, laminated part and surface-side single-layer part means “arithmetic average thickness”.
- the laminating period T of the a layer and the b layer of the laminated part of the present embodiment is as follows. As shown in FIG. It is the distance (thickness) in the film thickness direction to the upper end of. T is 5 to 100 nm. When T is less than 5 nm or more than 100 nm, the wear resistance of the film is lowered. T is preferably 10 to 90 nm, and more preferably 20 to 80 nm. In the laminated portion, the boundary between the a layer and the b layer may become unclear due to mutual diffusion between the a layer and the b layer.
- the stacking period T is the distance in the stacking direction of two a layers arranged with the b layer sandwiched between three adjacent layers (for example, a layer, b layer, and a layer stacked in order) in the stacking portion. Can also be measured.
- the distance between the two a layers is a distance connecting midpoints in the thickness direction of the respective a layers.
- the X-ray diffraction pattern of the hard film portion composed of the substrate-side single layer portion and the laminated portion of this embodiment has a single fcc structure. Furthermore, it is preferable that the X-ray diffraction pattern of the portion of the hard coating composed of the substrate-side single layer portion, the laminate portion, and the surface-side single layer portion of this embodiment has a single fcc structure. That is, when the hard coating portion of the present embodiment is an fcc crystal phase, it contributes to higher performance and longer life as a coated cutting tool. As long as it does not appear in the X-ray diffraction pattern, a fine phase other than fcc may exist in the hard coating.
- the crystal structure of only the laminated part can be identified by electron diffraction (TEM) capable of detecting a microphase.
- TEM electron diffraction
- the laminated portion preferably has fcc as the main structure, and more preferably has a single structure of fcc.
- the ratio I (200) / I (111) between the X-ray diffraction peak value I (200) on the (200) plane and the X-ray diffraction peak value I (111) on the (111) plane is 0. .2 to 0.37 is preferable. If the ratio I (200) / I (111) is out of the specific range, it becomes difficult to suppress flank wear and rake face wear in a well-balanced manner.
- the ratio I (200) / I (111) is more preferably 0.25 to 0.36.
- the ratio I (311) / I (111) of the X-ray diffraction peak value I (311) of the (311) plane and the X-ray diffraction peak value I (111) of the (111) plane is 0. 0.03 to 0.15 is preferable. If the ratio I (311) / I (111) is out of the specific range, it becomes difficult to suppress flank wear and rake face wear in a well-balanced manner.
- the ratio I (311) / I (111) is more preferably 0.06 to 0.12.
- the base-layer-side single layer portion and the b layer mainly suppress flank wear, and the a layer mainly suppresses rake face wear (crater wear). Furthermore, it has been found that when the surface-side single layer portion is formed, the effect of suppressing flank wear is further improved.
- the ratio I (200) / I (111) is 0.2 to 0.37, flank wear and rake face wear can be suppressed in a well-balanced manner.
- the (200) plane orientation is relatively suppressed and the (111) plane orientation is increased.
- the coated cutting tool of this embodiment is considered to have a high performance and a long life.
- the AI apparatus includes a decompression vessel 25, arc discharge evaporation sources 13 and 27 attached to the decompression vessel 25 via an insulator 14, and arc discharge evaporation sources 13 and 27. Attached targets 10, 18, arc discharge power sources 11, 12 connected to the respective arc discharge evaporation sources 13, 27, and a rotatable support column 6 penetrating to the inside of the decompression vessel 25 through a bearing portion 24.
- the decompression vessel 25 is provided with a gas introduction part 2 and an exhaust port 17.
- the arc ignition mechanisms 16 and 16 are attached to the decompression vessel 25 via arc ignition mechanism bearing portions 15 and 15.
- a filament type electrode 20 is attached to the decompression vessel 25 via insulators 19 and 19.
- a shielding plate 23 is provided in the decompression vessel 25 via a shielding plate bearing portion 21.
- the shielding plate 23 is moved, for example, vertically or horizontally by the shielding plate driving unit 22, and after the shielding plate 23 is not present between the target 10 and the base material 7, the formation of the hard coating of this embodiment is performed. Done.
- the AlCrB alloy or the AlCrBC alloy used as a target for forming the substrate-side single-layer part) is, for example, an Al powder, an AlC powder and a CrB alloy powder having a predetermined composition, and the following AlCrB alloy or AlCrBC alloy: It mix
- the oxygen content of the AlCrB sintered body alloy or AlCrBC sintered body alloy produced by the above process is, for example, the Al powder or the particle diameter of the AlC powder and the CrB alloy powder, and the non-oxidizing atmosphere from the blending process to the sintering process. It can be appropriately adjusted by carrying out in an argon gas atmosphere or an atmosphere having a degree of vacuum of 1 to 10 ⁇ 10 ⁇ 3 Pa, for example.
- AlCrB alloy or AlCrBC alloy has the following general formula except for inevitable impurities: Al ⁇ Cr 1- ⁇ - ⁇ - ⁇ B ⁇ C ⁇ (where ⁇ , 1- ⁇ - ⁇ - ⁇ , ⁇ and ⁇ are Al , Cr, B and C, and is a number satisfying 0.4 ⁇ ⁇ ⁇ 0.8, 0.04 ⁇ ⁇ ⁇ 0.165, and 0 ⁇ ⁇ ⁇ 0.035. It is preferable to have a composition. By setting ⁇ , ⁇ , and ⁇ within the specific ranges, the substrate-side single layer portion of this embodiment can be formed.
- the range of the atomic ratio ⁇ of Al is preferably 0.4 to 0.8. If ⁇ is less than 0.4, the Al content in the substrate-side single layer portion is too small, so that the oxidation resistance of the substrate-side single layer portion is impaired. On the other hand, if ⁇ exceeds 0.8, a crystalline phase having a soft hcp structure is formed on the substrate-side single layer portion or the like, and the wear resistance is impaired.
- the range of ⁇ is more preferably 0.45 to 0.78.
- the range of Cr atomic ratio 1- ⁇ - ⁇ - ⁇ is preferably 0.56 or less. If 1- ⁇ - ⁇ - ⁇ exceeds 0.56, the Al content in the single-layer part on the substrate side becomes too small and the oxidation resistance is impaired.
- the range of 1- ⁇ - ⁇ - ⁇ is more preferably 0.485 to 0.025.
- the range of the atomic ratio ⁇ of B is preferably 0.04 to 0.165. If ⁇ is less than 0.04, the effect of adding B cannot be obtained. On the other hand, if ⁇ exceeds 0.165, the substrate-side single layer portion or the like cannot maintain an fcc single structure in the X-ray diffraction pattern.
- the range of ⁇ is more preferably 0.05 to 0.16.
- the atomic ratio ⁇ of C is preferably 0.035 or less. When ⁇ exceeds 0.035, the coated cutting tool has a short life.
- the range of ⁇ is more preferably 0.015 to 0.035.
- the oxygen content of the AlCrB alloy or AlCrBC alloy is preferably 2000 to 4000 ⁇ g / g. In both cases where the oxygen content is less than 2000 ⁇ g / g and more than 4000 ⁇ g / g, the atomic ratio f of O in the substrate-side single layer portion is less than 0.002 or more than 0.010.
- the oxygen content of the AlCrB alloy or AlCrBC alloy is more preferably 2050 to 3900 ⁇ g / g, and particularly preferably 2100 to 3800 ⁇ g / g.
- TiB alloy target for forming the modified layer and the a layer of the present embodiment has the following general formula: Ti 1- ⁇ B ⁇ (where 1- ⁇ and ⁇ , except for inevitable impurities) Each represents an atomic ratio of Ti and B, and preferably satisfies 0.1 ⁇ ⁇ ⁇ 0.5. If ⁇ is less than 0.1, a decarburized layer is formed, and a modified layer having an fcc structure cannot be obtained. If ⁇ exceeds 0.5, a modified layer having an fcc structure cannot be obtained. More preferably, ⁇ is 0.10 to 0.3.
- arc discharge evaporation sources 13 and 27 are a target 10 made of a TiB alloy for forming a modified layer or a layer, respectively, and the substrate side.
- a target 18 made of an AlCrB alloy or an AlCrBC alloy for forming a single layer portion or the like is provided.
- a direct current or a pulse current is supplied to the target 10 or the target 18 as an arc current.
- the arc discharge evaporation sources 13 and 27 are provided with magnetic field generating means (a structure composed of an electromagnet and / or a permanent magnet and a yoke), and several tens of G (for example, 10 to 50 G) are provided in the vicinity of the substrate 7. ) Is preferably formed.
- the droplets generated when the hard coating of the present embodiment is formed serve as a starting point for the destruction of the hard coating. For this reason, it is preferable to suppress excessive generation of droplets by applying a direct current arc current of 150 to 250 A to the target 18 made of AlCrB alloy or AlCrBC alloy and the target 10 made of TiB alloy.
- (D) Bias power source As shown in FIG. 1, a bias voltage is applied to the substrate 7 from the bias power source 3.
- the inside of the decompression vessel 25 is 1 to 5 ⁇ 10 ⁇ 2 Pa (for example, 1.5 ⁇ 10 ⁇ 2 While holding at Pa), the substrate 7 is heated to a temperature of 250 to 650 ° C. by a heater (not shown).
- the base material 7 can take various shapes such as a solid type end mill or an insert.
- the base material 7 consists of a WC base cemented carbide, for example.
- argon gas is introduced into the decompression vessel 25 to obtain an argon gas atmosphere of 0.5 to 10 Pa (for example, 2 Pa).
- a DC bias voltage or pulse bias voltage of ⁇ 250 to ⁇ 150 V is applied to the base material 7 by the bias power source 3 to clean the surface of the base material 7 by bombarding with argon ions.
- the substrate temperature is less than 250 ° C., there is no etching effect by argon ions, and if it exceeds 650 ° C., it is difficult to set the substrate temperature to a predetermined condition during the film forming process.
- the substrate temperature is measured by a thermocouple embedded in the substrate (the same applies to the subsequent steps). If the pressure of the argon gas in the decompression vessel 25 is outside the range of 0.5 to 10 Pa, the bombardment process with argon ions becomes unstable. When the DC bias voltage or pulse bias voltage is less than ⁇ 250 V, arcing occurs in the substrate, and when it exceeds ⁇ 150 V, the cleaning effect by bombard etching cannot be sufficiently obtained.
- (B) Modified layer formation process Formation of the modified layer on the base material 7 is performed by ion bombarding on the base material 7 using the target 10 of TiB alloy. After cleaning the substrate 7, the inside of the decompression vessel 25 is set to an argon gas atmosphere with a flow rate of 30 to 150 sccm. An arc current (DC current) of 50 to 100 A is applied from the arc discharge power supply 11 to the surface of the target 10 made of TiB alloy attached to the arc discharge evaporation source 13. The substrate 7 is heated to a temperature of 450 to 750 ° C., and a DC bias voltage of ⁇ 1000 to ⁇ 600 V is applied from the bias power source 3 to the substrate 7. The substrate 7 is irradiated with Ti ions and B ions by ion bombardment using the TiB alloy target 10.
- DC current DC current
- the fcc-structured modified layer is not formed, or a decarburized layer is formed on the surface of the substrate 7 and the adhesion with the substrate-side single layer portion is remarkably high. descend. If the flow rate of the argon gas in the decompression vessel 25 is less than 30 sccm, the energy of Ti ions incident on the base material 7 is too strong, and a decarburized layer is formed on the surface of the base material 7, and is in close contact with the base material side single layer part. Impairs sex. On the other hand, when the flow rate of argon gas exceeds 150 sccm, the energy of Ti ions and the like is weakened, and the modified layer is not formed.
- the arc discharge becomes unstable, and when it exceeds 100 A, a large number of droplets are formed on the surface of the base material 7 and the adhesion to the base-side single layer portion is impaired.
- the DC bias voltage is less than ⁇ 1000 V, energy such as Ti ions is too strong and a decarburized layer is formed on the surface of the base material 7, and when it exceeds ⁇ 600 V, a modified layer is not formed on the base material surface.
- (C) Film formation step of hard coating (1) Film formation of substrate-side single layer portion On the substrate 7 or, if a modified layer is formed, on the modified layer, the substrate side of the present embodiment A single layer portion is formed. At this time, an arc current is supplied from the arc discharge power source 12 to the surface of the target 18 made of AlCrB alloy or AlCrBC alloy attached to the arc discharge evaporation source 27 using nitrogen gas. At the same time, a DC bias voltage or a unipolar pulse bias voltage is applied from the bias power source 3 to the substrate 7 controlled to the following temperature.
- the substrate temperature during film formation of the substrate-side single layer portion of this embodiment is set to 400 to 550 ° C.
- the substrate temperature is less than 400 ° C.
- the substrate-side single layer portion is not sufficiently crystallized, and therefore the substrate-side single layer portion does not have sufficient lubricity and wear resistance.
- the increase in residual stress causes film peeling.
- the substrate temperature is higher than 550 ° C., the refinement of crystal grains in the substrate-side single layer portion is excessively promoted and the lubricity and wear resistance are impaired.
- the substrate temperature is preferably 480 to 540 ° C.
- Nitrogen gas is used as the film forming gas for the substrate-side single layer portion of the present embodiment.
- the pressure (total pressure) of nitrogen gas is 2.7 to 3.3 Pa.
- the pressure of the nitrogen gas is less than 2.7 Pa, the nitriding of the substrate-side single layer portion becomes insufficient, and the presence of a different phase that is not nitrided leads to a shortened life of the coated cutting tool. Content is excessive.
- the pressure of the nitrogen gas exceeds 3.3 Pa, the oxygen content in the substrate-side single layer portion becomes too low, leading to softening.
- the pressure of nitrogen gas is preferably 2.8 to 3.2 Pa, more preferably 2.9 to 3.1 Pa.
- the flow rate of nitrogen gas is preferably 750 to 900 sccm. If the flow rate of nitrogen gas is less than 750 sccm and more than 900 sccm, it is difficult to adjust the pressure (total pressure) of the nitrogen gas to 2.7 to 3.3 Pa.
- the flow rate of nitrogen gas is more preferably 770 to 880 sccm.
- (D) Bias voltage applied to base material In order to form the base material side single layer part of this embodiment, it is preferable to apply the bias voltage of a direct current or a unipolar pulse to a base material.
- the bias voltage is preferably ⁇ 160 to ⁇ 100V. When the bias voltage is less than ⁇ 160 V, the B content is significantly reduced. On the other hand, when the bias voltage exceeds -100V, the coated cutting tool has a short life.
- the bias voltage is more preferably ⁇ 150 to ⁇ 110V.
- the bias voltage means a negative peak value excluding a steep rising portion from zero to the negative side.
- the frequency of the unipolar pulse bias voltage is preferably 20 to 50 kHz, and more preferably 30 to 40 kHz.
- the arc current (DC current) applied to the target 18 is 150 to 250 A.
- the arc current is less than 150A, the arc discharge becomes unstable, and when it exceeds 250A, the number of droplets increases remarkably and the wear resistance of the single layer portion on the substrate side deteriorates.
- the arc current is more preferably 160 to 240A.
- the laminated part of this embodiment is formed on the substrate side single layer part.
- the laminated part may be the outermost layer.
- the a layer and the b layer are formed by energizing the target 10 (TiB alloy) with the arc current in addition to the target 18 (AlCrB alloy or AlCrBC alloy) while continuing the film formation on the base-side single layer portion.
- the stacked portion of this embodiment in which layers are alternately deposited is formed. Only the following (i) and (ii) are the film forming conditions peculiar to the laminated part, and the other film forming conditions are the same as the film forming conditions of the substrate side single layer part.
- the bias voltage applied to the substrate is preferably ⁇ 140 to ⁇ 80V.
- the composition of the b layer in the laminated portion Becomes richer in Al than the composition of the substrate-side single layer part and the surface-side single layer part.
- a coated cutting tool with high performance and long life can be obtained.
- the bias voltage is less than ⁇ 140V, the B content is greatly reduced, and when it exceeds ⁇ 80V, the coated cutting tool has a short life.
- a more preferable range of the bias voltage is ⁇ 130 to ⁇ 90V. (Ii) It is practical to simultaneously apply an arc current to the target 18 and the target 10 at the time of film formation of the laminated portion.
- the surface side single layer part of this embodiment is formed on a laminated part as needed. For example, it is preferable to adjust the film formation time to set the film thickness ratio t3 / t1 between the surface-side single layer portion and the substrate-side single layer portion to 0.1 to 1.5. Other than this, the film forming conditions are the same as those of the substrate-side single layer portion.
- the laminated part or the surface-side single layer part may be the outermost layer, but if necessary, on the laminated part or the surface-side single layer part, for example, a known hard At least one layer may be provided.
- Known hard coatings include, for example, (TiAl) N, (TiAlCr) N, (TiAlNb) N, (TiAlW) N, (TiSi) N, (TiB) N, TiCN, Al 2 O 3 , Cr 2 O 3 , ( Examples include at least one hard film selected from the group consisting of (AlCr) N and (AlCrSi) N.
- the present invention will be described in more detail with reference to the following examples, but the present invention is of course not limited thereto.
- the composition of the target metal element and metalloid element is a measured value by a fluorescent X-ray method unless otherwise specified, and the oxygen content is determined by a carrier gas method (carrier gas hot ion extraction method). It is a measured value.
- the insert was used as the base material of the hard coating in the examples, the present invention is of course not limited thereto, and can be applied to cutting tools other than the insert (end mill, drill, etc.).
- Example 1 (1) Cleaning of base material Finished milling insert base material made of WC-based cemented carbide containing 8.0% by mass of Co and the balance consisting of WC and inevitable impurities (Mitsubishi Nichi Tool shown in FIG. 13) ZDFG300-SC manufactured by Co., Ltd.) and an insert base material for physical property measurement (SNMN120408 manufactured by Mitsubishi Hitachi Tool Co., Ltd.) are set on the holder 8 of the AI apparatus shown in FIG. (Not shown).
- argon gas is introduced at a flow rate of 500 sccm (sccm is 1 atm and cc / min at 25 ° C., the same applies hereinafter) to adjust the pressure in the decompression vessel 25 to 2.0 Pa, and each substrate (hereinafter referred to as the base material).
- the substrate 7 was also cleaned by etching with argon ion bombardment by applying a DC bias voltage of ⁇ 200 V to the material 7).
- a DC power of ⁇ 140 V is applied to the base material 7 by the bias power source 3, and a DC arc current of 200 A is passed from the arc discharge power source 12 to the target 18.
- the composition is Ti 0.85 B 0 while maintaining the film formation conditions of the substrate-side single layer portion except that a DC voltage of ⁇ 120 V is applied to the substrate 7 by the bias power source 3. .15 (atomic ratio), a direct current arc current of 200 A is passed from the arc discharge power source 11 to the target 10 of TiB alloy, and 50 layers of a layer and b layer are alternately formed on the substrate side single layer part.
- a stacked portion having an overall film thickness (t2) of 1.0 ⁇ m was formed by depositing the layers one by one.
- the coated cutting tool (milling insert) of this example was produced.
- FIG. 3 is a scanning electron microscope (SEM) photograph (magnification: 20,000 times) showing the sectional structure of the coated cutting tool.
- 31 is a WC base cemented carbide base material
- 33 is a base material side single layer part
- 34 is a laminated part. The a layer and the b layer constituting the modified layer 32 and the laminated portion 34 are not visible because FIG. 3 shows a low magnification.
- Respective film thicknesses of the hard coating and the lamination period of the laminated parts The film thicknesses at the left end and the right end of the substrate side single layer part 33 and laminated part 34 in FIG. 3 are measured, and the measured values are arithmetically averaged.
- the film thickness (t1) of the side single layer part 33 and the entire film thickness (t2) of the laminated part 34 were obtained.
- TEM transmission electron microscope
- a dark field image magnification 1, 1 taken of the laminated portion of the sample with the TEM. (600,000 times) is shown in FIG.
- the lamination period T was measured at the center position of the a layer and the b layer laminated alternately from the upper side to the lower side of the laminated part in FIG. 10, and T was obtained by arithmetically averaging the measured values. T was 20 nm.
- the (111) plane, (200) plane, (220) plane, and (311) plane were all x-ray diffraction peaks of the fcc structure. Therefore, it can be seen that the portion of the hard coating has a single structure of fcc.
- the X-ray diffraction peaks not indexed are the X-ray diffraction peaks of the WC-based cemented carbide base material.
- nanobeam diffraction was performed with a TEM (JEM-2100) under the conditions of an acceleration voltage of 200 kV and a camera length of 50 cm.
- the diffraction image obtained at position 4 is shown in FIG.
- the diffraction image obtained at position 5 is shown in FIG.
- diffraction patterns of the (002) plane, (111) plane, and (11-1) plane of the fcc structure were observed. From this result, it was found that the laminated portion of this example had a single structure of fcc in the electron diffraction pattern.
- the above-mentioned coated cutting tool (hereinafter also referred to as the insert 40A) is used as a tool body of a blade-tip replaceable rotary tool (ABPF30S32L150 manufactured by Mitsubishi Hitachi Tool Co., Ltd.) 50.
- a set screw 47 was attached to the tip 48 of 46.
- the blade diameter of the blade-tip replaceable rotary tool 50 was 30 mm.
- Cutting is performed under the following rolling conditions using the blade-replaceable rotary tool 50, and the rake face 45a and the flank face 45b of the insert 40A sampled every unit time are observed with an optical microscope (magnification: 100 times).
- the machining time when the wear width or chipping width of either the rake face 45a or the flank face 45b was 0.2 mm or more was determined as the tool life.
- Cutting conditions Machining method Continuous rolling Work material: S50C square (120 mm x 250 mm) (HB220) Inserts used: ZDFG300-SC (for milling) Cutting tool: ABPF30S32L150 Cutting speed: 380 m / min Feed amount per blade: 0.3 mm / blade Axial cut amount: 0.3 mm Radial cut depth: 0.1 mm Cutting fluid: None (dry machining)
- Table 1 shows the composition of the AlCrB alloy target and TiB alloy target used.
- Table 2 shows the film forming conditions of the substrate-side single layer part.
- Table 3 shows the DC bias voltage applied at the time of film formation of the laminated portion.
- Table 4 shows the composition of the substrate-side single layer part.
- Table 5 shows the metal (including metalloid) composition of layer a
- Table 6 shows the metal (including metalloid) composition of layer b.
- Table 8 shows the total film thicknesses t1 and t2 of the substrate-side single layer part and the laminated part, the film thickness ratio t1 / t2 between the substrate-side single layer part and the whole laminated part, and the lamination period T of the laminated part. Show.
- Table 9 shows the results of X-ray diffraction of the hard coating portion composed of the substrate-side single layer portion and the laminated portion, the results of electron diffraction of the a layer and the b layer, and the tool life.
- Example 2 By adjusting each film formation time of the substrate side single layer part and the laminated part, the film thickness t1 is set to 1.0 ⁇ m, the film thickness t2 is set to 0.8 ⁇ m, and the film thickness ratio t1 / t2 is set to 1.25.
- the stacking period T was changed to 16 nm. Except for the above, a coated cutting tool (milling insert) of this example was produced in the same manner as in Example 1, and the tool life and the like were measured.
- Example 3 The film thickness t1 was set to 5.0 ⁇ m and the film thickness ratio t1 / t2 was changed to 5 by adjusting the film formation time of the substrate-side single layer part. Except for the above, a coated cutting tool (milling insert) of this example was produced in the same manner as in Example 1, and the tool life and the like were measured.
- Example 4 Similar to Example 1, except that the film formation time of the substrate-side single layer portion was adjusted to set the film thickness t1 to 1.2 ⁇ m, the substrate-side single layer portion was sequentially formed on the substrate on which the modified layer was formed. And the laminated part was formed. Subsequently, a surface side single layer portion (Al 0.60 Cr 0.38 B 0.02 ) is formed on the laminated portion under the same film formation conditions as the substrate side single layer portion except that the film formation time is adjusted. A hard film having a composition of N 0.994 O 0.006 (atomic ratio) and a film thickness (t3) of 1.2 ⁇ m was formed.
- the film thickness ratio t1 / t2 is set to 1.2
- the film thickness ratio t3 / t2 is set to 1.2
- the film thickness ratio (t1 + t3) / t2 is set to 2.4
- the film thickness ratio t3 / t1 is set to 1.
- Example 5 In the same manner as in Example 1 except that the film formation time of the substrate-side single layer portion was adjusted, a substrate-side single layer portion having a film thickness t1 of 4.0 ⁇ m in order on the substrate on which the modified layer was formed, And the laminated part whose film thickness t2 is 1.0 micrometer was formed. Subsequently, a surface side single layer portion (Al 0.60 Cr 0.38 B 0.02 ) is formed on the laminated portion under the same film formation conditions as the substrate side single layer portion except that the film formation time is adjusted. A hard film having a composition of N 0.994 O 0.006 (atomic ratio) and a film thickness (t3) of 3.0 ⁇ m was formed.
- the film thickness ratio t1 / t2 is changed to 4
- the film thickness ratio t3 / t2 is changed to 3
- the film thickness ratio (t1 + t3) / t2 is changed to 7
- the film thickness ratio t3 / t1 is changed to 0.75.
- the coated cutting tool (milling insert) of an Example was produced and the tool life etc. were measured.
- Example 6 In the same manner as in Example 1, a base material-side single layer part and a laminated part were formed in order on the base material on which the modified layer was formed. Subsequently, a surface side single layer portion (Al 0.60 Cr 0.38 B 0.02 ) is formed on the laminated portion under the same film formation conditions as the substrate side single layer portion except that the film formation time is adjusted. A hard film having a composition of N 0.995 O 0.005 (atomic ratio) and a film thickness (t3) of 0.5 ⁇ m was formed.
- the film thickness ratio t1 / t2 is set to 2
- the film thickness ratio t3 / t2 is set to 0.5
- the film thickness ratio (t1 + t3) / t2 is set to 2.5
- the film thickness ratio t3 / t1 is set to 0.25.
- FIG. 4 is a scanning electron microscope (SEM) photograph (magnification: 20,000 times) showing the cross-sectional structure of the coated cutting tool of Example 4.
- 31 is a WC-based cemented carbide substrate
- 33 is a substrate-side single layer portion
- 34 is a laminated portion
- 35 is a surface-side single layer portion.
- the a layer and the b layer constituting the modified layer 32 and the laminated portion 34 are not visible because FIG. 4 shows a low magnification.
- FIG. 7 shows an X-ray diffraction pattern of a portion of the hard coating composed of the substrate-side single layer portion, the laminated portion, and the surface-side single layer portion of Example 4. From FIG. 7, it can be seen that the hard coating portion of Example 4 has a single fcc structure.
- FIG. 5 is a scanning electron microscope (SEM) photograph (magnification: 20,000 times) showing the cross-sectional structure of the coated cutting tool of Example 6.
- 31 is a WC-based cemented carbide substrate
- 33 is a substrate-side single layer portion
- 34 is a laminated portion
- 35 is a surface-side single layer portion.
- the a layer and the b layer constituting the modified layer 32 and the stacked portion 34 are not visible because FIG. 5 shows a low magnification.
- FIG. 8 shows an X-ray diffraction pattern of a hard coating portion composed of a base-material-side single layer portion, a laminated portion, and a surface-side single layer portion in Example 6. It can be seen from FIG. 8 that the hard coating portion of Example 6 has a single fcc structure.
- Table 1 shows the compositions of the AlCrB alloy target and TiB alloy target in Examples 2 to 6.
- Table 2 shows the film forming conditions for the base-side single layer portion of each example.
- Table 3 shows the bias voltage of the stacked portion in each example.
- Table 4 shows the composition of the substrate-side single layer portion of each example.
- Table 5 shows the composition of the metal (including metalloid) element of the a layer of each example, and
- Table 6 shows the composition of the metal (including metalloid) element of the b layer of each example.
- Table 7 shows the composition of the surface-side single layer portion in each of Examples 4 to 6.
- Table 8 shows the film thicknesses t1, t2, and t3, film thickness ratios t1 / t2, t3 / t2, (t1 + t3) / t2, t3 / t1, and the stacking periods T of each example. .
- Table 9 shows the results of electron diffraction of the layers and the tool life of each example.
- Examples 7 to 13 Using the AlCrB alloy target and TiB alloy target of each example shown in Table 1, using the film-forming conditions of the substrate-side single layer part of each example shown in Table 2, and the laminated part of each example shown in Table 3 A coated cutting tool (milling insert) of each example was produced in the same manner as in Example 1 except that the bias voltage was used.
- the Al (Cr) addition amount of the AlCrB alloy target was changed with respect to Example 1.
- Examples 8 and 9 the amount of B added to the AlCrB alloy target was greatly changed compared to Example 1.
- the total pressure of nitrogen gas was changed from that in Example 1.
- Example 11 the bias voltage was changed from that in Example 9.
- Example 12 the oxygen content of the AlCrB alloy target was greatly increased compared to Example 1.
- Table 1 shows the compositions of the AlCrB alloy target and TiB alloy target of each example.
- Table 2 shows the film forming conditions for the base-side single layer portion of each example.
- Table 3 shows the bias voltage of the stacked portion in each example.
- Table 4 shows the composition of the substrate-side single layer portion of each example.
- Table 5 shows the composition of the metal (including metalloid) element of the a layer of each example, and Table 6 shows the composition of the metal (including metalloid) element of the b layer of each example.
- Table 8 shows the film thicknesses t1 and t2, the film thickness ratios t1 / t2 and the stacking periods T in each example.
- Table 9 shows the results of X-ray diffraction of the part composed of the substrate-side single layer part and the laminated part, the results of electron diffraction of the a layer and b layer of each example, and the tool life of each
- Comparative Example 1 Implementation was carried out except that the AlCrB alloy target shown in Table 1 was used, the total pressure of the nitrogen gas atmosphere in the decompression vessel 25 during film formation was 2 Pa, the flow rate of nitrogen gas was 700 sccm, and the DC bias voltage was ⁇ 120 V.
- a coated cutting tool (milling insert) of this comparative example in which only the substrate-side single layer portion was formed on the same type of substrate as in Example 1 was produced, and the tool life and the like were measured.
- FIG. 9 shows an X-ray diffraction pattern of the substrate-side single layer portion of the coated cutting tool of Comparative Example 1.
- Comparative Example 2 Other than using the AlCrB alloy target shown in Table 1, the total pressure of the nitrogen gas atmosphere in the decompression vessel 25 during film formation was 3.5 Pa, the flow rate of nitrogen gas was 900 sccm, and the DC bias voltage was ⁇ 120 V. In the same manner as in Example 1, a coated cutting tool (milling insert) of this comparative example in which only the substrate-side single layer portion was formed on the same type of substrate as in Example 1 was produced, and the tool life and the like were measured. did.
- Comparative Example 3 The same kind of substrate as in Example 1 was used in the same manner as in Example 1 except that an AlCrB alloy target having a low oxygen content (420 ⁇ g / g) shown in Table 1 was used and the DC bias voltage was set to ⁇ 120 V. A coated cutting tool (milling insert) of this comparative example in which only the substrate-side single layer portion was formed was prepared, and the tool life and the like were measured.
- Comparative Example 4 Similar to Example 1, except that an AlCrB alloy target having an excessive oxygen content (5390 ⁇ g / g) shown in Table 1 was used and the DC bias voltage was set to ⁇ 120 V, a substrate of the same type as that of Example 1 was used. The coated cutting tool (milling insert) of this comparative example in which only the substrate-side single layer portion was formed was produced, and the tool life and the like were measured.
- Example 14 A coated cutting tool (milling insert) of this example was produced in the same manner as in Example 1 except that a modified layer using a TiB alloy target was not formed on the WC-based cemented carbide substrate, and the tool life and the like were measured. .
- Examples 15-17 A coated cutting tool (milling insert) of this example was produced in the same manner as in Example 1 except that the AlCrBC alloy target of each example shown in Table 1 was used, and the tool life and the like were measured.
- Table 1 shows the composition of the target made of the AlCrB alloy or AlCrBC alloy of each example used in Examples 14 to 17 and Comparative Examples 1 to 4, and the TiB alloy target.
- Table 2 shows the film forming conditions for the base-side single layer portion of each example.
- Table 3 shows the DC bias voltage applied at the time of film formation of the laminated portion of each example.
- Table 4 shows the composition of the substrate-side single layer portion of each example.
- Table 5 shows the composition of the metal (including metalloid) element of the a layer in each example, and Table 6 shows the composition of the metal (including metalloid) element of the b layer in each example.
- Table 8 shows the film thicknesses t1 and t2, the film thickness ratios t1 / t2 and the stacking periods T in each example.
- Table 9 shows the result of X-ray diffraction of the hard film portion of each example composed of the substrate-side single layer part and the laminated part, the result of electron diffraction of the a layer and b layer of each example, and the tool life of each example. Shown in Each ratio I (200) / I (111) and each ratio I (311) read from the X-ray diffraction patterns (FIGS. 6 to 9) of the hard coating portions of Examples 1, 4, 6 and Comparative Example 1, respectively. Table 10 shows / I (111).
- each blade-tip replaceable rotary tool of Examples 1 to 17 had a longer life than each blade-exchangeable rotary tool of Comparative Examples 1 to 4.
- each blade-tip-replaceable rotary tool of Examples 15 to 17 in which each (AlCrB) NCO film (Table 4) containing 0.01 to 0.03 (atomic ratio) of C was formed as the substrate-side single layer portion. was longer than or equal to that of the blade-tip-replaceable rotary tool of Example 1.
- the blade-tip replaceable rotary tool of Example 14 in which the modified layer was not formed on the surface of the WC-based cemented carbide base material had a shorter life than the blade-tip replaceable rotary tools of Examples 1 to 13 and Examples 15 to 17 However, the tool life was longer than that of each of the blade replacement type rotary tools of Comparative Examples 1 to 4.
- the ratio I (200) / I (111) was 0.30 in Example 1, 0.35 in Example 4, and 0.36 in Example 6. In contrast, the ratio I (200) / I (111) of Comparative Example 1 was as large as 0.39.
- the ratio I (311) / I (111) was 0.06 in Example 1, 0.09 in Example 4, and 0.11 in Example 6. In contrast, the ratio I (311) / I (111) of Comparative Example 1 was as large as 0.18.
- the substrate side single layer part, the b layer, and the surface side single layer part are formed on substantially the same composition by using a target made of the same AlCrB alloy or AlCrBC alloy, but there is no particular limitation.
- a target composed of a plurality of AlCrB alloys or AlCrBC alloys having different compositions is used, and the composition of any of the base-side single-layer part, the b-layer of the laminated part, and the surface-side single-layer part is within the scope of the present invention May be changed as appropriate.
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Ceramic Engineering (AREA)
- Cutting Tools, Boring Holders, And Turrets (AREA)
- Physical Vapour Deposition (AREA)
- Drilling Tools (AREA)
Abstract
Description
本願は、2018年5月30日に、日本に出願された特願2018-103480号に基づき優先権を主張し、その内容をここに援用する。
本実施形態の被覆切削工具は、基材上に硬質皮膜を有し、硬質皮膜として基材側から順に基材側単層部及び積層部を有し、基材側単層部は、金属(半金属を含む)元素の割合でAlが最も多く、AlとCrの合計の含有比率(原子比)が0.9以上であり、かつ少なくともBを含有する窒化物主体の硬質皮膜からなる。積層部は、金属(半金属を含む)元素の割合でTiが最も多く、かつ少なくともBを含有する窒化物主体のa層と、金属(半金属を含む)元素の割合でAlが最も多く、かつ少なくともCrとBを含有する窒化物主体のb層とが交互に積層されてなる。a層とb層との膜厚方向の積層周期は5~100nmである。基材側単層部及び積層部から構成される部分のX線回折パターンはfccの単一構造からなる。
基材は耐熱性に富み、物理蒸着法を適用できる材質である必要がある。基材の材質として、例えば超硬合金、サーメット、高速度鋼、工具鋼または立方晶窒化ホウ素(cBN)等のセラミックスが挙げられる。基材の材質は、強度、硬度、耐摩耗性、靱性及び熱安定性等の観点から、超硬合金基材又はセラミックス基材が好ましい。超硬合金は炭化タングステン粒子とCoまたはCoを主体とする合金の結合相とからなる。結合相の含有量は、炭化タングステン及び結合相の各含有量の合計(100質量%)に対して1~13.5質量%が好ましく、3~13質量%がより好ましい。超硬合金中の結合相の含有量が、1質量%未満では靭性が不十分であり、13.5質量%超では硬度(耐摩耗性)が不十分である。焼結後の基材の未加工面、研磨加工面及び刃先処理加工面のいずれにも本実施形態の硬質皮膜を形成できる。
基材が超硬合金の場合、基材表面にTiB合金のターゲットから発生したイオンを照射し(以後、イオンボンバードともいう)、平均厚さ1~10nmのfcc構造を有する改質層を形成するのが好ましい。超硬合金は主成分の炭化タングステンがhcp構造を有するが、改質層は基材側単層部と同じfcc構造からなる。超硬合金の基材と改質層とは、それらの境界(界面)における結晶格子縞の好ましくは30%以上、さらに好ましくは50%以上、特に好ましくは70%以上の部分が連続する。この構造により、改質層を介して超硬合金の基材と基材側単層部とが強固に密着する。
(1) 組成
(a) 基材側単層部及び表面側単層部
本実施形態の基材側単層部及び表面側単層部はいずれも、金属(半金属を含む)元素の割合でAlが最も多く、AlとCrの合計の含有比率(原子比)が0.9以上であり、かつ少なくともBを含有する窒化物主体の硬質皮膜からなる。前記のAlとCrの合計の含有比率(原子比)が0.9以上であることにより当該皮膜の耐摩耗性が向上する。当該皮膜の耐摩耗性を向上するために、前記のAlとCrの合計の含有比率(原子比)は0.90~0.99が好ましく、Alの含有比率(原子比)は0.5以上が好ましく、Bの含有比率(原子比)は0.01以上が好ましい。前記のAlとCrの合計の含有比率(原子比)、Alの含有比率(原子比)及びBの含有比率(原子比)が前記特定範囲を外れると耐摩耗性が低下する。なお、「窒化物主体」とは、Nの含有比率(原子比)が、非金属元素の含有比率(原子比)の合計1に対して0.5以上であることを意味し、Nの含有比率(原子比)は0.6以上であることが好ましい。
本実施形態の積層部は、金属(半金属を含む)元素の割合でTiが最も多く、かつ少なくともBを含有する窒化物主体のa層と、金属(半金属を含む)元素の割合でAlが最も多く、かつ少なくともCrとBを含有する窒化物主体のb層とが交互に積層されてなる。a層において、Tiの含有比率(原子比)は0.65以上であるのが好ましく、Bの含有比率(原子比)は0.01以上であるのが好ましい。b層において、Alの含有比率(原子比)は0.42以上であるのが好ましく、Crの含有比率(原子比)は0.1以上であるのが好ましく、Bの含有比率(原子比)は0.01以上であるのが好ましい。a層及びb層における各元素の含有比率(原子比)が前記特定範囲を外れると当該皮膜の耐摩耗性が低下しやすい。なお、「窒化物主体」とは、Nの含有比率(原子比)が、非金属元素の含有比率(原子比)の合計1に対して0.5以上であることを意味し、Nの含有比率(原子比)は0.6以上であることが好ましい。
基材側単層部、積層部のa層及びb層、及び表面側単層部において、前記特定範囲のB含有量とすることにより、各皮膜の結晶粒の格子歪が増加する。この作用により、B添加された硬質皮膜において、皮膜硬度、耐摩耗性及び工具寿命がいずれも向上する。
基材側単層部、積層部のa層及びb層、及び表面側単層部において、前記特定範囲のB含有量とすることを前提に、前記特定範囲のC含有量とすることにより、各皮膜の結晶粒の格子歪がさらに増加する。この作用により、C添加された硬質皮膜では、皮膜硬度、耐摩耗性及び工具寿命がいずれもさらに向上する。
本実施形態の基材側単層部の膜厚(t1)は積層部の全体の膜厚(t2)より大きい。さらに、t1は1.0~5μmであるのが好ましい。t1が、1.0μm未満では逃げ面摩耗が進みやすく、5μm超では基材側単層部の密着力が顕著に低下する。t1は1.2~5.0μmであるのがさらに好ましい。
積層部の全体の膜厚(t2)は0.5~2.5μmであるのが好ましい。t2が、0.5μm未満ではすくい面摩耗が進みやすく、2.5μm超では積層部の密着力が低下する。t2は0.8~2.2μmであるのがさらに好ましい。
本実施形態の積層部のa層及びb層の積層周期Tは、図2に示すように、任意のa層1層の下端から隣接する直上のb層1層の上端までの膜厚方向の距離(厚さ)である。Tは5~100nmである。Tが5nm未満及び100nm超ではいずれも当該皮膜の耐摩耗性が低下する。Tは10~90nmであるのが好ましく、20~80nmであるのがさらに好ましい。
なお、積層部において、a層とb層との相互拡散によってa層とb層の境界が不明瞭になる場合がある。この場合、積層周期Tを、積層部において隣接する3層(例えば順に積層されるa層、b層、及びa層)において、b層を挟んで配置される2つのa層の積層方向における距離として計測することもできる。2つのa層間の距離は、各々のa層の厚さ方向の中点同士を結んだ距離である。
本実施形態の基材側単層部及び積層部から構成される硬質皮膜の部分のX線回折パターンはfccの単一構造からなる。さらに、本実施形態の基材側単層部、積層部及び表面側単層部から構成される硬質皮膜の部分のX線回折パターンはfccの単一構造からなるのが好ましい。すなわち、本実施形態の前記硬質皮膜の部分がfccの結晶相であることにより、被覆切削工具としての高性能化、長寿命化に寄与する。なお、X線回折パターンに現れない範囲であれば、硬質皮膜内にfcc以外の微小相が存在していても構わない。積層部のみの結晶構造は微小相の検出が可能な電子回折(TEM)により同定できる。高性能化、長寿命化の点から、前記電子回折において、積層部はfccを主構造とするのが好ましく、fccの単一構造からなるのがさらに好ましい。
本発明者は、高性能で長寿命なナノ積層皮膜を鋭意検討した結果、(i)基材上に上記特定組成の基材側単層部を形成したこと、(ii)基材側単層部の上に上記特定組成のa層とb層とを交互に積層するとともに両層の膜厚方向の積層周期Tを5~100nmとしたこと、及び(iii)基材側単層部及び積層部から構成される部分のX線回折パターンがfccの単一構造からなることにより、従来に比べて逃げ面摩耗及びすくい面摩耗をバランス良く顕著に抑制できることを発見した。即ち、十分解明できていないものの、基材側単層部及びb層が主に逃げ面摩耗を抑制し、a層が主にすくい面摩耗(クレータ摩耗)を抑制することが分かった。さらに、表面側単層部が形成されると逃げ面摩耗の抑制効果がより向上することが分かった。
本実施形態の硬質皮膜の形成にはアークイオンプレーティング(以後、AIともいう)装置を使用することができる。AI装置は、例えば図1に示すように、減圧容器25と、絶縁物14を介して減圧容器25に取り付けられたアーク放電式蒸発源13,27と、各アーク放電式蒸発源13,27に取り付けられたターゲット10,18と、各アーク放電式蒸発源13,27に接続されたアーク放電用電源11,12と、軸受け部24を介して減圧容器25の内部まで貫通する回転自在の支柱6と、基材7を保持するために支柱6に支持された保持具8と、支柱6を回転させる駆動部1と、基材7にバイアス電圧を印加するバイアス電源3とを具備する。減圧容器25には、ガス導入部2及び排気口17が設けられている。アーク点火機構16,16は、アーク点火機構軸受部15,15を介して減圧容器25に取り付けられている。減圧容器25内に導入したガス(アルゴンガス、窒素ガス等)のイオン化のために、フィラメント型の電極20が絶縁物19,19を介して減圧容器25に取り付けられている。ターゲット10と基材7との間には、遮蔽板軸受け部21を介して減圧容器25に遮蔽板23が設けられている。遮蔽板23は遮蔽板駆動部22により例えば上下または左右方向に移動し、遮蔽板23がターゲット10と基材7との間に存在しない状態にされた後に、本実施形態の硬質皮膜の形成が行われる。
(1) AlCrB合金及びAlCrBC合金の組成
本実施形態の基材側単層部、b層及び表面側単層部(以後、基材側単層部等ともいう)の形成用のターゲットとして使用するAlCrB合金またはAlCrBC合金は、例えば所定組成のAl粉末またはAlC粉末及びCrB合金粉末を用いて、下記のAlCrB合金またはAlCrBC合金の組成に配合及び混合し、得られた混合粉末を成形し、得られた成形体を焼結して得られる。上記工程により作製されるAlCrB焼結体合金またはAlCrBC焼結体合金の含有酸素量は、例えばAl粉末またはAlC粉末及びCrB合金粉末の粒径、及び配合工程から焼結工程までを非酸化性雰囲気(例えば、アルゴンガス雰囲気または真空度1~10×10-3Paの雰囲気)で行うことにより適宜調整することができる。
AlCrB合金またはAlCrBC合金の酸素含有量は2000~4000μg/gであるのが好ましい。酸素含有量が2000μg/g未満及び4000μg/g超ではいずれも、基材側単層部等のOの原子比fが0.002未満または0.010超になる。AlCrB合金またはAlCrBC合金の酸素含有量は、2050~3900μg/gであるのがさらに好ましく、2100~3800μg/gであるのが特に好ましい。
本実施形態の改質層及びa層を形成するためのTiB合金ターゲットは、不可避的不純物を除いて下記一般式:Ti1-δBδ(ただし、1-δ及びδはそれぞれTi及びBの原子比を表し、0.1≦δ≦0.5を満たす。)で表される組成を有するのが好ましい。δが0.1未満では脱炭層が形成されてfcc構造の改質層が得られない。δが0.5を超えるとfcc構造の改質層が得られない。δは0.10~0.3であるのがさらに好ましい。
図1に示すように、アーク放電式蒸発源13,27はそれぞれ改質層若しくはa層形成用のTiB合金からなるターゲット10、及び基材側単層部等形成用のAlCrB合金またはAlCrBC合金からなるターゲット18を備える。例えば、ターゲット10若しくはターゲット18に、アーク電流として直流電流若しくはパルス電流を通電する。図示していないが、アーク放電式蒸発源13、27に磁場発生手段(電磁石及び/又は永久磁石とヨークとからなる構造体)を設け、基材7の近傍に数十G(例えば10~50G)の磁場分布を形成するのが好ましい。
図1に示すように、基材7にバイアス電源3からバイアス電圧を印加する。
本実施形態のイオンボンバードの条件、及び硬質皮膜の成膜条件を工程ごとに以下に詳述するが、特に限定されるものではない。
図1に示すAI装置の保持具8上に基材7をセットした後、減圧容器25内を1~5×10-2Pa(例えば1.5×10-2Pa)に保持しながら、ヒーター(図示せず)により基材7を250~650℃の温度に加熱する。図1では円柱体で示しているが、基材7はソリッドタイプのエンドミルまたはインサート等の種々の形状を取り得る。基材7は、例えばWC基超硬合金からなる。基材7を加熱して昇温した後、アルゴンガスを減圧容器25内に導入して0.5~10Pa(例えば2Pa)のアルゴンガス雰囲気とする。この状態で基材7にバイアス電源3により-250~-150Vの直流バイアス電圧またはパルスバイアス電圧を印加して基材7の表面をアルゴンイオンによりボンバードしてクリーニングする。
基材7への改質層の形成は、TiB合金のターゲット10を用いた基材7へのイオンボンバードにより行う。基材7のクリーニング後に、減圧容器25内を流量が30~150sccmのアルゴンガス雰囲気とする。アーク放電式蒸発源13に取り付けたTiB合金のターゲット10の表面にアーク放電用電源11から50~100Aのアーク電流(直流電流)を通電する。基材7を450~750℃の温度に加熱するとともに、バイアス電源3から基材7に-1000~-600Vの直流バイアス電圧を印加する。TiB合金のターゲット10を用いたイオンボンバードにより、Tiイオン及びBイオンが基材7に照射される。
(1) 基材側単層部の成膜
基材7の上、又は改質層を形成した場合は改質層の上に、本実施形態の基材側単層部を形成する。この際、窒素ガスを使用し、アーク放電式蒸発源27に取り付けたAlCrB合金またはAlCrBC合金からなるターゲット18の表面にアーク放電用電源12からアーク電流を通電する。同時に、下記温度に制御した基材7にバイアス電源3から直流バイアス電圧またはユニポーラパルスバイアス電圧を印加する。
本実施形態の基材側単層部の成膜時の基材温度を400~550℃にする。基材温度が400℃未満では基材側単層部が十分に結晶化しないため、基材側単層部が十分な潤滑性及び耐摩耗性を有しない。また、残留応力の増加により皮膜剥離の原因となる。一方、基材温度が550℃超では基材側単層部の結晶粒の微細化が過度に促進されて潤滑性及び耐摩耗性が損なわれる。基材温度は480~540℃が好ましい。
本実施形態の基材側単層部の成膜ガスとして窒素ガスを使用する。窒素ガスの圧力(全圧)は2.7~3.3Paにする。窒素ガスの圧力が2.7Pa未満では、基材側単層部の窒化が不十分になり、窒化されない異相の存在により被覆切削工具の短寿命化を招くほか、基材側単層部の酸素含有量が過多になる。一方、窒素ガスの圧力が3.3Pa超では、基材側単層部の酸素含有量が過少になり、軟化を招く。窒素ガスの圧力は、2.8~3.2Paにするのが好ましく、2.9~3.1Paにするのがさらに好ましい。
窒素ガスの流量は750~900sccmにするのが好ましい。窒素ガスの流量が750sccm未満及び900sccm超ではいずれも上記窒素ガスの圧力(全圧)を2.7~3.3Paに調整するのが困難になる。窒素ガスの流量は770~880sccmにするのがさらに好ましい。
本実施形態の基材側単層部を形成するために、基材に直流又はユニポーラパルスのバイアス電圧を印加するのが好ましい。バイアス電圧は-160~-100Vにするのが好ましい。バイアス電圧が-160V未満ではB含有量が著しく低下する。一方、バイアス電圧が-100V超では被覆切削工具が短寿命になる。バイアス電圧は-150~-110Vにするのがさらに好ましい。
基材側単層部の成膜時のドロップレットを抑制するために、ターゲット18に通電するアーク電流(直流電流)は150~250Aにするのが好ましい。アーク電流が、150A未満ではアーク放電が不安定になり、250A超ではドロップレットが顕著に増加して基材側単層部の耐摩耗性が悪化する。アーク電流は160~240Aにするのがさらに好ましい。
基材側単層部の上に、本実施形態の積層部を形成する。積層部を最外層にしても良い。具体的には、基材側単層部の成膜を継続しつつ、ターゲット18(AlCrB合金またはAlCrBC合金)に加えてターゲット10(TiB合金)にアーク電流を通電することにより、a層とb層とが交互に堆積された本実施形態の積層部を形成する。積層部特有の成膜条件は以下の(i)、(ii)のみであり、その他は基材側単層部の成膜条件と同一である。
(i)基材に印加するバイアス電圧を-140~-80Vにするのが好ましい。積層部の成膜時に基材に印加するバイアス電圧を基材側単層部のバイアス電圧より正電圧側にシフト(このシフトは5~30Vが好ましい)することにより、積層部のb層の組成が基材側単層部及び表面側単層部の組成に比較してAlリッチになる。この構造により、高性能で長寿命の被覆切削工具を得られる。バイアス電圧が、-140V未満ではB含有量が大きく低下し、-80V超では被覆切削工具が短寿命になる。バイアス電圧のさらに好ましい範囲は-130~-90Vである。
(ii)積層部の成膜時に、ターゲット18及びターゲット10に同時にアーク電流を通電するのが実用的である。
積層部の上に、必要に応じて本実施形態の表面側単層部を形成する。例えば、成膜時間を調整して、表面側単層部と基材側単層部との膜厚比t3/t1を0.1~1.5に設定するのが好ましい。これ以外は上記基材側単層部の成膜条件と同一である。
積層部または表面側単層部を最外層にしても良いが、必要に応じて積層部または表面側単層部の上に、例えば公知の硬質皮膜を少なくとも一層設けても良い。公知の硬質皮膜として、例えば(TiAl)N、(TiAlCr)N、(TiAlNb)N、(TiAlW)N、(TiSi)N、(TiB)N、TiCN、Al2O3、Cr2O3、(AlCr)N、及び(AlCrSi)Nからなる群から選ばれた少なくとも一層の硬質皮膜が例示される。
(1) 基材のクリーニング
8.0質量%のCoを含有し、残部がWC及び不可避的不純物からなる組成を有するWC基超硬合金製の仕上げミーリングインサート基材(図13に示す三菱日ツール株式会社製のZDFG300-SC)、及び物性測定用インサート基材(三菱日立ツール株式会社製のSNMN120408)を、図1に示すAI装置の保持具8上にセットし、真空排気と同時にヒーター(図示せず)で550℃まで加熱した。その後、アルゴンガスを500sccm(sccmは1atm及び25℃におけるcc/分、以後同様)の流量で導入して減圧容器25内の圧力を2.0Paに調整するとともに、前記各基材(以後、基材7ともいう)に-200Vの直流バイアス電圧を印加してアルゴンイオンのボンバードによるエッチングにより基材7のクリーニングを行った。
基材温度を550℃に保持したまま、アルゴンガスの流量を70sccmとし、組成がTi0.85B0.15(原子比)で表されるTiB合金のターゲット10をアーク放電用電源11が接続されたアーク放電式蒸発源13に配置した。バイアス電源3により基材7に-800Vの直流電圧を印加するとともに、ターゲット10の表面にアーク放電用電源11から75Aのアーク電流(直流電流)を流し、基材7の表面に平均厚さ5nmの改質層を形成した。改質層の平均厚さの測定は特許第5967329号に記載の方法で行った。
Al0.55Cr0.35B0.10(原子比)の金属元素及び半金属元素の組成、及び酸素含有量が2300μg/gのAlCrB焼結体合金からなるターゲット18を、図1のアーク放電用電源12が接続されたアーク放電式蒸発源27に配置した。基材7の温度を450℃に設定するとともに、窒素ガス雰囲気とした減圧容器25内の窒素ガスの全圧を3.0Paにし、及び窒素ガスの流量を800sccmに調整した。
バイアス電源3により基材7に-120Vの直流電圧を印加した以外は、上記基材側単層部の成膜条件を維持しながら、組成がTi0.85B0.15(原子比)で表されるTiB合金のターゲット10にアーク放電用電源11から200Aの直流アーク電流を流し、基材側単層部の上にa層とb層とを交互に50層ずつ堆積して全体の膜厚(t2)が1.0μmの積層部を形成した。こうして本実施例の被覆切削工具(ミーリングインサート)を作製した。
図3は、上記被覆切削工具の断面組織を示す走査型電子顕微鏡(SEM)写真(倍率:20,000倍)である。図3において、31はWC基超硬合金基材であり、33は基材側単層部であり、34は積層部である。改質層32、積層部34を構成するa層及びb層はいずれも図3が低倍率なので見えない。
図3の基材側単層部33及び積層部34においてそれぞれ左端及び右端の膜厚を測定し、測定値を算術平均して基材側単層部33の膜厚(t1)及び積層部34の全体の膜厚(t2)を得た。また図3の積層部34から透過型電子顕微鏡(TEM、日本電子株式会社製JEM-2100)の観察用試料を作製し、前記試料の積層部を当該TEMにより撮影した暗視野像(倍率1,600,000倍)を図10に示す。図10における積層部の上側から下側に向かって交互に積層したa層及びb層の中央位置において積層周期Tを測定し、測定値を算術平均してTを得た。Tは20nmであった。
上記被覆切削工具の断面における基材側単層部の厚さ方向の中心位置を電子プローブマイクロ分析装置EPMA(日本電子株式会社製JXA-8500F)により、加速電圧10kV、照射電流0.05A、及びビーム径0.5μmの条件で測定し、基材側単層部の組成を分析した。さらに、上記基材側単層部の厚さ方向の中心位置において基材側単層部のN元素及びO元素の定量分析を、TEM(JEM-2100)に搭載のエネルギー分散型X線分光器(EDS、NORAN社製UTW型Si(Li)半導体検出器、ビーム径:約1μm)を使用したEDS分析により行った。EPMA及びEDS分析の測定条件は他の例でも同様である。
上記被覆切削工具の断面における基材側単層部及び積層部から構成される硬質皮膜の部分の結晶構造を観察するために、X線回折装置(Panalytical社製のEMPYREAN)を使用し、当該硬質皮膜の表面に以下の条件でCuKα1線(波長λ:0.15405nm)を照射してX線回折パターン(図6)を得た。
管電圧:45kV
管電流:40mA
入射角ω:3°に固定
2θ:20~90°
図10のTEMの暗視野像における白色部の位置4及び黒色部の位置5をそれぞれ、TEM(JEM-2100)に付属するUTW型Si(Li)半導体検出器によりEDS分析を行った。その結果、白色部の位置4(a層)の金属(半金属を含む)組成は(Ti0.90B0.01Al0.08Cr0.01)であった。また黒色部の位置5(b層)の金属(半金属を含む)組成は(Al0.57Cr0.33B0.02Ti0.08)であった。
図13及び図14に示すように、上記被覆切削工具(以後、インサート40Aともいう。)を、刃先交換式回転工具(三菱日立ツール株式会社製 ABPF30S32L150)50の工具本体46の先端部48に止めねじ47により装着した。刃先交換式回転工具50の刃径は30mmとした。刃先交換式回転工具50を使用して下記の転削条件で切削加工を行い、単位時間ごとにサンプリングしたインサート40Aのすくい面45a及び逃げ面45bを光学顕微鏡(倍率:100倍)で観察し、すくい面45a若しくは逃げ面45bのいずれかの摩耗幅またはチッピング幅が0.2mm以上になったときの加工時間を工具寿命と判定した。
加工方法: 連続転削加工
被削材: 120mm×250mmのS50C角材(HB220)
使用インサート: ZDFG300-SC(ミーリング用)
切削工具: ABPF30S32L150
切削速度: 380m/分
1刃当たりの送り量: 0.3mm/刃
軸方向の切り込み量: 0.3mm
半径方向の切り込み量:0.1mm
切削液: なし(乾式加工)
基材側単層部及び積層部の各成膜時間を調整することにより、膜厚t1を1.0μmとし、膜厚t2を0.8μmとして、膜厚比t1/t2を1.25に、及び積層周期Tを16nmに変化させた。前記以外は実施例1と同様にして本実施例の被覆切削工具(ミーリングインサート)を作製し、工具寿命等を測定した。
基材側単層部の成膜時間を調整することにより膜厚t1を5.0μmとし、膜厚比t1/t2を5に変化させた。前記以外は実施例1と同様にして本実施例の被覆切削工具(ミーリングインサート)を作製し、工具寿命等を測定した。
基材側単層部の成膜時間を調整して膜厚t1を1.2μmとした以外、実施例1と同様に、改質層を形成した基材の上に順に基材側単層部及び積層部を形成した。続いて、積層部の上に、成膜時間を調整した以外は基材側単層部と同じ成膜条件により表面側単層部として、(Al0.60Cr0.38B0.02)N0.994O0.006(原子比)の組成を有し、膜厚(t3)を1.2μmとした硬質皮膜を形成した。こうして、膜厚比t1/t2を1.2に、膜厚比t3/t2を1.2に、膜厚比(t1+t3)/t2を2.4に、及び膜厚比t3/t1を1に変化させた本実施例の被覆切削工具(ミーリングインサート)を作製し、工具寿命等を測定した。
基材側単層部の成膜時間を調整した以外は実施例1と同様にして、改質層を形成した基材の上に順に膜厚t1が4.0μmの基材側単層部、及び膜厚t2が1.0μmの積層部を形成した。続いて、積層部の上に、成膜時間を調整した以外は基材側単層部と同じ成膜条件により表面側単層部として、(Al0.60Cr0.38B0.02)N0.994O0.006(原子比)の組成を有し、膜厚(t3)を3.0μmとした硬質皮膜を形成した。こうして、膜厚比t1/t2を4に、膜厚比t3/t2を3に、膜厚比(t1+t3)/t2を7に、及び膜厚比t3/t1を0.75に変化させた本実施例の被覆切削工具(ミーリングインサート)を作製し、工具寿命等を測定した。
実施例1と同様にして、改質層を形成した基材の上に順に基材側単層部及び積層部を形成した。続いて、積層部の上に、成膜時間を調整した以外は基材側単層部と同じ成膜条件により表面側単層部として、(Al0.60Cr0.38B0.02)N0.995O0.005(原子比)の組成を有し、膜厚(t3)を0.5μmとした硬質皮膜を形成した。こうして、膜厚比t1/t2を2とし、膜厚比t3/t2を0.5とし、膜厚比(t1+t3)/t2を2.5とし、及び膜厚比t3/t1を0.25に変化させた本実施例の被覆切削工具(ミーリングインサート)を作製し、工具寿命等を測定した。
表1に示す各例のAlCrB合金ターゲット及びTiB合金ターゲットを使用し、表2に示す各例の基材側単層部の成膜条件を使用し、及び表3に示す各例の積層部のバイアス電圧を使用した以外、実施例1と同様にして各例の被覆切削工具(ミーリングインサート)を作製した。実施例7では実施例1に対してAlCrB合金ターゲットのAl(Cr)添加量を変化させた。実施例8及び9では実施例1に対してAlCrB合金ターゲットのB添加量を大きく変化させた。実施例10及び13では実施例1に対して窒素ガスの全圧を変化させた。実施例11では実施例9に対してバイアス電圧を変化させた。実施例12では実施例1に対してAlCrB合金ターゲットの含有酸素量を大きく増加させた。各例のAlCrB合金ターゲット及びTiB合金ターゲットの組成を表1に示す。各例の基材側単層部の成膜条件を表2に示す。各例の積層部のバイアス電圧を表3に示す。各例の基材側単層部の組成を表4に示す。各例のa層の金属(半金属を含む)元素の組成を表5に示し、各例のb層の金属(半金属を含む)元素の組成を表6にそれぞれ示す。各例の各膜厚t1及びt2、各膜厚比t1/t2及び各積層周期Tを表8に示す。基材側単層部及び積層部から構成される部分のX線回折の結果、各例のa層及びb層の電子回折の結果、及び各例の工具寿命を表9に示す。
表1に示すAlCrB合金ターゲットを使用し、成膜時における減圧容器25内の窒素ガス雰囲気の全圧を2Paとし、窒素ガスの流量を700sccmとし、及びDCバイアス電圧を-120Vとした以外、実施例1と同様にして、実施例1と同種の基材の上に基材側単層部のみを形成した本比較例の被覆切削工具(ミーリングインサート)を作製し、工具寿命等を測定した。図9に比較例1の被覆切削工具の基材側単層部のX線回折パターンを示す。
表1に示すAlCrB合金ターゲットを使用し、成膜時における減圧容器25内の窒素ガス雰囲気の全圧を3.5Paとし、窒素ガスの流量を900sccmとし、及びDCバイアス電圧を-120Vとした以外、実施例1と同様にして、実施例1と同種の基材の上に基材側単層部のみを形成した本比較例の被覆切削工具(ミーリングインサート)を作製し、工具寿命等を測定した。
表1に示す過少な酸素含有量(420μg/g)のAlCrB合金ターゲットを使用し、DCバイアス電圧を-120Vとした以外、実施例1と同様にして、実施例1と同種の基材の上に基材側単層部のみを形成した本比較例の被覆切削工具(ミーリングインサート)を作製し、工具寿命等を測定した。
表1に示す過多の酸素含有量(5390μg/g)のAlCrB合金ターゲットを使用し、DCバイアス電圧を-120Vとした以外、実施例1と同様に、実施例1と同種の基材の上に基材側単層部のみを形成した本比較例の被覆切削工具(ミーリングインサート)を作製し、工具寿命等を測定した。
WC基超硬合金基材にTiB合金ターゲットを用いた改質層を形成しない以外、実施例1と同様にして本実施例の被覆切削工具(ミーリングインサート)を作製し、工具寿命等を測定した。
表1に示す各例のAlCrBC合金ターゲットを使用した以外、実施例1と同様にして、本実施例の被覆切削工具(ミーリングインサート)を作製し、工具寿命等を測定した。
実施例1、4、6及び比較例1の各硬質皮膜の部分のX線回折パターン(図6~9)からそれぞれ読み取った各比I(200)/I(111)及び各比I(311)/I(111)を表10に示す。
2:ガス導入部
3:バイアス電源
6:下部保持具(支柱)
7:基材
8:上部保持具
10、18:陰極物質(ターゲット)
11、12:アーク放電用電源
13、27:アーク放電式蒸発源
14:アーク放電式蒸発源固定用絶縁物
15:アーク点火機構軸受部
16:アーク点火機構
17:排気口
19:電極固定用絶縁物
20:電極
21:遮蔽板軸受け部
22:遮蔽板駆動部
23:遮蔽板
24:軸受け部
25:減圧容器
31:WC基超硬合金基材
32:改質層
33:基材側単層部
34:積層部
35:表面側単層部
40A:ミーリング用インサート(インサート基材)
45a:インサートのすくい面
46:工具本体
47:インサート用止めねじ
48:工具本体の先端部
50:被覆切削工具(刃先交換式回転工具)
a:a層
b:b層
Claims (9)
- 基材上に硬質皮膜を有する被覆切削工具であって、
前記硬質皮膜として基材側から順に基材側単層部及び積層部を有し、
前記基材側単層部は、金属(半金属を含む)元素の割合でAlが最も多く、AlとCrの合計の含有比率(原子比)が0.9以上であり、かつ少なくともBを含有する窒化物主体の硬質皮膜からなり、
前記積層部は、金属(半金属を含む)元素の割合でTiが最も多く、かつ少なくともBを含有する窒化物主体のa層と、金属(半金属を含む)元素の割合でAlが最も多く、かつ少なくともCrとBを含有する窒化物主体のb層とが交互に積層されてなり、
a層とb層との膜厚方向の積層周期は5~100nmであり、
前記基材側単層部及び前記積層部から構成される部分のX線回折パターンはfccの単一構造からなることを特徴とする被覆切削工具。 - 請求項1に記載の被覆切削工具において、
前記基材側単層部の膜厚(t1)は1.0~5μmであり、前記積層部の全体の膜厚(t2)は0.5~2.5μmであり、前記基材側単層部と前記積層部の全体との膜厚比(t1/t2)は1.0~5であることを特徴とする被覆切削工具。 - 請求項1または2に記載の被覆切削工具において、
前記積層部の上に表面側単層部を有し、前記表面側単層部の膜厚(t3)は0.3~5μmであり、
前記基材側単層部、前記積層部及び前記表面側単層部から構成される部分のX線回折パターンはfccの単一構造からなり、
前記表面側単層部は、金属(半金属を含む)元素の割合でAlが最も多く、AlとCrの合計の含有比率(原子比)が0.9以上であり、かつ少なくともBを含有する窒化物主体の硬質皮膜からなることを特徴とする被覆切削工具。 - 請求項1~3のいずれか1項に記載の被覆切削工具において、
前記X線回折パターンにおける(200)面のX線回折ピーク値I(200)と(111)面のX線回折ピーク値I(111)との比I(200)/I(111)は0.2~0.37であることを特徴とする被覆切削工具。 - 請求項1~4のいずれか1項に記載の被覆切削工具において、
前記X線回折パターンにおける(311)面のX線回折ピーク値I(311)と(111)面のX線回折ピーク値I(111)との比I(311)/I(111)は0.03~0.15であることを特徴とする被覆切削工具。 - 請求項1に記載の被覆切削工具をアークイオンプレーティング法により製造する方法であって、
前記基材側単層部及び前記b層の形成用ターゲットは、不可避的不純物を除いて下記一般式:AlαCr1-α-β-γBβCγ(ただし、α、1-α-β-γ、β及びγはそれぞれAl、Cr、B及びCの原子比を表し、0.4≦α≦0.8、0.04≦β≦0.165、及び0≦γ≦0.035を満たす数字である。)で表される組成のAlCrB合金またはAlCrBC合金からなり、
前記a層の形成用ターゲットは、不可避的不純物を除いて下記一般式:Ti1-δBδ(ただし、1-δ及びδはそれぞれTi及びBの原子比を表し、0.1≦δ≦0.5を満たす数字である。)で表される組成のTiB合金からなり、
全圧2.7~3.3Paとした窒素ガス雰囲気において、基材温度を400~550℃とし、前記基材側単層部の形成時に基材に印加するバイアス電圧を-160~-100Vとし、前記積層部の形成時に基材に印加するバイアス電圧を-140~-80Vとすることを特徴とする被覆切削工具の製造方法。 - 請求項6に記載の被覆切削工具の製造方法において、
前記積層部の上に表面側単層部を形成する工程を有し、
前記表面側単層部の形成時に基材に印加するバイアス電圧を-160~-100Vとすることを特徴とする被覆切削工具の製造方法。 - 請求項7に記載の被覆切削工具の製造方法において、
前記表面側単層部の形成用ターゲットとして前記基材側単層部と同じAlCrB合金またはAlCrBC合金を用いることを特徴とする被覆切削工具の製造方法。 - 請求項6~8のいずれか1項に記載の被覆切削工具の製造方法において、
前記積層部の形成にあたり、前記a層の形成用ターゲット及び前記b層の形成用ターゲットに同時にアーク電流を通電することを特徴とする被覆切削工具の製造方法。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US17/048,666 US11511352B2 (en) | 2018-05-30 | 2019-03-27 | Coated cutting tool and production method therefor |
CN201980029433.0A CN112055632B (zh) | 2018-05-30 | 2019-03-27 | 包覆切削工具及其制造方法 |
JP2020521748A JP6927431B2 (ja) | 2018-05-30 | 2019-03-27 | 被覆切削工具及びその製造方法 |
KR1020207031180A KR102421533B1 (ko) | 2018-05-30 | 2019-03-27 | 피복 절삭 공구 및 그 제조 방법 |
EP19810081.0A EP3804891A4 (en) | 2018-05-30 | 2019-03-27 | COATED CUTTING TOOL AND MANUFACTURING METHOD THEREOF |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018103480 | 2018-05-30 | ||
JP2018-103480 | 2018-05-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2019230166A1 true WO2019230166A1 (ja) | 2019-12-05 |
Family
ID=68696646
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2019/013106 WO2019230166A1 (ja) | 2018-05-30 | 2019-03-27 | 被覆切削工具及びその製造方法 |
Country Status (6)
Country | Link |
---|---|
US (1) | US11511352B2 (ja) |
EP (1) | EP3804891A4 (ja) |
JP (1) | JP6927431B2 (ja) |
KR (1) | KR102421533B1 (ja) |
CN (1) | CN112055632B (ja) |
WO (1) | WO2019230166A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2021140818A1 (ja) * | 2020-01-08 | 2021-07-15 | 住友電工ハードメタル株式会社 | 切削工具 |
WO2023053340A1 (ja) * | 2021-09-30 | 2023-04-06 | オーエスジー株式会社 | 硬質被膜、硬質被膜被覆工具、および硬質被膜の製造方法 |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004136430A (ja) | 2002-08-23 | 2004-05-13 | Hitachi Tool Engineering Ltd | 被覆工具 |
JP2009220259A (ja) * | 2008-03-19 | 2009-10-01 | Tungaloy Corp | 立方晶窒化硼素焼結体工具 |
JP4714186B2 (ja) | 2007-05-31 | 2011-06-29 | ユニオンツール株式会社 | 被覆切削工具 |
JP2013518987A (ja) * | 2010-02-04 | 2013-05-23 | エリコン・トレーディング・アクチェンゲゼルシャフト,トリュープバッハ | AL−Cr−B−N/Ti−Al−N多層被覆を有する切削工具 |
JP5967329B2 (ja) | 2014-06-02 | 2016-08-10 | 三菱日立ツール株式会社 | 硬質皮膜、硬質皮膜被覆部材、それらの製造方法、及び硬質皮膜の製造に用いるターゲット及びその製造方法 |
WO2017169498A1 (ja) * | 2016-03-28 | 2017-10-05 | 住友電工ハードメタル株式会社 | 表面被覆切削工具、およびその製造方法 |
JP2018505310A (ja) * | 2014-12-22 | 2018-02-22 | エリコン サーフェス ソリューションズ アーゲー、 プフェフィコン | 強められた耐クレータ摩耗性をもたらすAlCrNベースのコーティング |
JP2018103480A (ja) | 2016-12-27 | 2018-07-05 | 株式会社ジェイエスピー | ポリスチレン系樹脂板状積層発泡体 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4714186Y1 (ja) | 1969-03-12 | 1972-05-23 | ||
EP1764174B1 (en) * | 2004-07-08 | 2017-01-18 | Sumitomo Electric Hardmetal Corp. | Surface-coated cutting tool having film with compressive stress intensity distribution |
JP2006082207A (ja) * | 2004-09-17 | 2006-03-30 | Sumitomo Electric Hardmetal Corp | 表面被覆切削工具 |
WO2006070509A1 (ja) | 2004-12-28 | 2006-07-06 | Sumitomo Electric Hardmetal Corp. | 表面被覆切削工具および表面被覆切削工具の製造方法 |
PL2069553T3 (pl) * | 2006-09-26 | 2023-07-31 | Oerlikon Surface Solutions Ag, Pfäffikon | Przedmiot obrabiany z twardą powłoką |
JP2009039838A (ja) | 2007-08-10 | 2009-02-26 | Mitsubishi Materials Corp | 表面被覆切削工具 |
HUE042494T2 (hu) * | 2012-04-16 | 2019-07-29 | Oerlikon Surface Solutions Ag Pfaeffikon | Nagyteljesítményû szerszámok csökkentett kráteresedéssel, különösképp száraz megmunkálási mûveletekben |
US9211588B2 (en) | 2012-06-29 | 2015-12-15 | Sumitomo Electric Hardmetal Corp. | Surface-coated cutting tool |
WO2014157688A1 (ja) * | 2013-03-28 | 2014-10-02 | 日立ツール株式会社 | 被覆切削工具及びその製造方法 |
CN107530786B (zh) | 2015-04-27 | 2020-05-05 | 株式会社泰珂洛 | 被覆切削工具 |
EP3170919B1 (en) | 2015-11-20 | 2019-01-09 | Seco Tools Ab | Coated cutting tool |
-
2019
- 2019-03-27 WO PCT/JP2019/013106 patent/WO2019230166A1/ja unknown
- 2019-03-27 KR KR1020207031180A patent/KR102421533B1/ko active IP Right Grant
- 2019-03-27 US US17/048,666 patent/US11511352B2/en active Active
- 2019-03-27 JP JP2020521748A patent/JP6927431B2/ja active Active
- 2019-03-27 CN CN201980029433.0A patent/CN112055632B/zh active Active
- 2019-03-27 EP EP19810081.0A patent/EP3804891A4/en active Pending
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004136430A (ja) | 2002-08-23 | 2004-05-13 | Hitachi Tool Engineering Ltd | 被覆工具 |
JP4714186B2 (ja) | 2007-05-31 | 2011-06-29 | ユニオンツール株式会社 | 被覆切削工具 |
JP2009220259A (ja) * | 2008-03-19 | 2009-10-01 | Tungaloy Corp | 立方晶窒化硼素焼結体工具 |
JP2013518987A (ja) * | 2010-02-04 | 2013-05-23 | エリコン・トレーディング・アクチェンゲゼルシャフト,トリュープバッハ | AL−Cr−B−N/Ti−Al−N多層被覆を有する切削工具 |
JP5684829B2 (ja) | 2010-02-04 | 2015-03-18 | エリコン・トレーディング・アクチェンゲゼルシャフト,トリュープバッハOerlikon Trading AG,Truebbach | Al−Cr−B−N/Ti−Al−N多層被覆を有する多層被覆システム及び該多層被覆システムで被覆される固体本体 |
JP5967329B2 (ja) | 2014-06-02 | 2016-08-10 | 三菱日立ツール株式会社 | 硬質皮膜、硬質皮膜被覆部材、それらの製造方法、及び硬質皮膜の製造に用いるターゲット及びその製造方法 |
JP2018505310A (ja) * | 2014-12-22 | 2018-02-22 | エリコン サーフェス ソリューションズ アーゲー、 プフェフィコン | 強められた耐クレータ摩耗性をもたらすAlCrNベースのコーティング |
WO2017169498A1 (ja) * | 2016-03-28 | 2017-10-05 | 住友電工ハードメタル株式会社 | 表面被覆切削工具、およびその製造方法 |
JP2018103480A (ja) | 2016-12-27 | 2018-07-05 | 株式会社ジェイエスピー | ポリスチレン系樹脂板状積層発泡体 |
Non-Patent Citations (1)
Title |
---|
See also references of EP3804891A4 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2021140818A1 (ja) * | 2020-01-08 | 2021-07-15 | 住友電工ハードメタル株式会社 | 切削工具 |
WO2023053340A1 (ja) * | 2021-09-30 | 2023-04-06 | オーエスジー株式会社 | 硬質被膜、硬質被膜被覆工具、および硬質被膜の製造方法 |
Also Published As
Publication number | Publication date |
---|---|
CN112055632B (zh) | 2023-06-30 |
JPWO2019230166A1 (ja) | 2021-02-12 |
EP3804891A4 (en) | 2022-02-23 |
KR20200136991A (ko) | 2020-12-08 |
US20210162510A1 (en) | 2021-06-03 |
JP6927431B2 (ja) | 2021-09-01 |
US11511352B2 (en) | 2022-11-29 |
EP3804891A1 (en) | 2021-04-14 |
CN112055632A (zh) | 2020-12-08 |
KR102421533B1 (ko) | 2022-07-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP3269479B1 (en) | Surface-coated cutting tool and method for manufacturing same | |
JP6634647B2 (ja) | 耐チッピング性、耐摩耗性にすぐれた表面被覆切削工具 | |
JP6428899B2 (ja) | Wc基超硬合金基体の改質方法 | |
JP5967329B2 (ja) | 硬質皮膜、硬質皮膜被覆部材、それらの製造方法、及び硬質皮膜の製造に用いるターゲット及びその製造方法 | |
JP4748450B2 (ja) | 高速断続切削加工で硬質被覆層がすぐれた耐チッピング性を発揮する表面被覆切削工具 | |
WO2019230166A1 (ja) | 被覆切削工具及びその製造方法 | |
JP6421733B2 (ja) | 硬質皮膜、硬質皮膜被覆部材、及びそれらの製造方法 | |
JP2010207918A (ja) | 表面被覆切削工具 | |
JP6930446B2 (ja) | 硬質皮膜、硬質皮膜被覆工具及びその製造方法 | |
JP5035979B2 (ja) | 高速ミーリング加工で硬質被覆層がすぐれた耐摩耗性を発揮する表面被覆切削工具およびその製造方法 | |
WO2019188967A1 (ja) | 表面被覆切削工具 | |
JP4120500B2 (ja) | 高速切削加工で表面被覆層がすぐれた耐摩耗性を発揮する表面被覆超硬合金製切削工具 | |
JP2018162505A (ja) | 硬質皮膜、硬質皮膜被覆工具、及びそれらの製造方法 | |
WO2022208654A1 (ja) | 表面被覆切削工具 | |
WO2022196555A1 (ja) | 表面被覆切削工具 | |
JP2020152983A (ja) | 被覆切削工具及びその製造方法 | |
JP2002254228A (ja) | 高速切削ですぐれた耐摩耗性を発揮する表面被覆超硬合金製ドリル | |
JP2007136653A (ja) | 高硬度鋼の重切削加工で硬質被覆層がすぐれた耐チッピング性を発揮する表面被覆立方晶窒化ほう素基超高圧焼結材料製切削工具 | |
JP5321361B2 (ja) | 表面被覆切削工具 | |
JPH10251832A (ja) | 耐摩耗性のすぐれた表面被覆超硬合金製切削工具 | |
JP6062623B2 (ja) | 切削工具 | |
JP5688685B2 (ja) | 表面被覆切削工具 | |
JP4883474B2 (ja) | 高硬度鋼の高速切削加工で硬質被覆層がすぐれた耐摩耗性を発揮する表面被覆立方晶窒化ほう素基超高圧焼結材料製切削工具 | |
JP2017179465A (ja) | 硬質皮膜、硬質皮膜被覆部材、及びそれらの製造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 19810081 Country of ref document: EP Kind code of ref document: A1 |
|
ENP | Entry into the national phase |
Ref document number: 2020521748 Country of ref document: JP Kind code of ref document: A |
|
ENP | Entry into the national phase |
Ref document number: 20207031180 Country of ref document: KR Kind code of ref document: A |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
ENP | Entry into the national phase |
Ref document number: 2019810081 Country of ref document: EP Effective date: 20210111 |