WO2019198263A1 - 蒸着マスク用基材、蒸着マスク用基材の製造方法、蒸着マスクの製造方法、および、表示装置の製造方法 - Google Patents
蒸着マスク用基材、蒸着マスク用基材の製造方法、蒸着マスクの製造方法、および、表示装置の製造方法 Download PDFInfo
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- WO2019198263A1 WO2019198263A1 PCT/JP2018/039966 JP2018039966W WO2019198263A1 WO 2019198263 A1 WO2019198263 A1 WO 2019198263A1 JP 2018039966 W JP2018039966 W JP 2018039966W WO 2019198263 A1 WO2019198263 A1 WO 2019198263A1
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- Prior art keywords
- mass
- nickel
- vapor deposition
- mask
- deposition mask
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- 238000007740 vapor deposition Methods 0.000 title claims abstract description 181
- 239000000463 material Substances 0.000 title claims abstract description 74
- 238000004519 manufacturing process Methods 0.000 title claims description 58
- 238000000034 method Methods 0.000 title claims description 50
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims abstract description 218
- 229910052759 nickel Inorganic materials 0.000 claims abstract description 97
- 239000011888 foil Substances 0.000 claims abstract description 79
- 229910052751 metal Inorganic materials 0.000 claims abstract description 77
- 239000002184 metal Substances 0.000 claims abstract description 77
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims abstract description 53
- 238000009713 electroplating Methods 0.000 claims abstract description 34
- 229910052742 iron Inorganic materials 0.000 claims abstract description 25
- 229910001030 Iron–nickel alloy Inorganic materials 0.000 claims abstract description 16
- 239000000758 substrate Substances 0.000 claims description 69
- 230000008021 deposition Effects 0.000 claims description 50
- 238000007747 plating Methods 0.000 claims description 40
- 238000000137 annealing Methods 0.000 claims description 18
- 230000008020 evaporation Effects 0.000 claims description 9
- 238000001704 evaporation Methods 0.000 claims description 9
- 238000005530 etching Methods 0.000 description 21
- 230000000052 comparative effect Effects 0.000 description 17
- 239000000203 mixture Substances 0.000 description 17
- 239000000243 solution Substances 0.000 description 17
- 238000005304 joining Methods 0.000 description 13
- 239000011521 glass Substances 0.000 description 11
- 239000004642 Polyimide Substances 0.000 description 9
- 229920001721 polyimide Polymers 0.000 description 9
- 238000003466 welding Methods 0.000 description 9
- 239000011241 protective layer Substances 0.000 description 8
- 230000002378 acidificating effect Effects 0.000 description 7
- 230000002829 reductive effect Effects 0.000 description 7
- 229910021578 Iron(III) chloride Inorganic materials 0.000 description 6
- OFOBLEOULBTSOW-UHFFFAOYSA-N Malonic acid Chemical compound OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 description 6
- RBTARNINKXHZNM-UHFFFAOYSA-K iron trichloride Chemical compound Cl[Fe](Cl)Cl RBTARNINKXHZNM-UHFFFAOYSA-K 0.000 description 6
- 239000003795 chemical substances by application Substances 0.000 description 5
- 238000010438 heat treatment Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 4
- 230000007423 decrease Effects 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- 239000007864 aqueous solution Substances 0.000 description 3
- KRKNYBCHXYNGOX-UHFFFAOYSA-N citric acid Chemical compound OC(=O)CC(O)(C(O)=O)CC(O)=O KRKNYBCHXYNGOX-UHFFFAOYSA-N 0.000 description 3
- 239000013256 coordination polymer Substances 0.000 description 3
- -1 iron ion Chemical class 0.000 description 3
- 229910044991 metal oxide Inorganic materials 0.000 description 3
- 150000004706 metal oxides Chemical class 0.000 description 3
- 238000005192 partition Methods 0.000 description 3
- 230000000149 penetrating effect Effects 0.000 description 3
- 239000007921 spray Substances 0.000 description 3
- 101710108306 Bifunctional dihydroflavonol 4-reductase/flavanone 4-reductase Proteins 0.000 description 2
- 101710170824 Dihydroflavonol 4-reductase Proteins 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 2
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 2
- 239000000654 additive Substances 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical compound OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 description 2
- 239000004327 boric acid Substances 0.000 description 2
- 239000008139 complexing agent Substances 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- SURQXAFEQWPFPV-UHFFFAOYSA-L iron(2+) sulfate heptahydrate Chemical compound O.O.O.O.O.O.O.[Fe+2].[O-]S([O-])(=O)=O SURQXAFEQWPFPV-UHFFFAOYSA-L 0.000 description 2
- LHOWRPZTCLUDOI-UHFFFAOYSA-K iron(3+);triperchlorate Chemical compound [Fe+3].[O-]Cl(=O)(=O)=O.[O-]Cl(=O)(=O)=O.[O-]Cl(=O)(=O)=O LHOWRPZTCLUDOI-UHFFFAOYSA-K 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 229910052749 magnesium Inorganic materials 0.000 description 2
- 239000011777 magnesium Substances 0.000 description 2
- 239000000395 magnesium oxide Substances 0.000 description 2
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 2
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 description 2
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 description 2
- 229910001453 nickel ion Inorganic materials 0.000 description 2
- LGQLOGILCSXPEA-UHFFFAOYSA-L nickel sulfate Chemical compound [Ni+2].[O-]S([O-])(=O)=O LGQLOGILCSXPEA-UHFFFAOYSA-L 0.000 description 2
- 229910000363 nickel(II) sulfate Inorganic materials 0.000 description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000006174 pH buffer Substances 0.000 description 2
- VLTRZXGMWDSKGL-UHFFFAOYSA-N perchloric acid Chemical compound OCl(=O)(=O)=O VLTRZXGMWDSKGL-UHFFFAOYSA-N 0.000 description 2
- 238000005096 rolling process Methods 0.000 description 2
- 230000000930 thermomechanical effect Effects 0.000 description 2
- FTLYMKDSHNWQKD-UHFFFAOYSA-N (2,4,5-trichlorophenyl)boronic acid Chemical compound OB(O)C1=CC(Cl)=C(Cl)C=C1Cl FTLYMKDSHNWQKD-UHFFFAOYSA-N 0.000 description 1
- BJEPYKJPYRNKOW-REOHCLBHSA-N (S)-malic acid Chemical compound OC(=O)[C@@H](O)CC(O)=O BJEPYKJPYRNKOW-REOHCLBHSA-N 0.000 description 1
- OSWFIVFLDKOXQC-UHFFFAOYSA-N 4-(3-methoxyphenyl)aniline Chemical compound COC1=CC=CC(C=2C=CC(N)=CC=2)=C1 OSWFIVFLDKOXQC-UHFFFAOYSA-N 0.000 description 1
- 101100493712 Caenorhabditis elegans bath-42 gene Proteins 0.000 description 1
- 229910021585 Nickel(II) bromide Inorganic materials 0.000 description 1
- 229910021586 Nickel(II) chloride Inorganic materials 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 239000003929 acidic solution Substances 0.000 description 1
- BJEPYKJPYRNKOW-UHFFFAOYSA-N alpha-hydroxysuccinic acid Natural products OC(=O)C(O)CC(O)=O BJEPYKJPYRNKOW-UHFFFAOYSA-N 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000000921 elemental analysis Methods 0.000 description 1
- 229960002089 ferrous chloride Drugs 0.000 description 1
- 235000019253 formic acid Nutrition 0.000 description 1
- 150000004687 hexahydrates Chemical class 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- NMCUIPGRVMDVDB-UHFFFAOYSA-L iron dichloride Chemical compound Cl[Fe]Cl NMCUIPGRVMDVDB-UHFFFAOYSA-L 0.000 description 1
- SQZYOZWYVFYNFV-UHFFFAOYSA-L iron(2+);disulfamate Chemical compound [Fe+2].NS([O-])(=O)=O.NS([O-])(=O)=O SQZYOZWYVFYNFV-UHFFFAOYSA-L 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000001630 malic acid Substances 0.000 description 1
- 235000011090 malic acid Nutrition 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- LAIZPRYFQUWUBN-UHFFFAOYSA-L nickel chloride hexahydrate Chemical compound O.O.O.O.O.O.[Cl-].[Cl-].[Ni+2] LAIZPRYFQUWUBN-UHFFFAOYSA-L 0.000 description 1
- QMMRZOWCJAIUJA-UHFFFAOYSA-L nickel dichloride Chemical compound Cl[Ni]Cl QMMRZOWCJAIUJA-UHFFFAOYSA-L 0.000 description 1
- IPLJNQFXJUCRNH-UHFFFAOYSA-L nickel(2+);dibromide Chemical compound [Ni+2].[Br-].[Br-] IPLJNQFXJUCRNH-UHFFFAOYSA-L 0.000 description 1
- KERTUBUCQCSNJU-UHFFFAOYSA-L nickel(2+);disulfamate Chemical compound [Ni+2].NS([O-])(=O)=O.NS([O-])(=O)=O KERTUBUCQCSNJU-UHFFFAOYSA-L 0.000 description 1
- 229910000008 nickel(II) carbonate Inorganic materials 0.000 description 1
- ZULUUIKRFGGGTL-UHFFFAOYSA-L nickel(ii) carbonate Chemical compound [Ni+2].[O-]C([O-])=O ZULUUIKRFGGGTL-UHFFFAOYSA-L 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 239000003002 pH adjusting agent Substances 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 229940085605 saccharin sodium Drugs 0.000 description 1
- 229940049703 saccharin sodium dihydrate Drugs 0.000 description 1
- 229910000029 sodium carbonate Inorganic materials 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
- H10K71/166—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using selective deposition, e.g. using a mask
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D1/00—Electroforming
- C25D1/10—Moulds; Masks; Masterforms
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/04—Coating on selected surface areas, e.g. using masks
- C23C14/042—Coating on selected surface areas, e.g. using masks using masks
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D1/00—Electroforming
- C25D1/04—Wires; Strips; Foils
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/56—Electroplating: Baths therefor from solutions of alloys
- C25D3/562—Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of iron or nickel or cobalt
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/48—After-treatment of electroplated surfaces
- C25D5/50—After-treatment of electroplated surfaces by heat-treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
- H10K71/164—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using vacuum deposition
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/40—Thermal treatment, e.g. annealing in the presence of a solvent vapour
Definitions
- the present invention relates to a deposition mask substrate, a deposition mask substrate manufacturing method, a deposition mask manufacturing method, and a display device manufacturing method.
- the organic EL element included in the organic EL display device is formed by vapor deposition of an organic material using a vapor deposition mask.
- a material for forming a vapor deposition mask a thin plate of an iron-nickel alloy is used as a vapor deposition mask substrate (see, for example, Patent Document 1).
- a thin plate of an iron-nickel alloy a rolled material obtained by rolling a base material of the iron-nickel alloy is used.
- a metal foil formed by electroplating as a thin plate of an iron-nickel alloy.
- annealing is performed on the metal foil, at least one of the four corners of the metal foil may be lifted with respect to the central portion of the metal foil.
- Such lifting of the metal foil is a cause of a decrease in workability when forming the vapor deposition mask and a decrease in accuracy of the shape and position of the through holes formed in the vapor deposition mask. Therefore, it is required to suppress the lifting of the four corners in the annealed metal foil.
- the present invention relates to a deposition mask substrate, which is a metal foil formed using electroplating, and is capable of suppressing lifting at the four corners of the deposition mask substrate.
- An object is to provide a manufacturing method, a manufacturing method of a vapor deposition mask, and a manufacturing method of a display device.
- the substrate for a vapor deposition mask for solving the above-mentioned problems is a substrate for a vapor deposition mask that is a metal foil formed by using electroplating.
- the metal foil is made of an iron-nickel alloy.
- the first surface has a first nickel mass ratio (% by mass) that is a percentage of the mass of nickel with respect to the sum of the mass of iron and the mass of nickel on the first surface.
- the second surface has a second nickel mass ratio (% by mass) that is a percentage of the mass of nickel with respect to the sum of the mass of iron and the mass of nickel on the second surface.
- the absolute value of the difference between the first nickel mass ratio (mass%) and the second nickel mass ratio (mass%) is the mass difference (mass%).
- a value obtained by dividing the mass difference by the thickness ( ⁇ m) of the vapor deposition mask substrate is a standard value.
- the standard value is 0.05 (mass% / ⁇ m) or less.
- the manufacturing method of the base material for vapor deposition masks for solving the said subject is a method of manufacturing the base material for vapor deposition masks which is the metal foil formed using electroplating. Forming a plating foil by the electroplating, and annealing the plating foil to obtain the metal foil.
- the metal foil is made of an iron-nickel alloy and includes a first surface and a second surface that is a surface opposite to the first surface. The first surface has a mass ratio (mass%) of the first nickel which is a percentage of the mass of nickel with respect to the sum of the mass of iron and the mass of nickel on the first surface.
- the second surface has a second nickel mass ratio (% by mass) that is a percentage of the mass of nickel with respect to the sum of the mass of iron and the mass of nickel on the second surface.
- the absolute value of the difference between the first nickel mass ratio (mass%) and the second nickel mass ratio (mass%) is the mass difference (mass%).
- a value obtained by dividing the mass difference by the thickness ( ⁇ m) of the vapor deposition mask substrate is a standard value. The standard value is 0.05 (mass% / ⁇ m) or less.
- a method for manufacturing a vapor deposition mask for solving the above-described problem is a method for manufacturing a vapor deposition mask by forming a plurality of through holes in a vapor deposition mask substrate that is a metal foil formed by electroplating. Forming a plating foil using the electroplating, annealing the plating foil to obtain the metal foil, and forming a plurality of through holes in the metal foil.
- the metal foil includes a first surface and a second surface that is a surface opposite to the first surface.
- the first surface has a first nickel mass ratio (% by mass) that is a percentage of the mass of nickel with respect to the sum of the mass of iron and the mass of nickel on the first surface.
- the second surface has a second nickel mass ratio that is a percentage of the mass of nickel relative to the sum of the mass of iron and the mass of nickel on the second surface.
- the absolute value of the difference between the first nickel mass ratio (mass%) and the second nickel mass ratio (mass%) is the mass difference (mass%).
- a value obtained by dividing the mass difference by the thickness ( ⁇ m) of the vapor deposition mask substrate is a standard value. The standard value is 0.05 (mass% / ⁇ m) or less.
- a method of manufacturing a display device for solving the above-described problems includes preparing a vapor deposition mask by the vapor deposition mask manufacturing method and forming a pattern by vapor deposition using the vapor deposition mask.
- the amount of change in the mass ratio of nickel is suppressed to 0.05 (mass% / ⁇ m) or less per standard value, that is, per unit thickness of the base material for the evaporation mask. It is possible to prevent the four corners of the base material from being lifted with respect to the central portion.
- the substrate for a vapor deposition mask for solving the above-mentioned problems is a substrate for a vapor deposition mask that is a metal foil formed by using electroplating.
- the metal foil is made of an iron-nickel alloy and includes a first surface and a second surface that is a surface opposite to the first surface.
- the first surface has a first nickel mass ratio (% by mass) that is a percentage of the mass of nickel with respect to the sum of the mass of iron and the mass of nickel on the first surface.
- the second surface has a second nickel mass ratio (% by mass) that is a percentage of the mass of nickel with respect to the sum of the mass of iron and the mass of nickel on the second surface.
- the absolute value of the difference between the first nickel mass ratio (mass%) and the second nickel mass ratio (mass%) is the mass difference (mass%).
- the said mass difference is 0.6 (mass%) or less. According to the said structure, since the mass difference is suppressed to 0.6 (mass%) or less, it is suppressed that the four corners of the base material for vapor deposition masks float with respect to a center part.
- the deposition mask substrate may have a thickness of 15 ⁇ m or less.
- the depth of the hole which a vapor deposition mask has can be 15 micrometers or less, and the volume of the hole which a vapor deposition mask has can be made small. Thereby, the quantity which the vapor deposition material which passes the hole of a vapor deposition mask adheres to a vapor deposition mask can be decreased.
- the first nickel mass ratio and the second nickel mass ratio may be 35.8 mass% or more and 42.5 mass% or less, respectively.
- the difference between the linear expansion coefficient of the substrate for vapor deposition mask and the linear expansion coefficient of the glass substrate, and the difference between the linear expansion coefficient of the substrate for vapor deposition mask and the linear expansion coefficient of the polyimide sheet can be small.
- size change by the thermal expansion in a vapor deposition mask is the same grade as the magnitude
- the base material for a vapor deposition mask that is a metal foil formed by electroplating, it is possible to suppress lifting at the four corners of the base material for the vapor deposition mask.
- Process drawing which shows the annealing process in the manufacturing method of the base material for vapor deposition masks.
- Process drawing which shows the etching process for manufacturing a mask part.
- Process drawing which shows the etching process for manufacturing a mask part.
- Process drawing which shows the etching process for manufacturing a mask part.
- Process drawing which shows the etching process for manufacturing a mask part.
- Process drawing which shows the etching process for manufacturing a mask part.
- Process drawing which shows the etching process for manufacturing a mask part.
- Process drawing which shows an example of the process of joining the mask part to the frame part in the manufacturing method of a vapor deposition mask.
- Process drawing which shows the other example of the process of joining the mask part to the flame
- Process drawing which shows another example of the process of joining the mask part to the frame part in the manufacturing method of a vapor deposition mask.
- FIG. The photograph which image
- FIG. The photograph which image
- a deposition mask substrate an embodiment of a deposition mask substrate, a method for producing a deposition mask substrate, a method for producing a deposition mask, and a method for producing a display device will be described.
- the structure of the base material for vapor deposition masks, the structure of a mask apparatus provided with a vapor deposition mask, the manufacturing method of the base material for vapor deposition masks, the manufacturing method of a vapor deposition mask, the manufacturing method of a display apparatus, and an Example are demonstrated in order.
- the structure of the base material for vapor deposition masks is demonstrated.
- the base material 10 for vapor deposition masks is the metal foil formed using electroplating.
- the metal foil is made of an iron-nickel alloy.
- the substrate 10 for vapor deposition mask includes a first surface 10A and a second surface 10B which is a surface opposite to the first surface 10A.
- the absolute value of the difference between the mass ratio (mass%) of nickel (Ni) on the first surface 10A and the mass ratio (mass%) of Ni on the second surface 10B is the mass difference ( Mass%) (MD).
- a value obtained by dividing the mass difference by the thickness ( ⁇ m) (T) of the base material for the vapor deposition mask is the standard value (MD / T).
- a standard value is 0.05 (mass% / micrometer) or less.
- the first surface 10A has a first nickel mass ratio (mass%) that is a percentage of the mass of nickel with respect to the sum of the mass of iron and the mass of nickel in the first surface 10A.
- the second surface 10B has a second nickel mass ratio (% by mass) that is a percentage of the mass of nickel with respect to the sum of the mass of iron and the mass of nickel in the second surface 10B.
- the difference between the first nickel mass ratio (mass%) and the second nickel mass ratio (mass%) is the mass difference (mass%).
- a value obtained by dividing the mass difference by the thickness ( ⁇ m) of the base material for the evaporation mask is the standard value.
- the standard value is 0.05 (mass% / ⁇ m) or less.
- the amount of change in the mass ratio of Ni is suppressed to 0.05 or less per standard value, that is, per unit thickness of the evaporation mask substrate 10, the four corners of the evaporation mask substrate 10 are centered. Floating against the part is suppressed.
- the mass ratio of Ni is the percentage of the mass of Ni with respect to the total (Wfe + Wni) of the mass of iron (Wfe) and the mass of Ni (Wni) ⁇ 100 ⁇ Wni / (Wfe + Wni) ⁇ .
- the remainder which is a part other than Ni is iron (Fe).
- the base material 10 for vapor deposition masks is a base material made of an iron-nickel alloy.
- the balance may contain other elements in addition to the main component Fe. Examples of other elements include Si, C, O, and S.
- the total percentage (mass%) of the mass of Fe with respect to the total mass in each surface and the mass of Ni is 90 mass% or more.
- the first surface 10A is, for example, an electrode surface 10E that is in contact with the electrode for electroplating.
- the second surface 10B is a deposition surface 10D that is the surface opposite to the electrode surface 10E.
- the mass ratio of Ni in the electrode surface 10E is larger than the mass ratio of Ni in the deposition surface 10D.
- the mass ratio of Ni in the electrode surface 10E is smaller than the mass ratio in the deposition surface 10D. The smaller the difference between the Ni mass ratio on the electrode surface 10E and the Ni mass ratio on the deposition surface 10D, the better.
- the thickness of the deposition mask substrate 10 is 15 ⁇ m or less.
- the depth of the hole which a vapor deposition mask has can be 15 micrometers or less, and, thereby, the volume of the hole which a vapor deposition mask has can be made small. Therefore, the amount of the vapor deposition material that passes through the hole of the vapor deposition mask adheres to the vapor deposition mask can be reduced.
- the mass ratio of Ni (first nickel mass ratio) on the first surface 10A and the mass ratio of Ni (second nickel mass ratio) on the second surface 10B are nickel mass ratios.
- Nickel mass ratio is 35.8 mass% or more and 42.5 mass% or less. Therefore, the difference between the linear expansion coefficient of the vapor deposition mask base material 10 and the linear expansion coefficient of the glass substrate, and the difference between the linear expansion coefficient of the vapor deposition mask base material 10 and the linear expansion coefficient of the polyimide sheet are reduced. be able to.
- size change by the thermal expansion in a vapor deposition mask is the same grade as the magnitude
- FIG. 2 shows a schematic planar structure of a mask apparatus including a vapor deposition mask manufactured using the vapor deposition mask substrate 10.
- FIG. 3 shows an example of a cross-sectional structure of the mask portion included in the vapor deposition mask.
- FIG. 4 shows another example of the cross-sectional structure of the mask portion provided in the vapor deposition mask. Note that the number of vapor deposition masks included in the mask apparatus in FIG. 2 and the number of mask portions included in the vapor deposition mask 30 are examples of the number of vapor deposition masks and the number of mask portions.
- the mask device 20 includes a main frame 21 and three vapor deposition masks 30.
- the main frame 21 has a rectangular frame shape that supports the plurality of vapor deposition masks 30 and is attached to a vapor deposition apparatus for performing vapor deposition.
- the main frame 21 has a main frame hole 21H penetrating the main frame 21 over almost the entire range where the respective vapor deposition masks 30 are located.
- Each vapor deposition mask 30 includes a frame portion 31 having a strip shape and three mask portions 32 in each frame portion 31.
- the frame portion 31 has a strip shape that supports the mask portion 32 and is attached to the main frame 21.
- the vapor deposition mask 30 may be joined to the main frame 21 such that each end in the direction in which the vapor deposition mask 30 extends extends beyond the outer edge of the main frame 21.
- the frame part 31 has a frame hole 31H penetrating the frame part 31 over almost the entire range where the mask part 32 is located.
- the frame part 31 has a frame shape that has higher rigidity than the mask part 32 and surrounds the frame hole 31H.
- Each mask portion 32 is fixed one by one to the frame inner edge of the frame portion 31 that defines the frame hole 31H. For example, welding or adhesion is used for fixing the mask portion 32.
- an example of the mask unit 32 includes a mask plate 321.
- the mask plate 321 may be a single plate member formed from the vapor deposition mask substrate 10 or a laminate of a single plate member and a resin plate formed from the vapor deposition mask substrate 10. There may be.
- the mask board 321 is shown as one board
- the mask plate 321 includes a first surface 321A (a lower surface in FIG. 3) and a second surface 321B (an upper surface in FIG. 3) which is a surface opposite to the first surface 321A.
- the first surface 321A faces a deposition target such as a glass substrate in a state where the mask device 20 is attached to the deposition device.
- the second surface 321B faces the vapor deposition source of the vapor deposition apparatus.
- the mask part 32 has a plurality of holes 32 ⁇ / b> H that penetrate the mask plate 321.
- the wall surface of the hole 32 ⁇ / b> H has an inclination in a sectional view with respect to the thickness direction of the mask plate 321. As shown in FIG.
- the shape of the wall surface of the hole 32 ⁇ / b> H may be a semicircular arc shape protruding toward the outside of the hole 32 ⁇ / b> H or a complicated curved shape having a plurality of bending points. May be.
- the thickness of the mask plate 321 is 15 ⁇ m or less. Since the thickness of the mask plate 321 is 15 ⁇ m or less, the depth of the hole 32H formed in the mask plate 321 can be 15 ⁇ m or less. As described above, in the case of the thin mask plate 321, the volume of the vapor deposition material attached to the wall surface of the hole 32H can be reduced by reducing the area of the wall surface of the hole 32H itself.
- the second surface 321B includes a second opening H2 that is an opening of the hole 32H
- the first surface 321A includes a first opening H1 that is an opening of the hole 32H.
- the second opening H2 is larger than the first opening H1 in plan view.
- Each hole 32H is a passage through which the vapor deposition material sublimated from the vapor deposition source passes.
- the vapor deposition material sublimated from the vapor deposition source travels from the second opening H2 toward the first opening H1. Since the second opening H2 is the hole 32H larger than the first opening H1, it is possible to increase the amount of the vapor deposition material entering the hole 32H from the second opening H2.
- the area of the hole 32H in the cross section along the first surface 321A may increase monotonously from the first opening H1 to the second opening H2 from the first opening H1 to the second opening H2. You may provide the site
- another example of the mask part 32 has a plurality of holes 32 ⁇ / b> H penetrating the mask plate 321.
- the second opening H2 is larger than the first opening H1 in plan view.
- the hole 32H includes a large hole 32LH having a second opening H2 and a small hole 32SH having a first opening H1.
- the cross-sectional area of the large hole 32LH monotonously decreases from the second opening H2 toward the first surface 321A.
- the cross-sectional area of the small hole 32SH monotonously decreases from the first opening H1 toward the second surface 321B.
- the wall surface of the hole 32H has a shape protruding toward the inside of the hole 32H in the middle of the thickness direction of the mask plate 321 in a cross-sectional view, that is, in the middle of the thickness direction of the mask plate 321.
- the distance between the portion protruding from the wall surface of the hole 32H and the first surface 321A is the step height SH.
- the step height SH is zero. From the viewpoint of securing the amount of the vapor deposition material that reaches the first opening H1, a configuration in which the step height SH is zero is preferable.
- the mask plate 321 is thin enough that the hole 32H is formed by wet etching from one side of the vapor deposition mask substrate 10, for example, 15 ⁇ m or less. is there.
- FIG. 5 shows an example of a cross-sectional structure of the joint structure between the mask portion 32 and the frame portion 31.
- FIG. 5 shows a cross-sectional structure of the joint structure between the mask portion 32 and the frame portion 31 described above with reference to FIG.
- the outer edge portion 32E of the mask plate 321 is a region not provided with the hole 32H.
- a portion of the second surface 321B of the mask plate 321 included in the outer edge portion 32E of the mask plate 321 is joined to the frame portion 31.
- the frame portion 31 includes an inner edge portion 31E that partitions the frame hole 31H.
- the inner edge portion 31E includes a bonding surface 31A (the lower surface in FIG. 5) facing the mask plate 321 and a non-bonding surface 31B (an upper surface in FIG. 5) that is the surface opposite to the bonding surface 31A.
- the thickness T31 of the inner edge portion 31E that is, the distance between the bonding surface 31A and the non-bonding surface 31B is sufficiently thicker than the thickness T32 of the mask plate 321.
- the frame part 31 has higher rigidity than the mask plate 321.
- the frame part 31 has high rigidity with respect to the inner edge part 31 ⁇ / b> E depending on its own weight or the inner edge part 31 ⁇ / b> E being displaced toward the mask part 32.
- the joint surface 31A of the inner edge portion 31E includes a joint portion 32BN joined to the second surface 321B.
- the joint portion 32BN is located continuously or intermittently over substantially the entire circumference of the inner edge portion 31E.
- the joining portion 32BN may be a welding mark formed by welding the joining surface 31A and the second surface 321B, or may be a joining layer that joins the joining surface 31A to the second surface 321B.
- the frame portion 31 joins the joining surface 31A of the inner edge portion 31E with the second surface 321B of the mask plate 321 and the mask plate 321 faces the outside of the mask plate 321, that is, both ends of the mask plate 321 are mutually connected.
- a stress F is applied to the mask plate 321 so as to be pulled away from the mask plate 321.
- the frame portion 31 is also applied by the main frame 21 with a stress that is pulled toward the outside of the frame portion 31 to the same extent as the stress F on the mask plate 321. Therefore, in the vapor deposition mask 30 removed from the main frame 21, the stress due to the joining between the main frame 21 and the frame portion 31 is released, and the stress F applied to the mask plate 321 is also relaxed.
- the position of the joint portion 32BN on the joint surface 31A is preferably a position where the stress F isotropically acts on the mask plate 321 and is appropriately selected based on the shape of the mask plate 321 and the shape of the frame hole 31H. Is done.
- the joint surface 31A is a plane on which the joint portion 32BN is located, and extends from the outer edge portion 32E of the second surface 321B toward the outside of the mask plate 321.
- the inner edge portion 31E has a surface structure in which the second surface 321B is pseudo-expanded to the outside of the second surface 321B, and extends from the outer edge portion 32E of the second surface 321B toward the outside of the mask plate 321. . Therefore, a space V corresponding to the thickness of the mask plate 321 is likely to be formed around the mask plate 321 in a range where the bonding surface 31A is widened. As a result, it is possible to suppress the vapor deposition target S from physically interfering with the frame portion 31 around the mask plate 321.
- FIG. 6 shows an example of the relationship between the number of holes 32H provided in the vapor deposition mask 30 and the number of holes 32H provided in the mask part 32.
- the frame portion 31 has three frame holes 31H.
- the three frame holes 31H are a first frame hole 31HA, a second frame hole 31HB, and a third frame hole 31HC.
- the vapor deposition mask 30 includes one mask portion 32 for each frame hole 31H.
- the three mask portions 32 are a first mask portion 32A, a second mask portion 32B, and a third mask portion 32C.
- the inner edge portion 31E that partitions the first frame hole 31HA is joined to the first mask portion 32A.
- the inner edge portion 31E that partitions the second frame hole 31HB is joined to the second mask portion 32B.
- the inner edge portion 31E that defines the third frame hole 31HC is joined to the third mask portion 32C.
- the vapor deposition mask 30 is repeatedly used for a plurality of vapor deposition targets. Therefore, each hole 32H provided in the vapor deposition mask 30 is required to have higher accuracy in the position of the hole 32H, the structure of the hole 32H, and the like. When the desired accuracy cannot be obtained in the position of the hole 32H, the structure of the hole 32H, etc., the mask portion 32 is appropriately replaced regardless of whether the vapor deposition mask 30 is manufactured or the vapor deposition mask 30 is repaired. Is desired.
- the configuration is such that the number of holes 32H required for one frame portion 31 is shared by the three mask portions 32 as in the configuration shown in FIG. Even if it is desired, only one mask portion 32 of the three mask portions 32 needs to be replaced. That is, out of the three mask portions 32, the two mask portions 32 can be used continuously. Therefore, if the configuration is such that separate mask portions 32 are joined to the portions corresponding to the respective frame holes 31H, whether the deposition mask 30 is manufactured or the deposition mask 30 is repaired, the consumption of various materials required for these can be reduced. It is possible to suppress. The thinner the mask plate 321 is and the smaller the size of the hole 32H is, the lower the yield of the mask part 32 is, and the greater the demand for replacement of the mask part 32 is. Therefore, the above-described configuration including the separate mask portions 32 in the portions corresponding to the respective frame holes 31H is particularly suitable for the vapor deposition mask 30 that requires high resolution.
- the inspection regarding the position of the hole 32H and the structure of the hole 32H is performed in a state where the stress F is applied, that is, in a state where the mask portion 32 is bonded to the frame portion 31.
- the joint portion 32BN described above exist intermittently, for example, in a part of the inner edge portion 31E so that the mask portion 32 can be replaced.
- the manufacturing method of the base material 10 for vapor deposition masks includes forming a plating foil by electroplating and obtaining a metal foil by annealing the plating foil.
- the manufacturing method of the base material 10 for vapor deposition masks in this embodiment is demonstrated in detail.
- FIG. 7 schematically shows a process of forming a plating foil by electroplating.
- a cathode 43 and an anode 44 are arranged in an electrolytic cell 41 filled with an electrolytic bath 42. Then, a potential difference is generated between the cathode 43 and the anode 44 by the power source 45 connected to the cathode 43 and the anode 44. Thereby, the plating foil 10M is formed on the surface of the cathode 43.
- the surface in contact with the cathode 43 corresponds to the electrode surface 10E of the deposition mask substrate 10, and the surface away from the cathode 43 corresponds to the deposition surface 10D of the deposition mask substrate 10. .
- the plating foil 10M formed on the cathode 43 is released from the cathode 43.
- an electrolytic drum electrode having a mirror surface as a surface may be immersed in an electrolytic bath, and another electrode that receives the electrolytic drum electrode below and faces the surface of the electrolytic drum electrode may be used. . Then, a current is passed between the electrolytic drum electrode and the other electrode, and the plating foil 10M is deposited on the electrode surface which is the surface of the electrolytic drum electrode. At the timing when the electrolytic drum electrode rotates and the plating foil 10M reaches a desired thickness, the plating foil 10M is peeled off from the surface of the electrolytic drum electrode and wound.
- the electrolytic bath used for electroplating contains an iron ion supplier, a nickel ion supplier, and a pH buffer.
- the electrolytic bath used for electroplating may contain a stress relaxation agent, an Fe 3+ ion mask agent, a complexing agent, and the like.
- the electrolytic bath is a weakly acidic solution adjusted to a pH suitable for electroplating.
- the iron ion supply agent include ferrous sulfate heptahydrate, ferrous chloride, and iron sulfamate.
- the nickel ion supplier include nickel (II) sulfate, nickel (II) chloride, nickel sulfamate, and nickel bromide.
- Examples of the pH buffer include boric acid and malonic acid.
- Malonic acid also functions as an Fe 3+ ion masking agent.
- the stress relaxation agent include saccharin sodium.
- the complexing agent is, for example, malic acid or citric acid.
- the electrolytic bath used for electroplating is, for example, an aqueous solution containing the above-described additives, and the pH is adjusted to, for example, 2 or more and 3 or less with a pH adjuster such as 5% sulfuric acid or nickel carbonate. Adjusted.
- the temperature of the electrolytic bath, the current density, and the plating time are appropriately adjusted according to the thickness of the plating foil 10M and the composition ratio of the plating foil 10M.
- the anode applied to the electrolytic bath is, for example, a pure iron electrode, a nickel electrode, or the like.
- the cathode applied to the electrolytic bath is, for example, a stainless plate such as SUS304.
- the temperature of the electrolytic bath is, for example, 40 ° C. or more and 60 ° C. or less.
- the current density is, for example, 1 A / dm 2 or more and 4 A / dm 2 or less.
- the current density on the electrode surface is set so that the following [Condition 1] is satisfied.
- the current density on the electrode surface is set so that the following [Condition 2] is satisfied together with [Condition 1].
- FIG. 8 schematically shows a step of annealing the plating foil 10M.
- an annealing process is performed on the plating foil 10M.
- the plating foil 10 ⁇ / b> M is placed on the placement unit 52 in the annealing furnace 51.
- the plating foil 10M is heated by the heating unit 53.
- the annealing treatment the plating foil 10M is heated to a temperature of 350 ° C. or higher, and preferably heated to a temperature of 600 ° C. or higher.
- the heating time is, for example, 1 hour. At this time, since the above-described condition 1 is satisfied in the plating foil 10M, in the deposition mask base material 10 obtained through the annealing process, it is possible to suppress the four corners from being raised from the central portion.
- FIGS. 9 to 17 a method of manufacturing the vapor deposition mask 30 will be described.
- a process for manufacturing the mask part 32 shown in FIG. 4 will be described as a method for manufacturing the vapor deposition mask 30.
- the process for manufacturing the mask part 32 described above with reference to FIG. 3 is performed through the small hole 32SH in the process for manufacturing the mask part 32 described above with reference to FIG. Since it is the same as the process which omitted the process for forming large hole 32LH as a hole, the description is abbreviate
- the manufacturing method of the vapor deposition mask 30 includes forming a plating foil by electroplating, annealing the plating foil to obtain a metal foil, and forming a plurality of through holes in the metal foil.
- a plating foil by electroplating, annealing the plating foil to obtain a metal foil, and forming a plurality of through holes in the metal foil.
- the vapor deposition mask substrate 10 including the first surface 10A and the second surface 10B is attached to the first surface 10A.
- a first dry film resist (DRY FilmDFResist: DFR) 61 and a second dry film resist (DFR) 62 to be attached to the second surface 10B are prepared.
- DFRs 61 and 62 are formed separately from the vapor deposition mask substrate 10.
- the first DFR 61 is affixed to the first surface 10A
- the second DFR 62 is affixed to the second surface 10B.
- portions of the DFR 61, 62 other than the portion where the hole is formed are exposed, and the exposed DFRs 61, 62 are developed.
- the first through hole 61 a is formed in the first DFR 61
- the second through hole 62 a is formed in the second DFR 62.
- a sodium carbonate aqueous solution is used as the developer.
- the first surface 10A of the evaporation mask substrate 10 is etched using a ferric chloride solution using the developed first DFR 61 as a mask.
- the second protective layer 63 that protects the second surface 10B is formed so that the second surface 10B is not etched simultaneously with the first surface 10A.
- the material of the second protective layer 63 has chemical resistance to ferric chloride solution.
- a small hole 32SH that is recessed toward the second surface 10B is formed in the first surface 10A.
- the small hole 32SH has a first opening H1 opening in the first surface 10A.
- the etching solution for etching the deposition mask substrate 10 is not limited to a ferric chloride solution, and may be an acidic etching solution that can etch an iron-nickel alloy.
- Acidic etchants are, for example, perchloric acid, hydrochloric acid, sulfuric acid, formic acid, and ferric perchlorate solution and a mixture of ferric perchlorate solution and ferric chloride solution.
- the method for etching the deposition mask substrate 10 may be a dip method in which the deposition mask substrate 10 is immersed in an acidic etching solution, or a spray method in which an acidic etching solution is sprayed onto the deposition mask substrate 10. It may be.
- the first DFR 61 formed on the first surface 10A and the second protective layer 63 in contact with the second DFR 62 are removed. Further, a first protective layer 64 for preventing further etching of the first surface 10A is formed on the first surface 10A.
- the material of the first protective layer 64 has chemical resistance to ferric chloride liquid.
- the second surface 10B is etched using a ferric chloride solution using the developed second DFR 62 as a mask.
- a large hole 32LH that is recessed toward the first surface 10A is formed in the second surface 10B.
- the large hole 32LH has a second opening H2 that opens to the second surface 10B.
- the second opening H2 is larger than the first opening H1.
- the etching solution used at this time is also an acidic etching solution and may be any etching solution that can etch the iron-nickel alloy.
- the method for etching the deposition mask substrate 10 may also be a dip type in which the deposition mask substrate 10 is immersed in an acidic etching solution, or a spray that sprays an acidic etching solution on the deposition mask substrate 10. It may be a formula.
- metal oxides such as aluminum oxide and magnesium oxide
- a deoxidizer such as granular aluminum or magnesium is usually mixed with the raw material in order to prevent oxygen from being mixed into the base material.
- Aluminum and magnesium remain in the base material as metal oxides such as aluminum oxide and magnesium oxide.
- the metal oxide can be prevented from being mixed into the mask portion 32.
- the mask part 32 thus formed is bonded to the frame part 31 by any one of the three methods described below with reference to FIGS. 15 to 17, for example. Thereby, the vapor deposition mask 30 mentioned above is obtained.
- a support body is affixed on the 1st surface 321A in the mask part 32 before the joining process demonstrated with reference to FIGS. 15-17. The support can suppress the deflection of the mask portion 32 in the bonding step. Thereby, the mask part 32 can be stably joined to the frame part 31.
- the deflection in the mask portion 32 is small, it is not necessary to attach a support to the mask portion 32. Furthermore, when the mask portion 32 has the structure described above with reference to FIG. 3, a support is attached to the deposition mask substrate 10 before the deposition mask substrate 10 is etched. Is also possible.
- resistance welding is used as a method of joining the outer edge portion 32E of the second surface 321B to the inner edge portion 31E of the frame portion 31.
- a plurality of holes SPH are formed in the insulating support SP.
- Each hole SPH is formed in a part of the support SP that faces the part that becomes the joint 32BN described above with reference to FIG. And it supplies with electricity through each hole SPH, and forms intermittent junction part 32BN.
- the outer edge portion 32E is welded to the inner edge portion 31E.
- the vapor deposition mask 30 can be obtained by peeling the support SP from the mask portion 32.
- laser welding is used as a method of joining the outer edge portion 32E of the second surface 321B to the inner edge portion 31E of the frame portion 31.
- the support SP having light transmittance is used, and the laser beam L is irradiated to the portion to be the joint portion 32BN through the support SP.
- intermittent junction part 32BN is formed by irradiating the laser beam L intermittently around the outer edge part 32E.
- the continuous junction part 32BN is formed over the perimeter of the outer edge part 32E by continuing irradiating the laser beam L around the outer edge part 32E continuously.
- the outer edge portion 32E is welded to the inner edge portion 31E.
- the vapor deposition mask 30 can be obtained by peeling the support SP from the mask portion 32.
- ultrasonic welding is used as a method of joining the outer edge portion 32E of the second surface 321B to the inner edge portion 31E of the frame portion 31.
- the outer edge portion 32E and the inner edge portion 31E are sandwiched by a clamp CP or the like, and an ultrasonic wave is applied to a portion that becomes the joint portion 32BN.
- the member to which the ultrasonic wave is directly applied may be the frame part 31 or the mask part 32.
- a crimp mark by the clamp CP is formed on the frame portion 31 and the support SP.
- the vapor deposition mask 30 can be obtained by peeling the support SP from the mask portion 32.
- the second surface 321 ⁇ / b> B of the mask portion 32 is joined to the frame portion 31, but the first surface 321 ⁇ / b> A of the mask portion 32 is joined to the frame portion 31. May be.
- the mask device 20 on which the vapor deposition mask 30 is mounted is attached in the vacuum chamber of the vapor deposition device.
- the mask device 20 is attached so that a deposition target such as a glass substrate faces the first surface 321A and a deposition source faces the second surface 321B.
- a vapor deposition object is carried in the vacuum chamber of a vapor deposition apparatus, and a vapor deposition substance is sublimated with a vapor deposition source.
- the pattern which has the shape which followed 1st opening H1 is formed in the vapor deposition object facing 1st opening H1.
- the vapor deposition substance is, for example, an organic light-emitting material constituting a pixel of the display device, a material for forming a pixel electrode constituting a pixel circuit of the display device, or the like.
- Example The embodiment will be described with reference to FIGS.
- An electrolytic bath that was an aqueous solution and adjusted to pH 2.3 was used.
- Examples 1 to 8 and Comparative Examples 1 to 7 are used.
- a plating foil was obtained. Thereby, a plating foil having a length of 150 mm and a width of 150 mm was obtained.
- a first metal piece having a square shape with a length of 50 mm and a width of 50 mm was cut out from the plating foil formed by electroplating. At this time, each side in the first metal piece is parallel to the side facing the side in the plating foil, and the center in the plating foil and the center of the first metal piece substantially coincide with each other. A first metal piece was cut out from the plating foil. Then, the heating temperature was set to 600 ° C., the heating time was set to 1 hour, and the first metal piece was heated in vacuum. Thereby, the 1st metal piece in each Example and each comparative example was obtained. As will be described later, the first metal piece was an object to be measured for the curl amount.
- a second metal piece having a square shape with a length of 10 mm and a width of 10 mm was cut out from the vicinity of the region where the first metal piece was cut out from each plating foil described above.
- the second metal piece was used as a measurement target for the thickness, the composition ratio of the electrode surface, and the composition ratio of the deposition surface.
- the thickness, the composition ratio of the electrode surface, and the composition ratio of the deposition surface were measured for the second metal piece of each example and each comparative example.
- the thickness was measured using a scanning electron microscope (SEM) (JSM-7001F, manufactured by JEOL Ltd.).
- SEM scanning electron microscope
- EDX energy dispersive X-ray analyzer
- ICAETPentaPET ⁇ 3, manufactured by Oxford Instruments attached to the SEM was used.
- the cross section of each second metal piece was observed at a magnification of 5000 times.
- the acceleration voltage of SEM was set to 20 kV, and a secondary electron image was obtained.
- the EDX measurement time was set to 60 seconds.
- the cross section was exposed using a cross section polisher. Then, the composition ratio at the inner surface by 0.5 ⁇ m from the electrode surface (10E) is set to the composition ratio at the electrode surface, and the composition ratio at the inner surface by 0.5 ⁇ m from the deposition surface (10D) is set as the deposition surface.
- the composition ratio was set as follows. For each surface, the composition ratios at three different points were measured, and the average value of the three points was taken as the composition ratio at each surface.
- the absolute value of the difference between the Ni mass ratio (second nickel mass ratio) (mass%) on the deposition surface and the Ni mass ratio (first nickel mass ratio) (mass%) on the electrode surface is the mass difference (MD). Calculated as (mass%).
- the standard value (MD / T) (mass% / micrometer) was obtained by dividing a mass difference (MD) (mass%) by the thickness (T) (micrometer) of the base material for vapor deposition masks.
- the first metal piece M1 of each example and each comparative example is warped in the direction in which the four corners of the first metal piece M1 are separated from the flat surface FL, that is, is lifted from the flat surface FL. And placed on the flat surface FL. Then, at each of the four corners of the first metal piece M1, the height H (mm) which is the difference between the flat surface and the four corners was measured, and the average value of the four heights H was calculated as the curl amount (mm). .
- the linear expansion coefficient of each of the first metal pieces of each example and each comparative example was measured using a TMA (Thermomechanical Analysis) method.
- TMA Thermomechanical Analysis
- a thermomechanical analyzer TMA-50, manufactured by Shimadzu Corporation
- the average value of the linear expansion coefficient in the range of 25 degreeC or more and 100 degrees C or less was measured.
- mass difference (MD) is 0.6 mass% or less, and a standard value (MD / T) is 0.05 (mass% / micrometer) or less. It was confirmed that And in the 1st metal piece of each Example, it was recognized that the curl amount is 0.6 mm or less.
- mass difference (MD) is 0.7 mass% or more, and a standard value (MD / T) is 0.07 (mass% / micrometer) or more. It was recognized that And in the 1st metal piece of each comparative example, it was recognized that the amount of curls is 2.3 mm or more.
- FIG. 19 is a photograph taken of the first metal piece of Example 5
- FIG. 20 is a photograph taken of the first metal piece of Example 6.
- FIG. 19 and FIG. 20 show, it was recognized that the first metal piece was almost flat when the curl amount was about 0.3 mm. That is, it has been recognized that the first metal piece has a shape substantially along the flat surface FL.
- FIG. 21 is a photograph of the first metal piece of Comparative Example 5
- FIG. 22 is a photograph of the first metal piece of Comparative Example 3.
- FIG. 21 when the curl amount exceeds 5 mm, it was recognized that the lifting at the four corners of the first metal piece was significant.
- FIG. 22 when the curl amount exceeds 15 mm, it was recognized that the lifting at the four corners of the first metal piece is more remarkable.
- the metal foil before annealing was almost flat.
- the relationship between the standard value (MD / T) and the curl amount is as shown in FIG.
- the standard value (MD / T) (mass% / ⁇ m) which is a value obtained by dividing the mass difference (MD) (mass%) by the thickness (T) of the second metal piece, is 0.05.
- (mass% / ⁇ m) was exceeded, it was recognized that the curl amount in the first metal piece was significantly increased as compared to 0.05 (mass% / ⁇ m) or less.
- the relationship between the mass difference (MD) and the curl amount was as shown in FIG. As shown in FIG. 24, when the mass difference (MD) (mass%) exceeds 0.6 (mass%), the amount of curl in the first metal piece is smaller than when 0.6 (mass%) or less. was found to be significantly larger.
- the following effects can be obtained. Can do.
- the depth of the holes of the vapor deposition mask 30 can be reduced to 15 ⁇ m or less, and the volume of the holes of the vapor deposition mask 30 can be reduced. Thereby, the quantity which the vapor deposition material which passes the hole of the vapor deposition mask 30 adheres to the vapor deposition mask 30 can be decreased.
- the embodiment described above can be implemented with appropriate modifications as follows.
- [thickness] -The thickness of the base material 10 for vapor deposition masks may be larger than 15 micrometers.
- the large hole 32LH opened in the first surface 10A of the deposition mask substrate 10 and the small hole 32SH opened in the second surface 10B may be formed. .
- SYMBOLS 10 Base material for vapor deposition masks, 10A, 321A ... 1st surface, 10B, 321B ... 2nd surface, 10D ... Deposition surface, 10E ... Electrode surface, 10M ... Plating foil, 20 ... Mask apparatus, 21 ... Main frame, 21H ... main frame hole, 30 ... vapor deposition mask, 31 ... frame part, 31A ... bonding surface, 31B ... non-bonding surface, 31E ... inner edge, 31H ... frame hole, 31HA ... first frame hole, 31HB ... second frame hole, 31HC ... third frame hole, 32 ... mask part, 32A ... second mask part, 32B ... second mask part, 32C ...
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Abstract
Description
図1を参照して、蒸着マスク用基材の構成を説明する。
図1が示すように、蒸着マスク用基材10は、電気めっきを用いて形成された金属箔である。金属箔は、鉄ニッケル系合金製である。蒸着マスク用基材10は、第1面10Aと、第1面10Aとは反対側の面である第2面10Bとを含んでいる。蒸着マスク用基材10において、第1面10Aにおけるニッケル(Ni)の質量比(質量%)と、第2面10BにおけるNiの質量比(質量%)との差の絶対値が、質量差(質量%)(MD)である。質量差を蒸着マスク用基材の厚さ(μm)(T)で除算した値が規格値(MD/T)である。蒸着マスク用基材10において、規格値が、0.05(質量%/μm)以下である。
図2から図6を参照して、蒸着マスクを含むマスク装置の構成を説明する。
図2は、蒸着マスク用基材10を用いて製造される蒸着マスクを備えるマスク装置の概略的な平面構造を示している。図3は、蒸着マスクが備えるマスク部の断面構造の一例を示している。図4は、蒸着マスクが備えるマスク部の断面構造の他の例を示している。なお、図2におけるマスク装置が備える蒸着マスクの個数や、蒸着マスク30が備えるマスク部の個数は、蒸着マスクの個数やマスク部の個数の一例である。
図6(a)の例が示すように、フレーム部31は、3つのフレーム孔31Hを有する。3つのフレーム孔31Hは、第1フレーム孔31HA、第2フレーム孔31HB、および、第3フレーム孔31HCである。図6(b)の例が示すように、蒸着マスク30は、各フレーム孔31Hに対して、マスク部32を1つずつ備える。3つのマスク部32は、第1マスク部32A、第2マスク部32B、および、第3マスク部32Cである。第1フレーム孔31HAを区画する内縁部31Eは、第1マスク部32Aと接合する。第2フレーム孔31HBを区画する内縁部31Eは、第2マスク部32Bと接合する。第3フレーム孔31HCを区画する内縁部31Eは、第3マスク部32Cと接合する。
図7および図8を参照して、蒸着マスク用基材10の製造方法を説明する。蒸着マスク用基材10の製造方法は、電気めっきによってめっき箔を形成することと、めっき箔をアニールして金属箔を得ることと、を含む。以下、本実施形態における蒸着マスク用基材10の製造方法をより詳しく説明する。
図7が示すように、電気めっきによってめっき箔を形成するときには、電解浴42によって満たされた電解槽41内に、陰極43と陽極44とを配置する。そして、陰極43と陽極44とに接続された電源45によって、陰極43と陽極44との間に電位差を生じさせる。これにより、陰極43の表面にめっき箔10Mが形成される。すなわち、めっき箔10Mにおいて、陰極43に接している面が、蒸着マスク用基材10の電極面10Eに対応し、陰極43から離れた面が蒸着マスク用基材10の析出面10Dに対応する。陰極43に形成されためっき箔10Mを陰極43から離型する。
[条件2]ニッケル質量比が、35.8質量%以上42.5質量%以下である。
図8が示すように、めっき箔10Mに対してアニール処理が行われる。アニール処理では、めっき箔10Mが、アニール炉51内の載置部52に載置される。めっき箔10Mは、加熱部53によって加熱される。アニール処理では、めっき箔10Mが350℃以上の温度に加熱され、好ましくは600℃以上の温度に加熱される。加熱時間は、例えば、1時間である。このとき、めっき箔10Mにおいて上述した条件1が満たされているため、アニール工程を経て得られた蒸着マスク用基材10において、四隅が中央部よりも浮き上がることが抑えられる。
図9から図17を参照して、蒸着マスク30の製造方法を説明する。本実施形態では、蒸着マスク30の製造方法として、図4に示したマスク部32を製造するための工程を説明する。なお、図3を参照して先に説明したマスク部32を製造するための工程は、図4を参照して先に説明したマスク部32を製造するための工程にて、小孔32SHを貫通孔として、大孔32LHを形成するための工程を割愛した工程と同様であるため、その説明を省略する。
上述した蒸着マスク30を用いて表示装置を製造する方法では、まず、蒸着マスク30を搭載したマスク装置20を蒸着装置の真空槽内に取り付ける。この際、ガラス基板などの蒸着対象が第1面321Aと対向するように、かつ、蒸着源が第2面321Bと対向するように、マスク装置20を取り付ける。そして、蒸着装置の真空槽に蒸着対象を搬入し、蒸着源によって蒸着物質を昇華させる。これにより、第1開口H1に追従した形状を有するパターンが、第1開口H1と対向する蒸着対象に形成される。なお、蒸着物質は、例えば、表示装置の画素を構成する有機発光材料や、表示装置の画素回路を構成する画素電極を形成するための材料などである。
図18から図24を参照して実施例を説明する。
実施例1から実施例8、および、比較例1から比較例7の各々における蒸着マスク用基材を得るために、電気めっきによってめっき箔を形成するときには、以下に記載する添加物が添加された水溶液であって、pH2.3に調整された電解浴を用いた。また、電気めっきにおいて、電流密度を1(A/dm2)以上4(A/dm2)以下の範囲で変更することによって、実施例1から実施例8、および、比較例1から比較例7のめっき箔が得られた。これにより、長さが150mmであり、幅が150mmであるめっき箔を得た。
・硫酸第一鉄・7水和物 :83.4g/L
・硫酸ニッケル(II)・6水和物:250.0g/L
・塩化ニッケル(II)・6水和物:40.0g/L
・ホウ酸 :30.0g/L
・サッカリンナトリウム2水和物 :2.0g/L
・マロン酸 :5.2g/L
・温度 :50℃
各実施例および比較例において、厚さ(T)、析出面におけるNiの質量比(第2ニッケル質量比)、電極面におけるNiの質量比(第1ニッケル質量比)、質量差(MD)、規格値(MD/T)、カール量、および、線膨張係数は、以下の表1に示す通りであった。
図23が示すように、質量差(MD)(質量%)を第2金属片の厚さ(T)で除算した値である規格値(MD/T)(質量%/μm)が0.05(質量%/μm)を超えると、0.05(質量%/μm)以下である場合と比べて、第1金属片におけるカール量が顕著に大きくなることが認められた。
図24が示すように、質量差(MD)(質量%)が0.6(質量%)を超えると、0.6(質量%)以下である場合と比べて、第1金属片におけるカール量が顕著に大きくなることが認められた。
[厚さ]
・蒸着マスク用基材10の厚さは、15μmよりも大きくてもよい。
・蒸着マスク用基材10のエッチングでは、蒸着マスク用基材10の第1面10Aに開口した大孔32LHを形成し、かつ、第2面10Bに開口した小孔32SHを形成してもよい。
Claims (7)
- 電気めっきを用いて形成された金属箔である蒸着マスク用基材であって、
前記金属箔は、鉄ニッケル系合金製であり、
第1面と、
前記第1面とは反対側の面である第2面と、を含み、
前記第1面は、前記第1面における鉄の質量とニッケルの質量との合計に対するニッケルの質量の百分率である第1ニッケル質量比(質量%)を有し、
前記第2面は、前記第2面における鉄の質量とニッケルの質量との合計に対するニッケルの質量の百分率である第2ニッケル質量比(質量%)を有し、
前記第1ニッケル質量比(質量%)と、前記第2ニッケル質量比(質量%)との差の絶対値が、質量差(質量%)であり、
前記質量差を前記蒸着マスク用基材の厚さ(μm)で除算した値が規格値であり、
前記規格値が、0.05(質量%/μm)以下である
蒸着マスク用基材。 - 電気めっきを用いて形成された金属箔である蒸着マスク用基材であって、
前記金属箔は、鉄ニッケル系合金製であり、
第1面と、
前記第1面とは反対側の面である第2面と、を含み、
前記第1面は、前記第1面における鉄の質量とニッケルの質量との合計に対するニッケルの質量の百分率である第1ニッケル質量比(質量%)を有し、
前記第2面は、前記第2面における鉄の質量とニッケルの質量との合計に対するニッケルの質量の百分率である第2ニッケル質量比(質量%)を有し、
前記第1ニッケル質量比(質量%)と、前記第2ニッケル質量比(質量%)との差の絶対値が、質量差(質量%)であり、
前記質量差が、0.6(質量%)以下である
蒸着マスク用基材。 - 前記蒸着マスク用基材の厚さが、15μm以下である
請求項1または2に記載の蒸着マスク用基材。 - 前記第1ニッケル質量比および前記第2ニッケル質量比は各々、35.8質量%以上42.5質量%以下である
請求項1から3のいずれか一項に記載の蒸着マスク用基材。 - 電気めっきを用いて形成された金属箔である蒸着マスク用基材を製造する方法であって、
前記電気めっきによってめっき箔を形成することと、
前記めっき箔をアニールして前記金属箔を得ることと、を含み、
前記金属箔は、鉄ニッケル系合金製であり、
第1面と、
前記第1面とは反対側の面である第2面と、を含み、
前記第1面は、前記第1面における鉄の質量とニッケルの質量との合計に対するニッケルの質量の百分率である第1ニッケル質量比(質量%)を有し、
前記第2面は、前記第2面における鉄の質量とニッケルの質量との合計に対するニッケルの質量の百分率である第2ニッケル質量比(質量%)を有し、
前記第1ニッケル質量比(質量%)と、前記第2ニッケル質量比(質量%)との差の絶対値が、質量差(質量%)であり、
前記質量差を前記蒸着マスク用基材の厚さ(μm)で除算した値が規格値であり、
前記規格値が、0.05(質量%/μm)以下である
蒸着マスク用基材の製造方法。 - 電気めっきを用いて形成された金属箔である蒸着マスク用基材に複数の貫通孔を形成することによって蒸着マスクを製造する方法であって、
前記電気めっきによってめっき箔を形成することと、
前記めっき箔をアニールして前記金属箔を得ることと、
前記金属箔に複数の貫通孔を形成することと、を含み、
前記金属箔は、
第1面と、
前記第1面とは反対側の面である第2面と、を含み、
前記第1面は、前記第1面における鉄の質量とニッケルの質量との合計に対するニッケルの質量の百分率である第1ニッケル質量比(質量%)を有し、
前記第2面は、前記第2面における鉄の質量とニッケルの質量との合計に対するニッケルの質量の百分率である第2ニッケル質量比(質量%)を有し、
前記第1ニッケル質量比(質量%)と、前記第2ニッケル質量比(質量%)との差の絶対値が、質量差(質量%)であり、
前記質量差を前記蒸着マスク用基材の厚さ(μm)で除算した値が規格値であり、
前記規格値が、0.05(質量%/μm)以下である
蒸着マスクの製造方法。 - 請求項6の記載の蒸着マスクの製造方法による蒸着マスクを準備することと、
前記蒸着マスクを用いた蒸着によってパターンを形成することと、を含む
表示装置の製造方法。
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