WO2018181340A1 - Composition de résine photosensible positive, film sec, article durci, carte de circuit imprimé, et élément semi-conducteur - Google Patents
Composition de résine photosensible positive, film sec, article durci, carte de circuit imprimé, et élément semi-conducteur Download PDFInfo
- Publication number
- WO2018181340A1 WO2018181340A1 PCT/JP2018/012474 JP2018012474W WO2018181340A1 WO 2018181340 A1 WO2018181340 A1 WO 2018181340A1 JP 2018012474 W JP2018012474 W JP 2018012474W WO 2018181340 A1 WO2018181340 A1 WO 2018181340A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- photosensitive resin
- resin composition
- film
- cured product
- positive photosensitive
- Prior art date
Links
- BGTZYQSCNQIZER-UHFFFAOYSA-N CC(C)(c1cc(C)c(C)cc1)c1cc(C)c(C)cc1 Chemical compound CC(C)(c1cc(C)c(C)cc1)c1cc(C)c(C)cc1 BGTZYQSCNQIZER-UHFFFAOYSA-N 0.000 description 1
- FVPJAJZZABGRSW-KYESCBHCSA-N CC/C=C(/C(CC(F)(F)F)c1ccc(C)c(C)c1)\C=C(\C)/CC Chemical compound CC/C=C(/C(CC(F)(F)F)c1ccc(C)c(C)c1)\C=C(\C)/CC FVPJAJZZABGRSW-KYESCBHCSA-N 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/22—Polybenzoxazoles
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/023—Macromolecular quinonediazides; Macromolecular additives, e.g. binders
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/032—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
- G03F7/037—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders the binders being polyamides or polyimides
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/14—Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/28—Applying non-metallic protective coatings
Definitions
- the present invention relates to a positive photosensitive resin composition, a dry film, a cured product, a printed wiring board, and a semiconductor element.
- the printed wiring board of the present invention is characterized by having the cured product.
- the positive photosensitive resin composition of the present invention contains (A) a polybenzoxazole precursor.
- A) The method of synthesizing the polybenzoxazole precursor is not particularly limited, and may be synthesized by a known method. For example, it can be obtained by reacting a dihydroxydiamine as an amine component with a dihalide of a dicarboxylic acid such as dicarboxylic acid dichloride as an acid component.
- A is a single bond, —CH 2 —, —O—, —CO—, —S—, —SO 2 —, —NHCO—, —C (CF 3 ) 2 —, —C (CH 3 )) 2 represents a divalent group selected from the group consisting of-.
- the number average molecular weight (Mn) of the polybenzoxazole precursor is preferably 5,000 to 100,000, and more preferably 8,000 to 50,000.
- the number average molecular weight is a numerical value measured by GPC and converted by standard polystyrene.
- the weight average molecular weight (Mw) of the (A) polybenzoxazole precursor is preferably 10,000 to 200,000, more preferably 16,000 to 100,000.
- the weight average molecular weight is a numerical value measured by GPC and converted to standard polystyrene.
- Mw / Mn is preferably from 1 to 5, and more preferably from 1 to 3.
- One photoacid generator may be used alone, or two or more photoacid generators may be used in combination.
- the blending amount of the (B) photoacid generator is preferably 3 to 20% by mass based on the total amount of the solid content of the composition.
- Examples include N, N′-dimethylformamide, N-methylpyrrolidone, N-ethyl-2-pyrrolidone, N, N′-dimethylacetamide, diethylene glycol dimethyl ether, cyclopentanone, ⁇ -butyrolactone, ⁇ -acetyl- ⁇ - Examples include butyrolactone, tetramethylurea, 1,3-dimethyl-2-imidazolinone, N-cyclohexyl-2-pyrrolidone, dimethyl sulfoxide, hexamethylphosphoramide, pyridine, ⁇ -butyrolactone, and diethylene glycol monomethyl ether.
- the coating film is exposed through a photomask having a pattern or directly.
- the exposure light beam having a wavelength capable of activating the photoacid generator (B) and generating an acid is used.
- the exposure light beam preferably has a maximum wavelength in the range of 350 to 450 nm.
- the photosensitivity can be adjusted by appropriately using a sensitizer.
- a contact aligner, mirror projection, stepper, laser direct exposure apparatus, or the like can be used as the exposure apparatus.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Health & Medical Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Materials For Photolithography (AREA)
- Non-Metallic Protective Coatings For Printed Circuits (AREA)
Abstract
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201880010952.8A CN110268327B (zh) | 2017-03-31 | 2018-03-27 | 正型感光性树脂组合物、干膜、固化物、印刷电路板及半导体元件 |
JP2019509900A JP7134165B2 (ja) | 2017-03-31 | 2018-03-27 | ポジ型感光性樹脂組成物、ドライフィルム、硬化物、プリント配線板および半導体素子 |
KR1020197031854A KR102522475B1 (ko) | 2017-03-31 | 2018-03-27 | 포지티브형 감광성 수지 조성물, 드라이 필름, 경화물, 프린트 배선판 및 반도체 소자 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017-071754 | 2017-03-31 | ||
JP2017071754 | 2017-03-31 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2018181340A1 true WO2018181340A1 (fr) | 2018-10-04 |
Family
ID=63675944
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2018/012474 WO2018181340A1 (fr) | 2017-03-31 | 2018-03-27 | Composition de résine photosensible positive, film sec, article durci, carte de circuit imprimé, et élément semi-conducteur |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP7134165B2 (fr) |
KR (1) | KR102522475B1 (fr) |
CN (1) | CN110268327B (fr) |
TW (1) | TWI763815B (fr) |
WO (1) | WO2018181340A1 (fr) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2015170524A1 (fr) * | 2014-05-09 | 2015-11-12 | 住友ベークライト株式会社 | Composition de résine photosensible, film durci, film protecteur, film isolant et dispositif électronique |
JP2016145866A (ja) * | 2015-02-06 | 2016-08-12 | 株式会社Adeka | 感光性ソルダーレジスト組成物 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
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JP4492749B2 (ja) | 1998-10-30 | 2010-06-30 | 日立化成デュポンマイクロシステムズ株式会社 | 感光性重合体組成物、レリーフパターンの製造法及び電子部品 |
JP4815835B2 (ja) * | 2005-03-30 | 2011-11-16 | 大日本印刷株式会社 | 感光性組成物、及びそれを用いた光学素子とその製造方法 |
CN103091987B (zh) * | 2008-12-26 | 2016-11-23 | 日立化成株式会社 | 正型感光性树脂组合物、抗蚀图形的制造方法、半导体装置以及电子器件 |
JP5577688B2 (ja) * | 2009-12-17 | 2014-08-27 | 日立化成デュポンマイクロシステムズ株式会社 | ポジ型感光性樹脂組成物、それを用いた硬化膜及び電子部品 |
KR101910220B1 (ko) * | 2011-06-15 | 2018-10-19 | 히다치 가세이듀퐁 마이쿠로시스데무즈 가부시키가이샤 | 감광성 수지 조성물, 그 수지 조성물을 사용한 패턴 경화막의 제조 방법 및 전자 부품 |
KR101769190B1 (ko) * | 2011-12-09 | 2017-08-17 | 아사히 가세이 이-매터리얼즈 가부시키가이샤 | 감광성 수지 조성물, 경화 릴리프 패턴의 제조 방법, 반도체 장치 및 표시체 장치 |
-
2018
- 2018-03-27 KR KR1020197031854A patent/KR102522475B1/ko active IP Right Grant
- 2018-03-27 JP JP2019509900A patent/JP7134165B2/ja active Active
- 2018-03-27 CN CN201880010952.8A patent/CN110268327B/zh active Active
- 2018-03-27 WO PCT/JP2018/012474 patent/WO2018181340A1/fr active Application Filing
- 2018-03-30 TW TW107111179A patent/TWI763815B/zh active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2015170524A1 (fr) * | 2014-05-09 | 2015-11-12 | 住友ベークライト株式会社 | Composition de résine photosensible, film durci, film protecteur, film isolant et dispositif électronique |
JP2016145866A (ja) * | 2015-02-06 | 2016-08-12 | 株式会社Adeka | 感光性ソルダーレジスト組成物 |
Also Published As
Publication number | Publication date |
---|---|
TWI763815B (zh) | 2022-05-11 |
TW201841996A (zh) | 2018-12-01 |
KR102522475B1 (ko) | 2023-04-18 |
CN110268327A (zh) | 2019-09-20 |
KR20190133228A (ko) | 2019-12-02 |
JP7134165B2 (ja) | 2022-09-09 |
CN110268327B (zh) | 2023-04-28 |
JPWO2018181340A1 (ja) | 2020-02-06 |
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