WO2018043403A1 - Dispositif pour mesurer la qualité de grains - Google Patents

Dispositif pour mesurer la qualité de grains Download PDF

Info

Publication number
WO2018043403A1
WO2018043403A1 PCT/JP2017/030748 JP2017030748W WO2018043403A1 WO 2018043403 A1 WO2018043403 A1 WO 2018043403A1 JP 2017030748 W JP2017030748 W JP 2017030748W WO 2018043403 A1 WO2018043403 A1 WO 2018043403A1
Authority
WO
WIPO (PCT)
Prior art keywords
optical path
path length
grain
sample
grains
Prior art date
Application number
PCT/JP2017/030748
Other languages
English (en)
Japanese (ja)
Inventor
石津　裕之
由武 青島
義高 福元
章子 殿柿
Original Assignee
静岡製機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 静岡製機株式会社 filed Critical 静岡製機株式会社
Priority to KR1020187031859A priority Critical patent/KR102272720B1/ko
Priority to CN201780028441.4A priority patent/CN109154559A/zh
Publication of WO2018043403A1 publication Critical patent/WO2018043403A1/fr

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/359—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G01N2021/8592—Grain or other flowing solid samples

Definitions

  • the present invention relates to a grain quality measuring device for optically measuring, for example, grain taste and internal quality.
  • a quality analyzer such as a taste analyzer for analyzing the taste of a grain or an internal quality measuring device for measuring the internal quality of a grain
  • a sample of the grain put into a hopper provided at the top of the housing
  • the (sample) is accommodated (filled) in the sample measurement unit while being rotated by an impeller provided continuously to the hopper bottom.
  • the grain accommodated in the sample measuring unit is irradiated with light from the measuring means of the optical system to measure its quality.
  • the quality evaluation apparatus of the polished rice using a near-infrared analyzer is disclosed by patent document 1, for example.
  • the quality of the grain in the sample measuring unit connected to the lower part of the bottom surface of the impeller is measured by the measuring means of the optical system, but the amount of transmitted light depends on the type of grain.
  • a plurality of optical path length changing parts are prepared because they are different, and they are exchanged according to the grain so as to obtain a certain amount of light optimum for the grain.
  • the present invention has been made in view of such circumstances, and the purpose thereof is to automatically adjust the optical path length according to the type of grain and the like, thereby accurately and efficiently measuring the quality of various forms of grain.
  • An object of the present invention is to provide a grain quality measuring device that can be performed automatically.
  • the invention described in claim 1 of the present invention includes a hopper provided at an upper portion of the housing and into which the grain is charged, and the grain charged into the hopper by rotating the hopper.
  • An impeller to be transported a sample measuring unit disposed below the impeller and capable of accommodating a predetermined amount of grain, a measuring means for optically measuring the quality of the grain in the sample measuring unit, and the hopper
  • a control device capable of adjusting the optical path length of the transmitted light by the measuring means in accordance with the form of the grain to be processed.
  • the invention according to claim 2 is characterized in that the measuring means has a monochromator structure having a light source and a light receiving element, a first mirror and a second mirror, a diffraction grating, and an exit slit.
  • the invention according to claim 3 is characterized in that the optical path length is adjusted by electric position adjustment of the optical path length adjusting member.
  • a predetermined amount of the grain put into the hopper and rotated and conveyed by the impeller is stored and filled in the sample measuring unit, and this grain is optically measured by the measuring means.
  • the optical path length of the measuring means is adjusted to the length according to the form of the grain by the control device, so without changing the optical path length changing parts one by one corresponding to the form of the grain to be measured It can be automatically changed, and measurement errors of various forms of grains can be made uniform and the quality of the grains can be measured with high accuracy, and the measurement operation itself can be performed efficiently.
  • the measuring means has a light source and a light receiving element, first and second mirrors, a diffraction grating, and an exit slit. Due to the monochromator structure, the grain measurement accuracy can be greatly improved.
  • the optical path length can be changed electrically by controlling the position of the optical path length adjusting member with the control device, The efficiency of measurement work can be further increased.
  • the quality measuring apparatus 1 has a box-shaped housing 2, and a hopper 3 is disposed on the upper surface of the housing 2. It is arranged to be possible.
  • An impeller 4 is continuously provided below the bottom opening of the hopper 3, and the opening provided on the upper surface of the case 4a is in communication with the bottom opening of the hopper 3 via the shutter. .
  • a shutter sample is rotated downward by actuating the solenoid 5 in response to a control signal from a control device 15 (see FIG. 2), and a grain sample (referred to as a specimen) put into the hopper 3
  • the impeller 4 is supplied.
  • the impeller 4 has a plurality of blades 4c radially fixed to the rotation shaft 4b, and the blades 4c rotate in a vertical plane by the operation of the stepping motor 6 fixed to the rotation shaft 4b. It has become.
  • a discharge opening is formed in the bottom surface of the case 4 a of the impeller 4, and this opening communicates with the upper surface opening of the sample measuring unit 7 disposed at the lower part of the impeller 4.
  • the sample measuring unit 7 is formed in a bottomed cylindrical shape by, for example, a transparent resin plate, and a shutter that can be opened and closed by a solenoid (not shown) is provided at the opening on the bottom surface.
  • a sample collection tray 8 for collecting a measured sample is disposed in the lower part of the front surface of the housing 2 so as to be drawn out.
  • a monochromator as a measuring unit including a light source lamp (not shown), a pair of mirrors, a diffraction grating, a light receiving element (photodiode 10 to be described later), etc. is disposed at an appropriate position in the housing 2 around the sample measuring unit 7.
  • a heater 11 as a heating means for heating the photodiode 10, a thermistor 12 for detecting the temperature around the photodiode 10, and the like.
  • optical path length adjusting members 13 shown in FIG. 1 are disposed on both sides of the sample measuring unit 7 in the width direction, for example, and one (right side in FIG. 1) of the optical path length adjusting members 13 includes an actuator. 14 are connected. When the actuator 14 is operated by a control signal from the control device 15, the optical path length L in the sample measuring unit 7 is changed by approaching or moving away from the opposing optical path length adjusting member 13. ing.
  • FIG. 2 is a block diagram of the quality measuring apparatus 1 according to the present invention.
  • the quality measuring apparatus 1 includes a main substrate 15 a as a control device 15, a sample supply unit unit 17, a preamplifier unit 18, a spectroscope unit 19, and the like. It is disposed at a predetermined position.
  • the main substrate 15a has a CPU, RAM, ROM, etc. (not shown), to which a spectroscope unit 19 is connected, and the sample supply unit 17 is connected via a relay substrate 20.
  • the photodiode 10 and the thermistor 12 are connected to the main substrate 15a via the preamplifier substrate 18a of the preamplifier unit 18, and the heater 11 is directly connected to the main substrate 15a.
  • the sample supply unit 17 includes the relay substrate 20, a photomicrosensor 16a for detecting the impeller position, a photomicrosensor 16b for detecting the sample discharge shutter, and a photomicrosensor 16c for detecting the sample discharge shutter closed.
  • the optical path length sensor substrate 21, the stepping motor 6, and the actuator 14 are included.
  • the optical path length sensor substrate 21 has five photomicrosensors 21a for detecting five optical path length positions of, for example, 10 mm, 20 mm, 25 mm, 30 mm, and 35 mm of an optical path length actuator (not shown). 20 is connected.
  • the stepping motor 6 that rotates the impeller 4 and the actuator 14 that moves the optical path length adjusting member 13 are connected to the main board 15a via motor drivers 6a and 14a.
  • the spectroscope unit 19 includes a stepping motor 22 for rotating the diffraction grating, a rotary encoder 23 for the diffraction grating, two photomicrosensors 24a for switching the wavelength calibration filter, a solenoid 24b, and the like.
  • a stepping motor 22 for rotating the diffraction grating for rotating the diffraction grating
  • a rotary encoder 23 for the diffraction grating
  • two photomicrosensors 24a for switching the wavelength calibration filter
  • a solenoid 24b and the like.
  • the main board 15a is connected to a printer 25 for printing measurement results, a rear panel board 26 having various output terminals, a DC fan 27, a detection sensor 28 for detecting the open / closed state of the sample collection tray 8, and the like.
  • reference numeral 30 denotes a power supply unit
  • 31 denotes a front panel board
  • 32a denotes an indoor thermistor
  • 32b denotes an outdoor thermistor
  • 33 denotes a buzzer board
  • 34 denotes a Bluetooth (registered trademark) board
  • 35 denotes a DC fan 35a and a halogen.
  • a rear unit 36 having a lamp 35b is a sample discharge substrate. Note that this block configuration diagram is an example, and an appropriate block configuration diagram that can obtain an equivalent effect can be adopted.
  • the optical path length L is changed (K03).
  • a measurement product such as a sample type
  • measurement is started (K02)
  • the optical path length L is changed (K03).
  • the optical path length L one of five optical path lengths L of 10 mm to 35 mm set in accordance with the form of the measurement product is selected, and the optical path length adjusting member 13 is changed by the optical path length adjusting member 13 according to FIG.
  • the optical path length L is set to be short (or long) by moving from this position to the position shown in FIG.
  • the “grain form” handled in the present invention includes the type of grain, the state of moisture value, the production area, brand (variety), harvest year, and the like.
  • the stepping motor 6 is rotated to operate the impeller 4 (K10).
  • the sample detection sensor detects the sample (K11), the gain is changed (K12), and the spectrum is acquired (K13).
  • the shutter of the hopper 3 is opened (K14), the impeller 4 is operated (K15), and the shutter is closed (K16).
  • a sample (sample) is measured at K10 to K16.
  • an estimated value is calculated from the measured data (K17), and the result is printed (K18) and stored in the SD card (K19).
  • Data processing is performed in K17 to K19.
  • the shutter is opened (K20), the impeller 4 is operated (K21), and the shutter is closed (K22), whereby the sample after measurement is discharged (collected) to the sample collection dish, and the measurement of the sample is performed. End (K23).
  • the rotational speed of the stepping motor 6 can be controlled (variable) by the control signal of the control device 15, the rotational speed of the impeller 4 in the step K10, that is, at the time of sample measurement, Is set to an optimum number of revolutions according to.
  • the rotation speed of the impeller 4 is lowered, and in the case of a dried sample, the rotation speed is increased, so that the sample measurement unit is discharged from the impeller 4.
  • the density of the sample filled in 7 is made uniform. That is, the quality measuring device 1 has a function of supplying a variable speed of the impeller.
  • an optimal optical path length can be set according to the form of the sample, that is, an optical path length changing function is provided.
  • the heater 11 capable of heating the photodiode 10 and the thermistor 12 for detecting the temperature around the photodiode 10 are provided, the heater 11 is operated to change the temperature around the photodiode 10 (atmosphere temperature). For example, when the protein of the sample is measured, the temperature is set to an optimum temperature, that is, the temperature around the photodiode 10 is always kept constant by heating by the heater 11.
  • the quality measuring apparatus 1 As described above, according to the quality measuring apparatus 1, a predetermined amount of the sample put into the hopper 3 and rotated and conveyed by the impeller 4 is accommodated and filled in the sample measuring unit 7, and the sample is red by a monochromator as a measuring unit.
  • the optical path length L of the sample measuring unit 7 is adjusted to a predetermined length according to the sample by the control device 15, so that the conventional method corresponding to the form of the sample to be measured is used.
  • the measurement by the measuring means is performed using a monochromator structure having a light source and a light receiving element, first and second mirrors, a diffraction grating, and an exit slit, the sample is compared with a conventional polychromator structure.
  • the measurement accuracy can be greatly improved.
  • the optical path length L can be changed, and the optical path length L can be set in five steps within a range of 10 to 35 mm, for example. It becomes possible to efficiently and accurately measure the quality of various forms of samples.
  • the rotation speed of the impeller 4 can be controlled by the control device 15 in accordance with the type of the sample and the like, so that the rotation of the impeller 4 corresponds to the form of the sample to be measured.
  • the speed is set optimally, and various types of samples are uniformly filled in the sample measuring unit 7 without being affected by the sample form, and a measurement result with a stable sample quality can be easily obtained.
  • the quality measuring device 1 has a constant temperature maintaining function
  • the temperature around the photodiode 10 is detected by the control device 15 and the heater 11 is operated based on the detected temperature to make the temperature around the photodiode constant.
  • the protein can be detected (measured) with high accuracy using the temperature of the photodiode 10 as the optimum temperature, particularly when measuring the protein of the sample.
  • the form and arrangement position of the optical path length adjusting member, the movement adjusting method, the type of the optical path length L, the configuration of the block diagram, the parts to be used, and the like in the embodiment are merely examples, and the optical path length L is set to 5 for example.
  • the stage but also the grains with few types can be appropriately changed within a range not departing from the gist of each invention according to the present invention, such as being able to set a plurality of stages such as 2 to 4 stages. .
  • the present invention can be used not only for measuring protein of grains but also for measuring various internal qualities.

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

L'invention concerne un dispositif pour mesurer la qualité de grains qui peut mesurer efficacement la qualité de grains de formes diverses, avec une grande précision, par modification automatique de la longueur de chemin optique en fonction de la forme des grains. La présente invention est caractérisée en ce qu'elle comprend : une trémie qui est placée sur une partie supérieure d'un carter et dans laquelle sont introduits des grains ; une roue qui transporte les grains introduits dans la trémie par mise en rotation desdits grains ; une unité de mesure d'échantillon qui est placée sous la roue et qui peut recevoir une quantité prescrite de grains ; un moyen de mesure qui mesure optiquement la qualité des grains dans l'unité de mesure d'échantillon ; et un dispositif de commande qui peut modifier la longueur de chemin optique de la lumière transmise depuis le moyen de mesure en fonction de la forme des grains introduits dans la trémie. La longueur de chemin optique est commandée par réglage électrique de la position d'un élément de réglage de la longueur de chemin optique.
PCT/JP2017/030748 2016-08-30 2017-08-28 Dispositif pour mesurer la qualité de grains WO2018043403A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
KR1020187031859A KR102272720B1 (ko) 2016-08-30 2017-08-28 곡물의 품질 측정 장치
CN201780028441.4A CN109154559A (zh) 2016-08-30 2017-08-28 谷粒质量测定装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016168623A JP6347353B2 (ja) 2016-08-30 2016-08-30 穀粒の品質測定装置
JP2016-168623 2016-08-30

Publications (1)

Publication Number Publication Date
WO2018043403A1 true WO2018043403A1 (fr) 2018-03-08

Family

ID=57830456

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2017/030748 WO2018043403A1 (fr) 2016-08-30 2017-08-28 Dispositif pour mesurer la qualité de grains

Country Status (4)

Country Link
JP (1) JP6347353B2 (fr)
KR (1) KR102272720B1 (fr)
CN (1) CN109154559A (fr)
WO (1) WO2018043403A1 (fr)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06288907A (ja) * 1993-03-31 1994-10-18 Shizuoka Seiki Co Ltd 籾米の品質評価方法
JPH06300689A (ja) * 1993-04-14 1994-10-28 Mitsui Mining & Smelting Co Ltd 透過法による青果物の内部品質測定法
JPH0712719A (ja) * 1993-06-28 1995-01-17 Kubota Corp 分光分析装置
JPH08285763A (ja) * 1995-04-18 1996-11-01 Iseki & Co Ltd 近赤外線分光分析装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08100740A (ja) * 1994-09-30 1996-04-16 Zexel Corp 燃料噴射装置のパイロット噴射量制御機構およびパイロット噴射量制御方法
EP0957353A3 (fr) * 1998-05-15 2000-02-23 Mitsui Mining & Smelting Co., Ltd Dispositif de mesure de la qualité interne d'un objet
US7316322B2 (en) * 2002-12-24 2008-01-08 Kubota Corporation Quality evaluation apparatus for fruits and vegetables
RU2264610C2 (ru) * 2004-01-16 2005-11-20 Общество с ограниченной ответственностью "ВИНТЕЛ" Способ измерения спектроскопических свойств сыпучих продуктов и устройство для его осуществления
CN101295050A (zh) * 2007-04-27 2008-10-29 柯正浩 光学系统
BR112015021902B1 (pt) * 2013-03-15 2021-06-15 Iris International, Inc Líquido para alinhamento de partícula e organela intracelular

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06288907A (ja) * 1993-03-31 1994-10-18 Shizuoka Seiki Co Ltd 籾米の品質評価方法
JPH06300689A (ja) * 1993-04-14 1994-10-28 Mitsui Mining & Smelting Co Ltd 透過法による青果物の内部品質測定法
JPH0712719A (ja) * 1993-06-28 1995-01-17 Kubota Corp 分光分析装置
JPH08285763A (ja) * 1995-04-18 1996-11-01 Iseki & Co Ltd 近赤外線分光分析装置

Also Published As

Publication number Publication date
KR20190045089A (ko) 2019-05-02
KR102272720B1 (ko) 2021-07-05
JP6347353B2 (ja) 2018-06-27
CN109154559A (zh) 2019-01-04
JP2017015720A (ja) 2017-01-19

Similar Documents

Publication Publication Date Title
RU2383881C2 (ru) Спектрометрическая измерительная головка для уборочных и других сельскохозяйственных машин
EP2078951B1 (fr) Appareil pour l'analyse du lait
AU2011214172A1 (en) Optical absorption spectroscopy with multi-pass cell with adjustable optical path length
EP2480877B1 (fr) Procédé et appareil de mesure en ligne d'une propriété d'une bande continue
JP2019191194A (ja) マスターバッチをプラスチック加工機に供給するためのスペクトル特性に基づいたシステム及び方法
JP6347353B2 (ja) 穀粒の品質測定装置
JP6347352B2 (ja) 穀粒の品質測定装置
EP3341703A1 (fr) Verres à l'oxyde d'holmium comme standards d'étalonnage pour capteurs d'humidité dans l'infrarouge proche
WO2018043404A1 (fr) Dispositif pour mesurer la qualité de grains
JP2010175403A (ja) 近似式による吸光度の算出方法
JP4004443B2 (ja) 農産物の品質評価装置
CN209745749U (zh) 一种基于两段温度法的快速检测烟丝含水率的装置
JPH085550A (ja) 分光分析装置
JP2017015720A5 (fr)
JP2017037078A5 (fr)
JP2006047209A (ja) 分光分析装置
JPH0720042A (ja) 分光分析装置
JP3919491B2 (ja) 農産物の品質計測装置
JPH08300350A (ja) プリプレグの製造方法
Fisher et al. Rapid, Automated, Quality Control Measurements of Diffraction Grating Efficiency
CA3130795C (fr) Systeme de spectrometre et procede de controle de celui-ci
JP3989360B2 (ja) 品質評価装置校正方法
JP2002107294A (ja) 分光分析装置
Morantes Processing Analytics for Milling: Rapid Detection of Quality Parameters through Optical Technologies
JPH0829333A (ja) 分光分析装置

Legal Events

Date Code Title Description
ENP Entry into the national phase

Ref document number: 20187031859

Country of ref document: KR

Kind code of ref document: A

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 17846408

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 17846408

Country of ref document: EP

Kind code of ref document: A1