WO2018043403A1 - Device for measuring the quality of grains - Google Patents

Device for measuring the quality of grains Download PDF

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Publication number
WO2018043403A1
WO2018043403A1 PCT/JP2017/030748 JP2017030748W WO2018043403A1 WO 2018043403 A1 WO2018043403 A1 WO 2018043403A1 JP 2017030748 W JP2017030748 W JP 2017030748W WO 2018043403 A1 WO2018043403 A1 WO 2018043403A1
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WO
WIPO (PCT)
Prior art keywords
optical path
path length
grain
sample
grains
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PCT/JP2017/030748
Other languages
French (fr)
Japanese (ja)
Inventor
石津　裕之
由武 青島
義高 福元
章子 殿柿
Original Assignee
静岡製機株式会社
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Application filed by 静岡製機株式会社 filed Critical 静岡製機株式会社
Priority to CN201780028441.4A priority Critical patent/CN109154559A/en
Priority to KR1020187031859A priority patent/KR102272720B1/en
Publication of WO2018043403A1 publication Critical patent/WO2018043403A1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/359—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G01N2021/8592—Grain or other flowing solid samples

Definitions

  • the present invention relates to a grain quality measuring device for optically measuring, for example, grain taste and internal quality.
  • a quality analyzer such as a taste analyzer for analyzing the taste of a grain or an internal quality measuring device for measuring the internal quality of a grain
  • a sample of the grain put into a hopper provided at the top of the housing
  • the (sample) is accommodated (filled) in the sample measurement unit while being rotated by an impeller provided continuously to the hopper bottom.
  • the grain accommodated in the sample measuring unit is irradiated with light from the measuring means of the optical system to measure its quality.
  • the quality evaluation apparatus of the polished rice using a near-infrared analyzer is disclosed by patent document 1, for example.
  • the quality of the grain in the sample measuring unit connected to the lower part of the bottom surface of the impeller is measured by the measuring means of the optical system, but the amount of transmitted light depends on the type of grain.
  • a plurality of optical path length changing parts are prepared because they are different, and they are exchanged according to the grain so as to obtain a certain amount of light optimum for the grain.
  • the present invention has been made in view of such circumstances, and the purpose thereof is to automatically adjust the optical path length according to the type of grain and the like, thereby accurately and efficiently measuring the quality of various forms of grain.
  • An object of the present invention is to provide a grain quality measuring device that can be performed automatically.
  • the invention described in claim 1 of the present invention includes a hopper provided at an upper portion of the housing and into which the grain is charged, and the grain charged into the hopper by rotating the hopper.
  • An impeller to be transported a sample measuring unit disposed below the impeller and capable of accommodating a predetermined amount of grain, a measuring means for optically measuring the quality of the grain in the sample measuring unit, and the hopper
  • a control device capable of adjusting the optical path length of the transmitted light by the measuring means in accordance with the form of the grain to be processed.
  • the invention according to claim 2 is characterized in that the measuring means has a monochromator structure having a light source and a light receiving element, a first mirror and a second mirror, a diffraction grating, and an exit slit.
  • the invention according to claim 3 is characterized in that the optical path length is adjusted by electric position adjustment of the optical path length adjusting member.
  • a predetermined amount of the grain put into the hopper and rotated and conveyed by the impeller is stored and filled in the sample measuring unit, and this grain is optically measured by the measuring means.
  • the optical path length of the measuring means is adjusted to the length according to the form of the grain by the control device, so without changing the optical path length changing parts one by one corresponding to the form of the grain to be measured It can be automatically changed, and measurement errors of various forms of grains can be made uniform and the quality of the grains can be measured with high accuracy, and the measurement operation itself can be performed efficiently.
  • the measuring means has a light source and a light receiving element, first and second mirrors, a diffraction grating, and an exit slit. Due to the monochromator structure, the grain measurement accuracy can be greatly improved.
  • the optical path length can be changed electrically by controlling the position of the optical path length adjusting member with the control device, The efficiency of measurement work can be further increased.
  • the quality measuring apparatus 1 has a box-shaped housing 2, and a hopper 3 is disposed on the upper surface of the housing 2. It is arranged to be possible.
  • An impeller 4 is continuously provided below the bottom opening of the hopper 3, and the opening provided on the upper surface of the case 4a is in communication with the bottom opening of the hopper 3 via the shutter. .
  • a shutter sample is rotated downward by actuating the solenoid 5 in response to a control signal from a control device 15 (see FIG. 2), and a grain sample (referred to as a specimen) put into the hopper 3
  • the impeller 4 is supplied.
  • the impeller 4 has a plurality of blades 4c radially fixed to the rotation shaft 4b, and the blades 4c rotate in a vertical plane by the operation of the stepping motor 6 fixed to the rotation shaft 4b. It has become.
  • a discharge opening is formed in the bottom surface of the case 4 a of the impeller 4, and this opening communicates with the upper surface opening of the sample measuring unit 7 disposed at the lower part of the impeller 4.
  • the sample measuring unit 7 is formed in a bottomed cylindrical shape by, for example, a transparent resin plate, and a shutter that can be opened and closed by a solenoid (not shown) is provided at the opening on the bottom surface.
  • a sample collection tray 8 for collecting a measured sample is disposed in the lower part of the front surface of the housing 2 so as to be drawn out.
  • a monochromator as a measuring unit including a light source lamp (not shown), a pair of mirrors, a diffraction grating, a light receiving element (photodiode 10 to be described later), etc. is disposed at an appropriate position in the housing 2 around the sample measuring unit 7.
  • a heater 11 as a heating means for heating the photodiode 10, a thermistor 12 for detecting the temperature around the photodiode 10, and the like.
  • optical path length adjusting members 13 shown in FIG. 1 are disposed on both sides of the sample measuring unit 7 in the width direction, for example, and one (right side in FIG. 1) of the optical path length adjusting members 13 includes an actuator. 14 are connected. When the actuator 14 is operated by a control signal from the control device 15, the optical path length L in the sample measuring unit 7 is changed by approaching or moving away from the opposing optical path length adjusting member 13. ing.
  • FIG. 2 is a block diagram of the quality measuring apparatus 1 according to the present invention.
  • the quality measuring apparatus 1 includes a main substrate 15 a as a control device 15, a sample supply unit unit 17, a preamplifier unit 18, a spectroscope unit 19, and the like. It is disposed at a predetermined position.
  • the main substrate 15a has a CPU, RAM, ROM, etc. (not shown), to which a spectroscope unit 19 is connected, and the sample supply unit 17 is connected via a relay substrate 20.
  • the photodiode 10 and the thermistor 12 are connected to the main substrate 15a via the preamplifier substrate 18a of the preamplifier unit 18, and the heater 11 is directly connected to the main substrate 15a.
  • the sample supply unit 17 includes the relay substrate 20, a photomicrosensor 16a for detecting the impeller position, a photomicrosensor 16b for detecting the sample discharge shutter, and a photomicrosensor 16c for detecting the sample discharge shutter closed.
  • the optical path length sensor substrate 21, the stepping motor 6, and the actuator 14 are included.
  • the optical path length sensor substrate 21 has five photomicrosensors 21a for detecting five optical path length positions of, for example, 10 mm, 20 mm, 25 mm, 30 mm, and 35 mm of an optical path length actuator (not shown). 20 is connected.
  • the stepping motor 6 that rotates the impeller 4 and the actuator 14 that moves the optical path length adjusting member 13 are connected to the main board 15a via motor drivers 6a and 14a.
  • the spectroscope unit 19 includes a stepping motor 22 for rotating the diffraction grating, a rotary encoder 23 for the diffraction grating, two photomicrosensors 24a for switching the wavelength calibration filter, a solenoid 24b, and the like.
  • a stepping motor 22 for rotating the diffraction grating for rotating the diffraction grating
  • a rotary encoder 23 for the diffraction grating
  • two photomicrosensors 24a for switching the wavelength calibration filter
  • a solenoid 24b and the like.
  • the main board 15a is connected to a printer 25 for printing measurement results, a rear panel board 26 having various output terminals, a DC fan 27, a detection sensor 28 for detecting the open / closed state of the sample collection tray 8, and the like.
  • reference numeral 30 denotes a power supply unit
  • 31 denotes a front panel board
  • 32a denotes an indoor thermistor
  • 32b denotes an outdoor thermistor
  • 33 denotes a buzzer board
  • 34 denotes a Bluetooth (registered trademark) board
  • 35 denotes a DC fan 35a and a halogen.
  • a rear unit 36 having a lamp 35b is a sample discharge substrate. Note that this block configuration diagram is an example, and an appropriate block configuration diagram that can obtain an equivalent effect can be adopted.
  • the optical path length L is changed (K03).
  • a measurement product such as a sample type
  • measurement is started (K02)
  • the optical path length L is changed (K03).
  • the optical path length L one of five optical path lengths L of 10 mm to 35 mm set in accordance with the form of the measurement product is selected, and the optical path length adjusting member 13 is changed by the optical path length adjusting member 13 according to FIG.
  • the optical path length L is set to be short (or long) by moving from this position to the position shown in FIG.
  • the “grain form” handled in the present invention includes the type of grain, the state of moisture value, the production area, brand (variety), harvest year, and the like.
  • the stepping motor 6 is rotated to operate the impeller 4 (K10).
  • the sample detection sensor detects the sample (K11), the gain is changed (K12), and the spectrum is acquired (K13).
  • the shutter of the hopper 3 is opened (K14), the impeller 4 is operated (K15), and the shutter is closed (K16).
  • a sample (sample) is measured at K10 to K16.
  • an estimated value is calculated from the measured data (K17), and the result is printed (K18) and stored in the SD card (K19).
  • Data processing is performed in K17 to K19.
  • the shutter is opened (K20), the impeller 4 is operated (K21), and the shutter is closed (K22), whereby the sample after measurement is discharged (collected) to the sample collection dish, and the measurement of the sample is performed. End (K23).
  • the rotational speed of the stepping motor 6 can be controlled (variable) by the control signal of the control device 15, the rotational speed of the impeller 4 in the step K10, that is, at the time of sample measurement, Is set to an optimum number of revolutions according to.
  • the rotation speed of the impeller 4 is lowered, and in the case of a dried sample, the rotation speed is increased, so that the sample measurement unit is discharged from the impeller 4.
  • the density of the sample filled in 7 is made uniform. That is, the quality measuring device 1 has a function of supplying a variable speed of the impeller.
  • an optimal optical path length can be set according to the form of the sample, that is, an optical path length changing function is provided.
  • the heater 11 capable of heating the photodiode 10 and the thermistor 12 for detecting the temperature around the photodiode 10 are provided, the heater 11 is operated to change the temperature around the photodiode 10 (atmosphere temperature). For example, when the protein of the sample is measured, the temperature is set to an optimum temperature, that is, the temperature around the photodiode 10 is always kept constant by heating by the heater 11.
  • the quality measuring apparatus 1 As described above, according to the quality measuring apparatus 1, a predetermined amount of the sample put into the hopper 3 and rotated and conveyed by the impeller 4 is accommodated and filled in the sample measuring unit 7, and the sample is red by a monochromator as a measuring unit.
  • the optical path length L of the sample measuring unit 7 is adjusted to a predetermined length according to the sample by the control device 15, so that the conventional method corresponding to the form of the sample to be measured is used.
  • the measurement by the measuring means is performed using a monochromator structure having a light source and a light receiving element, first and second mirrors, a diffraction grating, and an exit slit, the sample is compared with a conventional polychromator structure.
  • the measurement accuracy can be greatly improved.
  • the optical path length L can be changed, and the optical path length L can be set in five steps within a range of 10 to 35 mm, for example. It becomes possible to efficiently and accurately measure the quality of various forms of samples.
  • the rotation speed of the impeller 4 can be controlled by the control device 15 in accordance with the type of the sample and the like, so that the rotation of the impeller 4 corresponds to the form of the sample to be measured.
  • the speed is set optimally, and various types of samples are uniformly filled in the sample measuring unit 7 without being affected by the sample form, and a measurement result with a stable sample quality can be easily obtained.
  • the quality measuring device 1 has a constant temperature maintaining function
  • the temperature around the photodiode 10 is detected by the control device 15 and the heater 11 is operated based on the detected temperature to make the temperature around the photodiode constant.
  • the protein can be detected (measured) with high accuracy using the temperature of the photodiode 10 as the optimum temperature, particularly when measuring the protein of the sample.
  • the form and arrangement position of the optical path length adjusting member, the movement adjusting method, the type of the optical path length L, the configuration of the block diagram, the parts to be used, and the like in the embodiment are merely examples, and the optical path length L is set to 5 for example.
  • the stage but also the grains with few types can be appropriately changed within a range not departing from the gist of each invention according to the present invention, such as being able to set a plurality of stages such as 2 to 4 stages. .
  • the present invention can be used not only for measuring protein of grains but also for measuring various internal qualities.

Abstract

Provided is a device for measuring the quality of grains which is capable of efficiently measuring the quality of grains of various shapes, with high accuracy, by automatically changing the optical path length in accordance with the shape of the grains. The present invention is characterized by being provided with: a hopper which is provided to an upper part of a housing, and into which grains are introduced; an impeller which conveys the grains introduced into the hopper by rotating said grains; a sample measurement unit which is provided below the impeller, and which is capable of accommodating a prescribed amount of grains; a measurement means which optically measures the quality of the grains in the sample measurement unit; and a control device which is capable of changing the optical path length of transmitted light from the measurement means in accordance with the shape of the grains introduced into the hopper. The optical path length is controlled by electrically adjusting the position of an optical path length adjustment member.

Description

穀粒の品質測定装置Grain quality measuring device
　本発明は、例えば穀粒の食味や内部品質等を光学的に測定するための穀粒の品質測定装置に関する。 The present invention relates to a grain quality measuring device for optically measuring, for example, grain taste and internal quality.
　従来、穀粒の食味を分析する食味分析計や、穀粒の内部品質を測定する内部品質測定器等の品質測定装置においては、例えば筐体上部に設けたホッパに投入された穀粒のサンプル（試料）を、ホッパ底部に連設したインペラで回転させつつ試料測定部に収容（充填）する。そして、試料測定部内に収容した穀粒に光学系の測定手段から光を照射してその品質を測定するようにしている。なお、近赤外分析計を使用した籾米の品質評価装置は、例えば特許文献１に開示されている。 Conventionally, in a quality analyzer such as a taste analyzer for analyzing the taste of a grain or an internal quality measuring device for measuring the internal quality of a grain, for example, a sample of the grain put into a hopper provided at the top of the housing The (sample) is accommodated (filled) in the sample measurement unit while being rotated by an impeller provided continuously to the hopper bottom. And the grain accommodated in the sample measuring unit is irradiated with light from the measuring means of the optical system to measure its quality. In addition, the quality evaluation apparatus of the polished rice using a near-infrared analyzer is disclosed by patent document 1, for example.
特開平６－２８８９０７号公報JP-A-6-288907
　しかしながら、このような品質測定装置にあっては、インペラの底面下部に連設した試料測定部内の穀粒の品質を光学系の測定手段で測定しているが、穀粒の種類によって透過光量が異なることから複数の光路長変更部品を用意して、これを穀粒に応じて交換することで、穀粒に最適な一定光量を得るようにしている。 However, in such a quality measuring device, the quality of the grain in the sample measuring unit connected to the lower part of the bottom surface of the impeller is measured by the measuring means of the optical system, but the amount of transmitted light depends on the type of grain. A plurality of optical path length changing parts are prepared because they are different, and they are exchanged according to the grain so as to obtain a certain amount of light optimum for the grain.
　ところが、穀物が変わった場合には勿論であるが、同じ穀粒でも生産年度や品種、産地等で透過光量が異なることから、複数の光路長変更部品ではこれらに的確に対応できず、測定誤差が生じ易い。また、光路長変更部品の交換忘れや付け忘れ等が発生し易く、測定結果の誤差を一層大きくしているのが実情で、各種穀粒の品質測定を精度良く行うことが困難である。また同時に、予め穀粒に対応した複数個の光路長変更部品が必要となり、装置の構成が複雑化してコスト高になったり光路長変更部材の交換作業が必要になる等、測定作業自体が面倒になり易い。 However, as a matter of course, when the grain changes, the amount of transmitted light varies depending on the production year, varieties, production area, etc., even with the same grain. Is likely to occur. Moreover, it is easy to forget to replace or forget to change the optical path length changing part, and the error in the measurement result is further increased, and it is difficult to accurately measure the quality of various grains. At the same time, a plurality of optical path length changing parts corresponding to the grains are required in advance, which complicates the configuration of the apparatus, increases costs, and requires replacement work of the optical path length changing member. It is easy to become.
　本発明は、このような事情に鑑みてなされたもので、その目的は、穀粒の種類等に応じて光路長を自動調整することで、各種形態の穀粒の品質測定を精度良くかつ効率的に行うことが可能な穀粒の品質測定装置を提供することにある。 The present invention has been made in view of such circumstances, and the purpose thereof is to automatically adjust the optical path length according to the type of grain and the like, thereby accurately and efficiently measuring the quality of various forms of grain. An object of the present invention is to provide a grain quality measuring device that can be performed automatically.
　かかる目的を達成すべく、本発明のうち請求項１に記載の発明は、筐体の上部に設けられて穀粒が投入されるホッパと、該ホッパ内に投入された穀粒をその回転により搬送するインペラと、該インペラの下方に配設され所定量の穀粒が収容可能な試料測定部と、該試料測定部内の穀粒の品質を光学的に測定する測定手段と、前記ホッパに投入される穀粒の形態に応じて前記測定手段による透過光の光路長を調整可能な制御装置と、を備えることを特徴とする。 In order to achieve such an object, the invention described in claim 1 of the present invention includes a hopper provided at an upper portion of the housing and into which the grain is charged, and the grain charged into the hopper by rotating the hopper. An impeller to be transported, a sample measuring unit disposed below the impeller and capable of accommodating a predetermined amount of grain, a measuring means for optically measuring the quality of the grain in the sample measuring unit, and the hopper And a control device capable of adjusting the optical path length of the transmitted light by the measuring means in accordance with the form of the grain to be processed.
　また、請求項２に記載の発明は、前記測定手段が、光源及び受光素子、第１ミラー及び第２ミラー、回折格子、及び出口スリットを有するモノクロメータ構造であることを特徴とする。また、請求項３に記載の発明は、前記光路長が、光路長調整部材の電動による位置調整で行われることを特徴とする。 The invention according to claim 2 is characterized in that the measuring means has a monochromator structure having a light source and a light receiving element, a first mirror and a second mirror, a diffraction grating, and an exit slit. The invention according to claim 3 is characterized in that the optical path length is adjusted by electric position adjustment of the optical path length adjusting member.
　本発明のうち請求項１に記載の発明によれば、ホッパ内に投入されインペラで回転搬送された穀粒が試料測定部に所定量収容充填され、この穀粒を測定手段で光学的に測定する際に、測定手段の光路長が制御装置で穀粒の形態に応じた長さに調整されるため、測定すべき穀粒の形態に対応して光路長変更部品を一々交換等することなく自動変更できて、各種形態の穀粒の測定誤差を均一化し穀粒の品質を精度良く測定することができると共に、測定作業自体を効率的に行うことが可能になる。 According to the invention described in claim 1 of the present invention, a predetermined amount of the grain put into the hopper and rotated and conveyed by the impeller is stored and filled in the sample measuring unit, and this grain is optically measured by the measuring means. In doing so, the optical path length of the measuring means is adjusted to the length according to the form of the grain by the control device, so without changing the optical path length changing parts one by one corresponding to the form of the grain to be measured It can be automatically changed, and measurement errors of various forms of grains can be made uniform and the quality of the grains can be measured with high accuracy, and the measurement operation itself can be performed efficiently.
　また、請求項２に記載の発明によれば、請求項１に記載の発明の効果に加え、測定手段が、光源及び受光素子、第１及び第２のミラー、回折格子、及び出口スリットを有するモノクロメータ構造であるため、穀粒の測定精度を大幅に向上させることができる。 According to the invention described in claim 2, in addition to the effect of the invention described in claim 1, the measuring means has a light source and a light receiving element, first and second mirrors, a diffraction grating, and an exit slit. Due to the monochromator structure, the grain measurement accuracy can be greatly improved.
　さらに、請求項３に記載の発明によれば、請求項１または２に記載の発明の効果に加え、光路長調整部材の位置を制御装置で制御することにより光路長を電動で変更できて、測定作業の一層の効率化を図ることができる。 Further, according to the invention described in claim 3, in addition to the effect of the invention described in claim 1 or 2, the optical path length can be changed electrically by controlling the position of the optical path length adjusting member with the control device, The efficiency of measurement work can be further increased.
本発明に係わる穀粒の品質測定装置の一実施形態を示す概略側面図The schematic side view which shows one Embodiment of the quality measuring apparatus of the grain concerning this invention 同そのブロック構成図Same block diagram 同動作の一例を示すフローチャートFlow chart showing an example of the same operation 同光路長の可変状態を示す図１と同様の概略側面図Schematic side view similar to FIG. 1 showing the variable state of the optical path length
　以下、本発明を実施するための形態を図面に基づいて詳細に説明する。
　図１～図４は、本発明に係わる品質測定装置の一実施形態を示している。図１に示すように、品質測定装置１は、箱状の筺体２を有し、この筺体２の上面にはホッパ３が配設され、このホッパ３の底面開口部には図示しないシャッタが開閉可能に配設されている。 DESCRIPTION OF EMBODIMENTS Hereinafter, embodiments for carrying out the present invention will be described in detail with reference to the drawings.
1 to 4 show an embodiment of a quality measuring apparatus according to the present invention. As shown in FIG. 1, the quality measuring apparatus 1 has a box-shaped housing 2, and a hopper 3 is disposed on the upper surface of the housing 2. It is arranged to be possible.
　また、ホッパ３の底面開口部の下方にはインペラ４が連設され、このインペラ４はそのケース４ａの上面に設けた開口がホッパ３の底面開口に前記シャッタを介して連通状態となっている。そして、シャッタが後述する制御装置１５（図２参照）の制御信号でソレノイド５が作動することにより下方に回動動作して、ホッパ３内に投入された穀粒のサンプル（試料という）が、インペラ４に供給されるようになっている。なお、インペラ４は、その回転軸４ｂに放射状に固定された複数枚の羽根４ｃを有し、回転軸４ｂに固定されたステッピングモータ６の作動で、羽根４ｃが垂直面内で回転するようになっている。 An impeller 4 is continuously provided below the bottom opening of the hopper 3, and the opening provided on the upper surface of the case 4a is in communication with the bottom opening of the hopper 3 via the shutter. . A shutter sample is rotated downward by actuating the solenoid 5 in response to a control signal from a control device 15 (see FIG. 2), and a grain sample (referred to as a specimen) put into the hopper 3 The impeller 4 is supplied. The impeller 4 has a plurality of blades 4c radially fixed to the rotation shaft 4b, and the blades 4c rotate in a vertical plane by the operation of the stepping motor 6 fixed to the rotation shaft 4b. It has become.
　また、前記インペラ４のケース４ａの底面には排出用の開口が形成され、この開口がインペラ４の下部に配設された試料測定部７の上面開口部に連通している。試料測定部７は、例えば透明な樹脂板により有底筒状に形成され、底面の開口部には、図示しないソレノイドで開閉可能なシャッタが設けられている。このシャッタの下方には、測定済みの試料を回収する試料回収皿８が筐体２の前面下部に引き出し可能に配設されている。 Further, a discharge opening is formed in the bottom surface of the case 4 a of the impeller 4, and this opening communicates with the upper surface opening of the sample measuring unit 7 disposed at the lower part of the impeller 4. The sample measuring unit 7 is formed in a bottomed cylindrical shape by, for example, a transparent resin plate, and a shutter that can be opened and closed by a solenoid (not shown) is provided at the opening on the bottom surface. Below the shutter, a sample collection tray 8 for collecting a measured sample is disposed in the lower part of the front surface of the housing 2 so as to be drawn out.
　また、前記試料測定部７の周囲の筐体２内の適宜位置には、図示しない光源ランプ、一対のミラー、回折格子、受光素子（後述するフォトダイオード１０）等からなる測定手段としてのモノクロメータが配設されると共に、フォトダイオード１０を加温する加温手段としてのヒータ１１や、フォトダイオード１０周辺の温度検出用のサーミスタ１２等が配設されている。さらに、前記試料測定部７の例えば幅方向の両側には、図１に示す光路長調整部材１３がそれぞれ配設され、このうち一方の（図１の右側）光路長調整部材１３には、アクチュエータ１４が連結されている。そして、このアクチュエータ１４が制御装置１５の制御信号で作動することにより、対向する光路長調整部材１３に対して接近したり離間して、試料測定部７における光路長Ｌが変更されるようになっている。 In addition, a monochromator as a measuring unit including a light source lamp (not shown), a pair of mirrors, a diffraction grating, a light receiving element (photodiode 10 to be described later), etc. is disposed at an appropriate position in the housing 2 around the sample measuring unit 7. And a heater 11 as a heating means for heating the photodiode 10, a thermistor 12 for detecting the temperature around the photodiode 10, and the like. Further, optical path length adjusting members 13 shown in FIG. 1 are disposed on both sides of the sample measuring unit 7 in the width direction, for example, and one (right side in FIG. 1) of the optical path length adjusting members 13 includes an actuator. 14 are connected. When the actuator 14 is operated by a control signal from the control device 15, the optical path length L in the sample measuring unit 7 is changed by approaching or moving away from the opposing optical path length adjusting member 13. ing.
　図２は、本発明に係わる品質測定装置１のブロック構成図を示している。図２に示すように、品質測定装置１は、制御装置１５としてのメイン基板１５ａと、試料供給ユニット部１７と、プリアンプユニット１８と、分光器ユニット１９等を有して、これらが筐体２内の所定位置に配設されている。前記メイン基板１５ａは、図示しないＣＰＵ、ＲＡＭ、ＲＯＭ等を有し、分光器ユニット１９が接続されると共に、前記試料供給ユニット部１７が中継基板２０を介して接続されている。 FIG. 2 is a block diagram of the quality measuring apparatus 1 according to the present invention. As shown in FIG. 2, the quality measuring apparatus 1 includes a main substrate 15 a as a control device 15, a sample supply unit unit 17, a preamplifier unit 18, a spectroscope unit 19, and the like. It is disposed at a predetermined position. The main substrate 15a has a CPU, RAM, ROM, etc. (not shown), to which a spectroscope unit 19 is connected, and the sample supply unit 17 is connected via a relay substrate 20.
　また、メイン基板１５ａには、前記フォトダイオード１０とサーミスタ１２がプリアンプユニット１８のプリアンプ基板１８ａを介して接続されると共に、前記ヒータ１１が直接接続されている。また、試料供給ユニット部１７は、前記中継基板２０と、インペラ位置検出用のフォトマイクロセンサ１６ａと、試料排出シャッタ開検出用のフォトマイクロセンサ１６ｂ及び試料排出シャッタ閉検出用のフォトマイクロセンサ１６ｃと、光路長センサ基板２１と、前記ステッピングモータ６と、アクチュエータ１４等を有している。 The photodiode 10 and the thermistor 12 are connected to the main substrate 15a via the preamplifier substrate 18a of the preamplifier unit 18, and the heater 11 is directly connected to the main substrate 15a. The sample supply unit 17 includes the relay substrate 20, a photomicrosensor 16a for detecting the impeller position, a photomicrosensor 16b for detecting the sample discharge shutter, and a photomicrosensor 16c for detecting the sample discharge shutter closed. The optical path length sensor substrate 21, the stepping motor 6, and the actuator 14 are included.
　なお、光路長センサ基板２１は、図示しない光路長アクチュエータの例えば１０ｍｍ、２０ｍｍ、２５ｍｍ、３０ｍｍ、３５ｍｍの５つの光路長位置を検出するための５個のフォトマイクロセンサ２１ａを有し、これが中継基板２０に接続されている。なお、前記インペラ４を回転させるステッピングモータ６と、光路長調整部材１３を移動させるアクチュエータ１４は、モータドライバ６ａ、１４ａを介してメイン基板１５ａに接続されている。 The optical path length sensor substrate 21 has five photomicrosensors 21a for detecting five optical path length positions of, for example, 10 mm, 20 mm, 25 mm, 30 mm, and 35 mm of an optical path length actuator (not shown). 20 is connected. The stepping motor 6 that rotates the impeller 4 and the actuator 14 that moves the optical path length adjusting member 13 are connected to the main board 15a via motor drivers 6a and 14a.
　前記分光器ユニット１９は、回折格子を回転させるステッピングモータ２２と、回折格子用のロータリーエンコーダ２３と、波長校正フィルタ切替用の２個のフォトマイクロセンサ２４ａとソレノイド２４ｂ等を有し、ステッピングモータ２２は、モータドライバ２２ａを介してメイン基板１５ａに接続され、各フォトマイクロセンサ２４ａ及びソレノイド２４ｂはメイン基板１５ａに直接接続されている。 The spectroscope unit 19 includes a stepping motor 22 for rotating the diffraction grating, a rotary encoder 23 for the diffraction grating, two photomicrosensors 24a for switching the wavelength calibration filter, a solenoid 24b, and the like. Are connected to the main board 15a via a motor driver 22a, and each photomicrosensor 24a and solenoid 24b are directly connected to the main board 15a.
　なお、メイン基板１５ａには、測定結果を印字するプリンタ２５、各種出力端子を有するリアパネル基板２６、ＤＣファン２７、試料回収皿８の開閉状態を検出する検出センサ２８等が接続されている。また、図２における符号３０は電源部、３１はフロントパネル基板、３２ａは室内用サーミスタ、３２ｂは室外用サーミスタ、３３はブザー基板、３４はＢｌｕｅｔｏｏｔｈ（登録商標）基板、３５はＤＣファン３５ａとハロゲンランプ３５ｂを有するリアユニット、３６は試料排出用基板である。なお、このブロック構成図は一例であって、同等の作用効果が得られる適宜のブロック構成図を採用することができる。 The main board 15a is connected to a printer 25 for printing measurement results, a rear panel board 26 having various output terminals, a DC fan 27, a detection sensor 28 for detecting the open / closed state of the sample collection tray 8, and the like. 2, reference numeral 30 denotes a power supply unit, 31 denotes a front panel board, 32a denotes an indoor thermistor, 32b denotes an outdoor thermistor, 33 denotes a buzzer board, 34 denotes a Bluetooth (registered trademark) board, and 35 denotes a DC fan 35a and a halogen. A rear unit 36 having a lamp 35b is a sample discharge substrate. Note that this block configuration diagram is an example, and an appropriate block configuration diagram that can obtain an equivalent effect can be adopted.
　次に、このように構成された品質測定装置１の測定動作の一例を、図３のフローチャートに基づいて説明する。先ず、試料の種類等の測定産物が設定（Ｋ０１）されると、測定が開始（Ｋ０２）され、光路長Ｌが変更（Ｋ０３）される。この光路長Ｌの変更は、測定産物の形態に応じて設定してある１０ｍｍ～３５ｍｍの５段階の光路長Ｌのうちの一つが選択され、それに応じて光路長調整部材１３が、例えば図１の位置から図４に示す位置まで移動して、光路長Ｌが短く（もしくは長く）なるように設定される。なお、本発明で取り扱う「穀粒の形態」としては、穀粒の種類、水分値等の状態、産地や銘柄（品種）、収穫年度等があげられる。 Next, an example of the measurement operation of the quality measuring apparatus 1 configured as described above will be described based on the flowchart of FIG. First, when a measurement product such as a sample type is set (K01), measurement is started (K02), and the optical path length L is changed (K03). For changing the optical path length L, one of five optical path lengths L of 10 mm to 35 mm set in accordance with the form of the measurement product is selected, and the optical path length adjusting member 13 is changed by the optical path length adjusting member 13 according to FIG. The optical path length L is set to be short (or long) by moving from this position to the position shown in FIG. The “grain form” handled in the present invention includes the type of grain, the state of moisture value, the production area, brand (variety), harvest year, and the like.
　光路長Ｌが変更されると前記試料回収皿８（ドロワ）がセットされている否か等をチェック（Ｋ０４）し、ホッパ３のシャッタを開閉（Ｋ０５）し、ゲインを変更（Ｋ０６）してリファレンス（Ｋ０７）する。その後ゲインを変更（Ｋ０８）して、測定用近赤外線の波長を校正（Ｋ０９）する。このＫ０５～Ｋ０９によりリファレンスが実行される。 When the optical path length L is changed, whether or not the sample collection tray 8 (drawer) is set is checked (K04), the shutter of the hopper 3 is opened and closed (K05), and the gain is changed (K06). Reference (K07). Thereafter, the gain is changed (K08), and the wavelength of the near infrared ray for measurement is calibrated (K09). Reference is executed by K05 to K09.
　そして、ステッピングモータ６を回転させてインペラ４を動作（Ｋ１０）させる。インペラ４が動作すると、試料検出センサが試料を検出（Ｋ１１）し、ゲインが変更（Ｋ１２）され、スペクトルを取得（Ｋ１３）する。試料のスペクトルが取得されたら、ホッパ３のシャッタを開（Ｋ１４）とし、インペラ４を動作（Ｋ１５）させ、シャッタを閉じる（Ｋ１６）。このＫ１０～Ｋ１６で試料（サンプル）が測定される。 Then, the stepping motor 6 is rotated to operate the impeller 4 (K10). When the impeller 4 is operated, the sample detection sensor detects the sample (K11), the gain is changed (K12), and the spectrum is acquired (K13). When the spectrum of the sample is acquired, the shutter of the hopper 3 is opened (K14), the impeller 4 is operated (K15), and the shutter is closed (K16). A sample (sample) is measured at K10 to K16.
　次に、測定したデータから推定値を計算（Ｋ１７）し、その結果を印字（Ｋ１８）すると共にＳＤカードに保存（Ｋ１９）する。このＫ１７～Ｋ１９でデータ処理が行われる。そして、シャッタを開（Ｋ２０）にして、インペラ４を動作（Ｋ２１）させ、シャッタを閉（Ｋ２２）にすることで、測定後の試料を試料回収皿に排出（回収）し、試料の測定が終了（Ｋ２３）する。 Next, an estimated value is calculated from the measured data (K17), and the result is printed (K18) and stored in the SD card (K19). Data processing is performed in K17 to K19. Then, the shutter is opened (K20), the impeller 4 is operated (K21), and the shutter is closed (K22), whereby the sample after measurement is discharged (collected) to the sample collection dish, and the measurement of the sample is performed. End (K23).
　すなわち、前記品質測定装置１の場合、制御装置１５の制御信号でステッピングモータ６の回転数を制御（可変）できることから、前記工程Ｋ１０、すなわち試料測定時においてインペラ４の回転数が、試料の形態に応じた最適な回転数に設定されることになる。その結果、試料の水分が高く粘性を有する場合には、例えばインペラ４の回転数を低くし、乾燥した試料の場合には、回転数を高くすることで、インペラ４から排出されて試料測定部７に充填される試料の密度が均一化される。つまり、品質測定装置１がインペラの回転速度可変供給機能を具備していることになる。 That is, in the case of the quality measuring device 1, since the rotational speed of the stepping motor 6 can be controlled (variable) by the control signal of the control device 15, the rotational speed of the impeller 4 in the step K10, that is, at the time of sample measurement, Is set to an optimum number of revolutions according to. As a result, when the water content of the sample is high and viscous, for example, the rotation speed of the impeller 4 is lowered, and in the case of a dried sample, the rotation speed is increased, so that the sample measurement unit is discharged from the impeller 4. The density of the sample filled in 7 is made uniform. That is, the quality measuring device 1 has a function of supplying a variable speed of the impeller.
　また、アクチュエータ１４の作動で光路長が５段階に変更できることから、工程Ｋ０３において、試料の形態に応じて最適な光路長に設定できる、つまり、光路長変更機能を具備していることになる。さらに、フォトダイオード１０を加温可能なヒータ１１と、フォトダイオード１０周辺の温度を検出するサーミスタ１２等を備えることから、ヒータ１１を作動させることで、フォトダイオード１０周辺の温度（雰囲気温度）を、例えば試料のタンパク質を測定する場合に最適な温度に設定、つまりヒータ１１による加温でフォトダイオード１０周辺の温度を常に一定に維持する恒温機能を具備していることになる。 Further, since the optical path length can be changed in five stages by the operation of the actuator 14, in step K03, an optimal optical path length can be set according to the form of the sample, that is, an optical path length changing function is provided. Further, since the heater 11 capable of heating the photodiode 10 and the thermistor 12 for detecting the temperature around the photodiode 10 are provided, the heater 11 is operated to change the temperature around the photodiode 10 (atmosphere temperature). For example, when the protein of the sample is measured, the temperature is set to an optimum temperature, that is, the temperature around the photodiode 10 is always kept constant by heating by the heater 11.
　このように、前記品質測定装置１によれば、ホッパ３内に投入されインペラ４で回転搬送された試料が試料測定部７に所定量収容充填され、この試料を測定手段としてのモノクロメータによる赤外分析で光学的に測定する際に、試料測定部７の光路長Ｌが制御装置１５で試料に応じた所定長さに調整されるため、測定すべき試料の形態に対応して従来のように光路長変更部品の一々交換等をすることなく自動的に調整変更できて、試料の測定誤差を均一化し試料の品質を精度良く測定することができると共に、測定作業自体を効率的に行うことが可能になる。 As described above, according to the quality measuring apparatus 1, a predetermined amount of the sample put into the hopper 3 and rotated and conveyed by the impeller 4 is accommodated and filled in the sample measuring unit 7, and the sample is red by a monochromator as a measuring unit. When optically measuring by external analysis, the optical path length L of the sample measuring unit 7 is adjusted to a predetermined length according to the sample by the control device 15, so that the conventional method corresponding to the form of the sample to be measured is used. In addition, it is possible to automatically adjust and change without changing each optical path length changing part, to make the measurement error of the sample uniform and to measure the quality of the sample with high accuracy, and to perform the measurement work itself efficiently. Is possible.
　また、測定手段による測定が、光源及び受光素子、第１及び第２のミラー、回折格子、及び出口スリットを有するモノクロメータ構造を利用して行われるため、従来のポリクロメータ構造に比較して試料の測定精度を大幅に向上させることができる。さらに、光路長調整部材１３用のアクチュエータ１４の位置を制御装置１５で制御することにより、光路長Ｌを変更できると共に、光路長Ｌを例えば１０～３５ｍｍの範囲において５段階に設定可能であるため、各種形態の試料の品質測定を効率的かつ正確に行うことが可能になる。 Further, since the measurement by the measuring means is performed using a monochromator structure having a light source and a light receiving element, first and second mirrors, a diffraction grating, and an exit slit, the sample is compared with a conventional polychromator structure. The measurement accuracy can be greatly improved. Furthermore, by controlling the position of the actuator 14 for the optical path length adjusting member 13 by the control device 15, the optical path length L can be changed, and the optical path length L can be set in five steps within a range of 10 to 35 mm, for example. It becomes possible to efficiently and accurately measure the quality of various forms of samples.
　また、前記品質測定装置１の場合、試料の種類等に応じてインペラ４の回転速度が制御装置１５で制御可能に構成されているため、測定すべき試料の形態に対応してインペラ４の回転速度を最適に設定して、試料の形態に影響されることなく、各種形態の試料を試料測定部７内に均一充填して、試料の品質の安定した測定結果を容易に得ることができる。 In the case of the quality measuring apparatus 1, the rotation speed of the impeller 4 can be controlled by the control device 15 in accordance with the type of the sample and the like, so that the rotation of the impeller 4 corresponds to the form of the sample to be measured. The speed is set optimally, and various types of samples are uniformly filled in the sample measuring unit 7 without being affected by the sample form, and a measurement result with a stable sample quality can be easily obtained.
　さらに、品質測定装置１が恒温維持機能を有するため、制御装置１５によりフォトダイオード１０周辺の温度を検出し該検出温度に基づいてヒータ１１を作動させてフォトダイオード周辺の温度を一定化させることができて、特に試料のタンパク質を測定する場合等に、フォトダイオード１０の温度を最適温度として、タンパク質を精度良く検出（測定）することができる。 Furthermore, since the quality measuring device 1 has a constant temperature maintaining function, the temperature around the photodiode 10 is detected by the control device 15 and the heater 11 is operated based on the detected temperature to make the temperature around the photodiode constant. In particular, the protein can be detected (measured) with high accuracy using the temperature of the photodiode 10 as the optimum temperature, particularly when measuring the protein of the sample.
　なお、前記実施形態における、光路長調整部材の形態や配置位置及びその移動調整方法、光路長Ｌの種類、ブロック図の構成、使用する部品等は、一例であって、例えば光路長Ｌを５段階だけではなく、種類の少ない穀粒の場合は、２～４段階等の複数段階に設定することができる等、本発明に係わる各発明の要旨を逸脱しない範囲において適宜に変更することができる。 In addition, the form and arrangement position of the optical path length adjusting member, the movement adjusting method, the type of the optical path length L, the configuration of the block diagram, the parts to be used, and the like in the embodiment are merely examples, and the optical path length L is set to 5 for example. Not only the stage but also the grains with few types can be appropriately changed within a range not departing from the gist of each invention according to the present invention, such as being able to set a plurality of stages such as 2 to 4 stages. .
　本発明は、穀粒のタンパク質の測定に限らず、各種の内部品質の測定にも利用できる。 The present invention can be used not only for measuring protein of grains but also for measuring various internal qualities.
　１・・・・・・・・・品質測定装置
　２・・・・・・・・・筺体
　３・・・・・・・・・ホッパ
　４・・・・・・・・・インペラ
　４ａ・・・・・・・・ケース
　４ｂ・・・・・・・・回転軸
　４ｃ・・・・・・・・羽根
　５・・・・・・・・・ソレノイド
　６・・・・・・・・・ステッピングモータ
　７・・・・・・・・・試料測定部
　１０・・・・・・・・フォトダイオード
　１１・・・・・・・・ヒータ
　１２・・・・・・・・サーミスタ
　１３・・・・・・・・光路長調整部材
　１４・・・・・・・・アクチュエータ
　１５・・・・・・・・制御装置
　１５ａ・・・・・・・メイン基板
　１９・・・・・・・・分光器ユニット
　２１・・・・・・・・光路長センサ基板
　２５・・・・・・・・プリンタ
　Ｌ・・・・・・・・・光路長 DESCRIPTION OF SYMBOLS 1 ..... Quality measuring device 2 ..... Housing 3 ....... Hopper 4 ....... Impeller 4a ... ... Case 4b ... Rotary shaft 4c ... Blade 5 ... Solenoid 6 ... Stepping motor 7 ······································ 10 ... Optical path length adjusting member 14 ... Actuator 15 ... Control device 15a ... Main board 19 ... Spectrometer unit 21 ... Optical path length sensor board 25 ... Printer L ... Optical path length

Claims (3)

  1. 　筐体の上部に設けられて穀粒が投入されるホッパと、該ホッパ内に投入された穀粒をその回転により搬送するインペラと、該インペラの下方に配設され所定量の穀粒が収容可能な試料測定部と、該試料測定部内の穀粒の品質を光学的に測定する測定手段と、前記ホッパに投入される穀粒の形態に応じて前記測定手段による透過光の光路長を調整可能な制御装置と、を備えることを特徴とする穀粒の品質測定装置。 A hopper provided in the upper part of the housing and into which the grain is thrown, an impeller that conveys the grain thrown into the hopper by its rotation, and a predetermined amount of grain that is disposed below the impeller and accommodates a predetermined amount of grain Possible sample measuring unit, measuring unit for optically measuring the quality of the grain in the sample measuring unit, and adjusting the optical path length of the transmitted light by the measuring unit according to the form of the grain put into the hopper A grain quality measuring device, comprising:
  2. 　前記測定手段は、光源及び受光素子、第１ミラー及び第２ミラー、回折格子、及び出口スリットを有するモノクロメータ構造であることを特徴とする請求項１に記載の穀粒の品質測定装置。 The grain quality measuring apparatus according to claim 1, wherein the measuring means has a monochromator structure having a light source and a light receiving element, a first mirror and a second mirror, a diffraction grating, and an exit slit.
  3. 　前記光路長は、光路長調整部材の電動による位置調整で行われることを特徴とする請求項１または２に記載の穀粒の品質測定装置。 3. The grain quality measuring apparatus according to claim 1 or 2, wherein the optical path length is obtained by electric position adjustment of an optical path length adjusting member.
PCT/JP2017/030748 2016-08-30 2017-08-28 Device for measuring the quality of grains WO2018043403A1 (en)

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JPH06288907A (en) * 1993-03-31 1994-10-18 Shizuoka Seiki Co Ltd Evaluation of quality of unhulled rice
JPH06300689A (en) * 1993-04-14 1994-10-28 Mitsui Mining & Smelting Co Ltd Interior quality measuring method for unripe fruit by transmission method
JPH0712719A (en) * 1993-06-28 1995-01-17 Kubota Corp Spectral analysis device
JPH08285763A (en) * 1995-04-18 1996-11-01 Iseki & Co Ltd Near infrared spectroscopic analyzer

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CN109154559A (en) 2019-01-04

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