WO2018001347A1 - 边缘曝光装置和方法 - Google Patents

边缘曝光装置和方法 Download PDF

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Publication number
WO2018001347A1
WO2018001347A1 PCT/CN2017/091008 CN2017091008W WO2018001347A1 WO 2018001347 A1 WO2018001347 A1 WO 2018001347A1 CN 2017091008 W CN2017091008 W CN 2017091008W WO 2018001347 A1 WO2018001347 A1 WO 2018001347A1
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WIPO (PCT)
Prior art keywords
exposure
silicon wafer
edge
edge exposure
unit
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PCT/CN2017/091008
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English (en)
French (fr)
Inventor
杨金国
唐文力
王刚
郎新科
郑教增
Original Assignee
上海微电子装备（集团）股份有限公司
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Priority to JP2018568682A priority Critical patent/JP6810170B2/ja
Priority to KR1020197002150A priority patent/KR102177237B1/ko
Priority to SG11201811752WA priority patent/SG11201811752WA/en
Priority to US16/314,199 priority patent/US10782614B2/en
Publication of WO2018001347A1 publication Critical patent/WO2018001347A1/zh

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67742—Mechanical parts of transfer devices
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20—Exposure; Apparatus therefor
    • G03F7/2022—Multi-step exposure, e.g. hybrid; backside exposure; blanket exposure, e.g. for image reversal; edge exposure, e.g. for edge bead removal; corrective exposure
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20—Exposure; Apparatus therefor
    • G03F7/2022—Multi-step exposure, e.g. hybrid; backside exposure; blanket exposure, e.g. for image reversal; edge exposure, e.g. for edge bead removal; corrective exposure
    • G03F7/2026—Multi-step exposure, e.g. hybrid; backside exposure; blanket exposure, e.g. for image reversal; edge exposure, e.g. for edge bead removal; corrective exposure for the removal of unwanted material, e.g. image or background correction
    • G03F7/2028—Multi-step exposure, e.g. hybrid; backside exposure; blanket exposure, e.g. for image reversal; edge exposure, e.g. for edge bead removal; corrective exposure for the removal of unwanted material, e.g. image or background correction of an edge bead on wafers
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216—Mask projection systems
    • G03F7/70275—Multiple projection paths, e.g. array of projection systems, microlens projection systems or tandem projection systems
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691—Handling of masks or workpieces
    • G03F7/70775—Position control, e.g. interferometers or encoders for determining the stage position
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7003—Alignment type or strategy, e.g. leveling, global alignment
    • G03F9/7007—Alignment other than original with workpiece
    • G03F9/7011—Pre-exposure scan; original with original holder alignment; Prealignment, i.e. workpiece with workpiece holder
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7003—Alignment type or strategy, e.g. leveling, global alignment
    • G03F9/7046—Strategy, e.g. mark, sensor or wavelength selection
    • H—ELECTRICITY
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    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
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    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/67207—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
    • H01L21/67225—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process comprising at least one lithography chamber
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    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67276—Production flow monitoring, e.g. for increasing throughput
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    • H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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    • H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
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    • H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • H01L21/681—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment using optical controlling means
    • H—ELECTRICITY
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    • H01L21/682—Mask-wafer alignment
    • H—ELECTRICITY
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    • H—ELECTRICITY
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    • H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68785—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support

Definitions

  • the present invention relates to the field of exposure, and in particular to an edge exposure apparatus and method.
  • Electroplating is one of the most important processes for IC circuit post-packaging. It uses the edge of the silicon wafer as the anode, the plating window in the middle of the silicon wafer as the cathode, and then adds a certain DC working voltage between the anode and the cathode, by controlling the current and plating. The concentration of the plating solution in the bath controls the height of the metal bumps formed by the plating.
  • the width of the edge is determined by the width of the Wafer Edge Exclusion (WEE) process.
  • WEE Wafer Edge Exclusion
  • the chemical de-edge method is to eliminate the edge of the silicon wafer by spraying solvent on the edge of the silicon wafer during the process of coating the silicon wafer.
  • the disadvantages of the method are long de-edge time, high cost of solvent consumables and easy spraying of the solvent onto the silicon wafer.
  • the middle graphics area seriously affects the graphics quality.
  • the edge exposure method is to vacuum-adsorb the silicon wafer on the rotating platform, and fix a set of ultraviolet exposure lens above the edge of the silicon wafer to generate a uniform illumination spot of a certain size, and then use the rotation of the rotary table to realize the edge exposure of the silicon wafer.
  • the edge exposure method has the advantages of high production efficiency, low device cost, and easy process control.
  • the silicon wafer is first pre-aligned because the position where the silicon wafer is transferred to the pre-alignment system is random and there is a position error.
  • the purpose of pre-alignment is to adjust these deviations to complete the centering of the silicon wafer and the orientation of the gap.
  • the centering is to move the core of the silicon wafer to the core of the rotating table to make the two coincide.
  • Orientation is to rotate the notch of the silicon wafer to a specified position, thus ensuring that the silicon wafer can be transmitted in a fixed posture.
  • Pre-alignment is a precise positioning before the edge of the wafer is exposed, and its positioning accuracy directly affects the working efficiency of the entire wafer processing apparatus.
  • the requirements for pre-alignment and edge exposure are getting higher and higher, and the degree of automation is getting higher and higher.
  • pre-alignment function it is not only required to complete pre-alignment of various types of process sheets, such as through-hole sheets, warps, ultra-thin sheets, etc., but also requires simultaneous processing of 8/12-inch wafers.
  • edge exposure function not only the edge exposure, ring exposure, segmentation exposure, linear exposure and other exposure modes are required, but also the exposure field of view and the exposure energy monitoring function are required. At the same time, the cost of the silicon wafer processing apparatus is required to be lower and lower.
  • wafer pre-alignment and wafer edge exposure are usually completed by two sets of devices, requiring two independent control systems, occupying a large space, and controlling more objects, and simultaneously implementing the switching axis.
  • Control of the motion axes such as the rotating shaft, the lifting shaft, and the centering shaft, the pre-alignment method is cumbersome, the system design is complicated, the energy consumption is large, and the cost is high.
  • the present invention provides an edge exposure apparatus and method which is compact in structure, can realize wafer pre-alignment and edge exposure, and has high production efficiency.
  • the present invention provides an edge exposure apparatus comprising: a whole machine frame; an edge exposure unit for edge exposure of the silicon wafer mounted on the frame of the whole machine; for centering the silicon wafer a pre-alignment unit that orients and cooperates with the edge exposure unit to perform an edge exposure operation; a library unit for storing and detecting a silicon wafer; a robot for wafer handling; and a main control unit for controlling the above components Wherein the edge exposure unit shares a work table with the pre-alignment unit.
  • the edge exposure unit comprises: a light source disposed in a light propagation direction, an optical fiber, a light homogenizing unit, and an exposure assembly.
  • the exposure component comprises:
  • a motion switching adjustment mechanism having a movement degree of freedom in the horizontal X-axis and the Y-axis;
  • An absolute light intensity detecting mechanism is mounted on the motion switching adjustment mechanism for performing a proofreading test on the light intensity of the exposed area;
  • An exposure metering detecting mechanism is mounted on the motion switching adjustment mechanism to achieve exposure during exposure Illumination monitoring;
  • the motion switching adjustment mechanism is used for switching between the exposure station and the pre-alignment station of the silicon wafer and the linear motion of the silicon wafer.
  • the motion switching adjustment mechanism comprises: a motion module mounting component, a plane motion module mounted on the motion module mounting component, a motion drag chain component and a module adapter respectively connected to the plane motion module a plate on which the exposure lens is mounted, the module adapter plate having a degree of freedom of movement of the horizontal X-axis and the Y-axis.
  • the absolute light intensity detecting mechanism comprises: a cylinder adapter, a switching cylinder, a sensor mounting component and a light intensity detecting sensor, wherein the switching cylinder is connected to the motion module mounting component through the cylinder adapter, The light intensity detecting sensor is coupled to the switching cylinder through the sensor mount and aligned with a field of view of the exposure lens.
  • the exposure measurement detecting mechanism comprises: an adjustment mounting plate, a pinhole, a filter and an illuminance detecting sensor, wherein the illuminance detecting sensor is fixed on the module transfer plate by the adjusting mounting plate, the pin A hole and a filter are mounted between the adjustment mounting plate and the illuminance detecting sensor.
  • the diaphragm switching mechanism comprises a linear motion module fixedly connected to the module adapter plate, a guiding block disposed on the linear motion module, and a mask diaphragm connected to the guiding block, the mask light
  • the crucible is located on the exposure lens.
  • the pre-alignment unit comprises: a mechanical vision system, a rotary table, and a centering orientation structure, wherein the rotary table is located on the centering alignment structure for carrying a silicon wafer, the mechanical vision system The position corresponds to the rotary table.
  • the edge exposure unit and the pre-alignment unit are respectively provided with two groups.
  • the present invention also provides an edge exposure method using the above-described edge exposure apparatus, comprising: a robot taking a silicon wafer from a library unit and placing it into a pre-alignment unit; the pre-alignment unit centering and orienting the silicon wafer
  • the edge exposure device performs edge exposure on the centered and oriented silicon wafers; the silicon wafer after the exposure is removed.
  • the step of centering and orienting the silicon wafer by the pre-alignment unit comprises:
  • the silicon wafer is adjusted to compensate for the offset of the silicon core.
  • the edge exposure device collects the residual light of the edge exposure, accumulates the actual exposure dose on the silicon wafer surface, and determines whether the current wafer exposure is There is a problem, if there is a problem, it will alarm.
  • the present invention has the following advantages:
  • the invention can realize a certain width of ring exposure, edge exposure, segmentation exposure, and linear exposure to a specific area on the edge of the silicon wafer, and the exposed line width can be automatically adjusted online.
  • the edge exposure unit of the invention can be compatible with 8 to 12 inch silicon wafers, and can freely switch 8 to 12 inch silicon wafer exposure stations;
  • the invention configures real-time exposure dose monitoring and online light source intensity detection system, so that online detection and real-time monitoring are compatible;
  • the pre-aligned unit and the edge exposure unit provided by the invention share a work table (pre-alignment table/exposure table), and the structure is compact;
  • the pre-alignment unit and the edge exposure unit of the present invention are respectively provided with two groups, and the production efficiency is high.
  • FIG. 1 is a schematic structural view of an edge exposure apparatus according to an embodiment of the present invention.
  • FIG. 2 is a schematic structural view of a pre-alignment unit according to an embodiment of the present invention.
  • FIG. 3 is a schematic structural view of an edge exposure unit according to an embodiment of the present invention.
  • FIG. 4 is a schematic structural view of an exposure assembly according to an embodiment of the present invention.
  • FIG. 5 is a schematic structural diagram of a motion switching adjustment mechanism according to an embodiment of the present invention.
  • FIG. 6 is a schematic structural view of an absolute light intensity detecting mechanism according to an embodiment of the present invention.
  • FIG. 7 is a schematic structural view of an exposure measurement detecting mechanism according to an embodiment of the present invention.
  • FIG. 8 is a schematic diagram showing the vertical distribution of the edge exposure device according to an embodiment of the present invention.
  • FIG. 9 is a schematic structural view of a diaphragm switching mechanism according to an embodiment of the present invention.
  • FIG. 10 is a schematic view showing an edge exposure apparatus exposed during an embodiment of the present invention.
  • FIG. 11 is a schematic diagram showing a vertical overall layout of an edge exposure apparatus in operation according to an embodiment of the present invention.
  • FIG. 12 is a schematic diagram showing a horizontal overall layout of an edge exposure apparatus in operation according to an embodiment of the present invention.
  • FIG. 13 is a schematic diagram of an edge exposure mode of a silicon wafer according to an embodiment of the present invention.
  • FIG. 14 is a schematic view showing a ring exposure mode of a silicon wafer according to an embodiment of the present invention.
  • FIG. 15 is a schematic diagram showing a segment exposure mode of a silicon wafer according to an embodiment of the present invention.
  • 16 is a schematic view showing a linear exposure mode of a silicon wafer according to an embodiment of the present invention.
  • 17 is a schematic diagram of a method for pre-aligning a silicon wafer of an edge exposure apparatus according to an embodiment of the present invention.
  • FIG. 18 is a flow chart of pre-alignment of an edge exposure apparatus according to an embodiment of the present invention.
  • Figure 19 is a flow chart of edge exposure in accordance with an embodiment of the present invention.
  • the present invention provides an edge exposure apparatus comprising: a whole machine frame 1 , an edge exposure unit 2 for edge exposure of a silicon wafer mounted on the whole machine frame 1 ; a pre-alignment unit 3 that centers, aligns, and cooperates with the edge exposure unit 2 to perform an edge exposure operation; a magazine unit 4 for storing and detecting a silicon wafer; a robot 5 for wafer handling; and an edge
  • Each of the exposure devices a main control unit 6 of the working unit; wherein the edge exposure unit 2 and the pre-alignment unit 3 are respectively provided with two groups, and the edge exposure unit 2 shares the work table with the pre-alignment unit 3, that is, It is said that the pre-alignment stage used by the pre-alignment unit 3 and the exposure stage used by the edge exposure unit 2 are the same worktable, and the structure is compact and the production efficiency is high.
  • the whole machine frame 1 comprises a protective frame assembly, a protective panel assembly mounted on the protective frame assembly, and an inner connecting plate assembly; wherein the protective frame assembly provides a fixed supporting foundation for the whole machine protective installation, the protective frame
  • the components and the protective panel assembly form a complete whole machine protection module, and provide protection, support and maintenance functions for the whole machine and related subsystems.
  • the main control unit 6 is responsible for controlling the electrical control of each unit such as the robot 5, the pre-alignment unit 3, the edge exposure unit 2, and the library unit 4.
  • the main control unit 6 includes a console and a computer system unit, and the computer system provides two local/remote control modes.
  • the user can operate and control the edge exposure device through the local console user interface, or remotely access and control via Ethernet connection to the factory interface.
  • the control of the whole machine beacon and fault buzzer is realized by a combination of software and hardware.
  • Computer system provides the hardware control interface required for software control
  • the edge exposure apparatus further includes a power supply unit 7, which mainly supplies working power to each of the working units, and provides a separate leakage current protector to protect the whole machine to the utmost extent.
  • a power supply unit 7 which mainly supplies working power to each of the working units, and provides a separate leakage current protector to protect the whole machine to the utmost extent. The stability of the basic environment.
  • the pre-alignment unit 3 is responsible for centering, orienting, and cooperating with the edge exposure unit to complete the edge exposure operation, which specifically includes a mechanical vision system 31, a rotary table 32, and a centering alignment structure 33.
  • the mechanical vision system 31 uses an LED light source and a linear array CCD to scan and sample the circumferential edge of the silicon wafer, fit the core of the silicon wafer, and perform coarse positioning and fine sampling on the gap of the silicon wafer to fit the center of the gap.
  • the rotary table 32 is for vacuum-adsorbing a silicon wafer, and the centering alignment structure 33 has degrees of freedom in a horizontal X direction, a vertical Z direction, and an Rz direction (rotation in the Z direction), the rotating table 32 and the centering
  • the orientation mechanism 33 cooperates to rotate the notch of the silicon wafer to a specified position while compensating for the offset of the core of the silicon wafer from the core of the rotary table 32.
  • the edge exposure unit 2 mainly includes a light source 21, an optical fiber 22, a light homogenizing unit 23, and an exposure assembly 24 disposed along a light propagation direction.
  • the function of the light source 21 is to provide light having the wavelength required for the edge exposure of the silicon wafer and the intensity of the illumination light.
  • the power of the light source is adjusted by the controller to meet the illumination requirement of the silicon surface, and the numerical aperture of the output light is matched.
  • the numerical aperture of the fiber 22 is followed.
  • the light source 21 mainly emits wavelengths of 365 nm, 405 nm, and 436 nm.
  • the optical fiber 22 is used to collect and transmit light of a certain angle and energy output by the light source.
  • the light homogenizing unit 23 functions as a homogenizing light to ensure that the spot light energy of the silicon wafer is uniformly distributed.
  • the present invention uses a quartz rod as the light homogenizing unit 23.
  • the exposure assembly 24 images the illumination field of view into the desired area of the silicon wafer surface to achieve exposure of the wafer edge.
  • the exposure assembly 24 includes: a motion switching adjustment mechanism 200 for station switching and linear motion, an exposure lens 100 mounted on the motion switching adjustment mechanism 200, an absolute light intensity detecting mechanism 300, The exposure measuring mechanism 400 and the diaphragm switching mechanism 500 are exposed.
  • the motion switching adjustment mechanism 200 is configured to implement station switching and linear motion, and mainly includes: a motion module mounting component 204, a plane motion module 202 mounted on the motion module mounting component 204, The moving towline assembly 203 and the module adapter plate 201 respectively connected to the planar motion module 202 are mounted on the module adapter plate 201.
  • the module adapter plate 201 is driven by the planar motion module 202 to have a degree of freedom of movement in the horizontal X-axis and the Y-axis. Specifically, the planar motion module 202 drives the module adapter plate 201 to move in a large stroke in the X direction, so that the exposure station of different specifications of the silicon wafer can be switched, and the planar motion module 202 drives the module adapter plate 201 along the Y. The direction of the large stroke movement, to achieve the flat edge of the silicon and linear exposure movement.
  • the planar motion module 202 pushes the exposure lens 100 along the X direction to the designated station; and when linear exposure is required, The Y direction is pushed to the specified linear exposure start position and then the exposure motion is performed along the Y axis.
  • the absolute light intensity detecting mechanism 300 includes a cylinder adapter 304, a switching cylinder 303, a sensor mounting member 302, and a light intensity detecting sensor 301, and the switching cylinder 303 passes through the cylinder adapter 304.
  • the light intensity detecting sensor Connected to the motion module mounting assembly 204, the light intensity detecting sensor The sensor 301 is coupled to the switching cylinder 303 through the sensor mount 302 and aligned with the field of view of the exposure lens 100.
  • the light intensity detecting sensor 301 can realize the X-direction linear distance switching with the switching cylinder 303.
  • the plane motion module 202 pushes the exposure lens 100 to the designated position, the diaphragm switching mechanism 500 pushes the mask diaphragm to the maximum field of view station, and then switches the cylinder 303 to the light intensity detecting sensor 301. Pushing along the X-axis to the exposed area of the wafer, the light intensity is proofread. After the detection is completed, the switching cylinder 303 pushes the light intensity detecting sensor 301 to exit the detecting station along the X axis, and the plane motion module 202 pushes the exposure lens 100 back to the exposure station along the X and Y directions.
  • the exposure measurement detecting mechanism 400 includes: an adjustment mounting plate 401, a pinhole 402, a filter 403, and an illuminance detecting sensor 404, and the illuminance detecting sensor 404 is fixed by the adjustment mounting plate 401.
  • the pinhole 402 and the filter 403 are mounted between the adjustment mounting plate 401 and the illuminance detecting sensor 404.
  • the exposure metering detecting mechanism 400 can move along with the exposure lens 100, and can perform small-scale monitoring station adjustment.
  • the horizontal position of the exposure dose detecting station is located between the edge of the silicon wafer and the boundary of the exposure field, so that the exposure can be realized. Monitoring of exposure illuminance during the process.
  • the exposure light detecting mechanism 400 is generally used to check the exposure measuring mechanism 400, and the detection value of the exposure measuring mechanism 400 is compensated for to ensure the validity and stability of the illuminance monitoring, in order to make the light intensity.
  • the detecting station 700 and the wafer exposure station are consistent on the Z axis, and the illuminance detecting sensor 404 is disposed under the light intensity detecting sensor 301. After the light intensity detecting sensor 301 exits along the X axis, the illuminance detecting sensor 404 remains The illuminance detection station is used to achieve compatibility between the two detection methods.
  • the diaphragm switching mechanism 500 includes a linear motion module 503 fixedly coupled to the module adapter plate 201, a guiding block 502 disposed on the linear motion module 503, and a cover connected to the guiding block 502.
  • the mode stop 501 is located on the exposure lens 100.
  • the mask stop 501 has a plurality of aperture projection holes. That is to say, the present invention moves the mask stop 501 along the X axis by the linear motion module 503, adjusts the misalignment gap between the pupil projection and the field of view of the exposure lens 100, constrains the size of the exposure area, and realizes the exposure area. Control, and thus achieve different sizes of exposure areas.
  • the edge exposure apparatus of the present invention can realize the stepless regulation of different types of edge exposure requirements of 8-inch to 12-inch silicon wafers by adjusting and switching the exposure area.
  • a 12-inch silicon wafer is placed on the rotating stage 32, and position detection is performed by the mechanical vision system 31 to ensure that the 12-inch silicon wafer is pre-aligned at the rotating stage 32.
  • the exposure lens 100 is pushed along the X-axis by the planar motion module 202 to the designated 12-inch wafer exposure station 702 to activate the edge exposure system, and the light source is incident perpendicularly to the exposure lens 100 through the optical system.
  • the rotating table 32 is rotated and the edge exposure operation is performed on the 12-inch silicon wafer.
  • the lens field of view 600 of the exposure lens 100 forms an exposed area 603 at the edge of the 12 inch silicon wafer, the exposure area 601 is currently located within the field of view 600 of the lens, and the area 602 to be exposed is not yet completed. After the edge exposure operation is completed, the 12 inch silicon wafer is removed.
  • an 8-inch silicon wafer is placed on the rotary table 32, and the exposure lens 100 is pushed along the X-axis through the planar motion module 202 to reach a designated 8-inch wafer exposure station 701, and the edge exposure system is activated, and the rotary table is simultaneously rotated. 32 is rotated to perform an edge exposure operation on the 8-inch silicon wafer. That is, the station switching operation from the 12-inch wafer exposure station 702 to the 8-inch wafer exposure station 701 is completed.
  • the present invention can realize various exposure modes such as linear exposure, edge exposure, ring exposure, and segmentation exposure.
  • Figure 13 shows the edge exposure mode.
  • the plane motion module 202 is moved along the X axis, and the exposure lens 100 is pushed to control the relative distance between the exposure lens 100 and the edge of the silicon wafer, that is, the width of the edge exposure is adjusted, so that the exposure lens 100 reaches the designated exposure station to realize silicon.
  • the edge of the film is exposed.
  • Fig. 14 shows a ring exposure mode.
  • the exposure lens 100 is pushed by the X-axis motion of the planar motion module 202, and the relative distance between the exposure lens 100 and the center of the wafer is controlled, that is, the position of the circular exposure station is adjusted, so that the exposure lens 100 reaches the designated exposure station, and then
  • the mask diaphragm 501 is moved by the linear motion module 503, and a suitable aperture projection hole is selected, that is, the width of the annular exposure is adjusted to realize the ring exposure of the silicon wafer.
  • Fig. 15 shows the segment exposure mode.
  • the exposure lens 100 is pushed by the X-axis motion of the planar motion module 202, and the relative distance between the exposure lens 100 and the center of the wafer is controlled, that is, the position of the segment exposure station is adjusted, so that the exposure lens 100 reaches the designated exposure station.
  • the mask diaphragm 501 is moved by the linear motion module 503, and a suitable aperture is selected, that is, the width of the segment exposure is adjusted.
  • the rotation angle of the silicon wafer is controlled by the rotary table 32, and the light source is passed through the light source.
  • the controller controls the exposure time to achieve a segmented exposure of the wafer.
  • Fig. 16 shows a linear exposure mode.
  • the exposure lens 100 is respectively pushed to move on the X-axis and the Y-axis, so that the exposure lens 100 reaches the starting position of the linear exposure, and then passes through the linear motion mode.
  • the group 503 moves the mask stop 501, selects a suitable aperture, and adjusts the width of the linear exposure, and then pushes the exposure lens 100 to perform a linear exposure motion on the Y axis through the Y-axis motion of the planar motion module 202.
  • the linear exposure method can also achieve a flat edge exposure process on the edge of the silicon wafer.
  • the illuminance detection station is located between the edge of the wafer and the boundary of the exposure field in the top-down view.
  • the illuminance monitoring of the exposure operation is performed in real time.
  • the invention increases the exposure measurement detecting mechanism 400 which is not provided in the prior art, ensures the normal operation of the exposure operation, and obtains the illumination state of the exposure operation in real time.
  • the module adapter plate 201 adopts a two-step structure. With this structure, the module adapter plate 201 is divided into an upper step plate and a lower step plate. The upper step plate and the lower step plate have a height difference in the vertical direction, and the lower step plate is fixed on the plane motion module 202.
  • the exposure lens 100, the exposure measurement detecting mechanism 400, and the diaphragm switching mechanism 500 are mounted on the upper plate, which simplifies the structure, saves material, and sets the illuminance detecting sensor 404 under the light intensity detecting sensor 301 to make the light intensity detecting device
  • the bit 700 and the wafer exposure station are consistent on the Z axis, and at the same time, the monitoring effect of the illuminance detecting sensor 404 is not affected, and the space is utilized reasonably to facilitate relative movement and exposure operation with the silicon wafer.
  • the present invention further provides an edge exposure method, which specifically includes:
  • the robot 5 takes out the silicon wafer from the magazine unit 4 and places it on the rotary table 32 of the pre-alignment unit 3.
  • the pre-alignment unit 3 centers and orients the silicon wafer.
  • the specific steps are as follows: the mechanical vision system 31 scans and samples the circumferential edge of the silicon wafer to fit the core of the silicon wafer; the mechanical vision system 31 performs initial positioning and fine sampling on the silicon chip gap. , the center position of the notch is fitted; the rotating table 32 rotates the notch to a designated position, where the connection between the silicon core and the center of the notch is parallel to the positive direction of the X-axis, and the silicon core is The offset of the rotating table core is ⁇ x, ⁇ y;
  • the rotating table 32 is moved by the centering orienting mechanism 33 in the Y direction to compensate the offset amount ⁇ y;
  • the robot 5 grabs the silicon wafer and moves it in the X direction to compensate for the offset ⁇ x.
  • the specific method of the robot compensation offset ⁇ x is: sending the offset ⁇ x to the robot 5, and setting the moving distance between the robot 5 and the rotating table 32 (that is, the exposure station) is a constant m. Then, the robot 5 should move to the m+ ⁇ x or m- ⁇ x position to interface with the rotary table 32.
  • the edge exposure unit 2 performs edge exposure on the centered and oriented silicon wafer. After the exposure is completed, the robot removes the exposed silicon wafer. Of course, after the pre-alignment unit completes the pre-alignment, the pre-alignment station That is, on the rotary table 32, the edge exposure operation is directly performed.
  • the wafer begins to be cyclically exposed until the exposure of each segment is completed; of course, during this process, the opening and closing of the exposure controller shutter and the movement of the rotary axis are controlled at the beginning and end of the exposure.
  • the exposure lens moves in steps, the illuminance returns to the pre-exposure state, and the exposure ends.
  • the dose control of the edge exposure is related to the illumination, the scanning speed, the field of view, and the size of the silicon wafer.
  • the relationship between the above main variables is:
  • the size of the silicon wafer is determined; the field of view size l is constant. Only the dose illuminance I (a set of attenuators integrated into the light source can be divided into multiple gears to attenuate the illuminance of the source) and the scanning speed v is a controllable variable.
  • the edge exposure device collects the residual light of the edge exposure, accumulates the actual exposure dose on the silicon wafer surface, and further determines whether there is a problem in the current silicon wafer exposure. If there is a problem, an alarm will be given.
  • the residual light is constant, and the actual dose of exposure is also certain.
  • the dose of each exposure can be actually measured.
  • the software compares the actual dose with the expected dose to determine whether there is a problem with the current wafer exposure. In case of problems, you can call the police in time to minimize production risks.
  • the shutter_on_enable signal is sent at the shutte_on_delay time before the setpoint position.
  • the shutte_on_delay time contains the 3sigma value of the shutter_on.
  • the shutter is the true open state when the setpoint starts to move.
  • the shutter_off_enable is issued after the shutter_on_delay time +moving time-shutter_off_delay time. The signal ensures that the shutter is actually closed after stopping the motion.

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Abstract

一种边缘曝光装置和方法，边缘曝光装置包括：整机框架（1）；安装在整机框架（1）上的用于对硅片进行边缘曝光的边缘曝光单元（2）；用于对硅片定心、定向并配合边缘曝光单元（2）完成边缘曝光操作的预对准单元（3）；用于存储、检测硅片的片库单元（4）；用于硅片搬运的机械手（5）；以及用于边缘曝光装置的各工作单元的主控单元（6）；其中边缘曝光单元（2）与预对准单元（3）共用工作台。预对准单元（3）、边缘曝光单元（2）共用工作台，结构紧凑；预对准单元（3）、边缘曝光单元（2）分别设置有两组，生产效率高。

Description

边缘曝光装置和方法 技术领域
本发明涉及曝光领域，特别涉及一种边缘曝光装置和方法。
背景技术
电镀是IC电路后封装非常重要的工艺之一，其利用硅片的边缘做阳极，硅片中间的电镀窗口做阴极，然后在阴阳两极之间加一定的直流工作电压，通过控制电流大小及电镀槽中电镀液的浓度来控制电镀所形成金属凸块的高度。
由于光刻胶不导电，因此在电镀工艺之前需将硅片边缘的光刻胶去掉，去边宽度大小取决于前道硅片边缘曝光(Wafer Edge Exclusion，WEE)工艺的去边宽度。传统的硅片去边方法很多，但总的归纳起来有两大类：化学去边法和边缘曝光法。化学去边法是在硅片涂胶过程中，通过向硅片边缘喷洒溶剂以消除硅片边缘光刻胶，该方法的缺点是去边时间长、溶剂耗材成本高且溶剂易喷洒到硅片中间图形区域，严重影响图形质量。边缘曝光法是将硅片通过真空吸附在旋转平台上，在硅片边缘上方固定一套紫外曝光镜头以产生一定大小尺寸的均匀照明光斑，然后利用旋转台的旋转来实现硅片边缘曝光。相比化学去边法，边缘曝光法具有生产效率高、装置成本低和过程易于控制等优点。
在边缘曝光过程中，硅片被传输到硅片旋转台上后，首先要对硅片进行预对准处理，这是因为硅片被传输到预对准系统的位置是随机的，存在位置误差，预对准的目的就是要调整这些偏差，完成硅片的定心及缺口的定向。定心就是要把硅片的型心移动到旋转台的型心上，使二者重合，定向就是把硅片的缺口转动到指定位置上，这样就保证硅片能以一个固定的姿态被传输到曝光台上进行曝光。预对准是硅片边缘曝光前的一次精确定位，其定位精度直接影响到整个硅片处理装置的工作效率。
目前市场上对预对准和边缘曝光的要求越来越高，自动化程度越来越高。 针对预对准功能，不仅要求可以完成多种类型工艺片的预对准，如通孔片，翘曲片，超薄片等，还要求同时实现对8/12英寸硅片的处理。针对边缘曝光功能，不仅要求实现边缘曝光，环形曝光、分段曝光、直线曝光等多种曝光方式，还要求实现曝光视场可调和曝光能量监控功能。同时，要求硅片处理装置的成本越来越低。
目前已有的技术中，硅片预对准和硅片边缘曝光通常由两套装置来完成，需要两套独立的控制系统，占用空间大，而且控制的对象较多，需要同时实现对切换轴、旋转轴、升降轴、定心轴等运动轴的控制，预对准方法繁琐、系统设计复杂、能源消耗大，成本也较高。
发明内容
本发明提供一种结构紧凑，可以实现硅片预对准和边缘曝光且生产效率高的边缘曝光装置和方法。
为解决上述技术问题，本发明提供一种边缘曝光装置，包括：整机框架；安装在所述整机框架上的用于对硅片进行边缘曝光的边缘曝光单元；用于对硅片定心、定向并配合所述边缘曝光单元完成边缘曝光操作的预对准单元；用于存储、检测硅片的片库单元；用于硅片搬运的机械手；以及用于控制上述各组件的主控单元；其中所述边缘曝光单元与所述预对准单元共用工作台。
作为优选，所述边缘曝光单元包括：沿光传播方向设置的光源、光纤、匀光单元以及曝光组件。
作为优选，所述曝光组件包括：
运动切换调整机构，具有水平方向X轴和Y轴的移动自由度；
曝光镜头，安装在所述运动切换调整机构上，用于对硅片进行边缘曝光；
绝对光强度检测机构，安装在所述运动切换调整机构上，用于对曝光区域的光强度进行校对检验；
曝光计量检测机构，安装在所述运动切换调整机构上，实现曝光过程中曝 光照度的监控；
以及光阑切换机构，位置与所述曝光镜头对应，
其中，所述运动切换调整机构用于实现硅片在曝光工位与预对准工位的切换以及硅片的直线运动。
作为优选，所述运动切换调整机构包括：运动模组安装组件、安装在运动模组安装组件上的平面运动模组、分别与所述平面运动模组连接的运动拖链组件和模组转接板，所述曝光镜头安装在所述模组转接板上，所述模组转接板具有水平方向X轴和Y轴的移动自由度。
作为优选，所述绝对光强度检测机构包括：气缸转接件、切换气缸、传感器安装件及光强度检测传感器，所述切换气缸通过所述气缸转接件与所述运动模组安装组件连接，所述光强度检测传感器通过所述传感器安装件与所述切换气缸连接，并对准所述曝光镜头的视场。
作为优选，所述曝光计量检测机构包括：调节安装板、针孔、滤波片和光照度检测传感器，所述光照度检测传感器通过所述调节安装板固定在所述模组转接板上，所述针孔和滤波片安装在所述调节安装板与光照度检测传感器之间。
作为优选，所述光阑切换机构包括与模组转接板固定连接的直线运动模组、设置在直线运动模组上的导向块及与导向块连接的掩模光阑，所述掩模光阑位于所述曝光镜头上。
作为优选，所述预对准单元包括：机械视觉系统、旋转台以及定心定向结构，其中，所述旋转台位于所述定心定向结构上，用于承载硅片，所述机械视觉系统的位置与所述旋转台对应。
作为优选，所述边缘曝光单元和预对准单元分别设置有两组。
本发明还提供一种边缘曝光方法，使用上述的边缘曝光装置，包括：机械手从片库单元中取出硅片并放置到预对准单元；所述预对准单元对硅片进行定心和定向；边缘曝光装置对定心和定向后的硅片进行边缘曝光；取下曝光完成后的硅片。
作为优选，所述预对准单元对硅片进行定心和定向的步骤包括：
对硅片圆周边缘进行扫描采样，拟合出硅片的型心；
对硅片缺口进行定位及采样，拟合出缺口的中心位置；
将缺口旋转到指定位置，使硅片型心与缺口中心的连线平行于X轴正方向，确定所述硅片型心的偏移量；
对硅片进行调整，补偿硅片型心的偏移量。
作为优选，所述边缘曝光装置对定心和定向后的硅片进行边缘曝光的步骤中，通过收集边缘曝光的余光，累积计算硅片面上的实际曝光剂量，进而判定当前硅片曝光是否存在问题，若存在问题则报警。
与现有技术相比，本发明具有以下优点：
1、本发明可对硅片边缘实现一定宽度的圆环曝光、边缘曝光，分段曝光，以及对特定区域内实现直线曝光，所曝光线条宽度可在线自动调整。
2、本发明的边缘曝光单元可兼容8至12寸硅片，可自由切换8至12寸硅片曝光工位；
3、本发明配置实时曝光剂量监控和在线光源强度检测系统，使得在线检测和实时监控可兼容；
4、本发明配备的预对准单元、边缘曝光单元共用工作台(预对准台/曝光台)，结构紧凑；
5、本发明的预对准单元、边缘曝光单元分别设置有两组，生产效率高。
附图说明
图1为本发明一具体实施方式中边缘曝光装置的结构示意图；
图2为本发明一具体实施方式中预对准单元的结构示意图；
图3为本发明一具体实施方式中边缘曝光单元的结构示意图；
图4为本发明一具体实施方式中曝光组件的结构示意图；
图5为本发明一具体实施方式中运动切换调整机构的结构示意图；
图6为本发明一具体实施方式中绝对光强度检测机构的结构示意图；
图7为本发明一具体实施方式中曝光计量检测机构的结构示意图；
图8为本发明一具体实施方式中边缘曝光装置的垂向分布示意图
图9本发明一具体实施方式中光阑切换机构的结构示意图；
图10为本发明一具体实施方式中边缘曝光装置曝光时的示意图；
图11为本发明一具体实施方式中边缘曝光装置工作时的垂直整体布局示意图；
图12为本发明一具体实施例中边缘曝光装置工作时的水平整体布局示意图；
图13为本发明一具体实施例中硅片边缘曝光方式的示意图；
图14为本发明一具体实施例中硅片环形曝光方式的示意图；
图15为本发明一具体实施例中硅片分段曝光方式的示意图；
图16为本发明一具体实施例中硅片直线曝光方式的示意图；
图17为本发明一具体实施例中边缘曝光装置硅片预对准方法的原理图；
图18为本发明一具体实施例中边缘曝光装置预对准流程图；
图19为本发明一具体实施例中边缘曝光流程图。
具体实施方式
为使本发明的上述目的、特征和优点能够更加明显易懂，下面结合附图对本发明的具体实施方式做详细的说明。需说明的是，本发明附图均采用简化的形式且均使用非精准的比例，仅用以方便、明晰地辅助说明本发明实施例的目的。
如图1所示，本发明提供一种边缘曝光装置，包括：整机框架1、安装在所述整机框架1上的用于对硅片进行边缘曝光的边缘曝光单元2；用于对硅片定心、定向并配合所述边缘曝光单元2完成边缘曝光操作的预对准单元3；用于存储、检测硅片的片库单元4；用于硅片搬运的机械手5；以及用于边缘曝光装置的各 工作单元的主控单元6；其中，所述边缘曝光单元2和预对准单元3分别设置有两组，且所述边缘曝光单元2与所述预对准单元3共用工作台，也即是说，所述预对准单元3使用的预对准台与边缘曝光单元2采用的曝光台为同一工作台，结构紧凑且生产效率高。
其中，所述整机框架1包括防护框架组件、安装在所述防护框架组件上的防护面板组件以及位于内部的连接板组件；其中，防护框架组件为整机防护安装提供固定支撑基础，防护框架组件与防护面板组件构成完整的整机防护模块，并为整机和各相关分系统提供防护、支撑和维修维护功能。
所述主控单元6负责控制机械手5、预对准单元3、边缘曝光单元2、片库单元4等各单元的电气控制。较佳的，所述主控单元6包括操作台与计算机系统单元，计算机系统提供本地/远程两种控制方式。用户既可以通过本地操作台用户界面来实现对边缘曝光装置的操作与控制，也可以通过以太网连接至工厂界面来实现远程访问和控制。整机灯塔和故障蜂鸣器的控制采用软件与硬件相结合的方式来实现。计算机系统提供软件控制所需要的硬件控制接口
继续参照图1，所述边缘曝光装置还包括供配电单元7，所述供配电单元7主要给上述各工作单元提供工作电源，同时提供单独的漏电流保护器，最大限度的保护整机基础环境的稳定。
请重点参照图2，所述预对准单元3负责硅片定心、定向并配合边缘曝光单元完成边缘曝光操作，其具体包括：机械视觉系统31、旋转台32、以及定心定向结构33。所述机械视觉系统31采用LED光源和线阵CCD对硅片圆周边缘进行扫描采样，拟合出硅片的型心，以及对硅片的缺口进行粗定位及细采样，拟合出缺口的中心位置；所述旋转台32用于真空吸附硅片，所述定心定向结构33具备水平X向、垂直Z向和Rz向(绕Z向旋转)的自由度，所述旋转台32与定心定向机构33配合将硅片的缺口旋转到指定位置，同时补偿硅片的型心与旋转台32的型心的偏移量。
请参照图3，所述边缘曝光单元2主要包括沿光传播方向设置的光源21、光纤22、匀光单元23以及曝光组件24。其中，所述光源21的作用是提供具有硅片边缘曝光所需的波长及照射光强的光线，光源功率大小由控制器进行调节，满足硅片面的照度需求，且输出光线的数值孔径匹配于后接光纤22的数值孔径。为满足不同波段的使用需求，光源21主要出射波长为365nm、405nm、436nm。所述光纤22用于收集光源输出的一定角度与能量的光线并进行传递。所述匀光单元23起匀光作用，确保照射到硅片面光斑能量为均匀分布，优选的，本发明选用石英棒作为匀光单元23。所述曝光组件24将照明视场成像到硅片面要求的区域内，从而实现硅片边缘的曝光。
请重点参照图4，所述曝光组件24包括：用于工位切换和直线运动的运动切换调整机构200，安装在所述运动切换调整机构200上的曝光镜头100、绝对光强度检测机构300、曝光计量检测机构400和光阑切换机构500。
请重点参照图5，所述运动切换调整机构200用于实现工位切换和直线运动，其主要包括：运动模组安装组件204、安装在运动模组安装组件204上的平面运动模组202、分别与所述平面运动模组202连接的运动拖链组件203和模组转接板201，所述曝光镜头100安装在所述模组转接板201上。
参照图4和5，所述模组转接板201由平面运动模组202带动运动，具有水平方向X轴和Y轴的移动自由度。具体地，所述平面运动模组202带动模组转接板201沿X方向大行程运动，可实现不同规格硅片的曝光工位切换，平面运动模组202带动模组转接板201沿Y方向大行程运动，实现硅片平边和直线曝光运动。具体地，当需要从12寸硅片曝光工位切换到8寸硅片曝光工位时，平面运动模组202推动曝光镜头100沿X向到指定工位；而需要进行直线曝光时，则沿Y向推动到指定直线曝光起始位置后再沿Y轴进行曝光运动。
如图6所示，所述绝对光强度检测机构300包括：气缸转接件304、切换气缸303、传感器安装件302及光强度检测传感器301，所述切换气缸303通过所述气缸转接件304与所述运动模组安装组件204连接，所述光强度检测传感器 301通过所述传感器安装件302与所述切换气缸303连接，并对准所述曝光镜头100的视场。其中，所述光强度检测传感器301随切换气缸303可实现X方向直线距离切换。具体为：当需要进行检测时，平面运动模组202推动曝光镜头100到指定位置，光阑切换机构500推动掩模光阑运动到最大视场工位，然后切换气缸303将光强度检测传感器301沿着X轴推动到硅片曝光区域，对光强度进行校对检测。检测完毕后，切换气缸303推动光强度检测传感器301沿X轴退出检测工位，平面运动模组202推动曝光镜头100沿X和Y向回到曝光工位。
如图7和图8所示，所述曝光计量检测机构400包括：调节安装板401、针孔402、滤波片403和光照度检测传感器404，所述光照度检测传感器404通过所述调节安装板401固定在所述模组转接板201上，所述针孔402和滤波片403安装在所述调节安装板401与光照度检测传感器404之间。所述曝光计量检测机构400可以随曝光镜头100运动，并可进行小范围的监控工位调整，曝光剂量检测工位水平方向位置位于硅片边缘和曝光视场边界之间，这样可以实现在曝光过程中曝光照度的监控。
需要说明的是，通常使用绝对光强度检测机构300对曝光计量检测机构400进行校对，并通过计算补偿曝光计量检测机构400的检测值，以保证光照度监控的有效性和稳定性，为了使光强度检测工位700与硅片曝光工位在Z轴上保持一致，将光照度检测传感器404设置在光强度检测传感器301的下方，光强度检测传感器301沿X轴退出后，光照度检测传感器404仍然保持在光照度检测工位中，以实现两种检测方法的兼容。
如图9所示，所述光阑切换机构500包括与模组转接板201固定连接的直线运动模组503、设置在直线运动模组503上的导向块502及与导向块502连接的掩模光阑501，所述掩模光阑501位于所述曝光镜头100上。所述掩模光阑501具有多个光阑投孔。也即是说，本发明通过直线运动模组503推动掩模光阑501沿X轴移动，调节光阑投孔与曝光镜头100视场的错位间隙，约束曝光区域的尺寸，实现对曝光区域的调控，进而实现不同尺寸的曝光区域。
请重点参照图10-16，本发明的边缘曝光装置通过对曝光区域的调控、切换，可以实现8寸到12寸硅片不同类型边缘曝光需求的无级调控。
如图10、11、12所示，先以8寸硅片曝光工位701和12寸硅片曝光工位702的工位切换过程为例加以说明：
首先，将12寸硅片放置到旋转台32上，通过机械视觉系统31进行定位检测，保证该12寸硅片在旋转台32预对准完成。通过所述平面运动模组202沿X轴推动曝光镜头100到达指定的12寸硅片曝光工位702，启动边缘曝光系统，光源经过光学系统垂直入射到曝光镜头100。同时使旋转台32进行旋转配合，对该12寸硅片进行边缘曝光操作。曝光镜头100的镜头视场600在该12寸硅片的边缘形成已曝光区域603，当前位于镜头视场600内的是曝光区域601，尚未完成曝光的是待曝光区域602。边缘曝光操作完成后，取下该12寸硅片。
然后，将8寸硅片放置到旋转台32上，通过所述平面运动模组202沿X轴推动曝光镜头100到达指定的8寸硅片曝光工位701，启动边缘曝光系统，同时使旋转台32进行旋转配合，对该8寸硅片进行边缘曝光操作。即完成从12寸硅片曝光工位702切换到8寸硅片曝光工位701的工位切换操作。
接着，以半径为R的硅片和表1为例，详细说明本发明能够实现直线曝光与边缘曝光、环形曝光、分段曝光等多种曝光方式相互兼顾。
表1各类型边缘曝光功能实现方式
Figure PCTCN2017091008-appb-000001
Figure PCTCN2017091008-appb-000002
结合表1，图13示出了边缘曝光方式。通过所述平面运动模组202沿X轴运动，推动曝光镜头100，控制曝光镜头100与硅片边缘的相对距离，即调节边缘曝光的宽度，使曝光镜头100到达指定的曝光工位，实现硅片的边缘曝光。
其中，图14示出了环形曝光方式。通过所述平面运动模组202的X轴运动推动曝光镜头100，控制曝光镜头100与硅片中心的相对距离，即调节环形曝光工位的位置，使曝光镜头100到达指定的曝光工位，然后，通过所述直线运动模组503移动掩模光阑501，选择合适的光阑投孔，即调节环形曝光的宽度，实现硅片的环形曝光。
其中，图15示出了分段曝光方式。通过所述平面运动模组202的X轴运动推动曝光镜头100，控制曝光镜头100与硅片中心的相对距离，即调节分段曝光工位的位置，使曝光镜头100到达指定的曝光工位，然后，通过所述直线运动模组503移动掩模光阑501，选择合适的光阑投孔，即调节分段曝光的宽度，在曝光时，通过旋转台32控制硅片的旋转角度，通过光源控制器控制曝光时间，实现硅片的分段曝光。
其中，图16示出了直线曝光方式。通过所述平面运动模组202的X轴和Y轴运动，分别推动曝光镜头100在X轴和Y轴上运动，使曝光镜头100到达直线曝光的起始位置，然后，通过所述直线运动模组503移动掩模光阑501，选择合适的光阑投孔，即调节直线曝光的宽度，再通过所述平面运动模组202的Y轴运动推动曝光镜头100在Y轴作直线曝光运动，实现硅片的直线曝光。所述直线曝光方式也可以实现对硅片边缘的平边曝光处理。
请重点参照图10-12，光照度检测工位在由上向下的俯视面上位于硅片边缘和曝光视场边界之间，实时对曝光操作进行光照度监控。本发明增加了现有技术不具有的曝光计量检测机构400，保证曝光操作的正常进行，实时获得曝光操作的光照状态。
进一步的，所述模组转接板201采用两台阶结构。采用这种结构使模组转接板201分为上阶板和下阶板，上阶板和下阶板在竖直方向上留有高度差，下阶板固定在平面运动模组202上，上阶板上安装有曝光镜头100、曝光计量检测机构400及光阑切换机构500，简化了结构，节省了材料，将光照度检测传感器404设置在光强度检测传感器301的下方，使光强度检测工位700与硅片曝光工位在Z轴上保持一致，同时，不影响光照度检测传感器404的监控作用，合理利用了空间，便于与硅片之间的相对运动和曝光操作。
请参照图17-19所示，结合图1-16，本发明还提供一种边缘曝光方法，其具体包括：
机械手5从片库单元4中取出硅片并放置到预对准单元3的旋转台32上。
所述预对准单元3对硅片进行定心和定向。如图17和图18所示，其具体步骤为：机械视觉系统31对硅片圆周边缘进行扫描采样，拟合出硅片的型心；机械视觉系统31对硅片缺口进行初定位及细采样，拟合出缺口的中心位置；旋转台32将缺口旋转到指定位置，在所述指定位置处，硅片型心与缺口中心的连线平行于X轴正方向，此时硅片型心到旋转台型心的偏移量为Δx，Δy；
旋转台32由定心定向机构33带动沿Y向移动，补偿偏移量Δy；
机械手5抓取硅片沿X向移动，补偿偏移量Δx。
其中，机械手补偿偏移量Δx的具体方法为：将偏移量Δx发送给机械手5，设机械手5与旋转台32(也即是曝光台)交接位之间的移动距离基量为一常数m，那么机械手5应移动到m+Δx或者m-Δx位与旋转台32交接。
接着，边缘曝光单元2对定心和定向后的硅片进行边缘曝光，曝光完成后，机械手取下曝光完成后的硅片。当然，预对准单元完成预对准后，在预对准台 也即是旋转台32上，直接进行边缘曝光操作。
如图19所示，边缘曝光的流程为：
首先，根据曝光的类型，切换曝光视场光阑；
判断硅片是否为预对准状态，若否，则执行预对准操作，若是，硅片运动至曝光工位；
进行光照度优化，并计算曝光参数；
硅片开始循环曝光，直至完成各段的曝光；当然，此过程中，在曝光开始和结束时控制曝光控制器shutter的打开与关闭和旋转轴的运动同步。
接着，曝光镜头步进运动，照度恢复到曝光前状态，曝光结束。
需要说明的是，本发明所述边缘曝光装置，边缘曝光过程中，边缘曝光的剂量控制与照度、扫描速度、视场大小、硅片尺寸有关。对于同一个目标剂量，以上主要变量的关系为：
Figure PCTCN2017091008-appb-000003
其中I为照度；dl为视场大小；v扫描速度；W为硅片周长。
显然，以上变量中除目标剂量dDose为上位机给定值，还有硅片尺寸是确定的；视场大小l是不变的。只有剂量照度I(光源中集成了一组衰减片可分多个档位衰减光源照度)与扫描速度v为可控的变量。
在边缘曝光实际生产过程中，工艺制程给定的期望剂量在硅片面上实际曝光时有多少以及剂量稳定性如何，因此，需要在实际生产过程中检测实际的曝光剂量。所述边缘曝光装置对定心和定向后的硅片进行边缘曝光的步骤中，通过收集边缘曝光的余光，累积计算硅片面上的实际曝光剂量，进而判定当前硅片曝光是否存在问题，若存在问题则报警。一般说来，对于同一个工艺制程的不同批次硅片来说，余光是一定的，曝光的实际剂量也是一定的。
这样，每次曝光的剂量可以得到实际测量。当完成一张硅片曝光后，软件上对实际剂量和期望剂量做对比，可以判定当前硅片曝光是否存在问题，若存 在问题，则可及时报警，将生产风险降到最低。
边缘曝光、分段曝光和圆环曝光、直线曝光过程中，由于曝光控制器快门(shutter)打开和关闭存在延时，该延时易造成曝光起始位置和终止位置出现欠曝光或者过曝光的情况，为了尽量保证在曝光开始和结束时曝光控制器中shutter的打开与关闭和旋转轴的运动同步，设计以下曝光控制方案：
设定点位置前的shutte_on_delay时间下发shutter_on_enable信号，该shutte_on_delay时间包含shutter_on的3sigma值，尽量保证设定点开始运动时shutter是真实的打开状态；在shutter_on_delay时间+moving时间-shutter_off_delay时间后下发shutter_off_enable信号，确保在停止运动后，快门是真实关闭的。
以下为具体事项步骤：
1、初始化时，偏移量(offset)；
2、边缘曝光时，下发shutter_on_enable信号后，边缘曝光触发快门时，开始计算曝光剂量；
3、边缘曝光的快门关闭时，停止计算曝光剂量，并得到上一次的曝光剂量。
因此每一次曝光都可以得到具体的曝光剂量。
显然，本领域的技术人员可以对发明进行各种改动和变型而不脱离本发明的精神和范围。这样，倘若本发明的这些修改和变型属于本发明权利要求及其等同技术的范围之内，则本发明也意图包括这些改动和变型在内。

Claims (12)

  1. 一种边缘曝光装置，包括：整机框架；安装在所述整机框架上的用于对硅片进行边缘曝光的边缘曝光单元；用于对硅片定心、定向并配合所述边缘曝光单元完成边缘曝光操作的预对准单元；用于存储、检测硅片的片库单元；用于硅片搬运的机械手；以及用于控制上述各组件的主控单元；其中，所述边缘曝光单元与所述预对准单元共用工作台。
  2. 如权利要求1所述的边缘曝光装置，其特征在于，所述边缘曝光单元包括：沿光传播方向设置的光源、光纤、匀光单元以及曝光组件。
  3. 如权利要求2所述的边缘曝光装置，其特征在于，所述曝光组件包括：
    运动切换调整机构，具有水平方向X轴和Y轴的移动自由度；
    曝光镜头，安装在所述运动切换调整机构上，用于对硅片进行边缘曝光；
    绝对光强度检测机构，安装在所述运动切换调整机构上，用于对曝光区域的光强度进行校对检验；
    曝光计量检测机构，安装在所述运动切换调整机构上，实现曝光过程中曝光照度的监控；
    以及光阑切换机构，位置与所述曝光镜头对应，
    其中，所述运动切换调整机构用于实现硅片在曝光工位与预对准工位的切换以及硅片的直线运动。
  4. 如权利要求3所述的边缘曝光装置，其特征在于，所述运动切换调整机构包括：运动模组安装组件、安装在运动模组安装组件上的平面运动模组、分别与所述平面运动模组连接的运动拖链组件和模组转接板，所述曝光镜头安装在所述模组转接板上，所述模组转接板具有水平方向X轴和Y轴的移动自由度。
  5. 如权利要求4所述的边缘曝光装置，其特征在于，所述绝对光强度检测机构包括：气缸转接件、切换气缸、传感器安装件及光强度检测传感器，所述切换气缸通过所述气缸转接件与所述运动模组安装组件连接，所述光强度检测传感器通过所述传感器安装件与所述切换气缸连接，并对准所述曝光镜头的视场。
  6. 如权利要求4所述的边缘曝光装置，其特征在于，所述曝光计量检测机 构包括：调节安装板、针孔、滤波片和光照度检测传感器，所述光照度检测传感器通过所述调节安装板固定在所述模组转接板上，所述针孔和滤波片安装在所述调节安装板与光照度检测传感器之间。
  7. 如权利要求4所述的边缘曝光装置，其特征在于，所述光阑切换机构包括与模组转接板固定连接的直线运动模组、设置在直线运动模组上的导向块及与导向块连接的掩模光阑，所述掩模光阑位于所述曝光镜头上。
  8. 如权利要求1所述的边缘曝光装置，其特征在于，所述预对准单元包括：机械视觉系统、旋转台以及定心定向结构，其中，所述旋转台位于所述定心定向结构上，用于承载硅片，所述机械视觉系统的位置与所述旋转台对应。
  9. 如权利要求1所述的边缘曝光装置，其特征在于，所述边缘曝光单元和预对准单元分别设置有两组。
  10. 一种边缘曝光方法，使用如权利要求1-9任意一项所述的边缘曝光装置，其特征在于，包括：
    机械手从片库单元中取出硅片并放置到预对准单元；
    所述预对准单元对硅片进行定心和定向；
    边缘曝光装置对定心和定向后的硅片进行边缘曝光；
    取下曝光完成后的硅片。
  11. 如权利要求10所述的边缘曝光方法，其特征在于，所述预对准单元对硅片进行定心和定向的步骤包括：
    对硅片圆周边缘进行扫描采样，拟合出硅片的型心；
    对硅片缺口进行定位及采样，拟合出缺口的中心位置；
    将缺口旋转到指定位置，使硅片型心与缺口中心的连线平行于X轴正方向，确定所述硅片型心的偏移量；
    对硅片进行调整，补偿硅片型心的偏移量。
  12. 如权利要求10所述的边缘曝光方法，其特征在于，所述边缘曝光装置对定心和定向后的硅片进行边缘曝光的步骤中，通过收集边缘曝光的余光，累积计算硅片面上的实际曝光剂量，进而判定当前硅片曝光是否存在问题，若存在问题则报警。
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