WO2016182289A1

WO2016182289A1 - Test socket adapter

Info

Publication number: WO2016182289A1
Application number: PCT/KR2016/004819
Authority: WO
Inventors: 유홍준
Original assignee: (주)제이티
Priority date: 2015-05-08
Filing date: 2016-05-09
Publication date: 2016-11-17
Also published as: KR20160131965A; TWI614507B; TW201643436A

Abstract

The present invention relates to a test socket adapter, and more specifically to a test socket adapter for guiding the loading of an element on a test socket. The present invention, which is a test socket adapter (200), disposed on a test socket (100) having a plurality of contact pins (110), for guiding the loading of an element (10) on the test socket (100), comprises: a main body (210) disposed on the test socket (100) and having a rectangular opening (211) with open top and bottom; two or more adapter members (220) disposed on the rectangular opening (211) so as to be moved linearly in the planar direction of the main body (210); and a moving means for moving the adapter members (220) back toward the main body (210) when the element (10) is being unloaded and forward toward the inside when being tested.

Description

Adapter for test socket

The present invention relates to a test socket adapter, and more particularly to a test socket adapter for guiding the loading of the device on the test socket.

Semiconductor devices (hereinafter referred to as 'devices') undergo various tests such as electrical properties, heat or pressure reliability tests after the packaging process is completed.

Among these tests, the burn-in test is a burn-in test, in which a plurality of devices are inserted into a burn-in board, and the burn-in board is placed in a burn-in test apparatus to apply heat or pressure for a predetermined time. It is a test to determine if a defect occurs in the back device.

The device sorting device for burn-in test generally classifies (unloads) the device into each tray according to the classification criteria given according to the inspection result for each device such as good or bad from the burn-in board that has loaded the device that has undergone the burn-in test. It is a device that inserts (loads) a new device to perform burn-in test again in an empty place (socket) of burn-in board where the device is located.

On the other hand, the performance of the device sorting device as described above is evaluated as the number of sorts per unit (UPH), UPH is the time required for the transfer of the device, the burn-in board transfer between the components constituting the device sorting device It is decided according to.

Therefore, it is necessary to improve the structure and arrangement of each component in order to increase the UPH, which is the performance of the device sorting device.

On the other hand, among the devices under test, there are so-called BGA devices (Viege devices) in which a plurality of balls are provided on the bottom surface instead of a lead projecting to the side as a terminal for coupling with an external terminal.

In addition, the inspection of the BG element is generally performed by being inserted into a socket in which a plurality of contact pins, so-called pogo pins, corresponding to the respective balls are contacted.

The test socket for such a BG element is disclosed in registered Utility Model No. 20-0463425.

In particular, registered utility model No. 20-0463425 has an additional adapter installed on the test socket for guiding upon loading of a BG element so that the alignment between the contact pin and the ball terminal is always kept constant and the connection state is maintained. It can be kept constant, so that the accurate inspection of the device is effected.

However, the adapter structure disclosed in Korean Utility Model Registration No. 20-0463425 has to have a lateral spacing between the side of the device and the adapter for stable loading of the device. Due to such lateral spacing, the alignment between the contact pins and the ball terminals is poor. There is a disturbing problem.

In addition, when the device is unloaded from the test socket, the device is caught by the adapter to stop the operation of the device, thereby reducing the efficiency of the inspection work.

In order to solve the above problems, an object of the present invention is to provide an adapter for a test socket that does not interfere with device unloading while maintaining a constant alignment state between the contact pin and the ball terminal.

The present invention has been created in order to achieve the object of the present invention as described above, the present invention is installed on a test socket 100 is installed a plurality of contact pins 110, the device 10 on the test socket 100 Adapter 200 for guiding the loading of the test socket, the main body 210 is formed on the test socket 100, the upper and lower rectangular opening 211 is formed; Two or more adapter members 220 installed in the rectangular opening 211 to linearly move in the planar direction of the main body 210; When the device 10 is unloaded on the test socket 100, the adapter members 220 are retracted toward the main body 210, and the adapter member 220 is moved inward when the device 10 is loaded and inspected. Disclosed is an adapter for a test socket, characterized in that it comprises a moving means.

The adapter members 220 may be provided in one or more pairs on opposite sides of the inner sides of the rectangular opening 211.

The adapter members 220 may be provided in pairs or more at four vertices of four vertices of the rectangular opening 211.

When the adapter member 220 is in close contact with the test socket 100, the moving unit may face the first inclined surface (not shown) formed on the adapter member 220 and the first inclined surface of the device 10. The adapter member 220 may be configured to be in close contact with the test socket 100 by a combination of the second inclined surface to closely contact the side and the adapter member 220.

The moving means, when the pressure of the adapter 200 to the test socket 100 is released by pressing the adapter member 220 to the outside to restore the adapter member 220 to the original position from the element 10 It may include an elastic member for completely retracting the adapter member 220.

In the adapter for the test socket according to the present invention, the adapter member for guiding the device during device inspection and loading of the device is moved toward the device to maintain a constant alignment between the contact pin and the ball terminal and retreat to the outside when the device is unloaded. It does not interfere with the unloading of the device, there is an advantage to improve the reliability of the device inspection and to be able to perform the loading and unloading of the device quickly.

1 is a plan view showing an adapter for a test socket according to the present invention.

FIG. 2 is a plan view illustrating a state in which the adapter member is retracted when the adapter for the test socket of FIG. 1 is unloaded.

3 is a cross-sectional view taken along the III-III direction in FIG. 1.

4 is a plan view and a cross-sectional view showing a state in which the adapter member is retracted when the adapter for the test socket of FIG. 3 is unloaded.

Hereinafter, with reference to the accompanying drawings of the test socket adapter according to the present invention.

As shown in FIGS. 1 to 4, the test socket adapter 200 according to the present invention is installed on a test socket 100 in which a plurality of contact pins 110 are installed, and an element on the test socket 100. 10. A test socket adapter 200 for guiding the loading of 10), comprising: a main body 210 provided on the test socket 100 and having a rectangular opening 211 penetrating up and down; Two or more adapter members 220 installed in the rectangular opening 211 so as to linearly move in the plane direction of the main body 210; Moving means for retracting the adapter member 220 toward the main body 210 during unloading of the device 10 on the test socket 100 and advancing the adapter member 220 inward during loading and inspection of the device 10. It includes.

The element 10 is a so-called ball grid array (BGA) in which a plurality of ball terminals 11 are provided on a bottom surface thereof.

The test socket 100 may be installed on a board in a double row, or may be installed in various ways, such as a double row in a test module.

In addition, the test socket 100 corresponds to a plurality of ball ends 11 installed on the bottom surface of the device 10, and a plurality of contact pins 110 are provided to supply power or signal.

The test socket 100 may have any configuration such as the structure shown in Registered Utility Model No. 20-0463425 provided that the plurality of contact pins 110 are installed.

The main body portion 210 is formed on the test socket 100 and is formed with a rectangular opening 211 penetrating the upper and lower sides, it can be configured in a variety of configurations, such as one member or a plurality of members.

In particular, the main body 210 can be modified in various ways, such as having a configuration disclosed in registered Utility Model No. 20-0463425.

Furthermore, the main body 210 may be coupled to a socket press installed on the upper side for loading / unloading of the device 10 with respect to the test socket 100.

The adapter members 220 may be configured in a rectangular opening 211 so as to linearly move in a plane direction of the main body 210.

For example, the adapter members 220 may be installed to correspond to four sides of the rectangular opening 211.

In addition, the adapter members 220 are formed with at least one guide surface 221 which is an inclined surface for guiding the loading of the element 10 inward.

The guide surface 221 has the test socket 100 at a position where the device 10 is more accurate when the device 10 is loaded, that is, when the device 10 is dropped from the picker 20 to the test socket 100. ) To be seated on the

The four adapter members 220 correspond to two sides of the four sides of the rectangular opening 211, that is, the two sides opposite to each other, and are in contact with the sides of the device 10. 222 may be formed.

The vertical contact surface 222 is a device 10 and contact by pressing the side of the device 10 by advancing the adapter member 220 toward the side of the device 10, that is toward the inside during the device inspection after device loading It is possible to more accurately maintain the alignment of the pin (110).

Meanwhile, the adapter members 220 may be installed such that at least a part thereof is fixed to the main body 210 and only a part of the adapter members 220 linearly moves in the plane direction of the main body 210.

For example, of the adapter members 220, only the adapter members 220 corresponding to two opposite sides of the four sides of the rectangular element 10 may be installed to linearly move in the plane direction of the main body 210. .

In addition, the adapter members 220 may be installed to correspond to the shape of the rectangular element 10 so as to correspond to two or more vertices and linearly move in the plane direction of the main body 210 instead of corresponding to each side.

For example, the adapter members 220 may linearly move in the planar direction of the main body 210 in correspondence with vertices of the elements 10 facing each other, that is, vertices facing each other among four vertices of the rectangular opening 211. Can be installed as possible.

In this case, the planar shape of the adapter member 220 may have a '-' shape.

In summary, the adapter members 220 retreat the adapter member 220 to the outside when the device 10 is unloaded so as not to disturb the unloading of the device 10, and loading and inspecting the device 10. Any configuration may be used as long as the position of the device 10 on the test socket 100 is accurately seated and the device inspection is performed stably by advancing toward the device 10.

The moving unit is configured to retract the adapter member 220 toward the main body 210 or to move inward, and various configurations are possible according to the linear movement method.

For example, corresponding to each side of the rectangular opening 211 may be installed inside the main body 210 to be operated by an external operating member to advance or retract each adapter member 220.

In addition, the moving means may move the adapter member 220 for guiding the device 10 in a suitable manner so as to be suitable for loading, unloading and inspection of the device 10.

For example, the moving means may retract the adapter member 220 to the outside during the unloading of the element 10 so as not to interfere with the unloading of the element 10, and during the loading and inspection of the element 10 By advancing toward 10), the position of the device 10 on the test socket 100 can be accurately seated and the device inspection can be performed stably.

Here, the horizontal movement position of the adapter member 220, the side of the device 10 and the adapter member 220 is in close contact during the device inspection, and when the device unloading retracts the adapter member 220 from the device 10 completely In order to facilitate device unloading, the adapter member 220 may be positioned between the device inspection position and the device unloading position when the device is loaded to induce a stable loading of the device 10.

As a specific example, the moving means may include the side surface of the element 10 and the adapter 200 being pressed by the picker 20 or the like when the picker 20 picking up the element 10 is seated on the test socket 100. The adapter member 220 may be in close contact, and may be configured to completely retract the adapter member 220 from the device 10 when the pressure is released by the picker 20.

That is, the adapter member 220 is installed to be movable relative to the test socket 100, the test socket 100 has an elastic member (not shown) to restore to the original position when the pressure is released by the picker 20, etc. Can be installed.

When the adapter member 220 is brought into close contact with the test socket 100, the moving unit may face the first inclined surface (not shown) and the first inclined surface formed on the adapter member 220 so as to face the side surface of the device 10. The adapter member 220 may be brought into close contact with the test socket 100 by the combination of the second inclined surfaces to closely contact the adapter member 220.

In addition, the moving means, when the pressure of the adapter 200 against the test socket 100 by the picker 20 or the like is released by pressing the adapter member 220 to the outside to restore the adapter member 220 to the original position It may include an elastic member for completely retracting the adapter member 220 from (10).

Since the above has been described only with respect to some of the preferred embodiments that can be implemented by the present invention, the scope of the present invention, as is well known, should not be construed as limited to the above embodiments, the present invention described above It will be said that both the technical idea and the technical idea which together with the base are included in the scope of the present invention.

Claims

As a test socket adapter 200 is installed on the test socket 100 is installed a plurality of contact pins 110 to guide the loading of the device 10 on the test socket 100,

A main body 210 installed on the test socket 100 and having a rectangular opening 211 penetrating up and down;

Two or more adapter members 220 installed in the rectangular opening 211 to linearly move in the planar direction of the main body 210;

When the device 10 is loaded on the test socket 100, the adapter member 220 is retracted toward the main body 210, and the adapter member 220 moves forward when the device 10 is unloaded. Adapter for test sockets comprising a means.
The method according to claim 1,

The adapter member (220), the adapter for the test socket, characterized in that one or more pairs are installed on the side of the inner side of the rectangular opening (211) facing each other.
The method according to claim 1,

The adapter member (220), the adapter for the test socket, characterized in that one or more pairs are installed at each of the vertices of the four vertices of the rectangular opening (211).
The method according to any one of claims 1 to 3,

When the adapter member 220 is in close contact with the test socket 100, the moving unit may face the first inclined surface (not shown) formed on the adapter member 220 and the first inclined surface of the device 10. The adapter for the test socket, characterized in that the adapter member 220 is configured to be in close contact with the test socket 100 by a combination of the second inclined surface to be in close contact with the side and the adapter member 220.
The method according to claim 4,

The moving means, when the pressure of the adapter 200 to the test socket 100 is released by pressing the adapter member 220 to the outside to restore the adapter member 220 to the original position from the element 10 Adapter for a test socket, characterized in that it comprises an elastic member for completely retracting the adapter member (220).