WO2016182289A1 - Adaptateur de prise d'essai - Google Patents

Adaptateur de prise d'essai Download PDF

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Publication number
WO2016182289A1
WO2016182289A1 PCT/KR2016/004819 KR2016004819W WO2016182289A1 WO 2016182289 A1 WO2016182289 A1 WO 2016182289A1 KR 2016004819 W KR2016004819 W KR 2016004819W WO 2016182289 A1 WO2016182289 A1 WO 2016182289A1
Authority
WO
WIPO (PCT)
Prior art keywords
adapter
test socket
adapter member
main body
test
Prior art date
Application number
PCT/KR2016/004819
Other languages
English (en)
Korean (ko)
Inventor
유홍준
Original Assignee
(주)제이티
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by (주)제이티 filed Critical (주)제이티
Publication of WO2016182289A1 publication Critical patent/WO2016182289A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures

Definitions

  • the present invention relates to a test socket adapter, and more particularly to a test socket adapter for guiding the loading of the device on the test socket.
  • 'devices' Semiconductor devices (hereinafter referred to as 'devices') undergo various tests such as electrical properties, heat or pressure reliability tests after the packaging process is completed.
  • the burn-in test is a burn-in test, in which a plurality of devices are inserted into a burn-in board, and the burn-in board is placed in a burn-in test apparatus to apply heat or pressure for a predetermined time. It is a test to determine if a defect occurs in the back device.
  • the device sorting device for burn-in test generally classifies (unloads) the device into each tray according to the classification criteria given according to the inspection result for each device such as good or bad from the burn-in board that has loaded the device that has undergone the burn-in test. It is a device that inserts (loads) a new device to perform burn-in test again in an empty place (socket) of burn-in board where the device is located.
  • the performance of the device sorting device as described above is evaluated as the number of sorts per unit (UPH), UPH is the time required for the transfer of the device, the burn-in board transfer between the components constituting the device sorting device It is decided according to.
  • UPH the number of sorts per unit
  • BGA devices Vege devices
  • a plurality of balls are provided on the bottom surface instead of a lead projecting to the side as a terminal for coupling with an external terminal.
  • the inspection of the BG element is generally performed by being inserted into a socket in which a plurality of contact pins, so-called pogo pins, corresponding to the respective balls are contacted.
  • test socket for such a BG element is disclosed in registered Utility Model No. 20-0463425.
  • registered utility model No. 20-0463425 has an additional adapter installed on the test socket for guiding upon loading of a BG element so that the alignment between the contact pin and the ball terminal is always kept constant and the connection state is maintained. It can be kept constant, so that the accurate inspection of the device is effected.
  • the adapter structure disclosed in Korean Utility Model Registration No. 20-0463425 has to have a lateral spacing between the side of the device and the adapter for stable loading of the device. Due to such lateral spacing, the alignment between the contact pins and the ball terminals is poor. There is a disturbing problem.
  • the device when the device is unloaded from the test socket, the device is caught by the adapter to stop the operation of the device, thereby reducing the efficiency of the inspection work.
  • an object of the present invention is to provide an adapter for a test socket that does not interfere with device unloading while maintaining a constant alignment state between the contact pin and the ball terminal.
  • the present invention has been created in order to achieve the object of the present invention as described above, the present invention is installed on a test socket 100 is installed a plurality of contact pins 110, the device 10 on the test socket 100 Adapter 200 for guiding the loading of the test socket, the main body 210 is formed on the test socket 100, the upper and lower rectangular opening 211 is formed; Two or more adapter members 220 installed in the rectangular opening 211 to linearly move in the planar direction of the main body 210; When the device 10 is unloaded on the test socket 100, the adapter members 220 are retracted toward the main body 210, and the adapter member 220 is moved inward when the device 10 is loaded and inspected.
  • an adapter for a test socket characterized in that it comprises a moving means.
  • the adapter members 220 may be provided in one or more pairs on opposite sides of the inner sides of the rectangular opening 211.
  • the adapter members 220 may be provided in pairs or more at four vertices of four vertices of the rectangular opening 211.
  • the moving unit When the adapter member 220 is in close contact with the test socket 100, the moving unit may face the first inclined surface (not shown) formed on the adapter member 220 and the first inclined surface of the device 10.
  • the adapter member 220 may be configured to be in close contact with the test socket 100 by a combination of the second inclined surface to closely contact the side and the adapter member 220.
  • the moving means when the pressure of the adapter 200 to the test socket 100 is released by pressing the adapter member 220 to the outside to restore the adapter member 220 to the original position from the element 10 It may include an elastic member for completely retracting the adapter member 220.
  • the adapter member for guiding the device during device inspection and loading of the device is moved toward the device to maintain a constant alignment between the contact pin and the ball terminal and retreat to the outside when the device is unloaded. It does not interfere with the unloading of the device, there is an advantage to improve the reliability of the device inspection and to be able to perform the loading and unloading of the device quickly.
  • FIG. 1 is a plan view showing an adapter for a test socket according to the present invention.
  • FIG. 2 is a plan view illustrating a state in which the adapter member is retracted when the adapter for the test socket of FIG. 1 is unloaded.
  • FIG. 3 is a cross-sectional view taken along the III-III direction in FIG. 1.
  • FIG. 4 is a plan view and a cross-sectional view showing a state in which the adapter member is retracted when the adapter for the test socket of FIG. 3 is unloaded.
  • test socket adapter according to the present invention.
  • test socket adapter 200 As shown in FIGS. 1 to 4, the test socket adapter 200 according to the present invention is installed on a test socket 100 in which a plurality of contact pins 110 are installed, and an element on the test socket 100.
  • a test socket adapter 200 for guiding the loading of 10 comprising: a main body 210 provided on the test socket 100 and having a rectangular opening 211 penetrating up and down; Two or more adapter members 220 installed in the rectangular opening 211 so as to linearly move in the plane direction of the main body 210; Moving means for retracting the adapter member 220 toward the main body 210 during unloading of the device 10 on the test socket 100 and advancing the adapter member 220 inward during loading and inspection of the device 10. It includes.
  • the element 10 is a so-called ball grid array (BGA) in which a plurality of ball terminals 11 are provided on a bottom surface thereof.
  • BGA ball grid array
  • the test socket 100 may be installed on a board in a double row, or may be installed in various ways, such as a double row in a test module.
  • test socket 100 corresponds to a plurality of ball ends 11 installed on the bottom surface of the device 10, and a plurality of contact pins 110 are provided to supply power or signal.
  • the test socket 100 may have any configuration such as the structure shown in Registered Utility Model No. 20-0463425 provided that the plurality of contact pins 110 are installed.
  • the main body portion 210 is formed on the test socket 100 and is formed with a rectangular opening 211 penetrating the upper and lower sides, it can be configured in a variety of configurations, such as one member or a plurality of members.
  • main body 210 can be modified in various ways, such as having a configuration disclosed in registered Utility Model No. 20-0463425.
  • main body 210 may be coupled to a socket press installed on the upper side for loading / unloading of the device 10 with respect to the test socket 100.
  • the adapter members 220 may be configured in a rectangular opening 211 so as to linearly move in a plane direction of the main body 210.
  • the adapter members 220 may be installed to correspond to four sides of the rectangular opening 211.
  • the adapter members 220 are formed with at least one guide surface 221 which is an inclined surface for guiding the loading of the element 10 inward.
  • the guide surface 221 has the test socket 100 at a position where the device 10 is more accurate when the device 10 is loaded, that is, when the device 10 is dropped from the picker 20 to the test socket 100. ) To be seated on the
  • the four adapter members 220 correspond to two sides of the four sides of the rectangular opening 211, that is, the two sides opposite to each other, and are in contact with the sides of the device 10. 222 may be formed.
  • the vertical contact surface 222 is a device 10 and contact by pressing the side of the device 10 by advancing the adapter member 220 toward the side of the device 10, that is toward the inside during the device inspection after device loading It is possible to more accurately maintain the alignment of the pin (110).
  • the adapter members 220 may be installed such that at least a part thereof is fixed to the main body 210 and only a part of the adapter members 220 linearly moves in the plane direction of the main body 210.
  • the adapter members 220 For example, of the adapter members 220, only the adapter members 220 corresponding to two opposite sides of the four sides of the rectangular element 10 may be installed to linearly move in the plane direction of the main body 210. .
  • the adapter members 220 may be installed to correspond to the shape of the rectangular element 10 so as to correspond to two or more vertices and linearly move in the plane direction of the main body 210 instead of corresponding to each side.
  • the adapter members 220 may linearly move in the planar direction of the main body 210 in correspondence with vertices of the elements 10 facing each other, that is, vertices facing each other among four vertices of the rectangular opening 211. Can be installed as possible.
  • planar shape of the adapter member 220 may have a '-' shape.
  • the adapter members 220 retreat the adapter member 220 to the outside when the device 10 is unloaded so as not to disturb the unloading of the device 10, and loading and inspecting the device 10. Any configuration may be used as long as the position of the device 10 on the test socket 100 is accurately seated and the device inspection is performed stably by advancing toward the device 10.
  • the moving unit is configured to retract the adapter member 220 toward the main body 210 or to move inward, and various configurations are possible according to the linear movement method.
  • each side of the rectangular opening 211 may be installed inside the main body 210 to be operated by an external operating member to advance or retract each adapter member 220.
  • the moving means may move the adapter member 220 for guiding the device 10 in a suitable manner so as to be suitable for loading, unloading and inspection of the device 10.
  • the moving means may retract the adapter member 220 to the outside during the unloading of the element 10 so as not to interfere with the unloading of the element 10, and during the loading and inspection of the element 10 By advancing toward 10), the position of the device 10 on the test socket 100 can be accurately seated and the device inspection can be performed stably.
  • the horizontal movement position of the adapter member 220, the side of the device 10 and the adapter member 220 is in close contact during the device inspection, and when the device unloading retracts the adapter member 220 from the device 10 completely
  • the adapter member 220 may be positioned between the device inspection position and the device unloading position when the device is loaded to induce a stable loading of the device 10.
  • the moving means may include the side surface of the element 10 and the adapter 200 being pressed by the picker 20 or the like when the picker 20 picking up the element 10 is seated on the test socket 100.
  • the adapter member 220 may be in close contact, and may be configured to completely retract the adapter member 220 from the device 10 when the pressure is released by the picker 20.
  • the adapter member 220 is installed to be movable relative to the test socket 100, the test socket 100 has an elastic member (not shown) to restore to the original position when the pressure is released by the picker 20, etc. Can be installed.
  • the moving unit may face the first inclined surface (not shown) and the first inclined surface formed on the adapter member 220 so as to face the side surface of the device 10.
  • the adapter member 220 may be brought into close contact with the test socket 100 by the combination of the second inclined surfaces to closely contact the adapter member 220.
  • the moving means when the pressure of the adapter 200 against the test socket 100 by the picker 20 or the like is released by pressing the adapter member 220 to the outside to restore the adapter member 220 to the original position It may include an elastic member for completely retracting the adapter member 220 from (10).

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

La présente invention concerne un adaptateur de prise d'essai, et plus spécifiquement un adaptateur de prise d'essai pour le chargement d'un élément sur une prise d'essai. La présente invention, qui est un adaptateur de prise d'essai (200), disposé sur une prise d'essai (100) ayant une pluralité de broches de contact (110), pour guider le chargement d'un élément (10) sur la prise d'essai (100), comprend : un corps principal (210) disposée sur la prise d'essai (100) et ayant une ouverture rectangulaire (211) avec un sommet et un fond ouverts ; deux éléments adaptateurs ou plus (220) disposés sur l'ouverture rectangulaire (211) de manière à être déplacés linéairement dans la direction plane du corps principal (210) ; et un moyen de déplacement pour déplacer les éléments adaptateurs (220) de retour vers le corps principal (210) lorsque l'élément (10) est déchargé et vers l'avant dans la direction de l'intérieur lorsqu'il est testé.
PCT/KR2016/004819 2015-05-08 2016-05-09 Adaptateur de prise d'essai WO2016182289A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2015-0064434 2015-05-08
KR20150064434 2015-05-08

Publications (1)

Publication Number Publication Date
WO2016182289A1 true WO2016182289A1 (fr) 2016-11-17

Family

ID=57249136

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2016/004819 WO2016182289A1 (fr) 2015-05-08 2016-05-09 Adaptateur de prise d'essai

Country Status (3)

Country Link
KR (1) KR20160131965A (fr)
TW (1) TWI614507B (fr)
WO (1) WO2016182289A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108802436A (zh) * 2017-04-28 2018-11-13 株式会社爱德万测试 电子零件试验装置用的载体

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI705250B (zh) * 2019-07-17 2020-09-21 美商第一檢測有限公司 晶片測試裝置
KR20220114214A (ko) * 2021-02-08 2022-08-17 (주)테크윙 전자부품 테스트용 핸들러의 어댑터

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KR100843273B1 (ko) * 2007-02-05 2008-07-03 삼성전자주식회사 반도체 패키지를 테스트하기 위한 테스트 소켓 및 이를구비하는 테스트 장치, 반도체 패키지를 테스트하는 방법
US20080309348A1 (en) * 2007-06-18 2008-12-18 David Eldridge Integrated chip clamp adjustment assembly and method
KR20110085477A (ko) * 2010-01-20 2011-07-27 삼성전자주식회사 반도체 장치의 테스트 젠더
KR101245838B1 (ko) * 2012-03-28 2013-03-20 (주)마이크로컨텍솔루션 박막 반도체 패키지의 휨 방지를 위한 테스트용 엘지에이 타입의 소켓장치

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KR200165887Y1 (ko) * 1997-06-25 2000-01-15 김영환 비지에이 패키지 검사용 소켓
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US8310256B2 (en) * 2009-12-22 2012-11-13 Teradyne, Inc. Capacitive opens testing in low signal environments
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KR20070045816A (ko) * 2005-10-28 2007-05-02 삼성전자주식회사 얼라이너를 갖는 반도체 소자용 테스트 소켓
KR100843273B1 (ko) * 2007-02-05 2008-07-03 삼성전자주식회사 반도체 패키지를 테스트하기 위한 테스트 소켓 및 이를구비하는 테스트 장치, 반도체 패키지를 테스트하는 방법
US20080309348A1 (en) * 2007-06-18 2008-12-18 David Eldridge Integrated chip clamp adjustment assembly and method
KR20110085477A (ko) * 2010-01-20 2011-07-27 삼성전자주식회사 반도체 장치의 테스트 젠더
KR101245838B1 (ko) * 2012-03-28 2013-03-20 (주)마이크로컨텍솔루션 박막 반도체 패키지의 휨 방지를 위한 테스트용 엘지에이 타입의 소켓장치

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108802436A (zh) * 2017-04-28 2018-11-13 株式会社爱德万测试 电子零件试验装置用的载体
CN108802436B (zh) * 2017-04-28 2021-09-07 株式会社爱德万测试 电子零件试验装置用的载体

Also Published As

Publication number Publication date
TW201643436A (zh) 2016-12-16
KR20160131965A (ko) 2016-11-16
TWI614507B (zh) 2018-02-11

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