TWI614507B - Adapter for test socket - Google Patents

Abstract

The present invention relates to an adapter for a test socket, and in particular, it relates to an adapter for a test socket for loading a guide element on the test socket. The invention discloses an adapter for a test socket, which is provided with a plurality of connecting pins on a set test socket as an adapter for a test socket that guides loading of components on the test socket. The main feature of the adapter includes: a main body, a main body The upper part is arranged on the test socket and is formed by a right-angled quadrangular opening penetrating up and down; two or more adapter parts are arranged on the right-angled quadrangular opening and can move linearly along the plane direction of the main body; and a moving mechanism when unloading components on the test socket , Make the adapter part back toward the main body part, and advance the adapter part inward when the component is loaded and inspected.

Description

Test socket adapter

The present invention relates to an adapter for a test socket, and more particularly, it relates to an adapter for a test socket for loading a guide element on the test socket.

After the semiconductor components (hereinafter referred to as "components") are packaged, they are subjected to various tests such as electrical characteristics, heat or pressure confidence testing.

Burn-in test is used to test such semiconductor devices. In the burn-in test, most components are inserted, and the burn-in test substrate is stored in the burn-in test device. After applying a certain period of heat or pressure, , To determine the detection of component failure.

The component classification device for burn-in test generally refers to unloading components that have undergone burn-in test from the burn-in test substrate, and according to the test results of each component such as samples and defective products, following the classification criteria given, the components are classified by each tray. (Remove) the device for inserting (loading) the component into the vacancy of the aging substrate where the component is located to perform the aging test.

In addition, the performance of the component sorting device described above is evaluated in terms of the number of units per time (UPH: Units Per Hour). UPH is based on the transfer of components to and from the components constituting the component sorting device. The time required to age the test substrate is determined.

Therefore, in order to improve the performance UPH of the component classification device, it is necessary to improve the structure and arrangement of each constituent element.

In addition, among the test target elements, as a connector for connection to an external port, a so-called spherical matrix array element is provided on the bottom surface instead of the read end protruding to the side.

In addition, the detection of the spherical matrix array element is generally performed by inserting a plurality of connection pins corresponding to the respective balls, so-called test pins into a provided socket.

A test socket for such a spherical matrix array element has been disclosed in Korean Registered Utility Model No. 20-0463425.

In particular, in the utility model No. 20-0463425 registered in South Korea, an additional adapter is provided on the test socket to guide the loading of the spherical matrix arrangement element, and the arrangement state between the connecting pin and the ball joint is always Keeping it constant, the connection state can be kept constant, and accurate detection of components can be carried out effectively.

However, in the adapter structure disclosed in the registered Korean Utility Model No. 20-0463425, in order to stably load the component, there should be a side gap between the side of the element and the adapter. Due to this side gap, the connecting pin and the ball joint There is a problem in that the arrangement of the frames is disordered.

In addition, when a component is detached from the test socket, the component is caught in the adapter, and the operation of the device is stopped, which has a problem that the detection work efficiency is lowered.

An object of the present invention is to provide an adapter for a test socket that does not hinder the mounting and dismounting of components in order to solve the problems described above while maintaining a constant arrangement between the connecting pin and the ball joint.

The invention created by the present invention to achieve the above-mentioned object of the invention discloses an adapter for a test socket, which is provided on the test socket and guides loading of components on the test socket, wherein a plurality of connections are provided on the test socket. The pin is characterized in that it includes: a main body portion provided on the test socket and formed with a right-angled quadrangular opening penetrating up and down; two or more adapter parts provided on the right-angled quadrangular opening, and A linear movement of the main body in a planar direction; and a moving mechanism that retreats the adapter member toward the main body when unloading a component from the test socket, and causes the adapter component to be loaded and inspected when the component is unloaded Move inward.

Among the four sides of the right-angled quadrangular opening, the adapter member may be provided with one or more pairs on opposite sides.

Among the four vertices of the right-angled quadrangular opening, the adapter member may be provided with a pair or more on opposite vertices.

The moving mechanism is configured such that, when the adapter member is in close contact with the test socket, a first inclined surface formed on the adapter member and the first inclined surface are opposed to each other to form an element. Of the side and the second inclined surface of the adapter part close to each other Close, so that the adapter parts are close to the test socket.

The moving mechanism includes an elastic member. When the pressure on the adapter of the test socket is released, the adapter member is pressed to the outside. The elastic member can restore the adapter member to the original position, and the adapter member can be removed from the component. Back completely.

According to the adapter for a test socket of the present invention, when the component is inspected and the component is loaded, the adapter that guides the component moves toward the component, and the arrangement state between the connecting pin and the ball joint is kept constant. Unloading, thereby improving the credibility during component inspection, and has the advantages of quickly completing the loading and unloading of components.

10‧‧‧ Components

11‧‧‧ Ball Joint

100‧‧‧test socket

110‧‧‧Connecting Pin

20‧‧‧Pickup

200‧‧‧ test socket adapter

210‧‧‧Main body

211‧‧‧ opening

220‧‧‧ adapter parts

221‧‧‧Guide

222‧‧‧Vertical contact surface

FIG. 1 is a plan view illustrating an adapter for a test socket according to the present invention; FIG. 2 is a plan view illustrating a retracted state of an adapter component when the test socket adapter is unloaded in FIG. 1; and FIG. Sectional view in the direction of III-III; and FIG. 4 is a plan view and a cross-sectional view showing the retracted state of the adapter part when the test socket adapter of FIG. 3 is unloaded.

The following relates to an adapter for a test socket according to the present invention, and is described below with reference to the attached drawings.

The test socket adapter 200 according to the present invention is provided on the test socket 100 as shown in FIG. 1 to FIG. 4 to guide the loading of the component 10 on the test socket. The connection pins 110 disclose the following features, including: a main body portion 210 provided on the test socket 100 and formed with a right-angled quadrangular opening 211 penetrating vertically; two or more adapter parts 220 provided on the right-angled quadrangular The opening 211 and linearly move along the plane direction of the main body portion 210; and a moving mechanism, when the component 10 is unloaded on the test socket 100, the adapter component 220 is moved back toward the main body portion 210, and the component 10 is loaded and inspected to make the adapter The member 220 advances inward.

Here, the element 10 is provided with a plurality of spherical joints 11 on the bottom surface, and the spherical joints have a ball grid array structure. (BGA; Ball Grid Array).

The test sockets 100 are arranged on a substrate in a plurality of rows, or are arranged in a plurality of rows on a test module of a detection device, etc., and can be provided in various ways.

In addition, the test socket is provided with a plurality of connection pins 110 for applying power and signals, and the plurality of connection pins 110 correspond to a plurality of ball joints 11 provided on a bottom surface of the element 10.

As long as the test socket 100 is provided with a plurality of connection pins 110, any structure can be implemented, such as the structure disclosed in the registered Korean Utility Model No. 20-0463425.

The main body portion 210 is a structure formed on the test socket 100 to form a right-angled rectangular opening 211 penetrating vertically, and other structures such as a structure composed of one member or two members may be implemented.

In particular, as long as the main body 210 has a structure disclosed in the registered Korean Utility Model No. 20-0463425, other modified structures may be implemented.

Furthermore, other structures, such as a structure provided to press-fit the socket provided on the upper portion for loading or unloading the component 10 into the test socket 100, may be implemented.

For example, the adapter component 220 may be provided corresponding to each of the four sides of the right-angled quadrangular opening 211.

Also, the adapter member 220 forms at least one guide surface 221, which is also an inclined surface loaded along the inner guide element 10.

The guide surface 221 can load components to a more accurate position on the test socket 100 when the component 10 is loaded, that is, when the component 10 falls from the picker 20 to the test socket 100.

In addition, the four adapter parts 220 may form a vertical contact surface 222 corresponding to a side surface of the element 10, that is, two opposite sides of the four sides of the right-angled quadrangular opening 211, and contact the side surface of the element 10.

In the vertical contact surface 222, when the component is inspected after the component is loaded, the adapter component 220 advances toward the side of the component 10, that is, inward. By pressing the side of the component 10, the arrangement of the component 10 and the connecting pin 110 can be changed. Accurately maintained.

In addition, at least a part of the adapter member 220 is fixed to the main body portion 210 and is provided so that a part of the adapter member 220 can be linearly moved in a plane direction of the main body portion 210.

For example, the adapter member 220 is provided corresponding to two opposite sides of the four sides of the right-angled quadrangular element 10, and only the adapter member 220 is linearly movable in the plane direction of the main body portion 210.

In addition, the adapter member 220 is provided corresponding to two or more vertexes and can be linearly moved along the plane direction of the main body portion 210, instead of being provided corresponding to the shape of the right-angled quadrangular element 10 and corresponding to each side. .

For example, the adapter component 220 is provided in the vertices of the opposite element 10, that is, the four vertices of the right-angled quadrangular opening 211, corresponding to the opposite vertices and being linearly movable along the plane direction of the main body portion 210.

At this time, the planar shape of the adapter component may be a "┐" shape.

If it is sorted out, when the component 10 is unloaded, the adapter component 220 is moved backward to prevent the component 10 from being unloaded. When the component 10 and the detection component 10 are loaded, they are advanced in the direction of the component 10 so that the position of the component 10 is loaded more accurately. Any structure can be used as long as it is a structure capable of stably detecting components.

The moving mechanism is a structure in which the adapter member 220 is moved backward in the direction of the main body portion 210 or is moved inward, and may be implemented by any structure based on a linear movement method.

For example, corresponding to each side of the right-angled quadrangular opening 211, each adapter member 220 can be moved forward or backward by being provided on the inner side of the main body portion 210 and operating based on an external operating member.

Moreover, the moving mechanism can move the adapter part 220 of the guide element 10 based on a suitable manner to adapt it to the loading, unloading, and detection of the element 10.

For example, the moving mechanism retracts the adapter member 220 to the outside when the component 10 is unloaded, so as not to prevent the component 10 from being unloaded. When the component 10 is loaded and tested, it is advanced toward the component 10 so that the position of the component on the test socket 100 can be accurately loaded, and the inspection of the component can be accurately performed.

Here, in the horizontal moving position of the adapter component 220, the side of the component 10 and the adapter 220 are brought into close contact when the component is inspected; when the component is unloaded, the adapter component 220 is completely retracted from the component 10, so that the component unloading proceeds smoothly. When loading the component, place the adapter part 220 Between the component detection position and the component unloading position, the loading of the component 10 can be guided stably.

Specifically, the moving mechanism may be configured such that when the picker 20 picking up the component 10 loads it into the test socket 100, the adapter 200 is pressed based on the picker 20 and the like, and the side of the component 10 and the adapter part are simultaneously pressed. 220 clings. When the pressure is released by the pickup 20 or the like, the adapter member 220 is completely retracted from the element 10.

That is, the adapter member 220 is provided so as to be movable with respect to the test socket 100. An elastic member (not shown) may be provided on the test socket 100, and if the pressure is released by the picker 20 or the like, the original position can be restored.

In addition, when the adapter component 220 is in close contact with the test socket 100 in the moving mechanism, the adapter component 220 is in close contact with the test socket 100 according to the combination of the first inclined surface (not shown) and the second inclined surface. The first inclined surface is formed at the adapter member 220, the second inclined surface is opposite to the first inclined surface, and the side surface of the element 10 is closely attached to the adapter member 220.

In addition, the moving mechanism may include: an elastic member, based on the picker 20, etc., if the pressure on the adapter 200 of the test socket 100 is released, the adapter member 220 is pressed outward, and the elastic member can restore the adapter member 220 to The home position makes the adapter part 220 completely retract from the element 10.

The above is a description of not only a part of the implementation of the preferred embodiments based on the present invention. As is known to all, the scope of the present invention cannot be understood by being limited to the above embodiments. The technical idea of the present invention described above and the fundamental technical idea are included in the scope of the present invention.

10‧‧‧ Components

11‧‧‧ Ball Joint

100‧‧‧test socket

200‧‧‧ test socket adapter

210‧‧‧Main body

211‧‧‧ opening

Claims (3)

An adapter for a test socket is provided on the test socket (100), and guides the loading of the component (10) provided with a plurality of ball joints on the bottom surface of the test socket (100), wherein the test socket (100) is mounted on the test socket (100). A plurality of connection pins (110) are provided, and the adapter for a test socket includes: a main body portion (210) that is disposed on the test socket (100) and has a right-angled quadrangular opening penetrating vertically; two The above adapter component (220) is disposed in the right-angled quadrangular opening (211) and linearly moves along the plane direction of the main body portion (210); and a moving mechanism is unloaded on the test socket (100) When the component (10), the adapter component (220) is moved backward toward the main body portion (210), and when the component (10) is loaded, the adapter component (220) is advanced inward; the adapter component (220) Among the four sides of the right-angled quadrangular opening (211), a pair or more are provided on the opposite pair of sides, and the adapter part (220) forms a guide surface for loading the element (10) The element (10) toward the inside of the adapter part (220) In order to maintain a stable arrangement between the connecting pin (110) of the test socket (100) and the ball joint of the element (10), the adapter part (220) maintains stability when detecting the element (10). The side of the element (10) loaded on the test socket (100) is pressurized. The adapter for a test socket according to item 1 of the scope of patent application, wherein the moving mechanism is configured in such a manner that, when the adapter member (220) is in close contact with the test socket (100), it is formed by The first inclined surface on the adapter component (220) and the second inclined surface opposite to the first inclined surface so that the side surface of the element (10) and the adapter component (220) are in close contact with each other so that the adapter component (220) Close to the test socket (100). The adapter for a test socket according to item 2 of the scope of patent application, wherein the moving mechanism includes an elastic member, and when the pressure on the adapter (200) of the test socket (100) is released, the adapter member (220) Apply pressure to the outside to make the adapter part (220) The original position is restored, so that the adapter part (220) is completely retracted from the element (10).