WO2016020905A3 - データ表示システム - Google Patents

データ表示システム Download PDF

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Publication number
WO2016020905A3
WO2016020905A3 PCT/IB2015/057622 IB2015057622W WO2016020905A3 WO 2016020905 A3 WO2016020905 A3 WO 2016020905A3 IB 2015057622 W IB2015057622 W IB 2015057622W WO 2016020905 A3 WO2016020905 A3 WO 2016020905A3
Authority
WO
WIPO (PCT)
Prior art keywords
malfunction
parameters
degree
variation
analyst
Prior art date
Application number
PCT/IB2015/057622
Other languages
English (en)
French (fr)
Other versions
WO2016020905A2 (ja
Inventor
内田貴之
崎村茂寿
高土和行
藤城孝宏
蛭田智昭
Original Assignee
株式会社日立製作所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社日立製作所 filed Critical 株式会社日立製作所
Priority to US15/501,999 priority Critical patent/US20170307480A1/en
Publication of WO2016020905A2 publication Critical patent/WO2016020905A2/ja
Publication of WO2016020905A3 publication Critical patent/WO2016020905A3/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M99/00—Subject matter not provided for in other groups of this subclass
    • G01M99/008—Subject matter not provided for in other groups of this subclass by doing functionality tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M15/00—Testing of engines
    • G01M15/02—Details or accessories of testing apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M99/00—Subject matter not provided for in other groups of this subclass
    • G01M99/005—Testing of complete machines, e.g. washing-machines or mobile phones
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0267—Fault communication, e.g. human machine interface [HMI]
    • G05B23/0272—Presentation of monitored results, e.g. selection of status reports to be displayed; Filtering information to the user
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/14—Digital output to display device ; Cooperation and interconnection of the display device with other functional units
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/14—Digital output to display device ; Cooperation and interconnection of the display device with other functional units
    • G06F3/147—Digital output to display device ; Cooperation and interconnection of the display device with other functional units using display panels
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T11/00—2D [Two Dimensional] image generation
    • G06T11/20—Drawing from basic elements, e.g. lines or circles
    • G06T11/206—Drawing of charts or graphs
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2200/00—Indexing scheme for image data processing or generation, in general
    • G06T2200/24—Indexing scheme for image data processing or generation, in general involving graphical user interfaces [GUIs]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • General Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)

Abstract

機械の異常診断の精度改善にはクラスタ数など診断に関するパラメータの調整が必 須である。その調整作業では診断パラメータの変更の度に、診断結果が改善したか分 析者による確認作業が必要になる。そこで本発明ではパラメータ変更前後の診断結果 を比較することで診断精度 が向上できたかを確認する作業を支援する。診断するセン サデータの点数が多い場合、その診断結果である異常度のデータ点数も多くなる。デ ータ点数が多くなると診断結果の比較作業に時間がかかってしまう問題がある。デー タ表示システムでは、パラメータ変更の前後で大きく変化した異常度のデータを自動 的に見つけて分析者に表示する。異常度の変化の大きさは「異常度の変化差分」と「 変更したパラメータの差分」の比を異常度変化率として決める。変化率が大きい異常 度のみ分析者に表示する。加えてパラメータの変更途中でより適したパラメータが隠 れていた場合にも分析者に表示、提示する。
PCT/IB2015/057622 2014-08-07 2015-10-06 データ表示システム WO2016020905A2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US15/501,999 US20170307480A1 (en) 2014-08-07 2015-10-06 Data Display System

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014160938A JP6326321B2 (ja) 2014-08-07 2014-08-07 データ表示システム
JP2014-160938 2014-08-07

Publications (2)

Publication Number Publication Date
WO2016020905A2 WO2016020905A2 (ja) 2016-02-11
WO2016020905A3 true WO2016020905A3 (ja) 2016-03-31

Family

ID=55264721

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IB2015/057622 WO2016020905A2 (ja) 2014-08-07 2015-10-06 データ表示システム

Country Status (3)

Country Link
US (1) US20170307480A1 (ja)
JP (1) JP6326321B2 (ja)
WO (1) WO2016020905A2 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108628263B (zh) * 2017-03-22 2021-09-21 欧姆龙株式会社 控制系统、控制装置、计算机可读存储介质以及控制方法

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6326321B2 (ja) * 2014-08-07 2018-05-16 株式会社日立製作所 データ表示システム
WO2018051568A1 (ja) * 2016-09-15 2018-03-22 株式会社日立製作所 プラント異常診断装置及びプラント異常診断システム
US10552529B2 (en) * 2017-05-03 2020-02-04 International Business Machines Corporation Data change alerts in a collaborative environment
JP2019016209A (ja) * 2017-07-07 2019-01-31 株式会社東芝 診断装置、診断方法およびコンピュータプログラム
JP6791892B2 (ja) * 2018-01-18 2020-11-25 ファナック株式会社 異常検知パラメータ調整表示装置
JP6708676B2 (ja) * 2018-02-27 2020-06-10 ファナック株式会社 異常要因特定装置
CN110569409B (zh) * 2018-05-18 2024-04-05 北京京东尚科信息技术有限公司 数据补差显示方法、系统、设备和存储介质
JP7084218B2 (ja) * 2018-06-13 2022-06-14 三菱重工業株式会社 情報中継装置、遠隔サービスシステム、情報中継方法及びプログラム
JP7367366B2 (ja) * 2019-07-23 2023-10-24 オムロン株式会社 異常検知装置、異常検知方法、および異常検知プログラム
GB202104306D0 (en) * 2021-03-26 2021-05-12 Rolls Royce Plc Computer-implemented methods for indicating damage to an aircraft
WO2023139790A1 (ja) * 2022-01-24 2023-07-27 ファナック株式会社 診断装置及びコンピュータ読み取り可能な記録媒体
CN114910733B (zh) * 2022-07-15 2022-09-30 深圳益实科技有限公司 一种基于人工智能的显示器故障智能诊断分析系统

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005092466A (ja) * 2003-09-16 2005-04-07 Toshiba Corp 診断プロセス支援方法とそのためのプログラム
JP2005284405A (ja) * 2004-03-26 2005-10-13 Matsushita Electric Works Ltd 異常診断装置
JP2013025367A (ja) * 2011-07-15 2013-02-04 Wakayama Univ 設備状態監視方法およびその装置
JP2013041448A (ja) * 2011-08-17 2013-02-28 Hitachi Ltd 異常検知・診断方法、および異常検知・診断システム
JP2014032455A (ja) * 2012-08-01 2014-02-20 Hitachi Power Solutions Co Ltd 設備状態監視方法およびその装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000121382A (ja) * 1998-10-13 2000-04-28 Hitachi Ltd 時系列データ修正装置
JP2013152655A (ja) * 2012-01-26 2013-08-08 Hitachi Ltd プラント又は設備の異常診断方法及びヘルスマネージメント方法
JP5950794B2 (ja) * 2012-11-01 2016-07-13 三菱電機株式会社 データロガー装置
JP6326321B2 (ja) * 2014-08-07 2018-05-16 株式会社日立製作所 データ表示システム

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005092466A (ja) * 2003-09-16 2005-04-07 Toshiba Corp 診断プロセス支援方法とそのためのプログラム
JP2005284405A (ja) * 2004-03-26 2005-10-13 Matsushita Electric Works Ltd 異常診断装置
JP2013025367A (ja) * 2011-07-15 2013-02-04 Wakayama Univ 設備状態監視方法およびその装置
JP2013041448A (ja) * 2011-08-17 2013-02-28 Hitachi Ltd 異常検知・診断方法、および異常検知・診断システム
JP2014032455A (ja) * 2012-08-01 2014-02-20 Hitachi Power Solutions Co Ltd 設備状態監視方法およびその装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108628263B (zh) * 2017-03-22 2021-09-21 欧姆龙株式会社 控制系统、控制装置、计算机可读存储介质以及控制方法

Also Published As

Publication number Publication date
WO2016020905A2 (ja) 2016-02-11
JP6326321B2 (ja) 2018-05-16
US20170307480A1 (en) 2017-10-26
JP2016038688A (ja) 2016-03-22

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