WO2015178339A1 - ガラス基板、ガラス基板の製造方法、およびブラックマトリクス基板 - Google Patents
ガラス基板、ガラス基板の製造方法、およびブラックマトリクス基板 Download PDFInfo
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- WO2015178339A1 WO2015178339A1 PCT/JP2015/064163 JP2015064163W WO2015178339A1 WO 2015178339 A1 WO2015178339 A1 WO 2015178339A1 JP 2015064163 W JP2015064163 W JP 2015064163W WO 2015178339 A1 WO2015178339 A1 WO 2015178339A1
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- glass substrate
- value
- glass
- cleaning
- film
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C15/00—Surface treatment of glass, not in the form of fibres or filaments, by etching
- C03C15/02—Surface treatment of glass, not in the form of fibres or filaments, by etching for making a smooth surface
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C19/00—Surface treatment of glass, not in the form of fibres or filaments, by mechanical means
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C23/00—Other surface treatment of glass not in the form of fibres or filaments
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P40/00—Technologies relating to the processing of minerals
- Y02P40/50—Glass production, e.g. reusing waste heat during processing or shaping
- Y02P40/57—Improving the yield, e-g- reduction of reject rates
Definitions
- the present invention relates to a glass substrate, a glass substrate manufacturing method, and a black matrix substrate.
- a glass substrate used in an FPD such as a liquid crystal display device (LCD) is manufactured by, for example, forming a glass ribbon from a molten glass by a float method or a fusion method, and cutting out the glass ribbon.
- a highly hydrophilic layer containing excessive OH groups hereinafter referred to as OH-rich hydrophilic layer
- OH-rich hydrophilic layer a highly hydrophilic layer containing excessive OH groups
- an abrasive (slurry) containing cerium oxide particles as abrasive grains is used for polishing such a glass substrate. Further, after polishing, residues such as abrasive grains adhering to the surface of the glass substrate are cleaned and removed with a cleaning liquid (see, for example, Patent Document 1).
- An acidic cleaning liquid containing an organic acid such as organic phosphonic acid is effective for removing residues such as abrasives containing abrasive grains of cerium oxide particles.
- a black matrix film for color filter (hereinafter referred to as BM) is formed on the surface using a resin composition containing a black pigment such as carbon black.
- BM black matrix film for color filter
- the present invention has been made in order to solve the above-described problems.
- the resin-based BM film (hereinafter also referred to as a resin BM film) formed on the surface has high adhesion, and the resin BM film is peeled off.
- the purpose is to provide a difficult glass substrate.
- the adhesion of the resin BM film formed on the surface of the glass substrate after cleaning is suppressed to prevent the resin BM film from peeling off.
- An object of the present invention is to provide a glass substrate manufacturing method that can be used.
- the glass substrate of the present invention is a glass substrate made of silicate glass containing aluminum, and the atomic concentration of aluminum in the glass substrate (hereinafter referred to as Al concentration) and silicon measured by X-ray photoelectron spectroscopy.
- Al concentration the atomic concentration of aluminum in the glass substrate
- Si concentration the atomic concentration
- the ⁇ Al / Si value is preferably 0.19 or less. Moreover, it is preferable that the arithmetic mean surface roughness of the surface of the said glass substrate is 0.2 nm or less.
- the silicate glass containing aluminum is preferably an aluminoborosilicate glass having a composition containing SiO 2 , Al 2 O 3 , B 2 O 3 , and an alkaline earth metal oxide, The contained silicate glass is preferably an aluminoborosilicate glass that does not substantially contain an alkali metal component.
- the method for producing a glass substrate of the present invention is a method for producing the glass substrate of the present invention, wherein a glass substrate polished with an abrasive containing abrasive grains is washed with an aqueous cleaning solution having a pH of greater than 2.7. It is characterized by that.
- the abrasive grains are preferably cerium oxide particles.
- the black matrix substrate of the present invention is characterized in that a BM film is formed on the glass substrate of the present invention.
- the adhesiveness of the resin BM film formed on the surface is good, and peeling of the resin BM film is prevented.
- a glass substrate having good adhesion of the resin BM film formed on the surface and hardly causing the resin BM film to peel off can be obtained.
- the glass substrate which concerns on embodiment of this invention is a glass substrate which consists of silicate glass containing aluminum, and it is similarly X-ray photoelectron spectroscopy from the Al / Si value inside a glass substrate measured by X-ray photoelectron spectroscopy.
- the ⁇ Al / Si value which is a value obtained by subtracting the Al / Si value of the surface of the glass substrate, measured by the method is 0.25 or less.
- the ⁇ Al / Si value is preferably closer to 0 (zero). Specifically, the ⁇ Al / Si value is preferably 0.19 or less, and more preferably 0.15 or less.
- the glass substrate of the embodiment is a glass substrate for FPD such as an LCD, for example.
- the glass constituting the glass substrate is not limited in composition as long as it is made of silicate glass containing an aluminum component, but SiO 2 , Al 2 O 3 , B 2 O 3 , and alkaline earth metal oxides
- An aluminoborosilicate glass having a composition containing is preferable, and so-called alkali-free aluminoborosilicate glass that does not substantially contain an alkali metal component in the glass composition is more preferable.
- that it does not contain an alkali metal component substantially means that content of the alkali metal oxide in a glass composition is 1 mass% or less in total, Preferably it is 0.1 mass% or less.
- the glass substrate according to the embodiment of the present invention has a strain point of 630 ° C. or higher, preferably 650 ° C. or higher, and a composition expressed in mass percentage on an oxide basis.
- An alkali-free glass containing is preferred.
- the Al concentration and Si concentration inside and on the surface of the glass substrate are values measured by X-ray photoelectron spectroscopy.
- the depth from the surface of the point where the Al concentration and the Si concentration in the glass substrate are measured is determined as follows. That is, while forming a recess hole (crater) on a glass substrate by using a C 60 ion sputtering to measure the Al concentration and Si concentration at the bottom of the concave hole of varying depth, the distribution in the depth direction of each atom concentration Ask for.
- the depth at which the distribution in the depth direction of the Al concentration and the Si concentration is constant is obtained, and the value of the ratio between the Al concentration and the Si concentration measured at the depth is defined as the Al / Si value inside the glass substrate.
- the ⁇ Al / Si value which is a value obtained by subtracting the Al / Si value of the surface of the glass substrate from this value, is obtained.
- the degree of decrease in the Al / Si value on the surface of the glass substrate relative to the Al / Si value inside the glass substrate is a predetermined value (0.25) or less. Since it is suppressed, the adhesiveness of the resin BM film formed on the surface of the glass substrate is good, and the resin BM film is hardly peeled off.
- the ⁇ Al / Si value indicating how much the Al / Si value on the surface of the glass substrate is lower than the Al / Si value inside the glass substrate where the Al component does not escape is the OH-rich hydrophilic layer. Indicates the degree of formation. That is, the lower the ⁇ Al / Si value, the smaller the deficiency of the Al component on the surface of the glass substrate, and the lower the hydrophilicity attributed to the OH groups on the surface of the glass substrate.
- the ⁇ Al / Si value which is a value obtained by subtracting the Al / Si value on the surface of the glass substrate from the Al / Si value inside the glass substrate, is 0.25 or less, the OH on the surface of the glass substrate.
- the hydrophilicity attributed to the group is low. Therefore, when the resin BM film is formed on the glass substrate, the intrusion of the developer into the interface between the glass substrate and the resin composition film for BM formation is suppressed, and the adhesion of the resin BM film is improved and the film is peeled off. Is prevented.
- the glass substrate of the present invention having a ⁇ Al / Si value of 0.25 or less can be obtained by the following method.
- the glass substrate which concerns on embodiment of this invention is shape
- the manufacturing method of the glass substrate of embodiment of this invention is demonstrated below as what has a grinding
- the manufacturing method of the glass substrate of embodiment comprises the grinding
- the glass substrate of the above-mentioned this invention can be obtained by wash
- the pH of the aqueous cleaning solution is preferably 3.0 or more, and more preferably 3.5 or more.
- the glass substrate that is the object to be cleaned is an FPD glass substrate such as an LCD, and is polished with an abrasive containing abrasive grains.
- the glass constituting the glass substrate is preferably an aluminoborosilicate glass having a composition containing oxides of SiO 2 , Al 2 O 3 , B 2 O 3 , and an alkaline earth metal, and the glass composition is alkali. More preferred is an aluminoborosilicate glass that does not substantially contain a metal component.
- the surface of such a glass substrate is polished with a polishing agent (slurry) containing abrasive grains using, for example, a polishing pad.
- the abrasive grains contained in the abrasive are not particularly limited, and examples thereof include silica particles, alumina particles, cerium oxide particles, titania particles, zirconia particles, manganese oxide particles, and the like. Cerium particles are preferred.
- the average particle size of the abrasive grains is preferably in the range of 0.8 to 1.0 ⁇ m, for example.
- the arithmetic average surface roughness Ra (JIS B0601-2013) of the surface of the glass substrate is preferably 0.2 nm or less.
- Examples of the aqueous cleaning liquid having a pH higher than 2.7 used in the embodiment of the present invention include the following acidic cleaning liquid containing an organic acid and alkaline cleaning liquid.
- the pH of the aqueous cleaning liquid is preferably less than 11, and more preferably less than 9. From the above, the pH of the aqueous cleaning liquid is more preferably in the range of 3.5 or more and less than 9.
- organic acid contained in the acidic cleaning liquid examples include, but are not limited to, organic carboxylic acids such as ascorbic acid and citric acid, and organic phosphonic acids.
- organic carboxylic acids such as ascorbic acid and citric acid
- organic phosphonic acids organic acids
- inorganic acids for example, sulfuric acid, phosphoric acid, nitric acid, hydrofluoric acid, hydrochloric acid, etc.
- inorganic acids can be added to the cleaning liquid, and inorganic acids can be used alone.
- inorganic acid in order to suppress the fluctuation
- a compound such as an organic carboxylic acid or organic phosphonic acid having a chelating effect may be included in the cleaning liquid from the viewpoint of detergency.
- examples of the organic carboxylic acid having a chelating effect include a dicarboxylic acid chelating agent, a tricarboxylic acid chelating agent, a gluconic acid chelating agent, a nitrilotriacetic acid chelating agent, and an iminosuccinic acid chelating agent.
- the organic phosphonic acid refers to an organic compound having a structure in which a phosphonic acid group represented by the formula: —P ( ⁇ O) (OH) 2 is bonded to a carbon atom.
- the number of phosphonic acid groups represented by the above formula per molecule of organic phosphonic acid is preferably 2 or more, more preferably 2 to 8, and particularly preferably 2 to 4.
- organic phosphonic acid a compound having a structure in which a hydrogen atom bonded to a carbon atom of hydrocarbons which may have a substituent is substituted with a phosphonic acid group, and a nitrogen atom of ammonia or amines are bonded.
- a compound having a structure in which a hydrogen atom is substituted with a methylenephosphonic acid group represented by —CH 2 —P ( ⁇ O) (OH) 2 is preferable.
- the organic phosphonic acid is methyldiphosphonic acid, 1-hydroxyethane-1,1-diphosphonic acid, aminotri (methylenephosphonic acid), ethylenediaminetetra (methylenephosphonic acid), hexamethylenediaminetetra (methylenephosphonic acid).
- Propylenediaminetetra (methylenephosphonic acid), diethylenetriaminepenta (methylenephosphonic acid), triethylenetetraminehexa (methylenephosphonic acid), tris (2-aminoethyl) aminehexa (methylenephosphonic acid), trans-1,2-cyclohexane
- Examples thereof include diamine tetra (methylene phosphonic acid), glycol ether diamine tetra (methylene phosphonic acid), and tetraethylenepentamine hepta (methylene phosphonic acid).
- the alkaline cleaning liquid contains a base, and can contain a chelating agent and a surfactant in addition to the base.
- the chelating agent may be included in the cleaning liquid from the viewpoint of cleaning properties.
- it is better not to contain the chelating agent in the cleaning liquid from the viewpoint of the adhesion of the resin BM film.
- Examples of the base contained in the alkaline cleaning liquid include alkali metal compounds such as alkali metal hydroxides and alkali metal carbonates, amines, and quaternary ammonium hydroxide.
- alkali metal hydroxides such as potassium hydroxide and sodium hydroxide are preferable.
- chelating agents examples include ethylenediaminetetraacetic acid chelating agents, gluconic acid chelating agents, nitrilotriacetic acid chelating agents, and iminosuccinic acid chelating agents.
- an ethylenediaminetetraacetic acid chelating agent is preferable.
- the surfactant a nonionic surfactant is preferable.
- an acidic detergent stock solution is diluted with water so that the pH is higher than 2.7 (acid cleaning solution), or an alkaline detergent stock solution is diluted with water (alkaline).
- the surface of the glass substrate after polishing is cleaned using a cleaning solution. It is preferable to wash by a single wafer method.
- the cleaning method is not particularly limited as long as the cleaning liquid is in contact with the surface of the glass substrate for cleaning.
- As the cleaning method for example, scrub cleaning, shower cleaning (jet cleaning), dip (immersion) cleaning, and the like can be used.
- the temperature of the cleaning liquid is not particularly limited and is used at room temperature (15 ° C.) to 95 ° C.
- the drying method include a method of blowing warm air, a method of blowing compressed air, and the like.
- the water system sprayed from the cleaning nozzle 4 on the upper and lower surfaces of the glass substrate 3 that is continuously transported in the cleaning chamber 2 in the horizontal direction by a mechanism such as a transport roll 1.
- a method of scrubbing (rubbing) the upper and lower surfaces of the glass substrate 3 with the rotating brushes 6 disposed on the upper and lower surfaces of the glass substrate 3 while spraying the cleaning liquid 5 can be employed.
- the cleaning unit composed of the cleaning nozzle 4 for spraying the aqueous cleaning liquid 5 and the rotating brush 6 may be provided in only one stage, but may be provided in a plurality of stages. In the cleaning method shown in FIG. 1, the cleaning unit has two stages.
- the aqueous cleaning liquid 5 sprayed in each stage has the same composition from either an acidic cleaning liquid or an alkaline cleaning liquid from the viewpoint of workability.
- the pH of the cleaning liquid is in the above range, it is possible to perform cleaning using different aqueous cleaning liquids 5 at each stage.
- the rotating brush 6 for cleaning a plurality of cylindrical brushes having an outer diameter of 70 to 100 mm made of PVA (polyvinyl alcohol) foam or the like are used. These rotating brushes 6 are arranged so that the rotation axis of the rotating brush 6 is perpendicular to the surface to be cleaned of the glass substrate 3, here the upper and lower surfaces, and the tip of the rotating brush 6 is covered by the glass substrate 3. Arrange it so that it is in contact with the surface to be cleaned or spaced from the surface to be cleaned by less than 2 mm.
- the rotation speed of the rotary brush 6 is preferably 100 to 500 rpm.
- aqueous cleaning liquid 5 a solution obtained by diluting the above-described acidic cleaning agent stock solution or alkaline cleaning agent stock solution with water to a desired pH is used, and the flow rate (injection amount) of the diluted cleaning solution, that is, the aqueous cleaning solution 5 is used. ) Is preferably 15 to 40 L / min. The scrub time is preferably 1.5 seconds or longer.
- the glass substrate polished with the abrasive containing cerium oxide particles is washed with an aqueous cleaning solution having a pH of greater than 2.7 in the cleaning step.
- the ⁇ Al / Si value obtained by subtracting the Al / Si value on the surface of the glass substrate from the internal Al / Si value is adjusted to 0.25 or less.
- the formation of the OH-rich hydrophilic layer on the surface of the glass substrate is suppressed.
- the developer enters the interface between the surface of the glass substrate and the resin composition film for BM formation.
- the adhesion of the resin BM film is improved. Therefore, it is possible to obtain a glass substrate in which the adhesion of the resin BM film is good and film peeling is prevented.
- Examples 1 to 3, Comparative Example 1 The surface of the glass substrate was polished as shown below.
- a glass substrate for LCD As the glass substrate, a glass substrate for LCD (Asahi Glass Co., Ltd., trade name: AN100) made of aluminoborosilicate glass was used. Then, the surface of the glass substrate was polished with a polishing pad containing a cerium oxide particle having an average particle size of 0.8 to 1.0 ⁇ m (made by Showa Denko KK, trade name: SHOROX A10). Polished using. Then, the glass substrate whose surface was polished was cleaned using the cleaning method shown in FIG.
- Example 1 an alkaline detergent stock solution (manufactured by Parker Corporation, trade name: PK-LCG28) diluted with water so as to have a pH of 8.9 was used as an aqueous cleaning solution.
- Example 2 and Example 3 what diluted the acidic cleaning agent stock solution with water so that pH might be set to 5.3 (Example 2) and 3.9 (Example 3), respectively, is an aqueous cleaning solution.
- the acidic detergent stock solution is PK-LCG492A (trade name of acidic detergent stock solution manufactured by Parker Corporation) with the concentration of organic phosphonic acid in the solution being 1 ⁇ 4.
- PK-LCG492A trade name of acidic detergent stock solution manufactured by Parker Corporation
- Comparative Example 1 an acidic detergent stock solution (manufactured by Parker Corporation, trade name: PK-LCG492A) diluted with water so as to have a pH of 2.7 was used as an aqueous cleaning solution.
- the adhesion of the resin BM film was measured and evaluated by the following method. Further, the Al / Si value (also referred to as surface Al / Si value) on the surface of the glass substrate, the Al / Si value inside the glass substrate (also referred to as internal Al / Si value), and the ⁇ Al / Si value were determined.
- this BM-forming resin composition was applied (spin coated) for 10 seconds at 200 rpm using a spin coater (manufactured by Mikasa Co., Ltd., apparatus name: MS-A100) on the surface of the cleaned glass substrate.
- a spin coater manufactured by Mikasa Co., Ltd., apparatus name: MS-A100
- the coating film was formed by heating and drying at 90 ° C. for 60 seconds.
- the photomask had four types of pattern shapes L1 to L4 shown below, and a total of 110 types of patterns in which the line width was changed by 1 ⁇ m for each type.
- L1 .
- 25 linear patterns in one block 2835 ⁇ m ⁇ 2000 ⁇ m
- a pattern spacing of 100 ⁇ m the line width is variable in the range of 1 to 25 ⁇ m
- L2 .
- 30 linear patterns in one block (2952.6 ⁇ m ⁇ 2000 ⁇ m) with a pattern spacing of 50 ⁇ m (the line width is variable in the range of 1 to 30 ⁇ m) L3 .
- the glass substrate after cleaning with pure water was observed with a laser microscope (manufactured by Keyence Corporation, apparatus name: VK-9510), and the line width of the mask in which the pattern of the resin BM film remained on the glass substrate (hereinafter referred to as residual resolution).
- the four types of pattern shapes L1 to L4 were examined. And the average of the remaining resolution about each of four types of pattern shapes was calculated
- the depth profile of the Al concentration and Si concentration was determined by XPS using C 60 ion sputtering.
- the same XPS measurement apparatus and analysis software as those used for the measurement of the surface Al / Si value were used.
- the measurement conditions were a path energy of 117.4 eV, an energy step of 0.5 eV / step, monitor peaks of Si (2p) and Al (2p), and a detection angle of 75 °.
- the sputtering interval was set to 5 minutes, and each time the sputtering was performed for 5 minutes, the Al concentration and the Si concentration at the bottom of the formed crater were measured.
- Table 1 shows the residual resolution, surface Al / Si value, internal Al / Si value, and ⁇ Al / Si value thus measured for the glass substrates obtained in Examples 1 to 3 and Comparative Example 1.
- FIG. 3 shows the relationship between the pH of the aqueous cleaning solution and the ⁇ Al / Si value
- FIG. 4 shows the relationship between the ⁇ Al / Si value and the remaining resolution.
- FIG. 3 shows that there is a negative correlation between the pH of the aqueous cleaning liquid and the ⁇ Al / Si value, and the ⁇ Al / Si value tends to decrease as the pH of the aqueous cleaning liquid increases.
- FIG. 4 shows that there is a positive correlation between the ⁇ Al / Si value and the remaining resolution, and that the remaining resolution tends to decrease as the ⁇ Al / Si value decreases.
- the smaller the remaining resolution the higher the adhesiveness of the resin BM film formed on the glass substrate after cleaning. Therefore, the smaller the ⁇ Al / Si value, the higher the adhesiveness of the resin BM film. I understand.
- the adhesion of the resin BM film formed on the surface is good, and peeling of the resin BM film is prevented. Therefore, the glass substrate of the present invention can be effectively applied to a glass substrate used for FPD such as LCD. Moreover, according to the manufacturing method of the glass substrate of this invention, the glass substrate suitable as a glass substrate for FPD in this way can be obtained efficiently.
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Abstract
Description
特に溶融ガラスから板状に成形されたガラスを、自転および公転する研磨具で研磨する場合に顕著である。研磨工程では表面の微小な凹凸やうねりを除去することによって、FPD用ガラス基板に要求される平坦度を満足する所定の厚さ(例えば、0.1~1.1mm)の薄板状に形成している。
また、本発明は、研磨後のガラス基板の表面を洗浄するにあたり、洗浄後のガラス基板の表面に形成される樹脂BM膜の密着性低下を抑制して、樹脂BM膜の剥れを防止することが可能なガラス基板の製造方法を提供することを目的としている。
また、前記アルミニウムを含むケイ酸ガラスが、SiO2、Al2O3、B2O3、およびアルカリ土類金属の酸化物を含む組成を有するアルミノホウケイ酸ガラスであることが好ましく、前記アルミニウムを含むケイ酸ガラスは、アルカリ金属成分を実質的に含有しないアルミノホウケイ酸ガラスであることが好ましい。
また、本発明のガラス基板の製造方法によれば、表面に形成される樹脂BM膜の密着性が良好であり、樹脂BM膜の剥れが生じにくいガラス基板を得ることができる。
本発明の実施形態に係るガラス基板は、アルミニウムを含むケイ酸ガラスからなるガラス基板であり、X線光電子分光法により測定された、ガラス基板の内部のAl/Si値から、同じくX線光電子分光法により測定された、ガラス基板の表面のAl/Si値を差し引いた値であるΔAl/Si値が、0.25以下のものである。ΔAl/Si値は、0(ゼロ)に近いほど好ましい。具体的には、ΔAl/Si値は0.19以下が好ましく、0.15以下がより好ましい。
例えば、本発明の実施形態に係るガラス基板は、歪点が630℃以上、好ましくは650℃以上で、組成が、酸化物基準の質量百分率表示で、
SiO2:54~73
Al2O3:10~23
B2O3:0 ~12
MgO:0~12
CaO:0~15
SrO:0~16
BaO:0~15
MgO+CaO+SrO+BaO:8~26
を含有する無アルカリガラスが好ましい。
すなわち、C60イオンスパッタリングを用いてガラス基板に凹穴(クレータ)を形成しながら、いろいろな深さの凹穴の底部でAl濃度およびSi濃度を測定し、各原子濃度の深さ方向の分布を求める。そして、Al濃度およびSi濃度の深さ方向の分布が一定になる深さを求め、その深さで測定したAl濃度とSi濃度との比の値を、ガラス基板の内部のAl/Si値とし、この値からガラス基板の表面のAl/Si値を差し引いた値であるΔAl/Si値を求める。
本発明の実施形態に係るガラス基板は、フロート法やフュージョン法により溶融ガラスから板状のガラスリボンに成形され、ガラスリボンから所定の大きさに切り出されて製造される。また、必要に応じて板状に成形されたガラスを研磨する。
本発明の実施形態のガラス基板の製造方法は、研磨工程を有するものとして以下に説明する。実施形態のガラス基板の製造方法は、ガラス基板を砥粒を含有する研磨剤により研磨する研磨工程と、研磨されたガラス基板を洗浄する洗浄工程とを備える。そして、砥粒を含有する研磨剤により研磨されたガラス基板を、pHが2.7より大きい水系洗浄液により洗浄することにより、前記した本発明のガラス基板を得ることができる。水系洗浄液のpHは、3.0以上が好ましく、3.5以上がより好ましい。
ガラス基板を構成するガラスは、前記したように、SiO2、Al2O3、B2O3、およびアルカリ土類金属の酸化物を含む組成を有するアルミノホウケイ酸ガラスが好ましく、ガラス組成にアルカリ金属成分を実質的に含有しないアルミノホウケイ酸ガラスがより好ましい。
酸性の洗浄液に含有される有機酸としては、例えば、アスコルビン酸、クエン酸のような有機カルボン酸や、有機ホスホン酸等が挙げられるが、これらに限定されない。洗浄液には、これらの有機酸とともに、無機酸(例えば、硫酸、リン酸、硝酸、フッ酸、塩酸など)を加えることができ、無機酸を単独で使用することも可能である。また、前記無機酸を使用した場合、pHの変動を抑制するために、無機酸とともにこれらの酸の塩を加えることも可能である。
具体的には、有機ホスホン酸は、メチルジホスホン酸、1-ヒドロキシエタン-1,1-ジホスホン酸、アミノトリ(メチレンホスホン酸)、エチレンジアミンテトラ(メチレンホスホン酸)、ヘキサメチレンジアミンテトラ(メチレンホスホン酸)、プロピレンジアミンテトラ(メチレンホスホン酸)、ジエチレントリアミンペンタ(メチレンホスホン酸)、トリエチレンテトラミンヘキサ(メチレンホスホン酸)、トリス(2-アミノエチル)アミンヘキサ(メチレンホスホン酸)、トランス-1、2-シクロヘキサンジアミンテトラ(メチレンホスホン酸)、グリコールエーテルジアミンテトラ(メチレンホスホン酸)、およびテトラエチレンペンタミンヘプタ(メチレンホスホン酸)等を挙げることができる。
アルカリ性の洗浄液は、塩基を含有し、塩基以外にキレート剤や界面活性剤を含有することができる。キレート剤は、洗浄性の観点から、洗浄液中に含んでもよい。一方、ガラスからのAl成分の抜け出しを促進する可能性があるため、樹脂BM膜の密着性の観点から、キレート剤は洗浄液中に含有しない方がよい。
界面活性剤としては、ノニオン性界面活性剤が好ましい。
洗浄工程においては、酸性の洗浄剤原液を水で希釈し、pHが2.7より大きくなるようにした希釈液(酸性の洗浄液)、またはアルカリ性の洗浄剤原液を水で希釈した希釈液(アルカリ性の洗浄液)を使用して、研磨後のガラス基板の表面を洗浄する。枚葉方式で洗浄することが好ましい。洗浄液をガラス基板の表面に直接接触させて洗浄する方法であれは、洗浄方法は特には限定されない。洗浄方法は、例えば、スクラブ洗浄、シャワー洗浄(噴射洗浄)、ディップ(浸漬)洗浄等を用いることができる。洗浄液の温度は特には限定されることはなく、室温(15℃)~95℃で使用される。95℃を超える場合には、洗浄液中の水が沸騰するおそれがあり、洗浄操作上不便であり好ましくない。洗浄後、乾燥を行ってもよい。乾燥方法としては、温風を吹き付ける方法や、圧縮した空気を吹き付ける方法等が挙げられる。
ガラス基板の表面を、以下に示すようにして研磨した。ガラス基板としては、アルミノホウケイ酸ガラスからなるLCD用ガラス基板(旭硝子社製、商品名:AN100)を使用した。そして、このガラス基板の表面を、研磨パッドを用い、平均粒径0.8~1.0μmの酸化セリウム粒子を含むスラリー状の研磨剤(昭和電工(株)製、商品名:SHOROX A10)を使用して研磨した。
そして、表面を研磨されたガラス基板を、図1に示す洗浄方法を使用して洗浄した。
また、実施例2および実施例3では、酸性の洗浄剤原液をpHがそれぞれ5.3(実施例2)および3.9(実施例3)になるように水で希釈したものを、水系洗浄液として用いた。なお、酸性の洗浄剤原液は、PK-LCG492A(パーカーコーポレーション社製の酸性の洗浄剤原液の商品名)を、液中の有機ホスホン酸濃度を1/4にしたものである。
さらに、比較例1では、酸性の洗浄剤原液(パーカーコーポレーション社製、商品名:PK-LCG492A)を、pHが2.7になるように水で希釈したものを、水系洗浄液として用いた。
まず、以下に示す各成分を以下の組成で配合し、均一に混合して、固形分濃度15%の感光性BM形成用樹脂組成物を調製した。
[BM形成用樹脂組成物の組成]
・バインダ樹脂(日本化薬社製、商品名:ZCR1569H):28.4部
・光活性剤(光重合開始剤)
(チバ・スペシャルティ・ケミカル社製、商品名:イルガキュアOXE02):6.1部
・コロイダルシリカ微粒子(日産化学社製、商品名:PMAST):20.3部
・カーボンブラック:32.5部
・界面活性剤(ビックケミー・ジャパン社製、商品名:BYK306):0.3部
・架橋剤(日本化薬社製、商品名:UX5002D):6.1部
(日本化薬社製、商品名:NC3000H):3.0部
・シランカップリング剤(信越化学社製、商品名:KBM403):3.0部
・リン酸化合物(リン酸とモノメタクリロイルオキシエチルフォスフェート、ジメタクリロイルオキシエチルフォスフェートの2:1(質量比)混合物):0.3部
L1………パターン間隔100μmで1ブロック(2835μm×2000μm)に25本の線状パターン(線幅は1~25μmの範囲で可変)
L2………パターン間隔50μmで1ブロック(2952.6μm×2000μm)に30本の線状パターン(線幅は1~30μmの範囲で可変)
L3………パターン間隔200μmで1ブロック(2682.5μm×2000μm)に25本の線状パターン(線幅は1~25μmの範囲で可変)
L4………パターン間隔200μmで1ブロック(2682.5μm×2000μm)に25本の短い線状パターン(線幅は1~25μmの範囲で可変)
洗浄後のガラス基板の表面におけるAl濃度およびSi濃度を、X線光電子分光法(以下、XPSと示す。)を用いて測定し、Al/Si値(原子濃度比)を求めた。
測定には、アルバック・ファイ社製のPHI5500を使用し、Si(2p)およびAl(2p)のピークを用い、パスエネルギー117.4eV、エネルギーステップ0.5eV/step、検出角(試料表面と検出器とのなす角度)15°の条件で測定を行った。スペクトルの解析には、解析ソフトMultiPakを使用した。スペクトルのバックグラウンドの引き方には、Shirley法を適用した。得られた結果を、表1に示す。
表面Al/Si値の測定に用いたガラス基板について、Al濃度およびSi濃度の深さ方向分布を、C60イオンスパッタリングを用いたXPSにより測定した。XPS測定装置および解析ソフトは、表面Al/Si値の測定と同じものを使用した。測定条件は、パスエネルギーを117.4eV、エネルギーステップを0.5eV/step、モニターピークをSi(2p)およびAl(2p)、検出角を75°とした。そして、スパッタ間隔を5分間とし、5分間スパッタを行うごとに、形成されたクレータ底部のAl濃度およびSi濃度を測定した。このような測定を、Al濃度およびSi濃度が一定になるまで実施した。こうして得られた、実施例1のガラス基板におけるAl濃度およびSi濃度の深さ方向分布を、図2に示す。このグラフから、スパッタ時間が40分間で、Al濃度およびSi濃度が一定になると判断した。
また、実施例1~3および比較例1は同一組成のガラス基板であるので、実施例2、実施例3および比較例1の内部Al/Si値も、実施例1と同一とみなせる。
また、図4から、ΔAl/Si値と残し解像度には正の相関関係があり、ΔAl/Si値の低下に伴い、残し解像度も小さくなる傾向が認められる。そして、前記したように、残し解像度が小さいほど、洗浄後のガラス基板上に形成された樹脂BM膜の密着性が高いので、ΔAl/Si値が小さいほど、樹脂BM膜の密着性が高いことがわかる。
また本発明のガラス基板の製造方法によれば、このようにFPD用ガラス基板として好適するガラス基板を、効率的に得ることができる。
Claims (8)
- アルミニウムを含むケイ酸ガラスからなるガラス基板であり、
X線光電子分光法により測定された、前記ガラス基板の内部におけるアルミニウムの原子濃度とケイ素の原子濃度との比の値から、前記ガラス基板の表面におけるアルミニウムの原子濃度とケイ素の原子濃度との比の値を引いた値(ΔAl/Si値)が、0.25以下であることを特徴とするガラス基板。 - 前記ΔAl/Si値が0.19以下である、請求項1に記載のガラス基板。
- 前記ガラス基板の表面の算術平均表面粗さは0.2nm以下である、請求項1または2に記載のガラス基板。
- 前記アルミニウムを含むケイ酸ガラスが、SiO2、Al2O3、B2O3、およびアルカリ土類金属の酸化物を含む組成を有するアルミノホウケイ酸ガラスである、請求項1~3のいずれか1項に記載のガラス基板。
- 前記アルミニウムを含むケイ酸ガラスが、アルカリ金属成分を実質的に含有しないアルミノホウケイ酸ガラスである、請求項1~4のいずれか1項に記載のガラス基板。
- 請求項1~5のいずれか1項に記載のガラス基板を製造する方法であり、
砥粒を含有する研磨剤により研磨されたガラス基板を、pHが2.7より大きい水系洗浄液により洗浄することを特徴とするガラス基板の製造方法。 - 前記砥粒が酸化セリウム粒子である、請求項6に記載のガラス基板の製造方法。
- 請求項1~5のいずれか1項に記載のガラス基板上に、ブラックマトリクス膜が形成されてなることを特徴とするブラックマトリクス基板。
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