WO2014189045A1 - 管理装置、基板処理システム、装置情報更新方法、及び記録媒体 - Google Patents
管理装置、基板処理システム、装置情報更新方法、及び記録媒体 Download PDFInfo
- Publication number
- WO2014189045A1 WO2014189045A1 PCT/JP2014/063336 JP2014063336W WO2014189045A1 WO 2014189045 A1 WO2014189045 A1 WO 2014189045A1 JP 2014063336 W JP2014063336 W JP 2014063336W WO 2014189045 A1 WO2014189045 A1 WO 2014189045A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- information
- device information
- substrate processing
- file
- correction
- Prior art date
Links
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM]
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM]
- G05B19/41865—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM] characterised by job scheduling, process planning, material flow
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM]
- G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM] characterised by quality surveillance of production
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/20—Pc systems
- G05B2219/23—Pc programming
- G05B2219/23295—Load program and data for multiple processors
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/45—Nc applications
- G05B2219/45031—Manufacturing semiconductor wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
Definitions
- the present invention relates to a management apparatus for managing apparatus information stored in a file such as a film forming recipe held by a substrate processing apparatus for processing a substrate such as a wafer, a substrate processing system including the management apparatus and the substrate processing apparatus,
- the present invention relates to a method for updating apparatus information held by a substrate processing apparatus and a recording medium.
- the substrate processing apparatus performs processing such as film formation on a semiconductor substrate (for example, a semiconductor wafer) on which a semiconductor integrated circuit (hereinafter referred to as IC) is formed, for example.
- a management apparatus for centrally managing a substrate processing apparatus group composed of a plurality of substrate processing apparatuses is introduced, and each substrate processing under the management apparatus is performed in the management apparatus. It is possible to monitor the production status of the device and to store and refer to production history and failure history.
- the management apparatus and each substrate processing apparatus are connected by a network such as a LAN capable of high-speed communication.
- Each substrate processing apparatus has a substrate processing recipe for substrate processing, and performs substrate processing based on the substrate processing recipe held by itself.
- the same substrate processing apparatus that performs the same substrate processing is the same among the plurality of substrate processing apparatuses.
- a plurality of film forming apparatuses are included.
- the substrate processing recipe of such a same substrate processing apparatus originally has the same contents, but as the substrate processing is repeated, the substrate processing recipe is improved in a certain substrate processing apparatus, for example, a parameter setting value of the substrate processing recipe (for example, substrate processing) Room temperature setting value) may be changed. And when the result is favorable, it will be reflected in another same substrate processing apparatus.
- the improved substrate processing recipe file is compared with a plurality of substrate processing recipe files held by other substrate processing apparatuses, and the parameters of the difference portion are extracted and output. Based on the parameters, the substrate processing recipe file of another substrate processing apparatus is corrected.
- FIG. 9 is a flowchart of file comparison update processing according to the background art.
- the substrate processing apparatus A has an appropriate file.
- the files held by other substrate processing apparatuses (substrate processing apparatus B or the like) match the appropriate files of the substrate processing apparatus A are compared in the management apparatus, and if there is a difference,
- the file of the substrate processing apparatus B or the like is corrected so as to match the file of the substrate processing apparatus A.
- the substrate processing apparatus A and the substrate processing apparatus B are installed in a clean room, and are connected to a management apparatus installed in the office via a network such as a LAN.
- the management apparatus acquires a file of the substrate processing apparatus A (step S61 in FIG. 9), acquires a file of the substrate processing apparatus B (step S62), and compares the acquired two files (step S63). . As a result of the comparison (step S64), if there is no difference between the two files, the process is terminated. If there is a difference between the two files, the comparison result is output (for example, CSV output), or the operator takes a note of the difference (step S65).
- step S66 the operator moves from the office into the clean room (step S66), and the substrate processing apparatus B corrects and updates the file based on the comparison result output or the memo (step S67).
- step S68 the operator moves from the clean room to the office (step S68) and confirms whether the file update has been performed correctly. If the file was not updated correctly, move to the clean room again and correct the file. If the file update is correctly performed, the process returns to step S62, and the file of the next substrate processing apparatus, for example, the substrate processing apparatus C is compared and corrected.
- the management device can compare two files, but cannot simultaneously compare three or more files. For this reason, if there are three or more substrate processing apparatuses to be compared, it takes a lot of time to update the file, and the original substrate processing cannot be started, leading to a reduction in the operating rate of the apparatus.
- An object of the present invention is to provide a management apparatus, a substrate processing system, an apparatus information update method, and a recording medium that can extract apparatus information differences between substrate processing apparatuses and update apparatus information.
- a management apparatus connected to a substrate processing apparatus that holds apparatus information for processing a substrate, wherein reference apparatus information that serves as a reference for the apparatus information is included in the apparatus information.
- a setting unit for setting, a difference unit obtained by extracting a difference between the acquisition device information acquired from the substrate processing apparatus based on the reference device information set in the setting unit and the reference device information, and the reference The contents of the device information including device information are respectively displayed, an operation display unit for instructing correction of the difference portion, and a correction instruction for the difference portion received from the operation display unit, based on the correction instruction, the acquisition
- the acquisition includes a control unit that corrects the apparatus information to create correction apparatus information, and controls the correction apparatus information to be transmitted to the substrate processing apparatus.
- a substrate processing system comprising a substrate processing apparatus that holds apparatus information for processing a substrate, and a management device, wherein the management device includes the device of the device information.
- a setting unit configured to set reference device information serving as a reference of information; and a difference between the acquisition device information acquired from the substrate processing apparatus based on the reference device information set in the setting unit and the reference device information.
- the difference between the acquired acquisition apparatus information for acquiring the apparatus information for processing the substrate from the substrate processing apparatus and the reference apparatus information serving as a reference for the apparatus information is extracted.
- a display step for displaying each of the extraction step, the difference portion, and the contents of the device information including the reference device information; and a correction instruction for receiving a correction instruction for a difference portion between the reference device information of the acquisition device information An accepting step, a device information correcting step of creating correction device information by correcting the acquisition device information based on the correction instruction, and transmitting the correction device information to the substrate processing apparatus, and a device information updating method comprising a bag Provided.
- the difference between the acquired acquisition apparatus information for acquiring the apparatus information for processing the substrate from the substrate processing apparatus and the reference apparatus information serving as a reference for the apparatus information is extracted.
- a display process for displaying the extraction process, the difference part, and the content of the device information including the reference device information, and a correction instruction for receiving a correction instruction for a difference part between the reference device information of the acquisition device information An accepting process, a device information correcting process for correcting the acquired device information based on the correction instruction, a device information correcting process for transmitting the corrected device information to the substrate processing device, and a device information update program including a bag A stored recording medium is provided.
- FIG. 1 is a configuration diagram of a substrate processing system according to an embodiment of the present invention. It is a block diagram of the management apparatus which concerns on embodiment of this invention. It is a flowchart which shows the outline of the file comparison update process which concerns on embodiment of this invention. It is an example of the substrate processing apparatus file information which concerns on embodiment of this invention. It is an example of the comparison file management information which concerns on embodiment of this invention. It is an example of the file comparison result information which concerns on embodiment of this invention. It is a file comparison update process flowchart which concerns on embodiment of this invention. It is a flowchart of the edit file output in the flowchart of FIG. It is a file comparison update process flowchart concerning background art. It is an example of the file comparison result information which concerns on embodiment of this invention.
- FIG. 1 is a configuration diagram of a substrate processing system according to an embodiment of the present invention.
- the substrate processing system includes a plurality of substrate processing apparatuses 20 (apparatus A, apparatus B, apparatus C,... Apparatus n), a management apparatus 10, and an operation display unit that constitutes a part of the management apparatus 10.
- a network 31 that connects the plurality of substrate processing apparatuses 20 and the management apparatus 10
- a network 32 that connects the management apparatus 10 and the GUI 13.
- the management apparatus 10 and the GUI 13 may be configured separately.
- Each substrate processing apparatus 20 is installed in a clean room, and the GUI 13 is installed in an office having an atmosphere with a lower cleanliness than that of the clean room.
- the management apparatus 10 is installed outside the clean room and outside the office.
- the management device 10 may be installed in an office. In this case, the management apparatus 10 and the GUI 13 do not need to be connected via a network, and may be directly connected.
- FIG. 3 is a flowchart showing an outline of the file comparison update process according to the present embodiment.
- the file of this embodiment is apparatus information of the substrate processing apparatus 20 for processing a substrate.
- a setting unit for setting a master file is provided on the operation screen of the operation display unit 13, and a file serving as a comparison source (referred to as a master file) is set via this setting unit.
- the management apparatus 10 performs comparison based on the master file.
- the specific file of the substrate processing apparatus 20A is set as a master file by the operator.
- the master file is a file in which reference device information serving as a reference for device information is stored.
- the management apparatus 10 acquires a master file (for example, the file name is “recipe 1”) designated by the operator from the substrate processing apparatus 20A (apparatus A) via the network 31 (step 1). S11).
- the management apparatus 10 acquires a file having the same name as the master file (referred to as the same name file) from the substrate processing apparatus 20B (apparatus B) (step S12).
- the management apparatus 10 sequentially acquires the same name file from each apparatus, and finally acquires from the substrate processing apparatus 20n (apparatus n) (step S13).
- the management apparatus 10 acquires this same name file from all the substrate processing apparatuses 20 under the management apparatus 10.
- not only files with the same name but also files with different names can be compared together. For example, it is configured to be able to perform batch comparison of similar file names.
- the management apparatus 10 compares the contents of the same name file acquired from the apparatuses B to n with the contents of the master file in parallel (step S14). If there is no difference in the comparison result, that is, if there is no difference in step S15, this process is terminated. If there is a difference in the comparison result, that is, if there is a difference in step S15, the management apparatus 10 determines whether or not the operator has issued an editing instruction from the operation display unit 13 of the management apparatus 10 (step S16). . If there is no editing instruction in step S16, the process is terminated. Regarding the presence / absence of an editing instruction from the operator, for example, a dialog box or the like may be displayed on the screen to inquire about the presence / absence of the editing instruction, or the presence / absence of the editing instruction may be managed by time.
- the management apparatus 10 edits, that is, corrects, the same name file acquired from the apparatuses B to n (step S17), and transmits the corrected file via the network 31.
- the file with the same name before the correction is updated by replacing the file with the same name before the correction with the corrected file received from the management device 10.
- management apparatus 10 After transmitting the corrected file to apparatuses B to n, management apparatus 10 returns to step S11 and proceeds to a file comparison / update process based on the next master file (for example, the file name is “recipe 2”).
- the management apparatus 10 since the management apparatus 10 has a file editing function, all operations by the operator are performed on the operation display unit 13 of the management apparatus 10, that is, performed in the office. Therefore, even if there are three or more devices to be compared, for example, there is no need to reciprocate between an office and a clean room many times. Therefore, during the file comparison / update process, wasted time that is not directly related, such as travel time between the office and the clean room, is suppressed. In addition, since the editing process in the clean room is unnecessary, it can be expected that the clean room atmosphere is maintained in a clean environment.
- the substrate processing apparatus 20 performs a substrate process, for example, a film forming process for forming a film on the surface of the substrate, and various apparatus information regarding the substrate processing apparatus together with an apparatus information ID that is an identifier for identifying each apparatus information. These are stored as files in the storage unit of the substrate processing apparatus 20.
- This apparatus information includes, for example, a substrate processing recipe including a procedure for performing substrate processing.
- the recipe includes an alarm recipe and an abort recipe that are executed when an error occurs during execution of the substrate processing recipe.
- the files include not only recipes but also control parameter files such as pressure parameters, temperature parameters, and gas flow rate parameters used in the substrate processing recipe. These various parameters such as control parameters are also included in the device information.
- FIG. 2 is a configuration diagram of the management apparatus according to the embodiment of the present invention.
- the management device 10 includes a control unit 11, a storage unit 12, an operation display unit 13, and a communication unit 14.
- the operation display unit 13 includes an operation unit composed of a keyboard and a mouse for receiving various instructions and data input from the operator, and a display unit composed of an LCD for displaying various data and the like. And the display unit are configured separately.
- the operation display unit 13 is connected to the management apparatus 10 via the network 32 in the present embodiment.
- the communication unit 14 is connected to the network 31 and performs communication with each substrate processing apparatus 20 connected to the network 31.
- the bag storage unit 12 stores device file information 12a, acquired file information 12b, comparison file management information 12c, comparison result information 12d, and corrected file information 12e.
- FIG. 4 shows a configuration example of the device file information 12a of this embodiment.
- the device file information 12a the file names of files held by all the substrate processing apparatuses 20 connected to the management apparatus 10 under the management apparatus 10 are stored in association with the apparatus names of the substrate processing apparatuses 20. Has been.
- the device file information 12a can be displayed on the operation display unit 13.
- the device file information 12a includes, for example, the substrate processing apparatus 20A whose apparatus name is “apparatus A”, the file names “File01”, “File02”, “File03”,. Contains information that the file is owned by Note that an apparatus identifier that identifies the substrate processing apparatus 20 may be used instead of the apparatus name. Further, a file identifier for specifying a file may be used instead of the file name.
- the acquired file information 12b is content information of a file having the same name as the master file acquired from each substrate processing apparatus 20 in the above-described file comparison / update process, and includes the content information of the master file.
- the acquired file information 12b is stored with the device name, the file name, and the file content associated with each other.
- the acquired file information 12b can be displayed on the operation display unit 13.
- the comparison file management information 12c indicates which substrate processing device 20 has been corrected (edited) in the above-described file comparison update processing, that is, the substrate processing device 20 that has performed the file correction.
- the substrate processing apparatus 20 that has not performed file correction is identified and shown.
- the comparison file management information 12c can be displayed on the operation display unit 13.
- FIG. 5 shows a configuration example of the comparison file management information 12c of this embodiment.
- whether or not the substrate processing apparatus 20 has a master file, the file name of the master file, and an edit flag (correction flag) indicating whether or not the file has been corrected are included in the master file. (In the example of FIG.
- File02 is stored in association with the names of all the substrate processing apparatuses 20 under the management apparatus 10 that have the same file name.
- “File02” is designated as the master file
- the apparatus A is the substrate processing apparatus 20 that holds the master file
- none of the files with the same name that are held by the apparatuses B to n are modified. (Edit flag OFF).
- FIG. 6 shows a configuration example of the comparison result information 12d of this embodiment.
- the comparison result information 12d indicates a result of comparing the master file and the file having the same name in the file comparison update process described above.
- the comparison result information 12d can be displayed on the operation display unit 13 as a file comparison screen (device information comparison screen).
- the comparison result information 12d includes the name of the substrate processing apparatus 20 (master apparatus) that holds the master file, the file name of the master file, and the name of the substrate processing apparatus 20 that has the same name file as the master file.
- the parameter values in the master file and the file with the same name are shown so as to be comparable between the substrate processing apparatuses 20.
- FIG. 1 shows a configuration example of the comparison result information 12d of this embodiment.
- the comparison result information 12d indicates a result of comparing the master file and the file having the same name in the file comparison update process described above.
- the comparison result information 12d can be displayed on the operation display unit 13 as a file comparison screen (device information comparison screen
- the temperature setting value of the master file “recipe 1” of apparatus A is 300 ° C., and the pressure setting value is 10,000 Pa.
- the temperature setting value of the file “recipe 1” with the same name of the device B is 295 ° C., and the pressure setting value is 10,000 Pa.
- the temperature setting value of the file “recipe 1” having the same name of the device C is 300 ° C., and the pressure setting value is 9900 Pa.
- the temperature setting value of the file “recipe 1” with the same name in the apparatus n is 295 ° C., and the pressure setting value is 10,000 Pa.
- the temperature setting value of the same-name file “Recipe 1” of the devices B and n is different from the temperature setting value (300 ° C.) of the master file, and the pressure setting value of the same-name file “Recipe 1” of the device C is the master file. Since there is a difference from the pressure setting value (10000 Pa), the parameter items having a difference (“temperature setting value”, “pressure setting value”) and the parameters having the difference (setting temperature, setting pressure, etc.) are underlined, for example. By displaying or the like, it is indicated that there is a difference from the master file. As a method of clearly displaying the difference, not only the underlined portion is drawn on the parameter or parameter item having the difference as shown in FIG. For example, a portion having a difference may be displayed with a background color, or a parameter name or a parameter item name may be displayed with a color.
- the corrected file information 12e is file information (correcting device information) as a result of file correction in the above-described file comparison / update process.
- the corrected file information 12e can be displayed on the operation display unit 13.
- the corrected file information 12e is a file in a state where the temperature setting value of the file “Recipe 1” having the same name in the apparatus B is corrected to 300 ° C. which is the temperature setting value of the master file in the example of FIG.
- the file “Recipe 1” having the same name in the device B is updated to the same content as the master file. Note that it is preferable to improve the visibility of the corrected parameter, for example, by making the display color different from other parameters.
- the control unit 11 controls each component of the management device 10 described above.
- the control unit 11 includes a CPU (Central Processing Unit) and a memory that stores an operation program of the control unit 11. Operates according to this operation program.
- the control unit 11 includes a device file acquisition function 11a, a device file comparison function 11b, a device file correction function 11c, and a correction file output function 11d.
- the heel control unit 11 registers and stores a file held by a specific substrate processing apparatus 20 in the storage unit 12 as a master file in accordance with an instruction from the operator received by the operation display unit 13. Let Then, the same name file is acquired from the substrate processing apparatus 20 under the management apparatus 10 having the same name file as the master file (apparatus file acquisition function 11a). At this time, the device information regarding the master file is clearly displayed. For example, an item for displaying device information related to a master file may be displayed with a background color.
- control unit 11 refers to the device file information 12a stored in the storage unit 12, and among the substrate processing devices 20 under the management device 10, the control unit 11 performs processing for the substrate processing device 20 having the same name file as the master file. Then, an instruction (same name file transmission instruction) is performed via the communication unit 14 so as to transmit the same name file to the management apparatus 10.
- an instruction (same name file transmission instruction) is performed via the communication unit 14 so as to transmit the same name file to the management apparatus 10.
- each substrate processing apparatus 20 transmits the same name file held by the management apparatus 10 together with the apparatus name of the substrate processing apparatus 20 to the management apparatus 10.
- the control unit 11 stores the same name file received from each substrate processing apparatus 20 in the storage unit 12 in association with the apparatus name of the substrate processing apparatus 20 as acquired file information 12b.
- the control unit 11 acquires the same name file from each substrate processing apparatus 20 under the management device 10, and then acquires the contents of the acquired same name file and the master file stored in the storage unit 12. And the difference between the acquired file having the same name and the master file is extracted and clearly displayed (device file comparison function 11b). For example, as shown in the file comparison screen of FIG. 6 described above, different parameters and parameter items are displayed on the operation display unit 13 so as to stand out.
- control unit 11 shifts to an edit mode in which the content of the acquired file with the same name can be edited, that is, can be corrected, in accordance with an instruction from the operator received by the operation display unit 13. And according to the instruction
- the control unit 11 turns the editing flag in the comparison file management information 12c in FIG. 5 described above from OFF to ON.
- the mouse constituting the operation display unit 13 is moved to the parameter position of the file with the same name displayed as the difference, A context menu is displayed by operating the mouse, and the editing mode is selected by selecting “edit” as an editing unit from the displayed context menu.
- the user can leave the edit mode by displaying the context menu in the same manner and selecting “END EDIT” from the displayed context menu.
- the parameter of the same name file displayed as the difference from the master file is corrected to be the same as the content of the master file.
- the temperature setting value “295” of the file with the same name (recipe 1) of the device B is corrected to “300”, which is the same as the master file.
- the operator may input a numerical value “300” from the operation display unit 13, but an “same modification” button for instructing the same correction as the master file is provided on the operation display unit 13. By pressing the “Modify” button, the same correction as the master file may be performed. In this way, erroneous input by the operator can be prevented.
- the parameter of the file with the same name displayed as the difference from the master file may be modified to a value different from the contents of the master file. In this way, it becomes easy to finely adjust parameters for each substrate processing apparatus 20.
- the control unit 11 can be configured to automatically modify the acquired parameter of the same name file so as to be the same as the content of the master file without an instruction from the operator. In this way, it becomes easy to correct the parameters to be the same as the contents of the master file.
- control unit 11 causes the substrate processing apparatus 20 to output the same name file corrected in the edit mode according to the instruction from the operator received by the operation display unit 13 (modified file output function 11d). ). At this time, the control unit 11 can confirm whether or not the same-name file has been corrected in the edit mode by using the comparison file management information 12c described above. Specifically, the management apparatus 10 transmits the same name file corrected in the edit mode to the substrate processing apparatus 20 that had the same name file before correction. The substrate processing apparatus 20 that has received the corrected file with the same name replaces and updates the file with the same name that has been corrected and has the same name as the file that has been corrected.
- the management apparatus 10 transmits the corrected file with the same name to the substrate processing apparatus 20, the same name corrected only for the instructed substrate processing apparatus 20 based on the instruction from the operator received by the operation display unit 13.
- Individual transmission for transmitting the file can be performed, or batch transmission for transmitting the modified file with the same name can be performed to all the substrate processing apparatuses 20 to which the plurality of modified files with the same name belong.
- the operator instructs the substrate processing apparatus 20 to which the correction file to be individually transmitted belongs on the operation display unit 13.
- a context menu is displayed at the position of the name of the substrate processing apparatus 20 as the transmission destination, for example, the position of the apparatus B, and “Send” is selected from the displayed context menu. By clicking and selecting, the modified file is transmitted to the device B.
- the operator instructs the operation display unit 13 to perform batch transmission.
- a context menu is displayed, and by clicking “Send all” from the displayed context menu, all the modified files are displayed in the respective modified files.
- the correction file “recipe 1” is sequentially transmitted to the apparatuses B to n.
- FIG. 7 is a flowchart of file comparison update processing according to the present embodiment.
- FIG. 8 is a flowchart of editing file output in the flowchart of FIG.
- the operation of the management apparatus 10 is controlled by the control unit 11.
- the management apparatus 10 registers and stores a specific file held by a specific substrate processing apparatus 20 in the storage unit 12 as a master file in accordance with an instruction from the operator received by the operation display unit 13 (see FIG. 7 step S31). Based on the apparatus file information 12a stored in the storage unit 12, the apparatus name of the substrate processing apparatus 20 under the management apparatus 10 and having the same name file as the master file is extracted. And it registers and memorize
- the management apparatus 10 acquires the same name file from the substrate processing apparatus 20 having the registered apparatus name, that is, the substrate processing apparatus 20 having the same name file, and acquires the file in association with the apparatus name of each substrate processing apparatus 20.
- the file information 12b is stored in the storage unit 12 (step S33).
- the master file is a file “File02” held by the substrate processing apparatus 20A (apparatus A).
- the management apparatus 10 compares the contents of the same name files of the apparatuses B to n acquired in step S33 with the contents of the master file of the apparatus A (step S34), and acquires the acquired files of the same name and the master file.
- the parameter or parameter item having the difference is displayed on the operation display unit 13 so as to stand out (step S35).
- the recipe file and the parameter file including the substrate processing recipe have a large number of items, all items cannot be actually displayed on one screen, and therefore, the screen is usually scrolled to refer to all items.
- FIG. 10 shows an example of displaying only the different parts (difference parameters and parameter items) in step S35 in FIG.
- a difference button is arranged at a predetermined position on the output screen.
- the difference button is pressed, the screen shown in FIG. 10 is displayed.
- it may be configured in advance so as to display only the difference portion in step S34. In this way, if only the difference portion is displayed, the item to be corrected becomes clear, and a parameter or parameter item having a difference can be edited.
- FIG. 11B shows an example of displaying the result of eliminating devices that do not require comparison in step S35 in FIG.
- a context menu is displayed at the position of the name of the substrate processing apparatus 20 (apparatus C) to be hidden, for example, the position of the apparatus C.
- “Hide” as a non-display part
- the selected substrate processing apparatus 20 (apparatus C) is hidden.
- the selected device C is not displayed, and the device names after the device D are displayed with the positions thereof aligned to the left. Accordingly, by configuring the apparatus C that does not require comparison to be hidden, the substrate processing apparatus 20 to be compared is clarified, and a parameter or parameter item that is different can be edited.
- FIG. 12B shows an example of displaying the result of rearranging with a specific parameter (or parameter item) in step S35 in FIG.
- a context menu is displayed at the position of the selected item “Setting Value”, and “Sort” as the sorting unit is displayed from the displayed context menu.
- the substrate processing apparatus 20 (apparatus D) having a temperature set value close to 300 ° C. of the substrate processing apparatus 20 (apparatus B) having the master file is displayed in order.
- the parameters are displayed in order from the substrate processing apparatus 20 having a parameter file close to the master file.
- FIG. 13B is an example of displaying the result of rearranging by changing the master file in step S35 in FIG.
- a context menu is displayed in the column of the substrate processing apparatus 20 (apparatus B) that is the target of switching the master file, and a change unit is selected from the displayed context menu. Click to select “Master”. Thereby, the master file is switched. In this case, the file comparison is performed again based on the new master file.
- the process returns to the file comparison step in step S34, and after file comparison is performed, the device B selected as the master file is moved to the leftmost position, and the file comparison is performed.
- the result is displayed (step S35). After switching the master file to the device B, each parameter acquired from the device B becomes a reference value. Then, as shown in FIG. 13B, parameter comparison is performed again for each parameter set in each recipe file with respect to the changed master file, and the comparison result is displayed.
- the master file can be arbitrarily set, for example, when parameter comparison is performed collectively at the time of setup of the substrate processing apparatus 20, a substrate processing apparatus that has been delivered in advance.
- the setup work can be performed efficiently.
- the substrate processing apparatus 20 is modified, for example, when parameters are changed in accordance with a change in a film type or a process to be processed by the substrate processing apparatus 20.
- the parameters to be changed can be accurately displayed by setting the parameters in use in the substrate processing apparatus 20 that has been delivered in advance in the master file.
- the recipe file and parameter file including the substrate processing recipe have a large number of items, so it is not easy to grasp the items to be corrected, but the parameters and parameter items with differences are visually recognized on the operation screen. As a result, incorrect parameter settings can be minimized. Furthermore, by setting the parameters in use in the substrate processing apparatus 20 with a proven record in the master file, it is possible to expect a reduction in the setup time for the modification work.
- the management apparatus 10 determines whether or not it is in an edit mode state in which the content of the acquired file with the same name can be modified (step S36). Whether or not to enter the edit mode is determined by an instruction from the operator received by the operation display unit 13 as described above. If it is determined in step S36 that the editing mode is not set ("NO” in step S36), this process ends. If it is determined in step S36 that the editing mode state is set ("YES" in step S36), the acquired file with the same name is edited according to the instruction from the operator received by the operation display unit 13, that is, the acquired same name. The contents of the file are corrected (step S37). When the content of the acquired file with the same name is corrected, the control unit 11 turns the edit flag in the comparison file management information 12c in FIG. 5 from OFF to ON.
- the management apparatus 10 outputs the same-name file corrected in the edit mode to the substrate processing apparatus 20 in accordance with the instruction from the operator received by the operation display unit 13 (step S38), and ends this process.
- the management apparatus 10 acquires information related to the output method in accordance with an instruction from the operator received by the operation display unit 13. That is, information on whether to perform batch output or individual output to the substrate processing apparatus 20 is acquired (step S41).
- step S41 information on whether to perform batch output or individual output to the substrate processing apparatus 20 is acquired.
- batch output is instructed by selecting “Send All” from the displayed context menu, and “Send” is selected from the displayed context menu. By doing so, individual output is instructed.
- the management apparatus 10 acquires from the comparison file management information 12c in FIG. 5 the editing status of the same name file of each substrate processing apparatus 20, that is, whether or not the file of each substrate processing apparatus 20 has been modified. (Step S42).
- the management apparatus 10 determines whether or not the same name file of each substrate processing apparatus 20 acquired in step S42 has been corrected (step S43). If the file with the same name has been modified (“edited” in step S43), the file is output to the substrate processing apparatus 20 to which the file with the same name belongs (step S44), and the process proceeds to step S45. If the file with the same name has not been corrected (“unedited” in step S43), the process proceeds to step S45 without outputting to the substrate processing apparatus 20 to which the file with the same name belongs.
- step S45 the management device 10 determines whether the output method acquired in step S41 is batch output or individual output (step S45). If the output method is individual output (“individual” in step S45), this process ends.
- step S45 it is determined whether or not there is a remaining file that has been corrected but not output in the comparison file management information 12c of FIG. It is determined whether or not there remains a substrate processing apparatus 20 having the same name file that has been output but not output (step S46). If there is no remaining file that has been corrected (“no remaining” in step S46), that is, if there is no remaining substrate processing apparatus 20 having the same name file that has been corrected and has not been output, this processing ends. If there is a modified remaining file (“remaining” in step S46), that is, if there is a substrate processing apparatus 20 having a file of the same name that has been modified but not output, the process returns to step S44 to process the substrate processing. The same name file is output to the device 20.
- the corrected file of the device B is transmitted to the device B, and the next First, the modified file of device C is transmitted to device C, then the modified file of device D is transmitted to device D, and finally the modified file of device n is transmitted to device n.
- the corrected file of each substrate processing apparatus 20 is transmitted to the substrate processing apparatus 20 to which each corrected file belongs.
- the file comparison screen can be displayed by rearranging with specific parameters (or parameter items).
- the visibility is improved by changing the display color of a part different from the master file of the same name file, the operator can easily recognize a part different from the master file. This makes it easy to determine whether or not a specific parameter needs to be corrected based on the parameter value, and improves operability in parameter correction. Furthermore, by rearranging the designated parameter items, it is possible to grasp the number of devices different from the setting contents with the device holding the master file.
- I Also, as shown in FIG.
- the visibility is improved by changing the display color of a part different from the master file of the same name file. Can be easily recognized by the operator.
- the master file after performing a batch comparison of files, by switching the master file, it is possible to perform a batch comparison of files from different viewpoints. For example, if some items of the device file specified as the master file are different from the items of the comparison target device, the setting of the master file may not be appropriate. Therefore, by switching the master file, the substrate processing apparatus to be compared with the item becomes clear. (J) Further, according to the present embodiment, it is possible to contribute to the early start-up (setup) associated with the shortening of the apparatus parameter adjustment time.
- the substrate processing recipe file is used as the master file.
- a file other than the substrate processing recipe for example, a parameter file including parameters may be used.
- the operation unit and the display unit of the management apparatus are separate operation display units.
- the operation unit and the display unit may be integrally configured using a touch panel.
- the master file is acquired from the substrate processing apparatus under the management apparatus.
- the master file may be acquired from other than the substrate processing apparatus.
- a master file serving as a reference for substrate processing may be created by a management device or a personal computer and stored in a storage unit of the management device.
- the management device is not necessarily installed outside the office or outside the clean room, and may be installed inside the office, for example.
- the management device does not need to be integrated with the storage unit, the control unit, the operation unit, and the display unit, and may be installed separately.
- the file comparison screen or the like is displayed on the management apparatus.
- the file comparison screen may be displayed on the substrate processing apparatus, and the operator may make various instructions from the operation display unit of the substrate processing apparatus.
- the control unit, operation display unit, and storage unit of the management device described in the above embodiment may not be dedicated to the management device, and may be realized by using a general computer system such as a personal computer (personal computer), for example. be able to.
- a general computer system such as a personal computer (personal computer), for example. be able to.
- the control part which performs the above-mentioned process can be comprised.
- a control unit for executing the file comparison update processing program described in the above embodiment can be realized in the substrate processing apparatus itself.
- means for supplying a program (file comparison update processing program) for executing the above-described processing can be arbitrarily selected.
- a program file comparison update processing program
- it can be supplied via a communication line, a communication network, a communication system, or the like.
- the program may be posted on a bulletin board of a communication network and supplied via the network.
- the above-described processing can be executed by starting the program provided in this way and executing it in the same manner as other application programs under the control of the OS (Operating System) of the management apparatus.
- the present invention can be applied not only to a semiconductor manufacturing apparatus but also to an apparatus for processing a glass substrate such as an LCD manufacturing apparatus and other substrate processing apparatuses.
- Substrate processing includes CVD, PVD, Epi, and other film formation processes for forming oxide films, nitride films, metal-containing films, etc., as well as annealing, oxidation, diffusion, etching, exposure, and lithography.
- Application processing, molding processing, development processing, dicing processing, wire bonding processing, inspection processing, and the like may be used.
- a management apparatus connected to a substrate processing apparatus that holds apparatus information for processing a substrate, and stores reference apparatus information serving as a reference for the apparatus information
- a storage unit an operation display unit that receives an instruction from a cocoon operator and displays information, and acquires the apparatus information from the substrate processing apparatus, and acquires the acquired acquisition apparatus information and the reference apparatus information stored in the storage unit
- the content of the acquisition device information and the content of the reference device information are displayed on the operation display unit as a device information comparison screen, and the correction instruction for the difference between the acquisition device information and the reference device information is displayed.
- a control unit that performs a control operation for generating correction device information by correcting the acquisition device information and transmitting the correction device information to the substrate processing apparatus; Comprising the management device is provided.
- the management apparatus Preferably, the management apparatus according to Supplementary Note 1, wherein the device information is recipe information including substrate processing parameters in the substrate processing apparatus.
- the reference device information is stored in the storage unit for each type of the device information, and the control unit is configured for each type of the device information. Further, a management device that performs the control operation is provided.
- the management device according to Supplementary notes 1 to 3, wherein the control unit controls the acquisition device information so that the difference is made the same as the content of the reference device information.
- a management device is provided.
- the operation display unit is provided with a management device that receives the correction instruction on the device information comparison screen.
- FIG. 6 Another aspect of the present invention is a substrate processing system comprising a substrate processing apparatus that holds apparatus information for processing a substrate, and a management apparatus, wherein the management apparatus is a reference for the apparatus information.
- a storage unit that stores reference device information
- an operation display unit that receives instructions from the operator and displays information, and acquires the device information from the substrate processing apparatus, and acquires the acquired acquisition device information and the storage
- the content of the acquisition device information and the content of the reference device information are displayed on the operation display unit as a device information comparison screen
- the reference device information of the acquisition device information Is received from the operation display unit
- the correction device information is generated by correcting the acquisition device information, and the correction device information is transmitted to the substrate processing apparatus.
- a substrate processing system including a control unit that performs a control operation to be controlled and a ridge.
- the management device acquires the device information from the substrate processing device based on the name of the reference device information stored in the storage unit, and There is provided a substrate processing system for displaying a substrate processing parameter included in reference apparatus information and a substrate processing parameter included in the apparatus information on the apparatus information comparison screen.
- Still another aspect of the present invention is that an acquisition step of acquiring apparatus information for processing a substrate from a substrate processing apparatus, the acquired acquisition apparatus information, and reference apparatus information serving as a reference for the apparatus information
- a correction instruction receiving step for receiving a correction instruction for a difference between the reference device information of the acquisition device information, and a correction device information for correcting the acquisition device information based on the correction instruction.
- An apparatus information correction step of creating and transmitting the correction apparatus information to the substrate processing apparatus, and an apparatus information update method including a bag are provided.
- Appendix 9 Preferably, there is provided an apparatus information update method according to appendix 8, wherein an apparatus information update method for acquiring the apparatus information from the substrate processing apparatus based on the name of the reference apparatus information in the acquisition step is provided.
- Additional remark 10 Preferably, it is the apparatus information update method of Additional remark 8 or Additional remark 9, Comprising:
- the apparatus information which displays the content of the said acquisition apparatus information and the content of the said reference
- An update method is provided.
- a device information update method for displaying the corrected information on the device information comparison screen on the device information comparison screen is provided.
- the difference information or the modified portion in which the difference is corrected is clearly indicated on the device information comparison screen so that it can be easily identified from others.
- a device information update method is provided (displays in different colors, blinks, or underlines).
- ⁇ device information update that clearly identifies a portion corresponding to the difference portion of the reference device information on the device information comparison screen so that it can be easily identified from others. Is provided.
- the further another aspect of this invention is the acquisition process which acquires the apparatus information for processing a substrate from a substrate processing apparatus, the reference
- a comparison step for comparing the above and a clarification step for clearly identifying a difference between the reference device information of the acquisition device information and a device information display method including a heel.
- a device information display method according to supplementary note 16 or supplementary note 17, wherein in the explicit step, the device information display method is provided to clearly identify the difference portion of the acquisition device information from others. Is done.
- Still another aspect of the present invention is that an acquisition process for acquiring apparatus information for processing a substrate from a substrate processing apparatus, an acquired acquisition apparatus information, and a reference apparatus information serving as a reference for the apparatus information
- a correction instruction receiving process for receiving a correction instruction for a difference portion between the reference device information of the acquisition device information, and a correction device information for correcting the acquisition device information based on the correction instruction.
- An apparatus information correction process for creating and transmitting the correction apparatus information to the substrate processing apparatus and an apparatus information update program including a bag are provided.
- Still another aspect of the present invention is that an acquisition process for acquiring apparatus information for processing a substrate from a substrate processing apparatus, an acquired acquisition apparatus information, and a reference apparatus information serving as a reference for the apparatus information
- a correction instruction receiving process for receiving a correction instruction for a difference portion between the reference device information of the acquisition device information, and a correction device information for correcting the acquisition device information based on the correction instruction.
- a recording medium in which an apparatus information correction process for creating and transmitting the correction apparatus information to the substrate processing apparatus and an apparatus information update program including a bag are stored.
- Still another aspect of the present invention is a management apparatus connected to a substrate processing apparatus that holds apparatus information for processing a substrate, and serves as a reference for the apparatus information in the apparatus information.
- a setting unit that sets reference device information; and, based on the reference device information set in the setting unit, acquires the device information from the substrate processing apparatus, and acquires the acquired acquisition device information and the reference device information.
- An operation display unit that compares and displays the extracted difference part and the contents of the device information including the reference device information, and a correction instruction for the difference part is received from the operation display unit, based on the correction instruction.
- a management device is provided that includes a control unit that performs a control operation to create correction device information in which the acquisition device information is corrected and to transmit the correction device information to the substrate processing apparatus. That.
- the management apparatus according to Supplementary note 21, further comprising a registration unit for registering the substrate processing apparatus that holds the apparatus information to be acquired based on the reference apparatus information, and the registration
- the management unit includes a name of the substrate processing apparatus, master file designation information, the comparison file name, and an editing flag indicating whether or not editing is performed.
- the management device according to Supplementary note 21, wherein the operation display unit further includes a device information comparison screen for displaying the content of the acquisition device information and the content of the reference device information, respectively.
- the device information comparison screen is provided with a management device having a button for displaying only the difference between the acquisition device information and the reference device information.
- the management device according to Supplementary Note 21, wherein the operation display unit further includes a device information comparison screen for displaying the content of the acquisition device information and the content of the reference device information.
- the device information comparison screen is provided with a management device having an editing unit that switches to an edit mode for editing the device information that is different from the reference device information.
- the management device Preferably, the management device according to Supplementary note 21, wherein the operation display unit further includes a device information comparison screen for displaying the content of the acquisition device information and the content of the reference device information, respectively.
- the apparatus information comparison screen includes a change unit that changes the substrate processing apparatus that holds the reference apparatus information, a non-display unit that hides the substrate processing apparatus that holds the apparatus information that does not need comparison, and the reference apparatus information
- a management device is provided that includes a rearrangement unit that rearranges and displays a specific parameter as a reference.
- the operation display unit holds the substrate processing that holds the reference device information.
- Change the device based on the changed reference device information, compare the acquisition device information and the changed reference device information, each of the content of the acquisition device information and the content of the changed reference device information A management device for displaying is provided.
- Still another aspect of the present invention is a substrate processing system including a substrate processing apparatus that holds apparatus information for processing a substrate and a management apparatus, wherein the management apparatus Among these, the setting unit for setting the reference device information serving as a reference for the device information, and the reference information on the reference device set in the setting unit, the device information is acquired from the substrate processing apparatus, and the acquired Device information and the reference device information are compared, an operation display unit that displays the extracted difference part, the content of the device information including the reference device information, respectively, and a correction instruction for the difference part is displayed in the operation display unit.
- a substrate processing system including a control unit and a basket.
- Yet another aspect of the present invention is a management apparatus connected to a substrate processing apparatus that holds apparatus information for processing a substrate, and is a reference for the apparatus information in the apparatus information.
- a setting unit for setting reference device information, and a difference unit obtained by extracting a difference between the acquisition device information acquired from the substrate processing apparatus and the reference device information based on the reference device information set in the setting unit And the contents of the device information including the reference device information, an operation display unit for instructing correction of the difference portion, and a correction instruction for the difference portion received from the operation display unit, the correction instruction
- a control unit that controls to correct the acquisition device information to create correction device information and transmit the correction device information to the substrate processing apparatus.
- a still further aspect of the present invention is a substrate processing system including a substrate processing apparatus that holds apparatus information for processing a substrate and a management apparatus, wherein the management apparatus Among them, a setting unit that sets reference device information serving as a reference for the device information, and an acquisition device information acquired from the substrate processing apparatus based on the reference device information set in the setting unit, and the reference device information A difference part obtained by extracting a difference, and the contents of the device information including the reference device information are respectively displayed, an operation display unit for instructing the correction of the difference part, and a correction instruction for the difference part in the operation A control unit configured to correct the acquisition device information to generate correction device information based on the correction instruction and control the correction device information to be transmitted to the substrate processing apparatus when received from the display unit; , A substrate processing system is provided.
- the difference between the acquired acquisition apparatus information for acquiring the apparatus information for processing the substrate from the substrate processing apparatus and the reference apparatus information serving as a reference for the apparatus information is calculated.
- An extraction step for extracting, a display step for displaying the difference portion, and contents of the device information including the reference device information, and a correction instruction for a difference portion between the reference device information of the acquisition device information are received.
- a method is provided.
- the difference between acquired acquisition device information for acquiring device information for processing a substrate from a substrate processing device and reference device information serving as a reference for the device information is calculated.
- An extraction process to be extracted, a display process for displaying the difference part, and contents of the device information including the reference apparatus information, and a correction instruction for a difference part between the reference apparatus information of the acquisition apparatus information are received.
- a correction instruction reception process Based on the correction instruction, a correction instruction reception process, a correction apparatus information that corrects the acquisition apparatus information is created, and the correction apparatus information is transmitted to the substrate processing apparatus.
- a recording medium storing the program is provided.
- the operation display unit includes a registration unit that registers the substrate processing apparatus having the apparatus information to be acquired based on the reference apparatus information, and the registration unit includes: The management apparatus according to appendix 28, which includes the name of the substrate processing apparatus, master file designation information, the comparison file name, and an editing flag indicating whether or not editing is performed.
- the operation display unit includes a device information comparison screen for displaying the content of the acquisition device information and the content of the reference device information, and the device information comparison screen is the acquisition device.
- the management device according to attachment 28 having a button for displaying only the difference between the information and the reference device information is provided.
- the said operation display part is provided with the apparatus information comparison screen which each displays the content of the said acquisition apparatus information, and the content of the said reference
- a management device according to supplementary note 28.
- the operation display unit changes the substrate processing apparatus that holds the reference apparatus information, and based on the changed reference apparatus information.
- a management device is provided for comparing the acquisition device information with the changed reference device information and displaying the contents of the acquisition device information and the changed reference device information, respectively.
- the management apparatus according to Supplementary Note 28 is provided, wherein the apparatus information is recipe information including parameters for substrate processing in the substrate processing apparatus.
- the present invention is preferably used in a processing system that can extract a difference in apparatus information between processing apparatuses and update apparatus information.
- DESCRIPTION OF SYMBOLS 10 ... Management apparatus, 11 ... Control part, 11a ... Device file acquisition function, 11b ... Device file comparison function, 11c ... Device file correction function, 11d ... Correction file output function, 12 ... Storage part, 12a ... Device file information, 12b ... acquired file information, 12c ... comparison file management information, 12d ... comparison result information, 12e ... modified file information, 13 ... operation display unit, 14 ... communication unit, 20 ... substrate processing apparatus, 31 ... network, 32 ... network.
Abstract
Description
Claims (11)
- 基板を処理するための装置情報を保有する基板処理装置と接続される管理装置であって、 前記装置情報のうち、前記装置情報の基準となる基準装置情報を設定する設定部と、 前記設定部に設定された前記基準装置情報に基づき前記基板処理装置から取得された取得装置情報と前記基準装置情報との差異を抽出し得られた差異部と、前記基準装置情報を含む前記装置情報の内容とをそれぞれ表示し、前記差異部の修正指示をする操作表示部と、該差異部に対する修正指示を前記操作表示部から受信すると、前記修正指示に基づいて、前記取得装置情報を修正して修正装置情報を作成し、該修正装置情報を前記基板処理装置へ送信するよう制御する制御部と、を備える管理装置。
- 基板を処理するための装置情報を保有する基板処理装置と、管理装置とを備える基板処理システムであって、 前記管理装置は、 前記装置情報のうち、前記装置情報の基準となる基準装置情報を設定する設定部と、 前記設定部に設定された前記基準装置情報に基づき前記基板処理装置から取得された取得装置情報と前記基準装置情報との差異を抽出し得られた差異部と、前記基準装置情報を含む前記装置情報の内容とをそれぞれ表示し、前記差異部の修正指示をする操作表示部と、該差異部に対する修正指示を前記操作表示部から受信すると、前記修正指示に基づいて、前記取得装置情報を修正して修正装置情報を作成し、該修正装置情報を前記基板処理装置へ送信するよう制御する制御部と、 を備える基板処理システム。
- 基板を処理するための装置情報を基板処理装置から取得する取得された取得装置情報と、前記装置情報の基準となる基準装置情報との差異を抽出する抽出工程と、前記差異部と、前記基準装置情報を含む前記装置情報の内容とをそれぞれ表示する表示工程と、 前記取得装置情報の前記基準装置情報との差異部の修正指示を受信する修正指示受付工程と、 前記修正指示に基づいて、前記取得装置情報を修正した修正装置情報を作成し、該修正装置情報を前記基板処理装置へ送信する装置情報修正工程と、 を備える装置情報更新方法。
- 基板を処理するための装置情報を基板処理装置から取得する取得された取得装置情報と、前記装置情報の基準となる基準装置情報との差異を抽出する抽出処理と、前記差異部と、前記基準装置情報を含む前記装置情報の内容とをそれぞれ表示する表示処理と、前記取得装置情報の前記基準装置情報との差異部の修正指示を受信する修正指示受付処理と、 前記修正指示に基づいて、前記取得装置情報を修正した修正装置情報を作成し、該修正装置情報を前記基板処理装置へ送信する装置情報修正処理と、 を含む装置情報更新プログラムが格納された記録媒体。
- 更に、前記操作表示部は、前記基準装置情報に基づいて、取得対象とする前記装置情報を保有する前記基板処理装置を登録する登録部を備え、前記登録部は、前記基板処理装置の名称と、マスタファイルの指定情報と、前記比較ファイル名称と、編集の有無を示す編集フラグと、を有する請求項1の管理装置。
- 更に、前記操作表示部は、前記取得装置情報の内容と前記基準装置情報の内容とをそれぞれ表示する装置情報比較画面を備え、前記装置情報比較画面は、前記取得装置情報と前記基準装置情報との差異部のみを表示するボタンを有する請求項1の管理装置。
- 更に、前記操作表示部は、前記取得装置情報の内容と前記基準装置情報の内容とをそれぞれ表示する装置情報比較画面を備え、前記装置情報比較画面は、前記基準装置情報を保有する基板処理装置を変更する変更部と、前記比較不要な装置情報を保有する基板処理装置を非表示にする非表示部と、前記基準装置情報のうち特定パラメータを基準に並べ替え表示する並べ替え部と、を有する請求項1の管理装置。
- 前記装置情報比較画面上で前記変更部が選択されると、 前記操作表示部は、前記基準装置情報を保有する前記基板処理装置を変更し、変更された基準装置情報に基づいて、前記取得装置情報と変更された基準装置情報とを比較し、前記取得装置情報の内容と前記変更された基準装置情報の内容とをそれぞれ表示する請求項7の管理装置。
- 前記装置情報は、前記基板処理装置における基板処理のパラメータを含むレシピ情報である請求項1の管理装置。
- 前記操作表示部は、前記基準装置情報と前記取得装置情報の前記差異部に対応する部分を、他から識別し易いよう明示する請求項1の管理装置。
- 前記操作表示部は、前記装置情報比較画面において、前記基準装置情報と前記取得装置情報の前記差異部を、修正前と修正後で色分け表示する請求項10の管理装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201480026651.6A CN105247657B (zh) | 2013-05-22 | 2014-05-20 | 管理装置、衬底处理系统、装置信息更新方法及存储介质 |
JP2015518259A JP6220871B2 (ja) | 2013-05-22 | 2014-05-20 | 管理装置、基板処理システム、装置情報更新方法、及び装置情報更新プログラム |
KR1020157033032A KR101786899B1 (ko) | 2013-05-22 | 2014-05-20 | 관리 장치, 기판 처리 시스템, 장치 정보 갱신 방법 및 프로그램 |
US14/946,965 US10289781B2 (en) | 2013-05-22 | 2015-11-20 | Management apparatus, substrate processing system and non-transitory computer-readable recording medium |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013-108226 | 2013-05-22 | ||
JP2013108226 | 2013-05-22 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US14/946,965 Continuation US10289781B2 (en) | 2013-05-22 | 2015-11-20 | Management apparatus, substrate processing system and non-transitory computer-readable recording medium |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2014189045A1 true WO2014189045A1 (ja) | 2014-11-27 |
Family
ID=51933598
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2014/063336 WO2014189045A1 (ja) | 2013-05-22 | 2014-05-20 | 管理装置、基板処理システム、装置情報更新方法、及び記録媒体 |
Country Status (5)
Country | Link |
---|---|
US (1) | US10289781B2 (ja) |
JP (1) | JP6220871B2 (ja) |
KR (1) | KR101786899B1 (ja) |
CN (1) | CN105247657B (ja) |
WO (1) | WO2014189045A1 (ja) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20170113244A (ko) * | 2016-03-29 | 2017-10-12 | 가부시키가이샤 히다치 고쿠사이 덴키 | 기판 처리 장치, 장치 관리 컨트롤러 및 프로그램 |
KR20170119620A (ko) | 2016-04-19 | 2017-10-27 | 가부시키가이샤 히다치 고쿠사이 덴키 | 기판 처리 장치, 장치 관리 컨트롤러 및 프로그램 |
KR20180041709A (ko) | 2015-09-30 | 2018-04-24 | 가부시키가이샤 히다치 고쿠사이 덴키 | 기판 처리 시스템, 기판 처리 장치의 파일 관리 방법, 프로그램, 기판 처리 장치 및 관리 장치 |
CN110137103A (zh) * | 2018-02-08 | 2019-08-16 | 株式会社斯库林集团 | 数据处理方法、数据处理装置、数据处理系统及记录介质 |
CN110277330A (zh) * | 2018-03-14 | 2019-09-24 | 株式会社国际电气 | 基板处理装置及系统、半导体装置的制作方法、记录介质 |
JP2020109855A (ja) * | 2020-03-06 | 2020-07-16 | 東京エレクトロン株式会社 | 半導体システム及びデータ編集支援方法 |
US11086304B2 (en) | 2016-04-19 | 2021-08-10 | Kokusai Electric Corporation | Substrate processing in a process chamber for semiconductor manufacturing and apparatus management controller with error analysis |
KR20230161349A (ko) | 2022-05-18 | 2023-11-27 | 도쿄엘렉트론가부시키가이샤 | 레시피의 표시 방법 및 기판 처리 시스템 |
US11966210B2 (en) | 2016-03-29 | 2024-04-23 | Kokusai Electric Corporation | Substrate processing apparatus, device management controller, and recording medium |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105467969A (zh) * | 2016-01-18 | 2016-04-06 | 京东方科技集团股份有限公司 | 一种制造执行系统 |
JP2018067626A (ja) * | 2016-10-19 | 2018-04-26 | 東京エレクトロン株式会社 | 半導体システム及びデータ編集支援方法 |
US10877466B2 (en) * | 2017-08-09 | 2020-12-29 | Fisher-Rosemount Systems, Inc. | Reconciliation of run-time and configuration discrepancies |
JP7161896B2 (ja) | 2018-09-20 | 2022-10-27 | 株式会社Screenホールディングス | 基板処理装置および基板処理システム |
US11714394B2 (en) * | 2018-09-28 | 2023-08-01 | Fisher-Rosemount Systems, Inc | Bulk commissioning of field devices within a process plant |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001189248A (ja) * | 2000-01-06 | 2001-07-10 | Hitachi Kokusai Electric Inc | 半導体製造装置 |
JP2006073845A (ja) * | 2004-09-03 | 2006-03-16 | Hitachi Kokusai Electric Inc | 半導体製造システム |
JP2007194446A (ja) * | 2006-01-20 | 2007-08-02 | Hitachi Kokusai Electric Inc | 基板処理装置 |
JP2007294773A (ja) * | 2006-04-27 | 2007-11-08 | Tokyo Electron Ltd | 群管理システム、プロセス情報管理装置、制御装置、およびプログラム |
JP2007299824A (ja) * | 2006-04-28 | 2007-11-15 | Tokyo Electron Ltd | プロセス情報管理装置、およびプログラム |
JP2007305613A (ja) * | 2006-05-08 | 2007-11-22 | Tokyo Electron Ltd | 群管理システム、プロセス情報管理装置およびプログラム |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11354398A (ja) * | 1998-06-08 | 1999-12-24 | Kokusai Electric Co Ltd | ウェーハ処理方法 |
US6442445B1 (en) * | 1999-03-19 | 2002-08-27 | International Business Machines Corporation, | User configurable multivariate time series reduction tool control method |
WO2003063044A2 (en) * | 2002-01-23 | 2003-07-31 | Intellitech Corporation | Management system, method and apparatus for licensed delivery and accounting of electronic circuits |
US7209798B2 (en) * | 2004-09-20 | 2007-04-24 | Tokyo Electron Limited | Iso/nested cascading trim control with model feedback updates |
US7308329B2 (en) * | 2004-12-28 | 2007-12-11 | Olympus Corporation | Method and apparatus for inspecting semiconductor wafer |
DE102005009022A1 (de) * | 2005-02-28 | 2006-09-07 | Advanced Micro Devices, Inc., Sunnyvale | Automatisches Durchsatzsteuerungssystem und Verfahren zum Betreiben desselben |
JP4629728B2 (ja) * | 2005-04-12 | 2011-02-09 | 富士通株式会社 | 生産管理プログラム、生産管理方法、生産管理システム |
US7340320B2 (en) * | 2005-04-13 | 2008-03-04 | Asm Japan K.K. | Method of recipe control operation |
US7596421B2 (en) * | 2005-06-21 | 2009-09-29 | Kabushik Kaisha Toshiba | Process control system, process control method, and method of manufacturing electronic apparatus |
US7489980B2 (en) * | 2005-08-09 | 2009-02-10 | International Business Machines Corporation | Factory level and tool level advanced process control systems integration implementation |
JP2007071678A (ja) * | 2005-09-07 | 2007-03-22 | Hitachi High-Technologies Corp | 検査システム |
US7305320B2 (en) * | 2006-02-15 | 2007-12-04 | International Business Machines Corporation | Metrology tool recipe validator using best known methods |
JP5077992B2 (ja) * | 2006-11-06 | 2012-11-21 | 東京エレクトロン株式会社 | サーバ装置、情報処理方法、及びプログラム |
JP4749385B2 (ja) * | 2007-05-29 | 2011-08-17 | 本田技研工業株式会社 | 部品発注管理のためのコンピュータ/システム |
US20090082897A1 (en) * | 2007-09-21 | 2009-03-26 | Cain Jason P | Method and apparatus for generating metrology tags to allow automatic metrology recipe generation |
JP2009272497A (ja) * | 2008-05-08 | 2009-11-19 | Hitachi High-Technologies Corp | レシピパラメータ管理装置およびレシピパラメータ管理方法 |
US8285414B2 (en) * | 2009-03-31 | 2012-10-09 | International Business Machines Corporation | Method and system for evaluating a machine tool operating characteristics |
US9280151B2 (en) * | 2012-05-15 | 2016-03-08 | Wafertech, Llc | Recipe management system and method |
JP2014041976A (ja) * | 2012-08-23 | 2014-03-06 | Toshiba Corp | レシピ管理装置 |
-
2014
- 2014-05-20 WO PCT/JP2014/063336 patent/WO2014189045A1/ja active Application Filing
- 2014-05-20 CN CN201480026651.6A patent/CN105247657B/zh active Active
- 2014-05-20 JP JP2015518259A patent/JP6220871B2/ja active Active
- 2014-05-20 KR KR1020157033032A patent/KR101786899B1/ko active IP Right Grant
-
2015
- 2015-11-20 US US14/946,965 patent/US10289781B2/en active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001189248A (ja) * | 2000-01-06 | 2001-07-10 | Hitachi Kokusai Electric Inc | 半導体製造装置 |
JP2006073845A (ja) * | 2004-09-03 | 2006-03-16 | Hitachi Kokusai Electric Inc | 半導体製造システム |
JP2007194446A (ja) * | 2006-01-20 | 2007-08-02 | Hitachi Kokusai Electric Inc | 基板処理装置 |
JP2007294773A (ja) * | 2006-04-27 | 2007-11-08 | Tokyo Electron Ltd | 群管理システム、プロセス情報管理装置、制御装置、およびプログラム |
JP2007299824A (ja) * | 2006-04-28 | 2007-11-15 | Tokyo Electron Ltd | プロセス情報管理装置、およびプログラム |
JP2007305613A (ja) * | 2006-05-08 | 2007-11-22 | Tokyo Electron Ltd | 群管理システム、プロセス情報管理装置およびプログラム |
Cited By (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20180041709A (ko) | 2015-09-30 | 2018-04-24 | 가부시키가이샤 히다치 고쿠사이 덴키 | 기판 처리 시스템, 기판 처리 장치의 파일 관리 방법, 프로그램, 기판 처리 장치 및 관리 장치 |
US10496078B2 (en) | 2015-09-30 | 2019-12-03 | Kokusai Electric Corporation | Substrate processing system, substrate processing apparatus and management device |
US11237538B2 (en) | 2016-03-29 | 2022-02-01 | Kokusai Electric Corporation | Substrate processing apparatus, device management controller, and recording medium |
US11966210B2 (en) | 2016-03-29 | 2024-04-23 | Kokusai Electric Corporation | Substrate processing apparatus, device management controller, and recording medium |
KR20170113244A (ko) * | 2016-03-29 | 2017-10-12 | 가부시키가이샤 히다치 고쿠사이 덴키 | 기판 처리 장치, 장치 관리 컨트롤러 및 프로그램 |
KR20190038504A (ko) * | 2016-03-29 | 2019-04-08 | 가부시키가이샤 코쿠사이 엘렉트릭 | 기판 처리 장치, 장치 관리 컨트롤러 및 프로그램 |
KR102394936B1 (ko) | 2016-03-29 | 2022-05-09 | 가부시키가이샤 코쿠사이 엘렉트릭 | 기판 처리 장치, 장치 관리 컨트롤러 및 프로그램 |
KR20210062606A (ko) * | 2016-03-29 | 2021-05-31 | 가부시키가이샤 코쿠사이 엘렉트릭 | 기판 처리 장치, 장치 관리 컨트롤러 및 프로그램 |
KR101965338B1 (ko) | 2016-03-29 | 2019-04-04 | 가부시키가이샤 코쿠사이 엘렉트릭 | 기판 처리 장치, 장치 관리 컨트롤러 및 프로그램 |
JP2020004997A (ja) * | 2016-03-29 | 2020-01-09 | 株式会社Kokusai Electric | 処理装置、装置管理コントローラ、及びプログラム並びに半導体装置の製造方法 |
KR102089890B1 (ko) | 2016-03-29 | 2020-03-16 | 가부시키가이샤 코쿠사이 엘렉트릭 | 기판 처리 장치, 장치 관리 컨트롤러 및 프로그램 |
JP7084898B2 (ja) | 2016-03-29 | 2022-06-15 | 株式会社Kokusai Electric | 処理装置、装置管理コントローラ、及びプログラム並びに半導体装置の製造方法 |
US11086304B2 (en) | 2016-04-19 | 2021-08-10 | Kokusai Electric Corporation | Substrate processing in a process chamber for semiconductor manufacturing and apparatus management controller with error analysis |
KR20170119620A (ko) | 2016-04-19 | 2017-10-27 | 가부시키가이샤 히다치 고쿠사이 덴키 | 기판 처리 장치, 장치 관리 컨트롤러 및 프로그램 |
KR20190038515A (ko) | 2016-04-19 | 2019-04-08 | 가부시키가이샤 코쿠사이 엘렉트릭 | 기판 처리 장치, 장치 관리 컨트롤러, 프로그램 및 반도체 장치의 제조 방법 |
KR20190038512A (ko) | 2016-04-19 | 2019-04-08 | 가부시키가이샤 코쿠사이 엘렉트릭 | 기판 처리 장치, 장치 관리 컨트롤러, 프로그램 및 반도체 장치의 제조 방법 |
KR20190038514A (ko) | 2016-04-19 | 2019-04-08 | 가부시키가이샤 코쿠사이 엘렉트릭 | 기판 처리 장치, 장치 관리 컨트롤러, 프로그램 및 반도체 장치의 제조 방법 |
CN110137103A (zh) * | 2018-02-08 | 2019-08-16 | 株式会社斯库林集团 | 数据处理方法、数据处理装置、数据处理系统及记录介质 |
JP7080065B2 (ja) | 2018-02-08 | 2022-06-03 | 株式会社Screenホールディングス | データ処理方法、データ処理装置、データ処理システム、およびデータ処理プログラム |
CN110137103B (zh) * | 2018-02-08 | 2023-08-08 | 株式会社斯库林集团 | 数据处理方法、数据处理装置、数据处理系统及记录介质 |
JP2019140195A (ja) * | 2018-02-08 | 2019-08-22 | 株式会社Screenホールディングス | データ処理方法、データ処理装置、データ処理システム、およびデータ処理プログラム |
US10930533B2 (en) | 2018-03-14 | 2021-02-23 | Kokusai Electric Corporation | Substrate processing apparatus, substrate processing system and method of manufacturing semiconductor device |
CN110277330B (zh) * | 2018-03-14 | 2023-10-31 | 株式会社国际电气 | 基板处理装置及系统、半导体装置的制作方法、记录介质 |
CN110277330A (zh) * | 2018-03-14 | 2019-09-24 | 株式会社国际电气 | 基板处理装置及系统、半导体装置的制作方法、记录介质 |
JP2020109855A (ja) * | 2020-03-06 | 2020-07-16 | 東京エレクトロン株式会社 | 半導体システム及びデータ編集支援方法 |
KR20230161349A (ko) | 2022-05-18 | 2023-11-27 | 도쿄엘렉트론가부시키가이샤 | 레시피의 표시 방법 및 기판 처리 시스템 |
Also Published As
Publication number | Publication date |
---|---|
JPWO2014189045A1 (ja) | 2017-02-23 |
KR20160002978A (ko) | 2016-01-08 |
US20160078163A1 (en) | 2016-03-17 |
CN105247657B (zh) | 2019-04-26 |
US10289781B2 (en) | 2019-05-14 |
JP6220871B2 (ja) | 2017-10-25 |
KR101786899B1 (ko) | 2017-10-18 |
CN105247657A (zh) | 2016-01-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6220871B2 (ja) | 管理装置、基板処理システム、装置情報更新方法、及び装置情報更新プログラム | |
US10768978B2 (en) | Management system and management method for creating service | |
JP6174825B2 (ja) | サービスを作成する管理システム | |
JP6421249B2 (ja) | デバッグを支援する方法及び計算機システム | |
JP2014032529A (ja) | Plcシステム、その作画エディタ装置、プログラマブル表示器 | |
US20130104101A1 (en) | Sequence program creating apparatus | |
JPWO2018011959A1 (ja) | 管理システム及び管理方法 | |
JP2018055494A (ja) | 情報処理装置、情報処理システム、及び情報処理方法 | |
JPH11232338A (ja) | プロセスフロー作成装置、プロセスフロー作成方法、及び、プロセスフロー作成プログラムを記録したコンピュータ読み取り可能な記録媒体 | |
CN113076186B (zh) | 任务处理的方法、装置、电子设备和存储介质 | |
KR102291974B1 (ko) | 반도체 시스템 및 데이터 편집 지원 방법 | |
US8495497B2 (en) | Graphical guides to aid user selection of groups of instruction packages | |
JP7156995B2 (ja) | 更新システム | |
US10108163B2 (en) | Production management apparatus, production management method and recording medium | |
JP2009169628A (ja) | 監視制御システムの構築装置、構築方法およびプログラム | |
KR20190085100A (ko) | 시스템 구축 지원 장치 및 시스템 구성도 작성 방법 | |
JPWO2015075810A1 (ja) | ユーザインターフェース生成システムおよび生成方法 | |
JP2019008635A (ja) | 画面表示装置、エンジニアリング装置、および、画面表示方法 | |
TW201730744A (zh) | 資訊處理裝置、資訊處理方法以及資訊處理程式產品 | |
US20210149642A1 (en) | Method for editing continual vertical line of visual programming language | |
JP2009230322A (ja) | ジョブ管理システム | |
JP5852066B2 (ja) | サーバ、サーバの制御方法、サーバの制御プログラム、通信システム、および情報処理装置 | |
US20190362660A1 (en) | Engineering tool | |
WO2018229979A1 (ja) | プログラム作成装置 | |
JP2015211441A (ja) | エンジニアリング作業装置及びエンジニアリング作業方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 14801086 Country of ref document: EP Kind code of ref document: A1 |
|
ENP | Entry into the national phase |
Ref document number: 2015518259 Country of ref document: JP Kind code of ref document: A Ref document number: 20157033032 Country of ref document: KR Kind code of ref document: A |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 14801086 Country of ref document: EP Kind code of ref document: A1 |