WO2014079095A1 - 液晶面板的测试装置及方法 - Google Patents

液晶面板的测试装置及方法 Download PDF

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Publication number
WO2014079095A1
WO2014079095A1 PCT/CN2012/085635 CN2012085635W WO2014079095A1 WO 2014079095 A1 WO2014079095 A1 WO 2014079095A1 CN 2012085635 W CN2012085635 W CN 2012085635W WO 2014079095 A1 WO2014079095 A1 WO 2014079095A1
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WO
WIPO (PCT)
Prior art keywords
test
liquid crystal
test unit
crystal panel
lines
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CN2012/085635
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English (en)
French (fr)
Inventor
黄皓
刘纯
潘昶宏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TCL China Star Optoelectronics Technology Co Ltd
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Shenzhen China Star Optoelectronics Technology Co Ltd
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Application filed by Shenzhen China Star Optoelectronics Technology Co Ltd filed Critical Shenzhen China Star Optoelectronics Technology Co Ltd
Priority to US13/813,935 priority Critical patent/US20140139256A1/en
Publication of WO2014079095A1 publication Critical patent/WO2014079095A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136254—Checking; Testing
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3648—Control of matrices with row and column drivers using an active matrix

Definitions

  • the present invention relates to the field of liquid crystal display technology, and in particular, to a test apparatus and method for testing a liquid crystal panel.
  • liquid crystal display devices such as liquid crystal display devices, plasma display devices and OLEDs (Organic Light-Emitting Diode, organic light emitting diode) display device.
  • OLEDs Organic Light-Emitting Diode, organic light emitting diode
  • liquid crystal display devices are gradually replacing cold cathode display devices due to their advantages of low weight, small size, and low power consumption.
  • FIG. 1 is a schematic diagram of a circuit structure of a prior art lighting test using 3D2G;
  • FIG. 2 is a schematic diagram of test signals and test results of the lighting test of the circuit shown in FIG.
  • every three data lines in the data line form a unit, and the first data line in each unit is connected together and receives the R signal, and the second data line in each unit is connected.
  • the third data line in each unit is connected together and receives the B signal;
  • every two of the scan lines form a unit, and the first scan line in each unit is connected together and receives G1
  • the signal, the second scan line in each cell is connected together and receives the G2 signal.
  • the signals of the R signal, the G signal, the B signal, the G1 signal and the G2 signal are as shown in Fig. 2. From the DOT electrical state obtained by the test, it is known that the DOT received by the R signal and the B signal have the same chargeability. Therefore, the detection capability of the liquid crystal panel is lowered.
  • the main object of the present invention is to provide a test apparatus for testing a liquid crystal panel, which aims to improve the competitiveness of the liquid crystal panel and improve the detection capability of the liquid crystal panel.
  • the present invention provides a test apparatus for testing a liquid crystal panel, including a first test unit connected to a data line of the liquid crystal panel, a second test unit connected to a scan line of the liquid crystal panel, and respectively connected to the first a signal generator of the test unit and the second test unit, the first test unit and the second test unit each include a routing area and a connection port disposed on a side of the routing area and connected to the signal generator, There are a plurality of lines in the routing area, and the lines of the same attribute in the plurality of lines are connected and connected one-to-one with the connecting port; the plurality of lines at the other end are corresponding to the signal lines set on the liquid crystal panel. connection.
  • the plurality of lines arranged in the routing area are divided into at least two sets of routing units, and the lines in each group of the routing units are arranged according to attributes, and the arrangement order is the same; and each group of routing units The number of lines in the middle line is equal to the number of connected ports.
  • the first test unit has 4 connection ports, the line area is provided with 4n lines, where n is a positive integer greater than or equal to 2; and the connection port of the second test unit is 2
  • the line set in the routing area is 2n, where n is a positive integer greater than or equal to 2.
  • the first test unit has 6 connection ports
  • the routing area is provided with 6n lines, where n is a positive integer greater than or equal to 2
  • the second test unit has a connection port of 4
  • the line set in the routing area is 4n, where n is a positive integer greater than or equal to 2.
  • the first test unit has 6 connection ports, the line area is provided with 6n lines, where n is a positive integer greater than or equal to 2; and the second test unit connection port is 2
  • the line set in the routing area is 2n, where n is a positive integer greater than or equal to 2.
  • connection ports of the first test unit and the second test unit are all four, and the line provided by the routing area is 4n, where n is a positive integer greater than or equal to 2.
  • the method further includes a first riser board connected between the signal generator and the first test unit and a second riser board connected between the signal generator and the second test unit.
  • the invention also provides a method for testing a liquid crystal panel by using the above test device, comprising the following steps:
  • the short circuit ring disposed on the non-display area of the liquid crystal panel has been cut to expose the end of the data line and the scan line;
  • the control signal generator continuously generates the first test signal and the second test signal to test the liquid crystal panel.
  • the plurality of lines set in the routing area are divided into at least two sets of routing units, and each group of the routing units is The lines are arranged by attributes and are arranged in the same order; and the number of lines in each group of routing units is equal to the number of connected ports.
  • the first test unit has 6 connection ports
  • the routing area is provided with 6n lines, where n is a positive integer greater than or equal to 2
  • the second test unit has a connection port of 4
  • the line set in the routing area is 4n, where n is a positive integer greater than or equal to 2.
  • the first test unit has 4 connection ports, the line area is provided with 4n lines, where n is a positive integer greater than or equal to 2; and the connection port of the second test unit is 2
  • the line set in the routing area is 2n, where n is a positive integer greater than or equal to 2.
  • the first test unit has 6 connection ports, the line area is provided with 6n lines, where n is a positive integer greater than or equal to 2; and the second test unit connection port is 2
  • the line set in the routing area is 2n, where n is a positive integer greater than or equal to 2.
  • connection ports of the first test unit and the second test unit are all four, and the line provided by the routing area is 4n, where n is a positive integer greater than or equal to 2.
  • the testing device used in the testing method further comprises:
  • a first riser board is disposed between the signal generator of the test device and the first test unit; and a second riser board is disposed between the signal generator of the test device and the second test unit.
  • the invention passes the line set in the routing area of the testing device, and one end of the wiring area is provided with a connection port for receiving the test signal, and the other end is connected with the signal line of the liquid crystal panel, thereby realizing the conversion of the liquid crystal panel lighting test mode; After the test of the liquid crystal panel is completed, the test device can be removed and repeated for the test of the liquid crystal panel. Therefore, the test device not only improves the detection capability of the liquid crystal panel, but also reduces the area occupied by the line on the liquid crystal panel, thereby improving the area. The competitiveness of LCD panels.
  • FIG. 1 is a schematic diagram of a circuit structure of a prior art using a 3D2G for lighting test
  • FIG. 2 is a schematic diagram of test signals and test results of the lighting test shown in FIG.
  • FIG. 3 is a schematic structural view of an embodiment of a testing apparatus for testing a liquid crystal panel of the present invention
  • FIG. 4 is a schematic structural view of two test ports in the test device of the present invention.
  • FIG. 5 is a schematic structural view of four test ports in the test device of the present invention.
  • FIG. 6 is a schematic structural view of six test ports in the test device of the present invention.
  • FIG. 7 is a schematic structural view of a first embodiment of a test device and a liquid crystal panel connection line of the present invention.
  • FIG. 8 is a schematic structural view of a second embodiment of a test device and a liquid crystal panel connection line of the present invention.
  • FIG. 9 is a schematic structural view of a third embodiment of a test device and a liquid crystal panel connection line of the present invention.
  • FIG. 10 is a schematic structural view of a fourth embodiment of a test device and a liquid crystal panel connection line of the present invention.
  • FIG. 11 is a schematic structural view of another embodiment of a testing apparatus for testing a liquid crystal panel of the present invention.
  • FIG. 12 is a flow chart showing a preferred embodiment of a test method for a liquid crystal panel of the present invention.
  • FIG. 3 is a schematic structural view of an embodiment of a testing apparatus for testing a liquid crystal panel of the present invention.
  • the test device includes a first test unit 1 for connecting to a data line of the liquid crystal panel 100 to be tested, a second test unit 2 for connecting to a scan line of the liquid crystal panel 100, and a first test unit connected thereto. 1 and a signal generator 3 of the second test unit 2, each of the first test unit 1 and the second test unit 2 includes a wiring area 10 and is disposed on a side of the wiring area 10 and connected to the signal generator 3.
  • connection ports 20 the plurality of lines are disposed in the routing area 10, and the lines of the same attribute in the line disposed near the connection port 20 are connected together, and are correspondingly connected to the connection port 20;
  • the lines are connected to the signal lines provided on the liquid crystal panel 100, respectively.
  • the test device is mainly used for lighting test of liquid crystal panels.
  • the lighting test method of the liquid crystal panel generally includes several types such as 2D1G, 3D2G, 4D2G, 6D2G, 4D4G, and 6D4G.
  • the 2D1G and 3D2G two lighting test methods will lead to the same polarity between the adjacent two signals, which makes the LCD panel detection ability weaker; and the other four lighting test methods Compared with the previous two, the detection capability of the liquid crystal panel is improved. Therefore, the present invention can realize the conversion of the 3D2G or 2D1G lighting test mode of the existing liquid crystal panel into the other four lighting test modes by the test device.
  • the short-circuit ring disposed on the liquid crystal panel is first cut by laser, so that the signal line on the liquid crystal panel is suspended; then, one end of the first test unit 1 in the test device is connected with the data line suspended on the liquid crystal panel 100 in one-to-one correspondence. The other end is connected to the signal generator 3 through the connection port 20; one end of the second test unit 2 in the test device is connected to the scanning line suspended on the liquid crystal panel 100, and the other end is connected to the signal generator 3 through the connection port 20.
  • the test signal generated by the signal generator 3 can be transmitted to the signal line on the liquid crystal panel 100 through the connection port 20.
  • the testing device for the liquid crystal panel of the present invention passes through the line provided by the wiring area 10, and one end of the wiring area 10 is provided with the connection port 20 for receiving the test signal, and the other end is connected with the signal line of the liquid crystal panel 100, thereby realizing the liquid crystal
  • the plurality of lines disposed in the routing area 10 of the first testing unit 1 and the second testing unit 2 are divided into at least two sets of routing units, and the lines in each group of routing units are arranged according to attributes. And the arrangement order is the same; and the number of lines in each group of routing units is equal to the number of connection ports 20.
  • the lines provided by the connection ports of 2, 4, and 6 respectively to the wiring area 10 will be specifically described.
  • connection port is 2
  • FIG. 4 is a schematic structural view of two test ports in the test device of the present invention.
  • the wiring area 10 is provided with 4n lines, where n is a positive integer greater than or equal to 1.
  • the connection port 20 includes a first connection port 21 and a second connection port 22.
  • the lines provided in the wiring area 10 are divided into a first wiring unit 11 and a second wiring unit 12.
  • the first line 11a of the first routing unit 11 is connected to the first line 12a of the second routing unit 12, and the connection is also connected to the first connection port 21;
  • the second line 11b of the first wiring unit 11 is connected to the second line 12b of the second wiring unit 12, and the connection is also connected to the second connection port 22.
  • all the suspended lines in the first wiring unit 11 and the second wiring unit 12 are used for one-to-one correspondence with the signal lines of the liquid crystal panel.
  • connection port is 4
  • FIG. 5 is a schematic structural view of four test ports in the testing device of the present invention.
  • the wiring area 10 is provided with 8n lines, where n is a positive integer greater than or equal to 1.
  • the connection port 20 includes a first connection port 21, a second connection port 22, a third connection port 23, and a fourth connection port 24.
  • the line provided in the wiring area 10 is divided into a first wiring unit 11 and a second wiring unit 12.
  • the first line 11a of the first routing unit 11 is connected to the first line 12a of the second routing unit 12, and the connection is also connected to the first connection port 21;
  • the second line 11b of the first routing unit 11 is connected to the second line 12b of the second routing unit 12, and the connection is also connected to the second connection port 22;
  • the third line of the first routing unit 11 The line 11c is connected to the third line 12c of the second line unit 12, and the connection is also connected to the third connection port 23;
  • the fourth line 11d of the first line unit 11 and the second line unit 11 The fourth line 12d is connected together, and the connection is also connected to the fourth connection port 24.
  • all the suspended lines in the first wiring unit 11 and the second wiring unit 12 are used for one-to-one correspondence with the signal lines of the liquid crystal panel.
  • connection port is 6
  • FIG. 6 is a schematic structural view of six test ports in the test apparatus of the present invention.
  • the wiring area 10 is provided with 12n lines, where n is a positive integer greater than or equal to 1.
  • the connection port 20 includes a first connection port 21, a second connection port 22, a third connection port 23, a fourth connection port 24, a fifth connection port 25, and a sixth connection port 26.
  • the line provided in the wiring area 10 is divided into a first wiring unit 11 and a second wiring unit 12.
  • the first line 11a of the first routing unit 11 is connected to the first line 12a of the second routing unit 12, and the connection is also connected to the first connection port 21;
  • the second line 11b of the first routing unit 11 is connected to the second line 12b of the second routing unit 12, and the connection is also connected to the second connection port 22;
  • the third line of the first routing unit 11 The line 11c is connected to the third line 12c of the second line unit 12, and the connection is also connected to the third connection port 23;
  • the fourth line 11d of the first line unit 11 and the second line unit 11 The fourth line 12d is connected together, and the connection is also connected to the fourth connection port 24.
  • the fifth line 11e of the first wiring unit 11 is connected to the fifth line 12d of the second wiring unit 12, and the connection is also connected to the fifth connection port 25.
  • the sixth line 11f of the first wiring unit 11 is connected to the sixth line 12f of the second wiring unit 12, and the sixth connection port 26 is also connected to the connection.
  • all the suspended lines in the first wiring unit 11 and the second wiring unit 12 are used for one-to-one correspondence with the signal lines of the liquid crystal panel.
  • the test device of the first test unit and the second test unit having different numbers of connection ports can be connected to the signal lines on the liquid crystal panel to realize 4D2G, 6D2G, 4D4G. , 6D4G lighting test method.
  • the number of connection ports in the first test unit 1 is set to four, and the number of connection ports in the second test unit 2 is set to two, and multiple units are arranged in parallel.
  • a test unit 1 and a plurality of second test units 2 are arranged in parallel to implement a 4D2G lighting test mode for the liquid crystal panel. As shown in FIG.
  • the number of connection ports in the first test unit 1 is set to six, and the number of connection ports in the second test unit 2 is set to two, and multiple units are arranged in parallel.
  • a test unit 1 and a plurality of second test units 2 are arranged in parallel to implement a 6D2G lighting test mode for the liquid crystal panel.
  • the number of connection ports in the first test unit 1 is set to four, and the number of connection ports in the second test unit 2 is set to four, and multiple units are arranged in parallel.
  • a test unit 1 and a plurality of second test units 2 are arranged in parallel to implement a 4D4G lighting test mode for the liquid crystal panel.
  • the number of connection ports in the first test unit 1 is set to six, and the number of connection ports in the second test unit 2 is set to four, and multiple units are arranged in parallel.
  • a test unit 1 and a plurality of second test units 2 are arranged in parallel to implement a 6D4G lighting test mode for the liquid crystal panel.
  • the second test unit 2 for testing the scan line 101 of the liquid crystal panel 100 is used for The number of first test units 1 that test the data line 102 of the liquid crystal panel 100 is less.
  • FIG 11 is a block diagram showing another embodiment of a test apparatus for testing a liquid crystal panel of the present invention.
  • the test apparatus of this embodiment further includes a first riser board 4 connected between the signal generator 3 and the first test unit 1, and a first connection between the signal generator 3 and the second test unit 2 Two adapter plate 5.
  • the first adapter plate 4 and the second adapter plate 5 are respectively used to connect the same connection ports of the first test unit 1 and the second test unit 2, and the connection ports of the second test unit 2 are two.
  • the second adapter plate 5 can realize that the first connection ports 21 on all the wiring areas 10 are connected together, and the second connection ports 22 on all the wiring areas 10 are connected together.
  • test signal generated by the signal generator 3 can be transmitted to all the wiring areas 10 through the first riser board 4 and the second riser board 5, and then the test signal can be simultaneously transmitted to the liquid crystal panel through the trace area 10. All the signal lines on the 100, that is, the lighting test of the liquid crystal panel is realized.
  • FIG. 12 is a schematic flow chart of a preferred embodiment of a method for testing a liquid crystal panel of the present invention.
  • the test method of the liquid crystal panel includes the following steps:
  • Step S101 providing a liquid crystal panel to be tested, cutting a short circuit ring disposed on a non-display area of the liquid crystal panel to expose a terminal of the data line and the scan line;
  • Step S102 providing a testing device, connecting a first testing unit in the testing device to a terminal of the data line, and a second testing unit in the testing device is connected to a terminal end of the scanning line;
  • Step S103 The control signal generator continuously generates the first test signal and the second test signal to test the liquid crystal panel.
  • the liquid crystal panel includes an array substrate, a color filter substrate, and a liquid crystal layer disposed between the array substrate and the color filter substrate.
  • the display area of the array substrate is provided with a plurality of staggered data lines, scan lines, and data respectively.
  • the thin film transistor connected to the line and the scan line is provided with a peripheral line for driving the thin film transistor to operate on the non-display area, and is connected to the data line and the scan line.
  • a short-circuit ring in the peripheral line, and the short-circuit ring is also used for the lighting test of the finished liquid crystal panel.
  • the lighting test method of the liquid crystal panel generally includes several types such as 2D1G, 3D2G, 4D2G, 6D2G, 4D4G, and 6D4G.
  • the 2D1G and 3D2G two lighting test methods will lead to the same polarity between the adjacent two signals, which makes the LCD panel detection ability weaker; and the other four lighting test methods Compared with the previous two, the detection capability of the liquid crystal panel is improved. Therefore, in the lighting test of the present invention, after the short-circuiting ring is cut off and then connected to the cut signal line through the testing device, the 3D2G or 2D1G lighting test mode of the existing liquid crystal panel is converted into the other four lighting tests. the way.
  • the test device used in the above test method is the test device described above, and will not be described herein.
  • the invention realizes the conversion of the liquid crystal panel lighting test mode by using the test device with the above structure; and after the liquid crystal panel test is finished, the test device can be removed and repeated for the liquid crystal panel test, so the test device not only improves The detection capability of the liquid crystal panel also reduces the area occupied by the lines on the liquid crystal panel, thereby improving the competitiveness of the liquid crystal panel.

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Abstract

一种用于测试液晶面板（100）的测试装置及测试方法。所述测试装置包括与液晶面板（100）的数据线连接的第一测试单元（1）、与液晶面板（100）的扫描线连接的第二测试单元（2）及分别连接所述第一测试单元（1）与第二测试单元（2）的信号产生器（3）。所述第一测试单元（1）与第二测试单元（2）包括走线区（10）及设置在走线区（10）—侧且与所述信号产生器（3）连接的连接端口（20）。所述走线区（10）内设有多条线路，该一端的多条线路中同属性的线路连接在一起且与所述连接端口（20）—一对应；另一端的多条线路相应与液晶面板（100）上设置的信号线连接。所述测试装置及测试方法实现液晶面板（100）点灯测试方式的转换，不仅提高了液晶面板（100）的检测能力，还减少了液晶面板（100）上线路占用的面积，进而提高了液晶面板（100）的竞争力。

Description

液晶面板的测试装置及方法
技术领域
本发明涉及液晶显示技术领域，特别涉及一种用于测试液晶面板的测试装置及方法。
背景技术
随着电子技术的发展，平板显示器件得到了飞速的发展，如液晶显示器件、等离子体显示器件和OLED（Organic Light-Emitting Diode，有机发光二极管）显示器件。在平板显示器件当中，液晶显示器件由于其重量低、体积小、能耗低的优点，正在逐步取代冷阴极显示设备。
平板显示器件中以无辐射薄膜晶体管有源矩阵液晶显示器应用较为广泛，现有技术中，无辐射薄膜晶体管有源矩阵液晶显示器的点灯方式一般采用2D1G（以2条数据线和1条栅极组成的若干单元）及3D2G（以3条数据线和2条栅极组成的若干单元）。但是由于2D1G和3D2G的方式将导致相邻的两数据线之间存在同种极性的现象，从而使得液晶面板的检测能力较弱。参照图1及图2，图1是现有技术采用3D2G进行点灯测试的线路结构示意图；图2是图1所示线路进行点灯测试的测试信号及测试结果的示意图。以3D2G点灯测试方式为例，数据线中每3条数据线形成一单元，且该每个单元中第一条数据线连接在一起并接收R信号，每个单元中第二条数据线连接在一起并接收G信号，每个单元中第三条数据线连接在一起并接收B信号；扫描线中每2条形成一单元，且该每个单元中第一条扫描线连接在一起并接收G1信号，每个单元中第二条扫描线连接在一起并接收G2信号。在测试过程中，R信号、G信号、B信号、G1信号及G2信号的信号如图2所示，从获得测试的DOT电性状态可知，接收R信号及B信号测试的DOT所带电性相同，因此降低了液晶面板的检测能力。
发明内容
本发明的主要目的在于提供一种用于测试液晶面板的测试装置，旨在既提高产生的竞争力，又提高液晶面板的检测能力。
本发明提供了一种用于测试液晶面板的测试装置，包括与液晶面板的数据线连接的第一测试单元、与所述液晶面板的扫描线连接的第二测试单元及分别连接所述第一测试单元与第二测试单元的信号产生器，所述第一测试单元与第二测试单元均包括走线区及设置在走线区一侧且与所述信号产生器连接的连接端口，所述走线区内设有多条线路，该一端的多条线路中同属性的线路连接在一起且与所述连接端口一一对应连接；另一端的多条线路相应与液晶面板上设置的信号线连接。
优选地，所述走线区设置的多条线路均分为至少两组走线单元，且每组走线单元中的线路中均按属性排列，且排列顺序均相同；而且每组走线单元中线路的条数与连接端口的数量相等。
优选地，所述第一测试单元的连接端口为4个，所述走线区设置的线路为4n条，其中n为大于或等于2的正整数；所述第二测试单元的连接端口为2个，所述走线区设置的线路为2n条，其中n为大于或等于2的正整数。
优选地，所述第一测试单元的连接端口为6个，所述走线区设置的线路为6n条，其中n为大于或等于2的正整数；所述第二测试单元的连接端口为4个，所述走线区设置的线路为4n条，其中n为大于或等于2的正整数。
优选地，所述第一测试单元的连接端口为6个，所述走线区设置的线路为6n条，其中n为大于或等于2的正整数；所述第二测试单元连接端口为2个，所述走线区设置的线路为2n条，其中n为大于或等于2的正整数。
优选地，所述第一测试单元与第二测试单元的连接端口均为4个，所述走线区设置的线路为4n条，其中n为大于或等于2的正整数。
优选地，还包括连接在所述信号产生器与第一测试单元之间的第一转接板及连接在所述信号产生器与第二测试单元之间的第二转接板。
本发明还提供了一种应用上述测试装置测试液晶面板的方法，包括以下步骤：
提供待测试的液晶面板，将所述液晶面板的非显示区上设置的短路环已被切割，露出数据线及扫描线的端头；
将所述测试装置中的第一测试单元与所述数据线的端头连接，所述测试装置中的第二测试单元与所述扫描线连接；
控制信号产生器连续产生第一测试信号及第二测试信号，以对液晶面板进行测试。
优选地，所述测试方法中所使用的测试装置的第一测试单元及第二测试单元中，走线区设置的多条线路均分为至少两组走线单元，且每组走线单元中的线路中均按属性排列，且排列顺序均相同；而且每组走线单元中线路的条数与连接端口的数量相等。
优选地，所述第一测试单元的连接端口为6个，所述走线区设置的线路为6n条，其中n为大于或等于2的正整数；所述第二测试单元的连接端口为4个，所述走线区设置的线路为4n条，其中n为大于或等于2的正整数。
优选地，所述第一测试单元的连接端口为4个，所述走线区设置的线路为4n条，其中n为大于或等于2的正整数；所述第二测试单元的连接端口为2个，所述走线区设置的线路为2n条，其中n为大于或等于2的正整数。
优选地，所述第一测试单元的连接端口为6个，所述走线区设置的线路为6n条，其中n为大于或等于2的正整数；所述第二测试单元连接端口为2个，所述走线区设置的线路为2n条，其中n为大于或等于2的正整数。
优选地，所述第一测试单元与第二测试单元的连接端口均为4个，所述走线区设置的线路为4n条，其中n为大于或等于2的正整数。
优选地，所述测试方法中所使用的测试装置还包括：
在测试装置的信号产生器及第一测试单元之间设置第一转接板；在测试装置的信号产生器及第二测试单元之间设置第二转接板。
本发明通过测试装置中走线区设置的线路，而且走线区一端设有接收测试信号的连接端口，另一端与液晶面板的信号线连接，从而可以实现液晶面板点灯测试方式的转换；而且待液晶面板测试结束后，该测试装置可以取下，而重复用于液晶面板的测试，因此该测试装置不仅提高了液晶面板的检测能力，而且还减少了液晶面板上线路占用的面积，进而提高了液晶面板的竞争力。
附图说明
图1是现有技术采用3D2G进行点灯测试的线路结构示意图；
图2是图1所示线路进行点灯测试的测试信号及测试结果的示意图
图3是本发明用于测试液晶面板的测试装置一实施例的结构示意图；
图4是本发明测试装置中连接端口为2个的结构示意图；
图5是本发明测试装置中连接端口为4个的结构示意图；
图6是本发明测试装置中连接端口为6个的结构示意图；
图7是本发明测试装置与液晶面板连接线路的第一实施例的结构示意图；
图8是本发明测试装置与液晶面板连接线路的第二实施例的结构示意图；
图9是本发明测试装置与液晶面板连接线路的第三实施例的结构示意图；
图10是本发明测试装置与液晶面板连接线路的第四实施例的结构示意图；
图11是本发明用于测试液晶面板的测试装置另一实施例的结构示意图；
图12是本发明液晶面板的测试方法较佳一实施例的流程示意图。
本发明目的的实现、功能特点及优点将结合实施例，参照附图做进一步说明。
具体实施方式
应当理解，此处所描述的具体实施例仅仅用以解释本发明，并不用于限定本发明。
参照图3，图3是本发明用于测试液晶面板的测试装置一实施例的结构示意图。该测试装置包括用于与待测液晶面板100的数据线连接的第一测试单元1、用于与所述液晶面板100的扫描线连接的第二测试单元2及分别连接所述第一测试单元1与第二测试单元2的信号产生器3，所述第一测试单元1与第二测试单元2均包括走线区10及设置在走线区10一侧且与所述信号产生器3连接的若干连接端口20，所述走线区10内设有多条线路，靠近连接端口20设置的线路中同属性的线路连接在一起，且对应与所述连接端口20连接；远离连接端口20设置的线路相应与液晶面板100上设置的信号线连接。
该测试装置主要用于液晶面板的点灯测试。液晶面板的点灯测试的方式一般可以包括2D1G、3D2G、4D2G、6D2G、4D4G及6D4G等几种。但是在实际的测试过程中，2D1G及3D2G两种点灯测试方式将导致相邻的两信号之间存在同种极性的现象，从而使得液晶面板的检测能力较弱；而其他四种点灯测试方式相较前面两种，提高了液晶面板的检测能力。因此本发明通过该测试装置，可以实现将现有液晶面板的3D2G或2D1G的点灯测试方式转换为其他四种点灯测试方式。具体地，先将液晶面板上设置的短路环通过激光切断，使得液晶面板上的信号线悬空；然后将该测试装置中第一测试单元1一端与液晶面板100上悬空的数据线一一对应连接，另一端通过连接端口20与信号产生器3连接；将该测试装置中第二测试单元2一端与液晶面板100上悬空的扫描线连接，另一端通过连接端口20与信号产生器3连接。从而信号产生器3产生的测试信号可以通过连接端口20传递至液晶面板100上的信号线。
本发明用于液晶面板的测试装置，通过走线区10设置的线路，而且走线区10一端设有接收测试信号的连接端口20，另一端与液晶面板100的信号线连接，从而可以实现液晶面板点灯测试方式的转换；而且待液晶面板测试结束后，该测试装置可以取下，而重复用于液晶面板100的测试，因此液晶面板非显示区上设置的线路仍然可以利用现有的3D2G或2D1G的线路方式，从而不但提高了液晶面板的检测能力，而且还提高了液晶面板的产品竞争力。
进一步的，上述第一测试单元1及第二测试单元2上走线区10设置的多条线路均分为至少两组走线单元，且每组走线单元中的线路中均按属性排列，且排列顺序均相同；而且每组走线单元中线路的条数与连接端口20的数量相等。下面将以连接端口分别为2个、4个及6个分别对走线区10设置的线路进行具体描述。
（1）连接端口为2个
参照图4，图4是本发明测试装置中连接端口为2个的结构示意图。该测试装置中，所述走线区10设置的线路为4n条，其中n为大于或等于1的正整数。以n等于1为例，其中连接端口20包括第一连接端口21及第二连接端口22。走线区10中设置的线路分为第一走线单元11及第二走线单元12。而且在走线区10的一侧，第一走线单元11的第一条线路11a与第二走线单元12的第一条线路12a连接在一起，且连接处还连接第一连接端口21；第一走线单元11的第二条线路11b与第二走线单元12的第二条线路12b连接在一起，且连接处还连接第二连接端口22。在走线区10的另一侧，第一走线单元11与第二走线单元12中所有悬空的线路均用于与液晶面板的信号线一一对应连接。
（2）连接端口为4个
参照图5，图5是本发明测试装置中连接端口为4个的结构示意图。该测试装置中，所述走线区10设置的线路为8n条，其中n为大于或等于1的正整数。以n等于1为例，其中连接端口20包括第一连接端口21、第二连接端口22、第三连接端口23及第四连接端口24。走线区10设置的线路分为第一走线单元11及第二走线单元12。而且在走线区10的一侧，第一走线单元11的第一条线路11a与第二走线单元12的第一条线路12a连接在一起，且连接处还连接第一连接端口21；第一走线单元11的第二条线路11b与第二走线单元12的第二条线路12b连接在一起，且连接处还连接第二连接端口22；第一走线单元11的第三条线路11c与第二走线单元12的第三条线路12c连接在一起，且连接处还连接第三连接端口23；第一走线单元11的第四条线路11d与第二走线单元12的第四条线路12d连接在一起，且连接处还连接第四连接端口24。在走线区10的另一侧，第一走线单元11及第二走线单元12中所有悬空的线路均用于与液晶面板的信号线一一对应连接。
（3）连接端口为6个
参照图6，图6是本发明测试装置中连接端口为6个的结构示意图。该测试装置中，所述走线区10设置的线路为12n条，其中n为大于或等于1的正整数。以n等于1为例，其中连接端口20包括第一连接端口21、第二连接端口22、第三连接端口23、第四连接端口24、第五连接端口25、第六连接端口26。走线区10设置的线路分为第一走线单元11及第二走线单元12。而且在走线区10的一侧，第一走线单元11的第一条线路11a与第二走线单元12的第一条线路12a连接在一起，且连接处还连接第一连接端口21；第一走线单元11的第二条线路11b与第二走线单元12的第二条线路12b连接在一起，且连接处还连接第二连接端口22；第一走线单元11的第三条线路11c与第二走线单元12的第三条线路12c连接在一起，且连接处还连接第三连接端口23；第一走线单元11的第四条线路11d与第二走线单元12的第四条线路12d连接在一起，且连接处还连接第四连接端口24。第一走线单元11的第五条线路11e与第二走线单元12的第五条线路12d连接在一起，且连接处还连接第五连接端口25。第一走线单元11的第六条线路11f与第二走线单元12的第六条线路12f连接在一起，且连接处还连接第六连接端口26。在走线区10的另一侧，第一走线单元11及第二走线单元12中所有悬空的线路均用于与液晶面板的信号线一一对应连接。
当液晶面板需要进行测试时，可以使用具有不同数量的连接端口的第一测试单元及第二测试单元的测试装置，将其与液晶面板上的信号线对应连接，即可实现4D2G、6D2G、4D4G、6D4G的点灯测试方式。如图7所示，该液晶面板测试所使用的测试装置中，第一测试单元1中连接端口设置为4个，第二测试单元2中连接端口设置为2个，则通过并联设置多个第一测试单元1及并联设置多个第二测试单元2可以实现对液晶面板进行4D2G的点灯测试方式。如图8所示，该液晶面板测试所使用的测试装置中，第一测试单元1中连接端口设置为6个，第二测试单元2中连接端口设置为2个，则通过并联设置多个第一测试单元1及并联设置多个第二测试单元2可以实现对液晶面板进行6D2G的点灯测试方式。如图9所示，该液晶面板测试所使用的测试装置中，第一测试单元1中连接端口设置为4个，第二测试单元2中连接端口设置为4个，则通过并联设置多个第一测试单元1及并联设置多个第二测试单元2可以实现对液晶面板进行4D4G的点灯测试方式。如图10所示，该液晶面板测试所使用的测试装置中，第一测试单元1中连接端口设置为6个，第二测试单元2中连接端口设置为4个，则通过并联设置多个第一测试单元1及并联设置多个第二测试单元2可以实现对液晶面板进行6D4G的点灯测试方式。由上可知，若测试装置的第一测试单元1及第二测试单元2中走线区10设置的线路越多，则用于测试液晶面板100的扫描线101的第二测试单元2及用于测试液晶面板100的数据线102的第一测试单元1数量越少。
参照图11，图11是本发明用于测试液晶面板的测试装置另一实施例的结构示意图。该实施例的测试装置还包括连接在所述信号产生器3与第一测试单元1之间的第一转接板4及连接在所述信号产生器3与第二测试单元2之间的第二转接板5。该第一转接板4及第二转接板5分别用于将第一测试单元1及第二测试单元2同类的连接端口连接在一起，以第二测试单元2中连接端口为2个的测试装置为例，该第二转接板5可以实现所有走线区10上的第一连接端口21连接在一起，所有走线区10上的第二连接端口22连接在一起。因此信号产生器3产生的测试信号可以通过第一转接板4及第二转接板5，同时传递至所有的走线区10，进而再通过走线区10将测试信号同时传递至液晶面板100上所有的信号线，即实现了液晶面板的点灯测试。
参照图12，图12是本发明液晶面板的测试方法较佳一实施例的流程示意图。该液晶面板的测试方法包括以下步骤：
步骤S101、提供待测试的液晶面板，将所述液晶面板的非显示区上设置的短路环切割，露出数据线及扫描线的端头；
步骤S102、提供测试装置，将所述测试装置中的第一测试单元与所述数据线的端头连接，所述测试装置中的第二测试单元与所述扫描线的端头连接；
步骤S103、控制信号产生器连续产生第一测试信号及第二测试信号，以对液晶面板进行测试。
液晶面板包括阵列基板、彩色滤光基板及设置在阵列基板与彩色滤光基板之间的液晶层，所述阵列基板的显示区上设有多条交错设置的数据线、扫描线以及分别与数据线及扫描线连接的薄膜晶体管，非显示区上设有驱动薄膜晶体管工作的外围线路，对应连接至数据线与扫描线。而且在液晶面板的制作过程中，为了测试数据线与扫描线是否连接正常，则需要在外围线路中设置短路环，而且该短路环还用于制成后的液晶面板的点灯测试。液晶面板的点灯测试的方式一般可以包括2D1G、3D2G、4D2G、6D2G、4D4G及6D4G等几种。但是在实际的测试过程中，2D1G及3D2G两种点灯测试方式将导致相邻的两信号之间存在同种极性的现象，从而使得液晶面板的检测能力较弱；而其他四种点灯测试方式相较前面两种，提高了液晶面板的检测能力。因此本发明在进行点灯测试时，先将短路环切除后，再通过该测试装置与切断的信号线连接，则实现将现有液晶面板的3D2G或2D1G的点灯测试方式转换为其他四种点灯测试方式。上述测试方法中使用的测试装置为前面所述的测试装置，在此就不再赘述。
本发明利用上述结构的测试装置，实现了液晶面板点灯测试方式的转换；而且待液晶面板测试结束后，该测试装置可以取下，而重复用于液晶面板的测试，因此该测试装置不仅提高了液晶面板的检测能力，而且还减少了液晶面板上线路占用的面积，进而提高了液晶面板的竞争力。
以上仅为本发明的优选实施例，并非因此限制本发明的专利范围，凡是利用本发明说明书及附图内容所作的等效结构或等效流程变换，或直接或间接运用在其他相关的技术领域，均同理包括在本发明的专利保护范围内。

Claims (16)

  1. 一种用于测试液晶面板的测试装置，其特征在于，包括与液晶面板的数据线连接的第一测试单元、与所述液晶面板的扫描线连接的第二测试单元及分别连接所述第一测试单元与第二测试单元的信号产生器，所述第一测试单元与第二测试单元均包括走线区及设置在走线区一侧且与所述信号产生连接的连接端口，所述走线区内设有多条线路，该一端的多条线路中同属性的线路连接在一起且与所述连接端口一一对应连接；另一端的多条线路相应与液晶面板上设置的信号线连接。
  2. 根据权利要求1所述的测试装置，其特征在于，所述走线区设置的多条线路均分为至少两组走线单元，且每组走线单元中的线路中均按属性排列，且排列顺序均相同；而且每组走线单元中线路的条数与连接端口的数量相等。
  3. 根据权利要求2所述的测试装置，其特征在于，所述第一测试单元的连接端口为4个，所述走线区设置的线路为4n条，其中n为大于或等于2的正整数；所述第二测试单元的连接端口为2个，所述走线区设置的线路为2n条，其中n为大于或等于2的正整数。
  4. 根据权利要求2所述的测试装置，其特征在于，所述第一测试单元的连接端口为6个，所述走线区设置的线路为6n条，其中n为大于或等于2的正整数；所述第二测试单元的连接端口为4个，所述走线区设置的线路为4n条，其中n为大于或等于2的正整数。
  5. 根据权利要求2所述的测试装置，其特征在于，所述第一测试单元的连接端口为6个，所述走线区设置的线路为6n条，其中n为大于或等于2的正整数；所述第二测试单元连接端口为2个，所述走线区设置的线路为2n条，其中n为大于或等于2的正整数。
  6. 根据权利要求2所述的测试装置，其特征在于，所述第一测试单元与第二测试单元的连接端口均为4个，所述走线区设置的线路为4n条，其中n为大于或等于2的正整数。
  7. 根据权利要求2所述的测试装置，其特征在于，还包括连接在所述信号产生器与第一测试单元之间的第一转接板及连接在所述信号产生器与第二测试单元之间的第二转接板。
  8. 根据权利要求1所述的测试装置，其特征在于，还包括连接在所述信号产生器与第一测试单元之间的第一转接板及连接在所述信号产生器与第二测试单元之间的第二转接板。
  9. 一种应用权利要求1所述的测试装置测试液晶面板的方法，其特征在于，包括以下步骤：
    提供待测试的液晶面板，将所述液晶面板的非显示区上设置的短路环切割，露出数据线及扫描线的端头；
    将所述测试装置中的第一测试单元与所述数据线的端头连接，所述测试装置中的第二测试单元与所述扫描线连接；
    控制信号产生器连续产生第一测试信号及第二测试信号，以对液晶面板进行测试。
  10. 根据权利要求9所述的液晶面板的测试方法，其特征在于，所述测试方法中所使用的测试装置的第一测试单元及第二测试单元中，走线区设置的多条线路均分为至少两组走线单元，且每组走线单元中的线路中均按属性排列，且排列顺序均相同；而且每组走线单元中线路的条数与连接端口的数量相等。
  11. 根据权利要求10所述的液晶面板的测试方法，其特征在于，所述第一测试单元的连接端口为6个，所述走线区设置的线路为6n条，其中n为大于或等于2的正整数；所述第二测试单元的连接端口为4个，所述走线区设置的线路为4n条，其中n为大于或等于2的正整数。
  12. 根据权利要求10所述的液晶面板的测试方法，其特征在于，所述第一测试单元的连接端口为4个，所述走线区设置的线路为4n条，其中n为大于或等于2的正整数；所述第二测试单元的连接端口为2个，所述走线区设置的线路为2n条，其中n为大于或等于2的正整数。
  13. 根据权利要求10所述的液晶面板的测试方法，其特征在于，所述第一测试单元的连接端口为6个，所述走线区设置的线路为6n条，其中n为大于或等于2的正整数；所述第二测试单元连接端口为2个，所述走线区设置的线路为2n条，其中n为大于或等于2的正整数。
  14. 根据权利要求10所述液晶面板的测试方法，其特征在于，所述第一测试单元与第二测试单元的连接端口均为4个，所述走线区设置的线路为4n条，其中n为大于或等于2的正整数。
  15. 根据权利要求10所述的液晶面板的测试方法，其特征在于，所述测试方法中所使用的测试装置还包括：
    在测试装置的信号产生器及第一测试单元之间设置第一转接板；在测试装置的信号产生器及第二测试单元之间设置第二转接板。
  16. 根据权利要求9所述的液晶面板的测试方法，其特征在于，所述测试方法中所使用的测试装置还包括：
    在测试装置的信号产生器及第一测试单元之间设置第一转接板；在测试装置的信号产生器及第二测试单元之间设置第二转接板。
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CN103713405A (zh) * 2013-10-30 2014-04-09 深圳市华星光电技术有限公司 一种液晶面板测试信号的转接板
CN103926717B (zh) 2013-12-31 2016-09-14 上海中航光电子有限公司 显示面板的检测电路、显示面板及其检测方法
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CN108257541B (zh) * 2018-03-23 2024-09-17 京东方科技集团股份有限公司 显示基板、显示面板和显示装置
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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2502699B2 (ja) * 1988-08-22 1996-05-29 松下電器産業株式会社 液晶表示パネルの製造方法
CN1591028A (zh) * 2003-08-27 2005-03-09 中华映管股份有限公司 显示面板合并检测电路
CN1945386A (zh) * 2006-10-25 2007-04-11 友达光电股份有限公司 液晶显示面板及测试其的探针
CN101833910A (zh) * 2009-03-11 2010-09-15 上海天马微电子有限公司 显示装置及其阵列基板的测试方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101527305A (zh) * 2008-03-07 2009-09-09 中华映管股份有限公司 有源元件阵列基板
JP2010210282A (ja) * 2009-03-06 2010-09-24 Videocon Global Ltd Ｔｆｔアレイ・ビルトイン・セルフ検査装置と検査方法
CN202256947U (zh) * 2011-10-20 2012-05-30 京东方科技集团股份有限公司 一种显示装置检测结构

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2502699B2 (ja) * 1988-08-22 1996-05-29 松下電器産業株式会社 液晶表示パネルの製造方法
CN1591028A (zh) * 2003-08-27 2005-03-09 中华映管股份有限公司 显示面板合并检测电路
CN1945386A (zh) * 2006-10-25 2007-04-11 友达光电股份有限公司 液晶显示面板及测试其的探针
CN101833910A (zh) * 2009-03-11 2010-09-15 上海天马微电子有限公司 显示装置及其阵列基板的测试方法

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