WO2014046041A1 - 基板ケース洗浄装置 - Google Patents
基板ケース洗浄装置 Download PDFInfo
- Publication number
- WO2014046041A1 WO2014046041A1 PCT/JP2013/074841 JP2013074841W WO2014046041A1 WO 2014046041 A1 WO2014046041 A1 WO 2014046041A1 JP 2013074841 W JP2013074841 W JP 2013074841W WO 2014046041 A1 WO2014046041 A1 WO 2014046041A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- base
- pod
- cleaning
- substrate case
- shell
- Prior art date
Links
- 238000004140 cleaning Methods 0.000 title claims abstract description 246
- 239000000758 substrate Substances 0.000 claims abstract description 174
- 230000007246 mechanism Effects 0.000 claims abstract description 78
- 230000007723 transport mechanism Effects 0.000 claims description 30
- 230000032258 transport Effects 0.000 claims description 11
- 230000003028 elevating effect Effects 0.000 claims description 6
- 239000000356 contaminant Substances 0.000 abstract description 8
- 239000012080 ambient air Substances 0.000 abstract 1
- 238000005406 washing Methods 0.000 description 10
- 239000007788 liquid Substances 0.000 description 8
- 238000000034 method Methods 0.000 description 8
- 230000008569 process Effects 0.000 description 7
- 239000007789 gas Substances 0.000 description 6
- 238000003780 insertion Methods 0.000 description 6
- 230000037431 insertion Effects 0.000 description 6
- 238000011109 contamination Methods 0.000 description 5
- 238000002347 injection Methods 0.000 description 5
- 239000007924 injection Substances 0.000 description 5
- 230000000694 effects Effects 0.000 description 3
- 230000002411 adverse Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 239000003344 environmental pollutant Substances 0.000 description 2
- 231100000719 pollutant Toxicity 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
Images
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/08—Cleaning involving contact with liquid the liquid having chemical or dissolving effect
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/02—Cleaning by the force of jets or sprays
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67057—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B9/00—Cleaning hollow articles by methods or apparatus specially adapted thereto
- B08B9/08—Cleaning containers, e.g. tanks
- B08B9/0861—Cleaning crates, boxes or the like
Definitions
- the present invention relates to a substrate case cleaning apparatus for cleaning a substrate case used for storing or transporting a substrate such as a semiconductor substrate such as a mask substrate or a wafer used for transferring a circuit pattern of an electronic component.
- this substrate case cleaning apparatus Sa includes a base case C, which includes a base Cb and a shell Cs that covers the base Cb and accommodates a substrate (not shown) in an empty state. Wash.
- the substrate case cleaning apparatus Sa includes a booth 200 that forms a clean space, and a cleaning tank 201 that houses and cleans the base Cb and shell Cs components in a separated state is provided in the booth 200.
- the cleaning tank 201 includes a tank body 202 having an opening that opens upward, and a lid 203 that opens and closes the opening of the tank body 202.
- a mounting table 204 for mounting the substrate case C is provided outside the booth 200.
- the arm robot 205 grips the substrate case C placed on the placing stand 204 with the grasping hand 207 and transports it to the support stand 206 provided inside the booth 200. Then, the arm robot 205 grips the shell Cs of the substrate case C supported by the support base 206 with the gripping hand 207, transports it into the tank body 202 of the cleaning tank 201, and cleans the base Cb of the substrate case C. It is conveyed to the lid 203 of the tank 201 and set. Thereafter, the shell Cs and the base Cb are cleaned in the tank body 202 with the lid 203 closed.
- the lid 203 of the cleaning tank 201 is opened, and the arm robot 205 sequentially conveys the base Cb and the shell Cs of the substrate case C and assembles them on the support table 206 on the substrate case C. Then, again, the arm robot 205 conveys the substrate case C from the support table 206 to the mounting table 204 outside the booth 200.
- the substrate case for storing and storing the EUV mask has a double structure as shown in FIGS. 20A and 20B.
- the substrate case C having a double structure includes an inner pot N and an outer pod M.
- the inner pod N includes an inner base Nb and an inner shell Ns that covers the inner base Nb, and accommodates a mask as a substrate D therein.
- the outer pod M includes an outer base Mb that supports the inner base Nb of the inner pod N and an outer shell Ms that covers the outer base Mb, and accommodates the inner pod N therein.
- the reason why the substrate case C is formed in a double structure is to thoroughly protect the substrate D from being contaminated by the outside air.
- the outer pod M is exposed to the outside air, but the inner pod N is not exposed to the outside air unless the outer pod M is intentionally opened.
- the conventional substrate case cleaning apparatus Sa In the case of cleaning the substrate case C, it is conceivable to use the conventional substrate case cleaning apparatus Sa as described above. However, in the conventional cleaning apparatus Sa, it is structurally difficult to house and clean the outer pod M and the inner pod N in one cleaning tank 201. Even if the outer pod M and the inner pod N can be accommodated in the cleaning layer 201 and cleaned, contaminants adhering to the outer pod M exposed to the outside air will remain in the inner pod N in the cleaning tank 201. There is a problem that it may cause secondary contamination. Since the inner pod N directly stores the substrate D, it needs to be cleaner.
- the present invention has been made in view of the above circumstances, and has made it possible to clean both of the contaminants attached to the outer pod exposed to the outside air without contaminating the inner pod, thereby improving the cleaning accuracy.
- a substrate case cleaning apparatus is provided.
- a substrate case cleaning apparatus comprises an inner base and an inner shell that covers the inner base, and an inner pod that accommodates the substrate therein, an outer base that supports the inner base of the inner pod, and an outer that covers the outer base.
- a substrate case cleaning apparatus configured to clean a substrate case including an outer pod that includes a shell and accommodates the inner pod in an empty state, a booth that forms a clean space, and an interior of the booth Each of the outer base and outer shell of the outer pod is separated and housed and cleaned in a separated state, and each of the inner base and inner shell of the inner pod is provided in the booth.
- a second cleaning tank for storing and cleaning the parts in a separated state;
- the corresponding Poddo and each part of the inner pod comprising a structure in which a transport mechanism for transporting to said first cleaning vessel and the second cleaning tank.
- the transport mechanism transports the outer base and outer shell parts of the outer pod to the first cleaning tank, and the inner base and inner shell parts of the inner pod are second. Transport to cleaning tank. And each component of an outer pod and an inner pod is wash
- the outer pod and the inner pod are each washed in separate washing tanks, it is possible to prevent a situation in which contaminants attached to the outer pod exposed to the outside air cause secondary contamination to the inner pod. Cleaning accuracy can be improved.
- the outer base and outer shell parts of the outer pod are removed from the first cleaning tank and transported by the transport mechanism, and the inner base and inner shell parts of the inner pod are second cleaned. Remove from the tank and transport.
- a support base for supporting the substrate case in the booth in a state in which the substrate case is assembled in a vertically separable manner with the outer base or the outer shell down.
- the transport mechanism is arranged such that the outer shell, the inner shell, the inner base, and the outer base are in order of the support base before the substrate case is cleaned.
- the first cleaning tank corresponding to the outer base, the inner base, the inner shell, and the outer shell in this order after being transferred into the corresponding first cleaning tank and the second cleaning tank. It is transported and assembled from the inside and the second cleaning tank to the support base, and the transport mechanism is mounted on the support base.
- the outer base, the inner base, the inner shell, and the outer shell in order of the first wash corresponding to the support base.
- the outer shell, the inner shell, the inner base, and the outer base are arranged in the order of the first cleaning tank and the second cleaning tank. It can be set as the structure which conveys to the said support stand and assembles.
- each part of the outer pod and inner pod can be sequentially transferred to the corresponding first cleaning tank and second cleaning tank by the transfer mechanism, and after cleaning, each of the outer pod and inner pod. Since the parts can be taken out from the corresponding first cleaning tank and second cleaning tank and conveyed one after another, each part of the outer pod and the inner pod can be reliably separated and assembled.
- each of the first cleaning tank and the second cleaning tank includes a tank body having an opening that opens upward, and an opening of the tank body.
- An openable / closable lid that opens when each component of the outer pod or inner pod is transported and closes when cleaning each component, and the support table, the first cleaning tank, and the second cleaning tank are Arranged in series along one horizontal direction
- the transport mechanism includes an outer base and an outer shell of the outer pod, a gripping mechanism capable of gripping the inner base and the inner shell of the inner pod, and the gripping mechanism. Elevating mechanism for moving up and down in the vertical direction, traveling mechanism for moving the gripping mechanism in one horizontal direction, and driving and controlling the gripping mechanism, the lifting mechanism and the traveling mechanism.
- It can be controller for a configured to include a.
- the transport mechanism can transport each component only by moving the gripping mechanism in the vertical direction (Z-axis direction) and one horizontal direction (Y-axis direction) under the control of the control unit.
- the structure can be simplified, and the parts can be easily separated and conveyed. Further, it is not necessary to take a large space, and space saving can be achieved.
- the gripping mechanism includes a gripping hand having a pair of hands that can be moved close to and away from each other in the other horizontal direction orthogonal to the horizontal one direction, and the pair of gripping hands.
- a drive unit that moves the hand unit close to and away from, and the control unit controls the outer base and outer shell of the outer pod and the inner base and inner shell of the inner pod individually to the pair of hands of the gripping hand. It can be set as the structure made to hold
- the gripping mechanism is moved and positioned in two horizontal directions (one horizontal direction (Y-axis direction) and one vertical direction (Z-axis direction)), and the gripping hand is positioned in the other horizontal direction (X-axis direction ), It is possible to grip each component, and it is possible to grip all the components with a single pair of hands, thereby simplifying the structure.
- the pair of single hands of the gripping hand engages the outer base and outer shell of the outer pod and the inner base and inner shell of the inner pod according to their shapes. It can be set as the structure provided with the stop part. Thereby, since each part is latched by the latching
- the outer pod and the inner pod of the substrate case are cleaned in separate cleaning tanks, so that contaminants attached to the outer pod exposed to the outside air are transferred to the inner pod.
- the cleaning accuracy it is possible to prevent a situation that causes secondary contamination, and accordingly, it is possible to improve the cleaning accuracy.
- FIG. 1 It is a perspective view which shows the structure of the holding
- cleaning apparatus It is a perspective view which shows the structure of the holding
- the substrate case cleaning apparatus S handles the substrate case C that houses the above-described EUV mask.
- the substrate case C is formed in a substantially rectangular box shape, and includes an inner base Nb and an inner shell Ns covering the inner base Nb, and an inner pod that accommodates a mask as the substrate D therein.
- N an outer base Mb that supports the inner base Nb of the inner pod N
- an outer pod M that includes the outer shell Ms that covers the outer base Mb and accommodates the inner pod N therein.
- the substrate case cleaning apparatus S cleans the substrate case C with the substrate D being empty.
- a latch-type lock portion 1 that can be locked and released so as to be detachable is provided.
- the lock portion 1 has an insertion hole 2 formed on the outer surface of the outer base Mb, and a mechanism portion (not shown) is provided inside the insertion hole 2.
- a latch pin 21 a of a latch drive unit 21 provided on a support 20, which will be described later, is inserted from the insertion hole 2, and the lock unit 1 can be locked and unlocked by the turning operation of the latch drive unit 21.
- positioning recesses 3 into which positioning pins 15 provided on the mounting table 13 to be described later are inserted are provided at three positions with an equiangular relationship.
- the engaging recess 4 in which the engaging protrusion 23 for positioning and the engaging protrusion 91 for positioning provided on the back surface of the lid 43 of the first cleaning device 40 engage with each other is provided as the positioning recess 3.
- the substrate case cleaning apparatus S includes a booth 10 that forms a clean space, as shown in FIGS.
- the booth 10 is provided with an opening 11 through which the substrate case C can pass and which is opened and closed by a shutter 12.
- the shutter 12 is opened and closed by an actuator 12a.
- the mounting table 13 supports the outer base Mb of the substrate case C with the outer base Mb facing down, and opens toward the booth 10 to expose the engaging recess 4 of the outer base Mb of the substrate case C as shown in FIG. It is formed in a fork shape having an opening 14 to be made.
- three positioning pins 15 are provided for positioning by being inserted into the three positioning recesses 3 provided on the back surface of the outer base Mb. Further, on the upper surface of the mounting table 13, four positioning blocks 16 for positioning that hold the corner portions of the outer base Mb are provided.
- the substrate case cleaning apparatus S is assembled in a state in which the substrate case C is assembled in the booth 10 so as to be vertically separable with the outer base Mb facing down.
- a support base 20 is provided for support.
- the support 20 is provided on the transfer mechanism 30.
- a latch drive unit 21 is provided in the center of the support base 20 to lock and unlock the lock unit 1 inserted from the insertion hole 2 of the outer base Mb of the supported substrate case C. It has been.
- the latch drive unit 21 is formed by standing a plurality of latch pins 21a on a rotatable disk.
- An actuator 22 for rotating the disk of the latch drive unit 21 is provided.
- the support base 20 is provided with four air suction type suction disks 24 that suck the outer base Mb of the supported substrate case C.
- the transfer mechanism 30 provided with the support base 20 is placed on the placement base 13 with the shutter 12 opened before the substrate case C is cleaned.
- the substrate case C is transferred to the support table 20, and after cleaning the substrate case C, the shutter 12 is opened and the substrate case C supported by the support table 20 is transferred to the mounting table 13.
- the transfer mechanism 30 includes a machine base 31 on which the support base 20 is mounted.
- the machine base 31 advances to the mounting base 13 side, and an advance position R1 for receiving and delivering the substrate case C between the mounting base 13 and the support base 20, and a transport mechanism which will be retracted into the booth 10 and will be described later. Between the two positions of the retracted position R2 where the substrate case C is delivered and received.
- the machine base 31 can also be positioned at an initial position R3 that is further retracted than the retracted position R2.
- the transfer mechanism 30 includes a rail 32 that movably supports the moving machine base 31, and a ball screw mechanism that moves the machine base 31 to two positions, an advance position R1 and a reverse position R2, and an initial position R3. And an advancing / retreating drive unit 33.
- the support base 20 is provided to be movable up and down with respect to the machine base 31 of the transfer mechanism 30.
- the air cylinder device that moves the support base 20 up and down on the machine base 31.
- the vertical drive part 34 which consists of is provided.
- the transfer mechanism 30 raises the support base 20 at the advance position R1 to engage the engagement convex portion 23 of the support base 20 with the engagement concave portion 4 of the substrate case C and the substrate case C with the suction plate 24. And the substrate case C is lifted.
- the transfer mechanism 30 makes the support table 20 movable through the opening 14 of the mounting table 13 while lifting the substrate case C.
- the latch drive unit 21 provided on the support base 20 raises the support base 20 at the advance position R1 of the machine base 31, and engages the engagement convex portion 23 of the support base 20 with the engagement concave portion 4 of the substrate case C. When this is done, the lock unit 1 is locked and unlocked.
- the booth 10 contains and cleans the parts of the outer base Mb and the outer shell Ms of the outer pod M in a separated state.
- a cleaning tank 40 and a second cleaning tank 50 that accommodates and cleans the components of the inner base Nb and the inner shell Ns of the inner pod N in a separated state are provided.
- Said support stand 20, the 1st washing tank 40, and the 2nd washing tank 50 are arranged in series along one horizontal direction (Y-axis direction).
- a transport mechanism 60 that transports the components of the outer pod M and the inner pod N of the substrate case C between the first cleaning tank 40 and the second cleaning tank 50 corresponding to the support 20. Is provided.
- the first cleaning tank 40 has a tank body 42 having an opening 41 opened upward, and the opening 41 of the tank body 42 is opened when each component of the outer pod M of the substrate case C is conveyed, An openable / closable lid 43 is provided for closing the parts. Further, as shown in FIG. 9, the first cleaning tank 40 is driven to rotate the first rotating plate 44 provided at the bottom of the tank body 42 so as to be rotatable about the vertical axis, and the first rotating plate 44. A plurality of (four) supporting a part of the outer edge of the outer base Mb (four corners in the embodiment) standing on the first rotating plate 44 at a predetermined height position.
- a plurality of (four) outer shell bearing rods 47 to be supported are provided.
- the outer base support rod 46 is set higher than the outer shell support rod 47 and supports the outer base Mb at a position higher than the outer shell Ms.
- the outer base bearing rod 46 and the outer shell bearing rod 47 are respectively provided at the distal ends thereof with a bearing body 48 that supports corner portions of the respective parts, and corners of the respective parts that are provided on the left and right sides of the bearing body 48. And guide pins 49 for guiding both sides of the guide.
- the plurality of outer base support rods 46 and the plurality of outer shell support rods 47 of the first cleaning tank 40 are erected at different positions in the rotational direction. In the embodiment, as shown in FIGS. 9 to 15B, the plurality of outer base support rods 46 and the plurality of outer shell support rods 47 are erected with a phase shifted in the 45 ° rotation direction.
- the tank body 52 having an opening 51 opened upward, and the opening 51 of the tank body 52 are opened when each component of the inner pod N of the substrate case C is conveyed. And a lid 53 that can be opened and closed during the cleaning.
- the inside of the first cleaning tank 40 is shown, but the configuration of the second cleaning tank 50 is also the same as that of the first cleaning tank 40, so the reference numerals of the second cleaning tank 50 are attached to the corresponding parts in parentheses. did.
- the second cleaning tank 50 rotationally drives the second rotating plate 54 provided at the bottom of the tank body 52 so as to be rotatable about a vertical axis, and the second rotating plate 54.
- the inner base support rod 56 and a part of the outer edge of the inner shell Ns (four corner portions in the embodiment) are supported at a predetermined height that is provided on the second rotary plate 54 and is different from the inner base support rod 56.
- a plurality of (four) inner shell support rods 57 are provided.
- the inner base bearing rod 56 is set higher than the inner shell bearing rod 57 and supports the inner base Nb at a position higher than the inner shell Ns.
- a bearing body 58 that supports the corner portion of each component, and a corner of each component that is provided on the left and right of the bearing body 58.
- Guide pins 59 for guiding both sides of the guide.
- the plurality of inner base support rods 56 and the plurality of inner shell support rods 57 of the second cleaning tank 50 are erected at different positions in the rotational direction. In the embodiment, as shown in FIGS.
- the plurality of inner base support rods 56 and the plurality of inner shell support rods are erected with a phase shifted in the 45 ° rotation direction.
- a cleaning liquid nozzle group for injecting a known cleaning liquid and an air nozzle for injecting and drying dry air.
- this apparatus is provided with the control part 100 which is mentioned later, as shown in FIG.
- the control unit 100 controls the first rotation drive unit 45 to stop the outer base support rod 46 when the outer base Mb is supported and released, and the outer shell support rod 47 when the outer shell Ms is supported and released.
- a function of setting the stop position different from that of the stop position is provided.
- the phase is shifted in the 45 ° rotation direction.
- the control unit 100 controls the second rotation driving unit 55 to stop the bearing rod of the inner base Nb when the inner base Nb is supported and released, and when the inner shell Ns is supported and released.
- a function for setting the stop position of the inner shell support rod 57 to be different from each other in phase is provided.
- the phase is shifted in the 45 ° rotation direction.
- the transport mechanism 60 since the substrate case C is supported by the support base 20 with the outer base Mb facing down, the transport mechanism 60 has an outer shell Ms, an inner shell Ns, an inner base Nb, These are transferred from the support base 20 into the corresponding first cleaning tank 40 and the second cleaning tank 50 in the order of the outer base Mb. Further, after cleaning the substrate case C, the transport mechanism 60 supports the outer base Mb, the inner base Nb, the inner shell Ns, and the outer shell Ms in this order from the corresponding first cleaning tank 40 and the second cleaning tank 50. It is transported to the table 20 and assembled.
- the transport mechanism 60 includes an outer base Mb and an outer shell Ms of the outer pod M, an inner base Nb and an inner shell Ns of the inner pod N, as shown in FIGS. , A lifting mechanism 62 for moving the gripping mechanism 61 up and down in the vertical direction (Z-axis direction), and a traveling mechanism 63 for moving the gripping mechanism 61 in one horizontal direction (Y-axis direction). And.
- the control unit 100 drives and controls the gripping mechanism 61, the lifting mechanism 62, and the traveling movement mechanism 63.
- the support stand 20, the 1st washing tank 40, and the 2nd washing tank 50 are provided in series along one horizontal direction (Y-axis direction), and the conveyance mechanism 60 is controlled by the control part 100,
- Each component can be transported simply by moving the gripping mechanism 61 in two directions, ie, the vertical direction (Z-axis direction) and one horizontal direction (Y-axis direction).
- the transport mechanism 60 can be simplified in structure as compared with the conventional arm robot, and can easily separate and transport the components. Further, it is not necessary to take a large space, and space saving can be achieved.
- the gripping mechanism 61 includes a base plate 64.
- the elevating mechanism 62 includes an elevating rail 65 that supports the base plate 64 so as to be movable up and down, and moves the base plate 64 up and down by a driving unit (not shown) to position it at a required position in the vertical direction (Z-axis direction).
- the traveling movement mechanism 63 includes a horizontal rail 67 that supports the lifting rail 65 so as to be movable in one horizontal direction (Y-axis direction) and is fixed to a stand 66. The travel movement mechanism 63 moves the elevating rail 65 by a driving unit (not shown) and positions it at a required position in one horizontal direction (Y-axis direction).
- the gripping mechanism 61 is a pair of hands that can be moved close to and away from each other in the other horizontal direction (X-axis direction) orthogonal to one horizontal direction (Y-axis direction).
- a gripping hand 70 including 71 and 71 and a drive unit 72 that moves the pair of hands 71 and 71 of the gripping hand 70 close to and away from each other are provided.
- the drive unit 72 is configured by, for example, an air cylinder device, and is mounted on the base plate 64.
- the control unit 100 causes the pair of single hands 71 and 71 of the gripping hand 70 to grip the outer base Mb and the outer shell Ms of the outer pod M and the inner base Nb and the inner shell Ns of the inner pod N individually by the control.
- the gripping mechanism 61 grips a component by moving the gripping mechanism 61 in two horizontal directions (a horizontal direction (Y-axis direction) and a vertical direction (Z-axis direction)) under the control of the control unit 100 and gripping the gripping mechanism 61. This is possible only by moving the hand 70 in the other horizontal direction (X-axis direction). Moreover, since all parts can be gripped by the pair of gripping single bodies 71, 71, the structure can be simplified. 16B, FIG. 17A, FIG. 17B, FIG.
- a pair of hand single bodies 71, 71 of the gripping hand 70 includes an outer base Mb of an outer pod M, an outer shell Ms, and an inner of an inner pod N.
- Locking portions 73, 74, 75, and 76 that lock to correspond to the shapes of the gripping portions of the base Nb and the inner shell Ns are formed.
- the control unit 100 causes the gripping hand 70 to wait at the standby position Q (FIG. 2) during the cleaning of the substrate case C by the control.
- the standby position Q is set at the end of the booth 10 on the shutter 12 side.
- a cleaning means 80 for cleaning the gripping hand 70 is provided.
- the cleaning means 80 includes an injection nozzle 81 that injects gas to the gripping hand 70 in the vicinity of the standby position Q, and an exhaust fan 82 that exhausts the gas injected from the injection nozzle 81 from the booth 10. Yes.
- air, nitrogen gas, or the like can be used as the gas.
- the substrate case cleaning apparatus S as shown in FIGS. 1 and 19, at least one component of the outer base Mb of the outer pod M and the outer shell Ms (the embodiment) is provided in the first cleaning tank 40. Then, when the outer surface of the outer base Mb) is not required to be cleaned, there is provided a holding portion 90 that can cover and hold the outer surface of a component that does not need to be cleaned.
- the holding unit 90 is provided on the back surface of the lid 43 of the first cleaning tank 40, and covers the outer surface of the outer base Mb as a part that does not require cleaning with the back surface of the lid 43.
- the holding portion 90 includes three engagement convex portions 91 that are engaged with the three engagement concave portions 4 of the outer base Mb to be held on the back surface of the lid 43.
- the holding unit 90 includes four suction disks 92 that suck the outer surface of the outer base Mb on the back surface of the lid 43. Since the back surface of the lid 43 is used, the structure of the holding unit 90 can be simplified.
- control unit 100 determines that the outer surface of the outer base Mb of the outer pod M is not required to be cleaned, the control unit 100 holds the corresponding outer base Mb with the holding unit 90 by the transport mechanism 60. It has a function to be conveyed. Whether or not cleaning by the control unit 100 is unnecessary is determined in advance by programming performed before cleaning of the substrate case C related to cleaning, or by detecting the type and shape of the substrate case C with a sensor. . In the embodiment, it is performed by programming performed before cleaning the substrate case C related to cleaning.
- the control unit 100 controls the opening / closing of the shutter 12, the driving control of the transfer mechanism 30, the driving control of the transport mechanism 60, and the opening / closing control of the lids 43, 53 of the first cleaning tank 40 and the second cleaning tank 50. Various controls such as rotation control, cleaning and drying control of the rotating plates 44 and 54 are performed.
- the substrate case C is cleaned as follows.
- the controller 100 is programmed in advance before cleaning the substrate case C to determine whether or not the outer surface of the outer base Mb of the outer pod M is unnecessary.
- a substrate case C for cleaning is set on the mounting table 13 using another transfer machine or the like.
- the shutter 12 of the booth 10 is opened, and the advance / retreat drive unit 33 of the transfer mechanism 30 moves the machine base 31 together with the support base 20 from the initial position R3 to the advanced position R1.
- the vertical drive unit 34 raises the support base 20, and the engagement convex part 23 of the support base 20 is moved to the board case C.
- the substrate case C is lifted by engaging with the engaging recess 4 of the outer base Mb. Further, the outer base Mb is sucked by the suction board 24. Therefore, the situation where the substrate case C moves back and forth is prevented, and the substrate case C is reliably positioned on the support base 20. Furthermore, the latch pin 21a of the latch drive unit 21 of the support base 20 is inserted from the insertion hole 2 of the outer base Mb.
- the advancing / retreating drive unit 33 of the transfer mechanism 30 moves the machine base 31 together with the support base 20 from the advance position R1 to the reverse position R2.
- the mounting table 13 is formed in a fork shape having an opening portion 14
- the support table 20 moves through the opening 14 of the mounting table 13 while the substrate case C is lifted, and the retreat position R2 Is positioned.
- the support base 20 itself is directly moved and the substrate case C is received by the support base 20, it becomes unnecessary to hold the entire substrate case as compared with the case where the arm robot is moved as in the conventional case.
- the transfer of the substrate case C from the mounting table 13 to the support table 20 is simplified without complication.
- the positioning of the substrate case C to the support base 20 can be easily performed.
- the substrate case C positioned and placed at a predetermined position on the mounting table 13 is positioned and supported at a predetermined position on the support table 20 by the engagement of the engaging concave portion 4 and the engaging convex portion 23. And positioning accuracy can be improved.
- the latch drive unit 21 is driven and unlocked, and the outer base Mb and outer shell Ms of the outer pod M supported by the support base 20 and the inner pod N The parts of the inner base Nb and the inner shell Ns can be detached. Further, the shutter 12 is closed.
- the lids 43 and 53 of the first cleaning tank 40 and the second cleaning tank 50 are opened, the transport mechanism 60 is driven, and the support base 20 moves the substrate case C to the transport mechanism 60. Deliver each part.
- the transport mechanism 60 transports the outer shell Ms, the inner shell Ns, the inner base Nb, and the outer base Mb in this order from the support 20 into the corresponding first cleaning tank 40 and the second cleaning tank 50.
- the gripping mechanism 61 grips a component by moving the gripping mechanism 61 in two horizontal directions (a horizontal direction (Y-axis direction) and a vertical direction (Z-axis direction)) under the control of the control unit 100 and gripping the gripping mechanism 61.
- the outer shell Ms and the outer base Mb are received in the first cleaning tank 40 as follows.
- the control unit 100 first drives the first rotating plate 44 so that the corner portion of the outer shell Ms can be supported by the outer shell support rod 47, and at a predetermined rotational position. Stop.
- the gripping hand 70 that grips the outer shell Ms descends into the first cleaning tank 40 to support the outer shell Ms on the outer shell support rod 47 and then rises.
- the outer shell Ms is supported by the outer shell support rod 47 having a low height, the outer shell Ms is positioned below the outer base support rod 46 having a high height together with the gripping hand 70. Since the flange 46 and the outer shell bearing rod 47 are erected at different positions in the rotation direction, it is possible to prevent interference with the outer base bearing rod 46 having a higher height.
- the outer shell Ms can be reliably transported and supported.
- the control unit 100 rotationally drives the first rotating plate 44 so that the corner portion of the outer base Mb can be supported by the outer base supporting rod 46, and stops at a predetermined rotational position. . That is, the plurality of outer base support rods 46 and the plurality of outer shell support rods 47 are erected at different positions in the rotation direction, so that the phases are shifted in the 45 ° rotation direction.
- the transport mechanism 60 can move the gripping mechanism 61 only in two horizontal directions, ie, a horizontal direction (Y-axis direction) and a vertical direction (Z-axis direction).
- the direction of the outer base Mb and the gripping hand 70 I can't change the direction.
- the position of the outer base support rod 46 and the position of the outer shell Ms support rod stop position can be set differently to adjust the position of each support rod relative to the transport mechanism 60, the outer base Mb can be reliably supported by the outer base support rod 46.
- the inner shell Ns and the inner base Nb are received in the second cleaning tank 50 as follows.
- the control unit 100 first drives the second rotating plate 54 so that the corner portion of the inner shell Ns can be supported by the inner shell support rod 57, and at a predetermined rotational position. Stop.
- the gripping hand 70 that grips the inner shell Ns descends into the second cleaning tank 50 to support the inner shell Ns on the inner shell support rod 57 and then rises.
- the inner shell Ns is supported by the inner shell bearing rod 57 having a low height, the inner shell Ns is positioned below the inner base bearing rod 56 having a high height together with the gripping hand 70. Since the bearing rod 56 and the inner shell bearing rod 57 are erected at different positions in the rotational direction, it is possible to prevent interference with the higher inner base bearing rod 56.
- the inner shell Ns can be reliably transported and supported.
- the control unit 100 rotationally drives the second rotating plate 54 so that the corner portion of the inner base Nb can be supported by the inner base support rod 56 and stops it at a predetermined rotational position. . That is, since the plurality of inner base support rods 56 and the plurality of inner shell support rods 57 are erected at different positions in the rotation direction, the phases are shifted in the 45 ° rotation direction.
- the transport mechanism 60 can move the gripping mechanism 61 only in two horizontal directions, ie, a horizontal direction (Y-axis direction) and a vertical direction (Z-axis direction).
- the direction of the inner base Nb and the gripping hand 70 I can't change the direction.
- the transport mechanism 60 performs first cleaning corresponding to the outer shell Ms, the inner shell Ns, the inner base Nb, and the outer base Mb in this order from the support base 20, respectively.
- the gripping hand 70 is made to wait at the standby position Q as shown in FIG.
- the lids 43 and 53 are closed in the first cleaning tank 40 and the second cleaning tank 50, and the parts of the outer pod M and the inner pod N are cleaned.
- the contaminants attached to the outer pod M exposed to the outside air are secondary to the inner pod N. A situation that causes contamination can be prevented, and the cleaning accuracy can be improved accordingly.
- the outer base bearing rod 46 and the outer shell bearing rod 47 support each component at a predetermined height position.
- the outer base Mb and the outer shell Ms expose the outer surface and the inner surface thereof and are held separately from each other. Therefore, when cleaning is performed, the cleaning liquid reaches the outer base Mb and the outer shell Ms evenly, so that the cleaning can be reliably performed.
- the inner base bearing rod 56 and the inner shell bearing rod 57 support each component at a predetermined height position.
- the inner base Nb and the inner shell Ns are held separately from each other while exposing their outer and inner surfaces. Therefore, when cleaning is performed, the cleaning liquid reaches the inner base Nb and the inner shell Ns evenly, so that the cleaning can be reliably performed. That is, when one part is mounted on the lids 43 and 53 for cleaning as in the prior art, the cleaning liquid is not sufficiently delivered to the surfaces of the parts mounted on the lids 43 and 53, particularly on the side of the lids 43 and 53. In the configuration of the present invention, the parts can be separated and cleaned in the tank main bodies 42 and 52, so that the cleaning liquid can be uniformly distributed and the cleaning can be surely performed.
- the gripping hand 70 is cleaned.
- the gripping hand 70 may be contaminated by the contaminants attached to each part by gripping each part and may be contaminated.
- the gripping hand 70 can be purified by gas injection from the injection nozzle 81. For this reason, when the gripping hand 70 grips and transports the cleaned components, it is possible to prevent the cleaned components from being contaminated again. Further, since the gripping hand 70 is cleaned during cleaning of each part, it can be cleaned every time each part is cleaned, and contamination of each part after cleaning can be surely prevented.
- the pollutant adhered to the gripping hand 70 is dropped by jetting gas from the jet nozzle 81, the pollutant can be reliably removed. Further, since the removed contaminants are discharged out of the booth 10 by the exhaust fan 82, the inside of the booth 10 can always be kept clean.
- the lids 43 and 53 of the first cleaning tank 40 and the second cleaning tank 50 are first opened according to the reverse process to the above, and the transport mechanism. 60, this time, the outer base Mb, the inner base Nb, the inner shell Ns, and the outer shell Ms are transferred from the corresponding first cleaning tank 40 and the second cleaning tank 50 to the support base 20 and assembled.
- the gripping mechanism 61 grips the component by moving the gripping mechanism 61 in two horizontal directions (one horizontal direction (Y-axis direction) and one vertical direction (Z-axis direction)) under the control of the control unit 100. Then, the gripping hand 70 is moved in the other horizontal direction (X-axis direction).
- the pair of single hands 71, 71 of the gripping hand 70 all the parts can be gripped by the pair of single hands 71, 71 of the gripping hand 70.
- the pair of hands 71 of the gripping hand 70 is engaged with the outer base Mb and the outer shell Ms of the outer pod M, and the gripping portions of the inner base Nb and the inner shell Ns of the inner pod N, respectively. Since the locking portions 73, 74, 75, and 76 are provided, the gripping of each component is ensured.
- the outer base Mb and the outer shell Ms are taken out from the first cleaning tank 40 as follows.
- the control unit 100 rotationally drives the first rotating plate 44 so that the outer base Mb can be gripped by the gripping hand 70, and stops at a predetermined rotational position.
- the gripping hand 70 descends, grips the outer base Mb, and then rises.
- the control unit 100 rotationally drives the first rotating plate 44 so that the outer shell Ms can be gripped by the gripping hand 70 and stops at a predetermined rotational position.
- the plurality of outer base support rods 46 and the plurality of outer shell support rods 47 are erected at different positions in the rotation direction, so that the phases are shifted in the 45 ° rotation direction.
- the gripping hand 70 descends, grips the outer shell Ms, and then rises.
- the outer shell Ms rises together with the gripping hand 70 from a position lower than the upper outer base bearing rod 46. Since the flange 46 and the outer shell bearing rod 47 are erected at different positions in the rotation direction, it is possible to prevent interference with the outer base bearing rod 46 having a higher height. The outer shell Ms can be reliably taken out.
- the inner base Nb and the inner shell Ns are taken out from the second cleaning tank 50 as follows.
- the control unit 100 rotationally drives the second rotating plate 54 so that the inner base Nb can be gripped by the gripping hand 70, and stops at a predetermined rotational position.
- the gripping hand 70 descends, grips the inner base Nb, and then rises.
- the control unit 100 rotationally drives the second rotating plate 54 so that the inner shell Ns can be gripped by the gripping hand 70, and stops at a predetermined rotational position.
- the phases are shifted in the 45 ° rotation direction.
- the gripping hand 70 descends, grips the inner shell Ns, and then rises.
- the inner shell Ns is supported toward the inner shell bearing rod 57 having a low height, the inner shell Ns rises together with the gripping hand 70 from a position lower than the inner base bearing rod 56 having a high height. Since the flange 56 and the inner shell bearing rod 57 are erected at different positions in the rotational direction, it is possible to prevent interference with the higher inner base bearing rod 56, The inner shell Ns can be reliably taken out.
- the outer base Mb, the inner base Nb, the inner shell Ns, and the outer shell Ms taken out from the cleaning tanks 40 and 50 in order are assembled on the support base 20 through the reverse process to the above, and the substrate case It is supported by the support stand 20 as C (refer FIG. 8E).
- the latch drive unit 21 is driven and the board case C is locked, and the outer base Mb and outer shell Ms of the outer pod M, the inner base Nb and inner shell Ns of the inner pod N cannot be detached. .
- the shutter 12 of the booth 10 is opened, and the advancing / retreating drive unit 33 of the transfer mechanism 30 advances the machine base 31 together with the support base 20 from the retreat position R2 to the advance position R1, and the mounting base 13 on the support base 20
- the substrate case C is delivered (see FIGS. 8D and 8C).
- the machine base 31 is advanced to the advance position R1 together with the support base 20, but since the mounting base 13 is formed in a fork shape having the opening portion 14, the support base 20 is placed with the substrate case C being lifted. It moves through the opening of the table 13 and is positioned at the advance position R1.
- the vertical drive unit 34 lowers the support base 20, removes the engagement convex portion 23 of the support base 20 from the engagement concave portion 4 of the substrate case C, and places the substrate case C on the placement table 13. (See FIG. 8B).
- the support table 20 since the support table 20 is directly moved and the substrate case C is received and delivered by the support table 20, it is not necessary to hold the entire substrate case as compared with the case where it is moved by an arm robot as in the prior art.
- the transfer from the mounting table 13 to the support table 20 can be simplified without complication, and the positioning to the mounting table 13 can be easily performed.
- the support base 20 is retracted to the initial position R3, and in this state, the substrate case C is transported from the mounting base 13 to the other.
- the outer surface of the outer base Mb is not required to be cleaned.
- it is programmed in advance in the control unit 100 that it is not necessary to clean the outer surface of the outer base Mb of the outer pod M.
- the outer base Mb and outer shell Ms of the outer pod M supported by the support base 20 and the inner base Nb and inner shell Ns of the inner pod N are transported by the transport mechanism 60.
- the last outer base Mb is held by the holding portion 90 provided on the back surface of the lid 43 of the first cleaning tank 40.
- the engaging convex part 91 of the holding part 90 is engaged with the engaging concave part 4 of the outer base Mb, and the outer base Mb is adsorbed by the suction disk 92. Therefore, the outer base Mb is prevented from moving back and forth, and is reliably held by the holding portion 90.
- the lid 43 is closed and cleaning is performed.
- the cleaning liquid reaches the inner surface and cleaning is performed.
- the cleaning liquid is prevented from entering the outer surface, so that it is not necessary to perform cleaning.
- the outer surface of the outer base Mb has a positioning hole, a lock portion 1 that locks the assembly of each component, and the like. If left in a dry state, there may be adverse effects such as generation of mold inside, but since cleaning is not performed, these adverse effects can be avoided.
- the present invention is not limited to this.
- the shell Ms is supported downward, and the outer base Mb, the inner base Nb, the inner shell Ns, and the outer shell Ms are sequentially supported from the support base 20 in the corresponding first cleaning tank 40 and After being transferred into the second cleaning tank 50 and cleaning the substrate case C, the outer shell Ms, the inner shell Ns, the inner base Nb, and the outer base Mb are arranged in the corresponding order in the first cleaning tank 40 and the second cleaning tank 50. It may be configured to be transported and assembled from the inside to the support base 20, and may be appropriately changed.
- Substrate Case Cleaning Device C Substrate Case N Inner Pod Nb Inner Base Ns Inner Shell M Outer Pod Mb Outer Base Ms Outer Shell D Substrate 1 Lock Part 2 Insertion Hole 3 Positioning Concave 4 Engaging Concave 10 Booth 11 Opening 12 Shutter 13 Mounting Base 14 Opening portion 15 Positioning pin 16 Positioning block 20 Support base 21 Latch drive portion 23 Engaging convex portion 24 Suction plate 30 Transfer mechanism 31 Machine base R1 Advance position R2 Treatment position R3 Initial position 32 Rail 33 Advance / retreat drive section 34 Vertical drive section 40 First cleaning tank 41 Opening 42 Tank main body 43 Lid 44 First rotary plate 45 First rotation driving part 46 Outer base bearing rod 47 Outer shell bearing rod 48 Bearing body 49 Guide pin 50 Second cleaning tank 51 Opening 52 Tank body 53 Lid 54 Second rotary plate 55 Second rotary drive unit 56 Inner base bearing rod 57 Inner shell bearing rod 58 Bearing body 59 Guide pin 60 Transport mechanism 61 Holding mechanism 62 Lifting mechanism 63 Traveling movement mechanism 64 Base plate 65 Lifting rail 66 Stand 67 Horizontal
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- Cleaning By Liquid Or Steam (AREA)
Abstract
Description
これにより、搬送機構により、洗浄前は、アウターポッド及びインナーポッドの各部品を順次対応する第一洗浄槽及び第二洗浄槽に搬送することができ、洗浄後は、アウターポッド及びインナーポッドの各部品を順次対応する第一洗浄槽及び第二洗浄槽から取り出して搬送することができるので、アウターポッド及びインナーポッドの各部品を確実に分離し、組み立てることができる。
これにより、搬送機構は、制御部の制御により、把持機構を垂直方向(Z軸方向)と、水平一方向(Y軸方向)の2軸方向に移動させるだけで、各部品を搬送できるので、従来のアームロボットに比較して構造を簡易にすることができ、各部品の分離搬送を容易にすることができる。また、スペースを広く取らなくても良くなり、省スペース化を図ることができる。
図1乃至図19に示す本発明の実施の形態に係る基板ケース洗浄装置Sは、上記もしたEUVマスクを収納する基板ケースCを取り扱うものである。図20A及び図20Bに示すように、基板ケースCは、略矩形箱状に形成され、インナーベースNb及びこのインナーベースNbを覆うインナーシェルNsからなり内部に基板Dとしてのマスクを収容するインナーポッドNと、インナーポッドNのインナーベースNbを支持するアウターベースMb及びアウターベースMbを覆うアウターシェルMsからなり内部にインナーポッドNを収容するアウターポッドMとを備えている。基板ケース洗浄装置Sは、基板ケースCを基板Dが空の状態で洗浄する。
また、ブース10内には、基板ケースCのアウターポッドM及びインナーポッドNの各部品を支持台20と対応する第一洗浄槽40及び第二洗浄槽50との間で搬送する搬送機構60が備えられている。
また、図9に示すように、第一洗浄槽40は、槽本体42の底部に垂直方向の軸線を中心に回転可能に設けられた第一回転板44と、第一回転板44を回転駆動する第一回転駆動部45と、第一回転板44に立設され所定の高さ位置でアウターベースMbの外縁の一部(実施の形態では4つのコーナー部)を支承する複数(4つ)のアウターベース支承杆46と、第一回転板44に立設されアウターベース支承杆46とは異なる所定の高さ位置でアウターシェルMsの外縁の一部(実施の形態では4つのコーナー部)を支承する複数(4つ)のアウターシェル支承杆47とを備えている。
また、第一洗浄槽40の複数のアウターベース支承杆46と複数のアウターシェル支承杆47とは、互いに回転方向の異なる位置に立設されている。実施の形態では、図9乃至図15Bに示すように、複数のアウターベース支承杆46及び複数のアウターシェル支承杆47は、45°回転方向に位相をずらして立設されている。
図9においては、第一洗浄槽40の内部を示すが、第二洗浄槽50においても第一洗浄槽40と構成が共通するので対応する部位に第二洗浄槽50の符号をカッコ書きで付した。この図9に示すように、第二洗浄槽50は、槽本体52の底部に垂直方向の軸線を中心に回転可能に設けられた第二回転板54と、第二回転板54を回転駆動する第二回転駆動部55と、第二回転板54に立設され所定の高さ位置でインナーベースNbの外縁の一部(実施の形態では4つのコーナー部)を支承する複数(4つ)のインナーベース支承杆56と、第二回転板54に立設されインナーベース支承杆56とは異なる所定の高さ位置でインナーシェルNsの外縁の一部(実施の形態では4つのコーナー部)を支承する複数(4つ)のインナーシェル支承杆57とを備えている。
また、第二洗浄槽50の複数のインナーベース支承杆56と複数のインナーシェル支承杆57とは、互いに回転方向の異なる位置に立設されている。実施の形態では、図9乃至図15Bに示すように、複数のインナーベース支承杆56及び複数のインナーシェル支承杆は、45°回転方向に位相をずらして立設されている。
尚、第一洗浄槽40及び第二洗浄槽50内には、周知の洗浄液を噴射する洗浄液ノズル群、ドライエアを噴出して乾燥させるエアノズルが設けられている。
この制御部100は、同様に、第二回転駆動部55を制御し、インナーベースNbの支承及び支承解除時のインナーベースNbの支承杆の停止位置と、インナーシェルNsの支承及び支承解除時のインナーシェル支承杆57の停止位置とを位相を異ならせて設定する機能を備えている。実施の形態では、図12A及び図13Aに示すように、45°回転方向に位相をずらす。
図16B、図17A、図17B、図18A及び図18Bに示すように、把持ハンド70の一対のハンド単体71、71には、アウターポッドMのアウターベースMb及びアウターシェルMs,インナーポッドNのインナーベースNb及びインナーシェルNsの各把持部の形状に夫々対応して係止する係止部73,74,75,76が形成されている。
尚、制御部100は、上記もしたシャッタ12の開閉制御、移載機構30の駆動制御、搬送機構60の駆動制御、第一洗浄槽40及び第二洗浄槽50の蓋43、53の開閉制御、回転板44,54の回転制御、洗浄,乾燥制御等、種々の制御を行う。
予め、制御部100には、アウターポッドMのアウターベースMbの外側面の洗浄が不要であるか否かを基板ケースCの洗浄前に行うプログラミングしておく。ここでは、先ず、アウターベースMbの外側面の洗浄が必要である場合について説明する。
先ず、図8Aに示すように、載置台13に洗浄に係る基板ケースCが、他の搬送機等を用いてセッティングされる。基板ケースCの洗浄前においては、図8Bに示すように、ブース10のシャッタ12が開けられ、移載機構30の進退駆動部33が機台31を支持台20とともに初期位置R3から進出位置R1に進出させるとともに、載置台13に載置された基板ケースCを支持台20上に受取る。この際には、図8C及び図6Bに示すように、機台31の進出位置R1で、上下駆動部34が支持台20を上昇させ、支持台20の係合凸部23を基板ケースCのアウターベースMbの係合凹部4に係合させて基板ケースCを持ち上げる。また、アウターベースMbを吸着盤24で吸着する。そのため、基板ケースCが左右前後に動く事態が防止され、確実に支持台20上に位置決めされる。更にまた、支持台20のラッチ駆動部21のラッチピン21aがアウターベースMbの挿入孔2から挿入される。
一方、図14A及び図14Bに示すように、第二洗浄槽50においても、インナーベース支承杆56とインナーシェル支承杆57とは異なる所定の高さ位置で各部品を支承しているので、槽本体52内において、インナーベースNb及びインナーシェルNsが夫々これらの外面及び内面を露出させるとともに互いに分離して保持されることになる。そのため、洗浄を行う際には、洗浄液が満遍なくインナーベースNb及びインナーシェルNsに行き届くことから、洗浄を確実に行うことができるようになる。
即ち、従来のように蓋43,53に一方の部品を装着して洗浄する場合には、蓋43、53に装着した部品の特に蓋43、53側の面には十分に洗浄液が行き届きにくいが、本発明の構成では、各部品を槽本体42、52内において離間させて洗浄できるので、洗浄液を満遍に行き届かせて、洗浄を確実に行うことができるようになるのである。
上記と同様に、支持台20に支持されたアウターポッドMのアウターベースMb及びアウターシェルMs、インナーポッドNのインナーベースNb及びインナーシェルNsの各部品を搬送機構60で搬送する。この際は、図1及び図19に示すように、最後のアウターベースMbは、第一洗浄槽40の蓋43の裏面に設けた保持部90に保持される。この場合、保持部90の係合凸部91をアウターベースMbの係合凹部4に係合させるとともに、アウターベースMbを吸着盤92で吸着する。そのため、アウターベースMbが左右前後に動く事態が防止され、確実に保持部90に保持される。
C 基板ケース
N インナーポッド
Nb インナーベース
Ns インナーシェル
M アウターポッド
Mb アウターベース
Ms アウターシェル
D 基板
1 ロック部
2 挿入孔
3 位置決め凹部
4 係合凹部
10 ブース
11 開口
12 シャッタ
13 載置台
14 開放部
15 位置決めピン
16 位置決めブロック
20 支持台
21 ラッチ駆動部
23 係合凸部
24 吸着盤
30 移載機構
31 機台
R1 進出位置
R2 後退位置
R3 初期位置
32 レール
33 進退駆動部
34 上下駆動部
40 第一洗浄槽
41 開口
42 槽本体
43 蓋
44 第一回転板
45 第一回転駆動部
46 アウターベース支承杆
47 アウターシェル支承杆
48 支承体
49 ガイドピン
50 第二洗浄槽
51 開口
52 槽本体
53 蓋
54 第二回転板
55 第二回転駆動部
56 インナーベース支承杆
57 インナーシェル支承杆
58 支承体
59 ガイドピン
60 搬送機構
61 把持機構
62 昇降機構
63 走行移動機構
64 ベース板
65 昇降レール
66 スタンド
67 水平レール
70 把持ハンド
71 ハンド単体
72 駆動部
73,74,75,76 係止部
80 洗浄手段
Q 待機位置
81 噴射ノズル
82 排気ファン
90 保持部
91 係合凸部
92 吸着盤
100 制御部
Claims (5)
- インナーベース及び該インナーベースを覆うインナーシェルからなり内部に基板を収容するインナーポッドと、該インナーポッドのインナーベースを支持するアウターベース及び該アウターベースを覆うアウターシェルからなり内部に該インナーポッドを収容するアウターポッドとを備えた基板ケースを、上記基板が空の状態で洗浄する基板ケース洗浄装置であって、
クリーンな空間を形成するブースと、
該ブース内に設けられ、上記アウターポッドのアウターベース及びアウターシェルの各部品を分離した状態で収容して洗浄する第一洗浄槽と、
上記ブース内に設けられ、上記インナーポッドのインナーベース及びインナーシェルの各部品を分離した状態で収容して洗浄する第二洗浄槽と、
上記アウターポッド及び上記インナーポッドの各部品を対応する上記第一洗浄槽及び上記第二洗浄槽に対して搬送する搬送機構とを備えた基板ケース洗浄装置。 - 上記ブース内で上記基板ケースを上記アウターベース若しくは上記アウターシェルを下にして垂直方向に分離可能に組み付けた状態で支持する支持台を備え、
上記搬送機構は、上記支持台に上記基板ケースが上記アウターベースを下にして支持される場合、上記基板ケースの洗浄前に、アウターシェル、インナーシェル、インナーベース、アウターベースの順にこれらを上記支持台から各々対応する上記第一洗浄槽内及び上記第二洗浄槽内に搬送し、該基板ケースの洗浄後に、アウターベース、インナーベース、インナーシェル、アウターシェルの順にこれらを対応する上記第一洗浄槽内及び上記第二洗浄槽内から上記支持台に搬送して組み立て、
上記搬送機構は、上記支持台に上記基板ケースが上記アウターシェルを下にして支持されている場合、上記基板ケースの洗浄前に、アウターベース、インナーベース、インナーシェル、アウターシェルの順にこれらを上記支持台から各々対応する上記第一洗浄槽内及び上記第二洗浄槽内に搬送し、該基板ケースの洗浄後に、アウターシェル、インナーシェル、インナーベース、アウターベースの順にこれらを対応する上記第一洗浄槽内及び上記第二洗浄槽内から上記支持台に搬送して組み立てる、請求項1記載の基板ケース洗浄装置。 - 上記第一洗浄槽及び上記第二洗浄槽のそれぞれは、上方に開放する開口を有した槽本体と、該槽本体の開口を、上記基板ケースのアウターポッドまたはインナーポッドの各部品が搬送される際に開にし、該各部品の洗浄時に閉にする開閉可能な蓋とを備え、
上記支持台、上記第一洗浄槽及び上記第二洗浄槽は、水平一方向に沿って直列的に配列され、上記搬送機構は、上記アウターポッドのアウターベース及びアウターシェル、上記インナーポッドのインナーベース及びインナーシェルを夫々把持可能な把持機構と、
該把持機構を垂直方向に昇降移動させる昇降機構と、
該把持機構を水平一方向に走行移動させる走行移動機構と、
上記把持機構、上記昇降機構及び上記走行移動機構を駆動制御する制御部とを備えた、請求項2記載の基板ケース洗浄装置。 - 上記把持機構は、上記水平一方向に直交する水平他方向に互いに近接離間可能な一対のハンド単体を備えた把持ハンドと、
該把持ハンドの上記一対のハンド単体を近接離間させる駆動部とを備え、
上記制御部の制御により上記把持ハンドの上記一対のハンド単体に上記アウターポッドのアウターベース及びアウターシェル、インナーポッドのインナーベース及びインナーシェルを個別に把持させる請求項3記載の基板ケース洗浄装置。 - 上記把持ハンドの上記一対のハンド単体は、上記アウターポッドのアウターベース及びアウターシェル及びインナーポッドのインナーベース及びインナーシェルの各把持部をその形状に応じて係止する係止部を備えた請求項4記載の基板ケース洗浄装置。
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