WO2013177830A1 - 液晶显示面板的检测方法及检测系统 - Google Patents

液晶显示面板的检测方法及检测系统 Download PDF

Info

Publication number
WO2013177830A1
WO2013177830A1 PCT/CN2012/076811 CN2012076811W WO2013177830A1 WO 2013177830 A1 WO2013177830 A1 WO 2013177830A1 CN 2012076811 W CN2012076811 W CN 2012076811W WO 2013177830 A1 WO2013177830 A1 WO 2013177830A1
Authority
WO
WIPO (PCT)
Prior art keywords
liquid crystal
crystal display
display panel
full
lighting
Prior art date
Application number
PCT/CN2012/076811
Other languages
English (en)
French (fr)
Inventor
黄皓
刘纯
潘昶宏
Original Assignee
深圳市华星光电技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 深圳市华星光电技术有限公司 filed Critical 深圳市华星光电技术有限公司
Priority to US13/521,686 priority Critical patent/US9135846B2/en
Publication of WO2013177830A1 publication Critical patent/WO2013177830A1/zh

Links

Images

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing

Definitions

  • the invention discloses a detection method and a detection system for a liquid crystal display panel, which can cut a short circuit rod in a liquid crystal display panel (shorting After bar), restore lighting detection.
  • liquid crystal displays Liquid Crystal Display, LCD
  • LCD liquid crystal display
  • CRT cathode Ray Tube
  • the liquid crystal display panel is the most important component in the liquid crystal display device, and generally includes a thin film transistor (Thin Film Transistor, TFT) substrate, color filter (Color Filter, a CF substrate and a liquid crystal layer interposed between the two substrates.
  • the thin film transistor substrate is provided with various scanning elements, a plurality of data lines, a plurality of pixel electrodes, and a plurality of thin film transistors arranged in a matrix.
  • the industry usually uses a shorting bar at the edge of the thin film transistor substrate when manufacturing the thin film transistor substrate (shorting) Bar), using the shorting bar to perform the lighting detection of the cell segment before the module is formed, and then cutting off the shorting bar on the thin film transistor substrate in the liquid crystal display panel after the detection, and then sending the liquid crystal display panel for modularization ( Module segment).
  • the short-circuit bar on the thin film transistor substrate has been cut off at this time, the short-circuit bar can no longer be used for cell lighting detection, so the tester cannot judge the mode.
  • the special defect of the liquid crystal display panel after the grouping is that the lighting tester has missed the lighting detection or the defect that the lighting detection cannot be detected.
  • the present invention provides a method and a detection system for detecting a liquid crystal display panel, which can restore the lighting detection after the shorting bar is cut.
  • a technical solution adopted by the present invention is to provide a method for detecting a liquid crystal display panel, comprising: providing a full contact lighting fixture, wherein the full contact lighting fixture comprises a plurality of probes; and utilizing the full contact The probe on the lighting fixture contacts the panel terminal on the liquid crystal display panel to perform lighting detection.
  • the full contact light fixture is further electrically connected to the printed circuit board to perform the lighting detection by using a lighting signal provided by the printed circuit board.
  • the full-contact lighting fixture is electrically connected to the printed circuit board through the COF package substrate to perform the lighting detection.
  • the liquid crystal display panel is electrically connected to the driving IC substrate of the liquid crystal display panel through the connection terminal.
  • the driving IC substrate includes a source driving IC located on the X axis and a gate driving IC located on the Y axis.
  • Another technical solution adopted by the present invention is to provide a detection system for a liquid crystal display panel, which comprises a full contact lighting fixture and a printed circuit board.
  • the full contact light fixture has a plurality of probes to contact connection terminals on the liquid crystal display panel.
  • the printed circuit board is electrically connected to the full contact light fixture to provide a lighting signal and transmit the lighting signal to the liquid crystal display panel through the full contact lighting fixture.
  • the detection system further includes a COF package substrate, wherein the printed circuit board is electrically connected to the full contact light fixture through the COF package substrate.
  • the liquid crystal display panel is electrically connected to the driving IC substrate of the liquid crystal display panel through the connection terminal.
  • the driving IC substrate includes a source driving IC located on the X axis and a gate driving IC located on the Y axis.
  • the invention has the beneficial effects that the detection method and the detection system of the liquid crystal display panel of the present invention can be utilized for the liquid crystal display panel after the module is removed (ie, the liquid crystal display panel after the shorting bar is cut off), which is different from the prior art.
  • the full-contact lighting fixture is used to restore the lighting detection originally performed by the shorting bar, thereby helping to judge whether the defective liquid crystal display panel is defective because the lighting inspection personnel missed the lighting detection or the lighting detection cannot be detected.
  • the defects are eliminated, and the parameters of the lighting detection can be adjusted to the modular detection parameters, thereby enhancing the ability of the lighting detection.
  • FIG. 1 is a schematic flow chart of a method for detecting a liquid crystal display panel according to an embodiment of the present invention
  • FIG. 2 is a detailed schematic diagram of a method of detecting a liquid crystal display panel according to an embodiment of the present invention.
  • FIG. 1 is a schematic flow chart of a method for detecting a liquid crystal display panel according to an embodiment of the present invention.
  • a method for detecting a liquid crystal display panel according to an embodiment of the present invention includes:
  • the full-contact fixture includes a plurality of probes
  • the probe on the full-contact lighting fixture contacts the liquid crystal display panel to restore the lighting detection.
  • FIG. 2 is a specific schematic diagram of a method for detecting a liquid crystal display panel according to an embodiment of the present invention.
  • the liquid crystal display panel 100 includes a display area 110 and drive IC substrates 120 and 130 disposed in the edge area.
  • the display area 110 includes a plurality of scan lines (not shown) and a plurality of data lines (not shown), and the scan lines intersect with the data lines to divide the display area 110 of the liquid crystal display panel 100 into multiple
  • Each of the pixel regions includes a thin film transistor (not shown) as a switching element and a pixel electrode (not shown).
  • the electronic devices in the display area 110 can be electrically connected to the driving IC substrates 120 and 130 in the edge regions through the connection terminals 140 to cause the liquid crystal display panel 100 to perform normal operations.
  • the driving IC substrates 120 and 130 include a gate driving IC substrate 120 on the Y axis and a source driving IC substrate 130 on the X axis.
  • the gate driving IC substrate 120 is electrically connected to the gate lines in the display region 110 through the connection terminals 140 to provide a gate signal to control whether each thin film transistor is turned on, and the source driving IC substrate 130 passes through the connection terminal 140.
  • the data lines in the display area 110 are electrically connected to transmit the image signals to the corresponding pixel electrodes through the turned-on thin film transistors, so that the liquid crystal display panel 100 can display a picture.
  • the gate driving IC substrate 120 and the source driving IC substrate 130 can utilize COF (chip The on film) or TCP (tape carrier package) and the like are attached to the liquid crystal display panel 100.
  • liquid crystal display panel 100 shown in FIG. 2 is a liquid crystal display panel after being modularized (Module segment), that is, a shorting bar (shorting) originally set. Bar) has been removed during the panel cutting process after the lighting of the cell segment has been detected.
  • Module segment modularized (Module segment)
  • shorting bar shorting
  • the connection terminal 140 of the liquid crystal display panel 100 can be electrically connected by using the full contact lighting fixture 200 as shown in FIG. 2 .
  • the full-contact lighting fixture 200 has a plurality of probes 210, and the number of the probes 210 can be designed to be the same as the number of the original short-circuit bars, thereby reducing the lighting detection originally performed by the short-circuit bar.
  • one end of the plurality of probes 210 of the full-contact lamp fixture 200 is electrically connected to the connection terminal 140 of the liquid crystal display panel 100, and the other end thereof is electrically connected to the COF package substrate 300, and then passes through the COF package substrate 300.
  • Electrically connected to the printed circuit board 400 printed Circuit board, PCB. Therefore, the lighting signal provided by the printed circuit board 400 can be transmitted to the full-contact lighting fixture 200 through the COF package substrate 300, and then transmitted to the liquid crystal display panel 100 through the full-contact lighting fixture 200, thereby performing lighting detection.
  • the method for detecting a liquid crystal display panel according to the present invention can restore the original short-circuit bar by using the full-contact lighting fixture 200 on the liquid crystal display panel 100 after the module is removed (that is, the liquid crystal display panel after the short-circuit bar is removed).
  • the detection of the lighting is performed to help determine whether the defect of the liquid crystal display panel after the moduleization is caused by the lighting detection personnel leaking the lighting detection or the defect that the lighting detection cannot be detected, and the parameter of the lighting detection can be adjusted. It tends to modularize the detection parameters to enhance the ability to detect lights.

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)

Abstract

一种液晶显示面板(100)的检测方法及检测系统。检测方法包括:提供一个全接触点灯治具(200),其中全接触点灯治具(200)包括多个探针(210);以及利用全接触点灯治具(200)上的探针(210)接触液晶显示面板(100)上的面板端子(140),以执行点灯检测。通过上述方式,能够对模组化后的液晶显示面板(100),即切除了短路棒后的液晶显示面板(100),利用全接触点灯治具(200)来还原原本由短路棒所执行的点灯检测,可以增强点灯检测的能力。

Description

液晶显示面板的检测方法及检测系统
【技术领域】
本发明公开了一种液晶显示面板的检测方法及检测系统,其可以在液晶显示面板切除短路棒(shorting bar)后,还原点灯检测。
【背景技术】
随着科技的高速发展,平面显示装置特别是液晶显示装置(Liquid Crystal Display, LCD)因其具有高画质、体积小、重量轻及应用范围广等优点,而被广泛地应用在手机、笔记本电脑、桌上型显示装置、电视等各类消费性电子产品中,并已经逐渐地取代传统的阴极射线管显示装置(Cathode Ray Tube, CRT)而成为显示装置的主流。
液晶显示面板是液晶显示装置中最重要的元件,其通常包括薄膜晶体管(Thin Film Transistor, TFT)基板、彩色滤光片(Color Filter, CF)基板以及夹设在两基板之间的液晶层。其中,薄膜晶体管基板上设置有多条扫描线、多条数据线、多个像素电极以及多个成矩阵排列的薄膜晶体管等等各类电子元器件。为了保证薄膜晶体管基板上各类电子元器件的电连接关系正确,业界通常在制程薄膜晶体管基板时,会一并在薄膜晶体管基板的边缘处设置短路棒(shorting bar),以利用短路棒而在模组化之前进行cell段的点灯检测,然后检测完毕后切除液晶显示面板中的薄膜晶体管基板上的短路棒,再将液晶显示面板送去进行模组化(Module段)。
但是,如果发现模组化后的液晶显示面板存在特殊缺陷时,由于此时薄膜晶体管基板上的短路棒已经被切除掉了,则无法再利用短路棒进行cell点灯检测,因此检测人员无法判断模组化后的液晶显示面板所存在的特殊缺陷是由于点灯检测人员漏了进行点灯检测,还是点灯检测无法检出的缺陷。
【发明内容】
为了至少部分解决以上问题,本发明提供一种液晶显示面板的检测方法及检测系统,其能够在切除短路棒后,还原点灯检测。
本发明采用的一个技术方案是:提供一种液晶显示面板的检测方法,其包括:提供一个全接触点灯治具,其中所述全接触点灯治具包括多个探针;以及利用所述全接触点灯治具上的所述探针接触所述液晶显示面板上的面板端子,以执行点灯检测。
其中,所述全接触点灯治具进一步电性连接至印刷电路板,以利用所述印刷电路板所提供的点灯信号而执行所述点灯检测。
其中,所述全接触点灯治具通过COF封装基板而电性连接至印刷电路板,以执行所述点灯检测。
其中,所述液晶显示面板通过所述连接端子而电性连接所述液晶显示面板的驱动IC基板。
其中,所述驱动IC基板包括位于X轴的源极驱动IC和位于Y轴的栅极驱动IC。
本发明采用的另一个技术方案是:提供一种液晶显示面板的检测系统,其包括全接触点灯治具和印刷电路板。所述全接触点灯治具具有多个探针,以接触所述液晶显示面板上的连接端子。所述印刷电路板电性连接所述全接触点灯治具,以提供点灯信号并通过所述全接触点灯治具而将所述点灯信号传送至所述液晶显示面板中。
其中,所述检测系统进一步包括COF封装基板,其中所述印刷电路板通过所述COF封装基板而电性连接所述全接触点灯治具。
其中,所述液晶显示面板通过所述连接端子而电性连接所述液晶显示面板的驱动IC基板。
其中,所述驱动IC基板包括位于X轴的源极驱动IC和位于Y轴的栅极驱动IC。
本发明的有益效果是:区别于现有技术的情况,本发明液晶显示面板的检测方法及检测系统可以对模组化后的液晶显示面板(即切除了短路棒后的液晶显示面板),利用全接触点灯治具来还原原本由短路棒所执行的点灯检测,从而有助于判断模组化后的液晶显示面板所存在的缺陷是由于点灯检测人员漏放了点灯检测,还是点灯检测无法检出的缺陷,并可以调整点灯检测的参数趋向至模组化检测参数,从而增强点灯检测的能力。
【附图说明】
图1是本发明实施例的液晶显示面板的检测方法的流程示意图;
图2是本发明实施例的液晶显示面板的检测方法的具体示意图。
【具体实施方式】
下面结合附图和实施例对本发明进行详细说明。
图1为本发明实施例的液晶显示面板的检测方法的流程示意图。请参阅图1,本发明实施例所示的液晶显示面板的检测方法包括:
提供一个全接触点灯治具,其中全接触治具包括多个探针;以及
利用全接触点灯治具上的探针接触液晶显示面板,以还原点灯检测。
具体地,图2为本发明实施例的液晶显示面板的检测方法的具体示意图。如图2所示,液晶显示面板100包括显示区域110以及设置在边缘区域内的驱动IC基板120和130。其中,显示区域110内包括有多条扫描线(图未示)和多条数据线(图未示),这些扫描线与这些数据线相互交叉以将液晶显示面板100的显示区域110划分成多个像素区域,而每一个像素区域分别包括一个作为开关元件的薄膜晶体管(图未示)和一个像素电极(图未示)。显示区域110内的这些电子器件可通过连接端子140而电性连接处于边缘区域的驱动IC基板120和130,以使液晶显示面板100进行正常的工作。
其中,驱动IC基板120和130包括位于Y轴的栅极驱动IC基板120和位于X轴的源极驱动IC基板130。栅极驱动IC基板120通过连接端子140而电性连接显示区域110内的栅极线,从而提供栅极信号以控制每一个薄膜晶体管的是否导通,而源极驱动IC基板130通过连接端子140而电性连接显示区域110内的数据线,以通过导通的薄膜晶体管而将图像信号传输至对应的像素电极,从而使液晶显示面板100可以显示画面。此外,栅极驱动IC基板120和源极驱动IC基板130可利用COF(chip on film)或者TCP(tape carrier package)等等封装技术而贴合在液晶显示面板100上。
此外,本领域技术人员可以理解的是,图2所示的液晶显示面板100是经过了模组化(Module段)后的液晶显示面板,即其在原本设置的短路棒(shorting bar)在经过cell段的点灯检测后已经在面板切割过程中被切除掉了。
在执行本发明实施例所述的液晶显示面板的检测方法时,其可利用如图2所示的全接触点灯治具200,而电性连接液晶显示面板100的连接端子140。其中,全接触点灯治具200具有多个探针210,其探针210的数量可以设计与原本的短路棒的线路数量相同,从而还原原本利用短路棒进行的点灯检测。
具体地,全接触点灯治具200的多个探针210的一端电性连接至液晶显示面板100的连接端子140,而其另一端电性连接至COF封装基板300,然后再通过COF封装基板300而电性连接至印刷电路板400(printed circuit board, PCB)。因此,印刷电路板400所提供的点灯信号可以通过COF封装基板300传递至全接触点灯治具200,然后再通过全接触点灯治具200而传递至液晶显示面板100内,从而执行点灯检测。
因此,本发明所述的液晶显示面板的检测方法可以对模组化后的液晶显示面板100(即切除了短路棒后的液晶显示面板),利用全接触点灯治具200来还原原本由短路棒所执行的点灯检测,从而有助于判断模组化后的液晶显示面板所存在的缺陷是由于点灯检测人员漏放了点灯检测,还是点灯检测无法检出的缺陷,并可以调整点灯检测的参数趋向至模组化检测参数,从而增强点灯检测的能力。
以上所述仅为本发明的实施例,并非因此限制本发明的专利范围,凡是利用本发明说明书及附图内容所作的等效结构或等效流程变换,或直接或间接运用在其他相关的技术领域,均同理包括在本发明的专利保护范围内。

Claims (9)

  1. 一种液晶显示面板的检测方法,其特征在于,包括:
    提供一个全接触点灯治具,其中所述全接触点灯治具包括多个探针;以及
    利用所述全接触点灯治具上的所述探针接触所述液晶显示面板上的连接端子,以执行点灯检测。
  2. 根据权利要求1所述的液晶显示面板的检测方法,其特征在于,所述全接触点灯治具进一步电性连接至印刷电路板,以利用所述印刷电路板所提供的点灯信号而执行所述点灯检测。
  3. 根据权利要求2所述的液晶显示面板的检测方法,其特征在于,所述全接触点灯治具通过COF封装基板而电性连接至所述印刷电路板,以执行所述点灯检测。
  4. 根据权利要求1所述的液晶显示面板的检测方法,其特征在于,所述液晶显示面板通过所述连接端子而电性连接所述液晶显示面板的驱动IC基板。
  5. 根据权利要求4所述的液晶显示面板的检测方法,其特征在于,所述驱动IC基板包括位于X轴的源极驱动IC和位于Y轴的栅极驱动IC。
  6. 一种液晶显示面板的检测系统,其特征在于,包括:
    全接触点灯治具,具有多个探针,以接触所述液晶显示面板上的连接端子;
    印刷电路板,电性连接所述全接触点灯治具,以提供点灯信号并通过所述全接触点灯治具而将所述点灯信号传送至所述液晶显示面板中。
  7. 根据权利要求6所述的液晶显示面板的检测系统,其特征在于,进一步包括:
    COF封装基板,其中所述印刷电路板通过所述COF封装基板而电性连接所述全接触点灯治具。
  8. 根据权利要求6所述的液晶显示面板的检测系统,其特征在于,所述液晶显示面板通过所述连接端子而电性连接所述液晶显示面板的驱动IC基板。
  9. 根据权利要求8所述的液晶显示面板的检测系统,其特征在于,所述驱动IC基板包括位于X轴的源极驱动IC和位于Y轴的栅极驱动IC。
PCT/CN2012/076811 2012-05-30 2012-06-13 液晶显示面板的检测方法及检测系统 WO2013177830A1 (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US13/521,686 US9135846B2 (en) 2012-05-30 2012-06-13 Method for detecting liquid crystal display panel and detecting system

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN2012101740521A CN102681227A (zh) 2012-05-30 2012-05-30 液晶显示面板的检测方法
CN201210174052.1 2012-05-30

Publications (1)

Publication Number Publication Date
WO2013177830A1 true WO2013177830A1 (zh) 2013-12-05

Family

ID=46813383

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2012/076811 WO2013177830A1 (zh) 2012-05-30 2012-06-13 液晶显示面板的检测方法及检测系统

Country Status (2)

Country Link
CN (1) CN102681227A (zh)
WO (1) WO2013177830A1 (zh)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103454794B (zh) * 2013-09-06 2016-06-08 深圳市华星光电技术有限公司 点灯测试治具以及液晶面板测试方法
CN104101743B (zh) * 2014-07-16 2017-03-29 北京京东方视讯科技有限公司 探头、线路检测装置及检测线路的方法
CN104166026A (zh) * 2014-08-29 2014-11-26 苏州市吴中区胥口广博模具加工厂 一种小型显示屏点亮测试座
CN104280906A (zh) * 2014-09-30 2015-01-14 合肥鑫晟光电科技有限公司 一种探针块及检测装置
CN104635105A (zh) * 2015-01-15 2015-05-20 昆山国显光电有限公司 屏体检测结构及检测方法
CN105096783A (zh) * 2015-08-03 2015-11-25 武汉华星光电技术有限公司 检测设备及其探针组件
CN106019654B (zh) * 2016-07-22 2019-05-14 京东方科技集团股份有限公司 探针单元、阵列基板的检测设备及检测方法
CN107068027B (zh) * 2017-05-27 2020-12-25 深圳市华星光电技术有限公司 液晶显示面板、液晶显示面板检测系统及方法
CN107103869A (zh) * 2017-06-26 2017-08-29 上海天马微电子有限公司 一种显示用测试系统及其测试方法
CN107942547B (zh) * 2017-11-21 2020-06-30 深圳市华星光电半导体显示技术有限公司 点灯回点治具及其检测面板的方法
CN110767131B (zh) * 2019-10-15 2023-03-24 Tcl华星光电技术有限公司 液晶显示面板的点灯检测方法、点灯治具
TWI730595B (zh) * 2020-01-20 2021-06-11 佳陞科技有限公司 待測面板的側向檢測裝置及檢測方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11212112A (ja) * 1998-01-27 1999-08-06 Sharp Corp 液晶パネル検査装置
JP2000347209A (ja) * 1999-06-07 2000-12-15 Sharp Corp 反射型液晶パネルの点灯構造
CN201138366Y (zh) * 2008-01-10 2008-10-22 环国科技股份有限公司 面板测试结构
CN101887180A (zh) * 2009-05-15 2010-11-17 东捷科技股份有限公司 移动式点灯机构
CN202110352U (zh) * 2011-06-01 2012-01-11 京东方科技集团股份有限公司 液晶基板组、检测装置及检测系统
CN202118673U (zh) * 2011-03-24 2012-01-18 京东方科技集团股份有限公司 一种背光源点灯治具及液晶显示设备

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101281980B1 (ko) * 2008-10-30 2013-07-03 엘지디스플레이 주식회사 오토 프로브 장치 및 이를 이용한 액정패널 검사방법

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11212112A (ja) * 1998-01-27 1999-08-06 Sharp Corp 液晶パネル検査装置
JP2000347209A (ja) * 1999-06-07 2000-12-15 Sharp Corp 反射型液晶パネルの点灯構造
CN201138366Y (zh) * 2008-01-10 2008-10-22 环国科技股份有限公司 面板测试结构
CN101887180A (zh) * 2009-05-15 2010-11-17 东捷科技股份有限公司 移动式点灯机构
CN202118673U (zh) * 2011-03-24 2012-01-18 京东方科技集团股份有限公司 一种背光源点灯治具及液晶显示设备
CN202110352U (zh) * 2011-06-01 2012-01-11 京东方科技集团股份有限公司 液晶基板组、检测装置及检测系统

Also Published As

Publication number Publication date
CN102681227A (zh) 2012-09-19

Similar Documents

Publication Publication Date Title
WO2013177830A1 (zh) 液晶显示面板的检测方法及检测系统
CN203324610U (zh) 显示装置
US7999901B2 (en) Thin film transistor array substrate with improved test terminals
JP4763906B2 (ja) 液晶表示パネル用駆動モジュール及びこれを有する液晶表示装置
US7847577B2 (en) Active matrix substrate, display device, and active matrix substrate inspecting method
KR100353955B1 (ko) 신호라인 검사를 위한 액정표시장치
US9188822B2 (en) Chip on glass type LCD device including testing thin film transistors, testing lines and testing pads and inspecting method of the same
EP2275861B1 (en) Active matrix substrate, display device, method for inspecting active matrix substrate, and method for inspecting display device
CN101965606B (zh) 有源矩阵基板、显示装置、有源矩阵基板的检查方法和显示装置的检查方法
KR101133762B1 (ko) 표시 장치용 표시판 및 이를 포함하는 표시 장치
CN102819126B (zh) 测试装置及测试方法
CN102566167A (zh) 一种阵列基板
CN103293771A (zh) 液晶配向检查机及方法
CN109448617B (zh) 显示面板和显示装置
CN112309884B (zh) Led显示背板检测装置及其检测方法
CN110927999B (zh) 显示面板及其测试方法
CN103499892A (zh) 栅线通断检测方法及检测设备
CN102831852A (zh) 一种tft-lcd阵列基板及其测试方法
WO2017190403A1 (zh) 面板检测单元、阵列基板及液晶显示装置
KR101746860B1 (ko) 액정표시장치 및 그의 검사방법
US20130321020A1 (en) Method for Detecting Liquid Crystal Display Panel and Detecting System
KR20150077778A (ko) 디스플레이 장치의 검사 방법
KR20110071271A (ko) 구동아이씨칩 테스트장비
US11017703B2 (en) Method for manufacturing display device, method for repairing display device, and display device
CN104375296A (zh) 一种玻璃基板、外围电路板和显示面板

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 13521686

Country of ref document: US

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 12877956

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 12877956

Country of ref document: EP

Kind code of ref document: A1