WO2013160428A1 - Verfahren zum behandeln von zumindest einem substrat in einem flüssigen medium - Google Patents
Verfahren zum behandeln von zumindest einem substrat in einem flüssigen medium Download PDFInfo
- Publication number
- WO2013160428A1 WO2013160428A1 PCT/EP2013/058687 EP2013058687W WO2013160428A1 WO 2013160428 A1 WO2013160428 A1 WO 2013160428A1 EP 2013058687 W EP2013058687 W EP 2013058687W WO 2013160428 A1 WO2013160428 A1 WO 2013160428A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- substrate
- liquid medium
- hoist
- treating
- holding frame
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/67034—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
Definitions
- the invention relates to a method for treating at least one substrate, in particular wafers, in a liquid medium.
- This invention relates to a technology by which, in particular, optimal drying of substrates is possible.
- Substrates include base plates for semiconductors or electronic components. These are wafers. But this only applies for example.
- the invention also relates to other substrates or objects that are taken from a bath, no matter which shape, whether round, angular, oval od. Like. And of which material.
- This application relates in particular to a method in which a wafer immersed in a liquid bath, then dug out of this liquid bath at a slow lifting speed and dried by a gas mixture, usually isopropanol-N2 mixture.
- This cleaning method makes use of the physical properties of the Marangoni effect, the properties of the nitrogen N2 gas and the properties of the alcohol isopropanol IPA.
- the Marangoni effect is based on the targeted control of a flow of a fluid.
- the internal residual stress is exploited or increased so that this internal stress or internal stress generated is greater than the boundary tension between a fluid and a surface, so that the fluid flows along the interface to the greater voltage and thus residue-free and contactless dries.
- a method for cleaning silicon plates is described in US-A-4,772,752.
- a silicon plate is immersed in a liquid medium containing deionized and heated to 90 ° C water.
- the plate is then removed from the medium at a slow speed, so that the plate dries when it exits. From this method, a disadvantage has been found in the drying method.
- the heat of the deionized water heated to 90 ° C is transferred to the silicon plate. Since a fine film of the liquid medium still exists on the surface of the silicon plate until it dries out by evaporation of the water, impurities from the liquid medium also dry on the surface of the silicon plate. This type of traces of drying and contamination can be very detrimental to the further processing of the silicon plates.
- DE 690 12 373 T2 also describes a method and a device which serve for drying substrates which takes place after treatment in a liquid.
- the apparatus is designed to provide a bath of liquid medium in which a substrate (silicon wafer) is dipped and then transported out of the bath by means of mechanical elements for drying, either by a gas vapor mixture or by inherent heat becomes.
- the problem with this and a following disadvantage are the mechanical conveying systems. In these transport systems, points of attack or points of contact between the substrate and the lifting mechanism are present. These points of contact prevent the Marangoni effect in its effect and, after drying, have traces of dried-on impurities which have a detrimental effect on the subsequent processes and the mode of functioning of the product.
- the object of this invention is to overcome the disadvantages which emerge from the prior art and, in particular, to enable contactless drying.
- a substrate is immersed in a tank filled with a liquid medium. Immersion in the pool is via a mechanism.
- This mechanism is preferably a linear actuator with which accurate positioning can be performed.
- the linear actuator consists in the present embodiment of two hoists, each hoist connected to a carriage. These carriages are arranged one above the other on a guide column and move along the guide column. The movement of these slides can be done on any type of drive, preferably a stepper motor.
- the two carriages are connected to one another via a toggle lever arrangement which is designed such that it can change a distance of the two carriages from one another.
- a toggle lever arrangement which is designed such that it can change a distance of the two carriages from one another.
- On one of the support legs is a holding frame with stops on which the substrate can be placed. From the support legs of the other lifting support members protrude upwards, through which the substrate can be lifted from the attacks.
- the inventive method now comprises the following steps:
- the substrate is lowered into the liquid medium and thus treated with the liquid medium.
- the substrate is completely or partially dug out of the liquid medium. In the preferred embodiments, it is at least half excavated from the medium.
- the stroke speed traveled during excavation is preferably selected such that a Marangoni effect arises between the substrate and the liquid medium at the moment of escape.
- the frictional force resulting from the excavation speed may preferably not exceed the adhesion force resulting from the residual stress of the liquid, so that the Marangoni effect is not interrupted.
- Excavation by initiating and considering the Marangoni effect has the advantage that the risk of dry marks is almost minimized, preferably eliminated.
- the substrate is taken over by the support elements and lifted off the stops. However, the takeover occurs at locations of the substrate that are already dry so that no traces remain on the substrate.
- the support elements can be designed as desired. It is of course also within the scope of the invention thought that the hoists do not drive at different speeds but at the same speed and are arranged for example on a single slide. In this case, the support elements are then formed telescopically extendable.
- the above-mentioned toggle lever arrangement which ensures that at least partially drive the hoists with different speed, so that the adoption of the substrate is ensured by a hoist of the other hoist without the lifting of the substrate must be interrupted from the liquid medium ,
- This also means that the Marangoni effect is not interrupted.
- substrates of any kind are lifted out of the liquid after cleaning, and it is a contactless drying guaranteed, whereby dry marks are avoided even at points of attack.
- wafers are dried, but with this device and method, each article of each material can be cleaned and dried.
- Figure 1 is a schematic view of an inventive device in the starting position
- Figure 2 to Figure 4 is a schematic view of the inventive device in different position of use
- Figure 5 is a schematic view of the inventive device in the end position.
- a device 1 for treating a substrate 15 in a liquid medium 3 consists of two housing parts.
- the first housing part is a basin 2 for the liquid medium 3.
- the basin 2 is filled with the liquid medium 3 up to a liquid level 4.
- the second housing part is placed on the basin 2 as a hood 5, which is filled with a gaseous medium 6.
- a lifting drive 7 for two hoists 8.1, 8.2 is present.
- the hoists 8.1 and 8.2 are each connected to a slide 16.1 and 16.2, which are arranged one above the other running on a corresponding guide column 17. In this case, their movements are coupled together and indeed via a knee lever assembly 20 shown in Figure 2.
- This toggle assembly 20 is not shown in the other figures for clarity.
- Each hoist 8.1 and 8.2 is approximately L-shaped and has a support legs 21 .1 and 21 .2, wherein an inner support leg 21 .2 or possibly a plurality of inner support legs between two outer support legs 21 .1 are arranged.
- a holding frame 9 is arranged, are provided on the fixed stops 10.1 to 10.4 as receptacles or holders for the substrate 15. In the holding frame is held by the four stops 10.1 to 10.4 the tilted by 45 ° substrate 15.
- On the support leg 21 .1 sit two support elements .1 and .2.
- Figure 1 shows a starting position of the device in carrying out the inventive method shown, wherein the lifting drive 7 is moved up and the substrate 15 is outside the liquid medium 3 and thus in the gaseous medium 6. In this position, the holding frame 9 is loaded with the substrate 15.
- FIG. 3 shows that now the lifting drive 7 with the carriages 16.1 and 16.2 is moved upwards along the guide column 17 until the substrate is raised about halfway out of the liquid medium 3.
- the part of the substrate projecting above the liquid level 4 of the liquid medium 3 is already dry.
- the lifting drive 7 moves along the guide column 17 further upwards, but according to Figure 4 by a corresponding control the toggle lever assembly 20 is set in motion, so that the carriage 16.2 moves away from the carriage 16.1. This creates between the two carriages 16.1 and 16.2 a distance a.
- the support leg 21 .1 also overtakes the support leg 21 .2, wherein the two support elements 11 .1 and 11 .2 lift the substrate 15 away from the stops 10.1 to 10.4. In this case, the support elements 1 1 .1 and 1 1 .2 but attack on edge regions of the substrate 15 this, which are already dry.
- FIG. 5 shows the other end position of the lifting drive 7, in which the two carriages 16.1 and 16.2 have been further removed from each other via the toggle lever arrangement 20, so that they maintain a distance a1 from one another.
- the substrate 15 is lifted out of the liquid medium 3 entirely by the support elements 11.1 and 11.2.
- the entire liquid medium 3 has expired from the substrate 15.
- the substrate 15 has no visible support points. Such are generated neither by the support elements 1 1 .1 nor by the stops 10.1 to 10.4.
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US14/397,338 US20150083171A1 (en) | 2012-04-27 | 2013-04-26 | Method and apparatus for treating at least one substrate in a liquid medium |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102012103762 | 2012-04-27 | ||
DE102012103762.0 | 2012-04-27 | ||
DE102013102545A DE102013102545A1 (de) | 2012-04-27 | 2013-03-13 | Verfahren zum Behandeln von zumindest einem Substrat in einem flüssigen Medium |
DE102013102545.5 | 2013-03-13 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2013160428A1 true WO2013160428A1 (de) | 2013-10-31 |
Family
ID=49323357
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2013/058687 WO2013160428A1 (de) | 2012-04-27 | 2013-04-26 | Verfahren zum behandeln von zumindest einem substrat in einem flüssigen medium |
Country Status (3)
Country | Link |
---|---|
US (1) | US20150083171A1 (de) |
DE (1) | DE102013102545A1 (de) |
WO (1) | WO2013160428A1 (de) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20220399211A1 (en) * | 2021-06-11 | 2022-12-15 | Akrion Technologies Inc. | Apparatus, system, and method for drying semiconductor wafers |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4772752A (en) | 1986-08-29 | 1988-09-20 | Aldrich-Boranes, Inc. | Mono- and diisopinocampheylhaloboranes as new chiral reducing agents |
DE69012373T2 (de) | 1989-02-27 | 1995-04-20 | Philips Nv | Verfahren und Vorrichtung zum Trocknen von Substraten nach Behandlung in einer Flüssigkeit. |
US20020023668A1 (en) * | 2000-08-24 | 2002-02-28 | Jeon Pyeong Sik | Drying system for drying semiconductor wafers and method of drying wafers using the same |
US20030168086A1 (en) * | 2002-03-05 | 2003-09-11 | Kaijo Corporation | Apparatus and method for drying washed objects |
WO2008033861A2 (en) * | 2006-09-14 | 2008-03-20 | Xyratex Corporation | Apparatus and method for drying a substrate |
US20090084413A1 (en) * | 2006-12-29 | 2009-04-02 | Applied Materials, Inc. | Vapor dryer having hydrophilic end effector |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19549490C2 (de) * | 1995-01-05 | 2001-01-18 | Steag Micro Tech Gmbh | Anlage zur chemischen Naßbehandlung |
-
2013
- 2013-03-13 DE DE102013102545A patent/DE102013102545A1/de not_active Withdrawn
- 2013-04-26 WO PCT/EP2013/058687 patent/WO2013160428A1/de active Application Filing
- 2013-04-26 US US14/397,338 patent/US20150083171A1/en not_active Abandoned
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4772752A (en) | 1986-08-29 | 1988-09-20 | Aldrich-Boranes, Inc. | Mono- and diisopinocampheylhaloboranes as new chiral reducing agents |
DE69012373T2 (de) | 1989-02-27 | 1995-04-20 | Philips Nv | Verfahren und Vorrichtung zum Trocknen von Substraten nach Behandlung in einer Flüssigkeit. |
US20020023668A1 (en) * | 2000-08-24 | 2002-02-28 | Jeon Pyeong Sik | Drying system for drying semiconductor wafers and method of drying wafers using the same |
US20030168086A1 (en) * | 2002-03-05 | 2003-09-11 | Kaijo Corporation | Apparatus and method for drying washed objects |
WO2008033861A2 (en) * | 2006-09-14 | 2008-03-20 | Xyratex Corporation | Apparatus and method for drying a substrate |
US20090084413A1 (en) * | 2006-12-29 | 2009-04-02 | Applied Materials, Inc. | Vapor dryer having hydrophilic end effector |
Also Published As
Publication number | Publication date |
---|---|
DE102013102545A1 (de) | 2013-10-31 |
US20150083171A1 (en) | 2015-03-26 |
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