WO2012144375A1 - データ処理システム - Google Patents
データ処理システム Download PDFInfo
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- WO2012144375A1 WO2012144375A1 PCT/JP2012/059758 JP2012059758W WO2012144375A1 WO 2012144375 A1 WO2012144375 A1 WO 2012144375A1 JP 2012059758 W JP2012059758 W JP 2012059758W WO 2012144375 A1 WO2012144375 A1 WO 2012144375A1
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/18—Automatic control for modifying the range of signals the converter can handle, e.g. gain ranging
- H03M1/181—Automatic control for modifying the range of signals the converter can handle, e.g. gain ranging in feedback mode, i.e. by determining the range to be selected from one or more previous digital output values
- H03M1/183—Automatic control for modifying the range of signals the converter can handle, e.g. gain ranging in feedback mode, i.e. by determining the range to be selected from one or more previous digital output values the feedback signal controlling the gain of an amplifier or attenuator preceding the analogue/digital converter
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/18—Automatic control for modifying the range of signals the converter can handle, e.g. gain ranging
- H03M1/181—Automatic control for modifying the range of signals the converter can handle, e.g. gain ranging in feedback mode, i.e. by determining the range to be selected from one or more previous digital output values
- H03M1/182—Automatic control for modifying the range of signals the converter can handle, e.g. gain ranging in feedback mode, i.e. by determining the range to be selected from one or more previous digital output values the feedback signal controlling the reference levels of the analogue/digital converter
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/20—Increasing resolution using an n bit system to obtain n + m bits
Definitions
- the present invention relates to a data processing system having an AD (Analog-to-Digital) conversion function, and more particularly to a technique for obtaining a bit accuracy (resolution) higher than the bit accuracy of an AD conversion circuit.
- AD Analog-to-Digital
- Patent Document 1 a ramp voltage having an amplitude substantially equal to the minimum resolution of the AD converter circuit is applied, an AD conversion operation is performed a plurality of times, and each digital output is an arithmetic circuit having a number of digits larger than the number of digits of the AD converter circuit.
- Patent Document 2 a difference between an input analog signal and a reference signal corresponding to a conversion range is obtained by a differential amplifier, converted into a digital signal by an AD converter circuit, and converted into a difference by a control device that receives the digital signal.
- the reference signal is controlled according to the corresponding digital signal, and the output digital signal is generated according to the digital signal and the conversion range.
- a resolution that is several times the conversion range than the resolution of the actual AD converter circuit can be obtained, and the necessary resolution can be obtained by the method of setting the conversion range.
- Patent Document 1 The present inventor examined increasing the resolution over the entire conversion range of the AD converter circuit.
- Patent Document 2 it is not easy to achieve the purpose.
- Patent Document 2 an attempt is made to increase the conversion bit accuracy by amplifying the difference between the reference signal of the conversion range and the input signal to be measured by an AD conversion circuit.
- the conversion range is set according to the signal to be measured. In order to switch optimally, it is necessary to determine whether or not the AD conversion result swings out of the conversion range, and to switch the reference signal.
- the object of the present invention is to increase the resolution over the entire conversion range of the AD converter circuit.
- An object of the present invention is to provide a data processing system that has good followability with respect to switching of the conversion range and has a small conversion error.
- a data processing system that obtains an AD conversion result obtained by extending the bit precision by n (n is a positive integer) bits with respect to the resolution of the AD conversion circuit divides the input range of the AD conversion circuit by m (2 n ⁇ m).
- the resolution can be increased over the entire conversion range of the AD conversion circuit, the followability to switching of the conversion range is good, and the conversion error can be reduced.
- FIG. 1 is a block diagram illustrating a data processing system according to the first embodiment of the present invention.
- FIG. 2 is an operation explanatory diagram generally illustrating the AD conversion principle according to the present embodiment.
- FIG. 3 is an explanatory diagram showing an example of setting an amplifier offset.
- FIG. 4 is an explanatory diagram showing the AD conversion principle according to the present embodiment, focusing on the section 2 of the divided range.
- FIG. 5 is an explanatory diagram showing the AD conversion principle according to the present embodiment, paying attention to the section 3 of the divided range.
- FIG. 6 also shows the above-described AD conversion principle according to the present embodiment, paying attention to the section 3 of the divided range, and the case where the sections are crossed within the voltage range in which the programmable gain amplifier maintains the linearity of the amplification operation.
- FIG. 7 also shows the AD conversion principle according to the present embodiment, paying attention to the section 2 of the divided range, and the case where the sections are crossed within the voltage range in which the programmable gain amplifier maintains the linearity of the amplification operation.
- FIG. 8 is a flowchart generally illustrating a conversion processing routine based on the AD conversion principle according to the present embodiment.
- FIG. 9 is a flowchart illustrating the generation process of the digital offset data DFS2.
- FIG. 10 is a flowchart illustrating the generation process of the higher-order digital offset data DFS3 of the known digital offset data DFS2.
- FIG. 11 is a flowchart illustrating the generation process of the lower digital offset data DFS1 of the known digital offset data DFS2.
- FIG. 12 is a flowchart illustrating the details of the input section discrimination process RT3 and the AD conversion process RT4.
- FIG. 13 is a flowchart illustrating details of gain correction and digital offset addition processing RT5.
- FIG. 14 is a timing chart illustrating an AD conversion operation according to this embodiment.
- FIG. 15 is a block diagram illustrating a data processing system according to the second embodiment of the invention.
- FIG. 16 is an operation explanatory diagram illustrating the sample hold operation of the analog signal under measurement.
- FIG. 17 is an operation explanatory diagram illustrating an operation of AD-converting the information held in the sample hold circuit 201 through the PGA 102 and the ADC 113.
- FIG. 18 is an operation explanatory diagram illustrating the operation in gain correction and digital offset addition processing RT5.
- FIG. 16 is an operation explanatory diagram illustrating the sample hold operation of the analog signal under measurement.
- FIG. 17 is an operation explanatory diagram illustrating an operation of AD-converting the information held in the sample hold circuit 201 through
- FIG. 19 is an operation explanation illustrating a case where AD conversion processing is performed by setting the number of divisions of the input range of the AD converter circuit to an even number when the median value of the analog signal to be measured is close to the median value of the input range of the AD converter circuit.
- FIG. 20 when the median value of the analog signal to be measured is close to the median value of the input range of the AD conversion circuit, the AD conversion processing is performed by setting the number of divisions of the input range of the AD conversion circuit to an odd number, for example, 5 divisions. It is explanatory drawing which concerns on 3rd Embodiment when it controls.
- FIG. 21 is a block diagram illustrating a data processing system according to the fourth embodiment.
- FIG. 21 is a block diagram illustrating a data processing system according to the fourth embodiment.
- FIG. 22 is an explanatory diagram exemplifying an outline of gain calibration for the PGA when the DA conversion circuits are integrated into one.
- FIG. 23 is an operation explanatory diagram illustrating details of the processes RT10 and RT11 of FIG.
- FIG. 24 is an operation explanatory diagram illustrating details of the processing RT12.
- FIG. 25 is an operation explanatory diagram illustrating details of the processes RT13 and RT14.
- FIG. 26 is an operation explanatory diagram illustrating details of the process RT15.
- FIG. 27 is an operation explanatory diagram illustrating the details of the A and B portions in the flowchart when calculating the digital offset of the section 3.
- FIG. 28 is an operation explanatory diagram illustrating the details of the portion C in the flowchart when calculating the digital offset of the section 3.
- a data processing system (100, 200, 300) according to a typical embodiment of the present invention is a system for obtaining an AD conversion result obtained by extending n (n is a positive integer) bits with respect to the resolution of an AD conversion circuit. And an AD conversion circuit (113), a programmable gain amplifier (102), and a control circuit (110, 110A, 110B).
- the control circuit divides the input range of the AD converter circuit by m (2 n ⁇ m), prepares a digital offset in which the voltage at the connection point of each divided range is the same, and measures the analog signal to be measured To which division range the AD conversion result by the AD conversion circuit belongs, and designating an amplifier offset and a gain in which the voltage range of the determined division range is the voltage range of the input range of the AD conversion circuit; Is applied to the programmable gain amplifier for amplification, and the amplified signal is converted by the AD conversion circuit, and the conversion result is subjected to n-bit extension and division by the value of the actual gain of the programmable gain amplifier, A digital offset of the division range corresponding to this is added to obtain an AD conversion result obtained by extending the bit accuracy by n bits.
- the programmable gain amplifier has a gain of 2 n because amplification is performed by giving the programmable gain amplifier the amplifier offset and gain designation for setting the determined divided range range to the voltage range of the input range of the AD converter circuit. Alternatively, amplification is performed in the vicinity thereof. At this time, the gain error of the programmable gain amplifier is corrected by performing input amplification, AD conversion, and n-bit expansion for each divided input range of the AD conversion circuit.
- the digital offset giving the minimum value of the divided range is the same as the maximum value of the divided range adjacent to the lower side. Therefore, it is possible to achieve high conversion accuracy with a small conversion error with respect to high-resolution AD conversion results over the entire conversion range of the AD conversion circuit. Furthermore, since the conversion range can be selected by performing AD conversion once by the AD conversion circuit without performing amplification by the programmable gain amplifier, good followability can be obtained when switching the conversion range.
- the gain given from the control circuit to the programmable gain amplifier is a target gain 2 n
- the n-bit extension by the control circuit is a 0 extension with respect to the lower bits of the AD conversion result.
- the control circuit sets the 2n as a target gain in the programmable gain amplifier, and converts an amplified output of an analog signal by the set programmable gain amplifier by an AD converter circuit; Then, the actual gain for the target gain is acquired based on the difference from the digital value used to generate the analog signal supplied to the programmable gain amplifier at that time.
- control circuit determines an input range to which the measured voltage belongs based on AD conversion data with respect to an input voltage of a boundary voltage of each divided range of the AD conversion circuit.
- sample hold The data processing system according to Item 1, further including a sample hold circuit (201) for inputting an analog signal to be measured, wherein the control circuit (110A, 110B) receives the same analog signal to be measured sampled by the sample hold circuit.
- the division range is determined and AD conversion is performed in which the voltage range of the determined division range is the voltage range of the input range of the AD conversion circuit.
- the determination of the division range and the AD conversion using the determination result can be performed on the same analog signal to be measured. Therefore, the situation in which AD conversion is erroneously performed using different division ranges occurs. Can be prevented in advance.
- the control circuit sets the division number of the input range of the AD converter circuit to an odd number when the median value of the analog signal to be measured is close to the median value of the input range of the AD converter circuit. The process for conversion is performed.
- a sample hold circuit (201) that selectively samples and holds a setting analog signal instead of the measured analog signal and outputs the sample analog signal to the programmable gain amplifier, and for generating and setting an amplifier offset
- a DA converter circuit (114 in FIG. 21) also used for generating an analog signal, and a path for outputting the amplifier offset generated by the DA converter circuit to the programmable gain amplifier, or a setting analog generated by the DA converter circuit
- a selection circuit (220) for selecting a path for supplying a signal to the sample and hold circuit.
- the setting of the amplifier offset and the generation of the setting analog signal must be performed in series, but the circuit scale can be reduced by sharing the DA converter circuit.
- a data processing system (100, 200, 300) according to another embodiment of the present invention includes an AD conversion circuit (113), a programmable gain amplifier (102), and a control circuit (110, 110A, 110B).
- the control circuit determines which divided range the analog signal under measurement belongs to which the input range of the AD converter circuit is divided by m (a positive integer), and determines the voltage range of the determined divided range of the AD converter circuit.
- An amplifier offset and target gain 2 n (n is a positive integer, 2 n ⁇ m) for expanding the voltage range of the input range is set in the programmable gain amplifier, and the measured analog signal by the set programmable gain amplifier
- the amplified signal is converted by the AD conversion circuit, n-bit bit expansion is performed on the converted data, and division by the actually measured gain of the programmable gain amplifier is performed on the expanded data, and the division result corresponds to the division range.
- the division number m with respect to the input range of the AD conversion circuit, it is possible to finally obtain an AD conversion result obtained by extending the bit precision by n bits within a range satisfying the relationship of 2 n ⁇ m.
- the amplification is given the designation of the amplifier offset and gain of the voltage range of the input range of the AD converter the scope of the discriminated divided ranges the programmable gain amplifier, programmable gain amplifier gain 2 n or a Amplification is performed in the vicinity.
- the gain error of the programmable gain amplifier is corrected by performing input amplification, AD conversion, n-bit expansion, and division by the actually measured gain of the programmable gain amplifier for each divided input range of the AD conversion circuit.
- the data processing system includes a first DA conversion circuit (114) and a second DA conversion circuit (115), and the control circuit controls the first to fifth processes.
- the first process is a process of generating an arbitrary voltage in a specific divided range by the first DA converter circuit and acquiring first data obtained by converting the arbitrary voltage by the AD converter circuit.
- the second process is a process of obtaining the second data by performing bit extension for n bits on the lower side of the first data according to the division range.
- an arbitrary voltage of the specific division range is generated by the first DA conversion circuit, and an amplifier offset for expanding the voltage range of the division range to the voltage range of the input range of the AD conversion circuit Is generated by the second DA converter circuit, and the arbitrary voltage generated by the first DA converter circuit is amplified by the programmable gain amplifier in which the generated amplifier offset and the target gain 2 n are set, and amplified.
- This is a process of acquiring the third data by converting the signal by the AD converter circuit.
- the fourth process is a process of obtaining the fourth data by extending the third data to the lower side by n bits and dividing the extended data by the actually measured gain.
- the fifth process is a process of subtracting the fourth data from the second data to obtain digital offset data of the specific division range.
- the result of AD conversion of the voltage range of the input range amplified by the programmable gain amplifier is expanded by n bits, and the digital offset data is added to the value divided by the measured gain.
- the obtained value and the value obtained by direct AD conversion without using the programmable gain amplifier substantially coincide with each other.
- the sixth data is expanded by n bits to the lower side, and the expanded data is divided by the actually measured gain to obtain the seventh data obtained by adding the digital offset data of the specific division range to this It is processing.
- the minimum voltage of the upper divided range is generated by the first DA converter circuit, and the amplifier offset for expanding the voltage range of the divided range to the voltage range of the input range of the AD converter circuit is generated.
- the amplified signal generated by the second DA converter circuit, the minimum voltage generated by the first DA converter circuit is amplified by the programmable gain amplifier in which the generated amplifier offset and the target gain 2 n are set. Is converted by the AD converter circuit to obtain eighth data.
- the ninth process extends the eighth data to the lower side by n bits, divides the extended data by the measured gain, and subtracts this from the seventh data to obtain the digital offset data of the upper side divided range. It is processing.
- the calculation is performed using the known digital offset data so that the voltage at the connection point between the specific divided range for which the known digital offset data is obtained and the upper divided range adjacent thereto matches in both divided ranges.
- the continuity between the specific division range and the upper division range adjacent thereto can be guaranteed.
- the value obtained by adding the digital offset data to the value obtained by expanding the result of AD conversion of the voltage range of the input range amplified by the programmable gain amplifier and dividing by the measured gain the value obtained by direct AD conversion without using a programmable gain amplifier substantially matches.
- the value AD converted in each division range is subjected to n-bit bit expansion and division by actually measured gain, the influence of the gain error of the programmable gain amplifier can be eliminated, and its continuity Can be assured with high accuracy.
- the control circuit performs the tenth to thirteenth processes when generating the digital offset data of the lower division range of the division range.
- the minimum voltage of the specific division range is generated by the first DA conversion circuit
- the amplifier offset for expanding the voltage range of the division range to the voltage range of the input range of the AD conversion circuit is The minimum voltage generated by the first DA converter circuit is amplified by the programmable gain amplifier generated by the second DA converter circuit, and the generated amplifier offset and the target gain 2 n are set, and the amplified signal is obtained.
- the tenth data is expanded by n bits to the lower side, and the expanded data is divided by the actually measured gain, and the digital offset data of a specific division range is added thereto to obtain the eleventh data. It is processing.
- the maximum voltage of the lower divided range is generated by the first DA converter circuit, and the amplifier offset for expanding the voltage range of the divided range to the voltage range of the input range of the AD converter circuit is set.
- the amplified signal generated by the second DA converter circuit, the maximum voltage generated by the first DA converter circuit is amplified by the programmable gain amplifier in which the generated amplifier offset and the target gain 2 n are set.
- the twelfth data is extended by n bits to the lower side, and the extended data is divided by the actually measured gain, and this is subtracted from the eleventh data to obtain the digital offset data of the lower side divided range and It is processing to do.
- the calculation is performed using the known reference digital offset data so that the voltage at the connection point between the specific division range for which the known digital offset data is obtained and the lower-side division range adjacent thereto matches in both division ranges. Therefore, the continuity between the specific division range and the lower side division range adjacent thereto can be guaranteed. Furthermore, in the voltage range of the divided range, the value obtained by adding the digital offset data to the value obtained by expanding the result of AD conversion of the voltage range of the input range amplified by the programmable gain amplifier and dividing by the measured gain, The value obtained by direct AD conversion without using a programmable gain amplifier substantially matches. In particular, since the value AD converted in each division range is subjected to n-bit bit expansion and division by actually measured gain, the influence of the gain error of the programmable gain amplifier can be eliminated, and its continuity Can be assured with high accuracy.
- sample hold> The data processing system according to Item 10, further comprising a sample hold circuit (201) for inputting an analog signal under measurement, wherein the control circuit (110A, 110B) outputs the same analog signal under measurement sampled by the sample hold circuit.
- the division range is determined and AD conversion is performed in which the voltage range of the determined division range is the voltage range of the input range of the AD conversion circuit.
- a sample hold circuit (201) that selectively samples and holds a setting analog signal instead of the measured analog signal and outputs the sample analog signal to the programmable gain amplifier, and an amplifier offset generation and setting A DA converter circuit (114 in FIG. 21) also used for generating an analog signal, and a path for outputting the amplifier offset generated by the DA converter circuit to the programmable gain amplifier, or a setting analog generated by the DA converter circuit And a selection circuit for selecting a path for supplying a signal to the sample and hold circuit.
- the setting of the amplifier offset and the generation of the setting analog signal must be performed in series, but the circuit scale can be reduced by sharing the DA converter circuit.
- a data processing system (100, 200, 300) according to still another embodiment of the present invention includes an AD conversion circuit (113), a programmable gain amplifier (102), a DA conversion circuit (114, 115), Programmable gain amplifier gain calibration processing, digital offset data generation processing, input interval determination processing for the analog signal under measurement, and the interval determined for the analog signal under measurement as the voltage range of the input range of the AD converter circuit And a control circuit (110, 110A, 110B) for performing extended AD conversion processing.
- the determination process of the input section it is determined whether the conversion result of the analog signal under measurement by the AD converter circuit belongs to which divided range obtained by dividing the voltage range of the input range of the AD converter circuit by m (positive integer). It is processing.
- an amplifier offset for expanding the voltage range of the determined divided range to the voltage range of the input range of the AD conversion circuit and a target gain 2 n (n is a positive integer, 2 n ⁇ m) are obtained.
- the programmable gain amplifier is set, the amplified signal of the analog signal to be measured by the set programmable gain amplifier is converted by the AD conversion circuit, and n-bit bit extension for the converted digital data and programmable for the extended data Division by the actual gain of the gain amplifier is performed, and digital offset data corresponding to the minimum value of the determined division range is added to the divided data to obtain an AD conversion result in which the bit accuracy is extended by n bits.
- the programmable gain amplifier has a gain of 2 n because amplification is performed by giving the programmable gain amplifier the amplifier offset and gain designation for setting the determined divided range range to the voltage range of the input range of the AD converter circuit. Alternatively, amplification is performed in the vicinity thereof. At this time, the gain error of the programmable gain amplifier is corrected by performing input amplification, AD conversion, n-bit expansion, and division by the actually measured gain of the programmable gain amplifier for each divided input range of the AD conversion circuit.
- the digital offset giving the minimum value of the divided range is the same as the maximum value of the divided range adjacent to the lower side. Therefore, it is possible to achieve high conversion accuracy with a small conversion error with respect to high-resolution AD conversion results over the entire conversion range of the AD conversion circuit. Furthermore, when the conversion range is selected, it is only necessary to perform the AD conversion once by the AD conversion circuit without performing amplification by the programmable gain amplifier, so that good followability can be obtained even when the conversion range is switched.
- the data processing system includes a first DA converter circuit (114) and a second DA converter circuit (115) as the DA converter circuit.
- the digital offset data generation process includes a first process to a fifth process.
- the first processing is processing for generating an arbitrary voltage in a specific divided range by the first DA conversion circuit and acquiring first data obtained by converting the arbitrary voltage by the AD conversion circuit.
- the second process is a process for obtaining the second data by performing n-bit bit expansion on the lower side of the first data.
- an arbitrary voltage in the specific division range is generated by the first DA conversion circuit, and an amplifier offset for expanding the voltage range of the division range to the voltage range of the input range of the AD conversion circuit is
- An arbitrary voltage generated by the first DA converter circuit is amplified by the programmable gain amplifier that is generated by the second DA converter circuit and the generated amplifier offset and target gain 2 n are set, and the amplified signal is
- This is a process of obtaining the third data after being converted by the AD conversion circuit.
- the fourth process is a process of obtaining the fourth data by extending the third data to the lower side by n bits and dividing the extended data by the actually measured gain.
- the fifth process is a process of subtracting the fourth data from the second data to obtain digital offset data of the specific division range.
- the result of AD conversion of the voltage range of the input range amplified by the programmable gain amplifier is expanded by n bits, and the digital offset data is added to the value divided by the measured gain.
- the obtained value and the value obtained by direct AD conversion without using the programmable gain amplifier substantially coincide with each other.
- the digital offset data generation processing includes generating the digital offset data of the specific division range and then generating digital offset data of the division range on the upper side of the division range. 6th to 9th processes are included.
- the maximum voltage of the specific division range is generated by the first DA conversion circuit, and the amplifier offset for expanding the voltage range of the division range to the voltage range of the input range of the AD conversion circuit is
- the maximum voltage generated by the first DA converter circuit is amplified by the programmable gain amplifier generated by the second DA converter circuit and the generated amplifier offset and the target gain 2 n are set, and the amplified signal is
- This is a process of obtaining the sixth data by performing conversion by the AD conversion circuit.
- the seventh process is a process of obtaining the seventh data by extending the sixth data to the lower side by n bits, dividing the expanded data by the actually measured gain, and adding the reference digital offset data thereto. .
- the minimum voltage of the upper divided range is generated by the first DA converter circuit, and the amplifier offset for expanding the voltage range of the divided range to the voltage range of the input range of the AD converter circuit is generated.
- the amplified signal generated by the second DA converter circuit, the minimum voltage generated by the first DA converter circuit is amplified by the programmable gain amplifier in which the generated amplifier offset and the target gain 2 n are set. Is converted by the AD converter circuit to obtain eighth data.
- the ninth process extends the eighth data to the lower side by n bits, divides the extended data by the actually measured gain, and subtracts this from the seventh data to obtain the digital offset data of the upper side divided range It is a process.
- the calculation is performed using the known digital offset data so that the voltage at the connection point between the specific divided range for which the known digital offset data is obtained and the upper divided range adjacent thereto matches in both divided ranges.
- the continuity between the specific division range and the upper division range adjacent thereto can be guaranteed.
- the value obtained by adding the digital offset data to the value obtained by expanding the result of AD conversion of the voltage range of the input range amplified by the programmable gain amplifier and dividing by the measured gain the value obtained by direct AD conversion without using a programmable gain amplifier substantially matches.
- the value converted by AD in each division range is subjected to n-bit bit expansion and division by actually measured gain, the influence of the gain error of the programmable gain amplifier can be excluded from the digital offset data.
- the continuity can be guaranteed with high accuracy.
- the digital offset data generation processing includes generating the digital offset data of the specific division range and then generating digital offset data of the division range on the lower side of the division range.
- the minimum voltage of the specific divided range is generated by the first DA converter circuit, and the voltage range of the divided range is changed to the voltage of the input range of the AD converter circuit.
- An amplifier offset that expands to the range is generated by the second DA converter circuit, and the minimum voltage generated by the first DA converter circuit by the programmable gain amplifier in which the generated amplifier offset and the target gain 2 n are set.
- the eleventh process is a process of obtaining the eleventh data by extending the tenth data to the lower side by n bits, dividing the expanded data by the actually measured gain, and adding the reference digital offset data thereto. .
- the maximum voltage of the lower divided range is generated by the first DA converter circuit, and the amplifier offset for expanding the voltage range of the divided range to the voltage range of the input range of the AD converter circuit is set.
- the amplified signal generated by the second DA converter circuit, the maximum voltage generated by the first DA converter circuit is amplified by the programmable gain amplifier in which the generated amplifier offset and the target gain 2 n are set.
- the twelfth data is extended by n bits to the lower side, and the extended data is divided by the actually measured gain, and this is subtracted from the eleventh data to obtain the digital offset data of the lower side divided range and It is processing to do.
- the calculation is performed using the known digital offset data so that the voltage at the connection point between the specific divided range for which the known digital offset data is obtained and the lower divided range adjacent thereto matches in both divided ranges. Therefore, it is possible to guarantee the continuity between the specific division range and the lower-side division range adjacent thereto. Furthermore, in the voltage range of the divided range, the value obtained by adding the digital offset data to the value obtained by expanding the result of AD conversion of the voltage range of the input range amplified by the programmable gain amplifier and dividing by the measured gain, The value obtained by direct AD conversion without using a programmable gain amplifier substantially matches. In particular, since the value converted by AD in each division range is subjected to n-bit bit expansion and division by actually measured gain, the influence of the gain error of the programmable gain amplifier can be excluded from the digital offset data. The continuity can be guaranteed with high accuracy.
- the section determination process includes a process of determining an input range to which the voltage to be measured belongs based on AD conversion data with respect to an input voltage of a boundary voltage of each divided range of the AD conversion circuit.
- FIG. 1 illustrates a data processing system according to the first embodiment of the present invention.
- the data processing system 100 shown in the figure is configured as a system-on-chip semiconductor device formed on a single semiconductor substrate such as single crystal silicon by a complementary MOS integrated circuit manufacturing technique or the like, although not particularly limited.
- the data processing system 100 includes a microcomputer (MCU) 101, a programmable gain amplifier (PGA) 102, and a selector (SW1) 103 that are representatively shown. Needless to say, other circuits such as a memory and an accelerator may be integrated, although not particularly shown.
- MCU microcomputer
- PGA programmable gain amplifier
- SW1 selector
- the microcomputer 101 is not particularly limited, but a central processing unit (CPU) 110 that executes a program as a control circuit, a non-volatile memory (FLASH) 111 such as a flash memory that electrically stores a program or data, and a CPU 110 RAM 112 used for the work area, AD conversion circuit (ADC) 113 for converting analog signals to digital signals, first DA conversion circuit (DAC1) 114 for converting digital signals to analog signals, and converting digital signals to analog signals A second DA conversion circuit (DAC2) 115, a digital input / output port 116, an analog input port 117, other peripheral circuit modules (PRPH) 118 such as a timer counter and a serial interface, and a selector (SW2) 119.
- CPU central processing unit
- FLASH non-volatile memory
- ADC AD conversion circuit
- DAC1 first DA conversion circuit
- DAC2 digital input / output port
- PRPH peripheral circuit modules
- SW2 selector
- the gain setting for the programmable gain amplifier 102 is performed by the CPU 110 using the signal 120.
- the second DA conversion circuit 115 DA converts the amplifier offset data supplied from the CPU 110 and supplies the amplifier offset 121 to the programmable gain amplifier 102.
- the second DA conversion circuit 115 converts the data supplied from the CPU 110 from DA to output.
- the selector 103 selects the analog signal under measurement 123 to be AD converted supplied from the analog input port 117 or the signal 122 output from the first DA conversion circuit 114 and supplies the selected signal to the programmable gain amplifier 102.
- the selector 119 selects the output of the selector 103 or the output of the programmable gain amplifier 102 and supplies it to the AD conversion circuit 113.
- the CPU 110 refers to the data converted by the AD conversion circuit 113.
- the CPU 110 performs switch control of the selectors 103 and 119.
- FIG. 1 mainly shows a configuration that pays attention to a function of obtaining an AD conversion result in which the bit accuracy is expanded with respect to the resolution of the AD conversion circuit 113.
- the AD conversion result can be obtained by increasing the resolution over the entire input range of the AD conversion circuit 113 according to the program control of the CPU 110.
- the AD conversion function will be described in detail.
- FIG. 2 generally illustrates the principle of AD conversion according to the present embodiment.
- the resolution of the AD conversion circuit 113 is 10 bits.
- the input range of the AD conversion circuit 113 (for convenience, the voltage range of the input range of the AD conversion circuit 113 is set to 0.5 V to 4.5 V) is divided into four parts accordingly. Each divided voltage range is divided into sections (0.5 V to 1.5 V, 1.5 V to 2.5 V, 2.5 V to 3.5 V, 3.5 V to 4.5 V).
- a 12-bit digital offset (DFS1, DFS2, DFS3, DFS4) of the range is prepared in advance.
- the programmable gain amplifier 102 is set, and the measured analog signal is amplified four times.
- the amplified signal is converted into 10-bit data by the AD conversion circuit 113.
- the converted 10-bit data is subjected to bit extension of 2 bits on the lower side, for example, 2-bit 0 extension, and the bit extension is performed.
- the setting of the amplifier offset for the programmable gain amplifier 102 is focused on the section 2 divided into four with respect to the full range.
- FIGS. 4 and 5 show the principle of AD conversion according to the present embodiment by paying attention to the section of the divided range.
- FIG. 4 shows the programmable gain of the measured analog signal in section 2 of the divided range (in this example, the voltage range of the input range of the AD converter circuit 113 is 0 V to 5 V for convenience, and does not match the description of FIG. 2).
- the amplifier 102 amplifies the signal by a factor of four, converts the amplified signal into 10-bit data by the AD converter circuit 113, performs 2-bit zero extension on the data and divides the expanded data by the actually measured gain.
- the principle when the 12-bit AD conversion data with an extended bit precision is obtained by adding the digital offset DFS2 to is exemplified.
- FIGS. 6 and 7 similarly show the principle of AD conversion according to the present embodiment, paying attention to the section of the divided range.
- the programmable gain amplifier 102 is particularly within the voltage range in which the linearity of the amplification operation is maintained. 2 shows the case where the sections are crossed with each other, and is consistent with FIG.
- the voltage range of the crossing section is 0.5 V for 10% of the input range.
- the amplifier offset may be determined so that the input voltage range of section 3 from 2.5V to 3.5V is in the range of 0.5V to 4.5V.
- the digital offset of the section 3 may be determined so that the maximum voltage of the section 2 matches the minimum voltage of the section 3, and details thereof will be described later.
- the amplifier offset may be determined so that the input voltage range of section 2 of 1.5 V to 2.5 V is the voltage range of 0.5 V to 4.5 V of the input range of the AD converter circuit. .
- the digital offset of the section 2 may be determined so that the maximum voltage of the section 1 matches the minimum voltage of the section 2, and details thereof will be described later.
- FIG. 8 shows an overall AD conversion processing routine according to the present embodiment in accordance with the above principle.
- the gain calibration process (RT1) of the programmable gain amplifier and the digital offset calculation process (RT2) are performed in advance, and then the execution stop of the AD conversion process according to the present embodiment is not instructed, and As long as there is an instruction for AD conversion, the input section discrimination process (RT3) based on the analog signal to be measured, the AD conversion process (RT4) by the AD conversion circuit for the analog signal to be measured, and the result of the AD conversion process (RT4) Gain correction and digital offset addition processing (RT5) are performed.
- the AD conversion process (RT4) and the gain correction and digital offset addition process (RT5) constitute an extended AD conversion process in which AD conversion is performed using the determined interval for the analog signal to be measured as the voltage range of the input range of the AD conversion circuit 113. To do.
- this discrimination process is a process of discriminating the input range to which the voltage to be measured belongs based on the AD conversion data of the voltage corresponding to the boundary voltage of each divided range of the AD conversion circuit 113.
- This is a process of setting the amplifier 102 and AD converting the amplified signal of the analog signal under measurement by the set programmable gain amplifier 102 by the AD conversion circuit 113.
- the gain correction and digital offset addition processing (RT5) performs 2-bit zero extension on the lower side of the 10-bit digital data converted by the AD conversion processing RT4, and uses the expanded 12-bit data as an actual gain (its purpose). divided by the gain actually measured gain to 2 n), by adding the digital offset data to comply to the minimum voltage division range corresponding to divided by 12-bit data, 12-bit conversion accuracy is expanded AD This is a process for acquiring the conversion result.
- the digital offset generation process is a process of generating digital offset data in the reference section illustrated in FIG. 9, a process of generating higher-order digital offset data in the reference section illustrated in FIG. 10, and FIG.
- the processing is roughly divided into the generation processing of the lower digital offset data of the reference section exemplified in FIG.
- an arbitrary voltage for example, a voltage of 2.1 V in section 2
- the first DA conversion circuit 114 S1
- this is given to the AD conversion circuit 113 via the terminals a and d of the selectors 103 and 119 to acquire AD converted first data (S2), and the first processing is performed.
- 10-bit data that is the basis of the digital offset data DFS2 is obtained.
- the CPU 110 fetches the first data M2 (S3), performs 2-bit zero extension on the lower side of the fetched first data M2 to obtain 12-bit second data M2_eb (S4), and performs a second process. .
- an amplifier offset for expanding the voltage range (1.5 V to 2.5 V) of the divided range to the voltage range of the input range (0.5 V to 4.5 V) of the AD converter circuit is converted to the second DA conversion.
- the arbitrary voltage generated by the first DA converter circuit 114 is amplified by the programmable gain amplifier 102 generated by the circuit 115 (S5) and having the generated amplifier offset and the actual gain near the target gain.
- the signal is converted by the AD conversion circuit 113 (S6), and the CPU 110 takes in the third data A2 obtained by the conversion (S7), and performs the third process.
- the CPU 110 performs the fourth process of obtaining the fourth data A2_eb_g by performing 2-bit zero extension on the lower side of the third data A2, performing division by the actually measured gain (S8).
- a fifth process of subtracting the fourth data A2_eb_g from the second data M2_eb to obtain the reference digital offset data DFS2 (fifth data) of the specific division range is performed (S9).
- the digital offset data DFS2 substantially matches the value obtained by AD converting the arbitrary voltage in the voltage range of the input range of the AD conversion circuit 113 without using the programmable gain amplifier 102.
- the value obtained by adding the digital offset data DFS2 to the value obtained by extending the result of AD conversion of the voltage range of the input range amplified by the programmable gain amplifier and dividing by the actually measured gain in the voltage range of the reference section And the value directly AD converted without going through the programmable gain amplifier substantially coincide with each other.
- the maximum voltage of the section 2 that is the specific division range 2.5 V is generated by the first DA converter circuit 114 (S10), and the voltage range (1.5 V to 2.5 V) of the divided range (section 2) is set to the voltage of the input range of the AD converter circuit 113.
- An amplifier offset that expands to a range (0 V to 5 V) is generated by the second DA conversion circuit 115 (S11), and the first DA conversion is performed by the programmable gain amplifier 102 in which the generated amplifier offset and target gain are set.
- the maximum voltage of 2.5 V in section 2 generated by the circuit 114 is amplified, and the amplified signal is converted by the AD conversion circuit 113 ( 12) to get the sixth data A2max (S13), it performs a sixth process.
- the CPU 110 performs 2-bit zero extension on the lower side of the sixth data A2max to generate temporary 12-bit data (A2max_eb) (S14), and divides this data A2max_eb by the measured gain to generate data A2max_eb_g Then, the digital offset data DFS2 is added to the data A2max_eb_g to obtain seventh data A2max_12b which is 12-bit AD conversion data (S16), and the seventh process is performed.
- the CPU 110 generates, in the second DA conversion circuit 115, an amplifier offset that expands the voltage range (2.5 V to 3.5 V) of the upper divided range (section 3) to the input range of the AD conversion circuit.
- the signal amplified as the minimum voltage of 2.5 V in section 3 is converted by the AD conversion circuit 113 (S18), the eighth data A3min is obtained (S19), and the eighth process is performed.
- the added value and the value directly AD converted without going through the programmable gain amplifier substantially match.
- the value subjected to AD conversion in each division range is subjected to n-bit bit expansion and division based on the actually measured gain, the influence of the gain error of the programmable gain amplifier 102 can be eliminated. Can be ensured with high accuracy.
- digital offset data DFS4 may be obtained by the same processing as in FIG. 10 based on the known digital offset data DFS3, and thus detailed description thereof is omitted.
- the minimum voltage (in the specific division range (section 2)) ( 1.5V) is generated by the first DA converter circuit 114 (S22), and the voltage range (1.5V to 2.5V) of the divided range (section 2) is set to the input range (1.5V to 2.5V) of the AD converter circuit 113.
- An amplifier offset that expands to 0V to 5V is generated by the second DA converter circuit 115 (S23), and the first DA converter circuit 114 is generated by the programmable gain amplifier 102 in which the generated amplifier offset and target gain are set.
- S24) and acquires the tenth data A2min (S25) performs the tenth processing.
- the CPU 110 generates temporary 12-bit data A2min_eb obtained by performing 2-bit zero extension on the lower side of the tenth data A2min (S26), and divides the data A2min_eb by the actually measured gain to generate data A2min_eb_g (
- the digital offset data DFS2 is added to the data A2min_eb_g to obtain eleventh data (A2min_12b) as 12-bit AD conversion data (S28), and an eleventh process is performed.
- the CPU 110 generates the maximum voltage (1.5 V) of the lower divided range (section 1) by the first DA converter circuit 114, and at the same time the voltage range (0.5 V to 1.. 5V) is generated in the second DA converter circuit 115 in the second DA converter circuit 115 (S29), and the programmable amplifier set with the generated amplifier offset and the target gain is expanded to the input range (0V to 5V) of the AD converter circuit 113.
- the gain amplifier 102 amplifies the maximum voltage (1.5 V) generated by the first DA converter circuit 114, converts the amplified signal by the AD converter circuit 113 (S30), and obtains twelfth data A1max. In step S31, a twelfth process is performed.
- the CPU 110 performs 2-bit zero extension on the lower side of the twelfth data A1max, divides the measured gain, generates data A1max_eb_g (S32), and generates the generated data A1max_eb_g as the eleventh data.
- the digital offset data DFS1 of the lower side division range (section 1) is acquired (S33), and the thirteenth process is performed.
- the added value and the value directly AD converted without going through the programmable gain amplifier substantially match.
- the value AD converted in each division range is subjected to n-bit bit expansion and division by actually measured gain, the influence of the gain error of the programmable gain amplifier can be eliminated, and its continuity Can be assured with high accuracy.
- FIG. 12 illustrates details of the input section discrimination process (RT3) and the AD conversion process (RT4).
- the selector 103 is selected as the input terminal b and the selector 119 is selected as the input terminal d (S40), and the analog signal to be measured is AD converted by the AD conversion circuit 113 (S41, S42).
- the CPU 110 fetches the AD conversion result (S43) and determines whether the AD conversion result is larger than the boundary value between the sections 3 and 4 (S44).
- Amplifier offset data is set (S45), and the stabilization of the conversion operation of the first DA conversion circuit 114 is awaited (S46).
- the AD conversion result is smaller than the boundary value between the sections 3 and 4
- the amplifier offset data of section 3 is set in the register (S48), and the stabilization of the conversion operation of the first DA conversion circuit 114 is awaited (S49).
- the AD conversion result is smaller than the boundary value between the sections 2 and 3
- the amplifier offset data of section 2 is set in the DA conversion register (S51), and the stabilization of the conversion operation of the first DA conversion circuit 114 is awaited (S52).
- the amplifier offset data of the section 1 is set in the DA conversion register for amplifier offset (S53), and the first DA conversion circuit 114 Wait for stabilization of the conversion operation (S54). After each stabilization waiting time (for example, 3 ⁇ s) has elapsed, the input of the selector 119 is connected to the output of the PGA 102 (S55). Thereby, 2 n (here, gain 4) is set in the programmable gain amplifier 102 as the target gain together with the amplifier offset for expanding the voltage range of the determined divided range to the input range of the AD conversion circuit 113. A process of converting the amplified signal of the analog signal under measurement by the programmable gain amplifier 102 by the AD conversion circuit 113 is performed.
- FIG. 13 illustrates the details of the gain correction and digital offset addition processing (RT5).
- the CPU 110 performs zero extension of n bits (2 bits in this case) on the lower side of the digital data converted by the AD conversion circuit 113 by the AD conversion process (RT4) to generate 12-bit data AE1.
- the data AE1 is divided by the actual gain (S61), and the result data (V1) is held and the discrimination result by the discrimination process (RT3) of the input section is referred to (S62).
- the CPU 110 adds the digital offset of the section 4 to the calculation result data V1 if the determination result by the input section determination processing (RT3) is the section 4 (S63, S64), and the input section determination processing (RT3).
- the digital offset of section 3 is added to the calculation result data V1 (S65, S66). If the determination result by the input section determination processing (RT3) is section 2, the calculation result data V1 is calculated. The digital offset of section 2 is added (S67, S68), and if the determination result by the input section determination processing (RT3) is section 1, the digital offset of section 1 is added to the calculation result data V1 (S69). The resulting data is held as an AD conversion result expanded to 12 bits (S70).
- FIG. 14 illustrates a timing chart of the AD conversion operation by the AD function according to the present embodiment.
- sampling of the analog signal to be measured for AD conversion and AD conversion operation by the AD conversion circuit 113 includes the above-described operation for determining the input section (monitoring AD conversion) and input measurement for extended AD conversion.
- the operation (actual AD conversion) is performed in this order.
- the divided section is determined using it (OPR1), and after the actual AD conversion, operations such as bit expansion, gain correction, and addition of a digital offset are performed (OPR2).
- OCR1 operations such as bit expansion, gain correction, and addition of a digital offset are performed
- the AD conversion result in which n bits are extended in a range satisfying the relationship of 2 n ⁇ m is obtained.
- the programmable gain amplifier is based on consistency with the amplification by giving the amplifier offset from the second DA conversion circuit 115 to the programmable gain amplifier 102 so that the determined range of the divided range is the full range of the AD conversion circuit 113.
- An amplifier 102 amplifies at a gain of 2 n or in the vicinity thereof. As a result, the resolution can be increased over the entire conversion range of the AD conversion circuit 113.
- Embodiment 2 a process for obtaining a digital offset of each divided range by a method different from that in the first embodiment will be described.
- the digital offset of a specific reference section substantially matches the minimum voltage of the specific section, so that the AD converter circuit 113 AD converts the minimum voltage of the specific section.
- 12-bit data obtained by performing 2-bit zero extension on the lower side can be used as the digital offset of the reference section.
- 2.5 V is output from the DAC 1 and AD-converted by the ADC 113 without being amplified by the PGA 102, and the following 2-bit bit extension is performed on the conversion result data, and this is used as the digital offset of the reference section.
- the AD converter circuit 113 Since the digital offset of the upper section of the specific section substantially coincides with the maximum voltage of the specific section, the AD converter circuit 113 performs AD conversion on the minimum voltage of the specific section, and the lower side has 2 bits. Perform 0-extension and divide by the actual gain, add the digital offset data of the section based on a known reference to the result of division, and use the obtained 12-bit extended AD conversion result as the digital offset Can do. It should be noted that the digital offset of the upper section of the upper section can be obtained by the same processing based on the known digital offset of the upper section.
- the AD converter circuit 113 AD converts the minimum voltage of the specific section to the lower side.
- a 2-bit zero extension is performed to divide by the actual gain, and the difference between the division result and the digital offset data of the section based on a known reference can be used as the digital offset. It should be noted that the digital offset of the lower section of the lower section can be obtained by the same processing based on the known digital offset of the lower section.
- FIG. 15 illustrates a data processing system according to the second embodiment of the present invention.
- the data processing system 200 shown in the figure is different from the data processing system 100 shown in FIG. 1 in that a sample and hold circuit 201 is added and a CPU 110A that performs control corresponding thereto is employed.
- the CPU 110A has a sample hold circuit 201 for inputting the analog signal to be measured 123, and the CPU 110A uses the same analog signal to be measured 123 sampled by the sample and hold circuit 201 to determine the division range and the determination result.
- a process for the extended AD conversion used is performed.
- the sample hold circuit 201 includes a sampling switch (SMP1) 211, a sampling capacitor (SC1) 212, an output buffer (BUF) 213, and an output selection switch (SW3) 214.
- SMP1 sampling switch
- SC1 sampling capacitor
- BAF output buffer
- SW3 output selection switch
- FIG. 16 illustrates the sample hold operation of the analog signal under measurement. After the necessary charge signal is accumulated in the sampling capacitor 212, the sampling switch 211 is closed.
- FIG. 17 illustrates an operation in which the information held in the sample hold circuit 201 is AD-converted by the ADC 113 through the PGA 102.
- the AD section data (RT3) and the measured voltage AD conversion process (RT4) described with reference to FIG. 8 are performed using the AD conversion data obtained by this monitoring operation.
- FIG. 18 illustrates operations in gain correction and digital offset addition processing (RT5).
- RT5 gain correction and digital offset addition processing
- the division range can be determined and the AD conversion using the determination result can be performed on the same analog signal to be measured. Occurrence of a situation where conversion is performed can be prevented in advance.
- Embodiment 4 >>
- the division number m can be arbitrarily determined within a range satisfying the relationship of 2 n ⁇ m.
- the midpoint of the dynamic signal is set to half of the input voltage range of the AD converter circuit. It is generally considered to be a good idea.
- the AD conversion method that divides the input range as described in the above embodiment if the number of divisions is an even number, the half of the input voltage range of the AD conversion circuit becomes a boundary between adjacent division ranges. In this respect, a difference in processing efficiency occurs in the AD conversion according to the present embodiment depending on whether the even number or the odd number is adopted as the division number m. This point will be described in the third embodiment.
- the division number of the input range of the AD converter circuit 113 is set to an even number, and the AD signal according to this embodiment is set.
- the voltage 2.5 V which is the median value of the periodic signal
- the amplifier offset is frequently switched according to the value of the analog signal to be measured.
- the time for waiting for the ADC 113 to stabilize becomes longer, and the conversion processing efficiency by the AD according to the present embodiment decreases.
- the CPU 110 (110 ⁇ / b> A) allows the input of the AD converter circuit 113 when the median value of the analog signal under measurement is close to the median value of the input range of the AD converter circuit 113.
- Control may be performed so that the AD conversion processing according to the present embodiment is performed with the number of divisions of the range set to an odd number, for example, five.
- the AD conversion processing according to the present embodiment is performed with the number of divisions of the range set to an odd number, for example, five.
- the input range by the converter 113 is expanded from 0.1 V to 4.9 V, for example.
- a margin corresponding to the capability of the AD conversion circuit 113 may be taken into consideration at both ends of the input range.
- FIG. 21 illustrates a data processing system according to the fourth embodiment.
- the data processing system 300 shown in the figure has a sample hold circuit 201 added to the data processing system 100 of FIG. 1, and the DA conversion circuit is integrated into one DA conversion circuit (DAC1) 114.
- the output is selectively supplied to the PGA 102 or the selector 103 via the selector 220, and the CPU 110B that performs control corresponding thereto is employed.
- a sample hold circuit 201 that selectively samples and holds the setting analog signal 122 instead of the measured analog signal 123 and outputs the sample analog signal 122 to the programmable gain amplifier 102, and an amplifier offset generation and a setting analog signal generation
- the DA conversion circuit (DAC1) 114 that is also used and the path for outputting the amplifier offset 121 generated by the DA conversion circuit 114 to the programmable gain amplifier 102 or the setting analog signal 122 generated by the DA conversion circuit
- a selector 220 for selecting a path to be supplied to the sample hold circuit 201 is provided.
- the CPU 110 ⁇ / b> B controls the selection of the selector 220 by using the DA conversion circuit 114 for generating the amplifier offset 121 and generating the setting analog signal 122.
- the sample hold circuit 201 includes a sampling switch (SMP1) 211, a sampling capacitor (SC1) 212, an output buffer (BUF) 213, and an output selection switch (SW3) 214.
- SMP1 sampling switch
- SC1 sampling capacitor
- BAF output buffer
- SW3 output selection switch
- the D / A converter circuit 115 that outputs the amplifier offset 121 to the programmable gain amplifier 102 and the setting analog signal 122 instead of the analog signal to be measured are programmable.
- the DA converter circuit 114 to be output to the gain amplifier 102 is separately provided, the setting of the amplifier offset and the generation of the setting analog signal can be performed in parallel, so that the processing efficiency when acquiring the digital offset It can contribute to improvement.
- the DA converter circuit 114 used for both the generation of the amplifier offset and the setting analog signal is employed, the setting of the amplifier offset and the generation of the setting analog signal are performed in series. However, it is possible to contribute to the reduction of the circuit scale by using the DA converter circuit.
- the gain calibration for the PGA 102 may be performed sequentially by processing RT10 to RT16 as shown in the outline of FIG. That is, in the actual gain acquisition process illustrated in FIG. 22, the terminal of the selector 103 is set to a, the selector 220 is set to g, the analog voltage is output from the DA conversion circuit 114, and the switch 211 built in the sample hold circuit 201 is output. (SMP1) is turned on, switch 214 (SW3) is turned off, and voltage x1 is stored in capacitor 212 (SC1) (RT10).
- the switch 211 After storing the voltage x1, the switch 211 is turned off, the switch 214 is turned on, the selector 220 is set to f, and an arbitrary voltage O (for example, 0 V) is output as the amplifier offset of the PGA 102 from the DA conversion circuit 114.
- O for example, 0 V
- the terminal of the selector 119 is set to d, and the voltage x1 stored in the capacitor 212 by the AD conversion circuit 113 is AD-converted through a path without the PGA 102, and an AD conversion result y1 is obtained (RT11).
- the terminal of the selector 119 is set to c, the voltage x1 stored in the capacitor 212 by the AD conversion circuit 113 is amplified by the PGA 102, and AD conversion is performed to obtain an AD conversion result Y1 (RT12).
- the analog voltage x2 is output from the DA conversion circuit 114, the voltage x2 is stored in the sample hold circuit 201 (RT13), the voltage x2 is stored, the switch 211 is turned off, the switch 214 is turned on, and the selector 220 is set to f.
- the amplifier offset voltage O is output from the DA conversion circuit 114.
- the AD conversion circuit 113 obtains the AD conversion result y2 from the voltage x2 stored in the capacitor 212 through the path without the PGA 102 (RT14), and the AD converter 113 obtains the AD conversion result Y2 from the voltage x2 amplified by the PGA 102. (TR15).
- the actually measured gain G is calculated from the ratio between the AD conversion result in the path without the PGA 102 and the AD conversion result of the voltage amplified by the PGA 102 for the two different voltages.
- processing is performed as x1 ⁇ x2.
- the voltages x1 and x2 are arbitrarily selected within a range in which the voltage amplified by the PGA 102 does not exceed the input range of the AD converter circuit.
- FIG. 23 illustrates details of the processes RT10 and RT11.
- FIG. 24 illustrates details of the process RT12.
- FIG. 25 illustrates details of the processes RT13 and RT14.
- FIG. 26 illustrates details of the process RT15.
- FIG. 27 illustrates details of the A and B portions in the flowchart when calculating the digital offset of section 3, and
- FIG. 28 illustrates details of the C portion in the flowchart when calculating the digital offset of section 3. .
- the calculation flow of the digital offset in other sections is not shown, but may be generated by processing according to FIG. 27 and FIG.
- bit expansion by a control unit such as a microcomputer and division by actually measured gain may be performed not only by fixed point arithmetic but also by floating point arithmetic.
- the order in which bit extension processing for expanding bit precision and division by measured gain is performed in digital offset generation processing, etc. is basically the order in which division after bit extension is desirable in the arithmetic system. However, it is possible to reverse by the calculation method otherwise.
- the bit accuracy, the number of extension bits, and the number of divisions of the AD conversion circuit are not limited to the above embodiment, and can be changed as appropriate.
- the data processing system is not limited to a one-chip semiconductor device, and can be configured with multiple chips.
- the microcomputers (MCUs) 101, 101A, and 101B can be configured with one chip, and other circuits can be configured with external components.
- the present invention relates to a data processing system having an AD conversion function, and can be widely applied to a technique for obtaining a bit accuracy higher than that of an AD conversion circuit.
- Microcomputer 102 Programmable gain amplifier (PGA) 103 Selector (SW1) 110 Central processing unit (CPU) 111 Nonvolatile memory (FLASH) 112 RAM 113 AD conversion circuit (ADC) 114 1st DA converter circuit (DAC1) 115 Second DA converter circuit (DAC2) 116 Digital input / output port 117 Analog input port 118 Peripheral circuit module (PRPH) 119 Selector (SW2) 200 Data processing system 201 Sample hold circuit 110A CPU 101A microcomputer 300 data processing system 110B CPU 101B Microcomputer
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Abstract
Description
変換レンジの切り替えに対する追従性が良好であって、その変換誤差が小さなデータ処理システムを提供することにある。
先ず、本願において開示される発明の代表的な実施の形態について概要を説明する。代表的な実施の形態についての概要説明で括弧を付して参照する図面中の参照符号はそれが付された構成要素の概念に含まれるものを例示するに過ぎない。
本発明の代表的な実施の形態に係るデータ処理システム(100,200,300)は、AD変換回路の分解能に対してn(nは正の整数)ビット拡張したAD変換結果を得るシステムであって、AD変換回路(113)、プログラマブルゲインアンプ(102)、及び制御回路(110,110A,110B)を有する。前記制御回路は、前記AD変換回路の入力レンジをm(2n≦m)分割し、各分割レンジの接続点の電圧が隣接するもの同士で同一となるデジタルオフセットを用意し、被測定アナログ信号に対して前記AD変換回路によるAD変換結果が何れの分割レンジに属するかを判別し、判別した分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲とするアンプオフセットとゲインの指定とを前記プログラマブルゲインアンプに与えて増幅し、増幅された信号を前記AD変換回路で変換し、その変換結果に対してnビット拡張と前記プログラマブルゲインアンプの実測ゲインの値による除算とを行なって、これに対応する分割レンジのデジタルオフセットを加算してビット精度をnビット拡張したAD変換結果とする。
項1のデータ処理システムにおいて、前記制御回路から前記プログラマブルゲインアンプに与えられるゲインは目的ゲイン2nであり、前記制御回路によるnビット拡張はAD変換結果の下位ビットに対する0拡張である。
項2のデータ処理システムにおいて、前記制御回路は、目的ゲインとして前記2nを前記プログラマブルゲインアンプに設定し、設定されたプログラマブルゲインアンプによるアナログ信号の増幅出力をAD変換回路で変換したデジタル値と、そのときプログラマブルゲインアンプに供給するアナログ信号の生成に用いたデジタル値との差に基づいて目的ゲインに対する実測ゲインを取得する。
項1のデータ処理システムにおいて、前記制御回路は、隣接する分割レンジの境界部分を交錯させるように前記アンプオフセットを設定する。
項1のデータ処理システムにおいて、前記制御回路は、前記AD変換回路の各分割レンジの境界電圧の入力電圧に対するAD変換データに基づいて被測定電圧が属する入力レンジを判別する。
項1のデータ処理システムにおいて、被測定アナログ信号を入力するサンプルホールド回路(201)をさらに有し、前記制御回路(110A,110B)は、前記サンプルホールド回路にサンプリングされた同じ被測定アナログ信号を用いて、分割レンジの判別と、判別された分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲とするAD変換とを行う。
項1のデータ処理システムにおいて、前記制御回路は、被測定アナログ信号の中央値がAD変換回路の入力レンジの中央値に近いとき前記AD変換回路の入力レンジの分割数を奇数に設定してAD変換のための前記処理を行う。
項1のデータ処理システムにおいて、前記プログラマブルゲインアンプに前記アンプオフセットを出力するDA変換回路(115)と、選択的に前記プログラマブルゲインアンプに設定用アナログ信号を出力するDA変換回路(114)とを別々に持つ。
項1のデータ処理システムにおいて、選択的に前記被測定アナログ信号に代えて設定用アナログ信号をサンプルホールドして前記プログラマブルゲインアンプに出力するサンプルホールド回路(201)と、アンプオフセットの生成と設定用アナログ信号の生成に兼用されるDA変換回路(図21の114)と、前記DA変換回路で生成されたアンプオフセットを前記プログラマブルゲインアンプに出力する経路又は前記DA変換回路で生成された設定用アナログ信号を前記サンプルホールド回路に供給する経路を選択する選択回路(220)とを有する。
本発明の別の実施の形態に係るデータ処理システム(100,200,300)は、AD変換回路(113)、プログラマブルゲインアンプ(102)、及び制御回路(110,110A,110B)を有する。前記制御回路は、被測定アナログ信号が前記AD変換回路の入力レンジをm(正の整数)分割した何れの分割レンジに属するかを判別し、判別した分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するためのアンプオフセットと目的ゲイン2n(nは正の整数、2n≦m)を前記プログラマブルゲインアンプに設定し、設定されたプログラマブルゲインアンプによる前記被測定アナログ信号の増幅信号を前記AD変換回路で変換し、変換されたデータに対するnビットのビット拡張と拡張されたデータに対する前記プログラマブルゲインアンプの実測ゲインによる除算とを行い、除算結果に当該分割レンジに対応する分割レンジのデジタルオフセットデータを加算して、ビット精度をnビット拡張したAD変換結果とする。
項10のデータ処理システムは第1のDA変換回路(114)及び第2のDA変換回路(115)を有し、前記制御回路は第1処理乃至第5処理の制御を行う。第1処理は、特定の前記分割レンジの任意電圧を前記第1のDA変換回路で生成し、これを前記AD変換回路で変換した第1データを取得する処理である。第2処理は、前記第1データの下位側に当該分割レンジに応じてnビット分のビット拡張を行って第2データを取得する処理である。第3処理は、前記特定の分割レンジの任意電圧を前記第1のDA変換回路で生成すると共に、当該分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するためのアンプオフセットを前記第2のDA変換回路で生成し、生成されたアンプオフセットと目的ゲイン2nとを設定した前記プログラマブルゲインアンプで前記第1のDA変換回路で生成した任意電圧を増幅し、増幅された信号を前記AD変換回路で変換して第3データを取得する処理である。第4処理は、前記第3データを下位側にnビット拡張し且つ拡張されたデータを前記実測ゲインで除算して第4データを取得する処理である。第5処理は、前記第2データから第4データを減算して当該特定の分割レンジのデジタルオフセットデータを取得する処理である。
項11のデータ処理システムにおいて、前記特定の分割レンジのデジタルオフセットデータを生成した後に、当該分割レンジの上位側の分割レンジのデジタルオフセットデータを生成するとき前記制御回路は第6処理乃至第9処理を行う。第6処理は、前記特定の分割レンジの最大電圧を前記第1のDA変換回路で生成すると共に、当該分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するためのアンプオフセットを前記第2のDA変換回路で生成し、生成したアンプオフセットと目的ゲイン2nとを設定した前記プログラマブルゲインアンプで前記第1のDA変換回路で生成された最大電圧を増幅し、増幅された信号を前記AD変換回路で変換して第6データを取得する処理である。第7処理は、前記第6データを下位側にnビット拡張し且つ拡張されたデータを前記実測ゲインで除算してこれに前記特定の分割レンジのデジタルオフセットデータを加算した第7データを取得する処理である。第8処理は、前記上位側の分割レンジの最小電圧を前記第1のDA変換回路で生成すると共に、当該分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するアンプオフセットを前記第2のDA変換回路で生成し、生成したアンプオフセットと目的ゲイン2nとを設定した前記プログラマブルゲインアンプで前記第1のDA変換回路で生成された最小電圧を増幅し、増幅された信号を前記AD変換回路で変換して第8データを取得する処理である。第9処理は前記第8データを下位側にnビット拡張し且つ拡張されたデータを前記実測ゲインで除算し、これを前記第7データから減算して前記上位側分割レンジのデジタルオフセットデータとする処理である。
項11のデータ処理システムにおいて、前記特定の分割レンジのデジタルオフセットデータを生成した後に、当該分割レンジの下位側の分割レンジのデジタルオフセットデータを生成するとき前記制御回路は第10乃至第13処理を行う。第10処理は、前記特定の分割レンジの最小電圧を前記第1のDA変換回路で生成すると共に、当該分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するアンプオフセットを前記第2のDA変換回路で生成し、生成したアンプオフセットと目的ゲイン2nとを設定した前記プログラマブルゲインアンプで前記第1のDA変換回路で生成された最小電圧を増幅し、増幅された信号を前記AD変換回路で変換して第10データを取得する処理である。第11処理は、前記第10データを下位側にnビット拡張し且つ拡張されたデータを前記実測ゲインで除算し、これに特定の分割レンジのデジタルオフセットデータを加算して第11データを取得する処理である。第12処理は、前記下位側の分割レンジの最大電圧を前記第1のDA変換回路で生成すると共に、当該分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するアンプオフセットを前記第2のDA変換回路で生成し、生成したアンプオフセットと目的ゲイン2nとを設定した前記プログラマブルゲインアンプで前記第1のDA変換回路で生成された最大電圧を増幅し、増幅された信号を前記AD変換回路で変換して第12データを取得する処理である。第13処理は、前記第12データを下位側にnビット拡張し且つ拡張されたデータを前記実測ゲインで除算し、これを前記第11データから減算して前記下位側分割レンジのデジタルオフセットデータとする処理である。
項10のデータ処理システムにおいて、前記制御回路は隣接する分割レンジの境界部分を交錯させるように前記アンプオフセットを設定する。
項10のデータ処理システムにおいて、被測定アナログ信号を入力するサンプルホールド回路(201)をさらに有し、前記制御回路(110A,110B)は、前記サンプルホールド回路にサンプリングされた同じ被測定アナログ信号を用いて、分割レンジの判別と、判別された分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲とするAD変換とを行う。
項10のデータ処理システムにおいて、前記制御回路は、被測定アナログ信号の中央値がAD変換回路の入力レンジの中央値に近いとき前記AD変換回路の入力レンジの分割数を奇数に設定してAD変換のための前記処理を行う。
項10のデータ処理システムにおいて、前記プログラマブルゲインアンプに前記アンプオフセットを出力するDA変換回路(115)と、選択的に前記プログラマブルゲインアンプに設定用アナログ信号を出力するDA変換回路(114)とを別々に持つ。
項10のデータ処理システムにおいて、選択的に前記被測定アナログ信号に代えて設定用アナログ信号をサンプルホールドして前記プログラマブルゲインアンプに出力するサンプルホールド回路(201)と、アンプオフセットの生成と設定用アナログ信号の生成に兼用されるDA変換回路(図21の114)と、前記DA変換回路で生成されたアンプオフセットを前記プログラマブルゲインアンプに出力する経路又は前記DA変換回路で生成された設定用アナログ信号を前記サンプルホールド回路に供給する経路を選択する選択回路とを有する。
本発明の更に別の実施の形態に係るデータ処理システム(100,200,300)は、AD変換回路(113)と、プログラマブルゲインアンプ(102)と、DA変換回路(114,115)と、前記プログラマブルゲインアンプのゲイン校正処理、デジタルオフセットデータの生成処理、被測定アナログ信号に対する入力区間の判別処理、及び被測定アナログ信号に対して判別された区間を前記AD変換回路の入力レンジの電圧範囲とする拡張AD変換処理を行う制御回路(110,110A,110B)とを有する。前記入力区間の判別処理は、前記AD変換回路による被測定アナログ信号に対する変換結果が当該AD変換回路の入力レンジの電圧範囲をm(正の整数)分割した何れの分割レンジに属するかを判別する処理である。前記拡張AD変換処理は、判別された分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するアンプオフセットと目的ゲイン2n(nは正の整数、2n≦m)とを前記プログラマブルゲインアンプに設定し、設定されたプログラマブルゲインアンプによる前記被測定アナログ信号の増幅信号を前記AD変換回路で変換し、変換されたデジタルデータに対するnビットのビット拡張と拡張されたデータに対するプログラマブルゲインアンプの実測ゲインによる除算を行い、除算されたデータに、前記判別された分割レンジの最小値に応ずるデジタルオフセットデータを加算して、ビット精度をnビット拡張したAD変換結果とする。
項19のデータ処理システムは前記DA変換回路として第1のDA変換回路(114)及び第2のDA変換回路(115)を有する。前記デジタルオフセットデータの生成処理は第1処理乃至第5処理を含む。第1処理は、特定の前記分割レンジの任意電圧を前記第1のDA変換回路で生成し、これを前記AD変換回路で変換した第1データを取得する処理である。第2処理は、前記第1データの下位側にnビットのビット拡張を行って第2データを取得する処理である。第3処理は、前記特定の分割レンジの任意電圧を前記第1のDA変換回路で生成すると共に、当該分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するアンプオフセットを前記第2のDA変換回路で生成し、生成されたアンプオフセットと目的ゲイン2nとを設定した前記プログラマブルゲインアンプで前記第1のDA変換回路で生成した任意電圧を増幅し、増幅された信号を前記AD変換回路で変換して第3データを取得する処理である。第4処理は、前記第3データを下位側にnビット拡張し且つ拡張されたデータを前記実測ゲインで除算して第4データを取得する処理である。第5処理は、前記第2データから第4データを減算して当該特定の分割レンジのデジタルオフセットデータを取得する処理である。
項20のデータ処理システムにおいて、前記デジタルオフセットデータの生成処理は、前記特定の分割レンジのデジタルオフセットデータを生成した後に、当該分割レンジの上位側の分割レンジのデジタルオフセットデータを生成するために第6乃至第9処理を含む。第6処理は、前記特定の分割レンジの最大電圧を前記第1のDA変換回路で生成すると共に、当該分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するアンプオフセットを前記第2のDA変換回路で生成し、生成したアンプオフセットと目的ゲイン2nとを設定した前記プログラマブルゲインアンプで前記第1のDA変換回路で生成された最大電圧を増幅し、増幅された信号を前記AD変換回路で変換して第6データを取得する処理である。第7処理は、前記第6データを下位側にnビット拡張し且つ拡張されたデータを前記実測ゲインで除算してこれに前記基準デジタルオフセットデータを加算して第7データを取得する処理である。第8処理は、前記上位側の分割レンジの最小電圧を前記第1のDA変換回路で生成すると共に、当該分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するアンプオフセットを前記第2のDA変換回路で生成し、生成したアンプオフセットと目的ゲイン2nとを設定した前記プログラマブルゲインアンプで前記第1のDA変換回路で生成された最小電圧を増幅し、増幅された信号を前記AD変換回路で変換して第8データを取得する処理である。第9処理は、前記第8データを下位側にnビット拡張し且つ拡張されたデータを前記実測ゲインで除算して、これを前記第7データから減算して前記上位側分割レンジのデジタルオフセットデータとする処理である。
項20のデータ処理システムにおいて、前記デジタルオフセットデータの生成処理は、前記特定の分割レンジのデジタルオフセットデータを生成した後に、当該分割レンジの下位側の分割レンジのデジタルオフセットデータを生成するために第10乃至第13処理を含む、第10処理は、前記特定の分割レンジの最小電圧を前記第1のDA変換回路で生成すると共に、当該分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するアンプオフセットを前記第2のDA変換回路で生成し、生成したアンプオフセットと目的ゲイン2nとを設定した前記プログラマブルゲインアンプで前記第1のDA変換回路で生成された最小電圧を増幅し、増幅された信号を前記AD変換回路で変換して第10データを取得する処理である。第11処理は、前記第10データを下位側にnビット拡張し且つ拡張されたデータを前記実測ゲインで除算し、これに前記基準デジタルオフセットデータを加算して第11データを取得する処理である。第12処理は、前記下位側の分割レンジの最大電圧を前記第1のDA変換回路で生成すると共に、当該分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するアンプオフセットを前記第2のDA変換回路で生成し、生成したアンプオフセットと目的ゲイン2nとを設定した前記プログラマブルゲインアンプで前記第1のDA変換回路で生成された最大電圧を増幅し、増幅された信号を前記AD変換回路で変換して第12データを取得する処理である。第13処理は、前記第12データを下位側にnビット拡張し且つ拡張されたデータを前記実測ゲインで除算し、これを前記第11データから減算して前記下位側分割レンジのデジタルオフセットデータとする処理である。
項19のデータ処理システムにおける前記拡張AD変換処理において、判別された分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するアンプオフセットを前記プログラマブルゲインアンプに設定するとき、隣接する分割レンジの境界部分を交錯させるように前記アンプオフセットを設定する。
項19のデータ処理システムにおいて、前記ゲイン校正処理は、前記第1のDA変換回路から出力したアナログ信号を前記プログラマブルゲインアンプで増幅して前記AD変換回路で変換して得られるデータと、前記アナログ信号を前記プログラマブルゲインアンプで増幅せずに前記AD変換回路で変換して得られるデータとに基づいて、前記増幅回路のゲインを演算し取得する処理を含む。
項19のデータ処理システムにおいて、前記区間判別処理は、AD変換回路の各分割レンジの境界電圧の入力電圧に対するAD変換データに基づいて被測定電圧が属する入力レンジを判別する処理を含む。
実施の形態について更に詳述する。
図1には本発明の第1の実施の形態に係るデータ処理システムが例示される。同図に示されるデータ処理システム100は、特に制限されないが、相補型MOS集積回路製造技術などにより単結晶シリコンなどの1個の半導体基板に形成されたシステムオンチップの半導体装置として構成される。データ処理システム100は、代表的に示されたマイクロコンピュータ(MCU)101、プログラマブルゲインアンプ(PGA)102、及びセレクタ(SW1)103を有する。特に図示はしないがメモリやアクセラレータなどのその他の回路が集積されていて良いことはいうまでもない。
実施の形態2では実施の形態1とは異なる方法によって夫々の分割レンジのデジタルオフセットを求める処理について説明する。ここでは特に図示はしないが、たとえば、特定の基準となる区間のデジタルオフセットは、特定の区間の最小電圧と実質的に一致することから、特定区間の最小電圧をAD変換回路113でAD変換し、下位側に2ビットの0拡張を行った12ビットのデータを基準となる区間のデジタルオフセットとすることができる。例えば2.5VをDAC1から出力しPGA102で増幅することなくADC113でAD変換し、変換結果データに下記2ビットのビット拡張を行なって、これを基準となる区間のデジタルオフセットとする。
《実施の形態3》
図15には本発明の第2の実施の形態に係るデータ処理システムが例示される。同図に示されるデータ処理システム200は図1のデータ処理システム100に比べてサンプルホールド回路201が追加され、それに応じた制御を行うCPU110Aを採用した点が相違される。即ち、被測定アナログ信号123を入力するサンプルホールド回路201を有し、CPU110Aは、前記サンプルホールド回路201にサンプリングされた同じ被測定アナログ信号123を用いて、分割レンジの判別と、その判別結果を利用した前記拡張AD変換のための処理を行う。サンプルホールド回路201はサンプリングスイッチ(SMP1)211、サンプリング容量(SC1)212、出力バッファ(BUF)213、及び出力選択スイッチ(SW3)214を備えて構成される。その他の構成について図1と同じ構成要素については同一参照符号を付してその詳細な説明を省略する。
上記実施の形態の説明では入力レンジの分割数mを4として説明した。即ち、本実施の形態に係るADによるAD変換結果の拡張ビット数n=2としたとき、分割数を2n=22とした。理論上、分割数mは2n≦mの関係を満足する範囲で任意に決定することができる。
図21には第4の実施の形態に係るデータ処理システムが例示される。同図に示されるデータ処理システム300は図1のデータ処理システム100に比べてサンプルホールド回路201が追加され、且つDA変換回路が一つのDA変換回路(DAC1)114に集約され、DA変換回路114の出力がセレクタ220を介して選択的にPGA102又はセレクタ103に供給可能にされ、それに応じた制御を行うCPU110Bを採用した点が相違される。即ち、選択的に前記被測定アナログ信号123に代えて設定用アナログ信号122をサンプルホールドして前記プログラマブルゲインアンプ102に出力するサンプルホールド回路201と、アンプオフセットの生成と設定用アナログ信号の生成に兼用されるDA変換回路(DAC1)114と、前記DA変換回路114で生成されたアンプオフセット121を前記プログラマブルゲインアンプ102に出力する経路又は前記DA変換回路で生成された設定用アナログ信号122を前記サンプルホールド回路201に供給する経路を選択するセレクタ220とが設けられる。CPU110Bは、前記アンプオフセット121の生成と設定用アナログ信号122の生成とでDA変換回路114を使い分けセレクタ220の選択制御を行う。サンプルホールド回路201はサンプリングスイッチ(SMP1)211、サンプリング容量(SC1)212、出力バッファ(BUF)213、及び出力選択スイッチ(SW3)214を備えて構成される。その他の構成について図1と同じ構成要素については同一参照符号を付してその詳細な説明を省略する。
101 マイクロコンピュータ(MCU)
102 プログラマブルゲインアンプ(PGA)
103 セレクタ(SW1)
110 中央処理装置(CPU)
111 不揮発性メモリ(FLASH)
112 RAM
113 AD変換回路(ADC)
114 第1DA変換回路(DAC1)
115 第2DA変換回路(DAC2)
116 デジタル入出力ポート
117 アナログ入力ポート
118 周辺回路モジュール(PRPH)
119 セレクタ(SW2)
200 データ処理システム
201 サンプルホールド回路
110A CPU
101A マイクロコンピュータ
300 データ処理システム
110B CPU
101B マイクロコンピュータ
Claims (25)
- AD変換回路の分解能に対してn(nは正の整数)ビット拡張したAD変換結果を得るデータ処理システムであって、
AD変換回路、プログラマブルゲインアンプ、及び制御回路を有し、
前記制御回路は、前記AD変換回路の入力レンジをm(2n≦m)分割し、各分割レンジの接続点の電圧が隣接するもの同士で同一となるデジタルオフセットを用意し、被測定アナログ信号に対して前記AD変換回路によるAD変換結果が何れの分割レンジに属するかを判別し、判別した分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲とするアンプオフセットとゲインの指定とを前記プログラマブルゲインアンプに与えて増幅し、増幅された信号を前記AD変換回路で変換し、その変換結果に対してnビット拡張と前記プログラマブルゲインアンプの実測ゲインによる除算とを行なって、これに対応する分割レンジのデジタルオフセットを加算してビット精度をnビット拡張したAD変換結果とする、データ処理システム。 - 前記制御回路から前記プログラマブルゲインアンプに与えられるゲインの指示は2nであり、
前記制御回路によるnビット拡張はAD変換結果の下位ビットに対する0拡張である、請求項1記載のデータ処理システム。 - 前記制御回路は、目的ゲインとして前記2nを前記プログラマブルゲインアンプに設定し、設定されたプログラマブルゲインアンプによるアナログ信号の増幅出力をAD変換回路で変換したデジタル値と、そのときプログラマブルゲインアンプに供給するアナログ信号の生成に用いたデジタル値との差に基づいて目的ゲインに対する実測ゲインを取得する、請求項2記載のデータ処理システム。
- 前記制御回路は、隣接する分割レンジの境界部分を交錯させるように前記アンプオフセットを設定する、請求項1記載のデータ処理システム。
- 前記制御回路は、前記AD変換回路の各分割レンジの境界電圧の入力電圧に対するAD変換結果データに基づいて被測定電圧が属する入力レンジを判別する、請求項1記載のデータ処理システム。
- 被測定アナログ信号を入力するサンプルホールド回路をさらに有し、
前記制御回路は、前記サンプルホールド回路にサンプリングされた同じ被測定アナログ信号を用いて、分割レンジの判別と、判別された分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲とするAD変換とを行う、請求項1記載のデータ処理システム。 - 前記制御回路は、被測定アナログ信号の中央値がAD変換回路の入力レンジの中央値に近いとき前記AD変換回路の入力レンジの分割数を奇数に設定してAD変換のための前記処理を行う、請求項1記載のデータ処理システム。
- 前記プログラマブルゲインアンプに前記アンプオフセットを出力するDA変換回路と、選択的に前記プログラマブルゲインアンプに設定用アナログ信号を出力するDA変換回路とを別々に持つ、請求項1記載のデータ処理システム。
- 選択的に前記被測定アナログ信号に代えて設定用アナログ信号をサンプルホールドして前記プログラマブルゲインアンプに出力するサンプルホールド回路と、アンプオフセットの生成と設定用アナログ信号の生成に兼用されるDA変換回路と、前記DA変換回路で生成されたアンプオフセットを前記プログラマブルゲインアンプに出力する経路又は前記DA変換回路で生成された設定用アナログ信号を前記サンプルホールド回路に供給する経路を選択する選択回路と、を有する請求項1記載のデータ処理システム。
- AD変換回路、プログラマブルゲインアンプ、及び制御回路を有するデータ処理システムであって、
前記制御回路は、被測定アナログ信号が前記AD変換回路の入力レンジをm(正の整数)分割した何れの分割レンジに属するかを判別し、判別した分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するためのアンプオフセットと目的ゲイン2n(nは正の整数、2n≦m)を前記プログラマブルゲインアンプに設定し、設定されたプログラマブルゲインアンプによる前記被測定アナログ信号の増幅信号を前記AD変換回路で変換し、変換されたデータに対するnビットのビット拡張と拡張されたデータに対する前記プログラマブルゲインアンプの実測ゲインによる除算とを行い、除算結果に当該分割レンジのデジタルオフセットデータを加算して、ビット精度をnビット拡張したAD変換結果とする、データ処理システム。 - 第1のDA変換回路及び第2のDA変換回路を有し、
前記制御回路は、特定の前記分割レンジの任意電圧を前記第1のDA変換回路で生成し、これを前記AD変換回路で変換した第1データを取得する第1処理と、
前記第1データの下位側にnビットのビット拡張を行って第2データを取得する第2処理と、
前記特定の分割レンジの任意電圧を前記第1のDA変換回路で生成すると共に、当該分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するためのアンプオフセットを前記第2のDA変換回路で生成し、生成されたアンプオフセットと目的ゲイン2nとを設定した前記プログラマブルゲインアンプで前記第1のDA変換回路で生成した任意電圧を増幅し、増幅された信号を前記AD変換回路で変換して第3データを取得する第3処理と、
前記第3データを下位側にnビット拡張し且つ拡張されたデータを前記実測ゲインで除算して第4データを取得する第4処理と、
前記第2データから第4データを減算して当該特定の分割レンジのデジタルオフセットデータを取得する第5処理とを制御する、請求項10記載のデータ処理システム。 - 前記制御回路は、前記特定の分割レンジのデジタルオフセットデータを生成した後に、当該分割レンジの上位側の分割レンジのデジタルオフセットデータを生成するとき、
前記特定の分割レンジの最大電圧を前記第1のDA変換回路で生成すると共に、当該分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するためのアンプオフセットを前記第2のDA変換回路で生成し、生成したアンプオフセットと目的ゲイン2nとを設定した前記プログラマブルゲインアンプで前記第1のDA変換回路で生成された最大電圧を増幅し、増幅された信号を前記AD変換回路で変換して第6データを取得する第6処理と、
前記第6データを下位側にnビット拡張し且つ拡張されたデータを前記実測ゲインで除算してこれに前記デジタルオフセットデータを加算した第7データを取得する第7処理と、
前記上位側の分割レンジの最小電圧を前記第1のDA変換回路で生成すると共に、当該分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するためのアンプオフセットを前記第2のDA変換回路で生成し、生成したアンプオフセットと目的ゲイン2nとを設定した前記プログラマブルゲインアンプで前記第1のDA変換回路で生成された最小電圧を増幅し、増幅された信号を前記AD変換回路で変換して第8データを取得する第8処理と、
前記第8データを下位側にnビット拡張し且つ拡張されたデータを前記実測ゲインで除算し、これを前記第7データから減算して前記上位側分割レンジのデジタルオフセットデータとする第9処理とを制御する、請求項11記載のデータ処理システム。 - 前記制御回路は、前記特定の分割レンジのデジタルオフセットデータを生成した後に、当該分割レンジの下位側の分割レンジのデジタルオフセットデータを生成するとき、
前記特定の分割レンジの最小電圧を前記第1のDA変換回路で生成すると共に、当該分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するアンプオフセットを前記第2のDA変換回路で生成し、生成したアンプオフセットと目的ゲイン2nとを設定した前記プログラマブルゲインアンプで前記第1のDA変換回路で生成された最小電圧を増幅し、増幅された信号を前記AD変換回路で変換して第10データを取得する第10処理と、
前記第10データを下位側にnビット拡張し且つ拡張されたデータを前記実測ゲインで除算し、これに前記デジタルオフセットデータを加算して第11データを取得する第11処理と、
前記下位側の分割レンジの最大電圧を前記第1のDA変換回路で生成すると共に、当該分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するアンプオフセットを前記第2のDA変換回路で生成し、生成したアンプオフセットと理想2nとを設定した前記プログラマブルゲインアンプで前記第1のDA変換回路で生成された最大電圧を増幅し、増幅された信号を前記AD変換回路で変換して第12データを取得する第12処理と、
前記第12データを下位側にnビット拡張し且つ拡張されたデータを前記実測ゲインで除算し、これを前記第11データから減算して前記下位側分割レンジのデジタルオフセットデータとする第13処理とを制御する、請求項11記載のデータ処理システム。 - 前記制御回路は、隣接する分割レンジの境界部分を交錯させるように前記アンプオフセットを設定する、請求項10記載のデータ処理システム。
- 被測定アナログ信号を入力するサンプルホールド回路をさらに有し、
前記制御回路は、前記サンプルホールド回路にサンプリングされた同じ被測定アナログ信号を用いて、分割レンジの判別と、判別された分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲とするAD変換とを行う、請求項10記載のデータ処理システム。 - 前記制御回路は、被測定アナログ信号の中央値がAD変換回路の入力レンジの中央値に近いとき前記AD変換回路の入力レンジの分割数を奇数に設定してAD変換のための前記処理を行う、請求項10記載のデータ処理システム。
- 前記プログラマブルゲインアンプに前記アンプオフセットを出力するDA変換回路と、選択的に前記プログラマブルゲインアンプに設定用アナログ信号を出力するDA変換回路とを別々に持つ、請求項10記載のデータ処理システム。
- 選択的に前記被測定アナログ信号に代えて設定用アナログ信号をサンプルホールドして前記プログラマブルゲインアンプに出力するサンプルホールド回路と、アンプオフセットの生成と設定用アナログ信号の生成に兼用されるDA変換回路と、前記DA変換回路で生成されたアンプオフセットを前記プログラマブルゲインアンプに出力する経路又は前記DA変換回路で生成された設定用アナログ信号を前記サンプルホールド回路に供給する経路を選択する選択回路と、を有する請求項10記載のデータ処理システム。
- AD変換回路と、プログラマブルゲインアンプと、DA変換回路と、前記プログラマブルゲインアンプのゲイン校正処理、デジタルオフセットデータの生成処理、被測定アナログ信号に対する入力区間の判別処理、及び被測定アナログ信号に対して判別された区間を前記AD変換回路の入力レンジの電圧範囲とする拡張AD変換処理を行う制御回路とを有するデータ処理システムであって、
前記入力区間の判別処理は、前記AD変換回路による被測定アナログ信号に対する変換結果が当該AD変換回路の入力レンジの電圧範囲をm(正の整数)分割した何れの分割レンジに属するかを判別する処理であり、
前記拡張AD変換処理は、判別された分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するアンプオフセットと目的ゲイン2n(nは正の整数、2n≦m)とを前記プログラマブルゲインアンプに設定し、設定されたプログラマブルゲインアンプによる前記被測定アナログ信号の増幅信号を前記AD変換回路で変換し、変換されたデジタルデータに対するnビットのビット拡張と拡張されたデータに対するプログラマブルゲインアンプの実測ゲインによる除算を行い、除算されたデータに、前記判別された分割レンジの起点に応ずるデジタルオフセットデータを加算して、ビット精度をnビット拡張したAD変換結果とする、データ処理システム。 - 前記DA変換回路として第1のDA変換回路及び第2のDA変換回路を有し、
前記デジタルオフセットデータの生成処理は、
特定の前記分割レンジの任意電圧を前記第1のDA変換回路で生成し、これを前記AD変換回路で変換した第1データを取得する第1処理と、
前記第1データの下位側にnビットのビット拡張を行って第2データを取得する第2処理と、
前記特定の分割レンジの任意電圧を前記第1のDA変換回路で生成すると共に、当該分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するアンプオフセットを前記第2のDA変換回路で生成し、生成されたアンプオフセットと目的ゲイン2nとを設定した前記プログラマブルゲインアンプで前記第1のDA変換回路で生成した任意電圧を増幅し、増幅された信号を前記AD変換回路で変換して第3データを取得する第3処理と、
前記第3データを下位側にnビット拡張し且つ拡張されたデータを前記実測ゲインで除算して第4データを取得する第4処理と、
前記第2データから第4データを減算して当該特定の分割レンジのデジタルオフセットデータを取得する第5処理とを含む、請求項19記載のデータ処理システム。 - 前記デジタルオフセットデータの生成処理は、前記特定の分割レンジのデジタルオフセットデータを生成した後に、当該分割レンジの上位側の分割レンジのデジタルオフセットデータを生成するため、
前記特定の分割レンジの最大電圧を前記第1のDA変換回路で生成すると共に、当該分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するアンプオフセットを前記第2のDA変換回路で生成し、生成したアンプオフセットと目的ゲイン2nとを設定した前記プログラマブルゲインアンプで前記第1のDA変換回路で生成された最大電圧を増幅し、増幅された信号を前記AD変換回路で変換して第6データを取得する第6処理と、
前記第6データを下位側にnビット拡張し且つ拡張されたデータを前記実測ゲインで除算してこれに前記デジタルオフセットデータを加算して第7データを取得する第7処理と、
前記上位側の分割レンジの最小電圧を前記第1のDA変換回路で生成すると共に、当該分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するアンプオフセットを前記第2のDA変換回路で生成し、生成したアンプオフセットと目的ゲイン2nとを設定した前記プログラマブルゲインアンプで前記第1のDA変換回路で生成された最小電圧を増幅し、増幅された信号を前記AD変換回路で変換して第8データを取得する第8処理と、
前記第8データを下位側にnビット拡張し且つ拡張されたデータを前記実測ゲインで除算して、これを前記第7データから減算して前記上位側分割レンジのデジタルオフセットデータとする第9処理とを含む、請求項20記載のデータ処理システム。 - 前記デジタルオフセットデータの生成処理は、前記特定の分割レンジのデジタルオフセットデータを生成した後に、当該分割レンジの下位側の分割レンジのデジタルオフセットデータを生成するため、
前記特定の分割レンジの最小電圧を前記第1のDA変換回路で生成すると共に、当該分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するアンプオフセットを前記第2のDA変換回路で生成し、生成したアンプオフセットと目的ゲイン2nとを設定した前記プログラマブルゲインアンプで前記第1のDA変換回路で生成された最小電圧を増幅し、増幅された信号を前記AD変換回路で変換して第10データを取得する第10処理と、
前記第10データを下位側にnビット拡張し且つ拡張されたデータを前記実測ゲインで除算し、これに前記デジタルオフセットデータを加算して第11データを取得する第11処理と、
前記下位側の分割レンジの最大電圧を前記第1のDA変換回路で生成すると共に、当該分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するアンプオフセットを前記第2のDA変換回路で生成し、生成したアンプオフセットと目的ゲイン2nとを設定した前記プログラマブルゲインアンプで前記第1のDA変換回路で生成された最大電圧を増幅し、増幅された信号を前記AD変換回路で変換して第12データを取得する第12処理と、
前記第12データを下位側にnビット拡張し且つ拡張されたデータを前記実測ゲインで除算し、これを前記第11データから減算して前記下位側分割レンジのデジタルオフセットデータとする第13処理とを含む、請求項20記載のデータ処理システム。 - 前記拡張AD変換処理において、判別された分割レンジの電圧範囲を前記AD変換回路の入力レンジの電圧範囲に拡大するアンプオフセットを前記プログラマブルゲインアンプに設定するとき、隣接する分割レンジの境界部分を交錯させるように前記アンプオフセットを設定する、請求項19記載のデータ処理システム。
- 前記ゲイン校正処理は、前記第1のDA変換回路から出力したアナログ信号を前記プログラマブルゲインアンプで増幅して前記AD変換回路で変換して得られるデータと、前記アナログ信号を前記プログラマブルゲインアンプで増幅せずに前記AD変換回路で変換して得られるデータとに基づいて、前記増幅回路のゲインを演算し取得する処理を含む、請求項19記載のデータ処理システム。
- 前記区間判別処理は、前記AD変換回路の各分割レンジの境界電圧の入力電圧に対するAD変換データに基づいて被測定電圧が属する入力レンジを判別する処理を含む、請求項19記載のデータ処理システム。
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