WO2012044026A2 - 형광체 및 이의 제조방법 - Google Patents
형광체 및 이의 제조방법 Download PDFInfo
- Publication number
- WO2012044026A2 WO2012044026A2 PCT/KR2011/007072 KR2011007072W WO2012044026A2 WO 2012044026 A2 WO2012044026 A2 WO 2012044026A2 KR 2011007072 W KR2011007072 W KR 2011007072W WO 2012044026 A2 WO2012044026 A2 WO 2012044026A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- phosphor
- nitride
- firing
- based phosphor
- firing step
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 56
- 239000000126 substance Substances 0.000 title abstract description 6
- 238000010304 firing Methods 0.000 claims abstract description 124
- 239000002243 precursor Substances 0.000 claims abstract description 61
- 150000004767 nitrides Chemical class 0.000 claims abstract description 60
- 238000002156 mixing Methods 0.000 claims abstract description 27
- 239000012686 silicon precursor Substances 0.000 claims abstract description 27
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 211
- 238000004519 manufacturing process Methods 0.000 claims description 32
- 239000000203 mixture Substances 0.000 claims description 32
- 238000002441 X-ray diffraction Methods 0.000 claims description 31
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 21
- IJGRMHOSHXDMSA-UHFFFAOYSA-N nitrogen Substances N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 21
- 229910052757 nitrogen Inorganic materials 0.000 claims description 21
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen(.) Chemical compound [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 claims description 21
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 17
- 239000000463 material Substances 0.000 claims description 15
- 239000013078 crystal Substances 0.000 claims description 13
- 239000006104 solid solution Substances 0.000 claims description 13
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 10
- 150000002500 ions Chemical class 0.000 claims description 10
- 150000001875 compounds Chemical class 0.000 claims description 2
- -1 silicon nitride compound Chemical class 0.000 claims description 2
- 239000012071 phase Substances 0.000 description 44
- 239000000047 product Substances 0.000 description 41
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 29
- 230000000052 comparative effect Effects 0.000 description 23
- AYJRCSIUFZENHW-UHFFFAOYSA-L barium carbonate Chemical compound [Ba+2].[O-]C([O-])=O AYJRCSIUFZENHW-UHFFFAOYSA-L 0.000 description 16
- 229910052909 inorganic silicate Inorganic materials 0.000 description 16
- 229910052681 coesite Inorganic materials 0.000 description 14
- 229910052906 cristobalite Inorganic materials 0.000 description 14
- 239000000377 silicon dioxide Substances 0.000 description 14
- 229910052682 stishovite Inorganic materials 0.000 description 14
- 229910052905 tridymite Inorganic materials 0.000 description 14
- 230000008859 change Effects 0.000 description 11
- 238000000295 emission spectrum Methods 0.000 description 10
- 239000012535 impurity Substances 0.000 description 10
- 239000012467 final product Substances 0.000 description 8
- LEDMRZGFZIAGGB-UHFFFAOYSA-L strontium carbonate Chemical compound [Sr+2].[O-]C([O-])=O LEDMRZGFZIAGGB-UHFFFAOYSA-L 0.000 description 8
- 229910000018 strontium carbonate Inorganic materials 0.000 description 8
- RSEIMSPAXMNYFJ-UHFFFAOYSA-N europium(III) oxide Inorganic materials O=[Eu]O[Eu]=O RSEIMSPAXMNYFJ-UHFFFAOYSA-N 0.000 description 7
- 238000004020 luminiscence type Methods 0.000 description 7
- 239000002994 raw material Substances 0.000 description 7
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 7
- 239000008367 deionised water Substances 0.000 description 6
- 229910021641 deionized water Inorganic materials 0.000 description 6
- 239000000243 solution Substances 0.000 description 6
- 239000002904 solvent Substances 0.000 description 6
- 229910052693 Europium Inorganic materials 0.000 description 5
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 5
- 239000001301 oxygen Substances 0.000 description 5
- 229910052760 oxygen Inorganic materials 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- 230000004907 flux Effects 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 3
- 229910004283 SiO 4 Inorganic materials 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 239000003822 epoxy resin Substances 0.000 description 3
- 238000011156 evaluation Methods 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 229920000647 polyepoxide Polymers 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- BVKZGUZCCUSVTD-UHFFFAOYSA-L Carbonate Chemical compound [O-]C([O-])=O BVKZGUZCCUSVTD-UHFFFAOYSA-L 0.000 description 2
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000007580 dry-mixing Methods 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 238000010532 solid phase synthesis reaction Methods 0.000 description 2
- 239000007858 starting material Substances 0.000 description 2
- 238000003786 synthesis reaction Methods 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- 229910052688 Gadolinium Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 229910001385 heavy metal Inorganic materials 0.000 description 1
- 230000003100 immobilizing effect Effects 0.000 description 1
- 239000013067 intermediate product Substances 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000003801 milling Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 239000002861 polymer material Substances 0.000 description 1
- 238000010791 quenching Methods 0.000 description 1
- 230000000171 quenching effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- 229920002050 silicone resin Polymers 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000003836 solid-state method Methods 0.000 description 1
- 238000001308 synthesis method Methods 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B21/00—Nitrogen; Compounds thereof
- C01B21/082—Compounds containing nitrogen and non-metals and optionally metals
- C01B21/0821—Oxynitrides of metals, boron or silicon
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B21/00—Nitrogen; Compounds thereof
- C01B21/082—Compounds containing nitrogen and non-metals and optionally metals
- C01B21/0821—Oxynitrides of metals, boron or silicon
- C01B21/0823—Silicon oxynitrides
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/0883—Arsenides; Nitrides; Phosphides
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/77—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals
- C09K11/7728—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals containing europium
- C09K11/77347—Silicon Nitrides or Silicon Oxynitrides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/50—Wavelength conversion elements
- H01L33/501—Wavelength conversion elements characterised by the materials, e.g. binder
- H01L33/502—Wavelength conversion materials
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2002/00—Crystal-structural characteristics
- C01P2002/50—Solid solutions
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2002/00—Crystal-structural characteristics
- C01P2002/50—Solid solutions
- C01P2002/52—Solid solutions containing elements as dopants
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2002/00—Crystal-structural characteristics
- C01P2002/70—Crystal-structural characteristics defined by measured X-ray, neutron or electron diffraction data
- C01P2002/72—Crystal-structural characteristics defined by measured X-ray, neutron or electron diffraction data by d-values or two theta-values, e.g. as X-ray diagram
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2002/00—Crystal-structural characteristics
- C01P2002/80—Crystal-structural characteristics defined by measured data other than those specified in group C01P2002/70
- C01P2002/84—Crystal-structural characteristics defined by measured data other than those specified in group C01P2002/70 by UV- or VIS- data
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/484—Connecting portions
- H01L2224/48463—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
- H01L2224/48465—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
Definitions
- a phosphor and a method of manufacturing the same are disclosed which are excellent in high temperature stability in LED application and have improved luminescence properties.
- LEDs White light emitting diodes
- LCD-TV BLU Back Light Unit
- automotive headlamps and general lighting, and the demand is expected to expand rapidly.
- a method of manufacturing a white LED is mainly the method of applying a yellow phosphor on a blue LED chip.
- This method implements white light by combining blue light emitted from a blue LED and yellow light emitted by an excited phosphor using a part of the light.
- the phosphor emitting yellow light is typically YAG: Ce 3+ ((Y, Gd) 3 (Al, Ga) 5 O 12 : Ce 3+ ) of Nichia, Japan, and the phosphor exhibits high-efficiency light emission. It is known to have excellent chemical stability.
- phosphors based on oxynitrides such as MSi 2 O 2 N 2 : Eu 2+ .
- the oxynitride-based phosphors are attracting attention as phosphors for white LEDs because of their excellent chemical stability and the ability to shift the emission wavelength by changing the type of M ions and the concentration of Eu ions.
- the oxynitride-based fluorescent material has a crystal structure in which Eu ions and M ions are arranged in two dimensions between the two-dimensional layer ( ⁇ ) consisting of SiON 3 tetrahedra. Therefore, the phosphor is expected to have significantly less emission deterioration due to concentration quenching than the phosphor in which Eu ions are three-dimensionally arranged.
- the oxynitride-based phosphor is synthesized by a solid phase method using a solid powder as a raw material.
- this synthesis method produces a substance close to a single phase only when Eu is not added or when a low concentration of Eu is added, and when a high concentration of Eu is added, that is, an Eu raw material (generally Eu 2 O). 3 )
- an Eu raw material generally Eu 2 O. 3
- a new phosphor capable of replacing the conventional YAG phosphor with excellent high temperature stability and luminescent properties, and a method of manufacturing the same.
- At least one precursor material of the precursor materials may be included in all of the respective groups.
- the firing temperature of the secondary firing step may be higher than the firing temperature of the primary firing step.
- the secondary firing step may be made under a nitrogen and hydrogen gas atmosphere.
- the first firing step is a first firing step of mixing and firing a first precursor group including MCO 3 and SiO 2 to produce a first firing product, and Eu 2 O 3 , SiO Second precursor groups comprising 2 and Si 3 N 4 may be mixed and calcined to produce a second calcined product.
- the first firing step may be performed under a temperature of 900 °C to 1300 °C.
- the second firing step may be performed under a temperature of 1200 °C to 1400 °C.
- the silicon nitride compound may be further added in the secondary firing step.
- Si 3 N 4 may be further added in the secondary firing step.
- NH 4 A (A is at least one element of F and Cl)
- KB 2 K is at least one element of Ca, Sr and Ba
- B is F
- at least one compound of LB L is at least one element of Na and K
- B is at least one element of F and Cl
- the secondary firing step may be made under a nitrogen and hydrogen gas atmosphere.
- the secondary firing step may be performed under a temperature of 1300 °C to 1600 °C.
- the first firing product may comprise a solid solution composed of two or more M ions.
- the second calcined product may include EuSi 2 O 2 N 2 .
- the nitride-based phosphor has a light emission intensity of at least 80% or more of the room temperature emission intensity at a temperature condition of 150 °C to 200 °C when driving the LED.
- the white light emitting diode has a light emission intensity of at least 80% or more of the room temperature emission intensity at a temperature condition of 150 °C to 200 °C.
- M 1-n Eu n Si a O b N c (M Sr 1-m Ba m, 0.25 ⁇ m ⁇ 0.3, 0 ⁇ m ⁇ (1-n) ⁇ 0.25, 2 ⁇
- oxynitride having an atomic ratio of O / N> 1 is 0.01 mol% or less relative to the entire phosphor.
- the phosphor has a triclinic crystal system and a space group of P1.
- the phosphor in the Sr-Eu system or Sr-Ba-Eu system to form a solid solution (solid solution).
- the diffraction angle is 12.50 ⁇ 2 ⁇ 12.60, 25.16 ⁇ 2 ⁇ 25.30, 31.51 ⁇ for three diffraction peaks of high intensity 2 ⁇ 31.65.
- the phosphor has a light emission wavelength range of 460 ⁇ 750 nm.
- M 1-n Eu n Si a O b N c (M Sr 1-m Ba m, 0.6 ⁇ m ⁇ 0.8, 0.5 ⁇ m ⁇ (1-n) ⁇ 0.65, 2 ⁇
- oxynitride having an atomic ratio of O / N> 1 is 0.01 mol% or less relative to the entire phosphor.
- the phosphor has a triclinic crystal system and a space group of P1.
- the phosphor in the Sr-Ba-Eu system to form a solid solution (solid solution).
- the diffraction angles for the four diffraction peaks of high intensity (12.30 ⁇ 2 ⁇ 12.38, 24.75 ⁇ 2 ⁇ 24.88, 25.56 ⁇ ) 2 ⁇ 25.62, 31.09 ⁇ 2 ⁇ 31.25.
- the phosphor has a light emission wavelength range of 465 ⁇ 765 nm.
- M 1-n Eu n Si a O b N c (M Sr 1-m Ba m, 0.3 ⁇ m ⁇ 0.6, 0.25 ⁇ m ⁇ (1-n) ⁇ 0.5, 2 ⁇
- oxynitride having an atomic ratio of O / N> 1 is 0.01 mol% or less with respect to all phosphors.
- the phosphor includes two different phases having a triclinic crystal system and a space group of P1.
- the phosphor comprises two different phases forming a solid solution in the Sr-Ba-Eu system.
- the diffraction angle is 12.47 ⁇ 2 ⁇ 12.49, 25.13 ⁇ 2 ⁇ for three diffraction peaks of high intensity (intensity), respectively 25.15, 31.48 ⁇ 2 ⁇ ⁇ 31.50, and the second phase has diffraction angles of 12.39 ⁇ 2 ⁇ ⁇ 12.45, 24.89 ⁇ 2 ⁇ ⁇ 24.95, and 31.26 ⁇ 2 ⁇ ⁇ 31.41 for three diffraction peaks having high intensity.
- the phosphor has a light emission wavelength range of 460 ⁇ 760 nm.
- the nitride-based phosphor according to an embodiment of the present invention may be formed as a single phase even with a high concentration of Eu, and may provide a yellow phosphor having improved high temperature stability and crystallinity and improved luminescence properties.
- nitride-based phosphor according to an embodiment of the present invention, it is possible to synthesize the solid solution containing two or more M ions, it is effective to increase the amount of oxygen in the raw material composition to generate impurities Can be suppressed.
- FIG. 1 is a flowchart conceptually illustrating a method of manufacturing a nitride-based phosphor according to an embodiment of the present invention.
- FIG. 2 is a flowchart illustrating a method of manufacturing the phosphor according to Example 1.
- FIG. 3 is a flowchart illustrating a method of manufacturing a phosphor according to Comparative Example 1.
- FIG. 4 is a graph showing luminescence intensity according to temperature for the phosphor prepared in Example 1 and the phosphor of Comparative Example 2.
- FIG. 4 is a graph showing luminescence intensity according to temperature for the phosphor prepared in Example 1 and the phosphor of Comparative Example 2.
- FIG. 5 is a graph showing emission spectra of the phosphor prepared in Example 1, the phosphor prepared in Comparative Example 1, and the phosphor of Comparative Example 2.
- FIG. 5 is a graph showing emission spectra of the phosphor prepared in Example 1, the phosphor prepared in Comparative Example 1, and the phosphor of Comparative Example 2.
- FIG. 6 is a cross-sectional view illustrating a structure of a white light emitting diode according to an embodiment of the present invention.
- 7A and 7B are graphs showing XRD patterns and emission spectra of phosphors prepared in Example 2, respectively.
- 8A and 8B are graphs showing XRD patterns and emission spectra of phosphors prepared in Example 3, respectively.
- 9A and 9B are graphs showing XRD patterns and emission spectra of phosphors prepared in Example 4, respectively.
- FIG. 10 is a view showing Rietveld fitting results for the phosphor prepared in Example 5.
- FIG. 10 is a view showing Rietveld fitting results for the phosphor prepared in Example 5.
- FIG. 11 is a graph illustrating XRD patterns of phosphor matrix materials prepared in Examples 6 to 26, respectively.
- 12A and 12B are graphs showing XRD patterns and emission spectra of phosphors prepared in Examples 27 to 41, respectively.
- FIG. 1 is a flowchart conceptually illustrating a method of manufacturing a nitride-based phosphor according to an embodiment of the present invention.
- a plurality of precursor materials are prepared to manufacture a nitride-based phosphor according to an embodiment of the present invention.
- the plurality of precursor materials are divided into two groups.
- the first group includes an M precursor (M comprises at least one element of Ca, Sr and Ba) and a first silicon precursor.
- the second group includes an Eu precursor and a second silicon precursor.
- the plurality of precursor materials are divided into two groups.
- the precursor materials may be divided into three or more groups.
- a metal carbonate (MCO 3 ) may be used, and SiO 2 may be used as the first silicon precursor.
- MCO 3 metal carbonate
- Eu precursor for example, there may be mentioned such as Eu 2 O 3
- a second silicon precursor may include SiO 2 and Si 3 N 4.
- the first silicon precursor and the second silicon precursor may include the same precursor (SiO 2 ) in common.
- Each grouped precursor is subjected to mixing.
- Mixing the precursors may be one of two methods, dry and wet.
- each precursor may be mixed with a solvent and a ball to assist grinding.
- the ball used may be made of a material such as silicon oxide (Si 3 N 4 ), alumina (Al 2 O 3 ), zirconia (ZrO 2 ).
- an alcohol such as DI water, ethanol, or an organic solvent such as n-hexane may be used.
- the precursors may be sealed together with the solvent and the ball to be homogeneously mixed using a device such as a miller. After the mixing process is completed, the mixture and the ball may be separated, and the solvent may be evaporated mostly through a drying process in an oven.
- the dried powder may be uniformly ground in a micrometer size condition using a sieve made of metal or polymer.
- the precursors are put in a container without using a solvent, and the precursors are homogeneously mixed using a milling machine. At this time, the mixing time can be shortened by using the ball as in the wet mixing method.
- This dry mixing method can shorten the process time because it does not require the drying process of the solvent compared to wet.
- the powder after the mixing process may be uniformly pulverized to a desired size using a sieve of a metal or polymer material.
- Precursors of each group mixed are calcined.
- the first firing product and the second firing product are respectively produced as intermediate products, and the first and second firing products are mixed again by the above-described method and subjected to the second firing step, thereby obtaining a final phosphor.
- additional silicon precursors or flux may be added before mixing. The use of such flux may promote mass transfer between the intermediate and first firing products and the silicon precursor added in the secondary firing step, thereby contributing to the crystallinity improvement and particle growth of the nitride-based phosphor as the final product. have.
- the firing temperature of the secondary firing step may be higher than the firing temperature of the primary firing step.
- the secondary firing step can take place under a nitrogen and hydrogen gas atmosphere.
- M Sr 1-xy Ba x Ca y, 0 ⁇ x ⁇ 0.5, 0 ⁇ y ⁇ 0.2, 0 ⁇ z ⁇ 0.3, 2 as specific examples
- the first group comprises an M precursor (M comprises at least one element of Ca, Sr and Ba) and a first silicon precursor.
- the second group includes an Eu precursor and a second silicon precursor.
- M precursor metal carbonate (MCO 3 ) may be used, and SiO 2 may be used as the first silicon precursor.
- M precursor metal carbonate (MCO 3 )
- SiO 2 may be used as the first silicon precursor.
- Eu precursor for example, there may be mentioned such as Eu 2 O 3
- a second silicon precursor may include SiO 2 and Si 3 N 4.
- the first group of precursors are fired at a temperature of 900 ° C to 1300 ° C. Firing of the precursors of the first group can be carried out under air conditions, and the firing time is suitably about 3 hours.
- the firing of the precursors of the second group may be performed at a temperature of 1200 ° C. to 1400 ° C., and may be performed under a nitrogen and hydrogen gas atmosphere. The firing time of the second group is also suitably about 3 hours.
- the calcined product of the first group will comprise M 2 SiO 4 and the calcined product of the second group will contain EuSi 2 O 2 N 2 .
- the intermediate firing product, M 2 SiO 4 can be easily synthesized in a single phase in the air, and the synthesis of a solid solution containing two or more M ions enables the synthesis of nitride-based phosphors containing two or more M ions.
- Another intermediate firing product, EuSi 2 O 2 N 2 by immobilizing the composition ratios of the starting materials Eu 2 O 3 , SiO 2 and Si 3 N 4 , can suppress the increase in the amount of oxygen in the starting composition, so that It is possible to synthesize phosphors on a daily basis.
- M 1-z Eu z Si a O b N c (M Sr 1-xy Ba x Ca y, 0 ⁇ x ⁇ 0.5, 0 ⁇ y ⁇ 0.2, 0 ⁇ z ⁇ 0.3, 2 ⁇ a ⁇ 2.5, 1.5 ⁇ b ⁇ 2, and 2 ⁇ c ⁇ 2.5 It can be generated in a single phase.
- SiO 4 And EuSi 2 O 2 N 2 Is Additional silicon precursors and fluxes are mixed by the mixing method described above.
- Si as the additional silicon precursor 3 N 4 To Can be used.
- NH as the flux 4 A (A is at least one element of F and Cl), KB 2 (K is at least one element of Ca, Sr and Ba, B is at least one element of F and Cl), LB (L is at least one element of Na and K, B is at least one of F and Cl) Element), and the like.
- the flux is M 2 SiO 4 And EuSi 2 O 2 N 2 And Si 3 N 4 MSi promotes mass transfer 2 O 2 N 2 : Eu 2+
- the secondary firing step can be made under a nitrogen and hydrogen gas atmosphere, the firing temperature is 1300 °C to 1600 °C.
- the phosphor is a yellow phosphor of a single phase which becomes a phosphor of a single phase, and an oxynitride having an atomic ratio of O / N> 1 is less than or equal to 1 mol% of the entire phosphor, and according to an embodiment, it may be a phosphor composed of only a single phase. .
- oxynitrides of impurities such as M 3 Si 6 O 9 N 4 are not formed in the manufacturing process.
- EuSi 2 O 2 N 2 which is an intermediate firing product during the manufacturing process, can fix the composition ratio of Eu 2 O 3 , SiO 2 and Si 3 N 4 , which are starting materials, thereby suppressing an increase in the amount of oxygen in the starting composition. It is possible to synthesize phosphors in a single phase without production.
- the nitride-based phosphor has a light emission intensity of at least 80% or more of the room temperature emission intensity at a temperature of 150 °C to 200 °C when driving the LED, the light emission intensity also shows a 90% level compared to the conventional YAG temperature stability and light emission characteristics are very great. Therefore, compared with the conventional YAG phosphor, it can be said that the LED application characteristics are better.
- This embodiment is a nitride-based phosphor, (Sr 0.75 Ba 0.25 ) 0.85 Eu 0.15 Si 2 O 2 N 2 It is a method of manufacturing a phosphor.
- 2 is a flowchart illustrating a method of manufacturing the phosphor according to Example 1.
- FIG. The phosphor of Example 1 was prepared by the sequence shown in FIG. Referring to FIG. 2, the first group of MCOs 3 (SrCO 3 , BaCO 3 ) And SiO 2 The precursors were mixed and calcined for 3 hours under an air atmosphere and a temperature of 1100 ° C. as an intermediate firing product M 2 SiO 4 Obtained.
- the second group Eu 2 O 3 , SiO 2 And Si 3 N 4 The precursors were mixed and calcined for 3 hours under a temperature of 1300 ° C. and nitrogen and hydrogen gas atmosphere to give EuSi as an intermediate firing product. 2 O 2 N 2 Obtained. Intermediate firing product M 2 SiO 4 And EuSi 2 O 2 N 2 Is then an additional silicon precursor Si 3 N 4 Wow NH NH 4 Mixed with Cl. The mixed mixture is then calcined again under a temperature of 1400 ° C. and nitrogen and hydrogen gas atmospheres, whereby the final product (Sr 0.75 Ba 0.25 ) 0.85 Eu 0.15 Si 2 O 2 N 2 of A phosphor having a composition was prepared.
- This comparative example is a nitride-based phosphor, also (Sr 0.75 Ba 0.25 ) 0.85 Eu 0.15 Si 2 O 2 N 2 It is a method of manufacturing a phosphor.
- the phosphor of the present comparative example was manufactured by the method of FIG. 3 unlike the method shown in FIG. 2.
- 3 is a flowchart illustrating a method of manufacturing a phosphor according to Comparative Example 1.
- MCO 3 (SrCO 3 , BaCO 3 ), SiO 2 , Eu 2 O 3 And Si 3 N 4 of After all the precursors were mixed at the same time and then calcined for 6 hours under the nitrogen and hydrogen gas atmosphere at a temperature of 1400 °C and the second firing step of Example 1 (Sr 0.75 Ba 0.25 ) 0.85 Eu 0.15 Si 2 O 2 N 2 of A phosphor having a composition was prepared.
- Table 1 below is a table summarizing the phosphors of Example 1, Comparative Example 1 and Comparative Example 2.
- Example 4 is a graph showing the light emission intensity according to the temperature of the phosphor prepared in Example 1 and the phosphor of Comparative Example 2.
- the phosphor of Example 1 exhibits about 80% or more of room temperature luminous intensity at a temperature of 150 ° C. to 200 ° C., which is a driving temperature of a typical LED, compared to the YAG phosphor of Comparative Example 2. Since the YAG phosphor of Comparative Example 2 exhibits about 60% emission intensity, it was confirmed that the phosphor of Example 1 had about 20% superior characteristics to that of the YAG phosphor of Comparative Example 2.
- FIG. 5 is a graph showing emission spectra of the phosphor prepared in Example 1, the phosphor prepared in Comparative Example 1, and the phosphor of Comparative Example 2.
- FIG. 5 is a graph showing emission spectra of the phosphor prepared in Example 1, the phosphor prepared in Comparative Example 1, and the phosphor of Comparative Example 2.
- the phosphor of Example 1 exhibits more than twice the emission intensity (integrated intensity) of the phosphor of Comparative Example 1 synthesized by a conventional solid phase method.
- the intensity of about 90% compared to the YAG phosphor of Comparative Example 2 it was confirmed that the phosphor of Example 1 has a light emission intensity enough to replace the YAG phosphor.
- the phosphor of Example 1 had excellent luminescent properties compared to the phosphor of Comparative Example 2 synthesized by the conventional solid-state method, and was evaluated to have a very high temperature stability compared to the phosphor of Comparative Example 2.
- the phosphor of Example 1 was evaluated to exhibit excellent properties in LED applications because it has a light emission characteristic close to the light emission characteristics of the YAG phosphor and excellent in high temperature stability. Therefore, the phosphor of Example 1 is expected to be able to reliably replace the conventional YAG phosphor.
- FIG. 6 is a cross-sectional view illustrating a structure of a white light emitting diode according to an embodiment of the present invention.
- a white light emitting diode using a blue light emitting diode or a long wavelength ultraviolet light emitting diode includes a reflecting cup 611 and an InGaN based light emitting diode chip 613 (long wavelength ultraviolet light) disposed on the reflecting cup 611.
- a light emitting diode a GaN-based light emitting diode
- a yellow phosphor 617 excited by light emitted from the light emitting diode chip 613 an electrode line 615 connected to the light emitting diode chip 613, and the light emission.
- a light transmissive epoxy resin 619 that encloses the diode chip 613 is included.
- the yellow phosphor 617 serves as a wavelength conversion material, and as the yellow phosphor 617, the nitride-based phosphor according to the embodiment of the present invention described above is used.
- the InGaN LED chip 613 is connected to an external power source by an electrode line 615.
- the yellow phosphor 617 excited by the light emitted from the InGaN-based light emitting diode chip 613 is mixed with the epoxy resin 619 and formed outside the light emitting diode chip 613.
- the configuration of the light emitting diode according to the present invention is not limited to the structure of FIG. 1, and it is possible to freely add, change, and delete components according to the prior art.
- the yellow phosphor 617 may form a white light emitting diode by mixing the epoxy resin with a silicone resin to mold the circumference of the light emitting diode chip 613.
- the yellow phosphor 617 is formed outside the light emitting diode chip 613 so that light emitted from the light emitting layer of the light emitting diode chip 613 serves as excitation light of the yellow phosphor 617.
- the blue light emitted from the LED chip 613 passes through the yellow phosphor 617 according to the embodiment of the present invention.
- some of the light is used to excite the yellow phosphor 617 to implement yellow, and the remaining light is transmitted as it is as blue light. Therefore, as described above, the yellow light passing through the yellow phosphor 617 and the blue light passing through the yellow phosphor as it is overlapped with each other to realize white light.
- the nitride-based phosphor prepared in Example 2 is a mixed-phase phosphor produced from starting composition (Sr 0.71 Ba 0.29 ) 0.92 Eu 0.08 Si 2 O 2 N 2 .
- Phosphor of Example 2 was prepared in the same manner as in Example 1 in the order shown in FIG.
- the first group of MCOs 3 (SrCO 3 , BaCO 3 ) And SiO 2
- the precursors were mixed and calcined for 3 hours under an air atmosphere and a temperature of 1100 ° C. as an intermediate firing product M 2 SiO 4 Obtained.
- the second group Eu 2 O 3 , SiO 2 And Si 3 N 4 The precursors were mixed and calcined for 3 hours under a temperature of 1300 ° C. and nitrogen and hydrogen gas atmosphere to give EuSi as an intermediate firing product. 2 O 2 N 2 Obtained.
- Intermediate firing product M 2 SiO 4 And EuSi 2 O 2 N 2 followeded by an additional silicon precursor Si 3 N 4 Wow NH NH 4 Mixed with Cl.
- the mixed mixture was calcined again under a temperature of 1400 ° C. and a nitrogen and hydrogen gas atmosphere to prepare a mixed phase phosphor as a final product. Thereafter, the prepared phosphor was replaced with 5% (v / v) HNO. 3
- the solution was washed with deionized water to remove impurities and intermediate phase. XRD patterns and light emission wavelengths of the phosphors thus prepared are shown in FIGS. 7A and 7B.
- the phosphor of Example 2 is a mixed-phase phosphor including two different phosphors. It can be seen that.
- the phosphor of Example 2 is excited with light of 450 nm, which is a representative wavelength of a blue light emitting device (LED), exhibits an emission spectrum in the range of 460 nm to 760 nm, and shows an emission peak of 554 nm. . Due to the optical properties, the phosphor of Example 2 exhibits yellow light emission, indicating that the phosphor of Example 2 has a luminescence property that can replace the YAG phosphor.
- LED blue light emitting device
- the nitride-based phosphor prepared in Example 3 is a mixed-phase phosphor produced from starting composition (Sr 0.65 Ba 0.35 ) 0.88 Eu 0.12 Si 2 O 2 N 2 .
- the phosphor of Example 3 was prepared in the same manner as in Example 1 by the procedure shown in FIG. 2.
- the first group of MCOs 3 (SrCO 3 , BaCO 3 ) And SiO 2
- the precursors were mixed and calcined for 3 hours under an air atmosphere and a temperature of 1100 ° C. as an intermediate firing product M 2 SiO 4 Obtained.
- the second group Eu 2 O 3 , SiO 2 And Si 3 N 4 The precursors were mixed and calcined for 3 hours under a temperature of 1300 ° C. and nitrogen and hydrogen gas atmosphere to give EuSi as an intermediate firing product. 2 O 2 N 2 Obtained.
- Intermediate firing product M 2 SiO 4 And EuSi 2 O 2 N 2 followeded by an additional silicon precursor Si 3 N 4 Wow NH NH 4 Mixed with Cl.
- the mixed mixture was calcined again under a temperature of 1400 ° C. and a nitrogen and hydrogen gas atmosphere to prepare a mixed phase phosphor as a final product. Thereafter, the prepared phosphor was replaced with 5% (v / v) HNO. 3
- the solution was washed with deionized water to remove impurities and intermediate phase.
- the XRD pattern and emission wavelength of the phosphor thus prepared are shown in FIGS. 8A and 8B.
- the phosphor of Example 3 was a mixed phase phosphor including two different phosphors. Able to know.
- the phosphor of Example 3 is excited with light of 450 nm, which is a representative wavelength of a blue light emitting device (LED), exhibits an emission spectrum in the range of 460 nm to 760 nm, and shows an emission peak of 560 nm. . Due to the optical properties, the phosphor of Example 3 exhibits yellow light emission, which shows that the phosphor of Example 3 has a luminescence property that can replace the YAG phosphor.
- LED blue light emitting device
- the nitride-based phosphor prepared in Example 4 has a composition formula of (Sr 0.31 Ba 0.69 ) 0.85 Eu 0.15 Si 2 O 2 N 2 .
- the phosphor of Example 4 was prepared in the same manner as in Example 1 by the procedure shown in FIG. 2.
- the first group of MCOs 3 (SrCO 3 , BaCO 3 ) And SiO 2
- the precursors were mixed and calcined for 3 hours under an air atmosphere and a temperature of 1100 ° C. as an intermediate firing product M 2 SiO 4 Obtained.
- the second group Eu 2 O 3 , SiO 2 And Si 3 N 4 The precursors were mixed and calcined for 3 hours under a temperature of 1300 ° C. and nitrogen and hydrogen gas atmosphere to give EuSi as an intermediate firing product. 2 O 2 N 2 Obtained.
- Intermediate firing product M 2 SiO 4 And EuSi 2 O 2 N 2 followeded by an additional silicon precursor Si 3 N 4 Wow NH NH 4 Mixed with Cl.
- the mixed mixture is then calcined again under a temperature of 1400 ° C. and nitrogen and hydrogen gas atmospheres, whereby the final product (Sr 0.31 Ba 0.69 ) 0.85 Eu 0.15 Si 2 O 2 N 2 of A single phase phosphor having a composition was prepared. Thereafter, the prepared phosphor was replaced with 5% (v / v) HNO. 3 The solution was washed with deionized water to remove impurities and intermediate phase. The XRD pattern and emission wavelength of the phosphor thus prepared are shown in FIGS. 9A and 9B.
- Example 4 is a single phase phosphor.
- the phosphor of Example 4 is excited with light of 450 nm, which is a representative wavelength of a blue light emitting device (LED), exhibits an emission spectrum in the range of 465 nm to 765 nm, and exhibits an emission peak of 577 nm. . Due to the optical properties, the phosphor of Example 4 exhibits yellow light emission, indicating that the phosphor of Example 4 has a luminescence property that can replace the YAG phosphor.
- LED blue light emitting device
- the nitride-based phosphor prepared in Example 5 is a single-phase phosphor having a (Sr 0.35 Ba 0.65 ) 0.85 Eu 0.15 Si 2 O 2 N 2 compositional formula.
- the phosphor of Example 5 was prepared in the same manner as in Example 1 by the procedure shown in FIG. 2.
- the first group of MCOs 3 (SrCO 3 , BaCO 3 ) And SiO 2
- the precursors were mixed and calcined for 3 hours under an air atmosphere and a temperature of 1100 ° C. as an intermediate firing product M 2 SiO 4 Obtained.
- the second group Eu 2 O 3 , SiO 2 And Si 3 N 4 The precursors were mixed and calcined for 3 hours under a temperature of 1300 ° C. and nitrogen and hydrogen gas atmosphere to give EuSi as an intermediate firing product. 2 O 2 N 2 Obtained.
- Intermediate firing product M 2 SiO 4 And EuSi 2 O 2 N 2 followeded by an additional silicon precursor Si 3 N 4 Wow NH NH 4 Mixed with Cl.
- the mixed mixture is then calcined again under a temperature of 1400 ° C. and nitrogen and hydrogen gas atmospheres, whereby the final product (Sr 0.35 Ba 0.65 ) 0.85 Eu 0.15 Si 2 O 2 N 2 of A single phase phosphor having a composition was prepared. Thereafter, the prepared phosphor was replaced with 5% (v / v) HNO. 3 The solution was washed with deionized water to remove impurities and intermediate phase. Crystal structure analysis data of the phosphor thus prepared is shown in Table 2, and Rietveld fitting results are shown in FIG. 10.
- the nitride-based phosphor prepared in Example 5 is a nitride-based phosphor having a triclinic crystal system and a space group of P1.
- Example 5 the XRD pattern of the nitride-based phosphor prepared in Example 5 almost matches the calculated value. From this, it can be seen that the phosphor of Example 5 is a single-phase phosphor.
- obs denotes a measured value of a manufactured phosphor
- cal denotes a value obtained by calculation
- diff denotes a value obtained by subtracting the value obtained by calculation. From the purity of the prepared phosphor can be determined.
- Examples 6 to 26 have m values in (Sr 1-m Ba m ) Si 2 O 2 N 2 , respectively, 0, 0.05, 0.1, 0.15, 0.2, 0.25, 0.3, 0.35, 0.4, 0.45, 0.5, 0.55 , 0.6, 0.65, 0.7, 0.75, 0.8, 0.85, 0.9, 0.95, 1 having a compositional formula.
- Phosphors of Examples 6 to 26 were prepared in the same manner as in Example 1 by the procedure shown in FIG. 2.
- the first group of MCOs 3 (SrCO 3 , BaCO 3 ) And SiO 2
- the precursors were mixed and calcined for 3 hours under an air atmosphere and a temperature of 1100 ° C. as an intermediate firing product M 2 SiO 4 Obtained.
- EuSi another intermediate firing product, because it does not contain Eu 2 O 2 N 2
- the step of synthesizing was omitted.
- the intermediate firing product M 2 SiO 4 Add silicon precursor Si 3 N 4 Wow NH NH 4 Mixed with Cl.
- the mixed mixture is then calcined again under a temperature of 1400 ° C.
- Table 3 shows the changes in the crystal phase produced according to the Ba content range.
- Phosphors of Examples 27 to 41 were prepared in the same manner as in Example 1 by the procedure shown in FIG. 2.
- the first group of MCOs 3 (SrCO 3 , BaCO 3 ) And SiO 2
- the precursors were mixed and calcined for 3 hours under an air atmosphere and a temperature of 1100 ° C. as an intermediate firing product M 2 SiO 4 Obtained.
- the second group Eu 2 O 3 , SiO 2 And Si 3 N 4 The precursors were mixed and calcined for 3 hours under a temperature of 1300 ° C. and a nitrogen and hydrogen gas atmosphere to give EuSi as an intermediate firing product. 2 O 2 N 2 Obtained.
- Intermediate firing product M 2 SiO 4 And EuSi 2 O 2 N 2 followeded by an additional silicon precursor Si 3 N 4 Wow NH NH 4 Mixed with Cl.
- the mixed mixture is then calcined again under a temperature of 1400 ° C. and nitrogen and hydrogen gas atmospheres, whereby the final product (Sr 1-m Ba m ) 1-n Eu n Si 2 O 2 N 2 (m and n values have values in the range as described above). Thereafter, the prepared phosphor was replaced with 5% (v / v) HNO. 3 The solution was washed with deionized water to remove impurities and intermediate phase. XRD patterns and emission spectra of the phosphors thus prepared are shown in FIGS. 12A and 12B, respectively.
- phase analysis results and the emission peak wavelength (Wp) of the phosphors prepared in Examples 27 to 41 are shown in Table 4, and the phosphors prepared in Examples 6 to 26 and Example 27 ⁇ Phase change according to m, n range from the XRD pattern of the phosphors prepared in Example 41 is shown in Table 3.
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Inorganic Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Materials Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Luminescent Compositions (AREA)
- Led Device Packages (AREA)
Abstract
Description
Claims (34)
- 복수의 전구체 물질들을 적어도 2개의 그룹으로 구분하여 각각의 그룹을 소성하는 1차 소성 단계; 및상기 각 그룹의 소성 후 산물을 혼합하여 소성하는 2차 소성 단계를 포함하는 질화물계 형광체의 제조 방법.
- 제1항에 있어서,상기 전구체 물질들 중 적어도 하나의 전구체 물질은 상기 각각의 그룹에 모두 포함되는 질화물계 형광체의 제조 방법.
- 제1항에 있어서,상기 2차 소성 단계의 소성 온도는 상기 1차 소성 단계의 소성 온도보다 높은 질화물계 형광체의 제조 방법.
- 제1항에 있어서,상기 2차 소성 단계는 질소 및 수소 가스 분위기 하에서 이루어지는 질화물계 형광체의 제조 방법.
- M1-zEuzSiaObNc (M=Sr1-x-yBaxCay, 0≤x≤0.5, 0≤y≤0.2, 0<z≤0.3, 2≤a≤2.5, 1.5≤b≤2, 및 2≤c≤2.5)의 조성식으로 표시되는 형광체의 제조 방법으로서,M 전구체 및 제1 규소 전구체를 포함하는 제1 전구체 그룹을 혼합 및 소성하여 제1 소성 산물을 생성하는 제1 소성 단계, 및 Eu 전구체 및 제2 규소 전구체를 포함하는 제2 전구체 그룹을 혼합 및 소성하여 제2 소성 산물을 생성하는 제2 소성 단계를 포함하는 1차 소성 단계; 및상기 제1 소성 산물 및 상기 제2 소성 산물을 혼합 및 소성하는 2차 소성 단계를 포함하는 질화물계 형광체의 제조 방법.
- 제5항에 있어서,상기 제1 소성 단계는 MCO3 및 SiO2를 포함하는 제1 전구체 그룹을 혼합 및 소성하여 제1 소성 산물을 생성하는 제1 소성 단계, 및 Eu2O3, SiO2 및 Si3N4를 포함하는 제2 전구체 그룹을 혼합 및 소성하여 제2 소성 산물을 생성하는 단계인 질화물계 형광체의 제조 방법.
- 제5항에 있어서,상기 제1 소성 단계는 900℃ 내지 1300℃의 온도 하에서 이루어지는 질화물계 형광체의 제조 방법.
- 제5항에 있어서,상기 제2 소성 단계는 1200℃ 내지 1400℃의 온도 하에서 이루어지는 질화물계 형광체의 제조 방법.
- 제5항에 있어서,상기 2차 소성 단계에서 질화규소 화합물을 더 첨가하는 질화물계 형광체의 제조 방법.
- 제6항에 있어서,상기 2차 소성 단계에서 Si3N4를 더 첨가하는 질화물계 형광체의 제조 방법.
- 제5항에 있어서,제2 소성 단계에서 NH4A (A는 F및 Cl 중 적어도 하나의 원소임), KB2 (K는 Ca, Sr 및 Ba 중 적어도 하나의 원소이고, B는 F 및 Cl 중 적어도 하나의 원소임), 및 LB (L은 Na 및 K 중 적어도 하나의 원소이고, B는 F 및 Cl 중 적어도 하나의 원소임) 중 적어도 하나의 화합물이 첨가되는 질화물계 형광체의 제조 방법.
- 제5항에 있어서,상기 2차 소성 단계는 질소 및 수소 가스 분위기 하에서 이루어지는 질화물계 형광체의 제조 방법.
- 제5항에 있어서,상기 2차 소성 단계는 1300℃ 내지 1600℃의 온도 하에서 이루어지는 질화물계 형광체의 제조 방법.
- 제5항에 있어서,상기 제1 소성 산물은 2종 이상의 M 이온으로 이루어진 고용체를 포함하는 질화물계 형광체의 제조 방법.
- 제5항에 있어서,상기 제2 소성 산물은 EuSi2O2N2를 포함하는 질화물계 형광체의 제조 방법.
- M1-zEuzSiaObNc (M=Sr1-x-yBaxCay, 0≤x≤0.5, 0≤y≤0.2, 0<z≤0.3, 2≤a≤2.5, 1.5≤b≤2, 및 2≤c≤2.5)의 조성식으로 표시되는 단일상의 형광체로서, O/N > 1인 원자비율을 갖는 산질화물이 전체 형광체 대비 1몰% 이하인 질화물계 형광체.
- 제16항에 있어서,LED 구동 시 150℃ 내지 200℃의 온도 조건에서, 상온 발광 강도의 적어도 80% 이상의 발광 강도를 갖는 질화물계 형광체.
- 파장 변환 물질인 황색 형광체로서, M1-zEuzSiaObNc (M=Sr1-x-yBaxCay, 0≤x≤0.5, 0≤y≤0.2, 0<z≤0.3, 2≤a≤2.5, 1.5≤b≤2, 및 2≤c≤2.5)의 조성식으로 표시되고, O/N > 1인 원자비율을 갖는 산질화물이 전체 형광체 대비 1몰% 이하인 단일상의 질화물계 형광체를 포함하는 백색 발광 다이오드.
- 제18항에 있어서,150℃ 내지 200℃의 온도 조건에서, 상온 발광 강도의 적어도 80% 이상의 발광 강도를 갖는 백색 발광 다이오드.
- M1-nEunSiaObNc (M=Sr1-mBam, 0.25<m≤0.3, 0<m×(1-n)<0.25, 2≤a≤2.5, 1.5≤b≤2, 및 2≤c≤2.5)의 조성식으로 표시되는 단일상의 형광체로서, O/N > 1인 원자비율을 갖는 산질화물이 전체 형광체 대비 0.01몰% 이하인 질화물계 형광체.
- 제20항에 있어서,상기 형광체는, 삼사정(triclinic)의 결정계 및 P1의 공간군(space group)을 갖는 질화물계 형광체.
- 제20항에 있어서,상기 형광체는, Sr-Eu 계 또는 Sr-Ba-Eu 계에서 완전 고용체(solid solution)을 형성하는 질화물계 형광체.
- 제20항에 있어서,상기 형광체의 X선 회절 패턴(XRD)에서, 강도(intensity)가 높은 3개의 회절 피크에 대하여 회절각이 각각 12.50≤2θ≤12.60, 25.16≤2θ≤25.30, 31.51≤2θ≤31.65의 범위를 갖는 질화물계 형광체.
- 제20항에 있어서,상기 형광체는, 460 ~ 750 nm의 발광 파장 범위를 갖는 질화물계 형광체.
- M1-nEunSiaObNc (M=Sr1-mBam, 0.6≤m≤0.8, 0.5≤m×(1-n)<0.65, 2≤a≤2.5, 1.5≤b≤2, 및 2≤c≤2.5)의 조성식으로 표시되는 단일상의 형광체로서, O/N > 1인 원자비율을 갖는 산질화물이 전체 형광체 대비 0.01몰% 이하인 질화물계 형광체.
- 제25항에 있어서,상기 형광체는, 삼사정(triclinic)의 결정계 및 P1의 공간군(space group)을 갖는 질화물계 형광체.
- 제25항에 있어서,상기 형광체는, Sr-Ba-Eu 계에서 완전 고용체(solid solution)을 형성하는 질화물계 형광체.
- 제25항에 있어서,상기 형광체의 X선 회절 패턴(XRD)에서, 강도(intensity)가 높은 4개의 회절 피크에 대하여 회절각이 각각 12.30≤2θ≤12.38, 24.75≤2θ≤24.88, 25.56≤2θ≤25.62, 31.09≤2θ≤31.25의 범위를 갖는 질화물계 형광체.
- 제25항에 있어서,상기 형광체는, 465 ~ 765 nm의 발광 파장 범위를 갖는 질화물계 형광체.
- M1-nEunSiaObNc (M=Sr1-mBam, 0.3≤m≤0.6, 0.25≤m×(1-n)<0.5, 2≤a≤2.5, 1.5≤b≤2, 및 2≤c≤2.5)인 출발 조성으로부터 생성되는 혼합상 형광체로서, O/N > 1인 원자비율을 갖는 산질화물이 전체 형광체 대비 0.01몰% 이하인 질화물계 형광체.
- 제30항에 있어서,상기 형광체는, 삼사정(triclinic)의 결정계 및 P1의 공간군(space group)을 가지는 서로 다른 2개의 상을 포함하는 질화물계 형광체.
- 제30항에 있어서,상기 형광체는, Sr-Ba-Eu 계에서 완전 고용체(solid solution)을 형성하는 서로 다른 2개의 상을 포함하는 질화물계 형광체.
- 제32항에 있어서,상기 형광체의 X선 회절 패턴(XRD)에서, 상기 제1상은 강도(intensity)가 높은 3개의 회절 피크에 대하여 회절각이 각각 12.47≤2θ≤12.49, 25.13≤2θ≤25.15, 31.48≤2θ≤31.50의 범위를 가지며,상기 제2상은 강도(intensity)가 높은 3개의 회절 피크에 대하여 회절각이 각각 12.39≤2θ≤12.45, 24.89≤2θ≤24.95, 31.26≤2θ≤31.41의 범위를 갖는 질화물계 형광체.
- 제30항에 있어서,상기 형광체는, 460 ~ 760 nm의 발광 파장 범위를 갖는 질화물계 형광체.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/825,098 US9127204B2 (en) | 2010-09-27 | 2011-09-27 | Fluorescent substance and method for preparing same |
CN201180056644.7A CN103347981B (zh) | 2010-09-27 | 2011-09-27 | 荧光物质及其制备方法 |
DE201111103236 DE112011103236T8 (de) | 2010-09-27 | 2011-09-27 | Fluoreszierende Substanz und Verfahren zum Bereitstellen derselben |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2010-0093200 | 2010-09-27 | ||
KR20100093200A KR101225002B1 (ko) | 2010-09-27 | 2010-09-27 | 형광체 및 이의 제조방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2012044026A2 true WO2012044026A2 (ko) | 2012-04-05 |
WO2012044026A3 WO2012044026A3 (ko) | 2012-07-19 |
Family
ID=45893624
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/KR2011/007072 WO2012044026A2 (ko) | 2010-09-27 | 2011-09-27 | 형광체 및 이의 제조방법 |
Country Status (6)
Country | Link |
---|---|
US (1) | US9127204B2 (ko) |
KR (1) | KR101225002B1 (ko) |
CN (1) | CN103347981B (ko) |
DE (1) | DE112011103236T8 (ko) |
TW (1) | TWI449769B (ko) |
WO (1) | WO2012044026A2 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20140097744A1 (en) * | 2012-10-09 | 2014-04-10 | Shunichi Kubota | Phosphor and light emitting device |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102000987B1 (ko) * | 2011-05-17 | 2019-07-17 | 삼성전자주식회사 | 다중 무선 전력 전송을 수행하기 위한 전력 송수신 장치 및 방법 |
KR101972777B1 (ko) * | 2012-05-08 | 2019-04-26 | 엘지이노텍 주식회사 | 산질화물 형광체 및 그를 포함한 발광소자 패키지 |
TWI498599B (zh) * | 2013-11-05 | 2015-09-01 | 製造低溫玻璃螢光體透鏡之方法及以此方法製成之透鏡 | |
CN104232088B (zh) * | 2014-09-03 | 2016-05-11 | 江门市科恒实业股份有限公司 | 一种氮氧化物荧光粉及其制备方法 |
KR20170056826A (ko) * | 2015-11-16 | 2017-05-24 | (주)라이타이저코리아 | 삼차원 형광층 제조 방법 |
WO2022134040A1 (zh) * | 2020-12-25 | 2022-06-30 | 苏州君诺新材科技有限公司 | 一种eu2+离子掺杂钇铝石榴石结构荧光粉的制备方法 |
DE102021132004A1 (de) * | 2021-12-06 | 2023-06-07 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Leuchtstoff, leuchtstoffmischung, verfahren zur herstellung eines leuchtstoffs und strahlungsemittierendes bauelement |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20070021140A (ko) * | 2004-03-12 | 2007-02-22 | 도쿠리츠교세이호징 붓시쯔 자이료 겐큐키코 | 형광체와 그 제조방법, 조명기구, 및 화상표시장치 |
US20080048151A1 (en) * | 2004-09-09 | 2008-02-28 | Showa Denko K.K. | Oxynitride-Based Fluorescent Material And Method For Production Thereof |
KR20090019677A (ko) * | 2007-08-21 | 2009-02-25 | 삼성전기주식회사 | 옥시 나이트라이드 형광체, 이를 포함하는 백색 발광 소자및 형광체 제조 방법. |
KR100896032B1 (ko) * | 2005-05-30 | 2009-05-11 | 네모또 도꾸슈 가가꾸 가부시키가이샤 | 녹색계 발광 형광체 |
WO2009104651A1 (ja) * | 2008-02-18 | 2009-08-27 | 株式会社小糸製作所 | 白色発光装置及びこれを用いた車両用灯具 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6632379B2 (en) | 2001-06-07 | 2003-10-14 | National Institute For Materials Science | Oxynitride phosphor activated by a rare earth element, and sialon type phosphor |
WO2005031797A2 (de) * | 2003-09-24 | 2005-04-07 | Patent-Treuhand- Gesellschaft Für Elektrische Glühlampen Mbh | Weiss emittierende led mit definierter farbtemperatur |
WO2005030903A1 (de) * | 2003-09-24 | 2005-04-07 | Patent-Treuhand- Gesellschaft Für Elektrische Glühlampen Mbh | Hocheffizientes beleuchtungssystem auf led-basis mit verbesserter farbwiedergabe |
JP2006077079A (ja) | 2004-09-08 | 2006-03-23 | Konica Minolta Medical & Graphic Inc | 蛍光体の製造方法及び蛍光体並びにプラズマディスプレイパネル |
JP2007177010A (ja) | 2005-12-27 | 2007-07-12 | Konica Minolta Medical & Graphic Inc | コア/シェル型の微粒子蛍光体とその製造方法 |
KR101141864B1 (ko) | 2008-03-18 | 2012-05-08 | 성균관대학교산학협력단 | 산질화물 형광체의 소성 장치를 이용한 산질화물 형광체의제조방법 |
-
2010
- 2010-09-27 KR KR20100093200A patent/KR101225002B1/ko active IP Right Grant
-
2011
- 2011-09-27 WO PCT/KR2011/007072 patent/WO2012044026A2/ko active Application Filing
- 2011-09-27 CN CN201180056644.7A patent/CN103347981B/zh active Active
- 2011-09-27 TW TW100134731A patent/TWI449769B/zh active
- 2011-09-27 US US13/825,098 patent/US9127204B2/en active Active
- 2011-09-27 DE DE201111103236 patent/DE112011103236T8/de active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20070021140A (ko) * | 2004-03-12 | 2007-02-22 | 도쿠리츠교세이호징 붓시쯔 자이료 겐큐키코 | 형광체와 그 제조방법, 조명기구, 및 화상표시장치 |
US20080048151A1 (en) * | 2004-09-09 | 2008-02-28 | Showa Denko K.K. | Oxynitride-Based Fluorescent Material And Method For Production Thereof |
KR100896032B1 (ko) * | 2005-05-30 | 2009-05-11 | 네모또 도꾸슈 가가꾸 가부시키가이샤 | 녹색계 발광 형광체 |
KR20090019677A (ko) * | 2007-08-21 | 2009-02-25 | 삼성전기주식회사 | 옥시 나이트라이드 형광체, 이를 포함하는 백색 발광 소자및 형광체 제조 방법. |
WO2009104651A1 (ja) * | 2008-02-18 | 2009-08-27 | 株式会社小糸製作所 | 白色発光装置及びこれを用いた車両用灯具 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20140097744A1 (en) * | 2012-10-09 | 2014-04-10 | Shunichi Kubota | Phosphor and light emitting device |
US9303206B2 (en) * | 2012-10-09 | 2016-04-05 | Lg Innotek Co., Ltd. | Phosphor and light emitting device |
Also Published As
Publication number | Publication date |
---|---|
US9127204B2 (en) | 2015-09-08 |
CN103347981B (zh) | 2015-09-16 |
KR101225002B1 (ko) | 2013-01-22 |
KR20120031672A (ko) | 2012-04-04 |
CN103347981A (zh) | 2013-10-09 |
DE112011103236T8 (de) | 2013-10-17 |
US20130264597A1 (en) | 2013-10-10 |
TW201221625A (en) | 2012-06-01 |
DE112011103236T5 (de) | 2013-08-14 |
WO2012044026A3 (ko) | 2012-07-19 |
TWI449769B (zh) | 2014-08-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2012044026A2 (ko) | 형광체 및 이의 제조방법 | |
US8222805B2 (en) | Oxynitride luminescent material, preparation method and its applications | |
US7253446B2 (en) | Light emitting device and illumination apparatus | |
KR101108975B1 (ko) | 발광 디바이스 및 조명장치 | |
Xie et al. | Silicon-based oxynitride and nitride phosphors for white LEDs—A review | |
TWI407474B (zh) | 陶瓷冷光轉換器及包含該轉換器之照明系統 | |
WO2011034226A1 (ko) | 산질화물 형광체, 그 제조방법 및 발광장치 | |
CN101117576B (zh) | 一种氮氧化合物发光材料及其所制成的照明或显示光源 | |
KR20080059418A (ko) | 고상 조명용 질화 및 산질화 세륨계 형광물질들 | |
TW200307033A (en) | A phosphor for white LED and a white LED | |
WO2012039566A2 (ko) | 사이알론 형광체, 그 제조방법 및 이를 이용한 발광소자 패키지 | |
KR100911001B1 (ko) | 백색 발광 다이오드용 신규 형광체 및 그 제조방법 | |
KR20150016252A (ko) | 실리케이트 인광체 | |
KR101484428B1 (ko) | 질소 화합물 발광 재료, 그 제조 방법 및 이로부터 제조된 조명 광원 | |
KR101496718B1 (ko) | 형광체 및 발광소자 | |
KR20090012082A (ko) | 신규 형광체 및 이의 제조 | |
EP3015530B1 (en) | Fluorescent powder and light emitting apparatus comprising same | |
JP2016516860A (ja) | 酸窒化物の発光材、製造方法及びそれから製造されたled光源 | |
WO2011083885A1 (ko) | 산황화물계 적색 형광체 및 이를 이용한 백색 led와 led패키지 | |
WO2011004961A2 (en) | Light emitting device employing luminescent substances with oxyorthosilicate luminophores | |
WO2012111929A2 (ko) | 형광체 및 이의 제조방법 | |
CN110846034B (zh) | Dy3+激活荧光粉及其制备方法 | |
WO2013058478A1 (ko) | 산화물계 녹색 형광체 및 그의 제조방법 및 이를 이용한 백색 led | |
KR20000049728A (ko) | 백색발광소자용 야그계 황색 형광체의 제조방법 | |
CN113930244A (zh) | 一种发光材料、其制备方法及其应用 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 11829532 Country of ref document: EP Kind code of ref document: A2 |
|
WWE | Wipo information: entry into national phase |
Ref document number: 1120111032366 Country of ref document: DE Ref document number: 112011103236 Country of ref document: DE |
|
WWE | Wipo information: entry into national phase |
Ref document number: 13825098 Country of ref document: US |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 11829532 Country of ref document: EP Kind code of ref document: A2 |