WO2011162186A1 - 画像生成装置 - Google Patents
画像生成装置 Download PDFInfo
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- WO2011162186A1 WO2011162186A1 PCT/JP2011/063973 JP2011063973W WO2011162186A1 WO 2011162186 A1 WO2011162186 A1 WO 2011162186A1 JP 2011063973 W JP2011063973 W JP 2011063973W WO 2011162186 A1 WO2011162186 A1 WO 2011162186A1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N7/00—Television systems
- H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
Definitions
- the present invention relates to an image generation apparatus that generates an image by irradiating a measured object with spatially modulated light.
- Patent Document 1 describes an optical device that irradiates a sample with light from a light source device through a diffraction grating and captures a sample image at that time with a CCD camera.
- this light source device obtains a plurality of modulated images by capturing images while moving the diffraction grating at a constant speed in a direction perpendicular to the fringes of the diffraction grating, and then image-processing those modulated images. Form an image.
- Patent Document 2 also discloses a microscope apparatus in which an SLM (Spatial Light Modulator) is arranged in an optical path of illumination light in order to irradiate a sample with spatially modulated light. According to such a configuration, no means for moving the diffraction grating is required.
- SLM Spatial Light Modulator
- the present invention has been made in view of such problems, and an object thereof is to provide an image generation apparatus capable of quickly obtaining high-resolution images in various positions and directions with a simple apparatus configuration. .
- an image generation apparatus is an image generation apparatus that generates an image of an object to be measured, and modulates the intensity of a laser light source that emits laser light and a laser light source. Control the laser modulator, the laser scanning unit that scans the irradiation position of the laser light on the object to be measured, and the laser modulating unit and the laser scanning unit so that the object to be measured is irradiated with illumination light of a plurality of spatial modulation patterns.
- a control unit that captures the observation light emitted from the object to be measured in response to illumination light irradiation with a plurality of spatial modulation patterns, and obtains a plurality of pattern images, and a plurality of patterns acquired by the imaging unit
- An image processing unit that generates a high-resolution image of the object to be measured using the image.
- the intensity of the laser light emitted from the laser light source is modulated by the laser modulation unit, and at the same time, the irradiation position on the object to be measured is scanned by the laser scanning unit. Irradiates an object to be measured such as a device or biological sample.
- the control unit controls the laser modulation unit and the laser scanning unit so that illumination light of a plurality of spatial modulation patterns is irradiated onto the object to be measured, and a plurality of pattern images emitted from the object to be measured by the imaging unit.
- the image processing unit After being imaged, the image processing unit generates a high-resolution image using a plurality of pattern images.
- the phase and direction of the spatial modulation pattern of the illumination light irradiated onto the object to be measured can be easily changed, and a high-resolution image with a desired position and orientation can be quickly obtained.
- FIG. 1 is a block diagram illustrating a configuration of an image generation device according to a first embodiment of the present invention. It is a conceptual diagram which shows the spatial modulation pattern of the illumination light prescribed
- FIG. 1 is a block diagram showing a configuration of an image generation apparatus 1 according to the first embodiment of the present invention.
- An image generating apparatus 1 shown in FIG. 1 irradiates an object to be measured such as a semiconductor device with illumination light having a plurality of spatial modulation patterns, and a plurality of reflected images (observation images) emitted from the object to be measured A in response thereto.
- the image generation apparatus 1 includes a laser light source 3 that emits laser light, a laser scanner (laser scanning unit) 5, an imaging device (imaging unit) 7 that captures a reflected image of the object A, and a laser light source 3. Of the laser beam to the object A to be measured, and an optical system 9 for forming a reflected image of the object A to be measured on the imaging device 7 and a laser output for controlling the output intensity of the laser light source 3.
- An image capturing unit 17 that captures data and an image data calculation unit (image processing unit) 19 that processes the image data captured by the image capturing unit 17 are provided.
- the optical system 9 includes a relay lens 21, a light separation unit 23, an objective lens 25, and an imaging lens 27.
- the relay lens 21 is an optical system that efficiently guides the laser light whose irradiation angle is changed by the laser scanner 5 to the objective lens 25, and projects the exit pupil of the objective lens 25 onto the reflection surface of the laser scanner 5.
- the laser beam reflected by the laser scanner 5 has a role of reliably reaching the objective lens 25.
- the laser light source 3, the laser scanner 5, and the relay lens 21 guide laser scanning means for scanning the laser light, and the light separation unit 23 and the objective lens 25 guide the laser light toward the object A to be measured.
- the light separating unit 23 is disposed between the laser scanner 5 and the DUT A on the optical path of the illumination light.
- the light separation unit 23 transmits observation light such as reflected light and scattered light from the object A to be measured and guides the light to the imaging device 7 through the imaging lens 27 and at the same time reflects the laser light from the laser scanner 5. Then, the reflected light and scattered light from the measured object A are prevented from being imaged on the imaging device 7 via the laser scanner 5 which is a laser scanning unit by being guided to the measured object A via the objective lens 25. ing. Accordingly, the observation light is incident on the light receiving position of the imaging device 7 corresponding to the irradiation position of the laser beam of the object A to be measured scanned by the laser scanning means.
- a half mirror having a reflectance and a transmittance of 1: 1, or a beam splitter having a predetermined relationship such as 8: 2 is used.
- a polarization beam splitter can be used as the light separation unit 23.
- a quarter wavelength plate is inserted between the polarizing beam splitter and the objective lens 25.
- the laser scanner 5 is an optical device that scans the irradiation position two-dimensionally by changing the traveling direction of the laser light. In other words, the laser scanner 5 changes the incident angle of the laser light incident on the relay lens 21 to change the irradiation position of the laser light irradiated through the optical system 9 on the surface of the object A to be measured. Scan in two dimensions.
- a galvanometer mirror having two mirrors whose rotation axes are orthogonal to each other and whose rotation angles can be electrically controlled can be used.
- a polygon mirror a MEMS (Micro Electro Mechanical System) mirror, an AOD (acousto-optic deflector), a resonant scanner (resonant galvanometer scanner), an EO scanner (electro-optic light deflector), etc. are employed.
- a MEMS Micro Electro Mechanical System
- AOD acousto-optic deflector
- a resonant scanner resonant galvanometer scanner
- an EO scanner electro-optic light deflector
- the intensity of the laser light output from the laser light source 3 is configured to be modulated by a control signal from the laser output control unit 11 connected to the laser light source 3, and the laser light to be measured by the laser scanner 5 is measured.
- the irradiation position on the surface of the object A is configured to be changeable by a control signal from the scanner control unit 13 connected to the laser scanner 5.
- a modulation pattern control unit 15 is connected to the laser output control unit 11 and the scanner control unit 13, and the modulation pattern control unit 15 illuminates a plurality of spatial (two-dimensional) modulation patterns determined in advance on the object A to be measured.
- the laser output control unit 11 and the scanner control unit 13 are controlled so that light is emitted.
- the modulation pattern control unit 15 performs control so that the irradiation position of the laser beam is moved along the X-axis direction which is a predetermined direction along the plane of the object A to be measured.
- the irradiation intensity of the laser beam is modulated so that the intensity distribution in the axial direction periodically increases and decreases according to a trigonometric function (sin function or cos function).
- a trigonometric function sin function or cos function
- the strip-shaped irradiation pattern L1 periodically modulated with the width W1 along the X-axis direction is formed.
- the modulation pattern control unit 15 shifts the laser irradiation position in the direction along the Y axis perpendicular to the X axis, and then moves the laser light irradiation position in the X axis direction and modulates the laser light intensity.
- the formation of the strip-shaped irradiation pattern L1 is repeated under control. As a result, a spatial modulation pattern having a striped pattern with a desired pitch W1 along the Y-axis direction can be generated. Note that the intensity of the laser light may be modulated periodically by ON-OFF.
- the modulation pattern control unit 15 causes the laser beam intensity to gradually shift the spatial phase of the strip-shaped irradiation pattern L2 along the X axis between adjacent patterns in the Y axis direction. It is also possible to control the modulation. In this case, it is possible to generate a spatial modulation pattern that approximates a striped pattern having a desired pitch W2 that is inclined by a desired angle ⁇ 2 with respect to the Y-axis direction. Further, as shown in FIG. 4, the modulation pattern control unit 15 makes the irradiation intensity of the laser beam uniform during one scan of the laser beam along the X axis, and forms a plurality of strips arranged in the Y axis direction. It is also possible to control the irradiation intensity to be modulated between irradiation patterns. In this case, a spatial modulation pattern having a striped pattern with a desired pitch W3 along the X-axis direction can be generated.
- the imaging device 7 Since the imaging device 7 receives the observation light such as the reflected light at the light receiving position corresponding to the irradiation position of the laser light, the reflected image of the object A to be measured generated in response to the illumination light having the spatial modulation pattern as described above. Are picked up by the image pickup device 7 to obtain a two-dimensional pattern image.
- the pattern image acquired by the imaging device 7 is captured by the image capturing unit 17.
- the image capturing unit 17 is connected to the imaging device 7 and the modulation pattern control unit 15, and the modulation pattern control unit 15 forms a spatial modulation pattern once on the surface of the object A to be measured, and one two-dimensional image.
- the exposure timing by the imaging device 7 is controlled so that the exposure period (imaging period) of the pattern image is synchronized.
- the image capturing unit 17 displays the reflected images generated by the entire illumination light of the respective spatial modulation patterns.
- the exposure timing is controlled so as to acquire separate two-dimensional pattern images by exposure and integration.
- the pattern image captured by the image capturing unit 17 is subjected to image processing by the image data calculation unit 19.
- the image data calculation unit 19 irradiates the surface of the object A to be measured with a plurality of striped spatial modulation patterns along the Y-axis direction while changing the spatial phase at a desired frequency.
- the image data calculation unit 19 irradiates a plurality of spatial modulation patterns along the four directions while changing the spatial phase at a desired frequency, and synthesizes the high frequency components of the plurality of pattern images obtained at that time.
- the intensity of the laser light emitted from the laser light source 3 is modulated by the laser output control unit 11, and at the same time the irradiation position of the object A to be measured by the laser scanner 5.
- the object to be measured A is irradiated while being scanned.
- the modulation pattern control unit 15 controls the laser output control unit 11 and the laser scanner 5 so that illumination light of a plurality of spatial modulation patterns is irradiated on the measurement object A, and the measurement object A is measured by the imaging device 7.
- a high resolution image is generated by the image data calculation unit 19 using the plurality of pattern images.
- a high-resolution image of the object A can be easily obtained without requiring a complicated driving mechanism for driving a diffraction grating or the like. That is, in this embodiment, it is only necessary to mount a simple optical system and a laser scanner.
- the phase and orientation of the spatial modulation pattern of the illumination light applied to the object to be measured can be easily changed by the control of the modulation pattern control unit 15 to quickly obtain a high-resolution image at a desired position and orientation. be able to.
- SLM Surface Light Modulator
- the number of stripes at the resolution limit ⁇ 3 the number of pixels in the uniaxial direction is required.
- the resolution is increased, only the stripes in the two directions in the X and Y axis directions perpendicular to each other are insufficient in the resolution in the oblique direction, and the stripes in the oblique direction are also required. It is necessary to create a stripe also in the 45 degree direction.
- the SLM pixels are square, it is not possible to create stripes with the same pitch in the diagonal direction, and the same pitch can be achieved by reducing the resolution by reducing the stripe pitch or by using an SLM with a larger number of pixels. Will do.
- the conventional apparatus requires an expensive SLM.
- light transmission / reflection loss in the SLM, loss at pixel joints, zero-order light, and higher-order light also occur.
- the object A to be measured causes two-photon absorption such as a fluorescent sample, and second harmonics (SHG, second harmonic generation).
- two-photon absorption such as a fluorescent sample
- SHG, second harmonic generation For those that show non-linear reactions, such as those that occur, these reactions are likely to occur because the intensity of the irradiation point is easily increased.
- observation using higher resolution is possible by using, for example, two-photon absorption.
- the resolution can be further increased.
- the light separation unit 23 since the light separation unit 23 is provided, it is possible to prevent the reflected image from the object A to be measured from returning to the laser scanner 5 side, so that the reflected image of the object A is detected as a wide range pattern image by the imaging device 7. be able to. Thereby, the high-resolution image of the to-be-measured object A can be obtained more reliably.
- the laser output control unit 11 modulates the intensity of the laser light so as to change according to the trigonometric function, it is easy to form a spatial modulation pattern.
- FIG. 5 is a block diagram showing a configuration of the image generation apparatus 101 according to the second embodiment of the present invention.
- the image generation apparatus 101 shown in FIG. 1 irradiates a measurement object such as a cell with a plurality of spatial modulation patterns of excitation light (illumination light) and emits a plurality of light emitted from the measurement object A accordingly.
- This is an apparatus for capturing fluorescent images (observation images) and obtaining a high-resolution image of the object to be measured based on the fluorescent images.
- the difference between the image generating apparatus 101 and the first embodiment is that the function of the light separating unit 123 is different and that a barrier filter 129 is provided between the light separating unit 123 and the imaging lens 27.
- the light separation unit 123 transmits the fluorescence from the object A to be measured and guides it to the imaging device 7 via the imaging lens 27, and at the same time reflects the laser light from the laser scanner 5 and passes through the objective lens 25. Then, by guiding the light to the object to be measured A, the fluorescence that is the observation light from the object to be measured A is prevented from being imaged on the imaging device 7 via the laser scanner 5 that is a laser scanning unit. Accordingly, the observation light is incident on the light receiving position of the imaging device 7 corresponding to the irradiation position of the laser beam of the object A to be measured scanned by the laser scanning means.
- a dichroic mirror that separates excitation light having a predetermined wavelength component and fluorescence having a longer wavelength than the wavelength component of the excitation light is used.
- This dichroic mirror has a function of reflecting excitation light incident from the laser scanner 5 toward the objective lens 25 and transmitting fluorescence generated from the object A to be measured, and has optical characteristics of short wavelength reflection and long wavelength transmission. It is a mirror containing the dielectric multilayer film which has these.
- the barrier filter 129 cuts the excitation light so that the excitation light does not reach the imaging device 7 when the imaging device 7 captures the pattern image.
- This barrier filter absorbs and reflects the wavelength component of the excitation light, cuts it off and transmits the wavelength component of the fluorescence, and transmits only the wavelength component of the fluorescence. It is a band pass filter to be made.
- a high-resolution image of the object to be measured A can be easily acquired even when the object to be measured that generates fluorescence such as cells is used as an observation target.
- the phase and orientation of the spatial modulation pattern of the illumination light applied to the object to be measured can be easily changed by the control of the modulation pattern control unit 15 to quickly obtain a high-resolution image at a desired position and orientation. be able to.
- a configuration as shown in FIG. 6 may be adopted as the configuration of the optical system for guiding the illumination light.
- an axicon 201 and a converter lens 202 may be inserted between the laser light source 3 and the laser scanner 5.
- the axicon 201 is a conical prism, and is an optical element that converts a parallel beam having a circular cross section emitted from the laser light source 3 into a beam having a ring cross section.
- the converter lens 202 is a lens that projects a ring-shaped beam emitted from the axicon 201 onto the laser scanner 5 in a circumferential shape.
- the laser light source 3 of the image generation apparatus 101 as shown in FIG. 7, a configuration capable of observing the two-photon excitation in the object A to be measured may be employed. Specifically, a configuration comprising an ultrashort pulse laser laser 3 a and a laser modulator 3 b that modulates the output is adopted as the laser light source 3, and a desired wavelength component from the laser light between the laser light source 3 and the laser scanner 5.
- An excitation wavelength selection filter 301 for selecting is inserted.
- Two-photon excitation is a phenomenon in which electrons are excited by two photons having a wavelength twice that of the original excitation light to emit fluorescence. Therefore, the excitation wavelength selection filter 301 functions to transmit light having a wavelength twice that of the excitation wavelength of the fluorescent sample.
- the light separation unit 23 reflects the long-wavelength excitation light incident from the laser scanner 5 side toward the objective lens 25 and transmits the short-wavelength fluorescence generated from the object A to be measured. Therefore, a dichroic mirror having a long function and having optical characteristics of long wavelength reflection and short wavelength transmission is used.
- the barrier filter 129 has a property of cutting by absorbing and reflecting the long wavelength component of the excitation light and transmitting the short wavelength component of the fluorescence, and a low-pass filter having a short wavelength transmission property or a fluorescent filter. A bandpass filter that transmits only the wavelength component is used.
- a light separation unit that is provided between the laser scanning unit on the optical path of the illumination light and the object to be measured, and separates the observation light from the object to be measured from the optical path of the illumination light and guides it to the imaging unit.
- the observation light from the object to be measured can be detected as a wide range pattern image by the imaging unit.
- the observation light emitted from the object to be measured is configured to be imaged by the imaging unit without passing through the laser scanning unit. With this configuration, the observation light from the object to be measured can be detected as a two-dimensional pattern image.
- the imaging unit is controlled so that one imaging period of the pattern image is synchronized with one formation period of the spatial modulation pattern in the control unit. In this way, in the imaging unit, a plurality of pattern images corresponding to a plurality of spatial modulation patterns of illumination light can be easily separated and acquired.
- the image processing unit extracts interference fringe components between a plurality of spatial modulation patterns irradiated to the object to be measured and a spatial frequency of the structure of the object to be measured based on the plurality of pattern images acquired by the imaging unit.
- a high-resolution image having a desired position and orientation can be efficiently obtained by changing the phase and orientation of the spatial modulation pattern of the illumination light applied to the object to be measured.
- the laser modulator modulates the intensity of the laser light so as to change according to a trigonometric function. If such a laser modulation unit is provided, it is easy to form a spatial modulation pattern.
- control unit forms different spatial modulation patterns by changing the phase and frequency of the trigonometric function. In this way, it becomes easy to form spatial modulation patterns having various pitches and phases.
- the present invention uses an image generation apparatus that generates an image by irradiating a measured object with spatially modulated light, and can quickly obtain high-resolution images in various positions and directions with a simple apparatus configuration. Is.
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Abstract
Description
図1は、本発明の第1実施形態に係る画像生成装置1の構成を示すブロック図である。図1に示す画像生成装置1は、半導体デバイス等の被測定物に対して複数の空間変調パターンの照明光を照射し、それに応じて被測定物Aから発せられる複数の反射像(観察像)を撮像し、それらの反射像を基にして被測定物の高解像度像を得るための装置である。この画像生成装置1は、レーザ光を出射するレーザ光源3と、レーザスキャナ(レーザ走査部)5と、被測定物Aの反射像を撮像する撮像装置(撮像部)7と、レーザ光源3からのレーザ光を被測定物Aに向けて導光し、また、被測定物Aの反射像を撮像装置7に結像させるための光学系9と、レーザ光源3の出力強度を制御するレーザ出力制御部(レーザ変調部)11と、レーザスキャナ5の動作を制御するスキャナ制御部13と、被測定物Aに照射される空間変調パターンを制御する変調パターン制御部15と、撮像装置7から画像データを取り込む画像取込部17と、画像取込部17によって取り込まれた画像データを処理する画像データ演算部(画像処理部)19とを備えている。
図5は、本発明の第2実施形態に係る画像生成装置101の構成を示すブロック図である。同図に示す画像生成装置101は、細胞等の蛍光を発する被測定物に対して複数の空間変調パターンの励起光(照明光)を照射し、それに応じて被測定物Aから発せられる複数の蛍光像(観察像)を撮像し、それらの蛍光像を基にして被測定物の高解像度像を得るための装置である。この画像生成装置101の第1実施形態との相違点は、光分離部123の機能が異なる点と、光分離部123と結像レンズ27との間にバリアフィルタ129を備える点である。
Claims (7)
- 被測定物の画像を生成する画像生成装置であって、
レーザ光を出射するレーザ光源と、
前記レーザ光の強度を変調させるレーザ変調部と、
前記レーザ光の前記被測定物への照射位置を走査するレーザ走査部と、
前記被測定物に複数の空間変調パターンの照明光を照射するように、前記レーザ変調部及び前記レーザ走査部を制御する制御部と、
前記複数の空間変調パターンの照明光の照射に応じて前記被測定物から発せられる観察光を撮像して複数のパターン画像を取得する撮像部と、
前記撮像部によって取得された前記複数のパターン画像を用いて、前記被測定物の高解像度画像を生成する画像処理部と、
を備えることを特徴とする画像生成装置。 - 前記照明光の光路上の前記レーザ走査部と前記被測定物との間に設けられ、前記被測定物からの前記観察光を前記照明光の光路と分離して前記撮像部に導く光分離部を更に備える、
ことを特徴とする請求項1記載の画像生成装置。 - 前記被測定物から発せられる観察光が、レーザ走査部を介すことなく前記撮像部で撮像されるように構成されている、
ことを特徴とする請求項1又は2記載の画像生成装置。 - 前記撮像部は、パターン画像の1回の撮像期間が、前記制御部における前記空間変調パターンの1回の形成期間と同期するように制御される、
ことを特徴とする請求項1~3のいずれか1項に記載の画像生成装置。 - 画像処理部は、前記撮像部によって取得された前記複数のパターン画像をもとに、前記被測定物に照射された前記複数の空間変調パターンと前記被測定物の構造の空間周波数との干渉縞成分を抽出することで、前記パターン画像の高周波数成分を低周波数成分に落とした低周波数パターン画像を生成し、前記低周波数パターン画像の干渉縞成分に基づいて、前記高解像度画像を生成する、
ことを特徴とする請求項1~4のいずれか1項に記載の画像生成装置。 - 前記レーザ変調部は、前記レーザ光の強度を三角関数に従って変化するように変調させる、
ことを特徴とする請求項1~5のいずれか1項に記載の画像生成装置。 - 前記制御部は、三角関数の位相および周波数を変化させることで、異なる空間変調パターンを形成すること、
ことを特徴とする請求項6記載の画像生成装置。
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EP11798070.6A EP2587297A4 (en) | 2010-06-23 | 2011-06-17 | IMAGE GENERATING DEVICE |
KR1020127033466A KR20130113343A (ko) | 2010-06-23 | 2011-06-17 | 화상 생성 장치 |
CN2011800309039A CN102985866A (zh) | 2010-06-23 | 2011-06-17 | 图像生成装置 |
US13/806,476 US20130100283A1 (en) | 2010-06-23 | 2011-06-17 | Image generation device |
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JP2010142879A JP2012008260A (ja) | 2010-06-23 | 2010-06-23 | 画像生成装置 |
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JP3731073B2 (ja) * | 2002-09-17 | 2006-01-05 | 独立行政法人理化学研究所 | 顕微鏡装置 |
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2011
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- 2011-06-17 WO PCT/JP2011/063973 patent/WO2011162186A1/ja active Application Filing
- 2011-06-17 KR KR1020127033466A patent/KR20130113343A/ko not_active Application Discontinuation
- 2011-06-17 US US13/806,476 patent/US20130100283A1/en not_active Abandoned
- 2011-06-17 EP EP11798070.6A patent/EP2587297A4/en not_active Withdrawn
- 2011-06-23 TW TW100122055A patent/TW201213848A/zh unknown
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JP2001117010A (ja) | 1999-10-21 | 2001-04-27 | Olympus Optical Co Ltd | 光学装置 |
JP2009510499A (ja) * | 2005-09-29 | 2009-03-12 | カール ツァイス マイクロイメージング ゲーエムベーハー | 対象物の画像を生成するための装置および方法 |
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Cited By (3)
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EP2685736A3 (en) * | 2012-07-13 | 2017-04-19 | Boe Technology Group Co. Ltd. | Spatial stereoscopic display device and operating method thereof |
CN110007453A (zh) * | 2019-05-13 | 2019-07-12 | 中国科学院生物物理研究所 | 一种多照明模式的荧光信号测量装置及其测量方法和应用 |
CN110007453B (zh) * | 2019-05-13 | 2023-11-21 | 中国科学院生物物理研究所 | 一种多照明模式的荧光信号测量装置及其测量方法和应用 |
Also Published As
Publication number | Publication date |
---|---|
EP2587297A4 (en) | 2014-08-13 |
EP2587297A1 (en) | 2013-05-01 |
US20130100283A1 (en) | 2013-04-25 |
KR20130113343A (ko) | 2013-10-15 |
TW201213848A (en) | 2012-04-01 |
JP2012008260A (ja) | 2012-01-12 |
CN102985866A (zh) | 2013-03-20 |
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