WO2011064940A1 - 炭素電極および多結晶シリコン棒の製造装置 - Google Patents
炭素電極および多結晶シリコン棒の製造装置 Download PDFInfo
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- WO2011064940A1 WO2011064940A1 PCT/JP2010/006270 JP2010006270W WO2011064940A1 WO 2011064940 A1 WO2011064940 A1 WO 2011064940A1 JP 2010006270 W JP2010006270 W JP 2010006270W WO 2011064940 A1 WO2011064940 A1 WO 2011064940A1
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- electrode
- rod
- core wire
- polycrystalline silicon
- carbon
- Prior art date
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B32/00—Carbon; Compounds thereof
- C01B32/20—Graphite
- C01B32/21—After-treatment
- C01B32/22—Intercalation
- C01B32/225—Expansion; Exfoliation
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B33/00—Silicon; Compounds thereof
- C01B33/02—Silicon
- C01B33/021—Preparation
- C01B33/027—Preparation by decomposition or reduction of gaseous or vaporised silicon compounds other than silica or silica-containing material
- C01B33/035—Preparation by decomposition or reduction of gaseous or vaporised silicon compounds other than silica or silica-containing material by decomposition or reduction of gaseous or vaporised silicon compounds in the presence of heated filaments of silicon, carbon or a refractory metal, e.g. tantalum or tungsten, or in the presence of heated silicon rods on which the formed silicon is deposited, a silicon rod being obtained, e.g. Siemens process
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/24—Deposition of silicon only
Definitions
- the present invention relates to a carbon electrode used for producing polycrystalline silicon and a polycrystalline silicon rod producing apparatus using the carbon electrode.
- Siemens method is known as a method for producing polycrystalline silicon which is a raw material of single crystal silicon for semiconductor production or silicon for solar cell production.
- the Siemens method is a method in which a source gas containing chlorosilane is brought into contact with a heated silicon core wire, and polycrystalline silicon is vapor-phase grown on the surface of the silicon core wire using a CVD (Chemical Vapor Deposition) method.
- CVD Chemical Vapor Deposition
- a mixed gas of, for example, trichlorosilane and hydrogen is supplied as a source gas from the gas nozzle into the reactor.
- silicon vapor-phase grows on the silicon core wire, and a polycrystalline silicon rod having a desired diameter is formed in an inverted U shape. And after cooling the inside of the reactor, the polycrystalline silicon rod is taken out from the reactor.
- Patent Document 1 Japanese Patent Laid-Open No. 8-45847 (Patent Document 1) includes at least one spring element disposed between a current lead portion (metal electrode) and an electrode holder (a holder for a core wire holder), and the spring element Proposes a carrier member (core wire) fixture that allows and absorbs movement of the electrode holder relative to the current lead.
- a current lead portion metal electrode
- an electrode holder a holder for a core wire holder
- the spring element Proposes a carrier member (core wire) fixture that allows and absorbs movement of the electrode holder relative to the current lead.
- Patent Document 2 Japanese Patent Laid-Open No. 2006-16243 (Patent Document 2) is a seed holding electrode including a carbon seed holder and a metal electrode, and the seed holder and the metal electrode are fitted with a tapered shape.
- a seed holding electrode that has a bonded structure and is bonded by sliding a noble metal plate between them, a large amount of heat is generated due to thermal strain generated in the cooling process after the formation of polycrystalline silicon. It is proposed to prevent breakage of crystalline silicon or carbon parts used for seed holding electrodes.
- Patent Document 3 discloses that an end portion of a silicon core wire is electrically connected to an electrode through a conductive holder that holds the silicon core wire, and at least one holder is connected to an electrode surface.
- a carbon holder that is slidable in either the left or right direction of the straight line connecting the ends of at least the inverted U-shaped silicon core.
- both ends of the torii type silicon core wire are fixed to a pair of metal electrodes arranged on the base plate via a pair of core wire holders. Is done.
- both ends of an inverted U-shaped polycrystalline silicon rod hereinafter simply referred to as “U rod”
- U rod inverted U-shaped polycrystalline silicon rod
- expansion and contraction of the U rod in the horizontal plane direction is hindered.
- the expansion and contraction in the horizontal plane direction is, for example, expansion and contraction in a linear direction connecting both ends of the U rod.
- the expansion and contraction of the U rod in the horizontal plane direction is not limited to the linear direction connecting both ends of the U rod.
- the inner side tends to expand due to radiant heat from the U rod.
- the outer side of the U rod is cooled by the furnace wall of the reactor, the outer side tends to shrink. That is, the U rod can be expanded and contracted in all directions in the horizontal plane direction depending on the environment.
- the fixture disclosed in Patent Document 1 has a drawback that the structure of the fixture is complicated and the movement of the electrode holder is not allowed except in the direction of expansion and contraction of the spring element.
- the seed holding electrode disclosed in Patent Document 2 is expensive because it is used by sliding a noble metal plate, and the noble metal is easily taken into polycrystalline silicon.
- the seed holder since it is a taper-shaped fitting, at the time of expansion, the seed holder may slide up the taper and come out of the electrode.
- the carbon holder disclosed in Patent Document 3 the polycrystalline silicon rod can slide only in the linear direction connecting both ends of the silicon core wire. Therefore, these proposals are insufficient to suppress the occurrence of cracks and cracks in the polycrystalline silicon rod.
- the present invention has been made in view of such problems, and its object is to suppress the occurrence of cracks and cracks in the U rod that can expand and contract in all directions during the vapor phase growth process of a polycrystalline silicon rod.
- the purpose is to provide highly effective technology.
- a carbon electrode according to the present invention is a carbon electrode used for manufacturing a polycrystalline silicon rod, and is a lower electrode fixed on a metal electrode which is an external electrode for energizing a silicon core wire And an upper electrode placed on the lower electrode and provided with a fixing portion of a core wire holder for holding the silicon core wire on the upper surface side, the upper electrode being an upper surface of the lower electrode It is slidable in all directions within the mounting surface that is a contact surface with the head.
- the upper electrode has a hole that penetrates from the upper surface to the lower surface, the lower end of a rod-shaped fastening member inserted into the hole is fixed to the lower electrode, and the diameter of the hole is The diameter may be larger than the diameter of the straight body portion of the rod-shaped fastening member, and a gap may be provided between the straight body portion and the hole portion.
- the diameter of the hole is 1 mm or more larger than the diameter of the straight body.
- a convex portion provided above the lower electrode is inserted into a concave portion provided below the upper electrode, and the upper electrode is placed on the lower electrode,
- An inner dimension of the concave portion is larger than an outer dimension of the convex portion, and a gap may be provided between the concave portion and the convex portion.
- a convex portion provided at the lower portion of the upper electrode is inserted into a concave portion provided at the upper portion of the lower electrode, and the upper electrode is placed on the lower electrode.
- the inside dimension of the said recessed part is larger than the outside dimension of the said convex part, and it can also be set as the aspect by which the gap
- the gap between the concave portion and the convex portion is 1 mm or more.
- the upper electrode and the lower electrode are made of graphite.
- the coefficient of static friction at the contact surface between the upper electrode and the lower electrode is 0.3 or less.
- the polycrystalline silicon rod manufacturing apparatus is a polycrystalline silicon rod for vapor-phase growing polycrystalline silicon on the silicon core wire by supplying power from a pair of metal electrodes to both ends of the silicon core wire assembled in a torii type.
- both ends of the silicon core wire are respectively held by fixing portions provided on the carbon electrode, and at least one of the carbon electrodes is the carbon electrode according to the present invention described above.
- a hole is provided in the upper electrode and fixed to the lower electrode by inserting a rod-shaped fastening member into the hole, and between the hole and the straight body portion of the fastening member.
- the upper electrode can slide in all directions within the surface of the mounting surface which is a contact surface with the upper surface of the lower electrode.
- FIG. 1 is a schematic view showing a configuration example of a polycrystalline silicon rod manufacturing apparatus 100 according to the present invention.
- This manufacturing apparatus 100 is an apparatus for manufacturing a polycrystalline silicon rod by vapor-phase growing polycrystalline silicon on the surface of a silicon core wire by the Siemens method.
- the manufacturing apparatus 100 is roughly constituted by a base plate 1 and a reaction vessel 10 and is obtained.
- the crystalline silicon rod is composed of a straight body portion 6 that vapor-phase grows on the vertical portion 5a of the silicon core wire 5 assembled in a torii type and a bridge portion 8 that vapor-phase grows on the horizontal portion (bridge portion 5b).
- the base plate 1 is provided with a metal electrode 2 that supplies a current to the silicon core wire 5, a gas nozzle 3 that supplies a process gas such as nitrogen gas, hydrogen gas, and trichlorosilane gas, and an exhaust port 4 that discharges exhaust gas.
- a metal electrode 2 that supplies a current to the silicon core wire 5
- a gas nozzle 3 that supplies a process gas such as nitrogen gas, hydrogen gas, and trichlorosilane gas
- an exhaust port 4 that discharges exhaust gas.
- the metal electrode 2 is connected to another metal electrode (not shown) or connected to a power source arranged outside the reaction furnace, and receives power from the outside.
- An insulator 7 is provided on the side surface of the metal electrode 2, and penetrates the base plate 1 while being sandwiched between the insulators 7.
- the metal electrode 2, the base plate 1, and the reaction furnace 10 are cooled using a refrigerant.
- the core wire holder 20 and the carbon electrode 30 are both made of graphite.
- At least one of the carbon electrodes 30 is a carbon electrode according to the present invention, which will be described later, and has a structure that can slide in all directions within a horizontal plane in the drawing.
- FIG. 2 is a schematic view showing a configuration example of the carbon electrode 30 of the present invention.
- the carbon electrode 30 includes a lower electrode 32 fixed on the metal electrode 2 that is an external electrode for energizing the silicon core wire 5, and an upper electrode 31 placed on the lower electrode 32. On the upper surface side of the upper electrode 31, a fixing portion for the core wire holder 20 that holds the silicon core wire 5a is provided.
- the upper electrode 31 is provided with a hole (through hole) 35 penetrating from the upper surface 33 to the lower surface 34, and a bolt 36, which is a rod-shaped fastening member, is provided from the upper surface 33 of the upper electrode 31 through a washer 37. It is inserted into the hole 35 and fixed by being screwed with the lower electrode 32.
- the diameter of the hole 35 is larger than the diameter of the straight body of the bolt 36 so that a gap 51 is formed between the straight body of the bolt 36 in the hole 35.
- the washer 37 has an outer diameter approximately twice the diameter of the hole 35 and prevents the bolt 36 from entering the hole 35.
- a gap 51 between the straight body portion of the bolt 36 in the hole 35 is a mounting surface (a lower surface in contact with the lower surface 34 of the upper electrode 31 in FIG. 2) where the upper electrode 31 is a contact surface with the upper surface of the lower electrode 32. Since sliding in all directions within the plane of the upper surface of the electrode 32 is possible, an effect of suppressing the occurrence of cracks and cracks in the U rod that can expand and contract in all directions during the vapor phase growth process is exhibited.
- the diameter of the hole 35 is preferably formed to be 1 mm or more larger than the diameter of the straight body portion of the bolt 36. Further, the number of bolts 36 is preferably two or more.
- FIG. 3 is a schematic view showing another configuration example of the carbon electrode 30 of the present invention.
- the upper electrode 31 is placed on the lower electrode 32 in such a manner that the convex portion provided on the upper portion of the lower electrode 32 is inserted into the concave portion provided on the lower portion of the upper electrode 31. Has been.
- the inner dimension of the concave portion 38 of the upper electrode 31 is larger than the outer dimension of the convex portion 39 of the lower electrode 32, and as a result, between the concave portion 38 and the convex portion 39.
- a gap 52 is provided.
- the gap 52 between the concave portion 38 and the convex portion 39 allows the upper electrode 31 to slide in all directions within the surface of the mounting surface that is a contact surface with the upper surface of the lower electrode 32.
- the effect of suppressing the occurrence of cracks and cracks in the U rod that can expand and contract in all directions during the vapor phase growth process is exhibited.
- the gap 52 between the concave portion 38 and the convex portion 39 is preferably 1 mm or more.
- FIG. 4 is a schematic view showing a modification of the carbon electrode 30 shown in FIG. That is, in the embodiment shown in FIG. 3, the upper electrode is formed on the lower electrode 32 in such a manner that the convex portion provided on the upper portion of the lower electrode 32 is inserted into the concave portion provided on the lower portion of the upper electrode 31. 31 is placed on the lower electrode 32 by inserting a convex portion 41 provided below the upper electrode 31 into a concave portion 42 provided on the upper portion of the lower electrode 32. An electrode 31 is placed.
- the inner dimension of the concave portion 42 of the lower electrode 32 is larger than the outer dimension of the convex portion 41 of the upper electrode 31, and as a result, the concave portion 42 and the convex portion.
- a gap 53 is provided between the upper electrode 31 and the upper electrode 31. The gap 53 enables the upper electrode 31 to slide in all directions within the surface of the mounting surface which is a contact surface with the upper surface of the lower electrode 32. In order to ensure sliding in all directions within the mounting surface, the gap 53 between the concave portion 38 and the convex portion 39 is preferably 1 mm or more.
- the silicon core wire 5 is connected to the metal electrode 2, the reaction vessel 10 is placed on the base plate 1, and nitrogen gas is supplied from the gas nozzle 3 to replace the air in the reaction vessel 10 with nitrogen. At this time, air and nitrogen in the reaction vessel 10 are exhausted from the exhaust port 4. After the inside of the reaction vessel 10 is replaced with a nitrogen atmosphere, hydrogen gas is supplied from the gas nozzle 3 instead of the nitrogen gas, and the inside of the reaction vessel 10 is made a hydrogen atmosphere.
- the silicon core wire 5 is preheated to a temperature of 250 ° C. or higher so that the current can flow efficiently. Subsequently, current is supplied from the metal electrode 2 to the silicon core wire 5 to heat the silicon core wire 5 to 900 ° C. or higher. Further, trichlorosilane gas is supplied together with hydrogen gas as a source gas, and polycrystalline silicon is vapor-grown on the silicon core wire 5 in a temperature range of 900 ° C. or more and 1200 ° C. or less. Unreacted gas and by-product gas are discharged from the exhaust port 4.
- the opposed surfaces of the pair of straight body portions 6 constituting the U rod are expanded by radiant heating with each other, and the core wire holder 20 extends in a direction in which the mutual space increases. And the upper electrode 31 moves. Further, since the outside of the U rod is cooled by the reaction vessel 10, the temperature is lower than the inside of the U rod, and the core wire holder 20 and the upper electrode 31 move in a direction in which the U rod warps outward.
- the supply of the source gas and the current supply are stopped in this order, and the temperature in the reaction vessel 10 is subsequently lowered.
- the core wire holder 20 and the upper electrode 31 are moved in the direction in which the distance between the bridge portions 8 is reduced in the U rod whose distance is widened during the growth.
- the core wire holder 20 and the upper electrode 31 move toward the center of the reaction vessel 10 in the U rod whose outside temperature is low during the growth.
- Example 1 As shown in FIG. 1, a silicon core wire 5 is assembled in a torii type in a reaction furnace 10, and both ends of the torii type silicon core wire 5 are connected to a base plate via a pair of graphite core wire holders 20 and carbon electrodes 30. It fixes to a pair of metal electrode 2 arrange
- the upper electrode 31 is 1.5 mm in the direction in which the interval between the polycrystalline silicon rods increases. It was moving. The occurrence of cracks detected after cutting the U rod was two places.
- Example 2 Polycrystalline silicon was vapor-grown under the same conditions as in Example 1 except that one of the carbon electrodes 30 having the upper electrode 31 and the lower electrode 32 of the type shown in FIG. 3 was used.
- the inner diameter of the concave shape 38 is 82 mm
- the outer diameter of the convex shape 39 is 74 mm.
- the upper electrode 31 moved 3.0 mm in the direction in which the distance between the polycrystalline silicon rods became narrow and the U rod warped outward. The occurrence of cracks detected after cutting the U rod was two places.
- Example 1 Polycrystalline silicon was vapor-grown under the same conditions as in Example 1 except that a carbon electrode 30 that did not move was used. The occurrence of cracks detected after cutting the U-rod was 5 locations.
Abstract
Description
図1に示したように、反応炉10内にシリコン芯線5を鳥居型に組み立て、該鳥居型のシリコン芯線5の両端を共にグラファイト製の一対の芯線ホルダ20と炭素電極30とを介してベースプレート1上に配置した一対の金属電極2に固定する。炭素電極30の一方は、図2に示す型の上部電極31と下部電極32とを有する。貫通孔35の内径は10mm、ボルト36の直径は6mmである。
炭素電極30の一方として、図3に示す型の上部電極31と下部電極32とを有するものを使用した以外は、実施例1と同様の条件で多結晶シリコンを気相成長させた。凹形状38の内径は82mm、凸形状39の外径は74mmである。気相成長終了後、上部電極31は多結晶シリコン棒の間隔が狭くなるとともにUロッドが外側に反る方向に3.0mm移動していた。Uロッドを刈り取りした後に検出された割れの発生は、2箇所であった。
炭素電極30として電極の移動しないものを使用した以外は、実施例1と同様の条件で多結晶シリコンを気相成長させた。Uロッドを刈り取りした後に検出された割れの発生は、5箇所であった。
2 金属電極
3 ガスノズル
4 排気口
5 シリコン芯線
5a 鉛直方向部分
5b ブリッジ部
6 多結晶シリコン棒の直胴部
8 多結晶シリコン棒のブリッジ部
10 反応容器
20 芯線ホルダ
30 炭素電極
31 上部電極
32 下部電極
33 上部電極31の上面
34 上部電極31の下面
35 貫通孔
36 ボルト
37 ワッシャ
38、42 凹形状部
39、41 凸形状部
51、52、53 間隙
100 多結晶シリコン棒の製造装置
Claims (9)
- 多結晶シリコン棒の製造に用いられる炭素電極であって、シリコン芯線への通電用外部電極である金属電極上に固定される下部電極と、該下部電極上に載置された上部電極であって上面側に前記シリコン芯線を保持する芯線ホルダの固定部が設けられた上部電極とからなり、前記上部電極は、前記下部電極の上面との接触面である載置面内で全方位に摺動可能であることを特徴とする炭素電極。
- 前記上部電極は上面から下面に貫通する孔部を備え、該孔部に挿入された棒状の締結部材の下端部は前記下部電極に固定されており、前記孔部の直径は前記棒状締結部材の直胴部の直径よりも大きく、前記孔部内で前記直胴部との間に間隙が設けられていることを特徴とする請求項1に記載の炭素電極。
- 前記孔部の直径は前記直胴部の直径よりも1mm以上大きいことを特徴とする請求項2に記載の炭素電極。
- 前記上部電極の下部に設けられた凹状部の内部に前記下部電極の上部に設けられた凸状部が挿入されて前記下部電極上に前記上部電極が載置されており、前記凹状部の内寸は前記凸状部の外寸よりも大きく、前記凹状部と凸状部との間に間隙が設けられていることを特徴とする請求項1に記載の炭素電極。
- 前記上部電極の下部に設けられた凸状部が前記下部電極の上部に設けられた凹状部の内部に挿入されて前記下部電極上に前記上部電極が載置されており、前記凹状部の内寸は前記凸状部の外寸よりも大きく、前記凹状部と凸状部との間に間隙が設けられていることを特徴とする請求項1に記載の炭素電極。
- 前記凹状部と凸状部との間隙は1mm以上であることを特徴とする請求項4又は5に記載の炭素電極。
- 前記上部電極と前記下部電極はグラファイト製であることを特徴とする請求項1乃至5の何れか1項に記載の炭素電極。
- 前記上部電極と前記下部電極の接触面における静止摩擦係数が0.3以下であることを特徴とする請求項1乃至5の何れか1項に記載の炭素電極。
- 鳥居型に組み立てたシリコン芯線の両端に一対の金属電極から電力供給して前記シリコン芯線上に多結晶シリコンを気相成長させる多結晶シリコン棒の製造装置であって、前記シリコン芯線の両端はそれぞれ炭素電極に設けられた固定部により保持され、前記炭素電極の少なくとも一方は請求項1乃至5の何れか1項に記載の炭素電極であることを特徴とする多結晶シリコン棒の製造装置。
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
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US13/508,826 US9562289B2 (en) | 2009-11-26 | 2010-10-22 | Carbon electrode with slidable contact surfaces and apparatus for manufacturing polycrystalline silicon rod |
EP10832796.6A EP2505554B1 (en) | 2009-11-26 | 2010-10-22 | Carbon electrode and equipment for manufacturing polycrystalline silicon rod |
EP16187289.0A EP3150556B1 (en) | 2009-11-26 | 2010-10-22 | Carbon electrode and apparatus for manufacturing polycrystalline silicon rod |
CN201080049198.2A CN102666380B (zh) | 2009-11-26 | 2010-10-22 | 碳电极和多晶硅棒的制造装置 |
AU2010324095A AU2010324095B2 (en) | 2009-11-26 | 2010-10-22 | Carbon electrode and apparatus for manufacturing polycrystalline silicon rod |
EP16187287.4A EP3118158B1 (en) | 2009-11-26 | 2010-10-22 | Carbon electrode and apparatus for manufacturing polycrystalline silicon rod |
US14/715,952 US20150247239A1 (en) | 2009-11-26 | 2015-05-19 | Carbon electrode and apparatus for manufacturing polycrystalline silicon rod |
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JP2009-268429 | 2009-11-26 | ||
JP2009268429A JP5415914B2 (ja) | 2009-11-26 | 2009-11-26 | 炭素電極および多結晶シリコン棒の製造装置 |
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US13/508,826 A-371-Of-International US9562289B2 (en) | 2009-11-26 | 2010-10-22 | Carbon electrode with slidable contact surfaces and apparatus for manufacturing polycrystalline silicon rod |
US14/715,952 Division US20150247239A1 (en) | 2009-11-26 | 2015-05-19 | Carbon electrode and apparatus for manufacturing polycrystalline silicon rod |
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US (2) | US9562289B2 (ja) |
EP (3) | EP3150556B1 (ja) |
JP (1) | JP5415914B2 (ja) |
CN (2) | CN103936010A (ja) |
AU (1) | AU2010324095B2 (ja) |
WO (1) | WO2011064940A1 (ja) |
Cited By (2)
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JP2013018675A (ja) * | 2011-07-11 | 2013-01-31 | Shin-Etsu Chemical Co Ltd | 多結晶シリコン製造装置 |
CN103145130A (zh) * | 2011-12-07 | 2013-06-12 | 刘雅铭 | 一种增加多晶硅还原炉里硅芯根数的方法及装置 |
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JP5477145B2 (ja) * | 2009-04-28 | 2014-04-23 | 三菱マテリアル株式会社 | 多結晶シリコン反応炉 |
JP5415914B2 (ja) | 2009-11-26 | 2014-02-12 | 信越化学工業株式会社 | 炭素電極および多結晶シリコン棒の製造装置 |
DE102010003064A1 (de) * | 2010-03-19 | 2011-09-22 | Wacker Chemie Ag | Graphitelektrode |
JP5696063B2 (ja) * | 2012-02-02 | 2015-04-08 | 信越化学工業株式会社 | 多結晶シリコン棒搬出冶具および多結晶シリコン棒の刈取方法 |
KR101420338B1 (ko) * | 2012-03-12 | 2014-07-16 | 한국실리콘주식회사 | 씨브이디 반응장치용 절연 슬리브 및 그 절연 슬리브가 구비된 씨브이디 반응장치 |
JP5917359B2 (ja) * | 2012-10-16 | 2016-05-11 | 信越化学工業株式会社 | 多結晶シリコン製造用原料ガスの供給方法および多結晶シリコン |
JP6373724B2 (ja) * | 2014-11-04 | 2018-08-15 | 株式会社トクヤマ | 芯線ホルダ及びシリコンの製造方法 |
CN106167264B (zh) * | 2016-08-31 | 2018-12-07 | 内蒙古盾安光伏科技有限公司 | 多晶硅还原炉的电极组件 |
JP7263172B2 (ja) | 2019-07-25 | 2023-04-24 | 信越化学工業株式会社 | 多結晶シリコン製造装置 |
JP7345441B2 (ja) * | 2020-07-02 | 2023-09-15 | 信越化学工業株式会社 | 多結晶シリコン製造装置 |
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- 2010-10-22 EP EP16187289.0A patent/EP3150556B1/en not_active Not-in-force
- 2010-10-22 CN CN201410092928.7A patent/CN103936010A/zh active Pending
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Also Published As
Publication number | Publication date |
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CN102666380A (zh) | 2012-09-12 |
EP3118158B1 (en) | 2018-09-12 |
JP5415914B2 (ja) | 2014-02-12 |
US9562289B2 (en) | 2017-02-07 |
EP3150556B1 (en) | 2018-09-26 |
CN103936010A (zh) | 2014-07-23 |
US20150247239A1 (en) | 2015-09-03 |
EP3150556A1 (en) | 2017-04-05 |
JP2011111360A (ja) | 2011-06-09 |
AU2010324095B2 (en) | 2013-08-22 |
CN102666380B (zh) | 2014-04-09 |
EP2505554A4 (en) | 2015-08-26 |
AU2010324095A1 (en) | 2012-05-31 |
EP3118158A1 (en) | 2017-01-18 |
US20120222619A1 (en) | 2012-09-06 |
EP2505554B1 (en) | 2016-10-19 |
EP2505554A1 (en) | 2012-10-03 |
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