WO2011014011A3 - 가교성 경화 물질을 포함하는 포토레지스트 조성물 - Google Patents

가교성 경화 물질을 포함하는 포토레지스트 조성물 Download PDF

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Publication number
WO2011014011A3
WO2011014011A3 PCT/KR2010/004969 KR2010004969W WO2011014011A3 WO 2011014011 A3 WO2011014011 A3 WO 2011014011A3 KR 2010004969 W KR2010004969 W KR 2010004969W WO 2011014011 A3 WO2011014011 A3 WO 2011014011A3
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WO
WIPO (PCT)
Prior art keywords
weight
light
parts
photoresist composition
pattern
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Application number
PCT/KR2010/004969
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English (en)
French (fr)
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WO2011014011A9 (ko
WO2011014011A2 (ko
Inventor
장유진
이준경
한동우
김정식
이정열
이재우
김덕배
김재현
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주식회사 동진쎄미켐
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Publication of WO2011014011A2 publication Critical patent/WO2011014011A2/ko
Publication of WO2011014011A9 publication Critical patent/WO2011014011A9/ko
Publication of WO2011014011A3 publication Critical patent/WO2011014011A3/ko

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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0035Multiple processes, e.g. applying a further resist layer on an already in a previously step, processed pattern or textured surface
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/0045Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • G03F7/032Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/038Macromolecular compounds which are rendered insoluble or differentially wettable
    • G03F7/0382Macromolecular compounds which are rendered insoluble or differentially wettable the macromolecular compound being present in a chemically amplified negative photoresist composition
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/40Treatment after imagewise removal, e.g. baking
    • G03F7/405Treatment with inorganic or organometallic reagents after imagewise removal
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/0271Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Materials For Photolithography (AREA)
  • Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)

Abstract

이중 패터닝 기술을 이용한 패턴 형성 방법에서, 포토레지스트 패턴 형성 후, 가열 또는 노광 및 가열에 의해 포토레지스트 패턴 표면에 패턴 보호막을 형성할 수 있는, 가교성 경화 물질을 포함하는 포토레지스트 조성물이 개시된다. 상기 포토레지스트 조성물은, 감광성 고분자 3 내지 30중량%; 상기 감광성 고분자 100중량부에 대하여, 청구항 1의 화학식 1 및/또는 화학식 2로 표시되는 가교 경화제 0.5 내지 75중량부; 상기 감광성 고분자 100중량부에 대하여, 광산발생제 0.05 내지 15중량부; 및 나머지 용매를 포함한다.
PCT/KR2010/004969 2009-07-28 2010-07-28 가교성 경화 물질을 포함하는 포토레지스트 조성물 WO2011014011A2 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR20090068858 2009-07-28
KR10-2009-0068858 2009-07-28

Publications (3)

Publication Number Publication Date
WO2011014011A2 WO2011014011A2 (ko) 2011-02-03
WO2011014011A9 WO2011014011A9 (ko) 2011-03-24
WO2011014011A3 true WO2011014011A3 (ko) 2011-06-09

Family

ID=43529872

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2010/004969 WO2011014011A2 (ko) 2009-07-28 2010-07-28 가교성 경화 물질을 포함하는 포토레지스트 조성물

Country Status (2)

Country Link
KR (1) KR101855504B1 (ko)
WO (1) WO2011014011A2 (ko)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101863635B1 (ko) * 2011-06-10 2018-06-04 주식회사 동진쎄미켐 포토리소그래피용 세정액 조성물 및 이를 이용한 포토레지스트 미세패턴 형성방법
JP6233240B2 (ja) * 2013-09-26 2017-11-22 信越化学工業株式会社 パターン形成方法
US10775697B2 (en) * 2014-04-22 2020-09-15 Zeon Corporation Radiation-sensitive resin composition, resin film, and electronic device
US10394126B2 (en) 2015-07-17 2019-08-27 Taiwan Semiconductor Manufacturing Company, Ltd. Photolithography process and materials
KR102289697B1 (ko) * 2015-12-29 2021-08-13 삼성에스디아이 주식회사 유기막 조성물 및 패턴형성방법
KR102592282B1 (ko) * 2021-08-18 2023-10-20 인하대학교 산학협력단 패터닝 후 기능화 가능 네거티브 포토레지스트 조성물 및 그의 제조 방법

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4705740A (en) * 1984-07-26 1987-11-10 Hoechst Aktiengesellschaft Radiation-polymerizable mixture, copolymer contained therein, and a process for the preparation of the copolymer
KR20020031081A (ko) * 2000-10-20 2002-04-26 무네유키 가코우 포지티브 감광성 조성물
JP2002265436A (ja) * 2001-03-08 2002-09-18 Fuji Photo Film Co Ltd ポジ型レジスト組成物
JP2006208546A (ja) * 2005-01-26 2006-08-10 Tokyo Ohka Kogyo Co Ltd レジストパターン形成方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0935635A1 (en) * 1996-10-30 1999-08-18 Cytec Technology Corp. Liquid cross-linker compositions containing 1,3,5-triazine carbamate/aminoplast resin mixtures

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4705740A (en) * 1984-07-26 1987-11-10 Hoechst Aktiengesellschaft Radiation-polymerizable mixture, copolymer contained therein, and a process for the preparation of the copolymer
KR20020031081A (ko) * 2000-10-20 2002-04-26 무네유키 가코우 포지티브 감광성 조성물
JP2002265436A (ja) * 2001-03-08 2002-09-18 Fuji Photo Film Co Ltd ポジ型レジスト組成物
JP2006208546A (ja) * 2005-01-26 2006-08-10 Tokyo Ohka Kogyo Co Ltd レジストパターン形成方法

Also Published As

Publication number Publication date
WO2011014011A9 (ko) 2011-03-24
WO2011014011A2 (ko) 2011-02-03
KR101855504B1 (ko) 2018-05-08
KR20110011585A (ko) 2011-02-08

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