WO2010140190A1 - 比較判定回路およびそれを用いた試験装置 - Google Patents
比較判定回路およびそれを用いた試験装置 Download PDFInfo
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- WO2010140190A1 WO2010140190A1 PCT/JP2009/002473 JP2009002473W WO2010140190A1 WO 2010140190 A1 WO2010140190 A1 WO 2010140190A1 JP 2009002473 W JP2009002473 W JP 2009002473W WO 2010140190 A1 WO2010140190 A1 WO 2010140190A1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/36—Overload-protection arrangements or circuits for electric measuring instruments
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/16576—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing DC or AC voltage with one threshold
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31924—Voltage or current aspects, e.g. driver, receiver
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/382—Arrangements for monitoring battery or accumulator variables, e.g. SoC
Definitions
- the present invention relates to a comparison / determination circuit that determines the level of a signal transmitted through a transmission line.
- bidirectional transmission may be performed via a single transmission line.
- the amplitude of a signal output from the device under test (DUT) is compared with a threshold voltage, and the quality is determined.
- the test apparatus is provided with a transmitter (driver) and a receiver (comparison determination circuit) connected to a common transmission line.
- the driver transmits a test pattern to the DUT, and the comparison / determination circuit determines the logical value of the signal output from the DUT or checks the amplitude of the signal.
- FIG. 1 is a block diagram showing a test system 500 using a general driver / comparator circuit 400.
- the driver / comparator circuit 400 includes a driver amplifier DRV1 and a level comparator CMP1.
- the driver / comparator circuit 400 is mounted on the test apparatus and is connected to a communication partner device, that is, the DUT 102 via the transmission line 104.
- the driver amplifier DRV1 outputs a signal Vd to the DUT 102
- the level comparator CMP1 compares the amplitude level of the signal Va received via the transmission line 104 with the threshold voltage VOH, and generates a signal SH indicating the comparison result. appear.
- the DUT 102 may output a relatively large amplitude signal Vu.
- the level comparator CMP1 needs to be configured by using a transistor element having a sufficiently high breakdown voltage that can withstand the amplitude.
- the high breakdown voltage transistor operates slowly. That is, the conventional system has a problem that the test rate is limited when the large-amplitude output signal Vu from the DUT 102 is designed.
- Such a problem can occur not only in a test apparatus but also in transmission between semiconductor devices.
- the present invention has been made in such a situation, and one of the exemplary purposes of an aspect thereof is to provide a comparison / determination circuit capable of evaluating a high-speed signal.
- An aspect of the present invention relates to a comparison / determination circuit that determines the level of a signal received from a communication partner device via a transmission line.
- the comparison determination circuit includes an input / output terminal connected to the transmission line, a first resistor having a first terminal connected to the input / output terminal, and a first terminal connected to the second terminal of the first resistor.
- An attenuator circuit including a second resistor having a first voltage applied to the second terminal and outputting an attenuation voltage generated at a connection point of the first and second resistors, and comparing the attenuation voltage with a predetermined threshold voltage And a level comparator that generates a level determination signal according to the comparison result.
- the voltage level input to the level comparator can be reduced, a high-speed comparator composed of low-voltage elements can be used.
- high-speed signals can be evaluated.
- FIG. 3 is a circuit diagram illustrating a specific first configuration example of the comparison determination circuit of FIG. 2.
- 4A and 4B are circuit diagrams of the driver / comparator circuit of FIG. 1 and the driver / comparator circuit of FIG. 3, respectively.
- FIGS. 5A and 5B are circuit diagrams of the driver / comparator circuit of FIG. 1 and the driver / comparator circuit of FIG. 3, respectively.
- FIG. 6 is a circuit diagram showing a configuration of a driver / comparator circuit according to a first modification.
- the state in which the member A is connected to the member B means that the member A and the member B are physically directly connected, or the member A and the member B are electrically connected. The case where it is indirectly connected through another member that does not affect the state is also included.
- the state in which the member C is provided between the member A and the member B refers to the case where the member A and the member C or the member B and the member C are directly connected, as well as an electrical condition. It includes the case of being indirectly connected through another member that does not affect the connection state.
- FIG. 2 is a block diagram illustrating a configuration of the driver / comparator circuit 100 according to the embodiment.
- the driver / comparator circuit 100 is an interface circuit of a first device, and is connected to a communication partner device (hereinafter referred to as a second device) 102 via a transmission line 104, and a signal Vd ′ is transmitted to the second device 102. Or the signal Vu output from the second device 102 is received.
- a communication partner device hereinafter referred to as a second device
- the driver / comparator circuit 100 is also suitable for use as an interface circuit (also referred to as pin electronics) of an automatic test apparatus ATE (Automatic Test Equipment). That is, the driver / comparator circuit 100 outputs pattern data to the second device (DUT) and receives a signal from the DUT and determines its amplitude (level).
- ATE Automatic Test Equipment
- FIG. 2 shows the test system.
- the second device 102 includes a driver amplifier DRV2 and an output resistor Ru.
- the signal Vu output from the driver amplifier DRV2 is input to the input / output terminal P1 of the driver / comparator circuit 100 via the transmission line 104.
- the driver amplifier DRV2 is provided with an output resistor Ru. The following description will be made on the assumption that the characteristic impedance Z0 of the transmission line 104 is matched with the output resistance Ru of the second device 102.
- the driver / comparator circuit 100 includes an input / output terminal P1 to which the transmission line 104 is connected.
- the driver / comparator circuit 100 includes a comparison / determination circuit 10, a driver amplifier DRV1, and a third resistor R3.
- the driver amplifier DRV1 generates a signal Vd ′ to be transmitted to the second device 102.
- the signal Vd ' may be a high / low binary value, or a multi-value signal such as a quaternary value or an quaternary value.
- the third resistor R3 is provided between the output terminal of the driver amplifier DRV1 and the input / output terminal P1. When the first device does not send a signal to the second device 102, that is, when unidirectional transmission is performed, the driver amplifier DRV1 may generate a constant voltage.
- the comparison / determination circuit 10 determines the amplitude level of the voltage Va 'generated at the input / output terminal P1.
- the comparison determination circuit 10 includes an attenuator circuit 12, a protection circuit 20, and a level comparator CMP1.
- the attenuator circuit 12 attenuates the voltage Va 'at the input / output terminal P1 to generate an attenuated voltage Vc.
- the level comparator CMP1 compares the decay voltage Vc with a predetermined upper threshold voltage VOH ′ and generates a level determination signal SH corresponding to the comparison result.
- a comparator (not shown) that compares the attenuation voltage Vc with a predetermined lower threshold voltage VOL 'may be further provided in parallel with the level comparator CMP1.
- the attenuation voltage Vc is supplied to the level comparator CMP1 via the protection circuit 20.
- the protection circuit 20 decreases the attenuation voltage Vc to the level comparator CMP1. Is forcibly cut off or the voltage value is changed.
- the driver / comparator circuit 100 The above is the configuration of the driver / comparator circuit 100. Next, the operation will be described.
- the driver / comparator circuit 100 of FIG. 2 the voltage Va ′ at the input / output terminal P 1 is attenuated by the attenuator circuit 12. Therefore, even when the second device 102 generates the voltage Vu having a large amplitude, the voltage Vc having a small amplitude is input to the level comparator CMP1.
- the level comparator CMP1 can be configured using low-voltage elements, high-speed comparison processing can be realized. That is, it is possible to appropriately evaluate the voltage level of the high-speed signal.
- the protection circuit 20 can protect the level comparator CMP1 from overvoltage.
- the withstand voltage of the level comparator CMP1 in consideration of not only the output voltage of the second device 102 in the normal state but also abnormal states such as a power fault, a ground fault, and surge noise.
- the driver / comparator circuit 100 since the level comparator CMP1 is not exposed to an overvoltage in an abnormal state by providing the protection circuit 20, the withstand voltage of the level comparator CMP1 can be designed low. . This, combined with the provision of the attenuator circuit 12, contributes to the high-speed operation of the driver / comparator circuit 100.
- FIG. 3 is a circuit diagram showing a specific first configuration example of the comparison determination circuit 10 of FIG.
- the attenuator circuit 12 includes a first resistor R1, a second resistor R2, and a first voltage source VS1.
- the first terminal of the first resistor R1 is connected to the input / output terminal P1.
- the first terminal of the second resistor R2 is connected to the second terminal of the first resistor R1, and the first voltage Vs is applied to the second terminal of the second resistor R2.
- the first voltage Vs is generated by the first voltage source VS1.
- the attenuator circuit 12 outputs the potential at the connection point between the first resistor R1 and the second resistor R2 as the attenuation voltage Vc.
- the resistance value of the first resistor R1 is denoted as Rb
- the resistance value of the second resistor R2 is denoted as Rc.
- the resistance values of the first resistor R1 and the second resistor R2 may be determined arbitrarily.
- Vc (Rc ⁇ Va ′ + Rb ⁇ Vs) / (Rb + Rc)
- the amplitude of the voltage Va ′ at the input / output terminal P1 that is, the fluctuation amount is attenuated by Rc / (Rb + Rc) times by the attenuator circuit 12. Further, the attenuator circuit 12 gives a level shift according to the first voltage Vs. When the first voltage Vs is the ground voltage (0 V), the shift amount is zero. The effect of the level shift will be described later.
- the protection circuit 20 in FIG. 3 includes a voltage monitoring circuit 22 and a protection switch SW1.
- the voltage monitoring circuit 22 generates a protection signal NOV that is asserted (low level) when the attenuation voltage Vc deviates from a predetermined voltage range [VCmin to VCmax].
- the voltage monitoring circuit 22 includes an upper limit comparator 24, a lower limit comparator 26, a first flip-flop 28, a second flip-flop 30, and a NOR gate 32.
- the upper limit comparator 24 compares the decay voltage Vc with the maximum voltage VCmax and generates a first detection signal PCH indicating the comparison result.
- the lower limit comparator 26 compares the attenuation voltage Vc with the minimum voltage VCmin, and generates a second detection signal PCL indicating the comparison result.
- the maximum voltage VCmax is set to the maximum value of a voltage that does not hinder (does not give stress) even if input to the level comparator CMP1
- the minimum voltage VCmin is the minimum value of a voltage that does not interfere even if input to the level comparator CMP1.
- the first detection signal PCH is at a high level when Vc> VCmax.
- the second detection signal PCL is at a high level when Vc ⁇ VCmin. That is, when the attenuation voltage Vc is out of the voltage range VCmin to VCmax, one of the signals PCH and PCL becomes high level.
- the signals PCH and PCL are input to the set terminals (S) of the first flip-flop 28 and the second flip-flop 30, respectively, and the release signal RST from the outside is input to the reset terminals (R).
- the NOR gate 32 generates a negative logical sum of the first flip-flop 28 and the second flip-flop 30. That is, the protection signal NOV generated by the NOR gate 32 takes a high level (negate) when the attenuation voltage Vc is included in the input voltage range of the level comparator CMP1, and takes a low level (assert) when it falls outside the input voltage range. .
- the protection switch SW1 is provided on the path from the attenuator circuit 12 to the level comparator CMP1.
- the protection switch SW1 is turned on when a high level is inputted, in other words, when the protection signal NOV is negated, and is turned off when a low level is inputted, in other words, when the protection signal NOV is asserted.
- the design guideline is to match the characteristics of the driver / comparator circuit 100 of FIG. 3 with the characteristics of the general driver / comparator circuit 400 of FIG. In other words, the design guideline is to realize a function equivalent to a state in which the attenuator circuit 12 is provided without the attenuator circuit 12.
- the output signal Vd ′ (Vd) of the driver amplifier DRV1 can take various potentials such as a high level (VIH), a low level (VIL), or a termination potential (VT) according to data to be transmitted to the second device 102.
- VH high level
- VIL low level
- VT termination potential
- FIGS. 4A and 4B are circuit diagrams in which only circuit elements related to the impedance of the driver / comparator circuit 400 of FIG. 1 and the driver / comparator circuit 100 of FIG. 3 are extracted, respectively. From the Thevenin's theorem, in order for two circuits to be equivalent, the following first condition and second condition should be satisfied.
- the first condition is that the impedance Z1 desired from the input / output terminal P1 of the driver / comparator circuit 100 of FIG. 3 is the impedance Z2 desired from the input / output terminal P1 of the driver / comparator circuit 400 of FIG. Is equal to
- the second condition is that the voltage level of the signal Va ′ output from the input / output terminal P1 of the driver / comparator circuit 100 of FIG. 3 is the same as that of the signal Va output from the input / output terminal P1 of the driver / comparator circuit 400 of FIG. It is equal to the voltage level.
- Equation (1) is derived from the first condition
- Equation (2) is derived from the second condition.
- Ra Ra ′ // (Rb + Rc)
- // means the combined resistance value of the parallel resistors.
- a // B A ⁇ B / (A + B) Can be regarded as an operator.
- FIGS. 5A and 5B are circuit diagrams in which circuit elements related to voltage comparison of the driver / comparator circuit 400 of FIG. 1 and the driver / comparator circuit 100 of FIG. 3 are extracted.
- Equation (7) is obtained from FIG.
- Equation (9) is established.
- Vd ′, Ra ′, and VOH ′ may be determined so that equations (6) and (10) are satisfied in order to make FIGS. 5A and 5B equivalent. .
- the protection operation of the driver / comparator circuit 100 of FIG. 3 will be described.
- the reset signal RST is asserted, and the output signals OVH and OVL of the first flip-flop 28 and the second flip-flop 30 are both at a low level.
- the protection signal NOV is at a high level (negated), and the protection switch SW1 is turned on (conductive).
- the input voltage Vc of the level comparator CMP1 is VCmin ⁇ Vc ⁇ VCmax In the normal operation range, PCH, PCL, OVH, and OVL are all at the low level, so the protection signal NOV continues to maintain the high level.
- the input voltage Vc of the level comparator CMP1 can be suitably limited.
- the attenuator circuit 12 can shift the input voltage (attenuation voltage) Vc of the level comparator CMP1 in accordance with the first voltage Vs. Therefore, by optimizing the shift amount according to the first voltage Vs, the level comparator CMP1 can be operated in the voltage range with the highest sensitivity, and high-speed determination is possible.
- FIG. 6 is a circuit diagram showing a configuration of the driver / comparator circuit 100a according to the first modification.
- the voltage monitoring circuit 22 of the comparison determination circuit 10a monitors the potential Va ′ of the input / output terminal P1, not the input voltage (attenuation voltage) Vc of the level comparator CMP1. Others are the same as FIG.
- equation (6-1) is obtained. Since the allowable input voltage range of the level comparator CMP1 is VCmin to VCmax, the equation (6-2) is obtained by replacing Vc in the equation (6-1) with VCmax and VCmin.
- the driver / comparator circuit 100a of FIG. 6 since the voltage monitoring circuit 22 is connected to a node having a low impedance (for example, 50 ⁇ ), the input capacities of the upper limit comparator 24 and the lower limit comparator 26 correspond to the response performance of the level comparator CMP1. The influence exerted can be reduced as compared with FIG.
- FIG. 7 is a circuit diagram showing a comparison / determination circuit 10b of a driver / comparator circuit according to a second modification.
- a dynamic comparator is used as the level comparator CMP1.
- the level comparator CMP1 determines and latches the amplitude level of the input voltage Vc at the timing set by the control signal ( ⁇ 3).
- the level comparator CMP1 includes an input hold unit 110, a comparison amplification unit 120, a reset unit 130, and a first capacitor C1 to a fourth capacitor C4.
- the input voltage Vc is input to the positive input terminal TP, and the threshold voltage VOH ′ is input to the negative input terminal TN.
- the power supply terminal 50 (first fixed voltage terminal) is supplied with the power supply voltage Vdd as the first fixed voltage, and the ground terminal 52 (second fixed voltage terminal) is supplied with the ground voltage VGND as the second fixed voltage. It is done.
- the positive differential signal IP (signal HP held by the input hold unit 110) propagates to the positive line LP.
- the negative differential signal IN (the signal HN held by the input hold unit 110) propagates to the negative line LN.
- the comparison amplification unit 120 includes a first inverter 122, a second inverter 124, and an activation switch 126.
- the comparison amplification unit 120 is configured in a form called a dynamic comparator or a sense latch.
- the input terminal of the first inverter 122 is connected to the positive output line OP, and its output terminal is connected to the negative output line ON.
- the first inverter 122 includes transistors PMOS, NMOS1, and NMOS2.
- the first inverter 122 inverts and amplifies the signal input to the gate of the transistor NMOS1, and outputs it from the drain of the transistor NMOS1 (PMOS drain).
- the gates of the transistors PMOS and NMOS2 are connected in common and connected to the output terminal of the second inverter 124.
- the second inverter 124 is configured in the same manner as the first inverter 122, and the first inverter 122 and the second inverter 124 are cross-coupled. Specifically, the input terminal of the second inverter 124 is connected to the negative output line ON, and its output terminal is connected to the positive output line OP.
- One power supply terminal (PMOS source) of the second inverter 124 is connected to the power supply terminal (first fixed voltage terminal) 50, and the other power supply terminal (NMOS2 source) is the other power supply terminal of the first inverter 122. It is connected in common with (source of NMOS2).
- the inverters 122 and 124 may be CMOS type inverters composed of NMOS and PMOS connected in series.
- the activation switch 126 has a power supply voltage (first fixed voltage) Vdd or a ground voltage (second fixed voltage) VGND connected to the other power supply terminal (source of NMOS2) of the first inverter 122 and the second inverter 124 connected in common. Apply.
- the third control signal ⁇ 3 is input to the input terminal of the activation switch 126.
- the third control signal ⁇ 3 When the third control signal ⁇ 3 is asserted (high level), the output voltage of the activation switch 126 becomes the second fixed voltage (ground voltage VGND), and the first inverter 122 and the second inverter 124 are activated.
- the first capacitor C1 and the second capacitor C2 are connected to the positive output line OP and the negative output line ON, respectively.
- the first capacitor C1 and the second capacitor C2 may be explicitly formed using MIM (Metal InsulatorlMetal) capacitance, but if the capacitance value is appropriate, parasitic capacitance (transistor gate capacitance or wiring) Capacity).
- MIM Metal InsulatorlMetal
- parasitic capacitance transistor gate capacitance or wiring Capacity
- the input hold unit 110 is provided before the comparison amplification unit 120.
- the input hold unit 110 has a function of electrically separating the input terminal of the comparison amplifier 120 from the positive input terminal TP and the negative input terminal TN.
- the input hold unit 110 holds the differential signal IP / IN at the timing indicated by the first control signal ⁇ 1. Then, the held differential signal HN / HP is output to the subsequent comparison amplification unit 120 at the timing specified by the second control signal ⁇ 2.
- the input hold unit 110 includes a first positive switch SW1p, a second positive switch SW2p, a first negative switch SW1n, a second negative switch SW2n, a third capacitor C3, and a fourth capacitor C4.
- the first positive switch SW1p and the second positive switch SW2p are provided in series between the positive input terminal TP and the positive line LP.
- the third capacitor C3 couples the path between the first positive switch SW1p and the second positive switch SW2p and the ground.
- the first positive switch SW1p is turned on when the first control signal ⁇ 1 is asserted (high level)
- the second positive switch SW2p is turned on when the second control signal ⁇ 2 is asserted (high level).
- the potential of the third capacitor C3 (positive hold signal HP) follows the positive differential signal IP.
- the control signal ⁇ 1 When the control signal ⁇ 1 is negated (low level) at a certain timing, the first positive switch SW1p is turned off, and the positive differential signal IP at that timing is held in the third capacitor C3.
- the second control signal ⁇ 2 When the second control signal ⁇ 2 is asserted and the second positive switch SW2p is turned on, the held positive hold signal HP is supplied to the positive line LP.
- the first negative side switch SW1n, the second negative side switch SW2n, and the fourth capacitor C4 are similarly connected to hold the negative side differential signal IN.
- the third capacitor C3 and the fourth capacitor C4 may be MIM capacitors or parasitic capacitors. Further, instead of providing the third capacitor C3 and the fourth capacitor C4, a single capacitor may be coupled between the line where the positive hold signal HP is generated and the line where the negative hold signal HN is generated.
- the reset unit 130 is provided to initialize the positive output signal OP and the negative output signal ON to the first fixed voltage (power supply voltage Vdd).
- the reset unit 130 includes a first reset switch SWr1 and a second reset switch SWr2.
- the first reset switch SWr1 is provided between the positive output line OP and the power supply terminal 50 (first fixed voltage terminal).
- the second reset switch SWr2 is provided between the negative output line ON and the power supply terminal 50.
- the first reset switch SWr1 and the second reset switch SWr2 are turned on when the fourth control signal ⁇ 4 is asserted (high level) and turned off when the fourth control signal ⁇ 4 is negated (low level).
- the potentials of the positive output signal OP and the negative output signal ON are quickly reset to the first fixed voltage (power supply voltage Vdd).
- the positive-side output signal OP and the negative-side output signal ON are set to the power supply voltage Vdd, though weak, by the transistors constituting the comparison amplification unit 120. Has been pulled. Therefore, when the level comparator CMP1 is operated at a low speed, the reset unit 130 can be omitted.
- the AND gate 34 generates a logical product of the first control signal ⁇ 1 and the protection signal NOV.
- the first switches SW1p and SW1n are controlled according to the output signal of the AND gate 34.
- the first switches SW1p and SW1n correspond to the protection switch SW1 in FIG.
- the level comparator CMP1 can be protected by controlling them according to the protection signal NOV.
- the level comparator CMP1 shown in FIG. 7 is also effective when the power supply voltage and the ground voltage are inverted.
- FIG. 8 is a circuit diagram showing a configuration of a driver / comparator circuit 100c according to a third modification.
- the comparison determination circuit 10 of FIG. 3 protects the level comparator CMP1 by cutting off the input voltage Vc of the level comparator CMP1 in the overvoltage state.
- the comparison determination circuit 10c of the third modification protects the level comparator CMP1 by shifting the level of the input voltage Vc in the overvoltage state.
- the attenuator circuit 12c of FIG. 8 includes a second voltage source VS2, a third voltage source VS3, and a first switch SW11 to a third switch SW13 in addition to the attenuator circuit 12 of FIG.
- the first voltage source VS1 to the third voltage source VS3 generate voltages VCT, VPH, and VPL, respectively. These voltages satisfy the following relational expression. VPH ⁇ VCT ⁇ VPL
- One of the first switch SW11 to the third switch SW13 is selectively turned on according to the monitoring result by the voltage monitoring circuit 22c.
- the block including the voltage sources VS1 to VS3 and the switches SW11 to SW13 can be regarded as the variable voltage source 40.
- Another configuration may be used as long as the voltage applied to the second terminal of the second resistor R2 can be switched.
- the voltage monitoring circuit 22c includes OR gates 36 and 38 in addition to the voltage monitoring circuit 22 of FIG.
- the first flip-flop 28 is reset when PCL is asserted, and the second flip-flop 30 is reset when PCH is asserted.
- Vc> VCmax PCH is asserted, the second switch SW12 is turned on, and the first switch SW11 is turned off.
- Vs VPH, and the input voltage Vc of the level comparator CMP1 is shifted to the low voltage side according to the equation (7).
- the value of VPH is set so that the input voltage Vc ′ after the shift satisfies Vc ′ ⁇ VCmax.
- Vc ⁇ VCmin PCL is asserted, and the third switch SW13 is turned on and the first switch SW11 is turned off.
- Vs VPL
- the value of VPL is set so that the input voltage Vc ′ after the shift satisfies Vc ′> VCmin.
- FIG. 9 is a circuit diagram showing another configuration example of the variable voltage source 40 of FIG. Registers (latch) 42, 44, and 46 hold digital data DCT, DPH, and DPL of L bits (L is a natural number) corresponding to voltages VCT, VPH, and VPL, respectively. Signals NOV, OVH, and OVL are asserted in a complementary manner. Therefore, one of the control data DCT, DPH, and DPL is input to the R-2R termination circuit 60.
- the R-2R termination circuit 60 includes, for example, an (L + 1) stage R-2R type network and (L + 1) buffers for applying a voltage to one end of the resistor 2R at each stage.
- the upper L bits of the digital data are assigned to each buffer in order from the closest to the output terminal, and a fixed potential (for example, ground potential) is input to the buffer farthest from the output terminal.
- variable voltage source 40 can be regarded as a voltage source having an output impedance of Rc, and is equivalent to the variable voltage source 40 of FIG.
- each voltage VCT, VPH, VPL can be suitably controlled according to the value of each bit of the digital data DCT, DPH, DPL.
- FIG. 10 is a block diagram showing a configuration of a driver / comparator circuit 100d according to a fourth modification.
- N N is an integer of 2 or more
- comparison determination circuits 10_1 to 10_N are connected in parallel to the input / output terminal P1.
- the resistance value of the first resistor R1 is preferably N ⁇ Rb
- the resistance value of the second resistor R2 is preferably N ⁇ Rc.
- the above formula (3) can be applied as it is.
- the driver / comparator circuit 100d of FIG. 10 can compare the amplitude of the signal output from the second device 102 with a plurality of different threshold voltages.
- DESCRIPTION OF SYMBOLS 100 ... Driver / comparator circuit, 102 ... 2nd device, 104 ... Transmission line, P1 ... Input / output terminal, 10 ... Comparison judgment circuit, 12 ... Attenuator circuit, 20 ... Protection circuit, 22 ... Voltage monitoring circuit, 24 ... Upper limit comparator , 26 ... lower limit comparator, 28 ... first flip-flop, 30 ... second flip-flop, 32 ... NOR gate, SW1 ... protection switch, CMP1 ... level comparator, DRV1 ... driver amplifier, R1 ... first resistor, R2 ... second Resistance, R3... Third resistance.
- the present invention can be used for a test apparatus.
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Abstract
Description
ドライバ・コンパレータ回路400は試験装置に搭載され、通信相手のデバイス、つまりDUT102と伝送線路104を介して接続される。ドライバアンプDRV1は、DUT102に対して信号Vdを出力し、レベルコンパレータCMP1は、伝送線路104を介して受信した信号Vaの振幅レベルをしきい値電圧VOHと比較し、比較結果を示す信号SHを発生する。
従来では、正常状態における第2デバイス102の出力電圧のみでなく、天絡、地絡、サージノイズ等の異常状態を想定してレベルコンパレータCMP1の耐圧を設計する必要があった。これに対して実施の形態に係るドライバ・コンパレータ回路100では、保護回路20を設けたことにより、異常状態においてレベルコンパレータCMP1が過電圧に晒されないため、レベルコンパレータCMP1の耐圧を低く設計することができる。このことはアテネータ回路12を設けたことと相まって、ドライバ・コンパレータ回路100の高速動作に資することになる。
Vc=(Rc・Va’+Rb・Vs)/(Rb+Rc)
第1条件は、図3のドライバ・コンパレータ回路100の入出力端子P1から、その内部を望んだインピーダンスZ1が、図1のドライバ・コンパレータ回路400の入出力端子P1からその内部を望んだインピーダンスZ2と等しいことである。
第2条件は、図3のドライバ・コンパレータ回路100の入出力端子P1から出力される信号Va’の電圧レベルが、図1のドライバ・コンパレータ回路400の入出力端子P1から出力される信号Vaの電圧レベルと等しいことである。
Ra=Ra’//(Rb+Rc) …(1)
Va’=Va=Vd …(2)
A//B=A×B/(A+B)
なる演算子と捉えることができる。
Va>VOHのとき、SH=Lo
Va<VOHのとき、SH=Hi …(8)
Vc>VOH’のとき、SH’=Lo
Vc<VOH’のとき、SH’=Hi …(9)
VCmin<Vc<VCmax
を満たすとき、つまり通常の動作範囲においては、PCH、PCL、OVH、OVLはいずれもローレベルであるから、保護信号NOVはハイレベルを維持し続ける。
Vc>VCmax
を満たすとき、PCHがハイレベルとなり第1フリップフロップ28がセットされ、OVHがハイレベルとなる。これを受けて保護信号NOVはローレベル(アサート)となり、保護スイッチSW1がオフ状態となる。一旦保護信号NOVがアサートされると、次に解除信号RSTがアサートされるまで、保護スイッチSW1は復帰しない。
Vc<VCmin
を満たすと、PCLがハイレベルとなり第2フリップフロップ30がセットされ、OVLがハイレベルとなる。これを受けて保護信号NOVはローレベル(アサート)となり、保護スイッチSW1がオフ状態となる。この場合も、次に解除信号RSTがアサートされるまで、保護スイッチSW1は復帰しない。
図6は、第1の変形例に係るドライバ・コンパレータ回路100aの構成を示す回路図である。この変形例では、比較判定回路10aの電圧監視回路22は、レベルコンパレータCMP1の入力電圧(減衰電圧)Vcではなく、入出力端子P1の電位Va’を監視する。その他は図3と同様である。
図7は、第2の変形例に係るドライバ・コンパレータ回路の比較判定回路10bを示す回路図である。この変形例では、レベルコンパレータCMP1としてダイナミックコンパレータが利用される。
電源端子50(第1固定電圧端子)には、第1固定電圧として電源電圧Vddが与えられており、接地端子52(第2固定電圧端子)には、第2固定電圧として接地電圧VGNDが与えられる。
具体的には、第2インバータ124の入力端子は負側出力ラインONと接続され、その出力端子は正側出力ラインOPと接続される。第2インバータ124の一方の電源端子(PMOSのソース)は、電源端子(第1固定電圧端子)50と接続され、その他方の電源端子(NMOS2のソース)は第1インバータ122の他方の電源端子(NMOS2のソース)と共通に接続される。
第3制御信号φ3がアサートされると(ハイレベル)、活性化スイッチ126の出力電圧は第2固定電圧(接地電圧VGND)となり、第1インバータ122および第2インバータ124が活性化される。
図7のレベルコンパレータCMP1は、電源電圧と接地電圧を天地反転した構成も有効である。
図8は、第3の変形例に係るドライバ・コンパレータ回路100cの構成を示す回路図である。
図3の比較判定回路10は、過電圧状態において、レベルコンパレータCMP1の入力電圧Vcを遮断することによりレベルコンパレータCMP1を保護する。これに対して第3の変形例の比較判定回路10cは、過電圧状態において入力電圧VcをレベルシフトすることによりレベルコンパレータCMP1を保護する。
VPH<VCT<VPL
電圧監視回路22cによる監視結果に応じて、第1スイッチSW11~第3スイッチSW13のひとつが、選択的にオンとなる。
信号NOV、OVH、OVLは相補的にアサートされる。したがって、R-2R終端回路60には、制御データDCT、DPH、DPLのいずれかが入力される。
図10は、第4の変形例に係るドライバ・コンパレータ回路100dの構成を示すブロック図である。図10においては、入出力端子P1に対してN個(Nは2以上の整数)の比較判定回路10_1~10_Nが並列に接続されている。各比較判定回路10において、第1抵抗R1の抵抗値は、N・Rbであり、第2抵抗R2の抵抗値はN・Rcであることが望ましい。この場合、上述の式(3)をそのまま適用できる。
Claims (10)
- 通信相手のデバイスから伝送線路を介して受けた信号のレベルを判定する比較判定回路であって、
前記伝送線路に接続される入出力端子と、
前記入出力端子の電圧を減衰させ、減衰電圧を発生するアテネータ回路と、
前記減衰電圧を所定のしきい値電圧と比較し、比較結果に応じたレベル判定信号を生成するレベルコンパレータと、
を備えることを特徴とする比較判定回路。 - 前記アテネータ回路は、
その第1端子が前記入出力端子と接続された第1抵抗と、
その第1端子が前記第1抵抗の第2端子に接続され、その第2端子に第1電圧が印加された第2抵抗と、
を含み、前記第1、第2抵抗の接続点に生ずる電圧を前記減衰電圧として出力することを特徴とする請求項1に記載の比較判定回路。 - 前記入出力端子の電圧または前記減衰電圧を監視し、監視対象の電圧が所定の電圧範囲から逸脱するとき、前記レベルコンパレータに入力される前記減衰電圧を強制的に遮断もしくは変化せしめる保護回路をさらに備えることを特徴とする請求項1に記載の比較判定回路。
- 前記保護回路は、
前記減衰電圧が所定の電圧範囲から逸脱するときアサートされる保護信号を生成する電圧監視回路と、
前記アテネータ回路から前記レベルコンパレータの経路上に設けられ、前記保護信号がネゲートされると導通状態、アサートされると遮断状態となる保護スイッチと、
を含むことを特徴とする請求項3に記載の比較判定回路。 - 前記保護回路は、
前記入出力端子の電圧が所定の電圧範囲から逸脱するときアサートされる保護信号を生成する電圧監視回路と、
前記アテネータ回路から前記レベルコンパレータの経路上に設けられ、前記保護信号がネゲートされると導通状態、アサートされると遮断状態となる保護スイッチと、
を含むことを特徴とする請求項3に記載の比較判定回路。 - 前記入出力端子の電圧または前記減衰電圧を監視し、監視対象の電圧が所定の電圧範囲から逸脱するときアサートされる保護信号を生成する電圧監視回路をさらに備え、
前記レベルコンパレータは、その入力部に、前記減衰電圧および前記しきい値電圧をホールドするための入力スイッチを備えたダイナミックコンパレータであり、
前記入力スイッチは、前記保護信号がネゲートされると導通状態、アサートされると遮断状態となることを特徴とする請求項1または2に記載の比較判定回路。 - 前記入出力端子の電圧または前記減衰電圧を監視し、監視対象の電圧が属する電圧範囲を示す保護信号を生成する電圧監視回路と、
前記第2抵抗の前記第2端子に第1電圧を印加する電圧源と、
をさらに備え、前記電圧源は、前記保護信号に応じて前記第1電圧の値を変化させることを特徴とする請求項1または2に記載の比較判定回路。 - 前記電圧監視回路は解除信号を受け、当該解除信号がアサートされると、前記保護信号をネゲートするよう構成されることを特徴とする請求項4から6のいずれかに記載の比較判定回路。
- 前記通信相手のデバイスに対し前記伝送線路を介して送信すべき信号を生成するドライバと、
前記ドライバの出力端子と前記入出力端子の間に設けられた第3抵抗と、
をさらに備えることを特徴とする請求項1から8のいずれかに記載の比較判定回路。 - 被試験デバイスとの間で伝送線路を介して信号を双方向伝送し、前記被試験デバイスを検査する試験装置であって、
前記被試験デバイスを通信相手とする請求項9に記載の比較判定回路を備えることを特徴とする試験装置。
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JP2017181574A (ja) * | 2016-03-28 | 2017-10-05 | 株式会社ジャパンディスプレイ | 表示装置 |
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US10359452B2 (en) | 2012-07-11 | 2019-07-23 | Hewlett-Packard Development Company, L.P. | Diagnostic device, apparatus and method |
WO2016173619A1 (en) * | 2015-04-27 | 2016-11-03 | Advantest Corporation | Switch circuit, method for operating a switch circuit and an automated test equipment |
US10862521B1 (en) * | 2019-01-30 | 2020-12-08 | Inphi Corporation | Techniques for programmable gain attenuation in wideband matching networks with enhanced bandwidth |
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US8704527B2 (en) | 2014-04-22 |
JPWO2010140190A1 (ja) | 2012-11-15 |
US20110121904A1 (en) | 2011-05-26 |
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