WO2010058667A1 - 物体検出装置および情報取得装置 - Google Patents

物体検出装置および情報取得装置 Download PDF

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Publication number
WO2010058667A1
WO2010058667A1 PCT/JP2009/067777 JP2009067777W WO2010058667A1 WO 2010058667 A1 WO2010058667 A1 WO 2010058667A1 JP 2009067777 W JP2009067777 W JP 2009067777W WO 2010058667 A1 WO2010058667 A1 WO 2010058667A1
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WO
WIPO (PCT)
Prior art keywords
filter
light
information acquisition
object detection
light source
Prior art date
Application number
PCT/JP2009/067777
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English (en)
French (fr)
Japanese (ja)
Inventor
勝美 楳田
信雄 岩月
Original Assignee
三洋電機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 三洋電機株式会社 filed Critical 三洋電機株式会社
Priority to CN2009801463652A priority Critical patent/CN102224431A/zh
Publication of WO2010058667A1 publication Critical patent/WO2010058667A1/ja
Priority to US13/109,531 priority patent/US8218149B2/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G01S17/89—Lidar systems specially adapted for specific applications for mapping or imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/481—Constructional features, e.g. arrangements of optical elements

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Electromagnetism (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Measurement Of Optical Distance (AREA)
  • Length Measuring Devices By Optical Means (AREA)
PCT/JP2009/067777 2008-11-21 2009-10-14 物体検出装置および情報取得装置 WO2010058667A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN2009801463652A CN102224431A (zh) 2008-11-21 2009-10-14 物体检测装置以及信息获取装置
US13/109,531 US8218149B2 (en) 2008-11-21 2011-05-17 Object detecting device and information acquiring device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2008-298575 2008-11-21
JP2008298575A JP2010122183A (ja) 2008-11-21 2008-11-21 物体検出装置および情報取得装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US13/109,531 Continuation US8218149B2 (en) 2008-11-21 2011-05-17 Object detecting device and information acquiring device

Publications (1)

Publication Number Publication Date
WO2010058667A1 true WO2010058667A1 (ja) 2010-05-27

Family

ID=42198106

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2009/067777 WO2010058667A1 (ja) 2008-11-21 2009-10-14 物体検出装置および情報取得装置

Country Status (4)

Country Link
US (1) US8218149B2 (zh)
JP (1) JP2010122183A (zh)
CN (1) CN102224431A (zh)
WO (1) WO2010058667A1 (zh)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8218149B2 (en) 2008-11-21 2012-07-10 Sanyo Electric Co., Ltd. Object detecting device and information acquiring device
EP2530485A1 (de) * 2011-05-31 2012-12-05 Pepperl & Fuchs GmbH Optischer Sensor zum Nachweis von Objekten und Verfahren zum optischen Anzeigen von Informationen
CN102822622A (zh) * 2011-03-25 2012-12-12 三洋电机株式会社 物体检测装置及信息取得装置
CN106772310A (zh) * 2016-12-30 2017-05-31 南京理工大学 一种基于计算鬼成像的目标鉴定装置及其方法

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KR101296780B1 (ko) * 2011-02-15 2013-08-14 계명대학교 산학협력단 레이저를 이용한 장애물 감지장치 및 방법.
DE102011089195A1 (de) * 2011-06-30 2013-01-03 Johnson Controls Gmbh Vorrichtung und Verfahren zur berührungslosen Erfassung von Gegenständen und/oder Personen und von diesen ausgeführten Gesten und/oder Bedienvorgängen
DE102012107329B4 (de) * 2012-08-09 2020-04-23 Trimble Jena Gmbh Distanzmesssystem
DE102014100245B3 (de) * 2014-01-10 2014-11-20 Sick Ag Optoelektronischer Sensor und Verfahren zur Erfassung von Objekten in einem Überwachungsbereich
DE102015101292A1 (de) * 2015-01-29 2016-08-04 Valeo Schalter Und Sensoren Gmbh Verfahren zum Erfassen eines Objekts in einem Umgebungsbereich eines Kraftfahrzeugs durch Überprüfen einer räumlichen Abweichung von Messpunkten, Steuereinrichtung, Fahrerassistenzsystem sowie Kraftfahrzeug
JP6609995B2 (ja) * 2015-05-25 2019-11-27 富士通株式会社 レーザ測距装置
JP6597150B2 (ja) * 2015-10-09 2019-10-30 富士通株式会社 距離測定装置、距離測定方法、距離測定プログラムおよびテーブルの作成方法
JP2017122673A (ja) 2016-01-08 2017-07-13 富士通株式会社 レーザ距離測定装置、測定方法及び測定プログラム
CN109154497A (zh) * 2016-02-23 2019-01-04 富士胶片株式会社 距离信息获取装置以及距离信息获取方法
CN110214098B (zh) * 2017-02-09 2021-09-17 本田技研工业株式会社 用于车辆的外部环境检测装置的安装结构
DE102017205685A1 (de) * 2017-04-04 2018-10-04 Robert Bosch Gmbh LIDAR-Vorrichtung mit einem dynamischen Filter und Verfahren
EP3444634B1 (en) 2017-08-17 2024-05-01 ams AG Semiconductor device and method for time-of-flight measurements
WO2019078074A1 (en) * 2017-10-20 2019-04-25 Sony Semiconductor Solutions Corporation IN-DEPTH PICTURE ACQUISITION APPARATUS, CONTROL METHOD, AND DEPTH PICTURE ACQUISITION SYSTEM
JP7271119B2 (ja) * 2017-10-20 2023-05-11 ソニーセミコンダクタソリューションズ株式会社 デプス画像取得装置、制御方法、およびデプス画像取得システム
KR102486426B1 (ko) 2018-02-23 2023-01-09 엘지이노텍 주식회사 카메라 모듈
JP2019174163A (ja) * 2018-03-27 2019-10-10 パイオニア株式会社 走査装置及び測距装置
JP2019174162A (ja) * 2018-03-27 2019-10-10 パイオニア株式会社 走査装置及び測距装置
US11947038B2 (en) * 2018-12-21 2024-04-02 Continental Automotive Systems, Inc. Wavelength adaptive narrow band optical filter for a LIDAR system
KR102618276B1 (ko) * 2019-01-07 2023-12-28 엘지이노텍 주식회사 카메라 모듈
EP3699640B1 (de) * 2019-02-19 2022-01-26 Sick Ag Optoelektronischer sensor und verfahren zur erfassung eines objekts
KR20200132319A (ko) * 2019-05-16 2020-11-25 엘지이노텍 주식회사 카메라 모듈
JP6879337B2 (ja) * 2019-07-05 2021-06-02 富士通株式会社 距離測定装置、距離測定方法、距離測定プログラムおよびテーブルの作成方法
DE102019210946A1 (de) * 2019-07-24 2021-01-28 Robert Bosch Gmbh LIDAR-Sensor zur optischen Erfassung eines Sichtfeldes und Verfahren zur optischen Erfassung eines Sichtfeldes
JP7335969B2 (ja) 2019-09-27 2023-08-30 富士フイルム株式会社 光学素子、光学装置、撮像装置、及び光学素子の製造方法
CN111339915B (zh) 2020-02-24 2024-04-12 京东方科技集团股份有限公司 指纹识别基板及指纹识别方法、显示装置
IN202221001096A (zh) * 2022-01-08 2022-11-25

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JPS62103587A (ja) * 1985-10-30 1987-05-14 Nec Corp レ−ザレ−ダ装置
JPH01116617A (ja) * 1987-10-30 1989-05-09 Meisei Electric Co Ltd 光学フイルタの通過波長帯域制御装置
JPH04113235A (ja) * 1990-09-04 1992-04-14 Minolta Camera Co Ltd 光センサー
JPH055805A (ja) * 1991-06-27 1993-01-14 Mitsubishi Cable Ind Ltd 波長可変フイルタモジユール
JPH0961732A (ja) * 1995-08-28 1997-03-07 Fujitsu Ltd チューナブルフィルタモジュール
JP2001317938A (ja) * 2000-05-01 2001-11-16 Asahi Optical Co Ltd 光波距離計を有する測量機
JP2007085832A (ja) * 2005-09-21 2007-04-05 Omron Corp 光学式レーダ装置
JP2008070157A (ja) * 2006-09-12 2008-03-27 Sanyo Electric Co Ltd レーザ照射装置、レーザレーダ装置およびレーザ照射装置の校正方法

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US7130056B2 (en) * 2004-02-20 2006-10-31 Agilent Technologies, Inc. System and method of using a side-mounted interferometer to acquire position information
US7773172B2 (en) * 2005-03-01 2010-08-10 Northrop Grumman Corporation Line attenuation tunable optical filter
JP2010122183A (ja) 2008-11-21 2010-06-03 Sanyo Electric Co Ltd 物体検出装置および情報取得装置

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62103587A (ja) * 1985-10-30 1987-05-14 Nec Corp レ−ザレ−ダ装置
JPH01116617A (ja) * 1987-10-30 1989-05-09 Meisei Electric Co Ltd 光学フイルタの通過波長帯域制御装置
JPH04113235A (ja) * 1990-09-04 1992-04-14 Minolta Camera Co Ltd 光センサー
JPH055805A (ja) * 1991-06-27 1993-01-14 Mitsubishi Cable Ind Ltd 波長可変フイルタモジユール
JPH0961732A (ja) * 1995-08-28 1997-03-07 Fujitsu Ltd チューナブルフィルタモジュール
JP2001317938A (ja) * 2000-05-01 2001-11-16 Asahi Optical Co Ltd 光波距離計を有する測量機
JP2007085832A (ja) * 2005-09-21 2007-04-05 Omron Corp 光学式レーダ装置
JP2008070157A (ja) * 2006-09-12 2008-03-27 Sanyo Electric Co Ltd レーザ照射装置、レーザレーダ装置およびレーザ照射装置の校正方法

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8218149B2 (en) 2008-11-21 2012-07-10 Sanyo Electric Co., Ltd. Object detecting device and information acquiring device
CN102822622A (zh) * 2011-03-25 2012-12-12 三洋电机株式会社 物体检测装置及信息取得装置
EP2530485A1 (de) * 2011-05-31 2012-12-05 Pepperl & Fuchs GmbH Optischer Sensor zum Nachweis von Objekten und Verfahren zum optischen Anzeigen von Informationen
WO2012163515A1 (de) * 2011-05-31 2012-12-06 Pepperl + Fuchs Gmbh Optischer sensor zum nachweis von objekten und verfahren zum optischen anzeigen von informationen
EP2555013A1 (de) * 2011-05-31 2013-02-06 Pepperl & Fuchs GmbH Optischer Sensor zum Nachweis von Objekten und Verfahren zum optischen Anzeigen von Informationen
CN106772310A (zh) * 2016-12-30 2017-05-31 南京理工大学 一种基于计算鬼成像的目标鉴定装置及其方法
CN106772310B (zh) * 2016-12-30 2019-05-07 南京理工大学 一种基于计算鬼成像的目标鉴定装置及其方法

Also Published As

Publication number Publication date
JP2010122183A (ja) 2010-06-03
CN102224431A (zh) 2011-10-19
US8218149B2 (en) 2012-07-10
US20110222064A1 (en) 2011-09-15

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