WO2009005060A1 - 電子ビームとレーザ光の衝突タイミング調整装置および方法 - Google Patents

電子ビームとレーザ光の衝突タイミング調整装置および方法 Download PDF

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Publication number
WO2009005060A1
WO2009005060A1 PCT/JP2008/061905 JP2008061905W WO2009005060A1 WO 2009005060 A1 WO2009005060 A1 WO 2009005060A1 JP 2008061905 W JP2008061905 W JP 2008061905W WO 2009005060 A1 WO2009005060 A1 WO 2009005060A1
Authority
WO
WIPO (PCT)
Prior art keywords
electron beam
laser light
moment
delay time
passing
Prior art date
Application number
PCT/JP2008/061905
Other languages
English (en)
French (fr)
Inventor
Hiroyuki Nose
Daisuke Ishida
Namio Kaneko
Yasuo Sakai
Mitsuru Uesaka
Fumito Sakamoto
Katsuhiro Dobashi
Original Assignee
Ihi Corporation
The University Of Tokyo
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ihi Corporation, The University Of Tokyo filed Critical Ihi Corporation
Priority to AT08790768T priority Critical patent/ATE550915T1/de
Priority to EP08790768A priority patent/EP2164307B1/en
Priority to US12/667,367 priority patent/US8000448B2/en
Publication of WO2009005060A1 publication Critical patent/WO2009005060A1/ja

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Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Plasma & Fusion (AREA)
  • X-Ray Techniques (AREA)
  • Lasers (AREA)
  • Optical Radar Systems And Details Thereof (AREA)

Abstract

　電子ビーム１の通過時からそれが予定衝突点９ａに到達するまでのビーム遅延時間ｔＢが、レーザ光３の発生指令からそれが予定衝突点９ａに到達するまでのレーザ遅延時間ｔＬよりも、所定の遅延時間Δｔ以上に長くなるように、電子ビームの通過経路上に電子ビーム検出装置３４を設ける。この装置３４により、電子ビームに影響を与えることなくその通過を検出し、その検出後、所定の遅延時間Δｔ（＝ｔＢ―ｔＬ）の経過後に、レーザ光指令遅延回路３６からレーザ光の発生指令を出力する。
PCT/JP2008/061905 2007-07-03 2008-07-01 電子ビームとレーザ光の衝突タイミング調整装置および方法 WO2009005060A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
AT08790768T ATE550915T1 (de) 2007-07-03 2008-07-01 Vorrichtung und verfahren zur anpassung der kollisionszeit zwischen elektronenstrahlen und laserlicht
EP08790768A EP2164307B1 (en) 2007-07-03 2008-07-01 Device and method for adjusting collision timing between electron beam and laser light
US12/667,367 US8000448B2 (en) 2007-07-03 2008-07-01 Device and method for adjusting collision timing between electron beam and laser light

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007175190A JP4793936B2 (ja) 2007-07-03 2007-07-03 電子ビームとレーザ光の衝突タイミング調整装置および方法
JP2007-175190 2007-07-03

Publications (1)

Publication Number Publication Date
WO2009005060A1 true WO2009005060A1 (ja) 2009-01-08

Family

ID=40226105

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/061905 WO2009005060A1 (ja) 2007-07-03 2008-07-01 電子ビームとレーザ光の衝突タイミング調整装置および方法

Country Status (5)

Country Link
US (1) US8000448B2 (ja)
EP (1) EP2164307B1 (ja)
JP (1) JP4793936B2 (ja)
AT (1) ATE550915T1 (ja)
WO (1) WO2009005060A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117545157A (zh) * 2024-01-09 2024-02-09 西南交通大学 一种用于测量等离子体电势和电场的诊断方法及系统

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5625414B2 (ja) * 2010-03-18 2014-11-19 株式会社Ihi Ｘ線発生方法
JP5113287B2 (ja) * 2011-11-01 2013-01-09 株式会社Ｉｈｉ Ｘ線計測装置及びｘ線計測方法
US9778391B2 (en) * 2013-03-15 2017-10-03 Varex Imaging Corporation Systems and methods for multi-view imaging and tomography
CN106793433A (zh) * 2016-12-07 2017-05-31 中国科学院光电研究院 一种具有高平均束流和单脉冲束流的小型化x射线仪

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JPH07110400A (ja) 1993-08-19 1995-04-25 Laser Gijutsu Sogo Kenkyusho 高輝度Ｘ線又はγ線の発生方法及び装置
JP2004226271A (ja) * 2003-01-23 2004-08-12 Sumitomo Heavy Ind Ltd Ｘ線発生装置及び発生方法
JP2004227952A (ja) * 2003-01-23 2004-08-12 Sumitomo Heavy Ind Ltd Ｘ線発生装置及び発生方法
JP2005285764A (ja) 2004-03-29 2005-10-13 General Electric Co <Ge> Ｘ線を発生するためのシステム及び方法
JP2006318746A (ja) 2005-05-12 2006-11-24 Ishikawajima Harima Heavy Ind Co Ltd 多色ｘ線発生装置

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JPS5990399A (ja) * 1982-09-07 1984-05-24 イメ−ジング・サイエンス・アソシエイツ・リミテツド・パ−トナ−シツプ Ｘ線発生方法及びその装置
JPH11142786A (ja) 1997-11-13 1999-05-28 Nippon Laser:Kk レーザー光路分配装置
JP3398908B2 (ja) * 1998-03-18 2003-04-21 住友重機械工業株式会社 電子／レーザ衝突型ｘ線発生装置及びｘ線発生方法
US6687333B2 (en) * 1999-01-25 2004-02-03 Vanderbilt University System and method for producing pulsed monochromatic X-rays
US6377651B1 (en) * 1999-10-11 2002-04-23 University Of Central Florida Laser plasma source for extreme ultraviolet lithography using a water droplet target
JP2001345503A (ja) 2000-05-31 2001-12-14 Toshiba Corp レーザ逆コンプトン光生成装置
JP3463281B2 (ja) 2000-06-28 2003-11-05 住友重機械工業株式会社 多軸レーザ加工装置及びレーザ加工方法
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US7382861B2 (en) * 2005-06-02 2008-06-03 John M. J. Madey High efficiency monochromatic X-ray source using an optical undulator
JP2006344731A (ja) 2005-06-08 2006-12-21 Ishikawajima Harima Heavy Ind Co Ltd レーザー光周回装置及びレーザー光周回方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07110400A (ja) 1993-08-19 1995-04-25 Laser Gijutsu Sogo Kenkyusho 高輝度Ｘ線又はγ線の発生方法及び装置
JP2004226271A (ja) * 2003-01-23 2004-08-12 Sumitomo Heavy Ind Ltd Ｘ線発生装置及び発生方法
JP2004227952A (ja) * 2003-01-23 2004-08-12 Sumitomo Heavy Ind Ltd Ｘ線発生装置及び発生方法
JP2005285764A (ja) 2004-03-29 2005-10-13 General Electric Co <Ge> Ｘ線を発生するためのシステム及び方法
JP2006318746A (ja) 2005-05-12 2006-11-24 Ishikawajima Harima Heavy Ind Co Ltd 多色ｘ線発生装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
KATSUHIRO DOHASHI: "Development of Small-Sized Hard X-Ray Source using X-band Linac", 27-TH LINAC TECHNOLOGY RESEARCH MEETING, 2002

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117545157A (zh) * 2024-01-09 2024-02-09 西南交通大学 一种用于测量等离子体电势和电场的诊断方法及系统
CN117545157B (zh) * 2024-01-09 2024-03-12 西南交通大学 一种用于测量等离子体电势和电场的诊断方法及系统

Also Published As

Publication number Publication date
JP2009016123A (ja) 2009-01-22
EP2164307A4 (en) 2011-08-31
US20110007875A1 (en) 2011-01-13
JP4793936B2 (ja) 2011-10-12
ATE550915T1 (de) 2012-04-15
EP2164307B1 (en) 2012-03-21
US8000448B2 (en) 2011-08-16
EP2164307A1 (en) 2010-03-17

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