WO2008155932A1 - 基板搬送方法 - Google Patents

基板搬送方法 Download PDF

Info

Publication number
WO2008155932A1
WO2008155932A1 PCT/JP2008/053141 JP2008053141W WO2008155932A1 WO 2008155932 A1 WO2008155932 A1 WO 2008155932A1 JP 2008053141 W JP2008053141 W JP 2008053141W WO 2008155932 A1 WO2008155932 A1 WO 2008155932A1
Authority
WO
WIPO (PCT)
Prior art keywords
substrates
hand
mounting portion
processing
carried
Prior art date
Application number
PCT/JP2008/053141
Other languages
English (en)
French (fr)
Inventor
Kenji Agou
Original Assignee
Ulvac, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ulvac, Inc. filed Critical Ulvac, Inc.
Priority to CN2008800016036A priority Critical patent/CN101584034B/zh
Priority to JP2009520371A priority patent/JP4809478B2/ja
Publication of WO2008155932A1 publication Critical patent/WO2008155932A1/ja
Priority to US12/486,238 priority patent/US7845897B2/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67754Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a batch of workpieces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B25HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25JMANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J11/00Manipulators not otherwise provided for
    • B25J11/0095Manipulators transporting wafers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B25HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25JMANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J15/00Gripping heads and other end effectors
    • B25J15/0052Gripping heads and other end effectors multiple gripper units or multiple end effectors
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B25HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25JMANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J9/00Programme-controlled manipulators
    • B25J9/02Programme-controlled manipulators characterised by movement of the arms, e.g. cartesian coordinate type
    • B25J9/04Programme-controlled manipulators characterised by movement of the arms, e.g. cartesian coordinate type by rotating at least one arm, excluding the head movement itself, e.g. cylindrical coordinate type or polar coordinate type
    • B25J9/041Cylindrical coordinate type
    • B25J9/042Cylindrical coordinate type comprising an articulated arm
    • B25J9/043Cylindrical coordinate type comprising an articulated arm double selective compliance articulated robot arms [SCARA]
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B25HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25JMANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J9/00Programme-controlled manipulators
    • B25J9/10Programme-controlled manipulators characterised by positioning means for manipulator elements
    • B25J9/106Programme-controlled manipulators characterised by positioning means for manipulator elements with articulated links
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67259Position monitoring, e.g. misposition detection or presence detection
    • H01L21/67265Position monitoring, e.g. misposition detection or presence detection of substrates stored in a container, a magazine, a carrier, a boat or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67742Mechanical parts of transfer devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68707Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S414/00Material or article handling
    • Y10S414/135Associated with semiconductor wafer handling
    • Y10S414/136Associated with semiconductor wafer handling including wafer orienting means
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S414/00Material or article handling
    • Y10S414/135Associated with semiconductor wafer handling
    • Y10S414/139Associated with semiconductor wafer handling including wafer charging or discharging means for vacuum chamber

Abstract

 複数枚の基板を一台のハンドに乗せて正確な位置に搬送する。搬送室内から処理室内に基板(16a,16b)を搬入する際に、ハンド(25)の第一の載置部(15a)を処理室に設けられた第一の処理位置(8a)の真上に位置させ、第一の載置部(15a)に配置された基板(16a)を持ち上げた後、ハンド(25)を微小移動させ、第二の載置部(15b)を第二の処理位置(8b)の真上に位置させる。次に、第二の載置部(15b)上の基板(16b)を持ち上げる。基板(16a,16b)と第一、第二の処理位置(8a,8b)の間からハンド(25)を抜き出し、基板(16a,16b)を降下させると、基板(16a,16b)は、第一、第二の処理位置(8a,8b)上に正確に配置される。上記と逆の手順で基板(16a,16b)をハンド(25)に乗せると、処理室内の基板(16a,16b)を第一、第二の載置部(15a,15b)上に正確に乗せて搬出することができる。
PCT/JP2008/053141 2007-06-19 2008-02-25 基板搬送方法 WO2008155932A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
CN2008800016036A CN101584034B (zh) 2007-06-19 2008-02-25 基板输送方法
JP2009520371A JP4809478B2 (ja) 2007-06-19 2008-02-25 基板搬送方法
US12/486,238 US7845897B2 (en) 2007-06-19 2009-06-17 Method for transporting substrates

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-161010 2007-06-19
JP2007161010 2007-06-19

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/486,238 Continuation US7845897B2 (en) 2007-06-19 2009-06-17 Method for transporting substrates

Publications (1)

Publication Number Publication Date
WO2008155932A1 true WO2008155932A1 (ja) 2008-12-24

Family

ID=40156094

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/053141 WO2008155932A1 (ja) 2007-06-19 2008-02-25 基板搬送方法

Country Status (6)

Country Link
US (1) US7845897B2 (ja)
JP (1) JP4809478B2 (ja)
KR (1) KR101044586B1 (ja)
CN (1) CN101584034B (ja)
TW (1) TWI382904B (ja)
WO (1) WO2008155932A1 (ja)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013082031A (ja) * 2011-10-07 2013-05-09 Ulvac Japan Ltd 搬送ロボット及び真空装置
JP2013546159A (ja) * 2010-09-15 2013-12-26 ユ−ジーン テクノロジー カンパニー.リミテッド 基板処理装置及び基板移送方法
JP2020061472A (ja) * 2018-10-10 2020-04-16 東京エレクトロン株式会社 基板処理システム
JP2022507753A (ja) * 2018-11-19 2022-01-18 マトソン テクノロジー インコーポレイテッド ワークピースを処理するためのシステムおよび方法
WO2024080332A1 (ja) * 2022-10-14 2024-04-18 川崎重工業株式会社 基板搬送ロボットシステム

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130287529A1 (en) * 2012-04-27 2013-10-31 Applied Materials, Inc. Method and apparatus for independent wafer handling
CN103317510A (zh) * 2013-05-09 2013-09-25 京东方科技集团股份有限公司 一种机械手设备
US9548231B2 (en) * 2013-06-05 2017-01-17 Persimmon Technologies, Corp. Robot and adaptive placement system and method

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10275848A (ja) * 1996-11-18 1998-10-13 Applied Materials Inc デュアル・ブレード・ロボット
JPH10340940A (ja) * 1997-06-06 1998-12-22 Anelva Corp 基板搬送システム及び半導体製造装置
JPH11163090A (ja) * 1997-12-02 1999-06-18 Mecs Corp 薄型ワークの搬送ロボット
JP2002343844A (ja) * 2001-05-11 2002-11-29 Kaijo Corp ウェーハハンドリング機構

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5879128A (en) 1996-07-24 1999-03-09 Applied Materials, Inc. Lift pin and support pin apparatus for a processing chamber
TW512478B (en) * 2000-09-14 2002-12-01 Olympus Optical Co Alignment apparatus
US6430468B1 (en) 2000-11-17 2002-08-06 Applied Materials, Inc. Method and apparatus for accurate placement of semiconductor wafers onto respective platforms within a single reaction chamber
JP4937459B2 (ja) * 2001-04-06 2012-05-23 東京エレクトロン株式会社 クラスタツールおよび搬送制御方法
US7008802B2 (en) * 2001-05-29 2006-03-07 Asm America, Inc. Method and apparatus to correct water drift
JP2003264214A (ja) * 2002-03-07 2003-09-19 Hitachi High-Technologies Corp 真空処理装置及び真空処理方法
US6887317B2 (en) * 2002-09-10 2005-05-03 Applied Materials, Inc. Reduced friction lift pin
US7204888B2 (en) * 2003-05-01 2007-04-17 Applied Materials, Inc. Lift pin assembly for substrate processing
JP4490341B2 (ja) * 2005-07-05 2010-06-23 株式会社ダイヘン リンク装置および搬送ロボット
TWM310091U (en) * 2006-10-02 2007-04-21 Forever Group Prec Ind Co Ltd Plate holding device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10275848A (ja) * 1996-11-18 1998-10-13 Applied Materials Inc デュアル・ブレード・ロボット
JPH10340940A (ja) * 1997-06-06 1998-12-22 Anelva Corp 基板搬送システム及び半導体製造装置
JPH11163090A (ja) * 1997-12-02 1999-06-18 Mecs Corp 薄型ワークの搬送ロボット
JP2002343844A (ja) * 2001-05-11 2002-11-29 Kaijo Corp ウェーハハンドリング機構

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013546159A (ja) * 2010-09-15 2013-12-26 ユ−ジーン テクノロジー カンパニー.リミテッド 基板処理装置及び基板移送方法
JP2013082031A (ja) * 2011-10-07 2013-05-09 Ulvac Japan Ltd 搬送ロボット及び真空装置
JP2020061472A (ja) * 2018-10-10 2020-04-16 東京エレクトロン株式会社 基板処理システム
JP7158238B2 (ja) 2018-10-10 2022-10-21 東京エレクトロン株式会社 基板処理システム
JP2022507753A (ja) * 2018-11-19 2022-01-18 マトソン テクノロジー インコーポレイテッド ワークピースを処理するためのシステムおよび方法
JP7254924B2 (ja) 2018-11-19 2023-04-10 マトソン テクノロジー インコーポレイテッド ワークピースを処理するためのシステムおよび方法
WO2024080332A1 (ja) * 2022-10-14 2024-04-18 川崎重工業株式会社 基板搬送ロボットシステム

Also Published As

Publication number Publication date
CN101584034A (zh) 2009-11-18
US7845897B2 (en) 2010-12-07
TWI382904B (zh) 2013-01-21
KR101044586B1 (ko) 2011-06-29
JPWO2008155932A1 (ja) 2010-08-26
KR20090095607A (ko) 2009-09-09
JP4809478B2 (ja) 2011-11-09
TW200918265A (en) 2009-05-01
CN101584034B (zh) 2011-05-18
US20090317226A1 (en) 2009-12-24

Similar Documents

Publication Publication Date Title
WO2008155932A1 (ja) 基板搬送方法
AU2003291439A1 (en) Apparatus and methods to process substrate surface features
EP1814142A4 (en) DEVICE AND METHOD FOR TRANSPORTING SUBSTRATES AND EXPOSURE DEVICE
WO2009094558A3 (en) Method for reversibly mounting a device wafer to a carrier substrate
TW200632995A (en) Single wafer dryer and drying methods
EP1443127B8 (en) Method for coating large-area substrates
AU2003235902A1 (en) Semiconductor substrate manufacturing method and semiconductor device manufacturing method, and semiconductor substrate and semiconductor device manufactured by the methods
AU2001266018A1 (en) Substrate with a reduced light-scattering, ultraphobic surface and a method for the production of the same
AU2003270040A1 (en) Fabrication method for a monocrystalline semiconductor layer on a substrate
AU2003211350A1 (en) Method for holding substrate in vacuum, method for manufacturing liquid crystal display device, and device for holding substrate
TW200731367A (en) Methods and apparatus for cleaning an edge of a substrate
WO2009060902A1 (ja) セラミックス基板、セラミックス基板の製造方法及びパワーモジュール用基板の製造方法
TW200722561A (en) Method of surface reconstruction for silicon carbide substrate
AU2003242422A1 (en) Substrate processing device and substrate processing method
WO2010022849A8 (de) Randentschichtung von dünnschicht-solar-modulen mittels ätzen
AU2003277790A1 (en) Apparatus for vacuum treating two dimensionally extended substrates and method for manufacturing such substrates
AU2003284537A1 (en) Substrate processing method and substrate processing device
WO2007076250A3 (en) Semiconductor device fabricated using sublimation
AU2003294188A1 (en) Method for manufacturing an organic electroluminescent display device, substrate to be used with such a method and an organic electroluminescent display device obtained with the method
SG162751A1 (en) Process for making a metal seed layer
AU2001292642A1 (en) Temporary protective covers
AU2003235846A1 (en) Substrate processing device, substrate processing method, and nozzle
AU2003229467A1 (en) Method and device for the production of an antireflective coating, antireflective coating, and antireflective-coated substrate
TW200743146A (en) Method of thinning a wafer
TW200633035A (en) Apparatus and method for wet treatment of wafers

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 200880001603.6

Country of ref document: CN

WWE Wipo information: entry into national phase

Ref document number: 2009520371

Country of ref document: JP

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 08711903

Country of ref document: EP

Kind code of ref document: A1

WWE Wipo information: entry into national phase

Ref document number: 1020097013356

Country of ref document: KR

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 08711903

Country of ref document: EP

Kind code of ref document: A1