WO2008152945A1 - 半導体発光装置及びその製造方法 - Google Patents

半導体発光装置及びその製造方法 Download PDF

Info

Publication number
WO2008152945A1
WO2008152945A1 PCT/JP2008/060209 JP2008060209W WO2008152945A1 WO 2008152945 A1 WO2008152945 A1 WO 2008152945A1 JP 2008060209 W JP2008060209 W JP 2008060209W WO 2008152945 A1 WO2008152945 A1 WO 2008152945A1
Authority
WO
WIPO (PCT)
Prior art keywords
semiconductor light
major surface
emitting device
manufacturing
same
Prior art date
Application number
PCT/JP2008/060209
Other languages
English (en)
French (fr)
Inventor
Kazuaki Tsutsumi
Yohei Ito
Yasuo Nakanishi
Shunji Nakata
Original Assignee
Rohm Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohm Co., Ltd. filed Critical Rohm Co., Ltd.
Priority to US12/452,049 priority Critical patent/US20100102341A1/en
Priority to DE112008001614T priority patent/DE112008001614T5/de
Priority to CN200880020294A priority patent/CN101689585A/zh
Priority to JP2009519229A priority patent/JPWO2008152945A1/ja
Publication of WO2008152945A1 publication Critical patent/WO2008152945A1/ja

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/20Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate
    • H01L33/22Roughened surfaces, e.g. at the interface between epitaxial layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/20Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/26Materials of the light emitting region
    • H01L33/30Materials of the light emitting region containing only elements of group III and group V of the periodic system
    • H01L33/32Materials of the light emitting region containing only elements of group III and group V of the periodic system containing nitrogen

Abstract

 第1の主面とその第1の主面に対向する第2の主面とを有し、第1の主面と第2の主面間の側面が粗面である透明基板と、透明基板の第1の主面上に配置され、窒化物半導体を積層してなる窒化物半導体層を有する半導体発光素子とを備える。
PCT/JP2008/060209 2007-06-15 2008-06-03 半導体発光装置及びその製造方法 WO2008152945A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
US12/452,049 US20100102341A1 (en) 2007-06-15 2008-06-03 Semiconductor light emitting device and method for manufacturing the same
DE112008001614T DE112008001614T5 (de) 2007-06-15 2008-06-03 Halbleiterlichtemissionsvorrichtung und Verfahren zu ihrer Herstellung
CN200880020294A CN101689585A (zh) 2007-06-15 2008-06-03 半导体发光装置及其制造方法
JP2009519229A JPWO2008152945A1 (ja) 2007-06-15 2008-06-03 半導体発光装置及びその製造方法

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
JP2007-158569 2007-06-15
JP2007-159095 2007-06-15
JP2007159095 2007-06-15
JP2007158569 2007-06-15
JP2007290618 2007-11-08
JP2007-290618 2007-11-08

Publications (1)

Publication Number Publication Date
WO2008152945A1 true WO2008152945A1 (ja) 2008-12-18

Family

ID=40129555

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/060209 WO2008152945A1 (ja) 2007-06-15 2008-06-03 半導体発光装置及びその製造方法

Country Status (7)

Country Link
US (1) US20100102341A1 (ja)
JP (1) JPWO2008152945A1 (ja)
KR (1) KR20100020521A (ja)
CN (1) CN101689585A (ja)
DE (1) DE112008001614T5 (ja)
TW (1) TW200903869A (ja)
WO (1) WO2008152945A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013004957A (ja) * 2011-06-17 2013-01-07 National Cheng Kung Univ 発光素子構造及びその製造方法
US8455332B2 (en) * 2009-05-01 2013-06-04 Bridgelux, Inc. Method and apparatus for manufacturing LED devices using laser scribing
JP2016525286A (ja) * 2013-07-18 2016-08-22 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 発光デバイスのウェファのダイシング

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7952106B2 (en) * 2009-04-10 2011-05-31 Everlight Electronics Co., Ltd. Light emitting diode device having uniform current distribution and method for forming the same
TWM366757U (en) * 2009-04-27 2009-10-11 Forward Electronics Co Ltd AC LED packaging structure
US8673662B2 (en) * 2009-07-29 2014-03-18 Tien-Tsai Lin Light-emitting diode cutting method and product thereof
JP5623791B2 (ja) * 2010-06-01 2014-11-12 株式会社ディスコ サファイア基板の加工方法
JP2012089709A (ja) * 2010-10-20 2012-05-10 Disco Abrasive Syst Ltd ワークの分割方法
US9502614B2 (en) * 2014-06-04 2016-11-22 Formosa Epitaxy Incorporation Light emitting diode chip, light emitting device, and wafer-level structure of light emitting diode
JP2016219547A (ja) * 2015-05-18 2016-12-22 ローム株式会社 半導体発光素子
WO2020116234A1 (ja) * 2018-12-04 2020-06-11 ハリマ化成株式会社 ハードコート層付モールド樹脂およびその製造方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004103672A (ja) * 2002-09-06 2004-04-02 Toshiba Corp 半導体発光素子および半導体発光装置
JP2004247411A (ja) * 2003-02-12 2004-09-02 Sharp Corp 半導体発光素子および製造方法
JP2005033196A (ja) * 2003-06-19 2005-02-03 Showa Denko Kk 半導体ウエーハのダイシング方法および発光ダイオードチップ
JP2006114820A (ja) * 2004-10-18 2006-04-27 Matsushita Electric Works Ltd 発光素子とその製造方法
JP2006253441A (ja) * 2005-03-11 2006-09-21 Kumamoto Univ ブレード加工方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5087949A (en) * 1989-06-27 1992-02-11 Hewlett-Packard Company Light-emitting diode with diagonal faces
US5900650A (en) * 1995-08-31 1999-05-04 Kabushiki Kaisha Toshiba Semiconductor device and method of manufacturing the same
JP3449201B2 (ja) 1997-11-28 2003-09-22 日亜化学工業株式会社 窒化物半導体素子の製造方法
US6413839B1 (en) * 1998-10-23 2002-07-02 Emcore Corporation Semiconductor device separation using a patterned laser projection
JP2001298214A (ja) * 2000-02-10 2001-10-26 Sharp Corp 半導体発光素子およびその製造方法
JP4083396B2 (ja) * 2000-07-10 2008-04-30 独立行政法人科学技術振興機構 紫外透明導電膜とその製造方法
JP2003124151A (ja) * 2001-10-17 2003-04-25 Disco Abrasive Syst Ltd サファイア基板のダイシング方法
JP3776824B2 (ja) * 2002-04-05 2006-05-17 株式会社東芝 半導体発光素子およびその製造方法
CN1241253C (zh) * 2002-06-24 2006-02-08 丰田合成株式会社 半导体元件的制造方法
SG130935A1 (en) * 2002-06-26 2007-04-26 Agency Science Tech & Res Method of cleaving gan/sapphire for forming laser mirror facets
CN1759492B (zh) * 2003-03-10 2010-04-28 丰田合成株式会社 固体元件装置的制造方法
JP4142080B2 (ja) * 2003-03-10 2008-08-27 豊田合成株式会社 発光素子デバイス
JP4029843B2 (ja) * 2004-01-19 2008-01-09 豊田合成株式会社 発光装置
US7170050B2 (en) * 2004-09-17 2007-01-30 Pacific Biosciences Of California, Inc. Apparatus and methods for optical analysis of molecules
JP5159040B2 (ja) * 2005-03-31 2013-03-06 株式会社光波 低温成長バッファ層の形成方法および発光素子の製造方法
US20070134833A1 (en) * 2005-12-14 2007-06-14 Toyoda Gosei Co., Ltd. Semiconductor element and method of making same
JP4984119B2 (ja) * 2006-08-28 2012-07-25 スタンレー電気株式会社 窒化物半導体結晶ないしそれを用いた発光素子及びその製造方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004103672A (ja) * 2002-09-06 2004-04-02 Toshiba Corp 半導体発光素子および半導体発光装置
JP2004247411A (ja) * 2003-02-12 2004-09-02 Sharp Corp 半導体発光素子および製造方法
JP2005033196A (ja) * 2003-06-19 2005-02-03 Showa Denko Kk 半導体ウエーハのダイシング方法および発光ダイオードチップ
JP2006114820A (ja) * 2004-10-18 2006-04-27 Matsushita Electric Works Ltd 発光素子とその製造方法
JP2006253441A (ja) * 2005-03-11 2006-09-21 Kumamoto Univ ブレード加工方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8455332B2 (en) * 2009-05-01 2013-06-04 Bridgelux, Inc. Method and apparatus for manufacturing LED devices using laser scribing
JP2013004957A (ja) * 2011-06-17 2013-01-07 National Cheng Kung Univ 発光素子構造及びその製造方法
JP2016525286A (ja) * 2013-07-18 2016-08-22 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 発光デバイスのウェファのダイシング

Also Published As

Publication number Publication date
CN101689585A (zh) 2010-03-31
TW200903869A (en) 2009-01-16
KR20100020521A (ko) 2010-02-22
US20100102341A1 (en) 2010-04-29
DE112008001614T5 (de) 2010-04-29
JPWO2008152945A1 (ja) 2010-08-26

Similar Documents

Publication Publication Date Title
WO2008152945A1 (ja) 半導体発光装置及びその製造方法
WO2009142391A3 (ko) 발광소자 패키지 및 그 제조방법
WO2009049958A3 (de) Verbund aus mindestens zwei halbleitersubstraten sowie herstellungsverfahren
TW200701335A (en) Nitride semiconductor device and manufacturing mathod thereof
WO2008051503A3 (en) Light-emitter-based devices with lattice-mismatched semiconductor structures
WO2006036297A3 (en) Organic electroluminescence device and method of production of same
WO2006095566A8 (en) Nitride semiconductor light-emitting device and method for fabrication thereof
WO2009005017A1 (ja) 半導体パッケージおよびその製造方法
EP3614442A3 (en) Semiconductor device having oxide semiconductor layer and manufactoring method thereof
SG144121A1 (en) Nitride semiconductor substrate and manufacturing method thereof
TW200711178A (en) Light-emitting element and manufacturing method thereof
WO2007124209A3 (en) Stressor integration and method thereof
TW200735348A (en) Semiconductor heterostructure and method for forming a semiconductor heterostructure
TW200802972A (en) GaN-based semiconductor light-emitting device and method for the fabrication thereof
WO2007078686A3 (en) Method of polishing a semiconductor-on-insulator structure
WO2011025149A3 (ko) 반도체 기판 제조 방법 및 발광 소자 제조 방법
WO2008154526A3 (en) Method to make low resistance contact
EP2075840A3 (en) Protection layer for wafer dicing and corresponding
WO2010027231A3 (ko) 리드 프레임 및 그 제조방법
WO2008021973A3 (en) Method of manufacturing a photodiode array with through-wafer vias
TW200605379A (en) Photoelectric conversion device, image sensor, and method for manufacturing photoelectric conversion device
WO2011129548A3 (en) Substrate assembly for crystal growth and fabricating method for light emitting device using the same
WO2009002129A3 (en) Semiconductor light emitting device and method of manufacturing the same
TW200746455A (en) Group III nitride semiconductor light-emitting device
WO2009057620A1 (ja) 圧力センサ及びその製造方法

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 200880020294.7

Country of ref document: CN

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 08765022

Country of ref document: EP

Kind code of ref document: A1

WWE Wipo information: entry into national phase

Ref document number: 2009519229

Country of ref document: JP

WWE Wipo information: entry into national phase

Ref document number: 1120080016143

Country of ref document: DE

ENP Entry into the national phase

Ref document number: 20107000757

Country of ref document: KR

Kind code of ref document: A

RET De translation (de og part 6b)

Ref document number: 112008001614

Country of ref document: DE

Date of ref document: 20100429

Kind code of ref document: P

122 Ep: pct application non-entry in european phase

Ref document number: 08765022

Country of ref document: EP

Kind code of ref document: A1