WO2008136432A1 - 表面検査装置 - Google Patents

表面検査装置 Download PDF

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Publication number
WO2008136432A1
WO2008136432A1 PCT/JP2008/058124 JP2008058124W WO2008136432A1 WO 2008136432 A1 WO2008136432 A1 WO 2008136432A1 JP 2008058124 W JP2008058124 W JP 2008058124W WO 2008136432 A1 WO2008136432 A1 WO 2008136432A1
Authority
WO
WIPO (PCT)
Prior art keywords
outer circumference
semiconductor wafer
imaging
lens
inspecting apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/058124
Other languages
English (en)
French (fr)
Japanese (ja)
Inventor
Yoshinori Hayashi
Masao Kawamura
Hideki Mori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shibaura Mechatronics Corp
Original Assignee
Shibaura Mechatronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shibaura Mechatronics Corp filed Critical Shibaura Mechatronics Corp
Priority to JP2009512994A priority Critical patent/JP5191484B2/ja
Priority to DE112008001114.1T priority patent/DE112008001114B4/de
Priority to KR1020097020908A priority patent/KR101120226B1/ko
Priority to US12/595,699 priority patent/US8023111B2/en
Publication of WO2008136432A1 publication Critical patent/WO2008136432A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9501—Semiconductor wafers
    • G01N21/9503—Wafer edge inspection
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
PCT/JP2008/058124 2007-04-27 2008-04-25 表面検査装置 Ceased WO2008136432A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2009512994A JP5191484B2 (ja) 2007-04-27 2008-04-25 表面検査装置
DE112008001114.1T DE112008001114B4 (de) 2007-04-27 2008-04-25 Vorrichtung für die Oberflächenprüfung
KR1020097020908A KR101120226B1 (ko) 2007-04-27 2008-04-25 표면 검사 장치
US12/595,699 US8023111B2 (en) 2007-04-27 2008-04-25 Surface inspection apparatus

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007120174 2007-04-27
JP2007-120174 2007-04-27

Publications (1)

Publication Number Publication Date
WO2008136432A1 true WO2008136432A1 (ja) 2008-11-13

Family

ID=39943539

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/058124 Ceased WO2008136432A1 (ja) 2007-04-27 2008-04-25 表面検査装置

Country Status (5)

Country Link
US (1) US8023111B2 (https=)
JP (2) JP5191484B2 (https=)
KR (1) KR101120226B1 (https=)
DE (1) DE112008001114B4 (https=)
WO (1) WO2008136432A1 (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010256090A (ja) * 2009-04-22 2010-11-11 Raytex Corp 表面検査用照明装置
CN115931903A (zh) * 2023-02-02 2023-04-07 苏州高视半导体技术有限公司 边缘检测镜头及系统

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110317003A1 (en) * 2010-06-02 2011-12-29 Porat Roy Method and system for edge inspection using a tilted illumination
US11026361B2 (en) * 2013-03-15 2021-06-01 John S. Youngquist Linear/angular correction of pick-and-place held component and related optical subsystem
KR20160040044A (ko) * 2014-10-02 2016-04-12 삼성전자주식회사 패널 검사장치 및 검사방법
WO2016090311A1 (en) 2014-12-05 2016-06-09 Kla-Tencor Corporation Apparatus, method and computer program product for defect detection in work pieces
JP6875285B2 (ja) 2015-03-13 2021-05-19 コーニング インコーポレイテッド エッジ強度試験方法および装置
CN107026095A (zh) * 2016-02-01 2017-08-08 易发精机股份有限公司 晶圆边缘量测模组
JP7161905B2 (ja) * 2018-10-15 2022-10-27 アルテミラ株式会社 缶蓋検査機並びにカメラ位置調整方法
KR102734714B1 (ko) * 2021-12-08 2024-11-27 주식회사 앤비젼 다면 이미징 광학 장치
CN114322773A (zh) * 2021-12-31 2022-04-12 杭州电子科技大学 一种用于长条薄片零件视觉检测的装置及其检测方法
KR102571868B1 (ko) * 2022-09-20 2023-08-30 주식회사 아이엠반도체 웨이퍼 엣지 검사용 광원 모듈 및 웨이퍼 엣지 검사 장치
JP2024158608A (ja) * 2023-04-28 2024-11-08 株式会社Ｓｃｒｅｅｎホールディングス 撮像装置、基板観察装置、基板処理装置および撮像方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09269298A (ja) * 1996-03-29 1997-10-14 Sumitomo Sitix Corp 端部欠陥検査方法とその装置
JP2002310924A (ja) * 2001-04-17 2002-10-23 Toray Ind Inc シートの欠陥検査装置及びシートの製造方法
JP2003065960A (ja) * 2001-08-24 2003-03-05 Kyoto Denkiki Kk Ｌｅｄ照明装置
JP2004191214A (ja) * 2002-12-12 2004-07-08 Kokusai Gijutsu Kaihatsu Co Ltd ライン照明装置及びライン照明装置を用いた検査装置
JP2006017685A (ja) * 2004-06-30 2006-01-19 Nippon Electro Sensari Device Kk 表面欠陥検査装置
WO2006059647A1 (ja) * 2004-11-30 2006-06-08 Shibaura Mechatronics Corporation 表面検査装置及び表面検査方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01233571A (ja) * 1988-03-15 1989-09-19 Fujitsu Ltd ピングリッドアレイ型部品のピン曲り検出装置
JPH04215045A (ja) * 1990-12-12 1992-08-05 Mitsubishi Rayon Co Ltd レーザ検査装置
JP4244305B2 (ja) * 2003-08-27 2009-03-25 株式会社トプコン 照明光学系及びこれを用いたパターン欠陥検査装置
JP4454356B2 (ja) * 2004-03-25 2010-04-21 シーシーエス株式会社 光照射装置及び光照射装置用ヘッド
US7280197B1 (en) * 2004-07-27 2007-10-09 Kla-Tehcor Technologies Corporation Wafer edge inspection apparatus

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09269298A (ja) * 1996-03-29 1997-10-14 Sumitomo Sitix Corp 端部欠陥検査方法とその装置
JP2002310924A (ja) * 2001-04-17 2002-10-23 Toray Ind Inc シートの欠陥検査装置及びシートの製造方法
JP2003065960A (ja) * 2001-08-24 2003-03-05 Kyoto Denkiki Kk Ｌｅｄ照明装置
JP2004191214A (ja) * 2002-12-12 2004-07-08 Kokusai Gijutsu Kaihatsu Co Ltd ライン照明装置及びライン照明装置を用いた検査装置
JP2006017685A (ja) * 2004-06-30 2006-01-19 Nippon Electro Sensari Device Kk 表面欠陥検査装置
WO2006059647A1 (ja) * 2004-11-30 2006-06-08 Shibaura Mechatronics Corporation 表面検査装置及び表面検査方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010256090A (ja) * 2009-04-22 2010-11-11 Raytex Corp 表面検査用照明装置
CN115931903A (zh) * 2023-02-02 2023-04-07 苏州高视半导体技术有限公司 边缘检测镜头及系统

Also Published As

Publication number Publication date
KR20090118105A (ko) 2009-11-17
KR101120226B1 (ko) 2012-03-20
JP2013033068A (ja) 2013-02-14
DE112008001114T5 (de) 2010-06-10
JP5191484B2 (ja) 2013-05-08
US8023111B2 (en) 2011-09-20
JPWO2008136432A1 (ja) 2010-07-29
DE112008001114B4 (de) 2014-02-27
JP5489186B2 (ja) 2014-05-14
US20100066998A1 (en) 2010-03-18

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