WO2010003163A3 - Vorrichtung zur prüfung von gegenständen - Google Patents

Vorrichtung zur prüfung von gegenständen Download PDF

Info

Publication number
WO2010003163A3
WO2010003163A3 PCT/AT2009/000268 AT2009000268W WO2010003163A3 WO 2010003163 A3 WO2010003163 A3 WO 2010003163A3 AT 2009000268 W AT2009000268 W AT 2009000268W WO 2010003163 A3 WO2010003163 A3 WO 2010003163A3
Authority
WO
WIPO (PCT)
Prior art keywords
illumination ring
light sources
light
arranged along
circular line
Prior art date
Application number
PCT/AT2009/000268
Other languages
English (en)
French (fr)
Other versions
WO2010003163A2 (de
Inventor
Gernot Kronreif
Werner Palfinger
Martin Kornfeld
Original Assignee
Profactor Research And Solutions Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Profactor Research And Solutions Gmbh filed Critical Profactor Research And Solutions Gmbh
Publication of WO2010003163A2 publication Critical patent/WO2010003163A2/de
Publication of WO2010003163A3 publication Critical patent/WO2010003163A3/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06146—Multisources for homogeneisation, as well sequential as simultaneous operation
    • G01N2201/06153—Multisources for homogeneisation, as well sequential as simultaneous operation the sources being LED's

Abstract

Bei der optischen Prüfung von Gegenständen ist vorgesehen, - dass als Beleuchtungseinheit eine Anzahl von längs zumindest einer Kreislinie angeordneten, einen Beleuchtungsring (2) ausbildenden Lichtquellen (7) verwendet wird, - dass die Lichtquellen (7) zu vorgegebenen Zeiten ein- und ausschaltbar und/oder bezüglich der Intensität des von ihnen abgestrahlten Lichtes regelbar sind, - dass eine Bildaufnahmeeinheit oder mit ihrem Bildbereich den innerhalb des Beleuchtungsringes oder -teilringes (2) gelegenen Objektbereich (8) erfasst und - dass der Abstand zwischen den einzelnen längs des Beleuchtungsringes (2) angeordneten Lichtquellen (7) oder von von den Lichtquellen (7) gebildeten Leuchtsegmenten (7") oder Untersegmenten (7"') oder die Umfangserstreckung von nicht Licht abstrahlenden, längs der Kreislinie liegenden Bereichen des Beleuchtungsringes (2) einen Zentriwinkel (Mittelpunktswinkel) σ ≤ 10° ergibt.
PCT/AT2009/000268 2008-07-09 2009-07-08 Vorrichtung zur prüfung von gegenständen WO2010003163A2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
AT10772008A AT507018B1 (de) 2008-07-09 2008-07-09 Vorrichtung zur prüfung von gegenständen
ATA1077/2008 2008-07-09

Publications (2)

Publication Number Publication Date
WO2010003163A2 WO2010003163A2 (de) 2010-01-14
WO2010003163A3 true WO2010003163A3 (de) 2010-03-04

Family

ID=41254614

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/AT2009/000268 WO2010003163A2 (de) 2008-07-09 2009-07-08 Vorrichtung zur prüfung von gegenständen

Country Status (2)

Country Link
AT (1) AT507018B1 (de)
WO (1) WO2010003163A2 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110082860B (zh) * 2014-12-02 2021-11-23 江苏宇特光电科技股份有限公司 光纤端面抛光检测设备及方法

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* Cited by examiner, † Cited by third party
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CN102269967B (zh) * 2010-06-07 2013-02-13 天津海鸥表业集团有限公司 一种手表的恒力装置
JP2012063269A (ja) * 2010-09-16 2012-03-29 Sony Corp 測定装置及び測定方法
DE102010037746B4 (de) * 2010-09-23 2013-01-24 Carl Mahr Holding Gmbh Verfahren zum optischen Antasten einer Kante in oder an einem Oberflächenbereich
DE102011113670A1 (de) 2011-09-20 2013-03-21 Schott Ag Beleuchtungsvorrichtung, Inspektionsvorrichtung und Inspektionsverfahren für die optische Prüfung eines Objekts
WO2013156926A1 (en) * 2012-04-20 2013-10-24 Koninklijke Philips N.V. Lighting apparatus for providing light for processing an object
TWI470214B (zh) * 2013-10-01 2015-01-21 Utechzone Co Ltd Optical testing equipment and methods
DE102014220598B4 (de) * 2014-10-10 2023-07-13 Krones Aktiengesellschaft Inspektionsvorrichtung und Verfahren zur Durchlichtinspektion von Behältern
JP2017067632A (ja) * 2015-09-30 2017-04-06 キヤノン株式会社 検査装置および物品製造方法
EP3236198B1 (de) * 2016-04-18 2021-03-10 VITRONIC Dr.-Ing. Stein Bildverarbeitungssysteme GmbH Schaltbare linienbeleuchtung
US10650646B2 (en) * 2017-12-06 2020-05-12 Illinois Tool Works Inc. Method of increasing detection zone of a shadow-based video intrusion detection system
FR3082601B1 (fr) * 2018-06-18 2020-10-16 Valeo Materiaux De Friction Dispositif d'eclairage annulaire pour le controle d'aspect d'une surface discoide
DE102018213740A1 (de) * 2018-08-15 2020-02-20 Robert Bosch Gmbh Messvorrichtung und Verfahren zur Bestimmung einer Oberfläche
EP4127311A1 (de) * 2020-03-23 2023-02-08 Voith Patent GmbH Verfahren und vorrichtung zur ermittlung der faserorientierung

Citations (5)

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Publication number Priority date Publication date Assignee Title
US5060065A (en) * 1990-02-23 1991-10-22 Cimflex Teknowledge Corporation Apparatus and method for illuminating a printed circuit board for inspection
WO1999022224A1 (en) * 1997-10-29 1999-05-06 Vista Computer Vision Ltd. Illumination system for object inspection
WO2002006798A1 (en) * 2000-07-19 2002-01-24 Intelligent Reasoning Systems, Inc. Multi-angle inspection for products
US20020093809A1 (en) * 2001-01-12 2002-07-18 Ccs Inc. Inspection illuminator
US20040175027A1 (en) * 2003-03-07 2004-09-09 James Mahon Machine vision inspection system and method

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Publication number Priority date Publication date Assignee Title
US4606645A (en) * 1984-10-29 1986-08-19 Weyerhaeuser Company Method for determining localized fiber angle in a three dimensional fibrous material
DE4312452A1 (de) * 1993-04-16 1994-10-20 Erhardt & Leimer Gmbh Verfahren zur berührungslosen optischen Messung von qualitätsbestimmenden Parametern textiler Oberflächen sowie Anordnung zur Durchführung des Verfahrens
US5640244A (en) * 1995-11-02 1997-06-17 Abb Industrial Systems, Inc. Method and apparatus for on-line determination of fiber orientation and anisotropy in a non-woven web
US7695592B2 (en) * 2005-04-21 2010-04-13 Honeywell International Inc. Method and apparatus for measuring fiber orientation of a moving web
JP4600763B2 (ja) * 2005-09-20 2010-12-15 横河電機株式会社 配向計

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5060065A (en) * 1990-02-23 1991-10-22 Cimflex Teknowledge Corporation Apparatus and method for illuminating a printed circuit board for inspection
WO1999022224A1 (en) * 1997-10-29 1999-05-06 Vista Computer Vision Ltd. Illumination system for object inspection
WO2002006798A1 (en) * 2000-07-19 2002-01-24 Intelligent Reasoning Systems, Inc. Multi-angle inspection for products
US20020093809A1 (en) * 2001-01-12 2002-07-18 Ccs Inc. Inspection illuminator
US20040175027A1 (en) * 2003-03-07 2004-09-09 James Mahon Machine vision inspection system and method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110082860B (zh) * 2014-12-02 2021-11-23 江苏宇特光电科技股份有限公司 光纤端面抛光检测设备及方法

Also Published As

Publication number Publication date
WO2010003163A2 (de) 2010-01-14
AT507018B1 (de) 2012-11-15
AT507018A1 (de) 2010-01-15

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