WO2008126747A1 - 試験装置、試験方法、および電子デバイス - Google Patents

試験装置、試験方法、および電子デバイス Download PDF

Info

Publication number
WO2008126747A1
WO2008126747A1 PCT/JP2008/056612 JP2008056612W WO2008126747A1 WO 2008126747 A1 WO2008126747 A1 WO 2008126747A1 JP 2008056612 W JP2008056612 W JP 2008056612W WO 2008126747 A1 WO2008126747 A1 WO 2008126747A1
Authority
WO
WIPO (PCT)
Prior art keywords
test
pattern
device under
order
testing
Prior art date
Application number
PCT/JP2008/056612
Other languages
English (en)
French (fr)
Inventor
Tatsuya Yamada
Kiyoshi Murata
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to DE112008001032T priority Critical patent/DE112008001032T5/de
Priority to JP2009509283A priority patent/JP5175840B2/ja
Publication of WO2008126747A1 publication Critical patent/WO2008126747A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/10—Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns 
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

　被試験デバイスを試験する試験装置であって、被試験デバイスを試験するための試験シーケンスを定める試験命令列を圧縮形式で記憶するパターンメモリと、パターンメモリから読み出された試験命令列を非圧縮形式に展開する展開部と、展開部により展開された試験命令列をキャッシングする命令キャッシュと、命令キャッシュに格納された命令を順次読み出して実行し、実行される命令に対する試験パターンを発生するパターン発生部と、試験パターンに基づく試験信号を生成し、被試験デバイスに供給する信号出力部とを備える試験装置を提供する。
PCT/JP2008/056612 2007-04-09 2008-04-02 試験装置、試験方法、および電子デバイス WO2008126747A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE112008001032T DE112008001032T5 (de) 2007-04-09 2008-04-02 Prüfgerät, Prüfverfahren und elektronische Vorrichtung
JP2009509283A JP5175840B2 (ja) 2007-04-09 2008-04-02 試験装置、試験方法、および電子デバイス

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/733,174 2007-04-09
US11/733,174 US7603604B2 (en) 2007-04-09 2007-04-09 Test apparatus and electronic device

Publications (1)

Publication Number Publication Date
WO2008126747A1 true WO2008126747A1 (ja) 2008-10-23

Family

ID=39828028

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/056612 WO2008126747A1 (ja) 2007-04-09 2008-04-02 試験装置、試験方法、および電子デバイス

Country Status (6)

Country Link
US (1) US7603604B2 (ja)
JP (1) JP5175840B2 (ja)
KR (1) KR20090131676A (ja)
DE (1) DE112008001032T5 (ja)
TW (1) TW200841033A (ja)
WO (1) WO2008126747A1 (ja)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7539902B2 (en) * 2006-10-19 2009-05-26 Sun Microsystems, Inc. Application level testing of instruction caches in multi-processor/multi-core systems
CN101398752B (zh) * 2007-09-29 2011-08-31 国际商业机器公司 重叠指令存取单元和重叠指令存取方法
JP5153670B2 (ja) * 2009-01-30 2013-02-27 株式会社アドバンテスト 診断装置、診断方法および試験装置
US8706439B2 (en) * 2009-12-27 2014-04-22 Advantest Corporation Test apparatus and test method
CN102142284A (zh) * 2010-01-29 2011-08-03 京元电子股份有限公司 可扩充样本储存器的储存器测试设备
WO2012073395A1 (ja) * 2010-11-29 2012-06-07 株式会社アドバンテスト 通信システムおよび試験装置
JP7208448B2 (ja) * 2019-02-01 2023-01-19 富士通株式会社 情報処理装置、情報処理プログラム、及び情報処理方法
CN112433765B (zh) * 2020-11-26 2023-09-08 海光信息技术股份有限公司 一种数据存储方法、装置、处理器及电子设备
CN116643140A (zh) * 2022-02-15 2023-08-25 华为技术有限公司 集成电路及集成电路的测试方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0269685A (ja) * 1988-09-06 1990-03-08 Hitachi Ltd Ｉｃ試験装置
JPH0742150Y2 (ja) * 1989-12-11 1995-09-27 株式会社アドバンテスト テストパタン発生器
JP2000040389A (ja) * 1998-07-24 2000-02-08 Advantest Corp 半導体試験装置の試験方法
JP2000162287A (ja) * 1998-11-24 2000-06-16 Advantest Corp パターン信号を生成するパターン発生器
JP2002521698A (ja) * 1998-07-30 2002-07-16 クリーダンス システムズ コーポレイション アルゴリズミックパターン発生器
JP2003028936A (ja) * 2001-07-16 2003-01-29 Mitsubishi Electric Corp 半導体装置のテストパターン編集方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0742150A (ja) 1993-07-27 1995-02-10 Taisei Corp 山留め用鋼管の打込み装置と打込み方法
US5737512A (en) * 1996-05-22 1998-04-07 Teradyne, Inc. Fast vector loading for automatic test equipment
DE19955380C2 (de) * 1998-11-10 2003-10-30 Advantest Corp Prüfmustergenerator, Prüfvorrichtung und Verfahren zum Erzeugen von Prüfmustern
JP4285816B2 (ja) 1999-01-19 2009-06-24 株式会社アドバンテスト パターン発生器、パターン発生方法及び試験装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0269685A (ja) * 1988-09-06 1990-03-08 Hitachi Ltd Ｉｃ試験装置
JPH0742150Y2 (ja) * 1989-12-11 1995-09-27 株式会社アドバンテスト テストパタン発生器
JP2000040389A (ja) * 1998-07-24 2000-02-08 Advantest Corp 半導体試験装置の試験方法
JP2002521698A (ja) * 1998-07-30 2002-07-16 クリーダンス システムズ コーポレイション アルゴリズミックパターン発生器
JP2000162287A (ja) * 1998-11-24 2000-06-16 Advantest Corp パターン信号を生成するパターン発生器
JP2003028936A (ja) * 2001-07-16 2003-01-29 Mitsubishi Electric Corp 半導体装置のテストパターン編集方法

Also Published As

Publication number Publication date
US20080250291A1 (en) 2008-10-09
US7603604B2 (en) 2009-10-13
JP5175840B2 (ja) 2013-04-03
TW200841033A (en) 2008-10-16
JPWO2008126747A1 (ja) 2010-07-22
KR20090131676A (ko) 2009-12-29
TWI365996B (ja) 2012-06-11
DE112008001032T5 (de) 2010-03-11

Similar Documents

Publication Publication Date Title
WO2008126747A1 (ja) 試験装置、試験方法、および電子デバイス
WO2008114654A1 (ja) 試験装置および電子デバイス
TW200623125A (en) Clock signal generation apparatus for use in semiconductor memory device and its method
WO2008114697A1 (ja) 試験装置、及び電子デバイス
WO2006026526A3 (en) Memory system and method for strobing data, command and address signals
EP1818841A3 (en) Method and device for content reproduction list generation
TW200802395A (en) Semiconductor testing apparatus and semiconductor memory testing method
WO2008019259A3 (en) Architecture for back up and/or recovery of electronic data
TW200615944A (en) Memory hub tester interface and method for use thereof
WO2010105238A3 (en) General purpose protocol engine
ATE511670T1 (de) Konfigurationsverfahren für steuergeräte
TW200739106A (en) Test system and method for testing electronic devices using a pipelined testing architecture
TW200702980A (en) Error-correcting apparatus including multiple error-correcting modules functioning in parallel and related method
WO2010047792A3 (en) Environmental sensing and communication
TW200615753A (en) Hub, memory module, memory system and methods for reading and writing to the same
EP2302562A3 (en) Automatic testing system and automatic testing method for testing barcode identification apparatus
TW200625324A (en) Method of testing a memory module and hub of the memory module
WO2009013679A3 (en) Device and method for physical training
WO2008117381A1 (ja) 試験装置及び電子デバイス
TW200641625A (en) Command protocol method for nonvolatile memory
EP1909236A3 (en) System and method for storing a vehicle location on the occurrence of an error
TW200629284A (en) Semiconductor memory device and method of testing the same
TW200637149A (en) Clock converting device and testing device
WO2009011028A1 (ja) 電子デバイス、ホスト装置、通信システム、およびプログラム
EP2128765A3 (en) Systems and methods for diagnosing faults in electronic systems

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 08739722

Country of ref document: EP

Kind code of ref document: A1

ENP Entry into the national phase

Ref document number: 2009509283

Country of ref document: JP

Kind code of ref document: A

WWE Wipo information: entry into national phase

Ref document number: 1120080010323

Country of ref document: DE

ENP Entry into the national phase

Ref document number: 20097023079

Country of ref document: KR

Kind code of ref document: A

RET De translation (de og part 6b)

Ref document number: 112008001032

Country of ref document: DE

Date of ref document: 20100311

Kind code of ref document: P

122 Ep: pct application non-entry in european phase

Ref document number: 08739722

Country of ref document: EP

Kind code of ref document: A1