WO2008029943A1 - Lift pin mechanism - Google Patents

Lift pin mechanism Download PDF

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Publication number
WO2008029943A1
WO2008029943A1 PCT/JP2007/067569 JP2007067569W WO2008029943A1 WO 2008029943 A1 WO2008029943 A1 WO 2008029943A1 JP 2007067569 W JP2007067569 W JP 2007067569W WO 2008029943 A1 WO2008029943 A1 WO 2008029943A1
Authority
WO
WIPO (PCT)
Prior art keywords
lift pin
elevating
pin mechanism
lift
cam
Prior art date
Application number
PCT/JP2007/067569
Other languages
French (fr)
Japanese (ja)
Inventor
Masaaki Chikaike
Original Assignee
Semiconductor & Display Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semiconductor & Display Corporation filed Critical Semiconductor & Display Corporation
Priority to JP2008533220A priority Critical patent/JP5561664B2/en
Publication of WO2008029943A1 publication Critical patent/WO2008029943A1/en

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65GTRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G49/00Conveying systems characterised by their application for specified purposes not otherwise provided for
    • B65G49/05Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
    • B65G49/06Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
    • B65G49/061Lifting, gripping, or carrying means, for one or more sheets forming independent means of transport, e.g. suction cups, transport frames
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65GTRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G49/00Conveying systems characterised by their application for specified purposes not otherwise provided for
    • B65G49/05Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
    • B65G49/06Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/67034Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68742Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65GTRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G2249/00Aspects relating to conveying systems for the manufacture of fragile sheets
    • B65G2249/02Controlled or contamination-free environments or clean space conditions

Definitions

  • the present invention relates to a lift pin mechanism that supports a substrate to be processed from below when processing the substrate to be processed, and particularly relates to a lift pin mechanism that is suitable for use in heat treatment of a glass substrate for a liquid crystal display, a semiconductor wafer, or the like. .
  • a coating film is formed on the surface and subjected to a drying treatment.
  • the substrate to be processed is supported by lift pins from below during the heat treatment or the like.
  • a glass substrate constituting this liquid crystal display is coated with a coating film and dried.
  • a lift pin mechanism is used.
  • the coating film drying oven provided is used. The force that dries the coating film by supporting the glass substrate with the lift pins in the coating film drying furnace and heating it to a high temperature. At this time, the overheated lift pins are newly processed, and the back surface of the cooled glass substrate.
  • the coating film may be adversely affected by heating locally while in contact with the coating.
  • the conventional coating film drying furnace described in the cited document 1 has a five-stage coating film drying furnace 1 in which a hot plate heater 2 and a drying chamber 3 are sequentially arranged.
  • the drying chambers of 3, 3, ⁇ ⁇ ⁇ are formed.
  • a transfer port 4 is provided on the side surface of the drying chamber 3, and a transfer door 5 for opening and closing the transfer port 4 is provided.
  • the glass substrate 6 is taken into and out of the drying chamber 3 by the transfer robot 7 that has received the glass substrate 6 sent from the previous step.
  • the transfer robot 7 moves up and down according to the transfer port 4 of each drying chamber 3 and has an arm 8 extending from the transfer port 4 into the drying chamber 3, and the glass substrate 6 is placed on the arm 8. Then, it is carried into the drying chamber 3.
  • the glass substrate 6 is formed in a rectangular shape, and a coating film 9 is printed on the upper surface 6a thereof. ing.
  • the feeding means 10 is provided on the upper surface of the hot plate heater 2 that is the bottom surface of the drying chamber 3.
  • the feeding means 10 includes a support pin 11 that is in contact with and supported by the lower surface of the glass substrate 6 carried in from the transport port 4, and a moving pin 12.
  • the moving pin 12 has a tip 12a of the moving pin 12 attached to a vertical air cylinder 13 that moves vertically to a position lower and higher than the tip 1 la of the support pin 11!
  • the vertical air cylinder 13 is attached to a horizontal air cylinder 14 which is a horizontal expansion / contraction mechanism that moves in the horizontal direction.
  • the glass substrate 6 is dried as follows.
  • a glass substrate 6 is placed on the arm 8 of the transfer robot 7 and is carried into the drying chamber 3.
  • the carry-in door 5 is opened at the transfer port 4 of the drying chamber 3.
  • the glass substrate 6 supported on the arm 8 is carried into the drying chamber 3 from the transfer port 4, the arm 8 is lowered, and the glass substrate 6 is placed on the support pins 11.
  • the carry-in door 5 is closed (the state shown in FIG. 3 (a)).
  • the inside of the drying chamber 3 is controlled to the set temperature by the hot plate heater 2.
  • the horizontal air cylinder 14 moves the vertical air cylinder 13 and the moving pin 12 (moved to the right in FIG. 3 (c)) to move the glass substrate 6, and the vertical air cylinder 13 moves the moving pin. 12 is lowered (the state shown in FIG. 3D), and the glass substrate 6 is placed on the support pins 11. Next, move the moving pin 12 back to its original position (the state shown in Fig. 3 (e)) using /!
  • This series of movements is taken as one cycle, and this cycle is repeated many times during the drying time. This cycle is less likely to cause pin marks as the moving speed of the moving pin 12 increases, but is approximately 4 to 8 seconds depending on the thickness of the coating film.
  • the lift pin rises again, receives the substrate from the fixed pin, and raises it to a predetermined position. In this way, do not keep the same position on the board with the pins, and no pin marks will be generated! /.
  • Patent Document 1 Japanese Patent Laid-Open No. 2006-61755
  • Patent Document 2 Japanese Patent Laid-Open No. 10-76211
  • the thermal conductivity is poor due to the thickness and material of the glass substrate 6, and it is difficult to transfer heat to the coating film 9 on the upper surface of the glass substrate 6. If the glass substrate 6 is thin or has a good thermal conductivity, heat is transferred to the coating film 9, resulting in drying irregularities and pin marks.
  • the reduced-pressure drying apparatus of Patent Document 2 has a configuration in which different positions on the lower surface of the glass substrate are alternately supported by the fixing pins and the lift pins and dried, but is supported alternately at two points. Therefore, if the glass substrate is thin or has good thermal conductivity, heat will be transferred to the coating film, which will cause adverse effects such as uneven drying and pin marks.
  • the present invention has been made in consideration of the above-described problems, and an object thereof is to provide a lift pin mechanism that minimizes the influence on a substrate to be processed by pins that are supported by contact. Means to solve
  • the present invention is configured to contact a substrate to be processed from below.
  • a lift pin mechanism including supporting lift pins, each of the lift pins being moved up and down one by one or two or more of the lift pins at the same time and in sequence.
  • an elevating pin unit which supports the upper end of the substrate to be brought into contact with the lower surface of the substrate to be processed, and a plurality of the elevating pin units are arranged below the substrate to be processed.
  • the plurality of lifting pin units disposed on the lower side of the substrate to be processed lifts the lifting pins one by one or two or more simultaneously and sequentially, By bringing the upper end into contact with the lower surface of the processing target substrate, the processing target substrate is supported by the lift pins.
  • FIG. 1 is a perspective view showing a lift pin mechanism according to a first embodiment of the present invention.
  • FIG. 2 is a schematic side view showing a conventional coating film drying furnace.
  • FIG. 3 is a schematic diagram showing the operation of a moving pin of a conventional coating film drying furnace.
  • FIG. 4 is a main part enlarged view showing a lift pin mechanism according to the first embodiment of the present invention.
  • FIG. 5 is a schematic diagram showing an operation in which cross sections A, B, C, and D in FIG. 4 are arranged at intervals of lifting pins for convenience.
  • Fig. 6 is a plan view of the lift pin mechanism that exerts a force according to the first embodiment of the present invention when viewed from the upper side of the hot plate.
  • FIG. 7 is a front view showing a lift pin mechanism according to the first embodiment of the present invention.
  • FIG. 8 is an enlarged view of a main part showing a cam mechanism of a lift pin mechanism according to a second embodiment of the present invention.
  • FIG. 9 is a schematic configuration diagram showing thermal expansion absorbing means of a lift pin mechanism according to a second embodiment of the present invention.
  • FIG. 10 is a schematic configuration diagram showing a modification of the second embodiment of the present invention.
  • FIG. 11 is a schematic configuration diagram showing a lift pin mechanism according to a third embodiment of the present invention.
  • FIG. 12 is a schematic configuration diagram showing a lift pin mechanism according to a third embodiment of the present invention.
  • FIG. 13 is a side view showing an eccentric cam according to a modification of the present invention.
  • FIG. 14 is a side view showing a linear cam according to a modification of the present invention.
  • FIG. 15 is a front view showing a lift pin mechanism according to a modification of the present invention.
  • FIG. 16 is a side view showing a cam mechanism and a vacuum chamber of a lift pin mechanism that exerts force on an embodiment of the present invention.
  • the lift pin mechanism of the present invention is an improved apparatus that minimizes the influence on the substrate to be processed by the pins that contact the substrate to be processed and support the substrate to be processed. This effect may be due to heat or static electricity.
  • a coating film drying furnace similar to the prior art will be described as an example.
  • the substrate to be processed is a glass substrate having a coating film on the upper surface. Since the entire configuration of the coating film drying furnace is the same as that of the prior art, the description here will focus on the lift pin mechanism.
  • the lift pin mechanism 21 is a mechanism for supporting the glass substrate 26 (see FIG. 4) from below.
  • the lift pin mechanism 21 is configured to include a plurality of lifting pin units 22 disposed below the glass substrate 26 over the entire area of the glass substrate 26.
  • This lifting pin unit 22 is composed of four lifting pins 23 as a set, and lifts and lowers one or more of the lifting pins 23 one by one or two at a time.
  • the top This is a device for contacting and supporting the lower surface of the glass substrate 26.
  • the elevating pin unit 22 includes an elevating pin 23, an elevating means 24, and a drive unit 25.
  • the elevating pin 23 is a material for supporting the glass substrate 26 from below while being supported so as to be movable up and down.
  • the elevating pin 23 is composed of a shaft portion 27 and a head portion 28.
  • the shaft portion 27 is a portion that is supported so as to move up and down and moves up and down by the lifting means 24.
  • the head portion 28 is a portion that is provided integrally with the lower end portion of the shaft portion 27 and that abuts on an eccentric cam 36 of the elevating means 24 described later and follows the cam surface.
  • the head 28 is brought into contact with and follows the cam surface of the eccentric cam 36 so that the elevating pin 23 moves up and down along the shape of the cam surface.
  • the elevating pin 23 is provided with a spring 29 (see FIG. 4) as required.
  • the spring 29 urges the elevating pin 23 downward so that the elevating pin 23 pushed up by the eccentric cam 36 moves up and down following the cam surface of the eccentric cam 36.
  • the elevating means 24 is a device for moving the elevating pin 23 up and down.
  • the elevating means 24 includes a cam mechanism 30, a connecting shaft 31, and a coupling 32.
  • the cam mechanism 30 is a device for raising and lowering the lift pin 23 by contacting the head 28 at the lower end of the lift pin 23.
  • the cam mechanism 30 includes a camshaft 35 that is rotatably supported in a container 34, and four eccentric force members 36 provided on the camshaft 35. ing. All of the four eccentric cams 36 have a circular outer peripheral cam surface, and are arranged by changing the eccentric direction by 90 degrees sequentially from the cam at one end thereof. As a result, the four lifting pins 23 are pushed up one by one from the one end in order and are in contact with and supported by the back surface of the glass substrate 26.
  • the connecting shaft 31 is a shaft that is connected to the camshaft 35 and transmits torque from the drive unit 25.
  • the coupling 32 is a member for connecting the connecting shafts 31 to each other, and a motor connecting shaft 39 of the drive motor 38 to be described later and the connecting shaft 31.
  • the coupling 32 has a connecting hole 32A in which the motor connecting shaft 39 and the connecting shaft 31 are fitted in the center of the cylindrical main body.
  • the connecting shaft 31 and the like are inserted into the connecting hole 32A and the tips of the connecting holes 32A are inserted.
  • the drive unit 25 includes a drive motor 38 and a motor connecting shaft 39! /. Driving mode
  • the motor 38 is a motor that drives the cam shaft 35 of the cam mechanism 30.
  • the drive motor 38 is connected to a control unit 40 that controls the drive motor 38.
  • the controller 40 is a device for adjusting the speed at which the ascending / descending means 24 is driven.
  • the control unit 40 is configured as an independent device that controls only the drive motor 38, or is incorporated as a part of a control unit (not shown) that controls the entire coating film drying furnace.
  • the control unit 40 can control the drive motor 38 to adjust the rotational speed of the eccentric cam 36 of the camshaft 35. Specifically, the control unit 40 can set the rotational speed of the eccentric cam 36 from 0.2 second / time to several seconds / time.
  • the control unit 40 is configured to include a controller such as an inverter that adjusts the number of rotations by controlling the voltage and frequency applied to the motor.
  • the motor connection shaft 39 is a shaft for connecting the drive motor 38 and the camshaft 35.
  • the motor connecting shaft 39 is rotatably supported by a support plate 46 of a base plate 45 described later.
  • the drive motor 38 and the camshaft 35 are connected via a motor connecting shaft 39, a coupling 32, and a connecting shaft 31.
  • a plurality of lift pin mechanisms 21 having the above-described configuration are disposed below the hot plate 43 provided in the drying chamber of the coating film drying furnace.
  • the hot plate 43 is a heating device for heating the glass substrate 26 installed on the upper side thereof.
  • the lift pin mechanism 21 is provided below the hot plate 43. More specifically, the cam mechanism 30 of the lift pin mechanism 21 is arranged in five vertically and four horizontally, for a total of 20 at almost equal intervals.
  • Four insertion holes 44 are provided at positions corresponding to the cam mechanisms 30 of the hot plate 43, and the elevation pins 23 of the elevation pin unit 22 are inserted into the insertion holes 44, respectively. .
  • Each cam mechanism 30 is connected by a coupling 32.
  • four cam mechanisms 30 are connected by a coupling 32 corresponding to the size of the glass substrate 26 and driven by one drive motor 38.
  • the four connected cam mechanisms 30 are arranged in parallel in five rows corresponding to the size of the glass base plate 26, and are arranged on the lower surface of the hot plate 43 at an approximately equal interval with each other. Yes.
  • a number of force mechanisms 30 corresponding to the size of the hot plate 43 are connected by a coupling 32, and can be freely configured to an arbitrary size.
  • a plurality of fixing pins 43A are provided on the upper side surface of the hot plate 43.
  • the fixing pin 43A is a pin used to heat the glass substrate 26 placed near the hot plate 43.
  • the lift pin mechanism 21 is attached to the base plate 45.
  • the base plate 45 is supported by an elevating mechanism (not shown) so as to be movable up and down.
  • the lift pin mechanism 21 is moved up and down by this lift mechanism, so that the glass substrate 26 inserted into the drying chamber of the coating film drying furnace and supported by the lift pins 23 is moved up and down.
  • the distance between the glass substrate 26 and the hot plate 43 is adjusted according to each drying process.
  • a support plate 46 that rotatably supports the motor connecting shaft 39 is provided on the base plate 45.
  • the lift pin mechanism 21 configured as described above operates as follows.
  • the hot plate 43 in the drying chamber of the coating film drying furnace is heated to a set temperature. Along with this, the elevating pins 23 inserted into the insertion holes 44 of the hot plate 43 are also heated.
  • the glass substrate 26 is inserted into the drying chamber, and is placed on the elevating pins 23 extending to the upper side surface of the hot plate 43! /.
  • the eccentric cam 36 of the elevating means 24 is rotated at the set rotational speed by the drive motor 38 of the drive unit 25.
  • the four lifting pins 23 are moved up and down one by one. Since the four eccentric cams 36 are offset by 90 degrees, the camshaft
  • each lifting pin 23 moves up and down sequentially, and the tip of the lifting pin 23 comes into contact with the back surface of the glass substrate 26 to support the glass substrate 26.
  • the camshaft 35 is rotated at a speed of 0.2 sec / time.
  • the four lifting pins 23 are supported in contact with the back surface of the glass substrate 26 in order and every 0.05 seconds.
  • the number of rotations of the camshaft 35 is selected in accordance with various conditions such as the temperature of the lift pins 23, the number of lift pins 23, the dimensions of the glass substrate 26, and the like.
  • This operation is performed by all of the 20 cam mechanisms 30 arranged on the lower side of the hot plate 43, and the glass substrate 26 is placed at 20 positions on the back surface thereof every 0.05 seconds. Supported by lift pins 23 that change contact position with 26.
  • the glass substrate 26 inserted in the drying chamber of the coating film drying furnace in a cold state is as follows.
  • One lift pin 23 and the glass substrate 26 are momentarily within 0.05 seconds within 0.5 seconds. Therefore, the coating film on the upper surface of the glass substrate 26 where the heat of the elevating pins 23 is not easily transmitted to the glass substrate 26 is not locally heated.
  • the lift pin mechanism 21 is a lifting mechanism for the base plate 45, and is appropriately adjusted to a set height in each step. For example, in the latter half of the drying process, the glass substrate 26 is heated close to the hot plate 43 from the state shown in FIG. 5A to the state supported by the fixing pin 43A shown in FIG. In some cases, the glass substrate 26 is directly placed on the upper surface of the hot plate 43 and heated.
  • the cam mechanism 30 at an arbitrary position is selectively repaired or replaced.
  • the front and rear couplings 32 of the cam mechanism 30 to be maintained are removed, and the cam mechanism 30 is repaired or replaced.
  • a plurality of elevating pin units 22 cam mechanism 30 arranged on the lower side of the glass substrate 26 force 4 elevating pins 23 are raised and lowered one by one in order, and each elevating pin 23 Since the glass substrate 26 is supported by contacting the upper end of the glass substrate 26 with the lower surface of the glass substrate 26, the heat from the heated elevating pins 23 is less likely to be transmitted to the glass substrate 26, resulting in uneven drying and pin marks. Can be reliably prevented. Thereby, the vacuum beta process can be omitted.
  • the controller 40 controls the number of rotations of the drive motor 38 to control the up / down speed of the up / down pins 23 by the eccentric cam 36, the upper end of the up / down pins 23 and the lower surface of the glass substrate 26 are Can be freely adjusted. As a result, it is possible to adjust the rotational speed of the eccentric cam 36 according to various conditions.
  • the lift pin mechanism 21 can be freely adjusted in size with respect to the hot plates 43 having different sizes by connecting a plurality of cam mechanisms 30 with couplings 32.
  • the force density can be adjusted by adjusting the arrangement density of the force mechanism 30 freely.
  • the number of cam mechanisms 30 of the elevating means 24 is connected by the coupling 32 by the number corresponding to the size of the glass substrate 26 (here, four), and the number corresponding to the size of the glass substrate 26. Since (here 5 rows) are arranged in parallel, the lift pin mechanism 21 in which the cam mechanism 30 is arranged at the optimum position can be easily configured for the glass substrates 26 of various sizes. it can. Since the four cam mechanisms 30 connected by the coupling 32 are driven by one drive motor 38, the number of drive motors 38 can be reduced.
  • the cam mechanism 30 can be removed and maintained by removing the couplings 32 before and after the cam mechanism 30 to be maintained, so that the workability at the time of maintenance is improved.
  • the lift pin mechanism of the present embodiment is provided with a thermal expansion absorbing unit that absorbs a shift due to thermal expansion of the hot plate 43.
  • a thermal expansion absorbing unit that absorbs a shift due to thermal expansion of the hot plate 43.
  • the hole into which the elevating pin 23 is inserted is enlarged to absorb the thermal expansion of the hot plate 43.
  • the lift pin mechanism of the present embodiment is adapted to be absorbed by the thermal expansion absorbing means.
  • the configuration other than the thermal expansion absorbing means is the same as that of the lift pin mechanism 21 of the first embodiment, and therefore, here, the description will focus on the thermal expansion absorbing means.
  • the thermal expansion absorbing means 51 is constituted by an electromagnet 52 that absorbs a shift due to thermal expansion.
  • the electromagnet 52 includes a coil 54 incorporated in the upper drive unit 53, a power supply 55, and a switch 56.
  • the elevating pin 23 is made of a magnetic material, and its head 28 is electromagnetically coupled to the electromagnet 52.
  • the upper drive unit 53 is provided with a lower drive unit 58 via a connecting rod 57, and the connecting rod 57 is supported so as to move up and down, and the upper drive unit 53 and the lower drive unit 58 follow the eccentric cam 36. It is designed to move up and down.
  • the upper side surface of the upper drive unit 53 and the lower side surface of the head 28 of the elevating pin 23 are formed in a flat surface. As a result, the upper drive unit 53 and the head 28 of the elevating pin 23 can be reliably electromagnetically coupled with each other, and the force S can be easily shifted along the contact surfaces. ! / [0060]
  • the thermal expansion absorbing means 51 of the lift pin mechanism configured as described above operates as follows.
  • the force S at which the hot plate 43 is heated to the set temperature, and the hot plate 43 then thermally expands as the temperature rises.
  • This thermal expansion increases in proportion to the distance from the center position. Specifically, the cam mechanisms 30 at the four corners of the hot plate 43 are displaced the most.
  • the shift of the lift pin unit 22 near the center of the hot plate 43 is small! /.
  • the switch 56 is turned off to release the electromagnetic coupling between the head 28 of the lift pin 23 and the electromagnet 52.
  • the head 28 of the elevating pin 23 and the upper drive unit 53 are displaced as shown in FIG.
  • the switch 56 is turned on, and the head 28 of the lift pin 23 and the electromagnet 52 are electromagnetically coupled. Thereby, the expansion of the hot plate 43 is absorbed.
  • the electromagnetic coupling between the head 28 of the elevating pin 23 and the electromagnet 52 is temporarily released as the hot plate 43 reaches the set temperature as the hot plate 43 is heated.
  • the electromagnetic coupling between the head 28 of the elevating pin 23 and the electromagnet 52 is temporarily released as the hot plate 43 reaches the set temperature as the hot plate 43 is heated.
  • a force S and a permanent magnet that electromagnetically couples the head 28 of the lifting pin 23 and the electromagnet 52 using the electromagnet 52 may be used.
  • the head portion 28 of the elevating / lowering pin 23 is composed of an N-pole or S-pole permanent magnet.
  • the portion of the upper drive unit 53 is composed of an S-pole or N-pole permanent magnet instead of the coil 54.
  • the contact surfaces of each other are flat.
  • the permanent magnet may be used only on either the head 28 side or the upper drive unit 53 side of the elevating pin 23, and the other may be a magnetic body.
  • an electromagnet may be used instead of the permanent magnet.
  • it is used in the same manner as the permanent magnet.
  • the lift pin mechanism of this embodiment uses a linear cam instead of the eccentric cam 36 of the cam mechanism 30 of the first embodiment.
  • the cam mechanism 61 is composed of a linear cam 62 and a driven portion 63.
  • the linear motion cam 62 is composed of a flat bar that reciprocates in the horizontal direction.
  • a chevron-shaped cam surface for moving the elevating pin 23 up and down is formed on the upper side surface of the flat bar-like linear motion cam 62.
  • the linear cam 62 is connected to a drive unit (not shown) by a connecting rod 65.
  • This drive unit is composed of a reciprocating mechanism, and causes the linear cam 62 to reciprocate.
  • the follower 63 is composed of a roller 66 and a vertically moving piece 67.
  • the roller portion 66 is rotatably supported by the lower end portion of the vertical moving piece portion 67.
  • the vertically moving piece 67 is supported so as to be vertically movable. As a result, the roller portion 66 rotates along the mountain-shaped cam surface of the linear cam 62, so that the vertically moving piece portion 67 moves up and down to raise and lower the lifting pin 23.
  • the follower 63 is attached to each lift pin 23.
  • Four followers 63 are arranged in accordance with the four lifting pins 23.
  • the linear motion cam 62 is reciprocated by the drive portion, and accordingly, the roller portion 66 of the driven portion 63 rotates along the mountain-shaped cam surface, Vertical movement piece 67 moves up and down to raise and lower the lift pin 23.
  • linear motion cam 62 reciprocates to move the four driven parts 63 up and down in order.
  • the drying operation by heating in the coating film drying furnace is described as an example, and the force by the lift pin 23 for explaining the lift pin mechanism for suppressing the influence by heat is as follows.
  • the lift pin mechanism 21 of each of the above embodiments can be used to eliminate adverse effects on the substrate to be processed.
  • the charge can be dispersed by the lifting pins 23.
  • the force may be 2, 3, or 5 or more as described in the case where four lifting pins 23 are provided.
  • the number is determined according to various conditions such as the size of the glass substrate 26 to be supported and the number of lift pin mechanisms 21 installed.
  • the number of eccentric cams 36 is adjusted according to the number of lifting pins 23.
  • the force using a thin pin with a sharp tip as the lift pin 23 is not limited to the thin pin with a sharp tip, and is moved up and down by the lift pin unit 22 Any existing pin that can be used can be used.
  • a rotating cam may be used as a means for raising and lowering the elevating pin 23, and in the third embodiment, another cam mechanism such as a force end face cam using a linear motion cam may be used. Needless to say. If the cam mechanism is configured to be able to move the elevating pin 23 up and down, the same operations and effects as the above embodiments can be achieved.
  • each lifting pin 23 is arranged along a circle that is not arranged in series, as in the above-described embodiments.
  • the four lifting pins 23 are provided with the force S that is brought into contact with and supported by the back surface of the glass substrate 26 one by one from one end thereof. 2 or more of May be moved up and down simultaneously and sequentially. Further, the force of raising and lowering the four raising / lowering pins 23 in order from one end thereof may be varied. For example, you can move up and down in other order, such as first, fourth, second, third in order, etc.! / ⁇ The time during which the elevating pin 23 is in contact with the back surface of the glass substrate 26 can be easily set by changing the shape of the eccentric cam 36.
  • the lifting pin 23 may be moved up and down using a force electromagnetic solenoid in which the lifting pin 23 is moved up and down using the cam mechanism 30.
  • the lifting pin unit is provided at a plurality of lifting pins 23 supported so as to be movable up and down, and at the base end of each lifting pin 23, and each lifting pin 23 is lifted and lowered individually.
  • An electromagnetic solenoid (not shown) that moves one or more of 23 at the same time and in order, and a drive unit (not shown) that drives the electromagnetic solenoid may be provided.
  • the drive unit includes a control unit that individually controls power supplied to the electromagnetic solenoid.
  • This control unit may control the electromagnetic solenoids of one set (four) of the lift pins 23 or may control all the electromagnetic solenoids disposed in the entire lower area of the glass substrate 26. In this case, heat insulation is applied so that the electromagnetic solenoid is not affected by heat. In addition, when electromagnetic solenoids are used for processing with the purpose of eliminating the adverse effects of other factors such as static electricity (processing without heat), they can be used as they are.
  • each electromagnetic solenoid can be easily and individually controlled by the control unit, so that one of the lifting pins 23 is moved up and down one by one.
  • the time during which the elevating pins 23 are in contact with the back surface of the glass substrate 26 and the order in which the elevating pins 23 are raised and lowered can be easily set.
  • the control unit 40 can set the rotational speed of the eccentric cam 36 from 0.2 second / time to several seconds / time.
  • the camshaft It is desirable that the rotation speed of 35 is as high as possible so that the contact time of one lifting pin 23 with the glass substrate 26 is shortened. For this reason, it is desirable to increase the number of lifting pins 23 while increasing the rotation of the camshaft 35.
  • the force S formed by using the perfect rotating plate for the eccentric cam 36 is limited to the perfect circle.
  • Other shapes may be used.
  • the eccentric cam 70 may be configured to include a circular arc portion 71 concentric with the rotation center in a part of the outer peripheral shape thereof. Further, the arc portion 71 is set so as to partially overlap the adjacent eccentric cams 70.
  • the elevating pins 23 are moved up and down along the outer peripheral shape of the eccentric cam 70. Specifically, the elevating pin 23 rises due to the rotation of the eccentric cam 70, stops at the upper end position at the arc portion 71, and descends after passing the arc portion 71.
  • the linear cam 62 is formed in a mountain shape and its apex is provided, and the elevating pin 23 rises before this apex and descends after the apex is flattened. You may do it.
  • the linear cam 72 has a flat surface portion 73 formed at the apex portion of the mountain shape.
  • the flat surface portion 73 is set to a length that can simultaneously contact the roller portions 66 of at least two adjacent lifting pins 23 among the plurality of lifting pins 23 arranged. You may set to the length which the roller part 66 of three or more raising / lowering pins 23 can contact simultaneously.
  • each lifting pin 23 is moved up and down by the linear cam 72 and stops at the upper end position at the flat surface portion 73 to support the glass substrate 26.
  • Each elevating pin 23 descends again after passing the flat surface portion 73.
  • the roller portions 66 of the two adjacent lift pins 23 simultaneously become upper end positions near both ends of the flat surface portion 73, and the two lift pins 23
  • the glass substrate 26 is supported.
  • one raising / lowering pin 23 descends, the other raising / lowering pin 23 stops at the upper end position, and descends after passing the flat surface portion 73.
  • processing in vacuum is not considered, but the present invention can also be applied to processing in vacuum.
  • O-rings 75 are respectively attached to the upper and lower ends of the hole through which the shaft portion 27 of the elevating pin 23 of the hot plate 43 passes.
  • the O-ring 75 is fixed with existing technology such as a ring grooved washer.
  • the O-ring 75 is made of an annular seal material that can be inserted into the hole of the hot plate 43.
  • the hole of the hot plate 43 is sealed by the O-ring 75 and the shaft portion 27 of the lifting pin 23 is passed through the central hole of the O-ring 75.
  • a side wall 76 is provided in a body-like manner, and is attached to the upper end of the side wall 76 with a top plate 77.
  • the side wall 76 and the top plate 77 are sealed with an O-ring 78.
  • a vacuum chamber 79 is formed by the hot plate 43, the side wall portion 76, and the top plate 77. Processing such as vacuum baking and vacuum drying is performed in the vacuum chamber 79.
  • the lift pin mechanism 21 is provided alone has been described as an example.
  • the lift bin mechanism 21 and the existing feeding unit may be combined.
  • the glass substrate 26 is lifted by existing feeding means and moved by, for example, lmm.
  • the glass substrates 26 are alternately supported by the four lifting pins 23 of the lift pin mechanism 21.
  • the number of contact of the lift pins 23 contacting the back surface of the glass substrate 26 with the same location can be reduced, and damage to the back surface of the glass substrate 26 due to the contact of the lift pins 23 can be greatly reduced.
  • each lifting pin 23 does not come into contact with the same place on the back surface of the glass substrate 26 twice. Damage to the back of the substrate 26 can be minimized.
  • the glass substrate 26 when the glass substrate 26 is moved, it may be reciprocated by changing the moving pitch. For example, it may be moved to one side with a lmm pitch by the feeding means and then moved to the other side with a pitch of 0.8mm. Further, as the direction in which the glass substrate 26 is moved by the feeding means, the glass substrate 26 may be moved by appropriately combining not only the front-rear direction but also the left-right direction.

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Abstract

Occurrence of unevenness or a pin trace is prevented on the surface of a substrate to be processed. A lift pin mechanism is equipped with an elevating/lowering pin for supporting the substrate to be processed by abutting against it from the underside. The lift pin mechanism is provided with an elevating/lowering pin unit for supporting the substrate by elevating/lowering one or more than one elevating/lowering pins in one set of a plurality of elevating/lowering pins simultaneously and sequentially and by abutting the upper end of each elevating/lowering pin against the lower side face of the substrate. A plurality of elevating/lowering pin units are arranged on the underside of the substrate. The elevating/lowering pin unit elevates/lowers one or more than one of a plurality elevating/lowering pins simultaneously and sequentially and abuts the upper end of each elevating/lowering pin against the lower side face of the substrate thus supporting the substrate by the elevating/lowering pins.

Description

明 細 書  Specification
リフトピン機構  Lift pin mechanism
技術分野  Technical field
[0001] 本発明は、処理対象基板を処理するに際して、当該処理対象基板をその下側から 支持するリフトピン機構に関し、特に液晶ディスプレイ用ガラス基板や半導体ウェハ 等の熱処理に用いて好適なリフトピン機構に関する。  TECHNICAL FIELD [0001] The present invention relates to a lift pin mechanism that supports a substrate to be processed from below when processing the substrate to be processed, and particularly relates to a lift pin mechanism that is suitable for use in heat treatment of a glass substrate for a liquid crystal display, a semiconductor wafer, or the like. .
背景技術  Background art
[0002] 液晶ディスプレイ用ガラス基板、フィルム基板、半導体ウェハ等の処理対象基板に あっては、その表面に塗布膜が形成されて乾燥処理が施される。この場合において 、処理対象基板は、その熱処理等に際して、下側からリフトピンで支持される。  [0002] In the case of a substrate to be processed such as a glass substrate for liquid crystal display, a film substrate, and a semiconductor wafer, a coating film is formed on the surface and subjected to a drying treatment. In this case, the substrate to be processed is supported by lift pins from below during the heat treatment or the like.
[0003] 例えば、液晶ディスプレイの製造にお!/、ては、この液晶ディスプレイを構成するガラ ス基板に塗布膜が施されて乾燥されるが、この塗布膜の乾燥の際に、リフトピン機構 を備えた塗布膜用乾燥炉が用いられる。この塗布膜用乾燥炉内でリフトピンによって ガラス基板を支持して高温に加熱することで塗布膜を乾燥させる力 この際に、過熱 されたリフトピンが、新たに処理される、冷えたガラス基板の裏面に当接して局部的に 加熱することで塗布膜に悪影響を及ぼすことがある。  [0003] For example, in the manufacture of a liquid crystal display! /, A glass substrate constituting this liquid crystal display is coated with a coating film and dried. When the coating film is dried, a lift pin mechanism is used. The coating film drying oven provided is used. The force that dries the coating film by supporting the glass substrate with the lift pins in the coating film drying furnace and heating it to a high temperature. At this time, the overheated lift pins are newly processed, and the back surface of the cooled glass substrate. The coating film may be adversely affected by heating locally while in contact with the coating.
[0004] このリフトピンの接触で起きる局部的な加熱による塗布膜への悪影響を除くための 改良が種々提案されている。この例として、引用文献 1がある。  [0004] Various improvements have been proposed to eliminate the adverse effects on the coating film caused by local heating caused by the contact of the lift pins. An example of this is cited document 1.
[0005] この引用文献 1に記載の従来の塗布膜用乾燥炉は、図 2に示すように、塗布膜用 乾燥炉 1は、ホットプレートヒータ 2と乾燥室 3を順次配置して、 5段の乾燥室 3, 3, · · •を形成している。そして、前記乾燥室 3の側面には搬送口 4が設けられて、この搬送 口 4を開閉する搬送扉 5が設けられて!/、る。  [0005] As shown in Fig. 2, the conventional coating film drying furnace described in the cited document 1 has a five-stage coating film drying furnace 1 in which a hot plate heater 2 and a drying chamber 3 are sequentially arranged. The drying chambers of 3, 3, · · · are formed. A transfer port 4 is provided on the side surface of the drying chamber 3, and a transfer door 5 for opening and closing the transfer port 4 is provided.
[0006] 前記乾燥室 3へのガラス基板 6の出し入れは、前工程から送られてくるガラス基板 6 を受け取った搬送ロボット 7により行われる。この搬送ロボット 7は各乾燥室 3の搬送口 4に合わせて上下に移動するとともに、搬送口 4より乾燥室 3内へ延びるアーム 8を備 えており、アーム 8上にガラス基板 6が裁置されて乾燥室 3へ搬入される。  [0006] The glass substrate 6 is taken into and out of the drying chamber 3 by the transfer robot 7 that has received the glass substrate 6 sent from the previous step. The transfer robot 7 moves up and down according to the transfer port 4 of each drying chamber 3 and has an arm 8 extending from the transfer port 4 into the drying chamber 3, and the glass substrate 6 is placed on the arm 8. Then, it is carried into the drying chamber 3.
[0007] 前記ガラス基板 6は、矩形状に形成されており、その上面 6aに塗布膜 9が印刷され ている。 [0007] The glass substrate 6 is formed in a rectangular shape, and a coating film 9 is printed on the upper surface 6a thereof. ing.
[0008] 送り手段 10は、図 3に示すように、乾燥室 3の底面である、ホットプレートヒータ 2の 上面に設けられている。送り手段 10は、前記搬送口 4から搬入されたガラス基板 6の 下面と当接して支持する支持ピン 11と、移動ピン 12とを備えている。この移動ピン 12 は、移動ピン 12の先端 12aを支持ピン 11の先端 1 laよりも低!/、位置と高!/、位置とに 垂直方向へ移動する垂直エアーシリンダー 13に取り付けている。また、垂直エアー シリンダー 13は水平方向へ移動する水平伸縮機構である水平エアーシリンダー 14 に取り付けている。  As shown in FIG. 3, the feeding means 10 is provided on the upper surface of the hot plate heater 2 that is the bottom surface of the drying chamber 3. The feeding means 10 includes a support pin 11 that is in contact with and supported by the lower surface of the glass substrate 6 carried in from the transport port 4, and a moving pin 12. The moving pin 12 has a tip 12a of the moving pin 12 attached to a vertical air cylinder 13 that moves vertically to a position lower and higher than the tip 1 la of the support pin 11! The vertical air cylinder 13 is attached to a horizontal air cylinder 14 which is a horizontal expansion / contraction mechanism that moves in the horizontal direction.
[0009] これにより、ガラス基板 6の乾燥作業は次のようにして行われる。  [0009] Thereby, the glass substrate 6 is dried as follows.
[0010] 搬送ロボット 7のアーム 8上にガラス基板 6が裁置されて乾燥室 3へ搬入される。乾 燥室 3の搬送口 4では搬入扉 5が開放されている。アーム 8上に支持されたガラス基 板 6は、搬送口 4から乾燥室 3内へ搬入され、アーム 8が下降されてガラス基板 6が支 持ピン 11上に載置される。次いで、搬入扉 5が閉じられる(図 3 (a)の状態)。乾燥室 3 内は、ホットプレートヒータ 2で設定温度に制御されている。 A glass substrate 6 is placed on the arm 8 of the transfer robot 7 and is carried into the drying chamber 3. The carry-in door 5 is opened at the transfer port 4 of the drying chamber 3. The glass substrate 6 supported on the arm 8 is carried into the drying chamber 3 from the transfer port 4, the arm 8 is lowered, and the glass substrate 6 is placed on the support pins 11. Next, the carry-in door 5 is closed (the state shown in FIG. 3 (a)). The inside of the drying chamber 3 is controlled to the set temperature by the hot plate heater 2.
[0011] 次いで、垂直エアーシリンダー 13によって移動ピン 12が上昇されることになり、支 持ピン 11から移動ピン 12 (図 3 (b)の状態)へとガラス基板 6の底面の当接が切り替 わる。 Next, the moving pin 12 is raised by the vertical air cylinder 13, and the contact of the bottom surface of the glass substrate 6 is switched from the supporting pin 11 to the moving pin 12 (the state shown in FIG. 3B). Wow.
[0012] 次いで、水平エアーシリンダー 14によって垂直エアーシリンダー 13及び移動ピン 1 2を移動(図 3 (c)の右へ移動した状態)させてガラス基板 6を移動させ、垂直エアー シリンダー 13で移動ピン 12を下降させて(図 3 (d)の状態)、ガラス基板 6を支持ピン 11上に載置させる。次!/、で、移動ピン 12を元の位置(図 3 (e)の状態)へ戻す。  [0012] Next, the horizontal air cylinder 14 moves the vertical air cylinder 13 and the moving pin 12 (moved to the right in FIG. 3 (c)) to move the glass substrate 6, and the vertical air cylinder 13 moves the moving pin. 12 is lowered (the state shown in FIG. 3D), and the glass substrate 6 is placed on the support pins 11. Next, move the moving pin 12 back to its original position (the state shown in Fig. 3 (e)) using /!
[0013] この一連の動きを 1サイクルとして乾燥時間中何回もこのサイクルを繰り返す。この 1 サイクルは移動ピン 12の移動速度が早い程、ピン痕残りが発生し難いが、塗布膜の 厚みにもよるがおおよそ 4〜8秒で行われる。  [0013] This series of movements is taken as one cycle, and this cycle is repeated many times during the drying time. This cycle is less likely to cause pin marks as the moving speed of the moving pin 12 increases, but is approximately 4 to 8 seconds depending on the thickness of the coating film.
[0014] このサイクル又は逆サイクル(図 3 (e)→図 3 (d)→図 3 (c)→図 3 (b)→図 3 (a) )を行 つて、ピンの痕跡が生じ難くなるようにしている。  [0014] This cycle or reverse cycle (Fig. 3 (e)-> Fig. 3 (d)-> Fig. 3 (c)-> Fig. 3 (b)-> Fig. 3 (a)) makes pin traces less likely to occur. I am doing so.
[0015] また、リフトピンと固定ピンとで交互にガラス基板を支持してピン跡等が生じないよう にしたものもある。このような例としては引用文献 2に記載のものがある。具体的には、 基板を処理室に搬入する際に、リフトピンを所定の位置まで上昇させて、基板をこの リフトピンに載置させ、このリフトピンを下降させる。リフトピンが下降していくと、固定ピ ンの上端部が基板の下面に当接する位置でリフトピンから固定ピンに基板が受け渡 しされる。そして、リフトピンの上端部が基板の下面に接触しない位置で停止する。処 理室の減圧が開始し、処理が終了すると、再びリフトピンが上昇して、固定ピンから基 板を受け取り、所定の位置まで上昇させる。このように、基板の同じ位置をピンで保持 し続けなレ、ようにして、ピン跡等が生じな!/、ようにしてレ、る。 [0015] Further, there is also a glass substrate that is alternately supported by lift pins and fixed pins so that pin marks or the like are not generated. An example of this is described in cited document 2. In particular, When the substrate is carried into the processing chamber, the lift pin is raised to a predetermined position, the substrate is placed on the lift pin, and the lift pin is lowered. As the lift pins descend, the substrate is transferred from the lift pins to the fixed pins at a position where the upper end of the fixed pin contacts the lower surface of the substrate. And the upper end part of a lift pin stops in the position which does not contact the lower surface of a board | substrate. When the decompression of the processing chamber starts and the processing is completed, the lift pin rises again, receives the substrate from the fixed pin, and raises it to a predetermined position. In this way, do not keep the same position on the board with the pins, and no pin marks will be generated! /.
特許文献 1 :特開 2006— 61755号公報  Patent Document 1: Japanese Patent Laid-Open No. 2006-61755
特許文献 2:特開平 10— 76211号公報  Patent Document 2: Japanese Patent Laid-Open No. 10-76211
発明の開示  Disclosure of the invention
発明が解決しょうとする課題  Problems to be solved by the invention
[0016] しかしながら、前記特許文献 1の塗布膜用乾燥炉では、移動ピン 12でガラス基板 6 を持ち上げてずらして支持ピン 11に載置する力 その一連の動作によって、加熱さ れた支持ピン 11及び移動ピン 12が数秒間ガラス基板 6の裏面に接触してガラス基板[0016] However, in the coating film drying furnace of Patent Document 1, a force that lifts and shifts the glass substrate 6 with the moving pin 12 and places the glass substrate 6 on the supporting pin 11 is heated by the series of operations. And the moving pin 12 contacts the back surface of the glass substrate 6 for a few seconds and the glass substrate
6を過熱することになる。 6 will be overheated.
[0017] このとき、ガラス基板 6の厚さや材質等のために熱伝導率が悪くて、ガラス基板 6の 上側面の塗布膜 9まで熱が伝わりづらレ、場合は問題な!/、が、ガラス基板 6が薄かった り熱伝導率が良かったりすると、塗布膜 9まで熱が伝わってしまい、乾燥ムラやピン痕 等が生じてしまう。 [0017] At this time, the thermal conductivity is poor due to the thickness and material of the glass substrate 6, and it is difficult to transfer heat to the coating film 9 on the upper surface of the glass substrate 6. If the glass substrate 6 is thin or has a good thermal conductivity, heat is transferred to the coating film 9, resulting in drying irregularities and pin marks.
[0018] また、特許文献 2の減圧乾燥装置では、ガラス基板の下面の異なる位置を固定ピン とリフトピンとで交互に支持して乾燥するとレ、う構成であるが、二点で交互に支持して いるだけなので、ガラス基板が薄かったり熱伝導率が良かったりすると、塗布膜まで 熱が伝わってしまい、乾燥ムラやピン痕等の悪影響を及ぼしてしまう。  [0018] Also, the reduced-pressure drying apparatus of Patent Document 2 has a configuration in which different positions on the lower surface of the glass substrate are alternately supported by the fixing pins and the lift pins and dried, but is supported alternately at two points. Therefore, if the glass substrate is thin or has good thermal conductivity, heat will be transferred to the coating film, which will cause adverse effects such as uneven drying and pin marks.
[0019] 本発明は、上述の問題点に考慮してなされたもので、接触して支持するピンによる 処理対象基板への影響を最小限に抑えたリフトピン機構を提供することを目的とする 課題を解決するための手段  [0019] The present invention has been made in consideration of the above-described problems, and an object thereof is to provide a lift pin mechanism that minimizes the influence on a substrate to be processed by pins that are supported by contact. Means to solve
[0020] 力、かる課題を解決するために、本発明は、処理対象基板をその下側から当接して 支持する昇降ピンを備えたリフトピン機構であって、複数の前記昇降ピンを一組とし て当該一組の昇降ピンのうちの 1ずつ又は 2以上を同時に、かつ順々に昇降させて 各昇降ピンの上端を前記処理対象基板の下側面に当接させて支持する昇降ピンュ ニットを備え、当該昇降ピンユニットを、前記処理対象基板の下側に複数配設したも のである。 [0020] In order to solve the above-mentioned problem, the present invention is configured to contact a substrate to be processed from below. A lift pin mechanism including supporting lift pins, each of the lift pins being moved up and down one by one or two or more of the lift pins at the same time and in sequence. And an elevating pin unit which supports the upper end of the substrate to be brought into contact with the lower surface of the substrate to be processed, and a plurality of the elevating pin units are arranged below the substrate to be processed.
[0021] 前記構成により、前記処理対象基板の下側に複数配設された昇降ピンユニットが、 複数の昇降ピンを 1ずつ又は 2以上を同時に、かつ順々に昇降させて、各昇降ピン の上端を前記処理対象基板の下側面に当接させることで、この昇降ピンによって前 記処理対象基板を支持する。  [0021] With the above-described configuration, the plurality of lifting pin units disposed on the lower side of the substrate to be processed lifts the lifting pins one by one or two or more simultaneously and sequentially, By bringing the upper end into contact with the lower surface of the processing target substrate, the processing target substrate is supported by the lift pins.
発明の効果  The invention's effect
[0022] 前記処理対象基板が熱処理される場合には、加熱された昇降ピンによる熱が前記 処理対象基板に伝わりにくくなり、前記処理対象基板の表面にムラやピン痕等が生じ るのを確実に防止することができる。  [0022] When the substrate to be processed is heat-treated, heat from the heated lifting pins is hardly transmitted to the substrate to be processed, and it is ensured that unevenness or pin marks are generated on the surface of the substrate to be processed. Can be prevented.
図面の簡単な説明  Brief Description of Drawings
[0023] [図 1]本発明の第 1実施形態にかかるリフトピン機構を示す斜視図である。  FIG. 1 is a perspective view showing a lift pin mechanism according to a first embodiment of the present invention.
[図 2]従来の塗布膜用乾燥炉を示す概略側面図である。  FIG. 2 is a schematic side view showing a conventional coating film drying furnace.
[図 3]従来の塗布膜用乾燥炉の移動ピンの動作を示す模式図である。  FIG. 3 is a schematic diagram showing the operation of a moving pin of a conventional coating film drying furnace.
[図 4]本発明の第 1実施形態にかかるリフトピン機構を示す要部拡大図である。  FIG. 4 is a main part enlarged view showing a lift pin mechanism according to the first embodiment of the present invention.
[図 5]図 4の A, B, C, D矢視断面を便宜的に各昇降ピンの間隔で並べて動作を示 す模式図である。  FIG. 5 is a schematic diagram showing an operation in which cross sections A, B, C, and D in FIG. 4 are arranged at intervals of lifting pins for convenience.
[図 6]本発明の第 1実施形態に力、かるリフトピン機構をホットプレートの上側から見た 平面図である。  [Fig. 6] Fig. 6 is a plan view of the lift pin mechanism that exerts a force according to the first embodiment of the present invention when viewed from the upper side of the hot plate.
[図 7]本発明の第 1実施形態にかかるリフトピン機構を示す正面図である。  FIG. 7 is a front view showing a lift pin mechanism according to the first embodiment of the present invention.
[図 8]本発明の第 2実施形態にかかるリフトピン機構のカム機構を示す要部拡大図で ある。  FIG. 8 is an enlarged view of a main part showing a cam mechanism of a lift pin mechanism according to a second embodiment of the present invention.
[図 9]本発明の第 2実施形態にかかるリフトピン機構の熱膨張吸収手段を示す概略構 成図である。  FIG. 9 is a schematic configuration diagram showing thermal expansion absorbing means of a lift pin mechanism according to a second embodiment of the present invention.
[図 10]本発明の第 2実施形態の変形例を示す概略構成図である。 [図 11]本発明の第 3実施形態にかかるリフトピン機構を示す概略構成図である。 FIG. 10 is a schematic configuration diagram showing a modification of the second embodiment of the present invention. FIG. 11 is a schematic configuration diagram showing a lift pin mechanism according to a third embodiment of the present invention.
[図 12]本発明の第 3実施形態にかかるリフトピン機構を示す概略構成図である。  FIG. 12 is a schematic configuration diagram showing a lift pin mechanism according to a third embodiment of the present invention.
[図 13]本発明の変形例に係る偏芯カムを示す側面図である。  FIG. 13 is a side view showing an eccentric cam according to a modification of the present invention.
[図 14]本発明の変形例に係る直動カムを示す側面図である。  FIG. 14 is a side view showing a linear cam according to a modification of the present invention.
[図 15]本発明の変形例に係るリフトピン機構を示す正面図である。  FIG. 15 is a front view showing a lift pin mechanism according to a modification of the present invention.
[図 16]本発明の実施形態に力、かるリフトピン機構のカム機構及び真空室を示す側面 図である。  FIG. 16 is a side view showing a cam mechanism and a vacuum chamber of a lift pin mechanism that exerts force on an embodiment of the present invention.
符号の説明  Explanation of symbols
[0024] 21 リフトピン機構、 22 昇降ピンユニット、 23 昇降ピン、 24 昇降手段、 25 駆 動部、 26 ガラス基板、 27 軸部、 28 頭部、 29 スプリング、 30 カム機構、 31 連 結軸、 32 カップリング、 34 容器、 35 カムシャフト、 36 偏芯カム、 38 駆動モー タ、 39 モータ連結軸、 40 制御部、 43 ホットプレート、 44 揷入穴、 45 ベース板 発明を実施するための最良の形態  [0024] 21 Lift pin mechanism, 22 Lifting pin unit, 23 Lifting pin, 24 Lifting means, 25 Drive part, 26 Glass substrate, 27 Shaft part, 28 Head, 29 Spring, 30 Cam mechanism, 31 Connecting shaft, 32 Coupling, 34 container, 35 camshaft, 36 eccentric cam, 38 drive motor, 39 motor connecting shaft, 40 control unit, 43 hot plate, 44 insertion hole, 45 base plate BEST MODE FOR CARRYING OUT THE INVENTION
[0025] 以下に、本発明の実施形態について説明する。本発明のリフトピン機構は、処理対 象基板に接触して当該処理対象基板を支持するピンによって当該処理対象基板に 及ぶ影響を最小限に抑えるように改良した装置である。この影響としては、熱ゃ静電 気等が考えられる。ここでは、熱による影響を解消した例を説明する。具体的には、 前記従来技術と同様の塗布膜用乾燥炉を例に説明する。このため、処理対象基板 は、上側面に塗布膜が施されたガラス基板となる。なお、塗布膜用乾燥炉の全体構 成は従来技術と同様であるため、ここでは、リフトピン機構を中心に説明する。  Hereinafter, embodiments of the present invention will be described. The lift pin mechanism of the present invention is an improved apparatus that minimizes the influence on the substrate to be processed by the pins that contact the substrate to be processed and support the substrate to be processed. This effect may be due to heat or static electricity. Here, an example in which the influence of heat is eliminated will be described. Specifically, a coating film drying furnace similar to the prior art will be described as an example. For this reason, the substrate to be processed is a glass substrate having a coating film on the upper surface. Since the entire configuration of the coating film drying furnace is the same as that of the prior art, the description here will focus on the lift pin mechanism.
[0026] [第 1実施形態]  [0026] [First embodiment]
図 1に示すように、リフトピン機構 21は、ガラス基板 26(図 4参照)をその下側から支 持するための機構である。このリフトピン機構 21は、ガラス基板 26の下側に、このガラ ス基板 26の全域に亘つて複数個配設された昇降ピンユニット 22を備えて構成されて いる。  As shown in FIG. 1, the lift pin mechanism 21 is a mechanism for supporting the glass substrate 26 (see FIG. 4) from below. The lift pin mechanism 21 is configured to include a plurality of lifting pin units 22 disposed below the glass substrate 26 over the entire area of the glass substrate 26.
[0027] この昇降ピンユニット 22は、 4本の昇降ピン 23を一組として当該一組の昇降ピン 23 のうちの 1ずつ又は 2以上を同時に、かつ順々に昇降させて各昇降ピン 23の上端を 前記ガラス基板 26の下側面に当接させて支持するための装置である。 [0027] This lifting pin unit 22 is composed of four lifting pins 23 as a set, and lifts and lowers one or more of the lifting pins 23 one by one or two at a time. The top This is a device for contacting and supporting the lower surface of the glass substrate 26.
[0028] 昇降ピンユニット 22は具体的には、昇降ピン 23と、昇降手段 24と、駆動部 25とから 構成されている。 [0028] Specifically, the elevating pin unit 22 includes an elevating pin 23, an elevating means 24, and a drive unit 25.
[0029] 昇降ピン 23は、上下動可能に支持されると共に、ガラス基板 26をその下側から支 持するための材料である。この昇降ピン 23は、軸部 27と、頭部 28とから構成されて いる。軸部 27は、上下動可能に支持され、昇降手段 24によって上下動する部分で ある。頭部 28は、軸部 27の下端部に一体的に設けられ、後述する昇降手段 24の偏 芯カム 36に当接して、カム面に追従する部分である。頭部 28が偏芯カム 36のカム面 に当接して追従することで、昇降ピン 23がカム面の形状に沿って上下動する。昇降 ピン 23には、必要に応じてスプリング 29 (図 4参照)が設けられる。このスプリング 29 は、偏芯カム 36で押し上げられる昇降ピン 23が、偏芯カム 36のカム面に追従して上 下動するように、昇降ピン 23を下方へ付勢している。  The elevating pin 23 is a material for supporting the glass substrate 26 from below while being supported so as to be movable up and down. The elevating pin 23 is composed of a shaft portion 27 and a head portion 28. The shaft portion 27 is a portion that is supported so as to move up and down and moves up and down by the lifting means 24. The head portion 28 is a portion that is provided integrally with the lower end portion of the shaft portion 27 and that abuts on an eccentric cam 36 of the elevating means 24 described later and follows the cam surface. The head 28 is brought into contact with and follows the cam surface of the eccentric cam 36 so that the elevating pin 23 moves up and down along the shape of the cam surface. The elevating pin 23 is provided with a spring 29 (see FIG. 4) as required. The spring 29 urges the elevating pin 23 downward so that the elevating pin 23 pushed up by the eccentric cam 36 moves up and down following the cam surface of the eccentric cam 36.
[0030] 昇降手段 24は、昇降ピン 23を上下動させるための装置である。この昇降手段 24は 、カム機構 30と、連結軸 31と、カップリング 32とから構成されている。  The elevating means 24 is a device for moving the elevating pin 23 up and down. The elevating means 24 includes a cam mechanism 30, a connecting shaft 31, and a coupling 32.
[0031] カム機構 30は、昇降ピン 23の下端部の頭部 28に当接してこの昇降ピン 23を昇降 させるための装置である。このカム機構 30は、 l , 4, 5に示すように、容器 34内に 回転可能に支持されたカムシャフト 35と、このカムシャフト 35に 4つ設けられた偏芯力 ム 36とから構成されている。 4つの偏芯カム 36は、全て外周のカム面が円形で、その 一端のカムから順々に 90度ずつ偏芯方向を変えて配設されている。これにより、 4本 の昇降ピン 23は、その一端から順々に 1つずつ押し上げてガラス基板 26の裏面に 当接して支持するようになっている。  [0031] The cam mechanism 30 is a device for raising and lowering the lift pin 23 by contacting the head 28 at the lower end of the lift pin 23. As shown in l, 4, and 5, the cam mechanism 30 includes a camshaft 35 that is rotatably supported in a container 34, and four eccentric force members 36 provided on the camshaft 35. ing. All of the four eccentric cams 36 have a circular outer peripheral cam surface, and are arranged by changing the eccentric direction by 90 degrees sequentially from the cam at one end thereof. As a result, the four lifting pins 23 are pushed up one by one from the one end in order and are in contact with and supported by the back surface of the glass substrate 26.
[0032] 連結軸 31は、カムシャフト 35に連結されて、駆動部 25からのトルクを伝達するため の軸である。  The connecting shaft 31 is a shaft that is connected to the camshaft 35 and transmits torque from the drive unit 25.
[0033] カップリング 32は、連結軸 31同士や、後述する駆動モータ 38のモータ連結軸 39と 連結軸 31とを連結するための部材である。カップリング 32は、円柱状の本体の中央 に、前記モータ連結軸 39や連結軸 31が嵌合する連結穴 32Aを備え、この連結穴 3 2Aに連結軸 31等を揷入してそれらの先端をネジ 32Bで固定して連結する。  The coupling 32 is a member for connecting the connecting shafts 31 to each other, and a motor connecting shaft 39 of the drive motor 38 to be described later and the connecting shaft 31. The coupling 32 has a connecting hole 32A in which the motor connecting shaft 39 and the connecting shaft 31 are fitted in the center of the cylindrical main body. The connecting shaft 31 and the like are inserted into the connecting hole 32A and the tips of the connecting holes 32A are inserted. Are fixed with screws 32B.
[0034] 駆動部 25は、駆動モータ 38と、モータ連結軸 39とから構成されて!/、る。駆動モー タ 38は、前記カム機構 30のカムシャフト 35を駆動するモータである。駆動モータ 38 は、この駆動モータ 38を制御する制御部 40に接続されている。この制御部 40は、昇 降手段 24を駆動する速度を調整するための装置である。制御部 40は、駆動モータ 3 8のみを制御する独立した装置として構成されたり、塗布膜用乾燥炉の全体を制御 する制御部 (図示せず)の一部として組み込まれたりする。この制御部 40は、駆動モ ータ 38を制御して、カムシャフト 35の偏芯カム 36の回転数を調整できるようになって いる。具体的には、制御部 40で、偏芯カム 36の回転数を、 0. 2秒/回〜数秒/回 まで設定できるようになつている。この制御部 40は、モータに印加する電圧や周波数 等を細力べ制御して回転数を調整するインバーター等のコントローラーを備えた構成 されている。 The drive unit 25 includes a drive motor 38 and a motor connecting shaft 39! /. Driving mode The motor 38 is a motor that drives the cam shaft 35 of the cam mechanism 30. The drive motor 38 is connected to a control unit 40 that controls the drive motor 38. The controller 40 is a device for adjusting the speed at which the ascending / descending means 24 is driven. The control unit 40 is configured as an independent device that controls only the drive motor 38, or is incorporated as a part of a control unit (not shown) that controls the entire coating film drying furnace. The control unit 40 can control the drive motor 38 to adjust the rotational speed of the eccentric cam 36 of the camshaft 35. Specifically, the control unit 40 can set the rotational speed of the eccentric cam 36 from 0.2 second / time to several seconds / time. The control unit 40 is configured to include a controller such as an inverter that adjusts the number of rotations by controlling the voltage and frequency applied to the motor.
[0035] モータ連結軸 39は、駆動モータ 38とカムシャフト 35とを連結するための軸である。  The motor connection shaft 39 is a shaft for connecting the drive motor 38 and the camshaft 35.
モータ連結軸 39は後述するベース板 45の支持板 46に回転可能に支持されている。 駆動モータ 38とカムシャフト 35とは、モータ連結軸 39とカップリング 32と連結軸 31を 介して連結されている。  The motor connecting shaft 39 is rotatably supported by a support plate 46 of a base plate 45 described later. The drive motor 38 and the camshaft 35 are connected via a motor connecting shaft 39, a coupling 32, and a connecting shaft 31.
[0036] 以上の構成のリフトピン機構 21は、図 6及び図 7に示すように、塗布膜用乾燥炉の 乾燥室内に設けられたホットプレート 43の下側に複数個配設されている。ホットプレ ート 43は、その上側に設置されるガラス基板 26を加熱するための加熱装置である。リ フトピン機構 21は、ホットプレート 43の下側に設けられている。具体的には、リフトピ ン機構 21のカム機構 30が縦に 5個ずつ、横に 4個ずつ、合計で 20個ほぼ等間隔に 配設されている。ホットプレート 43の各カム機構 30に対応する位置には、 4つの揷入 穴 44が設けられ、各揷入穴 44に昇降ピンユニット 22の昇降ピン 23がそれぞれ揷入 されるようになつている。  [0036] As shown in Figs. 6 and 7, a plurality of lift pin mechanisms 21 having the above-described configuration are disposed below the hot plate 43 provided in the drying chamber of the coating film drying furnace. The hot plate 43 is a heating device for heating the glass substrate 26 installed on the upper side thereof. The lift pin mechanism 21 is provided below the hot plate 43. More specifically, the cam mechanism 30 of the lift pin mechanism 21 is arranged in five vertically and four horizontally, for a total of 20 at almost equal intervals. Four insertion holes 44 are provided at positions corresponding to the cam mechanisms 30 of the hot plate 43, and the elevation pins 23 of the elevation pin unit 22 are inserted into the insertion holes 44, respectively. .
[0037] 各カム機構 30は、カップリング 32で連結されている。ここでは、ガラス基板 26の大 きさに対応して 4個のカム機構 30がカップリング 32で連結されて、 1つの駆動モータ 38で駆動されるようになっている。そして、この 4個連結されたカム機構 30がガラス基 板 26の大きさに対応して並行に 5列配設されて、ホットプレート 43の下側面の善意に 互いにほぼ均等間隔で配設されている。ホットプレート 43の大きさに応じた個数の力 ム機構 30をカップリング 32で接続して、任意の大きさに自由に構成する。 [0038] ホットプレート 43の上側面には、複数の固定ピン 43Aが設けられている。この固定 ピン 43Aは、ガラス基板 26をホットプレート 43の近くに配置して加熱するために用い られるピンである。 Each cam mechanism 30 is connected by a coupling 32. Here, four cam mechanisms 30 are connected by a coupling 32 corresponding to the size of the glass substrate 26 and driven by one drive motor 38. The four connected cam mechanisms 30 are arranged in parallel in five rows corresponding to the size of the glass base plate 26, and are arranged on the lower surface of the hot plate 43 at an approximately equal interval with each other. Yes. A number of force mechanisms 30 corresponding to the size of the hot plate 43 are connected by a coupling 32, and can be freely configured to an arbitrary size. [0038] On the upper side surface of the hot plate 43, a plurality of fixing pins 43A are provided. The fixing pin 43A is a pin used to heat the glass substrate 26 placed near the hot plate 43.
[0039] リフトピン機構 21は、ベース板 45に取り付けられている。このベース板 45は、昇降 機構 (図示せず)によって上下に移動可能に支持されている。この昇降機構でリフトピ ン機構 21が昇降することで、塗布膜用乾燥炉の乾燥室内に挿入されて昇降ピン 23 で支持されたガラス基板 26を、上下に移動させるようになつている。これにより、各乾 燥工程に応じてガラス基板 26とホットプレート 43との距離を調整する。ベース板 45上 には、モータ連結軸 39を回転可能に支持する支持板 46が設けられている。  The lift pin mechanism 21 is attached to the base plate 45. The base plate 45 is supported by an elevating mechanism (not shown) so as to be movable up and down. The lift pin mechanism 21 is moved up and down by this lift mechanism, so that the glass substrate 26 inserted into the drying chamber of the coating film drying furnace and supported by the lift pins 23 is moved up and down. Thus, the distance between the glass substrate 26 and the hot plate 43 is adjusted according to each drying process. On the base plate 45, a support plate 46 that rotatably supports the motor connecting shaft 39 is provided.
[0040] [動作]  [0040] [Operation]
以上のように構成されたリフトピン機構 21は次のように動作する。  The lift pin mechanism 21 configured as described above operates as follows.
[0041] まず、塗布膜用乾燥炉の乾燥室内のホットプレート 43を設定温度に加熱する。これ に伴って、ホットプレート 43の揷入穴 44に揷入された昇降ピン 23も加熱される。 [0041] First, the hot plate 43 in the drying chamber of the coating film drying furnace is heated to a set temperature. Along with this, the elevating pins 23 inserted into the insertion holes 44 of the hot plate 43 are also heated.
[0042] この状態で、ガラス基板 26が乾燥室内に挿入されて、ホットプレート 43の上側面に 延出して!/、る昇降ピン 23上に載置される。 [0042] In this state, the glass substrate 26 is inserted into the drying chamber, and is placed on the elevating pins 23 extending to the upper side surface of the hot plate 43! /.
[0043] このとき、駆動部 25の駆動モータ 38で昇降手段 24の偏芯カム 36が設定回転数で 回転されている。この偏芯カム 36の回転によって 4本の昇降ピン 23は、 1つずつ、か つ順々に昇降する。 4つの偏芯カム 36は 90度ずつずらされているため、カムシャフトAt this time, the eccentric cam 36 of the elevating means 24 is rotated at the set rotational speed by the drive motor 38 of the drive unit 25. By the rotation of the eccentric cam 36, the four lifting pins 23 are moved up and down one by one. Since the four eccentric cams 36 are offset by 90 degrees, the camshaft
35が 90度回転する毎に、各昇降ピン 23が順々に昇降して、昇降ピン 23の先端がガ ラス基板 26の裏面に当接してこのガラス基板 26を支持する。 Each time the 35 rotates 90 degrees, each lifting pin 23 moves up and down sequentially, and the tip of the lifting pin 23 comes into contact with the back surface of the glass substrate 26 to support the glass substrate 26.
[0044] ここでは、カムシャフト 35が 0. 2秒/回の速度回転されている。これにより、 4本の 昇降ピン 23が順々に、かつ 0. 05秒毎にガラス基板 26の裏面に当接して支持してい る。このカムシャフト 35の回転数は、昇降ピン 23の温度、昇降ピン 23の本数、ガラス 基板 26の寸法等の諸条件に応じて、最適な値を選択する。 [0044] Here, the camshaft 35 is rotated at a speed of 0.2 sec / time. As a result, the four lifting pins 23 are supported in contact with the back surface of the glass substrate 26 in order and every 0.05 seconds. The number of rotations of the camshaft 35 is selected in accordance with various conditions such as the temperature of the lift pins 23, the number of lift pins 23, the dimensions of the glass substrate 26, and the like.
[0045] この動作は、ホットプレート 43の下側に配設された 20個のカム機構 30すべてで行 われ、ガラス基板 26がその裏面の 20箇所の位置で、 0. 05秒毎にガラス基板 26との 接触位置が変わる昇降ピン 23で支持される。 [0045] This operation is performed by all of the 20 cam mechanisms 30 arranged on the lower side of the hot plate 43, and the glass substrate 26 is placed at 20 positions on the back surface thereof every 0.05 seconds. Supported by lift pins 23 that change contact position with 26.
[0046] これにより、冷えた状態で塗布膜用乾燥炉の乾燥室内に挿入されたガラス基板 26 は、過熱された昇降ピン 23に直接接触してこの昇降ピン 23で加熱される力 1つの 昇降ピン 23とガラス基板 26とは、 1周 0. 2秒の中で 0. 05秒以内の一瞬だけ接触す るため、昇降ピン 23の熱がガラス基板 26に伝わりづらぐガラス基板 26の上側面の 塗布膜を局部的に加熱することが無くなる。 [0046] Thereby, the glass substrate 26 inserted in the drying chamber of the coating film drying furnace in a cold state. The force that is heated directly by the lift pin 23 and heated by the lift pin 23 is as follows. One lift pin 23 and the glass substrate 26 are momentarily within 0.05 seconds within 0.5 seconds. Therefore, the coating film on the upper surface of the glass substrate 26 where the heat of the elevating pins 23 is not easily transmitted to the glass substrate 26 is not locally heated.
[0047] ガラス基板 26が加熱されて温度が上昇して昇降ピン 23と同じ又は同じ程度になつ たら、カムシャフト 35の回転数を遅くし、又は停止する。  [0047] When the glass substrate 26 is heated and the temperature rises to be the same as or similar to that of the lift pin 23, the rotational speed of the camshaft 35 is slowed or stopped.
[0048] リフトピン機構 21は、ベース板 45の昇降機構で、各工程での設定高さに適宜調整 される。例えば、乾燥工程の後半に、図 5 (a)の状態から図 5 (b)の固定ピン 43Aに 支持された状態にして、ガラス基板 26をホットプレート 43に近づけて加熱する。また 、ガラス基板 26をホットプレート 43の上側面に直接置いて加熱する場合もある。  [0048] The lift pin mechanism 21 is a lifting mechanism for the base plate 45, and is appropriately adjusted to a set height in each step. For example, in the latter half of the drying process, the glass substrate 26 is heated close to the hot plate 43 from the state shown in FIG. 5A to the state supported by the fixing pin 43A shown in FIG. In some cases, the glass substrate 26 is directly placed on the upper surface of the hot plate 43 and heated.
[0049] 塗布膜用乾燥炉での乾燥処理が終了すると、ガラス基板 26は外部に搬出され、次 のガラス基板 26が搬入されて、乾燥処理が繰り返される。  [0049] When the drying process in the coating film drying furnace is completed, the glass substrate 26 is unloaded, the next glass substrate 26 is loaded, and the drying process is repeated.
[0050] メンテナンス時には、任意の位置のカム機構 30に対して、選択的に修理、交換等 を行う。この場合は、メンテナンス対象のカム機構 30の前後のカップリング 32を外し て、そのカム機構 30の修理、交換等を行う。  [0050] During maintenance, the cam mechanism 30 at an arbitrary position is selectively repaired or replaced. In this case, the front and rear couplings 32 of the cam mechanism 30 to be maintained are removed, and the cam mechanism 30 is repaired or replaced.
[0051] [効果]  [0051] [Effect]
以上のように、ガラス基板 26の下側に複数配設された昇降ピンユニット 22のカム機 構 30力 4本の昇降ピン 23を 1本ずつ、かつ順々に昇降させて、各昇降ピン 23の上 端をガラス基板 26の下側面に当接させてガラス基板 26を支持するため、加熱された 昇降ピン 23による熱がガラス基板 26に伝わりにくくなり、乾燥ムラやピン痕等が生じ るのを確実に防止することができる。これにより、真空ベータ処理を省略できる。  As described above, a plurality of elevating pin units 22 cam mechanism 30 arranged on the lower side of the glass substrate 26 force 4 elevating pins 23 are raised and lowered one by one in order, and each elevating pin 23 Since the glass substrate 26 is supported by contacting the upper end of the glass substrate 26 with the lower surface of the glass substrate 26, the heat from the heated elevating pins 23 is less likely to be transmitted to the glass substrate 26, resulting in uneven drying and pin marks. Can be reliably prevented. Thereby, the vacuum beta process can be omitted.
[0052] 制御部 40で駆動モータ 38の回転数を制御して、偏芯カム 36による昇降ピン 23の 上下への昇降速度を制御するため、昇降ピン 23の上端とガラス基板 26の下側面と の当接時間を自由に調整することができる。これにより、諸条件に応じた最適な偏芯 カム 36の回転数に調整することができる。  [0052] Since the controller 40 controls the number of rotations of the drive motor 38 to control the up / down speed of the up / down pins 23 by the eccentric cam 36, the upper end of the up / down pins 23 and the lower surface of the glass substrate 26 are Can be freely adjusted. As a result, it is possible to adjust the rotational speed of the eccentric cam 36 according to various conditions.
[0053] リフトピン機構 21は、複数のカム機構 30をカップリング 32で連結して構成すること で、大きさの異なるホットプレート 43に対して自由に大きさを調整することができる。力 ム機構 30の配設密度も自由に調整すること力 Sできる。 [0054] さらに、昇降手段 24のカム機構 30が、ガラス基板 26の大きさに対応した数 (ここで は 4個)だけカップリング 32で連結され、かつガラス基板 26の大きさに対応した数 (こ こでは 5列)だけ並列に配設されるため、種々の大きさのガラス基板 26に対して、カム 機構 30が最適な位置に配設されたリフトピン機構 21を容易に構成することができる。 カップリング 32で連結された 4個のカム機構 30は 1個の駆動モータ 38で駆動される ため、駆動モータ 38の数を減らせる。 [0053] The lift pin mechanism 21 can be freely adjusted in size with respect to the hot plates 43 having different sizes by connecting a plurality of cam mechanisms 30 with couplings 32. The force density can be adjusted by adjusting the arrangement density of the force mechanism 30 freely. [0054] Further, the number of cam mechanisms 30 of the elevating means 24 is connected by the coupling 32 by the number corresponding to the size of the glass substrate 26 (here, four), and the number corresponding to the size of the glass substrate 26. Since (here 5 rows) are arranged in parallel, the lift pin mechanism 21 in which the cam mechanism 30 is arranged at the optimum position can be easily configured for the glass substrates 26 of various sizes. it can. Since the four cam mechanisms 30 connected by the coupling 32 are driven by one drive motor 38, the number of drive motors 38 can be reduced.
[0055] また、メンテナンス時には、メンテナンス対象のカム機構 30の前後のカップリング 32 を取り外すことで、そのカム機構 30を取り外してメンテナンスできるため、メンテナンス 時の作業性が向上する。  [0055] Further, at the time of maintenance, the cam mechanism 30 can be removed and maintained by removing the couplings 32 before and after the cam mechanism 30 to be maintained, so that the workability at the time of maintenance is improved.
[0056] [第 2実施形態]  [0056] [Second Embodiment]
次に、本発明の第 2実施形態について説明する。  Next, a second embodiment of the present invention will be described.
[0057] 本実施形態のリフトピン機構は、ホットプレート 43の熱膨張に伴うズレを吸収する熱 膨張吸収手段を備えたものである。従来は、昇降ピン 23の揷入される穴を大きくして 、ホットプレート 43の熱膨張分を吸収するようにしていた。これに対して、本実施形態 のリフトピン機構は、熱膨張吸収手段で吸収するようにしたものである。本実施形態 のリフトピン機構では、熱膨張吸収手段以外の構成は、前記第 1実施形態のリフトピ ン機構 21と同様であるため、ここでは熱膨張吸収手段を中心に説明する。  The lift pin mechanism of the present embodiment is provided with a thermal expansion absorbing unit that absorbs a shift due to thermal expansion of the hot plate 43. Conventionally, the hole into which the elevating pin 23 is inserted is enlarged to absorb the thermal expansion of the hot plate 43. On the other hand, the lift pin mechanism of the present embodiment is adapted to be absorbed by the thermal expansion absorbing means. In the lift pin mechanism of the present embodiment, the configuration other than the thermal expansion absorbing means is the same as that of the lift pin mechanism 21 of the first embodiment, and therefore, here, the description will focus on the thermal expansion absorbing means.
[0058] 図 8, 9に示すように、熱膨張吸収手段 51は、熱膨張に伴うズレを吸収する電磁石 52によって構成されている。電磁石 52は、上部駆動部 53に組み込まれたコイル 54 と、電源 55と、スィッチ 56とから構成されている。昇降ピン 23は磁性体で構成され、 その頭部 28が電磁石 52と電磁的に結合するようになっている。上部駆動部 53には 連結棒 57を介して下部駆動部 58が設けられ、連結棒 57が上下動可能に支持され て、下部駆動部 58と共に上部駆動部 53が偏芯カム 36に追従して上下動するように なっている。  As shown in FIGS. 8 and 9, the thermal expansion absorbing means 51 is constituted by an electromagnet 52 that absorbs a shift due to thermal expansion. The electromagnet 52 includes a coil 54 incorporated in the upper drive unit 53, a power supply 55, and a switch 56. The elevating pin 23 is made of a magnetic material, and its head 28 is electromagnetically coupled to the electromagnet 52. The upper drive unit 53 is provided with a lower drive unit 58 via a connecting rod 57, and the connecting rod 57 is supported so as to move up and down, and the upper drive unit 53 and the lower drive unit 58 follow the eccentric cam 36. It is designed to move up and down.
[0059] 上部駆動部 53の上側面と、昇降ピン 23の頭部 28の下側面とは、互いに平坦面状 に形成されている。これにより、上部駆動部 53と昇降ピン 23の頭部 28と力 互いに 確実に、電磁的に結合することができると共に、互いの当接面に沿って容易にずらす こと力 Sできるようになって!/、る。 [0060] 以上のように構成されたリフトピン機構の熱膨張吸収手段 51は、次のように動作す [0059] The upper side surface of the upper drive unit 53 and the lower side surface of the head 28 of the elevating pin 23 are formed in a flat surface. As a result, the upper drive unit 53 and the head 28 of the elevating pin 23 can be reliably electromagnetically coupled with each other, and the force S can be easily shifted along the contact surfaces. ! / [0060] The thermal expansion absorbing means 51 of the lift pin mechanism configured as described above operates as follows.
[0061] 熱処理に先立って、ホットプレート 43が設定温度に加熱される力 S、そのときホットプ レート 43は温度の上昇と共に熱膨張する。この熱膨張は、その中心位置からの距離 に比例して大きくなる。具体的には、ホットプレート 43の四隅のカム機構 30の部分が 最も大きくずれてしまう。これに対して、ホットプレート 43の中心付近の昇降ピンュニ ット 22の部分のずれは小さ!/、。 Prior to the heat treatment, the force S at which the hot plate 43 is heated to the set temperature, and the hot plate 43 then thermally expands as the temperature rises. This thermal expansion increases in proportion to the distance from the center position. Specifically, the cam mechanisms 30 at the four corners of the hot plate 43 are displaced the most. On the other hand, the shift of the lift pin unit 22 near the center of the hot plate 43 is small! /.
[0062] このため、ホットプレート 43の加熱に伴って、スィッチ 56をオフして、昇降ピン 23の 頭部 28と電磁石 52との電磁的結合を解除する。これにより、昇降ピン 23の頭部 28と 上部駆動部 53とが、図 9のようにずれる。ホットプレート 43が設定温度になったら、そ れ以上の熱膨張はないので、スィッチ 56をオンして、昇降ピン 23の頭部 28と電磁石 52とを電磁的に結合する。これにより、ホットプレート 43の膨張を吸収する。  [0062] Therefore, as the hot plate 43 is heated, the switch 56 is turned off to release the electromagnetic coupling between the head 28 of the lift pin 23 and the electromagnet 52. As a result, the head 28 of the elevating pin 23 and the upper drive unit 53 are displaced as shown in FIG. When the hot plate 43 reaches the set temperature, there is no further thermal expansion, so the switch 56 is turned on, and the head 28 of the lift pin 23 and the electromagnet 52 are electromagnetically coupled. Thereby, the expansion of the hot plate 43 is absorbed.
[0063] これ以外の動作は、前記第 1実施形態のリフトピン機構 21と同様である。  The other operations are the same as those of the lift pin mechanism 21 of the first embodiment.
[0064] 以上のように、昇降ピン 23の頭部 28と電磁石 52との電磁的結合を、ホットプレート 43の加熱に伴って、このホットプレート 43が設定温度になるまで一時的に解除する ので、熱膨張に伴う昇降ピン 23のずれを確実に吸収することができるようになる。  [0064] As described above, the electromagnetic coupling between the head 28 of the elevating pin 23 and the electromagnet 52 is temporarily released as the hot plate 43 reaches the set temperature as the hot plate 43 is heated. Thus, it is possible to reliably absorb the displacement of the elevating pin 23 due to thermal expansion.
[0065] なお、ここでは、電磁石 52を用いて、昇降ピン 23の頭部 28と電磁石 52とを電磁的 に結合するようにした力 S、永久磁石を用いても良い。  [0065] Here, a force S and a permanent magnet that electromagnetically couples the head 28 of the lifting pin 23 and the electromagnet 52 using the electromagnet 52 may be used.
[0066] この場合は、図 10に示すように、昇降ピン 23の頭部 28を、 N極又は S極の永久磁 石で構成する。さらに、前記上部駆動部 53の部分は、コイル 54の代わりに、 S極又は N極の永久磁石で構成する。そして、互いの当接面は平坦面状になっている。  In this case, as shown in FIG. 10, the head portion 28 of the elevating / lowering pin 23 is composed of an N-pole or S-pole permanent magnet. Further, the portion of the upper drive unit 53 is composed of an S-pole or N-pole permanent magnet instead of the coil 54. The contact surfaces of each other are flat.
[0067] これにより、熱膨張に伴うズレを前記平坦面状の当接面の互いのズレで吸収する。  [0067] Thereby, the displacement due to the thermal expansion is absorbed by the mutual displacement of the flat contact surface.
これは、永久磁石の特性を利用したものである。 N極と S極の永久磁石が互いに結合 すると、これらを引き離す方向へは非常に強い力を必要とするが、当接面に沿う方向 には僅かな力でずらすことができる。この平坦面状の当接面で互いに当接した永久 磁石によって、熱膨張に伴うズレを前記平坦面状の当接面の互いのズレで吸収して 、上下方向を確実に結合する。  This utilizes the characteristics of the permanent magnet. When N-pole and S-pole permanent magnets are coupled to each other, a very strong force is required in the direction to separate them, but they can be shifted with a slight force in the direction along the contact surface. The permanent magnets that are in contact with each other on the flat surface-like contact surfaces absorb the displacement due to thermal expansion by the mutual displacements of the flat surface-like contact surfaces, so that the vertical direction is reliably coupled.
[0068] この場合も、前記第 2実施形態と同様の作用、効果を奏すること力 Sできる。 [0069] なお、前記永久磁石は、昇降ピン 23の頭部 28側又は上部駆動部 53側のいずれ か一方のみに用いて、他方を磁性体にしても良い。 [0068] In this case as well, it is possible to achieve the same effect S as the second embodiment. [0069] The permanent magnet may be used only on either the head 28 side or the upper drive unit 53 side of the elevating pin 23, and the other may be a magnetic body.
[0070] さらに、前記永久磁石の代わりに電磁石を用いても良い。この場合は、前記第 2実 施形態の場合と異なって、前記永久磁石と同様の態様で用いる。 Furthermore, an electromagnet may be used instead of the permanent magnet. In this case, unlike the case of the second embodiment, it is used in the same manner as the permanent magnet.
[0071] [第 3実施形態] [0071] [Third Embodiment]
次に、本発明の第 3実施形態について説明する。  Next, a third embodiment of the present invention will be described.
[0072] 本実施形態のリフトピン機構は、第 1実施形態のカム機構 30の偏芯カム 36の代わ りに、直動カムを用いたものである。 [0072] The lift pin mechanism of this embodiment uses a linear cam instead of the eccentric cam 36 of the cam mechanism 30 of the first embodiment.
[0073] 図 11及び図 12に示すように、カム機構 61は、直動カム 62と、従動部 63とから構成 されている。 As shown in FIGS. 11 and 12, the cam mechanism 61 is composed of a linear cam 62 and a driven portion 63.
[0074] 直動カム 62は、水平方向に往復動する平板状の棒材で構成されている。この平板 棒状の直動カム 62の上側面に、昇降ピン 23を上下動させるための山型のカム面が 形成されている。この山型のカム面の形状を調整して、昇降ピン 23の上下動の速度 、移動量等を設定する。直動カム 62は、連結棒 65で駆動部 (図示せず)に接続され ている。この駆動部は、往復運動をする機構で構成され、直動カム 62を往復動させ  [0074] The linear motion cam 62 is composed of a flat bar that reciprocates in the horizontal direction. A chevron-shaped cam surface for moving the elevating pin 23 up and down is formed on the upper side surface of the flat bar-like linear motion cam 62. By adjusting the shape of this mountain-shaped cam surface, the vertical movement speed and movement amount of the lifting pin 23 are set. The linear cam 62 is connected to a drive unit (not shown) by a connecting rod 65. This drive unit is composed of a reciprocating mechanism, and causes the linear cam 62 to reciprocate.
[0075] 従動部 63は、ローラ部 66と、上下動片部 67とから構成されている。ローラ部 66は 上下動片部 67の下端部に回転可能に支持されている。上下動片部 67は、上下動 可能に支持されている。これにより、ローラ部 66が直動カム 62の山型のカム面に沿つ て回転することで、上下動片部 67が上下動して、昇降ピン 23を昇降させるようになつ ている。 The follower 63 is composed of a roller 66 and a vertically moving piece 67. The roller portion 66 is rotatably supported by the lower end portion of the vertical moving piece portion 67. The vertically moving piece 67 is supported so as to be vertically movable. As a result, the roller portion 66 rotates along the mountain-shaped cam surface of the linear cam 62, so that the vertically moving piece portion 67 moves up and down to raise and lower the lifting pin 23.
[0076] 従動部 63は、各昇降ピン 23にそれぞれ取り付けられている。 4本の昇降ピン 23に 合わせて、 4個の従動部 63が配設されている。  The follower 63 is attached to each lift pin 23. Four followers 63 are arranged in accordance with the four lifting pins 23.
[0077] 以上のように構成されたリフトピン機構では、前記駆動部で直動カム 62が往復運動 され、これに伴って従動部 63のローラ部 66が山型のカム面に沿って回転し、上下動 片部 67が上下動して、昇降ピン 23を昇降させる。 [0077] In the lift pin mechanism configured as described above, the linear motion cam 62 is reciprocated by the drive portion, and accordingly, the roller portion 66 of the driven portion 63 rotates along the mountain-shaped cam surface, Vertical movement piece 67 moves up and down to raise and lower the lift pin 23.
[0078] さらに、直動カム 62は、往復動することで、 4つの従動部 63を順々に上下動させて[0078] Further, the linear motion cam 62 reciprocates to move the four driven parts 63 up and down in order.
、 4本の昇降ピン 23を順々に昇降させる。これにより、前記第 1実施形態の昇降ピン 2 3と同様に、ガラス基板 26を支持する。 : Raise and lower the four lifting pins 23 one after another. As a result, the lifting pins 2 of the first embodiment As in 3, the glass substrate 26 is supported.
[0079] この場合も、前記第 1実施形態と同様の作用、効果を奏すること力 Sできる。 [0079] Also in this case, it is possible to achieve the same effect S as the first embodiment.
産業上の利用可能性  Industrial applicability
[0080] 前記各実施形態では、塗布膜用乾燥炉内での加熱による乾燥作業を例に説明し て、熱による影響を抑えるためのリフトピン機構について説明した力 昇降ピン 23に よる影響としては、熱以外に、静電気等の他の要因も考えられる。静電気等の他の要 因の場合も、前記各実施形態のリフトピン機構 21により処理対象基板への悪影響を 解消すること力できる。静電気の場合は、各昇降ピン 23で電荷を分散させることがで きる。 [0080] In each of the above embodiments, the drying operation by heating in the coating film drying furnace is described as an example, and the force by the lift pin 23 for explaining the lift pin mechanism for suppressing the influence by heat is as follows. In addition to heat, other factors such as static electricity are also conceivable. Also in the case of other factors such as static electricity, the lift pin mechanism 21 of each of the above embodiments can be used to eliminate adverse effects on the substrate to be processed. In the case of static electricity, the charge can be dispersed by the lifting pins 23.
[0081] 前記各実施形態では、昇降ピン 23を 4本設けた場合を例に説明した力 2本、 3本 又は 5本以上でも良いことは言うまでもない。支持するガラス基板 26の大きさやリフト ピン機構 21の設置数等の諸条件に応じて本数を決定する。この昇降ピン 23の本数 に応じて偏芯カム 36の設置個数を調整する。  [0081] In each of the above-described embodiments, it is needless to say that the force may be 2, 3, or 5 or more as described in the case where four lifting pins 23 are provided. The number is determined according to various conditions such as the size of the glass substrate 26 to be supported and the number of lift pin mechanisms 21 installed. The number of eccentric cams 36 is adjusted according to the number of lifting pins 23.
[0082] 前記各実施形態では、昇降ピン 23として、先端の尖った細いピンを用いた力 この 昇降ピン 23の形状としては、先端の尖った細いピンに限らず、昇降ピンユニット 22で 上下動させることができる既存の全てのピンを用いることができる。  In each of the above embodiments, the force using a thin pin with a sharp tip as the lift pin 23 The shape of the lift pin 23 is not limited to the thin pin with a sharp tip, and is moved up and down by the lift pin unit 22 Any existing pin that can be used can be used.
[0083] 前記第 1実施形態では、昇降ピン 23を昇降させる手段として回転カムを用い、第 3 実施形態では直動カムを用いた力 端面カム等の他のカム機構を用いてもよいこと は言うまでもない。昇降ピン 23を上下動できる構成のカム機構であれば、前記各実 施形態同様の作用、効果を奏することができる。  [0083] In the first embodiment, a rotating cam may be used as a means for raising and lowering the elevating pin 23, and in the third embodiment, another cam mechanism such as a force end face cam using a linear motion cam may be used. Needless to say. If the cam mechanism is configured to be able to move the elevating pin 23 up and down, the same operations and effects as the above embodiments can be achieved.
[0084] なお、端面カムの場合は、各昇降ピン 23は、前記各実施形態同様のように、直列 に 4本並ぶのではなぐ円形に沿って配設されることになる。  [0084] In the case of an end face cam, each lifting pin 23 is arranged along a circle that is not arranged in series, as in the above-described embodiments.
[0085] また、前記第 1実施形態では、偏芯カム 36の外周のカム面を円形にした力 楕円 形等の他の形状でもよ!/、ことは言うまでもな!/、。この偏芯カム 36の形状を適宜調整し て昇降ピン 23の上下への移動量や動き方、ガラス基板 26への接触時間等を適宜設 疋 。  [0085] In the first embodiment, other shapes such as a force ellipse in which the outer peripheral cam surface of the eccentric cam 36 is circular may be used! /, Needless to say! /. By appropriately adjusting the shape of the eccentric cam 36, the amount of movement and movement of the elevating pin 23 up and down, the contact time with the glass substrate 26, etc. are appropriately set.
[0086] また、前記第 1実施形態では、 4本の昇降ピン 23は、その一端から順々に 1つずつ ガラス基板 26の裏面に当接して支持するようにした力 S、各昇降ピン 23のうちの 2以上 を同時に、かつ順々に上下動させるようにしても良い。また、 4本の昇降ピン 23をその 一端から順番に昇降させた力 昇降させる順番はバラバラでもよい。例えば、 1本目、 4本目、 2本目、 3本目の順番に順々に昇降させる等の他の順番で昇降させてもよ!/ヽ 。昇降ピン 23がガラス基板 26の裏面に当接している時間も、偏芯カム 36の形状を変 えることで、容易に設定すること力 Sできる。 [0086] In the first embodiment, the four lifting pins 23 are provided with the force S that is brought into contact with and supported by the back surface of the glass substrate 26 one by one from one end thereof. 2 or more of May be moved up and down simultaneously and sequentially. Further, the force of raising and lowering the four raising / lowering pins 23 in order from one end thereof may be varied. For example, you can move up and down in other order, such as first, fourth, second, third in order, etc.! / ヽThe time during which the elevating pin 23 is in contact with the back surface of the glass substrate 26 can be easily set by changing the shape of the eccentric cam 36.
[0087] また、前記各実施形態では、カム機構 30を用いて昇降ピン 23を昇降させた力 電 磁ソレノイドを用いて、昇降ピン 23を昇降させるようにしても良い。具体的には、昇降 ピンユニットを、上下動可能に支持された複数の昇降ピン 23と、各昇降ピン 23の基 端部にそれぞれ設けられて各昇降ピン 23を個別に昇降させ、各昇降ピン 23のうちの 1ずつ又は 2以上を同時に、かつ順々に上下動させる電磁ソレノイド (図示せず)と、こ の電磁ソレノイドを駆動させる駆動部 (図示せず)とを備えて構成しても良!/、。前記駆 動部は、電磁ソレノイドに供給する電力を個別に制御する制御部を備えて構成する。 この制御部は、一組 (4本)の昇降ピン 23の電磁ソレノイドを制御する場合と、ガラス 基板 26の下側全域に配設された全ての電磁ソレノイドを制御する場合がある。この 場合、電磁ソレノイドが熱による影響を受けないように断熱処理を施す。また、静電気 等の他の要因による悪影響を解消する目的を伴う処理 (熱を伴わない処理)に電磁ソ レノイドを用いる場合は、そのまま用いることができる。  In each of the above embodiments, the lifting pin 23 may be moved up and down using a force electromagnetic solenoid in which the lifting pin 23 is moved up and down using the cam mechanism 30. Specifically, the lifting pin unit is provided at a plurality of lifting pins 23 supported so as to be movable up and down, and at the base end of each lifting pin 23, and each lifting pin 23 is lifted and lowered individually. An electromagnetic solenoid (not shown) that moves one or more of 23 at the same time and in order, and a drive unit (not shown) that drives the electromagnetic solenoid may be provided. Good! The drive unit includes a control unit that individually controls power supplied to the electromagnetic solenoid. This control unit may control the electromagnetic solenoids of one set (four) of the lift pins 23 or may control all the electromagnetic solenoids disposed in the entire lower area of the glass substrate 26. In this case, heat insulation is applied so that the electromagnetic solenoid is not affected by heat. In addition, when electromagnetic solenoids are used for processing with the purpose of eliminating the adverse effects of other factors such as static electricity (processing without heat), they can be used as they are.
[0088] この結果、前記制御部によって各電磁ソレノイドを、容易に、個別に、かつ自由自 在に制御することができるので、各昇降ピン 23のうちの 1ずつを順々に上下動させる 態様でも、 2以上を同時に、かつ順々に上下動させる態様でも、容易に行うことができ る。また、昇降ピン 23がガラス基板 26の裏面に当接している時間も、昇降ピン 23を 昇降させる順番も容易に設定することができる。  As a result, each electromagnetic solenoid can be easily and individually controlled by the control unit, so that one of the lifting pins 23 is moved up and down one by one. However, it is also possible to easily carry out a mode in which two or more are moved up and down at the same time. Further, the time during which the elevating pins 23 are in contact with the back surface of the glass substrate 26 and the order in which the elevating pins 23 are raised and lowered can be easily set.
[0089] また、前記第 1実施形態では、制御部 40で、偏芯カム 36の回転数を、 0. 2秒/回 〜数秒/回まで設定できるようにした力 一般的には、カムシャフト 35の回転数は極 力高くして、 1本の昇降ピン 23のガラス基板 26への接触時間を短くした方が望ましい 。このため、カムシャフト 35の回転を上げると共に、昇降ピン 23の本数を増やす方が 望ましい。  In the first embodiment, the control unit 40 can set the rotational speed of the eccentric cam 36 from 0.2 second / time to several seconds / time. Generally, the camshaft It is desirable that the rotation speed of 35 is as high as possible so that the contact time of one lifting pin 23 with the glass substrate 26 is shortened. For this reason, it is desirable to increase the number of lifting pins 23 while increasing the rotation of the camshaft 35.
[0090] 前記実施形態では、偏芯カム 36を真円の回転板を用いて構成した力 S、真円に限ら ず他の形状でもよい。例えば、図 13に示すように、偏芯カム 70を、その外周形状の 一部に、回転中心と同心円の円弧部 71を備えて構成しても良い。さらに、この円弧 部 71は、隣り合う偏芯カム 70同士で一部重なるように設定される。 [0090] In the above-described embodiment, the force S formed by using the perfect rotating plate for the eccentric cam 36 is limited to the perfect circle. Other shapes may be used. For example, as shown in FIG. 13, the eccentric cam 70 may be configured to include a circular arc portion 71 concentric with the rotation center in a part of the outer peripheral shape thereof. Further, the arc portion 71 is set so as to partially overlap the adjacent eccentric cams 70.
[0091] これにより、偏芯カム 70が回転されると、この偏芯カム 70の外周形状に沿って昇降 ピン 23が昇降する。具体的には、昇降ピン 23は、偏芯カム 70の回転により上昇し、 円弧部 71で上端位置となって止まり、円弧部 71を過ぎると降下する。  Thus, when the eccentric cam 70 is rotated, the elevating pins 23 are moved up and down along the outer peripheral shape of the eccentric cam 70. Specifically, the elevating pin 23 rises due to the rotation of the eccentric cam 70, stops at the upper end position at the arc portion 71, and descends after passing the arc portion 71.
[0092] 4つの偏芯カム 70が連結軸 31で回転されると、隣接する 2つの昇降ピン 23の一方 、先行する偏芯カム 70で上昇されて円弧部 71の上端位置で止まり、円弧部 71を 過ぎると降下する。この降下の直前に、隣接する 2つ昇降ピン 23の他方力 S、後行する 偏芯カム 70で上昇されて、偏芯カム 70の一部重なる部分で、 2つの昇降ピン 23が同 時に上端位置まで上昇してガラス基板 26を支持する。この直後、一方の昇降ピン 23 は降下し、他方の昇降ピン 23は上端位置で止まり、円弧部 71を過ぎると降下する。  [0092] When the four eccentric cams 70 are rotated by the connecting shaft 31, one of the two adjacent lifting pins 23 is raised by the preceding eccentric cam 70 and stops at the upper end position of the arc portion 71, and the arc portion Descent after 71. Immediately before this descent, the other force S of the adjacent two lifting pins 23 is raised by the following eccentric cam 70, and the two lifting pins 23 are simultaneously moved to the upper end at the part where the eccentric cam 70 partially overlaps. The glass substrate 26 is supported by moving up to the position. Immediately after this, one raising / lowering pin 23 descends, the other raising / lowering pin 23 stops at the upper end position, and descends after passing the arc portion 71.
[0093] これを 4つの昇降ピン 23が隣同士で連携して行う。端部の昇降ピン 23の場合は、 一端部の昇降ピン 23と他端部の昇降ピン 23とが隣同士として連携し合う。これにより 、隣り合う 2つの昇降ピン 23のうちのいずれかが必ずガラス基板 26を支持することに なる。この結果、複数の昇降ピン 23のうちいずれ力、 1本は必ずガラス基板 26に接触 して、ガラス基板 26を安定して支持することができる。  [0093] This is done in cooperation with the four lift pins 23 adjacent to each other. In the case of the lift pin 23 at the end, the lift pin 23 at one end and the lift pin 23 at the other end cooperate with each other. As a result, one of the two adjacent lift pins 23 always supports the glass substrate 26. As a result, any one of the plurality of lifting pins 23 always comes into contact with the glass substrate 26, and the glass substrate 26 can be stably supported.
[0094] 前記実施形態では、直動カム 62を山型にしてその頂点を設け、昇降ピン 23はこの 頂点の手前で上昇して、頂点を過ぎると降下する構成にした力 頂点部分を平坦に しても良い。具体的には、図 14に示すように、直動カム 72は、その山型形状の頂点 部分に、平坦面部 73が形成されている。  [0094] In the above embodiment, the linear cam 62 is formed in a mountain shape and its apex is provided, and the elevating pin 23 rises before this apex and descends after the apex is flattened. You may do it. Specifically, as shown in FIG. 14, the linear cam 72 has a flat surface portion 73 formed at the apex portion of the mountain shape.
[0095] さらに、平坦面部 73は、複数配設された昇降ピン 23のうち少なくとも隣接する 2つの 昇降ピン 23のローラ部 66に同時に接触し得る長さに設定されている。 3つ以上の昇 降ピン 23のローラ部 66が同時に接触し得る長さに設定しても良い。  [0095] Furthermore, the flat surface portion 73 is set to a length that can simultaneously contact the roller portions 66 of at least two adjacent lifting pins 23 among the plurality of lifting pins 23 arranged. You may set to the length which the roller part 66 of three or more raising / lowering pins 23 can contact simultaneously.
[0096] これにより、直動カム 72を移動させると、各昇降ピン 23が、直動カム 72で昇降され 、平坦面部 73で上端位置となって止まり、ガラス基板 26を支持する。各昇降ピン 23 は、平坦面部 73を過ぎると再び降下する。このとき、隣り合う 2つの昇降ピン 23のロー ラ部 66が平坦面部 73の両端付近で同時に上端位置となって、 2つの昇降ピン 23が 同時にガラス基板 26を支持する。この直後、一方の昇降ピン 23は降下し、他方の昇 降ピン 23は上端位置で止まり、平坦面部 73を過ぎると降下する。 Thus, when the linear cam 72 is moved, each lifting pin 23 is moved up and down by the linear cam 72 and stops at the upper end position at the flat surface portion 73 to support the glass substrate 26. Each elevating pin 23 descends again after passing the flat surface portion 73. At this time, the roller portions 66 of the two adjacent lift pins 23 simultaneously become upper end positions near both ends of the flat surface portion 73, and the two lift pins 23 At the same time, the glass substrate 26 is supported. Immediately after this, one raising / lowering pin 23 descends, the other raising / lowering pin 23 stops at the upper end position, and descends after passing the flat surface portion 73.
[0097] これを 4つの昇降ピン 23が隣同士で連携して行う。これにより、隣り合う 2つの昇降 ピン 23のうちのいずれかが必ずガラス基板 26を支持することになる。この結果、複数 の昇降ピン 23のうちいずれ力、 1本は必ずガラス基板 26に接触して、ガラス基板 26を 安定して支持することができる。 [0097] This is done in cooperation with the four lifting pins 23 adjacent to each other. As a result, one of the two adjacent lift pins 23 always supports the glass substrate 26. As a result, any one of the plurality of lifting pins 23 always comes into contact with the glass substrate 26, and the glass substrate 26 can be stably supported.
[0098] この場合も前記実施形態同様の作用、効果を奏することができる。 In this case as well, the same operations and effects as in the above embodiment can be achieved.
[0099] 前記実施形態では、真空中での処理については考慮していないが、本願発明は 真空中での処理にも適用できる。具体的には、図 15に示すように、ホットプレート 43 のうち昇降ピン 23の軸部 27が通る穴の上下端部に Oリング 75をそれぞれ装着する。 In the above embodiment, processing in vacuum is not considered, but the present invention can also be applied to processing in vacuum. Specifically, as shown in FIG. 15, O-rings 75 are respectively attached to the upper and lower ends of the hole through which the shaft portion 27 of the elevating pin 23 of the hot plate 43 passes.
Oリング 75は、リング溝ゃヮッシャ等の既存の技術で固定する。 Oリング 75は、ホット プレート 43の穴に揷入できる大きさの環状シール材で構成されている。この Oリング 7 5でホットプレート 43の穴が密封されて、昇降ピン 23の軸部 27が Oリング 75の中央 の孔に通される。  The O-ring 75 is fixed with existing technology such as a ring grooved washer. The O-ring 75 is made of an annular seal material that can be inserted into the hole of the hot plate 43. The hole of the hot plate 43 is sealed by the O-ring 75 and the shaft portion 27 of the lifting pin 23 is passed through the central hole of the O-ring 75.
[0100] ホットプレート 43の上側には、側壁部 76がー体的に設けられ、側壁部 76の上端に 天板 77で取り付けられている。側壁部 76と天板 77との間は、 Oリング 78で密封され ている。これにより、ホットプレート 43と側壁部 76と天板 77とで真空室 79が形成され ている。この真空室 79内で真空べ一キングや真空乾燥等の処理が行われる。  [0100] On the upper side of the hot plate 43, a side wall 76 is provided in a body-like manner, and is attached to the upper end of the side wall 76 with a top plate 77. The side wall 76 and the top plate 77 are sealed with an O-ring 78. Thus, a vacuum chamber 79 is formed by the hot plate 43, the side wall portion 76, and the top plate 77. Processing such as vacuum baking and vacuum drying is performed in the vacuum chamber 79.
[0101] この場合も前記実施形態同様の作用、効果を奏することができる。 [0101] In this case as well, the same operations and effects as in the above embodiment can be achieved.
[0102] 前記実施形態では、リフトピン機構 21を単独で備えた場合を例に説明したが、リフ トビン機構 21と既存の送り手段とを組み合わせて構成しても良い。既存の送り手段で ガラス基板 26を持ち上げて例えば lmmずつ移動させる。そして、リフトピン機構 21 の 4本の昇降ピン 23で交互にガラス基板 26を支持する。これにより、ガラス基板 26の 裏面に接触する昇降ピン 23の同じ場所への接触回数を減少させることができ、昇降 ピン 23の接触によるガラス基板 26の裏面へのダメージを大幅に低減することができ In the above-described embodiment, the case where the lift pin mechanism 21 is provided alone has been described as an example. However, the lift bin mechanism 21 and the existing feeding unit may be combined. The glass substrate 26 is lifted by existing feeding means and moved by, for example, lmm. Then, the glass substrates 26 are alternately supported by the four lifting pins 23 of the lift pin mechanism 21. As a result, the number of contact of the lift pins 23 contacting the back surface of the glass substrate 26 with the same location can be reduced, and damage to the back surface of the glass substrate 26 due to the contact of the lift pins 23 can be greatly reduced.
[0103] 特に、送り手段とリフトピン機構 21を交互に作動させると、各昇降ピン 23はガラス基 板 26の裏面の同じ場所に 2回接触することがなくなり、昇降ピン 23の接触によるガラ ス基板 26の裏面へのダメージを最小限に抑えることができる。 [0103] In particular, when the feeding means and the lift pin mechanism 21 are operated alternately, each lifting pin 23 does not come into contact with the same place on the back surface of the glass substrate 26 twice. Damage to the back of the substrate 26 can be minimized.
また、ガラス基板 26を移動させる際に、移動ピッチを変えて往復させてもよい。例え ば、送り手段で一方へ lmmピッチで移動させ、次いで他方へ 0. 8mmピッチで移動 させてもよい。また、送り手段でガラス基板 26を移動させる方向としては、前後方向だ けでなぐ左右方向も適宜組み合わせてガラス基板 26を移動させてもよい。  Further, when the glass substrate 26 is moved, it may be reciprocated by changing the moving pitch. For example, it may be moved to one side with a lmm pitch by the feeding means and then moved to the other side with a pitch of 0.8mm. Further, as the direction in which the glass substrate 26 is moved by the feeding means, the glass substrate 26 may be moved by appropriately combining not only the front-rear direction but also the left-right direction.

Claims

請求の範囲 The scope of the claims
[1] 処理対象基板をその下側から当接して支持する昇降ピンを備えたリフトピン機構で あってゝ  [1] A lift pin mechanism having a lift pin that supports a substrate to be processed from below and supports it.
複数の前記昇降ピンを一組として当該一組の昇降ピンのうちの 1ずつ又は 2以上を 同時に、かつ順々に昇降させて各昇降ピンの上端を前記処理対象基板の下側面に 当接させて支持する昇降ピンユニットを備え、  A plurality of the lifting pins are taken as a set, and one or more of the lifting pins are moved up and down simultaneously and sequentially so that the upper end of each lifting pin contacts the lower surface of the substrate to be processed. Elevating pin unit to support
当該昇降ピンユニットが、前記処理対象基板の下側に複数配設されたことを特徴と するリフトピン機構。  A lift pin mechanism in which a plurality of the lift pin units are arranged below the substrate to be processed.
[2] 請求項 1に記載のリフトピン機構にお!/、て、 [2] In the lift pin mechanism according to claim 1,! /,
前記昇降ピンユニットが、上下動可能に支持された複数の昇降ピンと、当該各昇降 ピンのうちの 1ずつ又は 2以上を同時に、かつ順々に上下動させる昇降手段と、当該 昇降手段を駆動させる駆動部とを備えて構成されたことを特徴とするリフトピン機構。  The elevating pin unit includes a plurality of elevating pins supported so as to be movable up and down, elevating means for elevating one or more of the elevating pins one by one or two simultaneously and sequentially, and driving the elevating means A lift pin mechanism comprising a drive unit.
[3] 請求項 2に記載のリフトピン機構において、 [3] In the lift pin mechanism according to claim 2,
前記昇降手段が、前記昇降ピンの下端部に当接して当該昇降ピンを昇降させる力 ム機構を備えて構成され、  The elevating means includes a force mechanism that raises and lowers the elevating pin by contacting the lower end of the elevating pin;
前記駆動部が、前記カム機構を駆動する駆動モータを備えて構成されたことを特 徴とするリフトピン機構。  A lift pin mechanism characterized in that the drive unit is configured to include a drive motor for driving the cam mechanism.
[4] 請求項 3に記載のリフトピン機構において、 [4] In the lift pin mechanism according to claim 3,
前記昇降手段のカム機構力 前記処理対象基板の大きさに対応した数だけ連結さ れ、かつ前記処理対象基板の大きさに対応した数だけ並列に配設されたことを特徴 とするリフトピン機構。  A lift pin mechanism characterized in that a cam mechanism force of the elevating means is connected in a number corresponding to the size of the substrate to be processed and arranged in parallel in a number corresponding to the size of the substrate to be processed.
[5] 請求項 3に記載のリフトピン機構において、 [5] The lift pin mechanism according to claim 3,
前記昇降手段のカム機構が、回転板状の偏芯カムを備え、  A cam mechanism of the elevating means includes a rotating plate-shaped eccentric cam;
当該偏芯カムが、その外周形状の一部に、回転中心と同心円の円弧部を有するこ とを特徴とするリフトピン機構。  A lift pin mechanism, wherein the eccentric cam has an arc portion concentric with a rotation center in a part of the outer peripheral shape thereof.
[6] 請求項 5に記載のリフトピン機構において、 [6] In the lift pin mechanism according to claim 5,
前記偏芯カムの円弧部が、隣り合う偏芯カム同士で一部重なることを特徴とするリフ トビン機構。 A lift bin mechanism in which the arc portion of the eccentric cam partially overlaps between adjacent eccentric cams.
[7] 請求項 3に記載のリフトピン機構において、 [7] In the lift pin mechanism according to claim 3,
前記昇降手段のカム機構が、直動カムを備え、  A cam mechanism of the elevating means includes a linear cam;
当該直動カムが、その山型形状の頂点部分に、平坦面部を有することを特徴とする リフトピン機構。  The linear motion cam has a flat surface portion at the apex portion of the mountain shape.
[8] 請求項 7に記載のリフトピン機構において、 [8] In the lift pin mechanism according to claim 7,
前記直動カムの平坦面部が、複数配設された昇降ピンのうち少なくとも隣接する 2 つの昇降ピンに同時に接触し得る長さに設定されたことを特徴とするリフトピン機構。  A lift pin mechanism characterized in that a flat surface portion of the linear cam is set to a length capable of simultaneously contacting at least two adjacent lift pins among a plurality of lift pins arranged.
[9] 請求項 2項に記載のリフトピン機構にお!/、て、 [9] In the lift pin mechanism according to claim 2,! /,
前記駆動部が、前記昇降手段を駆動する速度を調整する制御部を備えたことを特 徴とするリフトピン機構。  A lift pin mechanism characterized in that the drive unit includes a control unit for adjusting a speed of driving the elevating means.
[10] 請求項 2に記載のリフトピン機構において、 [10] In the lift pin mechanism according to claim 2,
前記昇降手段が、前記各昇降ピンの基端部にそれぞれ設けられて各昇降ピンを個 別に昇降させ、当該各昇降ピンのうちの 1ずつ又は 2以上を同時に、かつ順々に上 下動させる電磁ソレノイドを備えて構成され、  The elevating means is provided at the base end of each elevating pin and elevates each elevating pin individually, and moves up or down one or more of the elevating pins simultaneously and sequentially. Configured with electromagnetic solenoid,
前記駆動部が、前記各電磁ソレノイドに供給する電力を個別に制御する制御部を 備えて構成されたことを特徴とするリフトピン機構。  A lift pin mechanism characterized in that the drive unit includes a control unit that individually controls electric power supplied to each electromagnetic solenoid.
[11] 請求項 1に記載のリフトピン機構にぉレ、て、 [11] The lift pin mechanism according to claim 1,
前記昇降ピンが、熱膨張に伴うズレを吸収する熱膨張吸収手段を備えたことを特徴 とするリフトピン機構。  A lift pin mechanism characterized in that the elevating pin includes a thermal expansion absorbing means for absorbing a shift caused by thermal expansion.
[12] 請求項求 11に記載のリフトピン機構にお!/、て、 [12] In the lift pin mechanism according to claim 11, the! /,
前記熱膨張吸収手段が、互いの当接面を平坦面状にして電磁的に結合し、熱膨 張に伴って一時的に結合を解除して前記互いの当接面をずらすことで熱膨張に伴う ズレを吸収する電磁石を備えて構成されたことを特徴とするリフトピン機構。  The thermal expansion absorbing means electromagnetically couples the contact surfaces of each other with a flat surface, and temporarily releases the coupling in accordance with the thermal expansion and shifts the contact surfaces of each other to expand the thermal expansion. A lift pin mechanism characterized by comprising an electromagnet that absorbs misalignment associated with.
[13] 請求項 11に記載のリフトピン機構にお!/、て、 [13] In the lift pin mechanism according to claim 11,! /
前記熱膨張吸収手段が、互いの当接面を平坦面状にしてその一方を N極、他方を S極として電磁的に結合し、熱膨張に伴うズレを前記平坦面状の当接面の互いのズ レで吸収する永久磁石又は電磁石を備えて構成されたことを特徴とするリフトピン機 構。  The thermal expansion absorbing means electromagnetically couples the contact surfaces of each other as a flat surface, with one of the N poles and the other as the S poles. A lift pin mechanism characterized by comprising permanent magnets or electromagnets that absorb each other's misalignment.
PCT/JP2007/067569 2006-09-08 2007-09-10 Lift pin mechanism WO2008029943A1 (en)

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