WO2008010339A1 - Scintillator panel and radiation detector - Google Patents
Scintillator panel and radiation detector Download PDFInfo
- Publication number
- WO2008010339A1 WO2008010339A1 PCT/JP2007/059099 JP2007059099W WO2008010339A1 WO 2008010339 A1 WO2008010339 A1 WO 2008010339A1 JP 2007059099 W JP2007059099 W JP 2007059099W WO 2008010339 A1 WO2008010339 A1 WO 2008010339A1
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- WO
- WIPO (PCT)
- Prior art keywords
- film
- light
- reflecting material
- scintillator
- scintillator layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2002—Optical details, e.g. reflecting or diffusing layers
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent materials, e.g. electroluminescent or chemiluminescent
- C09K11/08—Luminescent materials, e.g. electroluminescent or chemiluminescent containing inorganic luminescent materials
- C09K11/61—Luminescent materials, e.g. electroluminescent or chemiluminescent containing inorganic luminescent materials containing fluorine, chlorine, bromine, iodine or unspecified halogen elements
- C09K11/615—Halogenides
- C09K11/616—Halogenides with alkali or alkaline earth metals
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent materials, e.g. electroluminescent or chemiluminescent
- C09K11/08—Luminescent materials, e.g. electroluminescent or chemiluminescent containing inorganic luminescent materials
- C09K11/77—Luminescent materials, e.g. electroluminescent or chemiluminescent containing inorganic luminescent materials containing rare earth metals
- C09K11/7701—Chalogenides
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K4/00—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens
Definitions
- the present invention relates to a scintillator panel that converts radiation into visible light, and a radiation detector using the scintillator panel.
- a flat detector using an active matrix By detecting the irradiated X-rays with this flat panel detector, an X-ray image or a real-time X-ray image is output as a digital signal.
- X-rays are converted into visible light, that is, fluorescence by a scintillator layer, and this fluorescence is converted into a photoelectric conversion element such as an amorphous silicon (a-Si) photodiode or a CCD (Charge Coupled Device). The image is acquired by converting it into signal charge.
- a-Si amorphous silicon
- CCD Charge Coupled Device
- the scintillator layer is generally made of cesium iodide (Csl): sodium (Na), cesium iodide (Csl): thallium (T1), sodium iodide (Nal), or acid sulfate. Gadrom (Gd OS) is used. Grooves are formed in the scintillator layer by dicing etc.
- the resolution characteristics can be improved.
- a radiation detector disclosed in Japanese Patent Laid-Open No. 2000-356679 (page 3-4, Fig. 1) is known.
- the configuration of this radiation detector will be described.
- a reflective metal thin film is provided on a support substrate such as glass or amorphous carbon.
- a protective film is provided so as to cover the entire reflective metal thin film.
- a scintillator layer is provided on this protective film.
- An organic film is provided so as to cover the scintillator layer.
- a radiation detector is configured by combining a photoelectric conversion element with the scintillator panel having the support substrate, the reflective metal thin film, the protective film, the scintillator layer, and the organic film.
- an X-ray detector disclosed in Japanese Patent Laid-Open No. 2005-283483 (page 46, FIG. 1) is known. The configuration of this X-ray detector is described. A columnar scintillator layer is provided on the surface of the photoelectric conversion element. A protective film is formed on the surface of the scintillator layer. Is provided. In this protective film, light reflecting member particles for reflecting the fluorescence converted by the scintillator layer are dispersed. An X-ray detector includes the photoelectric conversion element, a scintillator layer, a protective film, and the like.
- a protective film in which light reflecting member particles are dispersed is provided on the surface of a scintillator layer. This prevents the deterioration of resolution characteristics due to the protective film.
- the surface of the scintillator layer is not flat but uneven, and a protective film enters between the columnar structures of the scintillator layer. For this reason, the visible light incident on the protective film is scattered, and as a result, there is a problem that the resolution characteristic is deteriorated.
- the present invention has been made in view of these points, and an object of the present invention is to provide a scintillator panel with improved resolution characteristics and a radiation detector using the scintillator panel.
- a scintillator panel includes:
- a light-reflecting material-dispersed film that is provided in a planar shape on the support substrate and in which light-reflecting material particles that reflect visible light are dispersed;
- a scintillator layer provided on the light-reflecting material dispersion film for converting incident radiation into visible light
- a support substrate that transmits radiation, and light reflecting material particles that are provided in a plane on the support substrate and reflect visible light are dispersed !, a light reflecting material dispersion film, and the light reflecting material dispersion film
- a photoelectric conversion element provided on a surface opposite to the support substrate of the scintillator panel and converting visible light converted by the scintillator layer into an electrical signal;
- FIG. 1 is a cross-sectional view of a radiation detector showing a first exemplary embodiment of the present invention.
- FIG. 2 is a graph showing the relationship between the film thickness of the light reflecting material dispersion film and the resolution characteristics in the radiation detector.
- FIG. 3 is a table showing the refractive indexes of the material of the scintillator layer and the material of the light reflector dispersion film in the radiation detector.
- FIG. 4 is a graph showing the relationship between T X F / D and reflectance in the radiation detector.
- FIG. 5 is a cross-sectional view of a radiation detector showing a second embodiment of the present invention.
- FIG. 6 is a cross-sectional view of a comparative example.
- FIG. 7 is a cross-sectional view of Example 2.
- FIG. 8 is a cross-sectional view of Example 3.
- FIG. 9 is a cross-sectional view of Example 4.
- FIG. 10 is a table showing the luminance and CTF of the comparative example and each example.
- 1 to 4 show a first embodiment.
- the radiation detector 11 includes a scintillator panel 12 and a photoelectric conversion element 13.
- the scintillator panel 12 has a support substrate 16 formed by curing, for example, carbon fiber that transmits radiation with a resin, and a light-reflecting material dispersion film 17 is planar on the surface of the support substrate 16. Is formed.
- the light reflecting material dispersion film 17 is formed of an organic material such as paraxylylene, for example. In this light reflecting material dispersion film 17, light reflecting material particles 18 which are inorganic substances are dispersed. Has been. Therefore, the light reflecting material dispersion film 17 also has a function as a light reflecting film.
- a scintillator layer 19 that converts incident radiation into visible light is formed on the planar surface of the light reflecting material dispersion film 17.
- the scintillator layer 19 has a columnar structure, and a plurality of grooves 20 are formed between the columnar structures.
- the light reflecting material dispersion film 17 is provided so as to be separated from between the columnar structures of the scintillator layer 19.
- Csl cesium iodide
- T1 thallium
- Na sodium iodide
- a columnar structure is formed in the scintillator layer 19 by vacuum deposition.
- the columnar structure is formed in the scintillator layer 19 by using various methods such as applying the mixed material on the light reflecting material dispersion film 17, baking and curing, and dicing with a dicer.
- the mixed material is made from oxysulfur gadolinium (Gd O S) phosphor particles and binder resin.
- the groove 20 is filled with dry nitrogen.
- the groove 20 may be filled with dry air, and the groove 20 can be in a vacuum state.
- the light-reflecting material particles 18 have a low X-ray absorption such as titanium dioxide (TiO 2).
- n n.
- T thickness of the light reflecting material dispersion film 17
- F volume filling density of the light reflecting material particles 18
- D average particle diameter
- a moisture-proof organic film 21 as an organic film is formed so as to cover the entire scintillator panel 12 including the support substrate 16, the light reflecting material dispersion film 17 and the scintillator layer 19.
- the moisture-proof organic film 21 is moisture-proof for the scintillator layer 19, and is an organic film having excellent moisture resistance, such as a paraxylylene thin film, and has a property of transmitting visible light converted by the scintillator layer 19. Yes.
- the moisture-proof organic film 21 has a structure that does not penetrate into the groove 20 of the scintillator layer 19. That is, the moisture-proof organic film 21 is provided outside the columnar structure of the scintillator layer 19.
- the photoelectric conversion element 13 includes a TFT array substrate 25. On the TFT array substrate 25, a plurality of pixels 24 having photodiodes are formed in a matrix. This photoelectric The surface of the conversion element 13 on which the pixels are formed is bonded to the surface side of the scintillator panel 12 on the scintillator layer 19 side. Here, the surface on the scintillator layer 19 side is also the surface on the opposite side of the support substrate 16 of the scintillator panel 12. In the photoelectric conversion element 13, the visible light converted by the scintillator panel 12 is converted into an electric signal by the photodiode of each pixel 24.
- the resolution characteristic of the radiation detector 11 having the scintillator layer 19 depends on the resolution characteristic (CTF: Contrast Transfer FunctionCMTF: Modulation Transfer Function) of the scintillator layer 19.
- the resolution characteristic of visible light (fluorescence) converted by the scintillator layer 19 up to the photoelectric conversion element 13 is ⁇
- the resolution characteristic of the scintillator layer 19 is ⁇
- the light reflecting material dispersion film 17 is
- the resolution of visible light reaching the photoelectric conversion element 13 is obtained by multiplying the resolution characteristic of the scintillator layer 19 by the resolution characteristic of the light reflecting material dispersion film 17.
- the resolution characteristic of visible light reaching the photoelectric conversion element is about half that of the scintillator layer.
- the resolution characteristics of the light-reflecting material dispersion film in FIG. 2 are the same as when the light from the incident surface force point light source of the light-reflecting material dispersion film is incident, reflected by the metal film, and emitted to the incident surface.
- the incident surface is one end surface of the light reflecting material dispersion film
- the metal film is provided on one surface of the light reflecting material dispersion film.
- the light reflecting material particles 18 that reflect the visible light converted by the scintillator layer 19 are dispersed in the light reflecting material dispersion film 17.
- the resolution characteristic of the radiation detector 11 can be made equal to the resolution characteristic of the scintillator layer 19. The resolution characteristics of the radiation detector of the first embodiment are improved and are higher than those of the conventional radiation detector.
- the fluorescence generated in the columnar structure of the scintillator layer 19 is repeatedly reflected on the side wall of the columnar structure of the scintillator layer 19 and reaches the photoelectric conversion element 13. For this reason, the diffusion of visible light depends on the reflectance R1 at the side wall of the columnar structure of the scintillator layer 19.
- the refractive index of the material forming the scintillator layer 19 is n
- the columnar crystal side of the scintillator layer 19 is
- FIG. 3 shows the refractive indexes of various materials.
- the materials that make up the scintillator layer 19 include cesium iodide: thallium, sodium iodide: thallium, and oxysulfur gallium.
- the refractive index n of these materials is about 1.8 to 2.4. It is. on the other hand,
- the refractive index n of these materials is about 1.4 to 1.6.
- the reflectance R1 is improved as compared with the conventional configuration, and the resolution characteristic of the radiation detector 11 can be further improved.
- the reflection of visible light by the light reflecting material dispersion film 17 is caused by the boundary between the scintillator layer 19 and the light reflecting material particles 18, and the light reflection. It occurs at two locations, the material dispersion film 17 (the boundary between the organic material of the light reflection material dispersion film 17 and the light reflection material particles 18).
- the refractive index of the light reflecting material particles 18 is n
- the refractive index of the organic material of the light reflecting material dispersion film 17 is n.
- ⁇ is the scintillator layer r s r s r b r b
- the probability that reflection occurs at the boundary between the light reflecting material particles 19 and the light reflecting material particles 18, and ⁇ indicates the probability that reflection occurs at the boundary between the light reflecting material particles 18 and the organic material of the light reflecting material dispersion film 17.
- the reflectance R2 of the light reflector dispersion film 17 is the difference in refractive index between the light reflector particles 18 and the organic material of the light reflector dispersion film 17 when visible light enters the light reflector dispersion film 17. This is largely due to the reflection effect caused by. Therefore, in order to improve the reflectance R2 of the light reflecting material dispersion film 17 according to the fifth equation, the difference between the refractive index ⁇ and the refractive index ⁇ and the difference between the refractive index ⁇ and the refractive index ⁇ are larger. Yes. Further, as shown in FIG. 3, the refractive index n is about 1 ⁇ 8 to 2 ⁇ 4, and the refractive index ⁇ is about 1 ⁇ 4.
- the refractive index n and the refractive index n are
- the reflectance R2 of the light reflecting material dispersion film 17 shows a stable value with high reflectivity, and radiation The luminance characteristics of the detector 11 can be further improved.
- the light reflecting material dispersion film 17 in which the light reflecting material particles 18 are dispersed can be formed on the support substrate 16 in a flat surface, and the scintillator layer 19 is formed on the light reflecting material dispersion film 17. Yes. For this reason, the visible light converted by the scintillator layer 19 incident on the planar light reflecting material dispersion film 17 can be prevented from being scattered, and the resolution characteristics can be improved.
- FIG. 5 shows a second embodiment. Note that the same configurations and operations as those of the first embodiment are denoted by the same reference numerals and description thereof is omitted.
- a moisture-proof inorganic film 28 as an inorganic film is formed so as to cover the entire scintillator panel 12 including the support substrate 16, the light reflecting material dispersion film 17 and the scintillator layer 19.
- the moisture-proof inorganic film 28 prevents the scintillator layer 19 from moisture.
- the moisture-proof inorganic film 28 is, for example, silicon dioxide It is an organic film having excellent moisture resistance, such as a film, and has a characteristic of transmitting visible light converted by the scintillator layer 19.
- the moisture-proof inorganic film 28 has a structure that does not penetrate into the groove 20 of the scintillator layer 19. That is, the moisture-proof inorganic film 28 is provided outside the columnar structure of the scintillator layer 19.
- the light reflecting material particles 18 may be formed by selecting other various materials instead of the inorganic materials.
- Example 2 Example 2 shown in FIG. 7, Example 3 shown in FIG. 8, and Example 4 shown in FIG.
- an aluminum (A1) film is formed as a light reflecting film 41 on a support substrate 16 obtained by curing carbon fibers with a resin by a sputtering method.
- a paraxylene thin film is formed as a protective film 17 on the light reflecting film 41.
- a cesium iodide: thallium film having a thickness of 500 m is formed as a scintillator layer 19 on the protective film 17.
- a para-xylene thin film is formed as the moisture-proof organic film 21 so as to cover the entire scintillator layer 19 and the support substrate 16.
- the moisture-proof organic film 21 is formed, the moisture-proof organic film completely penetrates between the columnar structures of the scintillator layer 19.
- Example 1 shown in FIG. 1 a light-reflecting material dispersion film 17 having a thickness of 200 m is formed on a support substrate 16 obtained by curing carbon fibers with a resin.
- the light-reflecting material dispersion film 17 is formed on the support substrate 16 by binding with titanium dioxide as the inorganic substance of the light-reflecting material particles 18 with a resin.
- a cesium oxalate: thallium film having a thickness of 500 m is formed as a scintillator layer 19.
- a paraxylene thin film is formed as the moisture-proof organic film 21 so as to cover the entire scintillator layer 19 and the support substrate 16.
- the moisture-proof organic film 21 When the moisture-proof organic film 21 is formed, the moisture-proof organic film does not penetrate between the columnar structures of the scintillator layer 19.
- the refractive index of cesium iodide: thallium is about 1.8
- the refractive index of titanium dioxide is
- Example 1 satisfies the first formula. Further, the volume filling density of the titanium dioxide-titanium particles in the light reflecting material dispersion film 17 is 70%, and the average particle size is m. Gatsutsu Thus, Example 1 satisfies the second formula.
- Example 2 shown in FIG. 7 a light-reflecting material dispersion film 17, a scintillator layer 19 and a moisture-proof organic film 21 made of the same material as in Example 1 are formed.
- the moisture-proof organic film 21 penetrates completely between the columnar structures of the scintillator layer 19.
- Example 3 shown in FIG. 8 the light reflecting material particles 18 of Example 1 are silicon dioxide silicon dioxide particles.
- Example 3 The other conditions in Example 3 are the same as in Example 1.
- Cesium iodide Thallium has a refractive index of about 1.8, and silicon dioxide has a refractive index of 1.5. For this reason, Example 3 does not satisfy the first equation.
- the light reflecting material dispersion film 17 of Example 4 shown in FIG. 9 is formed thinner than the light reflecting material dispersion film 17 of Example 1, and has a thickness of 20 m.
- the volume filling density of the titanium dioxide dioxide particles that are the light reflecting material particles 18 in the light reflecting material dispersion film 17 is 40% of Example 1 and is set low.
- the conditions of Example 4 are the same as those of Example 1. This Example 4 does not satisfy the second formula.
- Example 2 the comparative example and Example 2 are compared.
- the CTF indicating the resolution characteristics is improved compared to the comparative example. Therefore, it was shown that the resolution characteristics can be improved by providing the light reflecting material dispersion film 17 with the function of the light reflecting film.
- Example 1 and Example 2 are compared.
- the CTF indicating the resolution characteristics is improved over Example 2. Therefore, it was shown that the resolution characteristics can be further improved by not allowing the moisture-proof organic film 21 to penetrate between the columnar structures of the scintillator layer 19.
- Example 1 and Example 3 are compared.
- the reflectance of the light reflecting material dispersion film 17 is lowered, and the luminance characteristics are deteriorated as compared with Example 1. Therefore, satisfying the first equation showed the effect of improving the luminance characteristics.
- Example 1 and Example 4 are compared.
- the reflectance of the light reflecting material dispersion film 17 is reduced, and the luminance characteristics are deteriorated as compared with Example 1. Therefore, the effect of improving the luminance characteristics by satisfying the second equation was shown.
- the present invention is not limited to the above-described embodiment as it is, but in an implementation stage. It is possible to modify the components without departing from the scope of the invention. Further, various inventions can be formed by appropriately combining a plurality of constituent elements disclosed in the above embodiments. For example, some constituent elements such as all the constituent elements shown in the embodiment may be deleted. Furthermore, the constituent elements over different embodiments may be appropriately combined.
- the light reflecting material particles are dispersed on the support substrate, and the light reflecting material dispersion film can be formed in a planar shape, and the scintillator layer is formed on the planar light reflecting material dispersion film. Therefore, the visible light converted by the scintillator layer incident on the planar light reflecting material dispersion film can be prevented from being scattered, and the resolution characteristics can be improved.
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- General Engineering & Computer Science (AREA)
- Measurement Of Radiation (AREA)
- Conversion Of X-Rays Into Visible Images (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Light Receiving Elements (AREA)
Description
Claims
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/033,469 US20080290285A1 (en) | 2006-07-18 | 2008-02-19 | Scintillation panel and radiation detector |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006-195486 | 2006-07-18 | ||
| JP2006195486A JP2008026013A (ja) | 2006-07-18 | 2006-07-18 | シンチレータパネルおよび放射線検出器 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US12/033,469 Continuation US20080290285A1 (en) | 2006-07-18 | 2008-02-19 | Scintillation panel and radiation detector |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2008010339A1 true WO2008010339A1 (en) | 2008-01-24 |
Family
ID=38956674
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2007/059099 Ceased WO2008010339A1 (en) | 2006-07-18 | 2007-04-26 | Scintillator panel and radiation detector |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20080290285A1 (ja) |
| JP (1) | JP2008026013A (ja) |
| KR (1) | KR20080041236A (ja) |
| CN (1) | CN101346642A (ja) |
| WO (1) | WO2008010339A1 (ja) |
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| WO2010078034A3 (en) * | 2008-12-17 | 2010-09-30 | Saint-Gobain Ceramics & Plastics, Inc. | Scintillation array method and apparatus |
| US8481952B2 (en) | 2008-12-23 | 2013-07-09 | Saint-Gobain Ceramics & Plastics, Inc. | Scintillation separator |
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| JP2010025620A (ja) * | 2008-07-16 | 2010-02-04 | Konica Minolta Medical & Graphic Inc | 放射線画像変換パネルとその製造方法 |
| JP2010169674A (ja) * | 2008-12-26 | 2010-08-05 | Tohoku Univ | 放射線検出器 |
| JP5416500B2 (ja) * | 2009-07-27 | 2014-02-12 | 浜松ホトニクス株式会社 | 放射線像変換パネルおよび放射線イメージセンサ |
| KR101325812B1 (ko) * | 2009-12-18 | 2013-11-08 | 도시바 덴시칸 디바이스 가부시키가이샤 | 방사선 검출기와 그 제조 방법 |
| JP2011137665A (ja) * | 2009-12-26 | 2011-07-14 | Canon Inc | シンチレータパネル及び放射線撮像装置とその製造方法、ならびに放射線撮像システム |
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| JP5883556B2 (ja) * | 2010-06-04 | 2016-03-15 | 浜松ホトニクス株式会社 | 放射線イメージセンサ |
| CN103460403A (zh) * | 2011-02-28 | 2013-12-18 | 佛罗里达大学研究基金会有限公司 | 用于上转换器件的红外线透过的可见光阻挡器 |
| JP2012211781A (ja) * | 2011-03-30 | 2012-11-01 | Sony Corp | 放射線撮像装置および放射線撮像表示システム |
| JP2012242355A (ja) | 2011-05-24 | 2012-12-10 | Fujifilm Corp | 放射線検出装置 |
| JP2013050364A (ja) * | 2011-08-30 | 2013-03-14 | Fujifilm Corp | 放射線画像検出装置 |
| TWI500926B (zh) * | 2012-11-23 | 2015-09-21 | Innocom Tech Shenzhen Co Ltd | X光平板偵測裝置 |
| CN104903745B (zh) * | 2013-01-08 | 2018-07-24 | 斯基恩特-X公司 | 包含多层涂层的x射线闪烁体 |
| JP6186748B2 (ja) * | 2013-02-28 | 2017-08-30 | コニカミノルタ株式会社 | シンチレータパネル |
| WO2015002281A1 (ja) * | 2013-07-04 | 2015-01-08 | コニカミノルタ株式会社 | シンチレータパネル及びその製造方法 |
| JP6310216B2 (ja) | 2013-09-06 | 2018-04-11 | キヤノン株式会社 | 放射線検出装置及びその製造方法並びに放射線検出システム |
| JP6575105B2 (ja) * | 2015-03-27 | 2019-09-18 | コニカミノルタ株式会社 | シンチレータパネルおよびその製造方法 |
| CN107390256A (zh) * | 2017-06-09 | 2017-11-24 | 上海翌波光电科技股份有限公司 | 一种新型掺铊碘化铯晶体阵列制作封装技术 |
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| EP4053244A4 (en) * | 2019-10-31 | 2023-11-15 | Kabushiki Kaisha Toshiba | Scintillator array, method for manufacturing scintillator array, radiation detector, and radiation inspection device |
| WO2025255118A1 (en) * | 2024-06-03 | 2025-12-11 | The Research Foundation For The State University Of New York | Structured glass-ceramic scintillators |
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2006
- 2006-07-18 JP JP2006195486A patent/JP2008026013A/ja active Pending
-
2007
- 2007-04-26 CN CNA2007800009358A patent/CN101346642A/zh active Pending
- 2007-04-26 KR KR1020087005524A patent/KR20080041236A/ko not_active Ceased
- 2007-04-26 WO PCT/JP2007/059099 patent/WO2008010339A1/ja not_active Ceased
-
2008
- 2008-02-19 US US12/033,469 patent/US20080290285A1/en not_active Abandoned
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000356679A (ja) | 1999-04-16 | 2000-12-26 | Hamamatsu Photonics Kk | シンチレータパネル及び放射線イメージセンサ |
| JP2002022838A (ja) * | 2000-07-05 | 2002-01-23 | Hitachi Medical Corp | マルチスライス型x線検出器とその製造方法及びこれを用いたx線ct装置 |
| WO2002023220A1 (en) * | 2000-09-11 | 2002-03-21 | Hamamatsu Photonics K.K. | Scintillator panel, radiation image sensor and methods of producing them |
| JP2005283483A (ja) | 2004-03-30 | 2005-10-13 | Toshiba Corp | X線検出器 |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2010078034A3 (en) * | 2008-12-17 | 2010-09-30 | Saint-Gobain Ceramics & Plastics, Inc. | Scintillation array method and apparatus |
| US8399843B2 (en) | 2008-12-17 | 2013-03-19 | Saint-Gobain Ceramics & Plastics, Inc. | Scintillation array method and apparatus |
| US8481952B2 (en) | 2008-12-23 | 2013-07-09 | Saint-Gobain Ceramics & Plastics, Inc. | Scintillation separator |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20080041236A (ko) | 2008-05-09 |
| CN101346642A (zh) | 2009-01-14 |
| JP2008026013A (ja) | 2008-02-07 |
| US20080290285A1 (en) | 2008-11-27 |
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