CN103460403A - 用于上转换器件的红外线透过的可见光阻挡器 - Google Patents
用于上转换器件的红外线透过的可见光阻挡器 Download PDFInfo
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Abstract
一种具有堆叠层结构的红外-可见上转换器件,其包括红外线(IR)透过的可见光阻挡层,使得堆叠器件的IR入射面允许IR辐射、特别是NIR辐射进入器件,而由发光二极管(LED)层所产生的可见光被阻挡从器件的IR入射面处出射。器件在IR入射面处具有IR透明电极和可见光透明电极,使得可见光可以从与IR入射面相反的可见光检测面离开器件。
Description
交叉引用的相关申请
本申请要求2011年2月28日提交的美国临时申请61/447,415号的优先权,其全部内容(包括任何图、表或附图)通过引用并入本文。
背景技术
由于在夜视、测距、安全及半导体晶片检查的潜在应用,红外-可见上转换器件已经吸引了大量的关注。红外-可见光上转换器件已经通过集成光检测器和发光二极管(LED)或有机发光二极管(OLED)来制造。然而,对于一些应用如夜视仪,如果可见光也可以穿过IR辐射所经过的IR透明电极,则上转换器件可能是不合适的。因此,需要一种用于多种应用例如夜视应用的上转换器件,其中该器件的堆叠有源层垂直于IR光入射,并且包括具有限制可见光输出到专门的期望观察点的手段的一个层。
发明内容
本发明的实施方案涉及一种具有堆叠层结构的上转换器件。该器件包括IR透过的可见光阻挡层、IR入射透明电极、红外线敏化层、发光二极管层(LED)和可见光出射透明电极。IR透过的可见光阻挡层位于IR辐射源和LED层之间,例如,在IR辐射源和IR入射透明电极之间。IR透过的可见光阻挡层阻挡了由LED层发射的一种或更多种波长的可见光的通过,但是允许近红外(NIR)辐射通过而到达IR敏化层。IR透过的可见光阻挡层可以是复合结构,其具有多组具有不同折射率的材料的两个交替膜,例如交替的Ta2O5和SiO2膜或LiF和TeO2膜的堆叠体。或者,IR透过的可见光阻挡层可以包含Si、CdS、InP和/或CdTe的一种或更多种膜。IR入射透明电极可以是铟锡氧化物(ITO)、铟锌氧化物(IZO)、铝锡氧化物(ATO)、铝锌氧化物(AZO)、碳纳米管或者银纳米线,并且可见光出射透明电极可以是铟锡氧化物(ITO)、铟锌氧化物(IZO)、铝锡氧化物(ATO)、铝锌氧化物(AZO)、碳纳米管、银纳米线、Mg:Ag或Mg:Ag与Alq3堆叠层。
LED层包括电子传输层(ETL)、发光层和空穴传输层(HTL)。ETL可以包含三[3-(3-吡啶)-基]硼烷(3TPYMB)、2,9-二甲基-4,7-二苯基-1,10-菲咯啉(BCP)、4,7-二苯基-1,10-菲咯啉(BPhen)和三-(8-羟基喹啉)铝(Alq3)。发光层可包含三-(2-苯基吡啶)合铱、Ir(ppy)3、聚[2-甲氧基,5-(2’-乙基-己氧基)亚苯基亚乙烯基](MEH-PPV)、三-(8-羟基喹啉)铝(Alq3)或双-[(4,6-二氟苯基)-吡啶-N,C2’]吡啶甲酰合铱(III)(FIrpic)。HTL可包含1,1-双[(二-4-甲苯氨基)苯基]环己烷(TAPC)、N,N’-二苯基-N,N’-(2-萘基)-(1,1’-苯基)-4,4’-二胺(NPB)和N,N’-二苯基-N,N’-二(间甲苯基)联苯胺(TPD)。
附图说明
图1是IR-可见光上转换器件的示意图,其中透明电极允许可见光在包括上转换器件的堆叠层的两端选出。
图2是根据本发明一个实施方案的IR-可见光上转换器件的示意图,其中插入IR透过的可见光阻挡层,使得可见光不能从器件的IR入射面漏出。
图3是IR透过的可见光阻挡层的示意图,所述IR透过的可见光阻挡层构造为具有不同折射率(RI)的两种材料的交替膜的复合物。
图4是%透射率随实施例1的IR透过的可见光阻挡层的波长变化的曲线图,它在近红外(NIR)中显示出高透射率,而在部分的可见光范围中几乎没有透射率,使得IR透过的可见光阻挡层可以限制绿色光从根据本发明一个实施方案的IR-可见上转换器件的IR入射面损失。
具体实施方式
本发明的实施方案涉及IR-可见光上转换器件,其中所产生的可见光的输出被限制从IR所通过的表面辐射出。在如图1所示的典型上转换器件中,IR敏化层位于电极的一侧上(其在图1中显示为阳极),在该处IR敏化层产生电荷载流子,即电子或空穴。在器件的偏压下,电荷载流子被导向发光器件(LED)层(其在图1中显示为有机发光二极管(OLED)层),在该处它与互补的电荷载流子结合而产生可见光。LED产生的光从LED在各个方向上辐射出。如图1中所示,上转换器件由两个透明电极构成,在该电极处所产生的可见光透射经过该器件的两个面。对于上转换器件的一些潜在应用例如军用夜视,优选的是该器件保持为不被除了采用该器件的期望可见光检测器之外的可见光检测器(包括不受欢迎的眼睛)观察到。因此,期望阻挡在意图被检测到的可见光的面之外的任意方向上引导的可见光,特别是阻挡通过IR入射面辐射的光。在本发明的实施方案中,IR透过的可见光阻挡层允许高比例的近IR进入器件,例如,IR透过的可见光阻挡层至少在小于1.8μm的NIR部分中具有至少有50%的透射,并且阻挡可见光透射穿过IR入射面,其程度为光在背景光下不可被容易地检测。
在图2中示出根据本发明一个实施例的上转换器件,其中,通过包括在IR入射面和IR敏化层之间的IR透过的可见光阻挡层,该器件在IR入射面处变成不可透过可见光的,原因是IR透过的可见光阻挡层吸收可见光和/或使可见光在内部反射,而不是允许可见光通过IR入射面而损失。出于本发明的目的,最靠近IR入射面的电极必须是对IR高度透明的,具有至少约50%的透射率,而最靠近可见光检测面的电极必须是对可见光高度透明的,其在由LED发射可见光的波长范围内具有约50%的透射率。当IR透过的可见光阻挡层具有反射表面时,相对于没有层或非反射性IR透过的可见光阻挡层,导向器件的光检测表面的可见光的比例增加是可能的。垂直于堆叠层的上转换器件的表面可覆盖有不透明的涂层,或另外端接至作为吸收/或反射表面的不透明表面,使得可见光不损失到器件的侧面。如图2所示,IR透过的可见光阻挡层可以在衬底和阳极之间。该层也可以位于衬底的与阳极相反的表面上,或者,当两个层都具有合适的电子特性以作为器件中的互连层或有源层时,IR透过的可见光阻挡层可以位于该器件的在器件中使用的LED的IR输入侧面上的任意层之间。
根据本发明的一个实施方案,在上转换装置中使用的IR透过的可见光阻挡层,可以采用如图3所示的多电介质堆叠层。IR透过的可见光阻挡层使用具有不同折射率的交替膜的电介质膜的堆叠体,其中具有高折射率的膜与具有明显低折射率的膜交替设置。在本发明的实施方案中,膜是材料的连续层,无需以任何特定的顺序或方式形成。堆叠体可包括具有高折射率的一种或更多种材料的膜和具有低折射率的一种或更多种材料的膜。在一个示例性IR透过的可见光阻挡层中,该层由交替的Ta2O5膜(RI=2.1)和SiO2膜(RI=1.45)的复合物构成。在本发明的其它实施方案中,可以使用其它材料,其包括:交替的TiO2膜和SiO2膜的复合物、和交替的LiF膜和TeO2膜的复合物。在本发明的其它实施方案中,IR透过的可见光阻挡层可以包括自身具有高IR透明度但不可透过可见光的一个或更多个膜,例如Si、CdS、InP或CdTe。如本领域技术人员可理解的,材料或复合材料可以在可见光中具有一定的透明度,然而,该材料必须反射或吸收由所用的LED发出的可见辐射的波长,以在上转换器件所使用的环境光条件下有效地不透过外部可见光检测器。对于上转换器件的一些用途,吸收或反射不需要是绝对的。
在本发明的实施方案中,IR敏化层可以包括混合PbSe量子点(QD)或混合PbS QD的广谱吸收IR敏化层。在本发明的其它实施方案中,IR敏化层包含以下的连续膜层:PbSe、PbS、InAs、InGaAs、Si、Ge、或、GaAs。在本发明的实施方案中,IR敏化层是有机物或有机金属,其包含包括但不限于以下的材料:二萘嵌苯-3,4,9,10-四羧酸-3,4,9,10-二酐(PTCDA);锡(II)酞菁(SnPC);SnPC:C60;酞菁氯化铝(AlPcCl);AlPcCl:C60;酞菁氧钛(TiOPc);和TiOPc:C60。
在本发明的一个实施方案中,LED层可以是OLED,包括面式-三-(2-苯基吡啶)合铱(Ir(ppy)3),其在515nm发射绿光。可以用在本发明实施方案中的其他LED材料包括:聚-[2-甲氧基,5-(2’-乙基-己氧基)亚苯基亚乙烯基](MEH-PPV)、三-(8-羟基喹啉)铝(Alq3)和双-[(4,6-二氟苯基)-吡啶-N,C2’]吡啶甲酰合铱(III)(FIrpic)。LED发光层可发出任意的单个的光波长、波长的混合物、或光的窄或宽谱。在LED层中可包含多种LED材料,并且LED层可以是多个不同的LED层。
可以在IR入射透明电极中使用的透明电极(其在图2中显示为阳极)包含铟锡氧化物(ITO)、铟锌氧化物(IZO)、铝锡氧化物(ATO)、铝锌氧化物(AZO)、碳纳米管、或银纳米线。可见光出射透明电极(其在图2中显示为阴极)可以是铟锡氧化物(ITO)、铟锌氧化物(IZO)、铝锡氧化物(ATO)、铝锌氧化物(AZO)、碳纳米管、银纳米线、Mg:Ag层、或Mg:Ag和Alq3堆叠层。例如,可以将厚度小于30nm的10∶1 Mg∶Ag合金层与厚度为至多200nm的Alq3层堆叠。该IR入射透明电极和/或可见光出射透明电极可以在分别对IR光谱和可见光谱透明的衬底上形成,所述衬底可以是任意合适的玻璃或聚合材料。
材料与方法
IR透过的可见光阻挡层由Ta2O5(RI=2.1)和SiO2(RI=1.45)的多个交替膜构成,如下表1中所示的。IR透过的可见光阻挡层的厚度为约1μm且适合用于利用发射515nm光的OLED的上转换器件,因为它表现出锐截止(sharp cutoff),在小于575nm且大于450nm的波长下几乎没有透射率。图4示出IR透过的可见光阻挡层的透射光谱。
表1:多层IR透过的可见光阻挡的结构
本文提及或引用的所有专利、专利申请、临时申请和出版物通过引用以其全文并入本文,包括所有的图和表,其程度为与本说明书中的明确教导一致。
应当理解,本文所描述的实施例和实施方案仅用于举例说明目的,本技术领域的技术人员将会想到根据它们的各自修改方案或变化方案,并且它们也包括在本申请的精神和范围内。
Claims (13)
1.一种上转换器件,其具有包括IR透过的可见光阻挡层、IR入射透明电极、IR敏化层、发光二极管(LED)层、和可见光出射透明电极的堆叠层结构,其中所述IR透过的可见光阻挡层位于IR辐射源和LED层之间,其中所述IR透过的可见光阻挡层不允许由LED层发射的波长的可见光通过,但是允许NIR辐射通过以到达所述IR敏化层。
2.根据权利要求1所述的上转换器件,其中所述IR透过的可见光阻挡层是包括多个具有不同折射率的材料的两个交替膜的复合结构。
3.根据权利要求2所述的上转换器件,其中所述两个交替膜包括Ta2O5和SiO2复合物或LiF和TeO2复合物。
4.根据权利要求1所述的上转换器件,其中所述IR透过的可见光阻挡层包含Si、CdS、InP和/或CdTe的一个或更多个膜。
5.根据权利要求1所述的上转换器件,其中所述IR入射透明电极包括铟锡氧化物(ITO)、铟锌氧化物(IZO)、铝锡氧化物(ATO)、铝锌氧化物(AZO)、碳纳米管或银纳米线。
6.根据权利要求1所述的上转换器件,其中所述可见光出射透明电极包括:铟锡氧化物(ITO);铟锌氧化物(IZO);铝锡氧化物(ATO);铝锌氧化物(AZO);碳纳米管;银纳米线;Mg:Ag;或者Mg:Ag和Alq3堆叠体。
7.根据权利要求6所述的可见光出射透明电极,其中所述Mg∶Ag层具有10∶1的比例和小于30nm的厚度。
8.根据权利要求6所述的可见光出射透明电极,其中所述Alq3层的厚度小于200nm。
9.根据权利要求1所述的上转换器件,其中所述LED层包括电子传输层(ETL)、发光层和空穴传输层(HTL)。
11.根据权利要求9所述的上转换器件,其中所述发光层包括三-(2-苯基吡啶)合铱、Ir(ppy)3、聚[2-甲氧基,5-(2’-乙基己氧基)亚苯基亚乙烯基](MEH-PPV)、三-(8-羟基喹啉)铝(Alq3)或双-[(4,6-二氟苯基)-吡啶-N,C2’]吡啶甲酰合铱(III)(FIrpic)。
12.根据权利要求9所述的上转换器件,其中所述HTL包括:1,1-双[(二-4-甲苯氨基)苯基]环己烷(TAPC)、N,N’-二苯基-N,N’-(2-萘基)-(1,1’-苯基)-4,4’-二胺(NPB)和N,N’-二苯基-N,N’-二(间甲苯基)联苯胺(TPD)。
13.根据权利要求1的装置,其中所述IR透过的可见光阻挡层位于IR辐射源和所述IR入射透明电极之间。
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