WO2007025485A1 - Detecteur de rayons x et procede de fabrication du detecteur - Google Patents
Detecteur de rayons x et procede de fabrication du detecteur Download PDFInfo
- Publication number
- WO2007025485A1 WO2007025485A1 PCT/CN2006/002259 CN2006002259W WO2007025485A1 WO 2007025485 A1 WO2007025485 A1 WO 2007025485A1 CN 2006002259 W CN2006002259 W CN 2006002259W WO 2007025485 A1 WO2007025485 A1 WO 2007025485A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- layer
- ray detector
- vapor deposition
- fluorescent
- wafer
- Prior art date
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20185—Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
Abstract
Ce détecteur de rayons X comprend un panneau de scintillement et un panneau de conversion photoélectrique. Le panneau de scintillement comprend une couche de silicium cristalline à rainures; une première couche barrière formée sur la couche de silicium; une couche de masque dure formée sur la première couche barrière; la seconde couche barrière étant déposée sur les parois latérales des rainures; une couche de scintillement remplissant les rainures recouvrant la seconde couche barrière; une couche réfléchissante recouvrant la couche de masque dure et la couche de scintillement; une couche de passivation formée sur la couche de réflexion sélective; une couche de dioxyde de silicium formée sur la couche de silicium cristalline en vue de la liaison du panneau de scintillement et du panneau de conversion photoélectrique; et des microlentilles formées dans la couche de dioxyde de silicium. Le détecteur est construit de manière que les rainures de scintillement puissent correspondre au réseau des photodiodes avec l'enregistrement de chaque pixel. La couche barrière dans les rainures de scintillement évite la superposition des rayons X.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2006800314089A CN101253419B (zh) | 2005-09-01 | 2006-09-01 | X射线探测器和x射线探测器制造方法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US71321505P | 2005-09-01 | 2005-09-01 | |
US60/713,215 | 2005-09-01 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2007025485A1 true WO2007025485A1 (fr) | 2007-03-08 |
Family
ID=37808478
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/CN2006/002259 WO2007025485A1 (fr) | 2005-09-01 | 2006-09-01 | Detecteur de rayons x et procede de fabrication du detecteur |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN101253419B (fr) |
WO (1) | WO2007025485A1 (fr) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102881702A (zh) * | 2012-09-26 | 2013-01-16 | 浙江大学 | 一种阵列式x射线传感器及其制作方法 |
WO2013019331A1 (fr) | 2011-07-29 | 2013-02-07 | Carestream Health,Inc. | Panneaux composites thermoplastiques détecteurs de radiation imprimés |
CN104124254A (zh) * | 2013-04-24 | 2014-10-29 | 佳能株式会社 | 放射线摄像装置及其制造方法以及放射线检查装置 |
CN112457794A (zh) * | 2020-03-17 | 2021-03-09 | 昆山雅锋电子有限公司 | 一种用于碘化铯平板探测器中的复合膜及其应用 |
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---|---|---|---|---|
CN104900745B (zh) * | 2015-05-26 | 2017-10-27 | 北京工业大学 | 一种基于高电子迁移率晶体管的光谱探测器及其制备方法 |
CN108027448B (zh) * | 2015-10-09 | 2022-02-11 | 深圳帧观德芯科技有限公司 | 半导体x射线检测器的封装方法 |
US11000249B2 (en) | 2016-11-10 | 2021-05-11 | Koninklijke Philips N.V. | X-ray detector for grating-based phase-contrast imaging |
FI127409B (en) * | 2017-01-18 | 2018-05-15 | Oxford Instruments Tech Oy | radiation Window |
CN107978655A (zh) * | 2017-11-28 | 2018-05-01 | 湖北京邦科技有限公司 | 一种辐射探测器的制造方法 |
CN110783431A (zh) * | 2019-11-13 | 2020-02-11 | 中国电子科技集团公司第四十四研究所 | Apd阵列器件的制作方法 |
Citations (15)
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US5171996A (en) * | 1991-07-31 | 1992-12-15 | Regents Of The University Of California | Particle detector spatial resolution |
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US5617463A (en) * | 1995-02-20 | 1997-04-01 | Siemens Aktiengesellschaft | X-ray diagnostic installation |
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JP2002087366A (ja) * | 2000-09-12 | 2002-03-27 | Yamaha Motor Co Ltd | 自動二輪車のエンジン懸架構造 |
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JP2004015000A (ja) * | 2002-06-11 | 2004-01-15 | Canon Inc | 放射線検出装置及び放射線撮像システム |
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CN2630866Y (zh) * | 2003-06-19 | 2004-08-04 | 清华大学 | 一种间接耦合线性阵列闪烁探测器模块 |
WO2004068168A1 (fr) * | 2003-01-28 | 2004-08-12 | Philips Intellectual Property & Standards Gmbh | Detecteur de rayons x |
WO2005038490A1 (fr) * | 2003-10-22 | 2005-04-28 | Canon Kabushiki Kaisha | Dispositif detecteur de rayonnements, panneau scintillateur, leur procede de fabrication, appareil de fabrication, et systeme analyseur d'images de rayonnements |
CN1654976A (zh) * | 2003-11-20 | 2005-08-17 | Ge医疗系统环球技术有限公司 | 用于辐射探测器的闪烁体阵列及其制造方法 |
-
2006
- 2006-09-01 CN CN2006800314089A patent/CN101253419B/zh active Active
- 2006-09-01 WO PCT/CN2006/002259 patent/WO2007025485A1/fr active Application Filing
Patent Citations (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5187369A (en) * | 1990-10-01 | 1993-02-16 | General Electric Company | High sensitivity, high resolution, solid state x-ray imaging device with barrier layer |
US5171996A (en) * | 1991-07-31 | 1992-12-15 | Regents Of The University Of California | Particle detector spatial resolution |
US5617463A (en) * | 1995-02-20 | 1997-04-01 | Siemens Aktiengesellschaft | X-ray diagnostic installation |
US6177236B1 (en) * | 1997-12-05 | 2001-01-23 | Xerox Corporation | Method of making a pixelized scintillation layer and structures incorporating same |
US6744052B1 (en) * | 1999-01-21 | 2004-06-01 | Sture Petersson | X-ray pixel detector device and fabrication method |
US6472665B1 (en) * | 1999-02-12 | 2002-10-29 | Konica Corporation | Radiation image detector and radiation image forming system |
US6677616B2 (en) * | 1999-08-31 | 2004-01-13 | Lg.Philips Lcd Co., Ltd. | Fabrication method of thin film transistor substrate for X-ray detector |
US6396046B1 (en) * | 1999-11-02 | 2002-05-28 | General Electric Company | Imager with reduced FET photoresponse and high integrity contact via |
CN1312474A (zh) * | 1999-12-15 | 2001-09-12 | 模拟技术公司 | 用于ct的两维x射线探测器阵列 |
JP2002087366A (ja) * | 2000-09-12 | 2002-03-27 | Yamaha Motor Co Ltd | 自動二輪車のエンジン懸架構造 |
JP2004015000A (ja) * | 2002-06-11 | 2004-01-15 | Canon Inc | 放射線検出装置及び放射線撮像システム |
WO2004068168A1 (fr) * | 2003-01-28 | 2004-08-12 | Philips Intellectual Property & Standards Gmbh | Detecteur de rayons x |
CN2630866Y (zh) * | 2003-06-19 | 2004-08-04 | 清华大学 | 一种间接耦合线性阵列闪烁探测器模块 |
WO2005038490A1 (fr) * | 2003-10-22 | 2005-04-28 | Canon Kabushiki Kaisha | Dispositif detecteur de rayonnements, panneau scintillateur, leur procede de fabrication, appareil de fabrication, et systeme analyseur d'images de rayonnements |
CN1654976A (zh) * | 2003-11-20 | 2005-08-17 | Ge医疗系统环球技术有限公司 | 用于辐射探测器的闪烁体阵列及其制造方法 |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013019331A1 (fr) | 2011-07-29 | 2013-02-07 | Carestream Health,Inc. | Panneaux composites thermoplastiques détecteurs de radiation imprimés |
US8502170B2 (en) | 2011-07-29 | 2013-08-06 | Carestream Health, Inc. | Patterned radiation-sensing thermoplastic composite panels |
US9069086B2 (en) | 2011-07-29 | 2015-06-30 | Carestream Health, Inc. | Patterned radiation-sensing thermoplastic composite panels |
CN102881702A (zh) * | 2012-09-26 | 2013-01-16 | 浙江大学 | 一种阵列式x射线传感器及其制作方法 |
CN104124254A (zh) * | 2013-04-24 | 2014-10-29 | 佳能株式会社 | 放射线摄像装置及其制造方法以及放射线检查装置 |
CN112457794A (zh) * | 2020-03-17 | 2021-03-09 | 昆山雅锋电子有限公司 | 一种用于碘化铯平板探测器中的复合膜及其应用 |
Also Published As
Publication number | Publication date |
---|---|
CN101253419B (zh) | 2011-07-27 |
CN101253419A (zh) | 2008-08-27 |
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