WO2006062152A1 - 中継接続部材、検査装置および中継接続部材の製造方法 - Google Patents
中継接続部材、検査装置および中継接続部材の製造方法 Download PDFInfo
- Publication number
- WO2006062152A1 WO2006062152A1 PCT/JP2005/022535 JP2005022535W WO2006062152A1 WO 2006062152 A1 WO2006062152 A1 WO 2006062152A1 JP 2005022535 W JP2005022535 W JP 2005022535W WO 2006062152 A1 WO2006062152 A1 WO 2006062152A1
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- WIPO (PCT)
- Prior art keywords
- wiring
- inspection
- connection member
- sheet member
- sheet
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
Definitions
- Relay connection member Inspection device, and method of manufacturing relay connection member
- the present invention relates to a plurality of terminals formed on the inspection object at the time of an inspection of a predetermined inspection object and the other end of a plurality of probes that contact one end, and an inspection signal used for the inspection.
- the present invention relates to a relay connection member that electrically connects to an inspection circuit that outputs, an inspection device using the relay connection member, and a method of manufacturing the relay connection member.
- an inspection apparatus for performing an electrical property inspection on an electronic component such as a liquid crystal panel.
- an inspection apparatus for example, as shown in FIG. 5, a plurality of probes 102 provided corresponding to the terminals 101a included in the inspection object 101 which is an electronic component, and a probe holder 103 which holds a plurality of probes.
- an inspection circuit 105 for outputting a predetermined inspection signal, and a relay connection member 104 for electrically connecting the probe and the inspection circuit.
- the inspection signal output from the inspection circuit 105 passes through the wiring structure 106 and the probe 102 formed on the sheet member 107 provided in the relay connection member 104.
- the response signal is input to the inspection circuit 105 via the probe 102 and the wiring structure 106 after processing the circuit in the electronic component and processing the circuit in the electronic component (see, for example, Patent Document 1).
- a dedicated electronic circuit may be used.
- the electronic circuit actually used when the electronic component is mounted on a product is used. It is preferable to use a circuit.
- a TAB Tunnel Automated Bonding
- the electronic circuit used at the product level is used as the inspection circuit 105. The reason why the electronic circuit used at the product level is used as the inspection circuit 105 is that it is close to the actual usage condition, it is preferable to perform the inspection under the conditions, and the inspection by separately producing an electronic circuit dedicated to the inspection This is to avoid an increase in cost.
- Patent Document 1 Japanese Patent Application Laid-Open No. 8-222299 Disclosure of the invention
- connection between the probe 102 and the wiring structure 106 in the relay connection member 104 is formed separately from the wiring structure 106 which is not realized by fixing with solder or the like. This is realized by the probe 102 physically contacting the wiring structure 106 while applying a predetermined load. For this reason, when the probe 102 is in contact with the wiring structure 106 in a misaligned state or when the probe 102 is displaced after contacting the wiring structure 106, it is caused by the friction force generated between the probe 102 and the probe 102.
- the shape of the wiring structure 106 changes, and new problems such as an electrical short circuit between adjacent wiring structures occur.
- the conventional inspection apparatus has a problem with respect to the electrical connection between the relay connection member 104 and the inspection circuit 105.
- the electrical connection via the probe 102 is realized with the terminal 101a of the inspection object 101 and the wiring structure 106 facing each other.
- the arrangement pattern of the plurality of terminals 101a is inverted in the wiring structure 106 for the same reason as that reflected in the mirror. Therefore, the inspection circuit 105 is electrically connected to the relay connection member 104 whose arrangement pattern is reversed.
- the relay connecting member 104 and the inspection circuit 105 need to be connected in a so-called “ ⁇ ” shape. Since the connection mode to be applied is a structure that is physically unreasonable, there will be a new problem such as disconnection in the wiring structure 106 etc. in a portion where the physical strength is low.
- the present invention has been made in view of the above, and is capable of sufficiently securing the electrical connection with the inspection target and the internal electrical connection while corresponding to the narrowing of the terminals provided in the inspection target.
- An object is to realize an inspection device, a relay connection member constituting the inspection device, and a method of manufacturing the relay connection member.
- the relay connection member according to claim 1 has a plurality of terminals and one end formed on the inspection object at the time of inspection of the predetermined inspection object.
- a relay connection member for electrically connecting the other end of the plurality of probes in contact with an inspection circuit that outputs an inspection signal used for the inspection, and the other end of the plurality of probes at each one end A first connection member having a plurality of first wiring structures formed on the surface, the other ends being located on different layers and having the other end exposed over a predetermined length or more at one end
- a second connection member in which a plurality of second wiring structures that are in contact with the other end of the first wiring structure exposed on the surface by a predetermined length and are electrically connected to the inspection circuit at the other end are formed on the same layer.
- the interval between the first wiring structures on the same layer is widened, so that the space between the probe and the first wiring structure is increased.
- the first connection member that can sufficiently secure the electrical continuity of the first connection member and the second wiring structure that electrically connects the first connection member and the inspection circuit are formed on the same surface to electrically connect the inspection circuit.
- the first connection member is formed of an insulating member, and one or more first wiring structures are formed on an upper surface thereof.
- the first wiring structures adjacent to each other are formed on different sheet members.
- the inspection apparatus according to claim 3 is an inspection apparatus that performs an inspection by inputting and outputting an electrical signal to a predetermined inspection object through a plurality of terminals provided in the inspection object.
- a plurality of probes each having one end in contact with each of the plurality of terminals formed on the inspection object; a probe holder that houses the plurality of probes at positions corresponding to the terminals; and A plurality of first wiring structures that are electrically connected to the other ends of the plurality of probes, the adjacent ones are located on different layers, and the other ends are exposed to the surface over a predetermined length.
- a plurality of second wiring structures that are in contact with the other end of the first wiring structure exposed on the surface by a predetermined length at one end and electrically connected to the inspection circuit at the other end in the same layer.
- a second connecting member formed on the front and the front An inspection circuit that is electrically connected to the second connection member and outputs at least an inspection signal to the second connection member is provided.
- the method for manufacturing a relay connection member according to claim 4 includes a plurality of probes that come into contact with a plurality of terminals formed on the inspection object when the predetermined inspection object is inspected, and the inspection described above. This is a method of manufacturing a relay connection member that electrically connects to an inspection circuit that outputs an inspection signal used in the process, and extends from one end to near the center on the surface of a single sheet member.
- the sheet member has a first region in which only the first wiring is formed and a second region in which only the second wiring is formed, with respect to a direction in which the first wiring and the second wiring extend.
- a sheet dividing step of forming the first sheet member, the second sheet member, and the third sheet member by dividing the first sheet member, the second sheet member, and the third sheet member, and the first wiring and the second sheet member.
- the predetermined first wiring and second wiring are continuously formed over the first to third regions on the single sheet member. There is no need to form a wiring pattern separately for each of the first, second and third sheet members, and the possibility of misalignment between the wirings after separation is suppressed. An excellent relay connection member can be manufactured.
- the method for manufacturing a relay connection member according to claim 5 is characterized in that, in the above invention, before the laminating step, at least one of the first sheet member and the second sheet member is provided. On the other hand, it further includes a label forming step for forming an alignment mark used for alignment with the other, and in the laminating step, the alignment sheet is used to connect the first sheet member and the second sheet member. It is characterized by stacking while aligning the gaps.
- the relay connection member and the inspection apparatus increase the interval between the first wiring structures on the same layer by forming the adjacent first wiring structures on different layers, and the probe and the first wiring. Inspection is performed by forming on the same surface a first connection member that can sufficiently ensure electrical continuity with the structure, and a second wiring structure that electrically connects the first connection member and the inspection circuit. By providing the second connection member that can sufficiently secure electrical connection to the circuit, there is an effect that electrical continuity between the probe and the inspection circuit can be sufficiently secured.
- the predetermined first wiring and the second wiring are continuously formed over the first to third regions on a single sheet member. Therefore, it is not necessary to form a wiring pattern separately for each of the first, second, and third sheet members, and the possibility of positional deviation between the wirings after separation is suppressed, thereby preventing electrical conduction. It is possible to produce an excellent relay connection member.
- FIG. 1 is a schematic diagram showing an overall configuration of an inspection apparatus according to an embodiment.
- FIG. 2 shows the details of the structure of the vicinity of the probe of the first connecting member that constitutes the inspection device It is a schematic diagram shown in FIG.
- FIG. 3 is a schematic diagram for explaining a connection mode among a first connection member, a second connection member, and an inspection circuit that constitute an inspection apparatus.
- FIG. 4 is a schematic view for explaining a method of manufacturing a relay connecting member constituting the inspection apparatus.
- FIG. 5 is a schematic diagram showing a configuration of a conventional inspection apparatus.
- FIG. 1 is a schematic diagram illustrating an overall configuration of an inspection apparatus according to an embodiment.
- the inspection apparatus according to the present embodiment includes a probe 2 that is in contact with a terminal 2 of the inspection object 1 and one end, a probe holder 4 that holds the probe 3 in a predetermined position, and a probe.
- An inspection circuit 5 that outputs at least an inspection signal to the inspection object 1 via the probe 3 and a relay connection member 6 for electrically connecting the probe 3 and the inspection circuit 5 are provided.
- the probe 3 contacts the terminal 2 provided on the inspection object 1 at one end, and contacts the first wiring structure 11, 12 (described later) at the other end. It is for electrically connecting between.
- the probe 3 is formed of a stretchable conductive member partially including an elastic member such as a panel, and contacts the contact target such as the terminal 2 while applying a predetermined pressing force. Therefore, it has a function of electrically conducting with the contact object.
- a plurality of terminals 2 formed on the inspection object 1 are provided, and the inspection apparatus according to the present embodiment includes a plurality of probes 3 corresponding to the plurality of terminals 2.
- the probe holder 4 is for holding a plurality of probes 3 at predetermined positions.
- the probe 3 is for electrical conduction by making contact with each of the plurality of terminals 2 formed on the inspection object 1, and the probe holder 4 is determined in advance so that the conduction state is good. It has a function to hold a plurality of probes 3 so that they are located at different locations.
- the probe holder 4 is, for example, a plate-like body. The probe 3 is held in the through-hole formed in the formed and powerful plate-like body so that both ends slightly protrude from the surface of the plate-like body.
- the inspection circuit 5 is for outputting an inspection signal necessary for inspection to the inspection object 1 when inspecting the electrical characteristics of the inspection object 1.
- the inspection circuit 5 is configured by a TAB or the like, and, for example, includes an IC chip 5a including an electronic circuit that generates an inspection signal, and electrically connects the IC chip 5a and the relay connection member 6. It has a structure with a wiring structure 7 for this purpose.
- the inspection circuit 5 may be manufactured separately with an electronic circuit dedicated to inspection, but in this embodiment, when the inspection object 1 is mounted as a part of the product, the inspection object 1 However, the circuit that inputs and outputs the operation signal etc. will be used as it is.
- the inspection object 1 is a liquid crystal panel
- a driver circuit that inputs a pixel signal or the like to the liquid crystal panel when a display is manufactured using the liquid crystal panel is used as the inspection circuit 5.
- the relay connection member 6 As shown in FIG. 1, the relay connection member 6 is used to electrically connect the first connection member 8 for electrical connection with the probe 3 and between the first connection member 8 and the inspection circuit 5.
- the second connecting member 9 and the reinforcing member 10 for preventing the first connecting member 8 from warping or the like.
- the first connection member 8 includes first wiring structures 11 and 12 that are electrically connected to the corresponding probes 3 at the other ends and are formed on different layers. Specifically, as shown in FIG. 1, the first connection member 8 has a configuration in which sheet members 13 and 14 are sequentially laminated, and the first wiring structure 11 is formed on the respective surfaces of the sheet members 13 and 14. The first wiring structures 11 and 12 are formed on different layers by pre-forming them.
- the sheet members 13, 14 are formed of a sheet-like insulating member having a thin film thickness and high flexibility. Specifically, the sheet members 13 and 14 are formed using, for example, polyimide or the like used as a base material for FPC (Flexible Printed Circuit). As shown in FIG. 1, the sheet member 13 located in the lower layer of the laminated structure is formed by the first wiring structure 11 to be formed. In order to be able to be electrically connected to the lobe 3 or the like, the first wiring structures 11 and 12 have a configuration that extends more than the sheet member 14 in the extending direction, and the first wiring structures 11 and 12 extend to the portion that extends beyond the sheet member 14. 1 Wiring structure 11 has a stretched structure.
- the first wiring structures 11 and 12 serve as a conduction path between the probe 3 and a second wiring structure 16 (described later) formed on the second connection member 9. Specifically, a plurality of first wiring structures 11 and 12 are formed corresponding to the probe 3, and the first wiring structure 11 and the first wiring structure 12 are formed on different layers. . Of the adjacent first wiring structures, one is the first wiring structure 11 and the other is the first wiring structure 12. That is, the adjacent first wiring structures are formed on different layers.
- the first wiring structure 11 is positioned below the first wiring structure 12, but the sheet member 13 as a base material has a portion that extends more than the sheet member 14, and extends to such a portion. As a result, the vicinity of the end portion is exposed on the surface.
- the second connection member 9 is for electrically connecting the first wiring structures 11, 12 constituting the first connection member 8 and the inspection circuit 5.
- the second connection member 9 has a structure in which a plurality of second wiring structures 16 are formed on the sheet member 15, and the second wiring structure 16 and the first wiring structures 11 and 12 and the inspection circuit 5 is electrically connected.
- the plurality of second wiring structures 16 each have a structure formed on the same sheet member 15, that is, on the same layer.
- the reinforcing member 10 is for reinforcing the first connecting member 8.
- one end portion of the first connecting member 8 has a configuration in which the first wiring structures 11 and 12 are electrically connected to the probe 3 by contacting the probe 3.
- a predetermined pressing force acts between the first connecting member 8 and the first connecting member 8.
- the sheet members 13 and 14 that function as the base material of the first connection member 8 are formed by a sheet-like member having a high flexibility, the sheet member is resistant to the pressing force supplied from the probe 3.
- the members 13 and 14 are warped, the probe 3 and the first wiring structures 11 and 12 are not in close contact with each other, and there is a possibility that the conduction state between the two is deteriorated.
- FIG. 2 is a plan view showing a part of the end portion of the first connection member 8 on the side in contact with the probe 3.
- FIG. 2 schematically shows a planar structure of the first connecting member 8 as viewed from the probe 3 side, and the portion that cannot be directly seen! / Is indicated by a broken line.
- the first wiring structure l la to l Id formed on the sheet member 13 and the first wiring structures 12a to 12d formed on the sheet member 14 are planar structures. Have alternating structures. Specifically, when the first connection member 8 is viewed from the probe 3 side force, the first wiring structure 11a ⁇ 12a ⁇ ib ⁇ 12b ⁇ is arranged, and the probe 3 side force is also The first wiring structures adjacent to each other are formed so as to be located on different layers (sheet member 13 or sheet member 14). By adopting a powerful structure, as shown in FIG. 2, the distance between the first wiring structures formed on the same layer is almost 2 as compared with the case where the first wiring structure is formed on a single layer. Double the value.
- connection pads 18a to 18a having a width wider than that of the first wiring structure in the direction perpendicular to the extending direction. 18d and connection pads 19a to 19d are formed respectively. These connection pads 18a to 18d and connection pads 19a to 19d are each formed in a so-called staggered state. Specifically, for example, in the case of the connection pads 18a to 18d, the connection pads 18a and 18c are formed at the same position with respect to the extending direction of the first wiring structure 11, while the connection pads 18b and 18d are It is formed at a position different from the connection pad 18a and the like. That is, the connection pads 18a to 18d and the connection pads 19a to 19d are formed so that positions in the extending direction of the first wiring structure are different between adjacent connection pads.
- FIG. 3 is a schematic diagram for explaining a connection mode among the first connection member 8, the second connection member 9, and the inspection circuit 5. Refer to Figure 3 below. One connection mode will be described.
- connection mode between the first connection member 8 and the second connection member 9 will be described.
- the electrical connection between the first connecting member 8 and the second connecting member 9 is performed by specifically connecting the ends of the first wiring structures 11 and 12 provided in the first connecting member 8 and the second connecting member 9. This is realized by fixing the positional relationship between the first connection member 8 and the second connection member 9 in a state where the end of the second wiring structure 16 provided in the contact is in contact.
- the first wiring structures 11 and 12 and The part where the second wiring structure 16 contacts each other is the predetermined wiring length d
- the 1 connecting member 8 has a structure in which the sheet member 13 extends more than the sheet member 14 on the side connected to the second connecting member 9.
- the first wiring structure 11 is formed using the sheet member 13 as a base material and is formed in the lower layer of the sheet member 14. Therefore, in order to connect to the second wiring structure 16, the range of the wiring length d is on the surface of the first connecting member 8.
- a structure in which the material 13 is stretched more than the sheet member 14 is adopted.
- the entire first wiring structure 12 has a structure exposed on the surface of the first connection member 8, but even if a structure that is covered with a protective layer or the like is adopted, (1) As with wiring structure (11), the wiring length (d) is exposed at the end on the side connected to the second connecting member (9).
- the second wiring structure 16 provided in the second connection member 9 is a region in contact with the first wiring structures 11 and 12, and has a wiring length d of approximately 2 Double the wiring length
- the first connecting member 8 has the first arrangement located on the lower layer side.
- the sheet member 13 is extended more than the sheet member 14.
- the sheet member 14 functions as a base material of the first wiring structure 12
- the first wiring structure 11 formed on the sheet member 13 is formed on the sheet member 14 as shown in FIG. It is almost equal to the wiring length d on the second connecting member 9 side than the formed first wiring structure 12.
- the plurality of second wiring structures 16 are Each needs to be in contact with either the first wiring structure 11 or 12, and in order to be able to contact either of them, the wiring length required for contact d
- the first connection member 8 and the second connection member 9 are used. Are electrically connected to each other.
- the first wiring structures 11 and 12 and the second wiring structure 16 are in the direction and in alignment (in the example of FIG. 3, the second connection member 9 is positioned vertically above the first connection member 8 in the drawing).
- the end of the first connecting member 8 and the end of the second connecting member 9 are overlapped, and the positional relationship between the two is fixed by using, for example, ACF (Anisotropic Conductive Film) Is done.
- the alternate long and short dash line regions connected by the double-sided arrows in FIG. Done That is, for example, the one-dot chain line region S of the first wiring structure 11a is the second wiring structure 11a.
- the line structure 11a and the second wiring structure 16a are in contact with each other within the range of the wiring length d.
- the one-dot chain line region S of the first wiring structure 12a is fixed in contact with the one-dot chain line region S of the second wiring structure 16b.
- the one-dot chain line region S of the first wiring structure l ib is the one-dot chain line region lib of the second wiring structure 16c.
- 16c 12b Structure Fixed in contact with the dash-dot line region S of 16d. In this way, the first connection
- connection mode between the second connection member 9 and the inspection circuit 5 will be described.
- the electrical connection between the second connection member 9 and the inspection circuit 5 is made by the end of the second wiring structure 16 provided in the second connection member 9 and the end of the wiring structure 7 provided in the inspection circuit 5. This is realized by contact with.
- the second wiring structure 16 has a wiring length d as a contact area at the end in contact with the inspection circuit 5.
- One area is secured, and the wiring length d is secured in the wiring structure 7 as well.
- the region T and the dot-and-dash region T at the end of the wiring structure 7d are in contact with each other.
- FIG. 4 is a schematic diagram for explaining a manufacturing method of the first connection member 8 and the second connection member 9 constituting the relay connection member.
- a predetermined wiring pattern is formed on a single sheet member 21.
- the sheet member 21 includes a central region 21a (corresponding to the third region in the claims) located at the center, an end region 21b (corresponding to the first region in the claims) located at both ends, Wiring is formed in the central region 21a and the end regions 21b and 21c so as to have a different pattern in each of the region 21c (corresponding to the second region in the claims).
- first wirings 22a to 22h are formed from the central region 21a to the end region 21b, and second wirings are formed from the central region 21a to the end region 21c.
- 23a to 23i are formed.
- the first wirings 22a to 22h and the second wirings 23a to 23i have a configuration in which each extends substantially in parallel, while the first wiring and the second wiring are alternately arranged in the central region 21a.
- the first wiring 22h, the second wiring 23i are arranged in this order.
- a pattern is formed.
- pads 24a to 24h are respectively provided corresponding to the first wirings 22a to 22h and the second wirings 23a to 23i. And pads 25a to 25i are formed.
- alignment alignment 26 (which functions as an example of an alignment mark in the claims) is formed on the end region 2 lc.
- the sheet member 21 is divided into three pieces, that is, a central region 21a and end regions 21b and 21c along the broken line shown in FIG.
- the three pieces of the divided center region 21a and end region 21b and 21c function as examples of the third sheet member, the first sheet member, and the second sheet member in the claims.
- the central region 2 la and the end regions 21b and 21c on which the predetermined wiring pattern is formed constitute the sheet member 15, the sheet member 13 and the sheet member 14 included in the relay connecting member 6, and are formed on each region.
- the wiring patterns thus formed constitute the second wiring structure 16, the first wiring structure 12, and the first wiring structure 11, respectively, as is clear when FIG. 4 is compared with FIG.
- the portions remaining on the central region 21a constitute the second wiring structure 16 and remain in the end region 21b.
- Each portion constitutes the first wiring structure 12, and the portion remaining in the end region 21 c constitutes the first wiring structure 11.
- the pad 24 and the pad 25 constitute the connection pad 19 and the connection node 18, respectively.
- the end regions 21b and 21c corresponding to the sheet member 14 and the sheet member 13 are sequentially laminated and fixed.
- the end regions 21b and 21c are accurately aligned by the alignment 26 described above in the step of applying power.
- the alignment 26 indicates the position of the end of the end region 21b on the central region 21a side (the end on the side indicated by the broken line in FIG. 4).
- the central region 21a forms the second connection member 9 together with the first wirings 22a to 22h and the second wirings 23a to 23i formed on the surface.
- the central area 2 la is connected to the structure in which the end areas 21 b and 21 c are stacked, so that the wiring structures are electrically connected to each other, that is, are connected so as to satisfy the connection relationship shown in FIG. Member 6 is completed.
- the inspection apparatus according to the present embodiment has an advantage that the first wiring structures 11 and 12 adjacent to each other in the first connection member 8 are formed on different layers. As shown in FIG.
- first wiring structures 11 and 12 adjacent to each other are formed on different layers (that is, the sheet members 13 and 14), a plurality of the first wiring structures 11 and 12 are formed on the same layer.
- the arrangement interval of the first wiring structure 11 and the plurality of first wiring structures 12 can be increased to twice the arrangement interval of the probes 3. For this reason, as shown in FIG. 2, it is possible to increase the area of the connection pads 18 and 19 for contact with the end of the probe 3, and alignment between the probe 3 and the connection pads 18 and 19 is possible. This makes it possible to easily perform the above-described process and to suppress the deformation of the wiring structure (connection pad) due to the frictional force with the probe 3.
- connection pad 18b is formed at a position different from the connection pads 18a and 18c with respect to the extending direction of the first wiring structure (longitudinal direction in FIG. 2). Even if it is extended with respect to (lateral direction in FIG. 2), it does not short-circuit with the connection pads 18a and 18c.
- connection pad 18b can be extended in a direction perpendicular to the extending direction as long as it is not short-circuited with the first wiring structures 11a and 11c located in the vicinity. This also applies to the other connection pads 18a, 19a, etc., and adjacent pads on the same layer are arranged at different positions, so that connection pads with a larger area can be realized. is there.
- the first connection member 8 has the structure in which the first wiring structures 11, 12 are formed on different layers, and more specifically, the first wiring Between structures 11 and 12, there is a sea The member 14 is interposed. Therefore, in order to electrically connect the first wiring structure 11 located in the lower layer to the other, it is necessary to adopt a structure in which the first wiring structure 11 is exposed in the vicinity of the end portion.
- the electrical connection portion (the chain line area S in FIG. 3) and the electrical connection portion in the first wiring structure 12 formed in the upper layer (in FIG. 3)
- the position is different from the one-dot chain line region s) with respect to the extending direction of the wiring structure. others
- the member that is electrically connected to the first connecting member 8 is approximately twice as long as the wiring length d that is normally required to electrically connect to both the first wiring structures 11 and 12.
- Wiring length d is approximately twice as long as the wiring length d that is normally required to electrically connect to both the first wiring structures 11 and 12.
- the inspection circuit 5 to be connected to the relay connection member 6 has a wiring length d as the length of the electrical connection portion (the one-dot chain line region T of the wiring structure 7), and does not have a cover. Is normal
- the inspection circuit 5 is obtained by diverting what is used as a driver circuit or the like when mounting the inspection object 1, the electrical connection portion provided in the inspection circuit 5 is the surface of the inspection object 1. Only the length (for example, the wiring length d) necessary for electrical connection with the terminal 2 formed above (that is, on the same layer) is provided. Therefore, the first connection
- inspection circuit 5 use a dedicated circuit for inspection where the electrical connection part is the wiring length d
- the relay connection member 6 and the inspection circuit 5 are connected.
- a good conduction state is realized. That is, in the second connection member 9, there is no limit on the wiring length, and it is not possible to secure the wiring length d in the second wiring structure 16 on the side connected to the first connection member 8.
- the second connecting member 9 has an advantage that sufficient electrical continuity with the inspection circuit 5 can be secured.
- the relay connection member 6 is newly provided with the second connection member 9 in the present embodiment, there is an advantage that an inspection apparatus having a structure that is physically reasonable can be realized.
- the conventional inspection apparatus has a structure in which the relay connection member 104 is formed by a single connection member. Therefore, in the conventional inspection apparatus, in order to maintain the correspondence between the plurality of wiring structures 105a formed on the inspection circuit 105 and the plurality of terminals 101a formed on the inspection object 101, FIG. It is necessary to connect the relay connection member 104 and the inspection circuit 105 in the shape of a " ⁇ " as shown in Fig. 3, resulting in a structure that is physically unreasonable, weak in strength, partly broken, etc. There was a problem.
- the relay connection member 6 has a structure including a plurality of connection members (first connection member 8 and second connection member 9), thereby solving such a problem. ing. That is, the arrangement pattern of the terminals 2 in the direction perpendicular to the paper surface in FIG. 1 is reversed by passing through the first connection member 8 arranged with the first wiring structures 11 and 12 facing the terminal 2. . Thereafter, the second wiring member 16 is reversed again by passing through the second connecting member 9 disposed in a state where the second wiring structure 16 is opposed to the first wiring structures 11 and 12, and coincides with the original arrangement pattern.
- the inspection circuit 5 can bring the wiring structure 7 into contact with the second wiring structure 16 in the same manner as when contacting with the plurality of terminals 2 provided in the inspection object 1. Instead, the second connection member 9 and the inspection circuit 5 can be connected by a normal connection mode. As a result, the inspection apparatus according to the present embodiment can realize a structure that is physically unreasonable, and has the advantage of being able to reduce the probability of occurrence of defects such as disconnection.
- the inspection apparatus can manufacture the relay connection member 6 using a single sheet member 21 as shown in FIG.
- the second wiring structure 16 formed on the sheet member 15 constituting the relay connecting member 6 is composed of the sheet member.
- the first wiring structures 11 and 12 formed on the 13 and 14 are alternately connected.
- the first wiring 22 and the second wiring 23 are alternately arranged on the central region 21a (the sheet member 15 is configured after separation), and the end region 21c (the sheet member after separation is formed). 13) is formed by extending the second wiring 23, and the end region 21b (the sheet member 14 after separation) is formed by extending the first wiring 22 to form the first wiring.
- the structures 11 and 12 and the second wiring structure 16 can be easily realized. For this reason, it is possible to form a wiring pattern by using a simple pattern mask for forming a wiring pattern on the sheet member 21 without having to prepare three patterns for each region. is there.
- the first wiring 22 maintains continuity between the central region 21a and the end region 21b
- the second wiring 23 includes the central region 21a and the end region 21c.
- the first wiring structure 11 formed on the surface of the sheet member 13
- the second wiring formed on the surface of the structure 12 and the sheet member 15 does not cause adverse effects such as a gap between adjacent wiring structures between the first structure 16 and the second connection member 9.
- the configuration of the first connection member 8 has a structure in which sheet members 13 and 14 each having a predetermined wiring pattern formed on the surface are laminated. It is not necessary to limit to a structure in which TAB, FPC, etc. are laminated. Any structure in which adjacent first wiring structures are formed on different layers can be used as the first connection member. Further, the number of layers in which the first wiring structure is formed is not limited to two, and the first wiring structure can be formed on an arbitrary number of layers as long as there are a plurality of layers.
- the relay connection member and the inspection apparatus using the relay connection member according to the present invention are provided.
- the method of manufacturing the intermediate connection member is used for the inspection, and the other ends of the plurality of probes that contact one end with a plurality of terminals formed on the inspection object when inspecting a predetermined inspection object. This is useful when electrically connecting to an inspection circuit that outputs an inspection signal, and is particularly suitable when performing an electrical characteristic inspection on an electronic component such as a liquid crystal panel.
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
Claims
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2005800423113A CN101073014B (zh) | 2004-12-08 | 2005-12-08 | 中继连接构件、检查装置以及中继连接构件的制造方法 |
| KR1020077012780A KR101166861B1 (ko) | 2004-12-08 | 2005-12-08 | 중계 접속부재, 검사장치 및 중계 접속부재의 제조방법 |
| TW094143325A TWI278633B (en) | 2004-12-08 | 2005-12-08 | Relay connection member, inspection device and method of manufacturing relay connection member |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004355855A JP4767528B2 (ja) | 2004-12-08 | 2004-12-08 | 中継接続部材、検査装置および中継接続部材の製造方法 |
| JP2004-355855 | 2004-12-08 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2006062152A1 true WO2006062152A1 (ja) | 2006-06-15 |
Family
ID=36577975
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2005/022535 Ceased WO2006062152A1 (ja) | 2004-12-08 | 2005-12-08 | 中継接続部材、検査装置および中継接続部材の製造方法 |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP4767528B2 (ja) |
| KR (1) | KR101166861B1 (ja) |
| CN (1) | CN101073014B (ja) |
| TW (1) | TWI278633B (ja) |
| WO (1) | WO2006062152A1 (ja) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010054487A (ja) * | 2008-08-26 | 2010-03-11 | Isao Kimoto | プローバ装置 |
| JP2012233723A (ja) * | 2011-04-28 | 2012-11-29 | Micronics Japan Co Ltd | プローブ装置及びプローブユニット |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04184264A (ja) * | 1990-11-20 | 1992-07-01 | Nippon Maikuronikusu:Kk | 表示パネル用プローバ |
| JPH08315879A (ja) * | 1995-05-15 | 1996-11-29 | Nippon Maikuronikusu:Kk | 多極端子板およびプローブ装置 |
| JPH09184853A (ja) * | 1995-12-28 | 1997-07-15 | Nippon Maikuronikusu:Kk | プローブユニット |
| JP2000266779A (ja) * | 1999-03-18 | 2000-09-29 | Toshiba Corp | マルチプローブユニット |
-
2004
- 2004-12-08 JP JP2004355855A patent/JP4767528B2/ja not_active Expired - Fee Related
-
2005
- 2005-12-08 KR KR1020077012780A patent/KR101166861B1/ko not_active Expired - Fee Related
- 2005-12-08 TW TW094143325A patent/TWI278633B/zh not_active IP Right Cessation
- 2005-12-08 CN CN2005800423113A patent/CN101073014B/zh not_active Expired - Fee Related
- 2005-12-08 WO PCT/JP2005/022535 patent/WO2006062152A1/ja not_active Ceased
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04184264A (ja) * | 1990-11-20 | 1992-07-01 | Nippon Maikuronikusu:Kk | 表示パネル用プローバ |
| JPH08315879A (ja) * | 1995-05-15 | 1996-11-29 | Nippon Maikuronikusu:Kk | 多極端子板およびプローブ装置 |
| JPH09184853A (ja) * | 1995-12-28 | 1997-07-15 | Nippon Maikuronikusu:Kk | プローブユニット |
| JP2000266779A (ja) * | 1999-03-18 | 2000-09-29 | Toshiba Corp | マルチプローブユニット |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI278633B (en) | 2007-04-11 |
| KR20070085822A (ko) | 2007-08-27 |
| JP4767528B2 (ja) | 2011-09-07 |
| TW200634312A (en) | 2006-10-01 |
| KR101166861B1 (ko) | 2012-07-19 |
| JP2006162478A (ja) | 2006-06-22 |
| CN101073014B (zh) | 2010-05-26 |
| CN101073014A (zh) | 2007-11-14 |
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